Condition determination device, maintenance management device, information processing device, X-ray CT device and program

Abstract

The present invention provides a condition determination device, a maintenance management device, an information processing device, an X-ray CT device, and a program that can appropriately determine the condition of a slip ring. [Solution] The state determination device comprises an illumination device that irradiates light onto the slip rings, a camera that photographs the area including the slip rings, and a processor that recognizes the image acquired via the camera and determines the state of the object based on the image recognition result. The state of the object may include at least one of the following: the degree of contamination of the slip rings, the degree of contamination of the area between the rings, and the amount of attached material. The processor may calculate feature quantities from the image and determine the need for maintenance based on the feature quantities and a set threshold.

Description

Technical Field

[0001] The present disclosure relates to a state determination device, a maintenance management device, an information processing device, an X-ray CT device, and a program, and particularly relates to a technique for determining the surface state of a slip ring applied to a rotating and sliding current-carrying mechanism.

Background Art

[0002] Patent Document 1 describes a technique related to a sliding state diagnosis device and method for a rotating electric machine that can detect abnormal sliding of the rotating electric machine at an early stage and reduce the stop period and maintenance cost of the rotating electric machine. The sliding state diagnosis device for the rotating electric machine described in Patent Document 1 includes a light source that irradiates a sliding surface on the surface of a rotating body of the rotating electric machine toward a current collecting brush, a light receiving unit that receives reflected light from the sliding surface, and a determination unit that processes a signal from the light receiving unit. The determination unit detects an increase in a specific wavelength component of the reflected light and determines an abnormality in the sliding state on the surface of the rotating body of the rotating electric machine.

Prior Art Documents

Patent Documents

[0003]

Patent Document 1

Summary of the Invention

Problems to be Solved by the Invention

[0004] The technique described in Patent Document 1 has the following problems.

[0005] [Problem 1] The technique described in Patent Document 1 is configured to detect (estimate) the degree of deposits on the sliding surface by detecting an increase in a specific wavelength component of the spectral spectrum of the reflected light, and unevenness such as scratches on the sliding surface cannot be detected.

[0006] [Problem 2] The state of change in the appearance of the sliding surface cannot be visually confirmed either.

[0007] [Problem 3] Because the threshold for comparison is determined by the conditions at the time of measurement, the result of the abnormality detection will change even if the intensity of reflected light is the same. Therefore, there is a risk of using the rotating electric machine while it is in an abnormally worn state.

[0008] [Problem 4] Because detection is performed using only components of a specific wavelength, it is difficult to determine the variation in fouling within the same slip ring, the variation in fouling among multiple rings, and the state of fouling in the grooves between rings.

[0009] [Problem 5] For multiple types of rings, such as slip rings in power systems and slip rings in control systems, even if the degree of fouling is the same, the tolerance differs depending on the type of ring. Therefore, it is not appropriate to make an abnormality judgment using a uniform standard.

[0010] This disclosure is made in view of these circumstances and aims to provide a condition determination device, a maintenance management device, an information processing device, an X-ray CT device, and a program that can solve at least some of the above-mentioned problems and appropriately determine the state of a slip ring. [Means for solving the problem]

[0011] A state determination device according to a first aspect of this disclosure comprises an illumination device that irradiates light onto a slip ring, a camera that photographs an area including the slip ring, and a processor that recognizes an image acquired via the camera and determines the state of an object based on the recognition result of the image.

[0012] According to the first embodiment, light is shone onto the slip ring from an illumination device, and the area including the slip ring is photographed by a camera. The processor can recognize objects in the image captured by the camera and determine the state of the objects. The objects may include, for example, the slip ring, the inter-ring area, and deposits. The inter-ring area is a non-slip ring area adjacent to the slip ring, and is typically the area of ​​the groove between the rings. By using the image obtained from the camera, it is possible to quantitatively evaluate the dirt on the object, surface scratches (irregularities), the amount of deposits, etc. It is also possible to visually confirm the state of the object by displaying the image. The term "ring" is not limited to shapes including arcs, but includes the concept of anything shaped like a ring, and also includes shapes that are partially discontinuous, such as a C-ring.

[0013] The state determination device according to the second embodiment may be configured such that the state of the object includes at least one of the following: the degree of contamination of the slip rings, the degree of contamination of the inter-ring region of the slip rings, and the amount of deposits in the inter-ring region. "Contamination" includes the concepts of dirt, scratches, or a combination thereof.

[0014] The state determination device according to the third embodiment may be configured such that, in the state determination device according to the first or second embodiment, the processor calculates feature quantities from an image and determines the need for maintenance based on the feature quantities and a set threshold.

[0015] By using features calculated from images, the condition of an object can be quantitatively evaluated. According to the third embodiment, it is possible to determine whether the degree of soiling requires maintenance by comparing it with a threshold value.

[0016] The state determination device according to the fourth embodiment may be configured to include a storage device that stores at least one of the following: an image, a feature quantity calculated from the image, a threshold value, and a state determination result, in addition to the state determination device according to the third embodiment.

[0017] The state determination device according to the fifth aspect may be configured such that, in the state determination device according to the fourth aspect, the processor notifies information stored in the storage device to an external device via a network.

[0018] The state determination device according to the sixth aspect may be configured such that, in the state determination device according to any one of the third to fifth aspects, different threshold values are set according to the type of slip ring.

[0019] For example, the threshold values of the degree of contamination that requires maintenance may be made different between the power system slip ring and the control system slip ring.

[0020] The state determination device according to the seventh aspect may be configured such that, in the state determination device according to any one of the first to sixth aspects, the image includes at least one of a power system slip ring that performs power transmission and a control system slip ring that performs signal transmission.

[0021] The state determination device according to the eighth aspect may be configured such that, in the state determination device according to any one of the first to seventh aspects, the image includes a groove in the inter-ring region of the slip ring.

[0022] The state determination device according to the ninth aspect may be configured such that, in the state determination device according to any one of the first to eighth aspects, the color of the inter-ring region of the slip ring may be a color other than black.

[0023] The state determination device according to the tenth aspect may be configured such that, in the state determination device according to any one of the first to ninth aspects, the image is taken by diffused light.

[0024] The state determination device according to the eleventh aspect may be configured such that, in the state determination device according to the tenth aspect, the lighting device irradiates light from an oblique direction to the region including the slip ring.

[0025] The state determination apparatus according to the 12th aspect may be configured to include a plurality of lighting devices that irradiate light from a plurality of directions onto an area including a slip ring in the state determination apparatus according to the 10th or 11th aspect.

[0026] The state determination apparatus according to the 13th aspect may be configured to include a light shielding guard that suppresses direct incidence of light from the lighting device onto the camera in the state determination apparatus according to any one of the 10th to 12th aspects.

