Withstand voltage test circuits for equipment, methods, apparatus, equipment, and storage media.

Abstract

This invention provides a withstand voltage test circuit that solves the problem of difficulty in accurately measuring resonance points, which makes it difficult to conduct withstand voltage tests on electrical equipment. [Solution] The test area for electrical equipment includes a voltage regulation module 10, a protection module 20, and a high-voltage module 30. The voltage regulation module and the protection module are connected in parallel, the protection module and the high-voltage module are connected in parallel, and the test electrical equipment and the high-voltage module are connected in parallel. Because the withstand voltage test circuit of the equipment is connected in parallel, when the withstand voltage test circuit of the equipment reaches its resonance point, the total impedance of the withstand voltage test circuit of the equipment becomes the minimum value. If the total impedance of the withstand voltage test circuit of the equipment is monitored to be at its minimum value, the resonance point can be found. Therefore, the resonance point can be easily identified in the withstand voltage test circuit of equipment connected in parallel, and the difficulty of withstanding voltage testing of electrical equipment is further reduced.

Description

Technical Field

[0001] The present disclosure relates to the field of testing electrical equipment, and particularly relates to a withstand voltage test circuit for equipment, its method, apparatus, equipment, and storage medium.

Background Art

[0002] During operation, electrical equipment not only receives the action of the operating voltage over a long period but also receives the action of various overvoltages that may occur in the power system. In the withstand voltage test of electrical equipment, by generating a test voltage that simulates these action voltages, the ability of the electrical equipment to withstand the test voltage can be verified. Therefore, the withstand voltage test of electrical equipment is an important measure to verify whether the electrical equipment meets the operating conditions, prevent damage to the electrical equipment, and ensure the safe operation of the system.

[0003] In the technology related to the withstand voltage test of equipment, an inductor, a capacitor, and a resistor are connected in series to form a series circuit, and the withstand voltage test of electrical equipment is carried out using the high voltage generated at the resonance point of the series circuit. However, when the capacitance of the series circuit does not match the capacitance of the electrical equipment, it is difficult to accurately measure the resonance point, making it difficult to carry out the withstand voltage test on the electrical equipment.

Summary of the Invention

[0004] The present disclosure provides a withstand voltage test circuit for equipment, its method, apparatus, equipment, and storage medium. Its main purpose is to solve the problem that it is difficult to accurately measure the resonance point and difficult to carry out the withstand voltage test on electrical equipment.

[0005] According to a first aspect of the present disclosure, a withstand voltage test circuit for equipment is provided, including a voltage adjustment module, a protection module, and a high voltage module. The voltage adjustment module and the protection module are connected in parallel, the protection module and the high voltage module are connected in parallel. The test electrical equipment and the high voltage module are connected in parallel. The voltage adjustment module is used to adjust the voltage input to the test electrical equipment, the protection module is used to control the current input to the test electrical equipment, and the high-voltage module is used to measure the resonance point of the test electrical equipment and generate a high voltage based on the resonance point, where the voltage is highest.

[0006] The voltage regulation module may optionally include a voltage regulator and a transformer. The voltage regulator and the transformer are connected in series, and the transformer and the protection module are connected in parallel.

[0007] The protection module may optionally include a first resistor, a second resistor, and a sphere gap. The first resistor and the voltage adjustment module are connected in series, the first resistor and the second resistor are connected in parallel, the second resistor and the sphere gap are connected in series, and the sphere gap and the voltage adjustment module are connected in parallel. The first resistor and the high-voltage module are connected in parallel, the second resistor and the high-voltage module are connected in parallel, and the sphere gap and the high-voltage module are connected in parallel.

[0008] The high-voltage module may optionally include a reactor, a first capacitor, a second capacitor, and a voltmeter. The reactor and the protection module are connected in parallel, and the reactor and the test electrical equipment are connected in parallel. The test electrical equipment and the first capacitor are connected in parallel, the first capacitor and the second capacitor are connected in series, and the second capacitor and the test electrical equipment are connected in parallel. The voltmeter and the second capacitor are connected in parallel.

[0009] A second aspect of this disclosure provides a method for testing the withstand voltage of equipment, the method being applied to the withstand voltage test circuit of equipment described in the first aspect above. A step of monitoring the first capacitive reactance value of the first capacitor and the second capacitive reactance value of the second capacitor in the high-voltage module of the equipment in the withstand voltage test circuit of the equipment, and monitoring the inductive reactance value of the reactor of the high-voltage module, wherein the withstand voltage test circuit of the equipment and the test electrical equipment are connected in parallel, and the step of monitoring the first capacitive reactance value of the first capacitor and the second capacitive reactance value of the second capacitor in the high-voltage module in the withstand voltage test circuit of the equipment, wherein the withstand voltage test circuit of the equipment and the test electrical equipment are connected in parallel, A step of determining that the withstand voltage test circuit of the equipment has reached a resonance point when the sum of the inductive reactance value and the capacitive reactance value is equal, wherein the sum of the capacitive reactance values ​​is the sum of the first capacitive reactance value and the second capacitive reactance value, When it is determined that the withstand voltage test circuit of the equipment has reached the resonance point, the steps are to obtain the voltage value of the second capacitor, and to obtain the first capacitance value of the first capacitor and the second capacitance value of the second capacitor, The procedure includes the steps of calculating the voltage value of the first capacitor based on the voltage value of the second capacitor, the first capacitance value, and the second capacitance value, and determining the voltage value of the first capacitor as the withstand voltage value of the test electrical equipment.

