Light-emitting device manufacturing method, inspection method, and inspection device

JP2026044349APending Publication Date: 2026-03-12NICHIA CORP
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Patent Information

Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
Filing Date
2024-08-30
Publication Date
2026-03-12

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Abstract

To easily determine whether a resin part is non-defective. [Solution] A method for inspecting a light-emitting device (5) includes the steps of irradiating the light-emitting device (5) with a first illumination light (11) from directly above the light-emitting device (5) and irradiating the light-emitting device (5) with a second illumination light (21) having a different chromaticity from the first illumination light (11) from a different direction from the first illumination light (11); obtaining an image of a first reflected light (12) of the first illumination light (11) reflected by a resin part (4) from directly above the light-emitting device (5) and a second reflected light (22) of the second illumination light (21) reflected by the resin part (4); observing an area of ​​the first reflected light (12) in the image where the first reflected light (12) is observed to be stronger than the second reflected light (22); and determining the product as good if the area (14) of the first reflected light (12) is observed to be in the form of a single straight line, and determining the product as defective if the area (14) of the first reflected light (12) is not observed to be in the form of a single straight line.
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Citation Information

Patent Citations

  • Appearance inspection device

    JP2019138762A