Method and system for determining reticle deformation
JP2025540159APending Publication Date: 2025-12-11ASML NETHERLANDS BV
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Patent Information
- Application Number
- JP2025532085
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2022-12-23
- Filing Date
- 2023-11-29
- Publication Date
- 2025-12-11
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Figure 2025540159000001_ABST
Abstract
Disclosed herein is a computer system configured to determine a shape and / or deformation of a reticle using a reticle heating model, and to control operation of a lithography process using the reticle depending on the modeled shape and / or deformation. The computer system is configured to determine that a long track fault has occurred depending on generated reticle process data and known thermal characteristics of the reticle, and in response to determining that a long track fault has occurred, reset the reticle heating model to the same initialization state used at the start of performance of the lithography process on a lot of substrates.
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