Inspection device, inspection method, and inspection program for light source devices.
JP2026085801APending Publication Date: 2026-05-25NICHIA CORP
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Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- NICHIA CORP
- Filing Date
- 2024-11-13
- Publication Date
- 2026-05-25
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Figure 2026085801000001_ABST
Abstract
This invention provides an inspection device, inspection method, and inspection program for a light source device that can appropriately and quickly perform processing from individualization to measurement and packaging. [Solution] The inspection device 10 comprises an information acquisition unit 20a, a segmentation processing unit 20b, a measurement processing unit 20c, a classification processing unit 20d, and a packaging processing unit 20e. The information acquisition unit 20a acquires information about the light source device 50. The segmentation processing unit 20b segments multiple light source devices 50 based on the information about the light source device 50 acquired by the information acquisition unit 20a. The measurement processing unit 20c sets measurement conditions based on the information acquired by the information acquisition unit 20a and measures the light source devices 50 segmented by the segmentation processing unit 20b. The classification processing unit 20d classifies the light source devices 50 into normal products and defective products according to the measurement results in the measurement processing unit 20c. The packaging processing unit 20e packages the light source devices 50 classified by the classification processing unit 20d.
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