[0010] The step of calculating the voltage value of the first capacitor based on the voltage value of the second capacitor, the first capacitance value, and the second capacitance value described above, is as follows: The steps include performing a quotient calculation between the first capacity value and the second capacity value to obtain the quotient result, The method includes the step of performing a product calculation between the voltage value of the second capacitor and the quotient result to obtain the voltage value of the first capacitor.

[0011] According to a third aspect of this disclosure, a pressure resistance testing apparatus for equipment is provided, A monitoring unit used to monitor the first capacitive reactance value of the first capacitor and the second capacitive reactance value of the second capacitor in the high-voltage module of the equipment in the withstand voltage test circuit of the equipment, and to monitor the inductive reactance value of the reactor of the high-voltage module, wherein the withstand voltage test circuit of the equipment and the test electrical equipment are connected in parallel, the monitoring unit and A first determination unit used to determine that the withstand voltage test circuit of the equipment has reached a resonance point when the sum of the inductive reactance value and the capacitive reactance value is equal, wherein the sum of the capacitive reactance values ​​is the sum of the first capacitive reactance value and the second capacitive reactance value, When it is determined that the withstand voltage test circuit of the equipment has reached the resonance point, an acquisition unit is used to acquire the voltage value of the second capacitor, and the first capacitance value of the first capacitor and the second capacitance value of the second capacitor, The system includes a second determination unit used to calculate the voltage value of the first capacitor based on the voltage value of the second capacitor, the first capacitance value, and the second capacitance value, and to determine the voltage value of the first capacitor as the withstand voltage value of the test electrical equipment.

[0012] Selectable, the second decision unit, Includes a calculation module used to perform a quotient calculation between the first capacity value and the second capacity value and to obtain a quotient result, The calculation module is further used to perform a product calculation between the voltage value of the second capacitor and the quotient result to obtain the voltage value of the first capacitor.

[0013] According to a fourth aspect of this disclosure, an electronic device is provided, At least one processor, The system comprises a memory that is communicably connected to at least one of the processors, The memory stores instructions that can be executed by the at least one processor, and by executing the instructions, the at least one processor can perform the method according to the second embodiment.

[0014] According to a fifth aspect of this disclosure, a non-temporary computer-readable storage medium is provided in which computer instructions are stored, the computer instructions are used to cause the computer to perform the method described in the second aspect described above.

[0015] According to a sixth aspect of this disclosure, a computer program product including a computer program is provided, and when the computer program is executed by a processor, the method described in the second aspect is realized.

[0016] The present disclosure provides a withstand voltage test circuit for equipment, a method, apparatus, equipment, and a memory medium, comprising a voltage regulating module, a protection module, and a high-voltage module, wherein the voltage regulating module and the protection module are connected in parallel, the protection module and the high-voltage module are connected in parallel, the test electrical equipment and the high-voltage module are connected in parallel, the voltage regulating module is used to regulate the voltage input to the test electrical equipment, the protection module is used to control the current input to the test electrical equipment, and the high-voltage module is used to measure the resonance point of the test electrical equipment and generate a high voltage based on the resonance point, where the voltage at the resonance point is the highest. Compared to related technologies, because the withstand voltage test circuit for equipment is connected in parallel, when the withstand voltage test circuit for equipment reaches the resonance point, the total impedance of the withstand voltage test circuit for equipment becomes the minimum value, and if the total impedance of the withstand voltage test circuit for equipment is monitored to be the minimum value, the resonance point can be found, and therefore the resonance point can be easily identified in a withstand voltage test circuit for equipment connected in parallel, and the difficulty of withstanding the electrical equipment is further reduced.

[0017] It should be understood that the contents of this section are not intended to identify important or key features of the embodiments of this application, nor are they intended to limit the scope of this application. Other features of this application will be readily apparent from the following description. [Brief explanation of the drawing]

[0018] The drawings are provided to facilitate understanding of the present solution and do not limit the present disclosure. [Figure 1]It is a schematic diagram showing the structure of a pressure resistance test circuit of a device provided by an embodiment of the present disclosure. [Figure 2] It is a flowchart of a pressure resistance test method for a device provided by an embodiment of the present disclosure. [Figure 3] It is a schematic diagram showing the structure of a pressure resistance test device for a device provided by an embodiment of the present disclosure. [Figure 4] It is a schematic diagram showing the structure of a pressure resistance test device for another device provided by an embodiment of the present disclosure. [Figure 5] It is a block diagram of an example of an electronic device provided by an embodiment of the present disclosure.

