Risk measurement system, risk measurement method, and risk measurement program
Patent Information
- Application Number
- JP2024121172
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2024-07-26
- Publication Date
- 2026-02-05
AI Technical Summary
Existing methods for calculating credit VaR, such as Monte Carlo simulation and analytical methods, struggle with high computational loads and inability to accurately account for complex inter-company relationships and chain bankruptcies, leading to impractical risk allocation.
A risk measurement system that includes a debtor information storage unit, calculation result storage unit, and control unit to perform simulations considering chain bankruptcies, record loss amounts, and calculate VaR and CVaR for each debtor, using an algorithm that integrates Monte Carlo simulations with analytical methods to account for inter-company relationships.
Enables efficient and accurate credit risk calculation and management by accounting for chain bankruptcies and inter-company relationships, improving risk allocation accuracy.
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Abstract
Citation Information
Patent Citations
Method and system for credit risk measurement
JP2002063345A
Method and apparatus for calculating credit risk of portfolio
JP2009032237A