Determination of Nanoparticle-Based Baseline and Detection Threshold by Multi-Data Processing Switching
By employing iterative outlier removal and multiple data processing techniques, the method addresses the challenges of determining nanoparticle baselines and detection thresholds in ICP mass spectrometry, achieving more reliable nanoparticle analysis.
JP2025516038APending Publication Date: 2025-05-26ELEMENTAL SCI
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Patent Information
- Application Number
- JP2024563707
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2022-04-27
- Filing Date
- 2023-04-21
- Publication Date
- 2025-05-26
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Figure 2025516038000001_ABST
Abstract
A system and method are described for automatically utilizing a plurality of data processing methods on a spectroscopic analysis dataset to determine a nanoparticle detection factor including a nanoparticle baseline and a detection threshold.
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