Embodiments for Carrying Out the Invention

[0019] Hereinafter, representative embodiments of the present disclosure will be described with reference to the drawings. However, they include various details related to the embodiments of the present disclosure for the purpose of assisting understanding, and these should be understood as merely exemplary. Therefore, those skilled in the art should recognize that various changes and modifications can be made to the embodiments described here without departing from the scope and spirit of the present disclosure. Similarly, for the sake of clarity and brevity, descriptions of well-known functions and structures are omitted in the following description.

[0020] The embodiments of the present disclosure are not comprehensive and are merely examples of some embodiments, and do not specifically limit the protection scope of the present disclosure. If there is no contradiction, each step in a specific embodiment can be implemented as an independent embodiment, and can be arbitrarily combined among each step. For example, a solution excluding some steps in a specific embodiment can also be implemented as an independent embodiment, and the order of each step in a specific embodiment can be arbitrarily exchanged. Also, any implementation manner in a specific embodiment can be arbitrarily combined, and further, each embodiment can be arbitrarily combined with each other. For example, some or all steps of different embodiments can be arbitrarily combined, and a specific embodiment can be arbitrarily combined with the implementation manner of other embodiments.

[0021] In each embodiment disclosed herein, unless otherwise specified and without logical inconsistency, the terminology and / or descriptions used between embodiments are consistent and mutually referential, and technical features disclosed in different embodiments can be combined based on their inherent logical relationships to form new embodiments.

[0022] The terms used in the embodiments of this disclosure are for illustrative purposes only and do not limit the disclosure.

[0023] In the embodiments of this disclosure, unless otherwise specified, elements expressed in the singular form, such as "one," "a kind," "the," "above," "below," "as mentioned above," and "this," may mean "one and unique," or they may mean "one or more," "at least one," etc. For example, when articles such as "a," "an," and "the" are used in translation, the noun following such an article may be understood as singular or plural.

[0024] In some examples, terms such as "depending on," "depending on the decision," "in the case of," "when," "at the time," "if," and "in the event of" are interchangeable.

[0025] In some embodiments, terms such as “greater,” “greater or equal to,” “not less,” “more,” “more or equal to,” “not less,” “higher,” “higher or equal to,” “not lower,” and “greater than or equal to,” are interchangeable with each other, and terms such as “smaller,” “smaller or equal to,” “not greater,” “less,” “less or equal to,” “not more,” “lower,” “lower or equal to,” “not higher,” and “less than or equal to,” are interchangeable with each other.

[0026] The prefixes such as "First," "Second," etc., in the embodiments of this disclosure are merely for distinguishing different subjects of description and do not limit the location, order, priority, number, or content of the subjects of description. Descriptions of the subjects of description should refer to the descriptions in the claims or the context of the embodiments, and the use of prefixes should not be interpreted as creating an excessive limitation.

[0027] In the embodiments of this disclosure, "multiple" means two or more.

[0028] In the embodiments of this disclosure, terms such as “import,” “input,” and “read” are interchangeable.

[0029] In some embodiments, devices and the like can be interpreted both substantively and virtually, and their names are not limited to those listed in the embodiments. Terms such as "device," "equipment," "device," "circuit," "network element," "node," "function," "unit," "section," "system," "network," "chip," "chip system," "entity," and "subject" are interchangeable.

[0030] In some embodiments, terms such as "terminal," "terminal device," "user equipment (UE)," "user terminal," "mobile station (MS)," "mobile terminal (MT)," subscriber station, mobile unit, subscriber unit, wireless unit, remote unit, mobile device, wireless device, wireless communication device, remote device, mobile subscriber station, access terminal, mobile terminal, wireless terminal, remote terminal, handset, user agent, mobile client, and client are interchangeable.

[0031] While the following description provides many specific details to fully understand this disclosure, it is also possible to implement this disclosure in ways other than those described herein, and obviously the examples described in the specification are only a selection of the examples of this disclosure and do not encompass all examples.

[0032] The following describes, with reference to the drawings, the withstand voltage test circuit, method, apparatus, equipment, and memory medium of the equipment according to the embodiments of this disclosure.

[0033] Figure 1 is a schematic diagram showing the structure of a withstand voltage test circuit of equipment provided by an embodiment of the present disclosure, and as shown in Figure 1, the withstand voltage test circuit of the equipment includes a voltage regulation module, a protection module, and a high-voltage module.

[0034] To facilitate understanding of the embodiments of this disclosure, a schematic diagram of the structure of a withstand voltage test circuit for equipment including a voltage regulating module, a protection module, and a high-voltage module, shown in Figure 1, is given as an example, where the voltage regulating module 10 and the protection module 20 are connected in parallel, the protection module 20 and the high-voltage module 30 are connected in parallel, the test electrical equipment 40 and the high-voltage module 30 are connected in parallel, the voltage regulating module 10 is used to adjust the voltage input to the test electrical equipment 40, the protection module 20 is used to control the current input to the test electrical equipment 40, and the high-voltage module 30 is used to measure the resonance point of the test electrical equipment 40 and generate a high voltage based on the resonance point, where the voltage at the resonance point is the highest.