[0027] The state determination apparatus according to the 14th aspect may be configured such that, in the state determination apparatus according to any one of the 1st to 9th aspects, the image is captured by specularly reflected light.

[0028] The state determination apparatus according to the 15th aspect may be configured to include a half mirror that is disposed between the lighting device and the slip ring and reflects specularly reflected light from the slip ring toward the camera in the state determination apparatus according to the 14th aspect.

[0029] The state determination apparatus according to the 16th aspect may be configured such that, in the state determination apparatus according to any one of the 1st to 15th aspects, the processor issues a warning when an abnormality of the object is detected.

[0030] The state determination apparatus according to the 17th aspect may be configured to include a display device that displays a determination result of the state in the state determination apparatus according to any one of the 1st to 16th aspects.

[0031] The state determination apparatus according to the 18th aspect may be configured such that, in the state determination apparatus according to any one of the 1st to 17th aspects, the slip ring is provided on a rotating member that rotates around a subject in a medical imaging apparatus.

[0032] The state determination apparatus according to the 19th aspect may be configured such that, in the state determination apparatus according to any one of the 1st to 18th aspects, the processor determines an acquisition frequency of the image based on a feature amount calculated from the image.

[0033] The state determination device according to the 20th embodiment may be configured such that, in the state determination device according to the 19th embodiment, the processor sets conditions for changing the image acquisition frequency, and changes the image acquisition frequency when the feature quantity satisfies the conditions.

[0034] The state determination device according to the 21st embodiment may be configured such that, in the state determination device according to the 19th or 20th embodiment, the processor changes the image acquisition frequency according to the difference between the feature quantity and a set threshold.

[0035] The state determination device according to the 22nd embodiment may be configured such that, in the state determination device according to the 20th embodiment, the processor acquires condition setting information that defines conditions via a network and modifies the conditions based on the condition setting information.

[0036] The maintenance management device according to the 23rd embodiment is a maintenance management device connected via a network to a system equipped with a status determination device according to any one of the first to 22 embodiments, and comprises a second processor different from a first processor which is a processor included in each of the multiple systems, the second processor acquires information from the multiple systems via the network, determines setting information to be applied to the determination in the system based on the information acquired from the multiple systems, and provides the setting information to the system via the network.

[0037] The maintenance management device according to the 24th embodiment may be configured such that the information acquired by the second processor from multiple systems includes at least one of the following: the value of a feature calculated from an image of the system, the status of the system, and system operation information, and the setting information includes at least one of the following: a threshold used for determination, the type of feature used for determination, the frequency of image acquisition, and a condition for changing the frequency of image acquisition.

[0038] The maintenance management device according to the 25th embodiment may be configured such that, in the maintenance management device according to the 24th embodiment, the second processor obtains feature values ​​and status indicating whether or not a system is down from multiple systems, and determines at least one of the threshold used for determination and the type of feature used for determination based on a dataset including the obtained feature values ​​and status.

[0039] The maintenance management device according to the 26th embodiment may be configured such that, in the maintenance management device according to the 24th or 25th embodiment, the system operation information includes information on the rotational speed and rotational velocity of the rotating member on which the slip ring is provided in the system, the second processor acquires information on the rotational speed and rotational velocity of each system and the value of the feature quantity from multiple systems, classifies the multiple systems using the information on the rotational speed and rotational velocity, calculates a representative value of the change in the feature quantity for each class of the classified systems, and determines the conditions for changing the image acquisition frequency for each class based on the comparison result between the representative value and the assumed value of the reference change quantity.

[0040] The X-ray CT apparatus according to the 27th embodiment comprises an X-ray source that irradiates a subject with X-rays, an X-ray detector positioned opposite the X-ray source and detecting X-rays that have passed through the subject, a rotating member that mounts the X-ray source and the X-ray detector and rotates around the subject, a slip ring provided on the rotating member, an illumination device that irradiates the slip ring with light, a camera that photographs the area including the slip ring, and a processor that recognizes the image acquired via the camera and determines the state of the object based on the image recognition result.

[0041] In the X-ray CT apparatus according to the 27th embodiment, the configuration may include specific features similar to those of the state determination device according to any one of the second to 22nd embodiments.

[0042] The information processing device according to the 28th embodiment includes a processor, which acquires an image of a region including a slip ring, recognizes the image, and determines the state of the object based on the image recognition result.

[0043] In the information processing device according to the 28th embodiment, the configuration may include specific embodiments similar to those of the state determination device according to any one of the second to 22nd embodiments.

[0044] The program according to the 29th embodiment enables the computer to perform the following functions: acquiring an image of a region including a slip ring; recognizing the image; and determining the state of an object based on the image recognition result.

[0045] The program relating to the 29th aspect may have a configuration that includes specific features similar to those of the state determination device relating to any one of the 2nd to 22nd aspects. A computer-readable storage medium that is non-temporary and tangible, on which the program relating to the 29th aspect is stored, is also included in this disclosure. [Effects of the Invention]

[0046] According to this disclosure, it becomes possible to appropriately determine the state of an object within a region containing a slip ring based on the recognition results of an image taken of the region containing the slip ring. [Brief explanation of the drawing]

[0047] [Figure 1] Figure 1 is a diagram showing the basic configuration of a system including an X-ray CT apparatus and a maintenance management apparatus according to an embodiment of this disclosure. [Figure 2] Figure 2 is an explanatory diagram showing an overview of the state determination device implemented in the X-ray CT scanner 1. [Figure 3] Figure 3 shows an example of an image obtained by photographing a region containing a slip ring. [Figure 4] Figure 4 is a schematic diagram showing example 1 of the arrangement of lighting equipment and cameras. [Figure 5] Figure 5 is a schematic diagram showing example 2 of the arrangement of lighting equipment and cameras. [Figure 6] Figure 6 is a block diagram showing an example of the hardware configuration of an information processing device applied to a control console. [Figure 7] Figure 7 is a graph showing the trend of the measured value of a certain feature. [Figure 8] Figure 8 is a graph showing an example of pre-set frequency change conditions. [Figure 9] Figure 9 is a flowchart showing an example of a process for changing the measurement frequency of features. [Figure 10] Figure 10 is an explanatory diagram illustrating an example of a configuration in which multiple CT systems are connected to a maintenance management device via a network. [Figure 11] Figure 11 is a graph showing an example of default threshold settings. [Figure 12] Figure 12 is a graph that includes data where the desired classification could not be achieved with the default threshold. [Figure 13] Figure 13 is a graph showing an example of resetting the threshold using the dataset from Figure 12. [Figure 14] Figure 14 is a graph illustrating an example of setting a new threshold by changing the features used for classification. [Figure 15] Figure 15 shows a conceptual diagram illustrating the classification of multiple systems. [Figure 16] Figure 16 is a graph showing the average change in feature quantities for each class. [Figure 17] Figure 17 shows an example of a measurement frequency function. [Modes for carrying out the invention]

[0048] Preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings. In this specification, identical components are denoted by the same reference numerals, and redundant descriptions are omitted where appropriate.

