Optimized summation test based on nested t-tests that maximize separation between carriers and non-carriers
JP2025502818APending Publication Date: 2025-01-28ILLUMINA INC
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Patent Information
- Application Number
- JP2024539698
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2022-10-18
- Filing Date
- 2022-12-28
- Publication Date
- 2025-01-28
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Figure 2025502818000001_ABST
Abstract
A computer-implemented method for performing an optimized summation test for a particular gene, wherein an optimal combination of maximum allele count and minimum pathogenicity score threshold (862) that maximizes the significance of the summation test for rare deleterious variants is determined using a grid search (822) protocol. Each combination of maximum allele count and minimum pathogenicity score threshold is tested (824) with a t-test to obtain an effect size and p-value (842). The combination of allele count and pathogenicity score threshold with the most significant p-value (842) is selected as the optimal parameter for the rare deleterious variant summation test for the particular gene.
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