[0035] The resonance point refers to a specific frequency point in a withstand voltage test circuit where the impedance values ​​of the inductance (inductive reactance) and capacitance (capacitive reactance) of a high-voltage module are equal. In AC circuits, the impedance of an inductance is proportional to the frequency, and the impedance of a capacitor is inversely proportional to the frequency. When the impedance values ​​of both are equal, the circuit reaches a resonant state. At this point, the total impedance of the circuit is at its minimum, the current is at its maximum, and in a series resonant circuit, the voltage reaches its highest value.

[0036] In withstand voltage testing, finding the resonance point is crucial because it allows the highest voltage to be applied to the test electrical equipment, thereby effectively testing its withstand voltage performance. By adjusting the inductance and capacitance values ​​in the circuit, the frequency of the resonance point can be changed, making it possible to accommodate the withstand voltage testing requirements of different test electrical equipment.

[0037] A withstand voltage test circuit for equipment provided by this disclosure includes a voltage regulating module, a protection module, and a high-voltage module, wherein the voltage regulating module and the protection module are connected in parallel, the protection module and the high-voltage module are connected in parallel, the test electrical equipment and the high-voltage module are connected in parallel, the voltage regulating module is used to regulate the voltage input to the test electrical equipment, the protection module is used to control the current input to the test electrical equipment, and the high-voltage module is used to measure the resonance point of the test electrical equipment and generate a high voltage based on the resonance point, where the voltage at the resonance point is the highest. Compared to related technologies, because the withstand voltage test circuit for equipment is connected in parallel, when the withstand voltage test circuit for equipment reaches the resonance point, the total impedance of the withstand voltage test circuit for equipment becomes the minimum value, and if the total impedance of the withstand voltage test circuit for equipment is monitored to be the minimum value, the resonance point can be found, and therefore the resonance point can be easily identified in a withstand voltage test circuit for equipment connected in parallel, and the difficulty of withstanding voltage testing of electrical equipment is further reduced.

[0038] In some embodiments, continuing to refer to Figure 1, the voltage regulation module 10 includes a voltage regulator 101 and a transformer 102. The voltage regulator 101 and the transformer 102 are connected in series, and the transformer 102 and the protection module 20 are connected in parallel.

[0039] The primary function of a voltage regulator is to regulate voltage. In a withstand voltage test circuit, a voltage regulator is used to adjust the voltage level input to the test electrical equipment. By changing the settings of the voltage regulator, the voltage applied to the test equipment can be precisely controlled, and various operating conditions or test requirements can be simulated. This is crucial for ensuring the accuracy and effectiveness of the test, as it allows the test operator to apply a specific voltage level as needed. A transformer is an electrical device used to change voltage and operates on the principle of electromagnetic induction. In a withstand voltage test circuit, a transformer is connected in series with a voltage regulator to further regulate the voltage. A transformer can increase or decrease the voltage depending on the specific requirements of the test. In withstand voltage testing, transformers are typically used to increase the voltage to a predetermined test level, or, in some cases, to decrease the voltage for the purpose of conducting a safer test. Transformers can also provide electrical isolation, that is, they can improve safety by providing insulation between the primary and secondary sides, which is particularly noticeable when dealing with high voltages.

[0040] By connecting a voltage regulator and a transformer in series, they can work together to regulate voltage. The voltage regulator first pre-regulates the input voltage and can flexibly change the output voltage within a certain range. This pre-regulated voltage then functions as the input voltage for the transformer. The transformer further modifies the voltage based on its turns ratio. For example, if the voltage regulator steps down or steps up the input commercial power voltage (e.g., 220V) to an intermediate value, the transformer can convert this intermediate voltage to a value close to the withstand voltage test voltage required by the electrical equipment being tested, according to its own transformation ratio. This series connection method enables a more precise and wider voltage regulation range, allowing it to meet the testing requirements of electrical equipment with different withstand voltage levels.

[0041] In some embodiments, continuing with reference to Figure 1, the protection module 20 includes a first resistor 201, a second resistor 202, and a sphere gap 203. The first resistor 201 and the voltage adjustment module 10 are connected in series, the first resistor 201 and the second resistor 202 are connected in parallel, the second resistor 202 and the sphere gap 203 are connected in series, the sphere gap 203 and the voltage adjustment module 10 are connected in parallel, the first resistor 201 and the high-voltage module 30 are connected in parallel, the second resistor 202 and the high-voltage module 30 are connected in parallel, and the sphere gap 203 and the high-voltage module 30 are connected in parallel.