[0049] 《Example of system configuration》 Figure 1 shows the basic configuration of a system including an X-ray CT apparatus 1 and a maintenance management device 202 according to an embodiment of the present disclosure. The X-ray CT apparatus 1 comprises a scan gantry unit 100 and an operating console 120.

[0050] The scan gantry unit 100 includes an X-ray tube 101, a rotating disk 102, a collimator 103, an X-ray detector 106, a data acquisition device 107, a patient bed 105, a gantry control device 108, a patient bed control device 109, and an X-ray control device 110.

[0051] The X-ray tube 101 and a high-voltage generator (not shown) are mounted on a rotating disk 102 and rotate together with the disk 102. The other components are not mounted on the rotating disk 102 and remain stationary. The rotating disk 102 is equipped with slip rings 111. The slip rings 111 electrically connect the components mounted on the rotating disk 102 with the stationary components. The high-voltage generator is connected to the rotating side of the slip rings 111, and the DC-to-high-current converter is connected to the stationary side of the slip rings 111. Thus, the DC-to-high-current converter and the high-voltage generator are electrically connected via the slip rings 111. The slip rings 111 include power system slip rings for power transmission and control system slip rings for signal transmission such as control signals.

[0052] Furthermore, the X-ray CT scanner 1 includes, as a means for diagnosing the condition of the slip ring 111, an illumination device 112 that irradiates light onto the surface of the slip ring 111, and a camera 113 that images the area including the slip ring 111 that has been illuminated by the illumination device 112.

[0053] The collimator 103 controls the irradiation range of the X-rays emitted from the X-ray tube 101. The X-ray detector 106 is positioned opposite the X-ray tube 101 and detects the X-rays that have passed through the subject. The rotating disk 102 is mounted on the patient bed 105 and has an opening 104 into which the subject enters. The rotating disk 102 is equipped with the X-ray tube 101 and the X-ray detector 106 and has a drive unit (not shown) that rotates around the subject. The X-ray detector 106 has a configuration in which multiple detection elements are arranged in the direction of rotation of the rotating disk 102. The multiple detection elements may be arranged in multiple rows (for example, 64 rows) in the direction of the rotation axis of the rotating disk 102, with the row in the direction of rotation being considered as one row. The direction of rotation of the rotating disk 102 is also called the "channel direction". The direction of rotation axis of the rotating disk 102 is also called the "slice direction".

[0054] The X-ray control device 110 includes an X-ray high-voltage device and controls the power supplied to the X-ray tube 101. The data acquisition device 107 is a device that converts X-rays detected by the X-ray detector 106 into predetermined electrical signals. The gantry control device 108 is a device that controls the rotation of the rotating disk 102. The bed control device 109 is a device that controls the vertical and horizontal movement of the bed 105. Horizontal movement of the bed 105 means movement in the direction of the rotation axis of the rotating disk 102.

[0055] The control console 120 comprises an input device 121, an image processing device 122, a storage device 123, a system control device 124, and a display device 125. The input device 121 is a device for inputting the subject's name, examination date and time, imaging conditions, etc., and specifically includes a keyboard or pointing device. The image processing device 122 is a device that performs CT image reconstruction by processing the measurement data sent from the data acquisition device 107, and specifically includes a CPU (Central Processing Unit) that performs the calculations, a dedicated calculation circuit, or a combination thereof.

[0056] The display device 125 is a device that displays CT images and other data created by the image processing unit 122. The storage device 123 is a device that stores data collected by the data acquisition device 107 and data such as CT images created by the image processing unit 122. The system control device 124 controls these devices as well as the gantry control device 108, the patient table control device 109, and the X-ray control device 110.

[0057] The X-ray tube 101 is supplied with tube current and tube voltage controlled by the X-ray control device 110 so that the imaging conditions (tube voltage, etc.) input from the input device 121 are met. The X-ray tube 101 is an example of an "X-ray source" in this disclosure.

[0058] X-rays emitted from the X-ray tube 101 and transmitted through the subject are detected by the X-ray detection element in the X-ray detector 106. During this time, the rotating disk 102 rotates the X-ray tube 101 and the X-ray detector 106 so that X-rays are emitted from all directions of the subject and detected. The rotation speed of the rotating disk 102 is controlled by the gantry control device 108 to match the imaging conditions (such as scan speed) input from the input device 121. Also, while X-rays are being emitted and detected, the patient table 105 is controlled by the patient table control device 109 to move the subject along the body axis to match the imaging conditions (such as spiral pitch) input from the input device 121.

[0059] The output signal from the X-ray detector 106 is collected as projection data by the data acquisition device 107. The projection data collected by the data acquisition device 107 is sent to the image processing device 122. The image processing device 122 reconstructs the projection data to create a CT image. The reconstructed CT image is displayed on the display device 125 and stored as image data in the storage device 123 along with the shooting conditions.

[0060] The image processing unit 122 also functions as an image processing device that analyzes various feature quantities from images captured by the camera 113.

[0061] The maintenance management device 202 is a device that collects and manages information related to the maintenance of the X-ray CT apparatus 1. The maintenance management device 202 may be configured using one or more computers. The maintenance management device 202 may also be implemented using cloud computing.

[0062] The X-ray CT scanner 1 and the maintenance management device 202 are connected to network 201. Network 201 may be a local area network, a wide area network, or a combination of both.

[0063] Although Figure 1 illustrates one X-ray CT scanner 1, multiple X-ray CT scanners may be connected to a maintenance management device 202 via a network 201 so as to be able to communicate with it.

[0064] The X-ray CT scanner 1 is an example of a "medical imaging device" in this disclosure, and the rotating disk 102 is an example of a "rotating member" in this disclosure. The maintenance management device 202 is an example of an "external device" in this disclosure.

[0065] [Overview of the state determination device according to the first embodiment] Figure 2 is an explanatory diagram illustrating the overview of a state determination device 140 implemented in the X-ray CT apparatus 1. The state determination device 140 comprises an illumination device 112, a camera 113, and an operating console 120. The illumination device 112 and the camera 113 are installed near the slip ring 111. The camera 113 includes an optical system (not shown), an image sensor, and a signal processing circuit. The optical system includes one or more lenses, such as a focusing lens. The image sensor may be, for example, a CCD (Charge Coupled Device) image sensor or a CMOS (Complementary Metal-Oxide Semiconductor) image sensor. The camera 113 generates digital image data of the captured object by processing the signal obtained from the image sensor with the signal processing circuit. The term "image" includes the concept of "image data".

