Semiconductor manufacturing equipment and semiconductor device manufacturing method
JP2026056464APending Publication Date: 2026-04-01MITSUBISHI ELECTRIC CORP
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2024-09-19
- Publication Date
- 2026-04-01
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Figure 2026056464000001_ABST
Abstract
In semiconductor manufacturing equipment, residual chemicals or pure water at the clamp pin contact points on the wafer surface, sides, and back surfaces caused uneven drying on the wafer, resulting in appearance defects and a decrease in yield. [Solution] The semiconductor manufacturing apparatus 1 according to this disclosure comprises a stage 2 on which a wafer 5 is placed with its surface facing upward and rotated, and clamp pins 41 that hold the wafer 5 by contacting the wafer surface and the wafer side surface 5b, and for discharging a chemical solution onto the wafer surface.
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Citation Information
Patent Citations
Substrate treatment equipment
JP2005019701A