[0042] The first resistor is a component of the protection module, connected in series with the voltage regulation module, meaning it is located between the voltage regulation module and the protection module, and is used to limit current. When current flows through the first resistor, the resistor consumes some power, thereby reducing the current flowing through the subsequent circuit. Furthermore, the first resistor is connected in parallel with the second resistor, forming a shunt path that helps distribute current between different circuit parts. The second resistor is also part of the protection module, connected in parallel with the first resistor and in series with the sphere gap. The role of the second resistor is to provide another current limiting and shunt path. In a parallel circuit, the second resistor helps to share the current load of the first resistor, thereby preventing the circuit from being damaged by excessive current. The sphere gap is a protective device, usually consisting of two or more spherical electrodes with a certain gap between them. The main role of the sphere gap is to provide protection in the event of an overvoltage condition. If the voltage exceeds the design threshold of the sphere gap, an arc discharge occurs in the sphere gap, causing it to break down. As a result, current can flow, protecting the circuit by allowing the release of overvoltage energy. The sphere gap is connected in parallel with the first and second resistors, meaning that under normal operating conditions, current mainly flows through the resistors, and under overvoltage conditions, the sphere gap activates to provide protection.

[0043] In the protection module, by connecting the first resistor, the second resistor, and the sphere gap in parallel, the resonance point can be precisely measured without interfering with voltage regulation.

[0044] In some embodiments, continuing to refer to Figure 1, the high-voltage module 30 includes a reactor 301, a first capacitor 302, a second capacitor 303, and a voltmeter 304. The reactor 301 and the protection module 20 are connected in parallel, the reactor 301 and the test electrical equipment 40 are connected in parallel, the test electrical equipment 40 and the first capacitor 302 are connected in parallel, the first capacitor 302 and the second capacitor 303 are connected in series, the second capacitor 303 and the test electrical equipment 40 are connected in parallel, and the voltmeter 304 and the second capacitor 303 are connected in parallel.

[0045] Reactors are used to limit current or adjust the phase of a circuit. Their function is to control the flow of current in an AC circuit by providing inductive reactance through the action of inductance. In withstand voltage test circuits, reactors are connected in parallel with protective modules and test electrical equipment and are primarily used to regulate current and voltage, thereby preventing excessive current during the test process and contributing to the formation of resonant conditions.

[0046] The first capacitor is one of the capacitors in the withstand voltage test circuit and is connected in parallel with the test electrical equipment. The role of the first capacitor is to store power and provide capacitive reactance to the circuit. It is connected in series with the second capacitor and contributes to the formation of a resonant circuit, thereby enabling the generation of a high voltage at the resonant point. By adjusting the capacitance value, the resonant frequency of the circuit can be affected, and the effectiveness of the withstand voltage test can be optimized.

[0047] The second capacitor is also a capacitor in a voltage test circuit, typically connected in series with the first capacitor and in parallel with the test electrical equipment. Like the first capacitor, the second capacitor's role is primarily to store power and provide capacitive reactance. Under resonant conditions, the second capacitor works in conjunction with the first capacitor to help the circuit reach its resonant point and generate the highest voltage.

[0048] A voltmeter is a measuring instrument used to measure the voltage in a circuit. In a withstand voltage test circuit, the voltmeter is connected in parallel with the second capacitor and is primarily used to monitor the voltage value of the second capacitor in real time. By measuring the value displayed on the voltmeter, the voltage level at which the circuit is at its resonance point can be obtained, thereby allowing evaluation of the withstand voltage performance of the test electrical equipment.

[0049] By monitoring the capacitive reactance values ​​of the first and second capacitors, as well as the inductive reactance value of the reactor, the conditions under which the circuit reaches its resonance point can be precisely determined. At the resonance point, the voltage value of the first capacitor can be calculated based on the voltage and capacitance values ​​of the second capacitor, and this voltage value represents the withstand voltage of the test electrical equipment.

[0050] According to embodiments of the present disclosure, the present disclosure further provides a method for testing equipment withstand voltage, as shown in Figure 2, which is a flowchart of the method for testing equipment withstand voltage provided by embodiments of the present disclosure, the method being applied to a withstand voltage test circuit for equipment and comprising the following steps 501 to 504.

[0051] Step 501: The first capacitive reactance value of the first capacitor and the second capacitive reactance value of the second capacitor in the high-voltage module of the equipment's withstand voltage test circuit are monitored, and the inductive reactance value of the reactor in the high-voltage module is monitored, and the equipment's withstand voltage test circuit and the test electrical equipment are connected in parallel.

[0052] The formula for calculating the capacitive reactance value can be realized by equation (1).

[0053] TIFF2026114938000002.tif14170 Here, TIFF2026114938000003.tif5170 is a capacitive reactance value, TIFF2026114938000004.tif6170 is the frequency of AC power, TIFF2026114938000005.tif5170 is the capacitance value of a capacitor.

[0054] The formula for calculating the inductive reactance value can be realized by equation (2).

[0055] TIFF2026114938000006.tif10170 Here, TIFF2026114938000007.tif6170 is an inductive reactance value, TIFF2026114938000008.tif6170 is the frequency of AC power, TIFF2026114938000009.tif5170 is the inductance value of the reactor.