[0066] The control console 120 functions as an information processing device that controls the operation of the lighting device 112 and the camera 113, and analyzes the images obtained from the camera 113. The control console 120 includes a storage device 123, an image processing device 122, a determination unit 126, and a display device 125. The determination unit 126 may be implemented in the system control device 124.

[0067] Images captured by camera 113 under arbitrary conditions are processed by image processing unit 122. Image processing unit 122 recognizes the images acquired via camera 113 and analyzes various feature quantities from the images. Determination unit 126 compares the change in feature quantities with a preset threshold to determine the surface state of the slip ring 111. The measured value of the feature quantities calculated from the image is understood to reflect the change in feature quantities.

[0068] The term "determination" includes the concepts of discrimination, judgment, and diagnosis. The determination unit 126 may determine the surface condition of the inter-ring region of the slip ring 111, as well as the surface condition of the slip ring 111. A threshold is set, for example, as a criterion for determining whether or not the degree of contamination (contamination level) requires maintenance.

[0069] If the determination unit 126 determines that there is an abnormality on the surface of the slip ring 111 or the surface of the inter-ring region, it issues a warning on the display device 125. Images captured by the camera 113 can also be displayed on the display device 125. The images captured by the camera 113, thresholds, the comparison results between feature quantities and thresholds, and the warning content are associated and stored in the storage device 123.

[0070] The system of this X-ray CT scanner 1 is connected to network 201, and the system status is notified to the maintenance management device 202 via network 201.

[0071] The system status includes various parameters related to the state of the X-ray CT apparatus 1. In addition to the determination result by the determination unit 126, the system status may also include information such as the lifespan of the target component predicted based on the determination result, the remaining usable period, and the maintenance timing. For example, the maintenance management device 202 may acquire information via the network 201, such as how many days remain until the acceptable margin is lost regarding the surface contamination state of the slip ring 111.

[0072] To improve the judgment accuracy of the judgment unit 126, it is preferable that images be captured at multiple locations on the slip ring 111, and that multiple images be captured.

[0073] A configuration is desirable in which multiple images are acquired by taking multiple shots at multiple locations by installing multiple cameras 113, moving the position of the cameras 113, or rotating the slip ring 111 for shooting.

[0074] Alternatively, in order to improve the accuracy of the judgment, the image processing unit 122 performs various corrections on the images to be compared. The correction process may include, for example, image averaging and contrast conversion.

[0075] [Example image] Figure 3 is an example of an image IM obtained by photographing a region including the slip rings 111. The camera 113 can acquire an image IM that photographs a region including the power system slip rings 111A, the control system slip rings 111B, and the grooves 154 which are the inter-ring regions. The power system slip rings 111A function as power contacts. The control system slip rings 111B function as contacts for control signals, etc. The spacing between the slip rings 111A arranged in the power system slip ring section 150 and the slip rings 111B arranged in the control system slip ring section 152 may or may not be equal.

[0076] Slip ring 111A is an example of a "power system slip ring" in this disclosure, and slip ring 111B is an example of a "control system slip ring" in this disclosure.

[0077] Figure 3 shows an example of slip rings 111A and 111B in a clean state with no dirt or scratches on the surface. However, when the X-ray CT device 1 is used, shavings from the slider may adhere to the sliding parts, and depending on the type of slip ring, the lubricating oil on the ring surface may become contaminated. The slip ring 111B in the control system is more susceptible to contamination than the slip ring 111A in the power system. Contamination in the control system's slip ring 111B can cause errors in communication and control.

[0078] Even within the same ring, the distribution of dirt accumulation is uneven. Furthermore, the way each of the multiple slip rings 111A and 111B accumulates differs from how it accumulates in other rings.

[0079] Furthermore, if shavings from the slider accumulate in the groove 154 between the rings, a short circuit will occur. Examples of slider materials include carbon, copper, and silver alloys.

[0080] The gap between the rings (grooves 154 between the rings) is preferably a color other than that of the slider. For example, if the slider is made of carbon, the carbon shavings that accumulate between the rings will be black. Therefore, in order to accurately detect the state of shavings accumulation between the rings using image recognition, the color of the gap between the rings should be a color that is easily visually distinguishable from the color of the shavings, such as green.

[0081] The slip rings 111 may be arranged in a configuration in which multiple rings are arranged concentrically with respect to the bore of the scan gantry section 100, or multiple rings may be arranged in a configuration aligned in the Z-axis direction inside the bore.

[0082] [Example of lighting equipment and camera arrangement 1] Figure 4 is a schematic diagram showing example 1 of the arrangement of illumination devices 112A, 112B and camera 113. Figure 4 is an example of acquiring an image using diffused light. Multiple illumination devices 112A, 112B may be arranged to illuminate the area including the slip ring 111 from multiple directions. For example, as shown in Figure 4, the illumination devices 112A, 112B are arranged to illuminate the slip ring 111 from an oblique direction. Camera 113 is arranged to photograph the slip ring 111 from a direction perpendicular to the slip ring 111.

[0083] The lighting devices 112A and 112B can be turned ON (lit) both simultaneously, or only one side can be turned ON. By taking a picture with only one side ON, the light reflection changes, making it easier to detect irregularities (scratches, dirt) on the slip ring 111.

[0084] A light-shielding guard 114 may be provided around the camera 113 to suppress the direct incidence of illumination light from the lighting devices 112A and 112B onto the camera 113. The number of cameras 113 may be one or multiple. The number of lighting devices 112A and 112B is determined according to the number of cameras 113.

[0085] [Example of lighting equipment and camera arrangement 2] Figure 5 is a schematic diagram showing example 2 of the arrangement of the lighting device 112 and the camera 113. Figure 5 is an example of acquiring an image using specular reflection.

[0086] The lighting device 112 is positioned to illuminate the slip ring 111 from a direction perpendicular to it. The camera 113 is positioned parallel to the slip ring 111. A half mirror 116 is placed between the lighting device 112 and the camera 113, and is configured to reflect the specularly reflected light from the slip ring 111 and guide it to the camera 113. An LED (Light Emitting Diode) can be used as the lighting device 112. Using an LED allows the lighting device 112 to be placed in a small space. According to the configuration in Figure 5, the specularly reflected light is bent by 90 degrees by the half mirror 116, allowing the camera 113 to be placed in a small space.

[0087] Since the slip ring 111 is made of metal, if its surface is clean, it will emit strong specular reflection. As the slip ring 111 becomes dirty, the specular reflection weakens, so it is possible to detect differences in surface condition.

