Object detection method and object detection device

JP2025167826APending Publication Date: 2025-11-07NISSAN MOTOR CO LTD
1 Cites 0 Cited by

Patent Information

Application Number
JP2024072767
Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
Filing Date
2024-04-26
Publication Date
2025-11-07

AI Technical Summary

Technical Problem

Existing object detection technologies, such as those using LiDAR, face issues with uniform downsampling leading to coarse sampling intervals for stationary objects like buildings, resulting in unnecessary data and increased processing load.

Method used

An object detection method that utilizes sensors with multiple scan lines at varying thinning rates based on object detection requirements, adjusting the sampling density for reflection points or image feature points depending on their height above ground to prioritize detection of relevant objects.

Benefits of technology

This approach reduces processing load while accurately detecting objects like buildings by optimizing the sampling density, ensuring proper detection of required objects and minimizing unnecessary data processing.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure 2025167826000001_ABST
    Figure 2025167826000001_ABST
Patent Text Reader

Abstract

To provide an object detection method and an object detection device capable of reducing a treatment load and properly detecting an object that needs to be detected.SOLUTION: In an object detection method for allowing a controller to detect an object by using a sensor that has multiple scan lines in a vertical direction, emits electromagnetic waves within a predetermined angle in which the respective scan lines are lateral, and detects reflection points of the electromagnetic waves of an object, the controller executes a point group acquisition step of thinning out the reflection points at a predetermined interval and acquiring non-thinned-out reflection points, and an object detection step of detecting the object on the basis of the acquired reflection points, and a thin-out ratio of the reflection points detected for an upper scan line is allowed to differ from a thin-out ratio of the reflection points detected for a lower scan line in the point group acquisition step.SELECTED DRAWING: Figure 4
Need to check novelty before this filing date? Find Prior Art

Citation Information

Patent Citations

  • Obstacle detector

    JP2021085828A