[0056] By monitoring the capacitive reactance of the capacitor and the inductive reactance of the inductor, it is possible to determine whether or not the circuit will reach its resonance point. At the resonance point, the sum of the inductive reactance of the inductor and the capacitive reactance of the capacitor becomes equal, at which point the total impedance of the circuit is at its minimum and the voltage reaches its maximum.

[0057] Step 502: When the sum of the inductive reactance value and the capacitive reactance value is equal, it is determined that the withstand voltage test circuit of the equipment has reached its resonance point, and the sum of the capacitive reactance values ​​is the sum of the first capacitive reactance value and the second capacitive reactance value.

[0058] By adjusting the frequency of the AC current until the sum of the inductive reactance and capacitive reactance values ​​is equal, and conducting the test at the resonance point, the insulation performance and high-voltage environmental resistance of electrical equipment can be evaluated more accurately, thereby improving the accuracy of the withstand voltage test.

[0059] Step 503: If it is determined that the withstand voltage test circuit of the equipment has reached the resonance point, the voltage value of the second capacitor is obtained, and the first capacitance value of the first capacitor and the second capacitance value of the second capacitor are obtained.

[0060] The capacitance values ​​of the first and second capacitors are typically preset parameters and can be determined during the circuit design phase based on test requirements and circuit configuration.

[0061] Step 504: Based on the voltage value of the second capacitor, the first capacitance value, and the second capacitance value, the voltage value of the first capacitor is calculated, and the voltage value of the first capacitor is determined as the withstand voltage value of the test electrical equipment.

[0062] The formula for calculating the voltage value of the first capacitor can be realized by formula (3).

[0063] TIFF2026114938000010.tif14170 Here, TIFF2026114938000011.tif5170 is the voltage value of the first capacitor, TIFF2026114938000012.tif5170 is the voltage value of the second capacitor, TIFF2026114938000013.tif5170 is the first volume value, TIFF2026114938000014.tif5170 is the second volume value.

[0064] In actual power system operation, electrical equipment faces a variety of complex voltage conditions. The withstand voltage values ​​determined by this calculation method can simulate the tolerance capability of electrical equipment in overvoltage conditions that may occur.

[0065] A method for withstanding voltage testing of equipment provided by this disclosure includes a voltage regulating module, a protection module, and a high-voltage module, wherein the voltage regulating module and the protection module are connected in parallel, the protection module and the high-voltage module are connected in parallel, the test electrical equipment and the high-voltage module are connected in parallel, the voltage regulating module is used to regulate the voltage input to the test electrical equipment, the protection module is used to control the current input to the test electrical equipment, and the high-voltage module is used to measure the resonance point of the test electrical equipment and generate a high voltage based on the resonance point, where the voltage at the resonance point is the highest. Compared to related technologies, since the withstanding voltage test circuit of equipment is connected in parallel, when the withstanding voltage test circuit of equipment reaches the resonance point, the total impedance of the withstanding voltage test circuit of equipment becomes the minimum value, and if the total impedance of the withstanding voltage test circuit of equipment is monitored to be the minimum value, the resonance point can be found, and therefore the resonance point can be easily identified in a withstanding voltage test circuit of equipment connected in parallel, and the difficulty of withstanding voltage testing of electrical equipment is further reduced.

[0066] As an implementation of step 504, calculating the voltage value of the first capacitor based on the voltage value of the second capacitor, the first capacitance value, and the second capacitance value described above can be achieved using the following method, namely, performing a quotient calculation between the first capacitance value and the second capacitance value, obtaining the quotient result, and then performing a product calculation between the voltage value of the second capacitor and the quotient result to obtain the voltage value of the first capacitor, but is not limited to this method.

[0067] Specifically, the implementation process of this embodiment is structured as a literal description of equation (3).

[0068] Based on the above, the embodiments of this disclosure can achieve the following effects: Since the withstand voltage test circuits of the equipment are connected in parallel, when the withstand voltage test circuits reach their resonance point, the total impedance of the withstand voltage test circuits becomes minimum. By monitoring that the total impedance of the withstand voltage test circuits is at its minimum, the resonance point can be found. Therefore, the resonance point can be easily identified in withstand voltage test circuits of equipment connected in parallel, and the difficulty of withstanding voltage testing of electrical equipment is further reduced.

[0069] Corresponding to the pressure resistance testing method for the equipment described above, the present invention further proposes a pressure resistance testing apparatus for equipment. Since the apparatus embodiments of the present invention correspond to the method embodiments described above, details not disclosed in the apparatus embodiments can be referred to the method embodiments described above and will not be repeated in the present invention.