[0088] [Example of hardware configuration for information processing equipment] Figure 6 is a block diagram showing an example of the hardware configuration of an information processing device 300 applied to a state determination device 140. The information processing device 300 may be a personal computer, a workstation, or a server computer. The information processing device 300 includes a processor 302, a memory 304 which is the main memory, a storage 306 which is the auxiliary memory, an input / output interface 308, and a bus 310.

[0089] The processor 302 includes a CPU (Central Processing Unit). The processor 302 may also include a GPU (Graphics Processing Unit). Furthermore, the processor 302 may be configured to include hardware such as a DSP (Digital Signal Processor), an ASIC (Application Specific Integrated Circuit), and a PLD (Programmable Logic Device).

[0090] The processor 302 is connected to the memory 304, storage 306, input / output interface 308, input device 312, and display device 314 via the bus 310.

[0091] Memory 304 includes RAM (Random Access Memory). Memory 304 may also include ROM (Read Only Memory). Storage 306 may be, for example, a Hard Disk Drive (HDD), a Solid State Drive (SSD), or a combination of these. Storage 306 may also include external storage devices such as removable media.

[0092] The memory 304 and storage 306, among other storage devices, store programs and data that enable the various functions of the information processing device 300. The processor 302 enables the various functions by executing the programs stored in the memory 304. The processor 302 comprehensively controls each part of the information processing device 300 and various devices and units provided in the X-ray CT apparatus 1, and performs various processes.

[0093] The input / output interface 308 includes a communication interface that can connect to a telecommunications line such as a local area network, and a connection interface that can connect to external devices. Examples of connection interfaces that can connect to external devices include the Universal Serial Bus and HDMI (High-Definition Multimedia Interface) (HDMI is a registered trademark).

[0094] The processor 302 communicates with various devices of the X-ray CT apparatus 1 and / or external devices via the input / output interface 308, thereby transmitting and receiving necessary information.

[0095] The input device 312 may consist of, for example, a keyboard, a pointing device such as a mouse, a numeric keypad, and various switch buttons. The input device 312 may also include an audio input device. Alternatively, the input device 312 may be a touch panel type input device integrated with the display screen of the display device 314.

[0096] The display device 314 is composed of, for example, a liquid crystal display, an organic electro-luminescence (OEL) display, a projector, or an appropriate combination thereof. The display device 314 displays various information in addition to the image captured by the X-ray CT apparatus 1. The display device 314 is used as part of the user interface when receiving input from the input device 312. Note that the display device 314 is not limited to one, and a multi-display configuration with multiple display devices is also possible. The input device 312 and the display device 314 are used as the input device 121 and display device 125 shown in Figure 1. The processor 302 used in the control console 120 is an example of the "first processor" in this disclosure.

[0097] [Overview of the algorithm for determining the state of slip ring 111] The processor 302 applied to the state determination device 140 can function as an image processing device 122, a system control device 124, and a determination unit 126.

[0098] The image processing unit 122 recognizes the image acquired from the camera 113 and detects the regions of objects within the image, such as the slip rings 111A of the power system, the slip rings 111B of the control system, the grooves 154, and attached substances. As an image recognition technique for detecting the regions of objects from an image, for example, machine learning algorithms such as deep learning or pattern matching algorithms can be applied. The image processing unit 122 may include, for example, a trained model trained to perform the task of region classification (semantic segmentation), and may use the trained model to detect the regions of objects from the image. The trained model is constructed, for example, using a convolutional neural network. The "model" is essentially a program.

[0099] The image processing unit 122 calculates feature quantities from the image based on the image recognition results and analyzes the change in these feature quantities. The image processing unit 122 may calculate feature quantities for each region of the recognized object. The feature quantities may be, for example, values ​​indicating brightness (luminance) calculated from the signal values ​​(pixel values) of each RGB component of the image, a luminance distribution, a color value indicating color, a color distribution, or a distribution obtained by edge (luminance difference) detection. The feature quantities may also be calculated using a convolutional neural network or the like. The image processing unit 122 calculates one or more feature quantities, preferably multiple types of feature quantities, from the image.

[0100] The determination unit 126 quantitatively determines the state of the object, including the state of the sliding surface of the slip ring 111, using a threshold value based on the feature quantities calculated by the image processing unit 122. The determination unit 126 can determine the need for maintenance based on the feature quantities calculated from the image and the set threshold value. In addition, the state determination device 140 displays the image and the determination result on the display device 125 so that the surface state of the slip ring 111 can be visually confirmed by the image.

[0101] The state of the object, which is evaluated based on the features obtained from the image, may include at least one of the following: the degree of contamination of the slip rings 111A and 111B, the degree of contamination of the groove 154, the amount of deposits attached to the slip rings 111A and 111B, and the amount of deposits attached to the groove 154.

[0102] The image processing unit 122 may calculate different feature quantities depending on the type of object. For example, the feature quantities measured for the regions of the slip rings 111A and 111B may be of a different type than the feature quantities measured for the groove 154. Also, the determination unit 126 may set different thresholds depending on the type of object. For example, the threshold for abnormality detection may be different for the power system slip ring 111A and the control system slip ring 111B.

[0103] The anomaly detection threshold is optimized through statistical processing to ensure that the detection is independent of the state of the feature at the time of measurement. The term "optimization" does not necessarily mean strictly optimal, but rather includes the concept of approaching optimal. The time of feature measurement can be understood as the time when the image used to calculate the feature is captured (image acquisition). In terms such as "time of measurement," "time" does not refer only to a specific point in time, but includes a reasonably acceptable temporal range.

[0104] [Second Embodiment: An Example of a System for Changing the Frequency of Image Acquisition by Camera 113] In the second embodiment, in addition to the configuration of the first embodiment, conditions for changing the image acquisition frequency are set in advance to prevent over- or under-diagnosis of the slip ring 111 by the state determination device 140, and the image acquisition frequency is changed when the analysis result of the acquired image satisfies the conditions. The conditions for changing the image acquisition frequency are referred to as "frequency change conditions". The image acquisition frequency is synonymous with the feature measurement frequency.

[0105] Figures 7 to 9 illustrate an example of a system that changes the measurement frequency of a feature. The frequency change condition may be determined, for example, based on the difference between the measured value of a feature and the anomaly detection threshold. The difference between the measured value of a feature and the anomaly detection threshold is called the "margin size."

[0106] Figure 7 is a graph showing the trend of a certain feature's measured value. The horizontal axis represents time, the vertical axis represents the feature's value calculated (measured) from the image, and the black circles are points where the feature's measured value is plotted. The feature shown in Figure 7 tends to increase in value as the degree of contamination of the slip ring 111 increases. As shown in Figure 7, it is possible to predict the change in a feature from the results of multiple measurements.

