Method of measuring electric property of electro-optical display

By measuring and adjusting drive waveforms based on impedance, the method addresses inefficiencies in encapsulated electrophoretic display measurement, enhancing display performance and reducing afterimages and edge effects.

JP2025159162APending Publication Date: 2025-10-17E INK CORP
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Patent Information

Application Number
JP2025136262
Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
Priority Date
2022-01-21
Filing Date
2025-08-19
Publication Date
2025-10-17

AI Technical Summary

Technical Problem

Existing methods for measuring the electrical properties of encapsulated electrophoretic displays are inefficient and inaccurate, leading to complications in manufacturing and potential inaccuracies in display performance due to environmental factors like temperature and humidity, which affect the electrical properties of the polymer material.

Method used

A method for measuring and adjusting drive waveforms based on the impedance of electro-optic materials by applying time-dependent voltages and measuring currents through a current measurement circuit, using resistive elements and differential voltage amplifiers to determine optimal drive waveforms for each pixel electrode.

Benefits of technology

This approach allows for efficient and accurate measurement of electrical properties, enabling precise waveform application to maintain consistent optical states in the display, reducing afterimages and edge effects, and improving display performance.

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Abstract

To provide a preferable method for measuring the electric property of an electro-optical display.SOLUTION: A method is provided for an electro-optical display including an electro-optical material interposed between a common electrode and a back plane. The back plane includes an array of pixel electrodes each of which is coupled to a transistor. A display controller applies a wave to a pixel electrode. The method includes applying a first measurement wave to a first part of the pixel electrodes. The same time dependent voltage is applied to the first part of each pixel electrode during each frame of the first measurement wave. The method includes determining an impedance of the electro-optical material close to the first part of the pixel electrodes on the basis of a current which flows through a current measurement circuit and a measurement value of a time-dependent voltage applied to each pixel electrode during the first measurement wave, and selecting a drive wave on the basis of the impedance of the electro-optical material close to the first part of the pixel electrodes.SELECTED DRAWING: Figure 6
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