[0070] Figure 3 is a schematic diagram showing the structure of a pressure resistance test apparatus provided by an embodiment of the present disclosure, as shown in Figure 3, A monitoring unit used to monitor the first capacitive reactance value of the first capacitor and the second capacitive reactance value of the second capacitor of the high-voltage module in the withstand voltage test circuit of the equipment, and to monitor the inductive reactance value of the reactor of the high-voltage module, wherein the withstand voltage test circuit of the equipment and the test electrical equipment are connected in parallel, comprising the monitoring unit 61, A first determination unit used to determine that the withstand voltage test circuit of the equipment has reached a resonance point when the sum of the inductive reactance value and the capacitive reactance value is equal, wherein the sum of the capacitive reactance values ​​is the sum of the first capacitive reactance value and the second capacitive reactance value, the first determination unit 62 When it is determined that the withstand voltage test circuit of the equipment has reached the resonance point, an acquisition unit 63 is used to acquire the voltage value of the second capacitor, and to acquire the first capacitance value of the first capacitor and the second capacitance value of the second capacitor, The system includes a second determination unit 64 used to calculate the voltage value of the first capacitor based on the voltage value of the second capacitor, the first capacitance value, and the second capacitance value, and to determine the voltage value of the first capacitor as the withstand voltage value of the test electrical equipment.

[0071] The equipment withstand voltage test apparatus provided by this disclosure includes a voltage regulating module, a protection module, and a high-voltage module, wherein the voltage regulating module and the protection module are connected in parallel, the protection module and the high-voltage module are connected in parallel, the test electrical equipment and the high-voltage module are connected in parallel, the voltage regulating module is used to regulate the voltage input to the test electrical equipment, the protection module is used to control the current input to the test electrical equipment, and the high-voltage module is used to measure the resonance point of the test electrical equipment and generate a high voltage based on the resonance point, where the voltage at the resonance point is the highest. Compared to related technologies, since the equipment withstand voltage test circuit is connected in parallel, when the equipment withstand voltage test circuit reaches the resonance point, the total impedance of the equipment withstand voltage test circuit becomes the minimum value, and if the total impedance of the equipment withstand voltage test circuit is monitored to be the minimum value, the resonance point can be found, and therefore the resonance point can be easily identified in the equipment withstand voltage test circuit connected in parallel, and the difficulty of the electrical equipment for withstand voltage testing is further reduced.

[0072] Furthermore, in a possible implementation of this embodiment, as shown in Figure 4, the second decision unit 64 is It includes a calculation module 641 used to perform a quotient calculation between the first capacity value and the second capacity value and to obtain a quotient result, The calculation module 641 is further used to perform a product calculation between the voltage value of the second capacitor and the quotient result to obtain the voltage value of the first capacitor.

[0073] Furthermore, the description of the above-mentioned method embodiments is applicable to the apparatus of the embodiments of this disclosure as the principle is the same, and is not limited to the embodiments of this disclosure.

[0074] According to embodiments of the present disclosure, the present disclosure further provides electronic devices, readable storage media, and computer program products.

[0075] Figure 5 is a block diagram of an example of an electronic device 700 that can be used to carry out embodiments of the present disclosure. Electronic devices refer to laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other appropriate forms of digital computers. Electronic devices may also refer to various forms of mobile devices, such as personal digital assistants, cellular phones, smartphones, wearable devices, and other similar computing devices. The components, their connections and relationships, and their functions shown herein are merely examples and are not intended to limit the realization of the present disclosure as described herein and / or claimed herein.

[0076] As shown in Figure 5, the device 700 includes a computing unit 701, which is configured to perform various appropriate operations and processes according to computer programs stored in a ROM (Read-Only Memory) 702 or computer programs loaded from a storage unit 708 into a RAM (Random Access Memory) 703. The RAM 703 can also store various programs and data necessary for operating the device 700. The computing unit 701, ROM 702, and RAM 703 are connected to each other via a bus 707. An I / O (Input / Output) interface 705 is also connected to the bus 707.

[0077] Multiple components in the device 700 are connected to the I / O interface 305 and include, for example, an input unit 706 such as a keyboard and mouse, an output unit 707 such as various types of displays and speakers, a storage unit 708 such as a magnetic disk and an optical disk, and a communication unit 709 such as a network card, modem, and wireless communication transceiver. The communication unit 709 enables the device 700 to exchange information / data with other devices via computer networks such as the Internet and / or various telecommunications networks.

[0078] The computing unit 701 may be various general-purpose and / or dedicated processing components having processing and computing capabilities. Some examples of the computing unit 701 include, but are not limited to, a CPU (Central Processing Unit), a GPU (Graphics Processing Unit), various dedicated AI (Artificial Intelligence) computing chips, computing units that execute various machine learning model algorithms, a DSP (Digital Signal Processor), and any suitable processor, controller, microcontroller, etc. The computing unit 701 performs each of the methods and processes described above, for example, the equipment withstand pressure test method. For example, in some embodiments, the equipment withstand pressure test method may be implemented as a computer software program tangibly contained in a machine-readable medium such as a storage unit 708. In some embodiments, part or all of the computer program may be loaded and / or installed into the equipment 700 via ROM 702 and / or communication unit 709. When the computer program is loaded into RAM 703 and executed by the computing unit 701, one or more steps of the methods described above can be performed. Alternatively, in other embodiments, the computing unit 701 may be configured in some other suitable manner (e.g., firmware) to perform the aforementioned pressure test method for the equipment.