[0107] Figure 8 is a graph showing an example of pre-set frequency change conditions. The horizontal axis represents the margin size, and the vertical axis represents the measurement frequency. As shown in Figure 8, the measurement frequency is set low in regions with large margins, and the measurement frequency is set to increase gradually as the margin decreases. The feature measurement frequency function is referred to as the "measurement frequency function".

[0108] Figure 9 is a flowchart illustrating an example of a process for changing the feature measurement frequency. In step S11, the processor 302 performs feature measurement at the frequency defined by the measurement frequency function set as shown in Figure 8. In the initial state, since the margin is sufficiently large, the minimum value of the measurement frequency defined by the measurement frequency function may be applied as the initial setting value. The initial setting value may be, for example, 1 time / month (a frequency of once a month).

[0109] In step S12, the processor 302 determines whether the set value of the measurement frequency matches the size of the margin of the measured value. If the result of the determination in step S12 is YES, the process returns to step S11.

[0110] If the result of step S12 is NO, the process proceeds to step S13. In step S13, the processor 302 changes the measurement frequency function to a measurement frequency corresponding to the size of the margin of the measured value. After step S13, the process returns to step S11.

[0111] Thus, a configuration that changes the feature measurement frequency based on the size of the margin between the feature measurement value and the anomaly detection threshold is desirable. It is desirable to increase the measurement frequency as the margin size decreases.

[0112] This enables a process where, if the margin size of a certain feature's measurement falls below a certain value, the measurement frequency is changed, for example, from once a month to once a week (a frequency of once a week).

[0113] In the state determination device 140 according to the second embodiment, the processor 302 functions as a frequency change condition setting unit that sets frequency change conditions, and as a measurement frequency determination unit that determines the measurement frequency of feature quantities based on the set frequency change conditions and feature quantities calculated from the image.

[0114] 《Third Embodiment》 [Specific example 1 of optimizing feature measurement conditions: Changing the threshold] In the third embodiment, an example of a method for changing the abnormality detection threshold to an appropriate value is described. Figure 10 is an explanatory diagram showing an example of a configuration in which multiple CT systems are connected to a maintenance management device 202 via a network 201.

[0115] The maintenance management device 202 collects measured values ​​of various characteristic quantities of each system, as well as status information such as whether or not a system is down, from multiple CT systems 11, 12, ..., 1N via the network 201. Each of the CT systems 11, 12, ..., 1N may have the same configuration as the X-ray CT apparatus 1 described in Figure 1.

[0116] Individual CT systems 11, 12, ..., 1N connected to network 201 transmit their status to an external maintenance management device 202. Each CT system 11, 12, ..., 1N may transmit at least one of the following to the maintenance management device 202: feature values ​​calculated from images, system status, and system operation information.

[0117] The status transmitted from CT systems 11, 12, ... 1N to the maintenance management device 202 may include, for example, the margin of the measured feature quantities, the rotation speed of the slip ring 111, the number of communication failures, and the cleaning date. The number of communication failures here refers to the number of communication failures caused by contamination of the control system's slip ring 111B. The cleaning date is the day the slip ring 111 was cleaned.

[0118] The maintenance management device 202 performs statistical processing on the status collected from each system to optimize and classify various conditions. For optimizing the various conditions, a machine learning model such as a Support Vector Machine (SVM) may be applied. For classifying the various conditions, a clustering algorithm such as the k-means method may be applied. The maintenance management device 202 transmits the optimized conditions to each system via the network 201 and modifies the various judgment conditions.

[0119] For example, if the desired classification cannot be achieved with a pre-set threshold, the maintenance management device 202 uses the data for which the desired classification could not be achieved to perform supervised learning, such as SVM, and resets the threshold.

[0120] Figure 11 is a graph showing an example of default threshold settings. For illustrative purposes, Figure 11 uses a two-dimensional feature space consisting of feature 1 and feature 2, but the actual feature space can be any multi-dimensional. In Figure 11, black circles represent data without system downtime, and "×" marks represent data with system downtime. "System downtime" includes states where the CT system becomes unusable due to contamination of the slip ring 111, etc. Each of the multiple data shown in Figure 11 is supervised data, and the set of these multiple data becomes the training dataset for SVM.

[0121] From this training dataset, as shown in Figure 11, a hyperplane (separation hyperplane) is determined that serves as the boundary for classifying data sets with and without system downtime, and this hyperplane can serve as the default threshold.

[0122] Subsequently, if the desired classification cannot be achieved with this default threshold, the data that could not be classified as desired is used to perform supervised learning, such as SVM, and the threshold is reset.

[0123] Figure 12 shows an example. In addition to the initial training dataset shown in Figure 11, Figure 12 includes data from systems that could not be correctly classified during system operation. This added data would be classified as "no system downtime" if the default threshold were applied, but it represents cases where system downtime actually occurred in the system.

[0124] In such cases, as shown in Figure 13, the maintenance management device 202 performs supervised learning using a dataset that includes data that could not be properly classified, finds a new hyperplane that can properly classify this data, and determines a new threshold.

[0125] Alternatively, as shown in Figure 14, the maintenance management device 202 sets a threshold that yields the desired classification result by changing the feature quantities used for classification.

[0126] Figure 14 shows an example where the combination of feature 1 and feature 2 in Figure 12 has been changed to the combination of feature 3 and feature 4. For illustrative purposes, the data plot points in Figure 12 and Figure 14 appear unchanged, but in reality, because the combination of features (feature space) is different, the data plot points in Figure 14 may differ from those in Figure 12.

[0127] The maintenance management device 202 provides the newly determined thresholds and features to each CT system via the network 201, allowing for changes to the thresholds and features used by each system.

[0128] The hardware configuration of the maintenance management device 202 may be the same as that of the information processing device 300 described in Figure 6. The processor applied to the maintenance management device 202 is an example of the "second processor" in this disclosure.

[0129] The processor of the maintenance management device 202 according to the third embodiment functions as a setting information determination unit that optimizes various conditions, including judgment conditions such as thresholds, based on information obtained from multiple CT systems 11, 12...1N, and determines setting information to be applied to the judgment, and also functions as a setting information provision unit that provides the determined setting information to each system via the network 201.

[0130] 《Fourth Embodiment》 [Specific example 2 of optimizing feature measurement conditions: Changing the measurement frequency] In the fourth embodiment, an example of a method for changing the measurement frequency function to an appropriate function is described. The maintenance management device 202 collects information on the rotational speed and rotational velocity of the slip rings 111 of each system via the network 201. The maintenance management device 202 then classifies the systems using, for example, a k-means clustering method.

[0131] Figure 15 shows a conceptual diagram of the classification. Figure 15 shows example data from nine systems, which are classified into three classes (clusters): "Class 1," "Class 2," and "Class 3." Based on this classification, the maintenance management device 202 calculates the average change in feature quantities for each class.

