Method for testing tiplets, tips, and tips.
JP2026047336AActive Publication Date: 2026-03-13SANECHIPS TECH CO LTD
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Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2025-09-01
- Publication Date
- 2026-03-13
Smart Images
Figure 2026047336000001_ABST
Abstract
This document provides a chiplet, a chip, and a method for testing the chip. [Solution] A chiplet is provided that includes at least one inter-chiplet interconnect interface for connecting to at least one other chiplet and communicating with at least one other chiplet, a selection module connected to the at least one inter-chiplet interconnect interface, and a processing module connected to the selection module. A chip and a method for testing the chip are further provided.
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