[0132] Figure 16 is a graph showing the average change in feature quantities for each class. In Figure 16, the dashed line graph FQd represents the default expected value for the change in feature quantities. The solid line graph in Figure 16 shows the average change in feature quantities for systems belonging to class 1, the dashed line graph shows the average change in feature quantities for systems belonging to class 2, and the dotted line graph shows the average change in feature quantities for systems belonging to class 2.

[0133] The maintenance management device 202 compares the assumed value of the change in feature quantities (graph FQd) assumed in the first embodiment and the like with the average value of the change in feature quantities calculated from each class, and changes the measurement frequency function for each class. The average value is an example of a "representative value" in this disclosure.

[0134] Figure 17 shows an example of a measurement frequency function. The measurement frequency function fd shown by the solid line in Figure 17 is the default measurement frequency function determined from the assumed values ​​of feature changes assumed by default. The measurement frequency function shown by the thick solid line and the frequency function shown by the dashed line in Figure 17 are the measurement frequency functions calculated for each class as explained in Figure 16.

[0135] Thus, the set values ​​of the measurement frequency function calculated for each class are fed back to each system of the corresponding class via the network 201. The information on the measurement frequency function provided to each system from the maintenance management device 202 is an example of "condition setting information" in this disclosure. The processor 302 on the CT system side obtains the information on the measurement frequency function from the maintenance management device 202 via the network 201 and changes (updates) the measurement frequency function to be applied.

[0136] The processor of the maintenance management device 202 according to the fourth embodiment functions as a classification unit that classifies systems based on information obtained from a plurality of CT systems 11, 12...1N, and as a measurement frequency condition determination unit that determines an appropriate measurement frequency function for each classified class.

[0137] About the processor In embodiments of this disclosure, each process is performed on any computer. Any computer may perform these processes by a processor, a program, or a combination thereof. Any computer may be a general-purpose computer, a computer designed for a specific purpose, a workstation, or any other hardware element capable of running a program.

[0138] A processor may consist of one or more hardware components, and the type of hardware is not limited. For example, a processor may consist of hardware such as a CPU (Central Processing Unit), MPU (Micro Processing Unit), FPGA (Field Programmable Gate Array) or other programmable logic devices, ASIC (Application Specific Integrated Circuit) or other dedicated circuits for performing specific processing, GPU (Graphic Processing Unit), or NPU (Neural Processing Unit).

[0139] Furthermore, the processor has various units or means that perform the various processes in this embodiment. The hardware may also be a combination of different types of hardware. When multiple hardware components are configured to perform one or more processes of a processor, these components may reside in physically separate devices or in the same device. In any embodiment, the order of the processes performed by the processor is not limited to the order described above and may be changed as appropriate. The hardware is composed of electrical circuits (circuitry) and other components, such as semiconductor elements.

[0140] Furthermore, this embodiment may be implemented by hardware, software, firmware, microcode, or a combination thereof. The software, firmware, and microcode are composed of a program. The program may also be, for example, a group of program modules, each of which may be implemented by a processor configured to perform its respective function. The program may be program code or multiple code segments stored on one or more non-temporary computer-readable media (e.g., storage media or other storage). The program may be divided and stored on multiple non-temporary computer-readable media located on devices that are physically separated from each other. The program code or code segment may represent any combination of procedures, functions, subprograms, routines, subroutines, modules, software packages, classes, or instructions, data structures, or program statements. The program code or code segment may be connected to other code segments or hardware circuits by sending and receiving information, data, arguments, parameters, or memory contents.

[0141] Regarding programs and program products that operate computers: The processing method in the embodiments of this disclosure may be configured as a program or program product for a processor or a computer including a processor, which implements the functions of each step. A program product is a computer-readable medium, which is a tangible, non-temporary information storage medium on which the program is recorded.

[0142] It is possible to record a program that enables a computer to implement some or all of the processing functions of the status determination device 140 and the maintenance management device 202 on a computer-readable medium, such as an optical disk, magnetic disk, or semiconductor memory, which is a tangible, non-temporary information storage medium, and to provide the program through this information storage medium.

[0143] Alternatively, instead of providing programs by storing them on tangible, non-temporary computer-readable media, it is also possible to provide program signals as a download service using telecommunication lines such as the Internet.

[0144] Furthermore, some or all of the processing functions in the status determination device 140 and the maintenance management device 202 may be implemented by cloud computing, and they can also be provided as SaaS (Software as a Service).

[0145] Advantages of the Embodiment The embodiments of this disclosure offer the following advantages.

[0146] [1] According to the condition determination device 140, the degree of contamination of the slip ring 111, the degree of contamination of the groove 154 between the rings, and the amount of deposits such as carbon shavings attached to the groove 154 can be quantitatively determined based on feature quantities calculated from images of the region including the slip ring 111.

[0147] [2] According to the state determination device 140, an image of the area including the slip ring 111 can be displayed on the display device 125, and the surface condition of the slip ring 111 can be visually confirmed.

[0148] [3] If the determination unit 126 determines that maintenance is required, a warning can be issued via the screen of the display device 125.

[0149] [4] According to the condition determination device 140, the slip ring 111A of the power system and the slip ring 111B of the control system and the groove 154 between the rings can be identified from the image obtained from the camera 113, and the degree of contamination of each ring, the degree of contamination of the groove 154, and the amount of deposits can be determined, and the maintenance timing can be predicted based on the determination result.

[0150] [5] With the X-ray CT apparatus 1 incorporating the condition determination device 140, it is possible to self-diagnose the surface condition of the slip ring 111.

[0151] [6] According to the state determination device 140 of the second embodiment, images can be acquired at an appropriate frequency according to the size of the margin between the measured value of the feature quantity and the anomaly determination threshold, and the state of the slip ring 111 can be diagnosed. According to the second embodiment, the state of the slip ring 111 can be diagnosed at an appropriate timing without excess or deficiency.

[0152] [7] According to the maintenance management device 202 of the third embodiment, the judgment conditions in each CT system can be optimized and the judgment accuracy can be improved.

[0153] [8] According to the maintenance management device 202 of the fourth embodiment, an appropriate measurement frequency can be set for each CT system, and the timing of diagnosis can be optimized.

[0154] 《Example 1》 Figure 6 illustrates an example with two types of slip rings: a power system slip ring 111A and a control system slip ring 111B. However, there may be only one type of slip ring. Furthermore, in a configuration with two or more types of slip rings, only a portion of the slip rings may be subject to diagnosis.

[0155] 《Modified Example 2》 The technology of this disclosure can be applied not only to medical imaging devices that can be used as a substitute for X-ray CT scanner 1, but also to various devices equipped with slip rings.

[0156] "others" The configurations and modifications described in each of the above embodiments can be used in appropriate combinations, and some of the modifications can also be replaced. This disclosure is not limited to the embodiments described above, and various modifications are possible without departing from the spirit of the technical idea of ​​this disclosure. [Explanation of Symbols]

[0157] 1 X-ray CT device 11,12,1N CT System 100 Scan Gunner Unit 101 X-ray tube 102 Rotating Discs 103 Collimator 104 Opening 105 berths 106 X-ray detector 107 Data acquisition device 108 Gantry Control Device 109 Bed control device 110 X-ray control device 111 Slip Rings 111A Power System Slip Ring 111B Slip rings for control systems 112,112A,112B Lighting equipment 113 Camera 114 Light-blocking guard 116 Half Mirror 120 Control console 121 Input device 122 Image Processing Unit 123 Storage device 124 System Control Unit 125 Display device 126 Judgment section 140 State determination device 150 Power System Slip Ring Section 152 Control system slip ring section 154 Groove 201 Network 202 Maintenance Management Device 300 Information Processing Devices 302 Processors 304 memory 306 storage 308 Input / Output Interfaces 310 Bus 312 Input device 314 Display device FQd graph fd Measurement frequency function IM image Steps for changing the measurement frequency of features (S11-S13)

Claims

1. A lighting device that illuminates the slip ring with light, A camera that photographs the area including the slip ring, A processor that recognizes an image acquired via the camera and determines the state of an object based on the recognition result of the image, A state determination device equipped with the following features.

2. The state of the object includes at least one of the following: the degree of contamination of the slip ring, the degree of contamination of the inter-ring region of the slip ring, and the amount of deposits in the inter-ring region. The state determination device according to claim 1.

3. The aforementioned processor, Calculate features from the aforementioned image, Based on the aforementioned features and the set threshold, the need for maintenance is determined. The state determination device according to claim 1.

4. The device includes a storage device that stores at least one of the following: the image, the feature quantity calculated from the image, the threshold value, and the state determination result. The state determination device according to claim 3.

5. The aforementioned processor, The information stored in the aforementioned storage device is notified to an external device via the network. The state determination device according to claim 4.

6. Depending on the type of slip ring, different thresholds are set. The state determination device according to claim 3.

7. The above image shows a power system slip ring that transmits power, Including at least one of a control system slip ring that transmits signals, The state determination device according to claim 1.

8. The aforementioned image includes the grooves in the inter-ring region of the slip ring. The state determination device according to claim 1.

9. The color of the inter-ring region of the slip ring is a color other than black. The state determination device according to claim 1.

10. The aforementioned image was captured using diffuse light. The state determination device according to claim 1.

11. The lighting device irradiates light onto the area including the slip ring from an oblique direction. The state determination device according to claim 10.

12. The area including the slip ring is provided with a plurality of illumination devices that irradiate light from a plurality of directions. The state determination device according to claim 10.

13. The lighting device is equipped with a light-shielding guard to suppress the direct incidence of light onto the camera. The state determination device according to claim 10.

14. The aforementioned image is captured by specular reflection. The state determination device according to claim 1.

15. The lighting device and the slip ring are positioned and include a half-mirror that reflects the specularly reflected light from the slip ring toward the camera, The state determination device according to claim 14.

16. The aforementioned processor, If an abnormality is detected in the aforementioned object, a warning will be issued. The state determination device according to claim 1.

17. The system includes a display device that displays the result of determining the aforementioned state. The state determination device according to claim 1.

18. The slip ring is provided on a rotating member that rotates around the subject in a medical imaging device. The state determination device according to claim 1.

19. The aforementioned processor, Based on the features calculated from the aforementioned image, the frequency of acquiring the image is determined. The state determination device according to claim 1.

20. The aforementioned processor, Set conditions to change the frequency of acquiring the aforementioned images, If the aforementioned feature satisfies the aforementioned conditions, the frequency of image acquisition is changed. The state determination device according to claim 19.

21. The aforementioned processor, The image acquisition frequency is changed according to the difference between the aforementioned feature and a set threshold. The state determination device according to claim 19.

22. The aforementioned processor, The condition setting information that defines the above conditions is obtained via the network, The conditions are changed based on the aforementioned condition setting information. The state determination device according to claim 20.

23. A maintenance management device connected via a network to a system comprising a status determination device according to any one of claims 1 to 22, The system comprises a second processor different from the first processor, which is included in each of the multiple systems, The second processor is, Information is acquired from the multiple systems via the aforementioned network. Based on the information obtained from the plurality of systems, the setting information to be applied to the determination in the system is determined. The aforementioned configuration information is provided to the system via the network. Maintenance management device.

24. The information acquired by the second processor from the plurality of systems includes at least one of the following: the value of a feature calculated from the image of the system, the status of the system, and the operation information of the system. The setting information includes at least one of the following: the threshold used for the determination, the type of feature used for the determination, the frequency of image acquisition, and the conditions for changing the frequency of image acquisition. The maintenance management device according to claim 23.

25. The second processor is, The values ​​of the feature quantities and the status indicating whether or not a system is down are obtained from the plurality of systems. Based on the acquired feature values ​​and the dataset including the status, determine at least one of the threshold used for the determination and the type of feature used for the determination. The maintenance management device according to claim 24.

26. The operation information of the system includes information on the number of rotations and rotational speed of the rotating member on which the slip ring is provided in the system. The second processor obtains information on the rotational speed and rotational velocity of each of the plurality of systems, and the value of the feature quantity from each of the plurality of systems. The information on the rotational speed and rotational speed is used to classify the multiple systems into categories. For each of the aforementioned classified systems, a representative value of the change in the feature quantity is calculated. Based on the comparison result between the aforementioned representative value and the assumed value of the amount of change that serves as the standard, the conditions for changing the image acquisition frequency are determined for each class. The maintenance management device according to claim 24.

27. An X-ray source that irradiates the subject with X-rays, An X-ray detector positioned opposite the X-ray source and detecting X-rays that have passed through the subject, A rotating member that mounts the X-ray source and the X-ray detector and rotates around the subject, A slip ring provided on the rotating member, A lighting device that illuminates the slip ring with light, A camera that photographs the area including the slip ring, A processor that recognizes an image acquired via the camera and determines the state of an object based on the recognition result of the image, An X-ray CT scanner equipped with [a specific feature].

28. Equipped with a processor, The aforementioned processor, An image was taken of the region containing the slip ring. Recognizing the aforementioned image, Based on the recognition results of the aforementioned image, the state of the object is determined. Information processing device.

29. On the computer, A function to acquire images of the region containing the slip ring, The function for recognizing the aforementioned image, A function to determine the state of the object based on the recognition results of the aforementioned image, A program that makes this possible.

Images