[0079] The various embodiments of the systems and technologies described herein can be implemented in digital electronic circuit systems, integrated circuit systems, FPGAs (Field Programmable Gate Arrays), ASICs (Application-Specific Integrated Circuits), ASSPs (Application Specific Standard Products), SOCs (System on a Chip), CPLDs (Complex Programmable Logic Devices), computer hardware, firmware, software, and / or combinations thereof. These various embodiments may include implementation in one or more computer programs, which may run and / or interpret on a programmable system including at least one programmable processor, which may be a dedicated or general-purpose programmable processor, which may receive data and instructions from a storage system, at least one input device, and at least one output device, and which may transmit data and instructions to the storage system, the at least one input device, and the at least one output device.

[0080] Program code for carrying out the methods of this disclosure can be written using any combination of one or more programming languages. This program code can be provided to a processor or controller of a general-purpose computer, a dedicated computer, or other programmable data processing device, so that when the program code is executed by the processor or controller, the functions / operations defined in the flowcharts and / or block diagrams are performed. The program code may be fully executed on a machine, partially executed on a machine, partially executed on a machine and partially executed on a remote machine as a standalone software package, or fully executed on a remote machine or server.

[0081] In the context of this disclosure, a machine-readable medium may be a tangible medium for storing or storing a program used by or in conjunction with an instruction execution system, apparatus, or device. A machine-readable medium may be a machine-readable signal medium or a machine-readable storage medium. A machine-readable medium includes, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or any suitable combination thereof. More specific examples of machine-readable storage media include electrical connections based on one or more wires, portable computer disks, hard disks, RAM, ROM, EPROM (Electrically Programmable Read-Only Memory), or flash memory, optical fibers, CD-ROM (Compact Disc Read-Only Memory), optical storage devices, magnetic storage devices, or any suitable combination thereof.

[0082] To provide user interaction, the systems and technologies described herein may be implemented on the following computer: The computer may include a display device for displaying information to the user (e.g., a CRT (Cathode-Ray Tube) or LCD (Liquid Crystal Display) monitor), as well as a keyboard and pointing device (e.g., a mouse or trackball), through which the user can provide input to the computer. Other types of devices may also be used to provide user interaction; for example, the feedback provided to the user may be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback), and input from the user may be received in any form (including voice input, speech input, or tactile input).

[0083] The systems and technologies described herein may be implemented in computing systems including backend components (e.g., as data servers), or middleware components (e.g., application servers), or frontend components (e.g., user computers with graphical user interfaces or web browsers, through which users can interact with implementations of the systems and technologies described herein), or in computing systems including any combination of such backend components, middleware components, or frontend components. The components of the system may be interconnected by digital data communications (e.g., communication networks) of any form or medium. Examples of communication networks include LANs (Local Area Networks), WANs (Wide Area Networks), the Internet, and blockchain networks.

[0084] A computer system can include clients and servers. Clients and servers are typically located remotely from each other and usually interact via a communication network. The client-server relationship arises from computer programs running on corresponding computers that have a client-server relationship with each other. A server can be a cloud server, also called a cloud computing server or cloud host, and is a hosting product in a cloud computing service scheme that solves the drawbacks of traditional physical servers and VPS services ("Virtual Private Server," or "VPS"), such as high management difficulty and low scalability. A server can be a server in a distributed system, or a server combined with blockchain technology.

[0085] Artificial intelligence (AI) is the academic field that studies how to make computers mimic specific human thought processes and intellectual activities (such as learning, reasoning, thinking, and planning), and it encompasses technologies at both the hardware and software levels. Hardware technologies in artificial intelligence generally include technologies such as sensors, dedicated AI chips, cloud computing, distributed storage, and big data processing, while software technologies in artificial intelligence mainly include computer vision technologies, speech recognition technologies, natural language processing technologies, and several major areas such as machine learning / deep learning, big data processing technologies, and knowledge graph technologies.

[0086] As can be understood, it is possible to rearrange, add, or delete steps using the various forms of flows described above. For example, each step described herein may be performed in parallel, sequentially, or in a different order, as long as it does not result in the expected outcome of the technical solution disclosed herein.

[0087] The specific embodiments described above do not limit the scope of protection of this disclosure. It will be obvious to those skilled in the art that various modifications, combinations, subcombinations, and substitutions are possible depending on design requirements and other factors. Any modifications, substitutions with equivalents, improvements, etc., made within the spirit and principles of this disclosure shall all be included within the scope of protection of this disclosure.

Claims

1. Includes voltage regulation module, protection module, and high-voltage module, The voltage regulation module and the protection module are connected in parallel, and the protection module and the high-voltage module are connected in parallel. The aforementioned test electrical equipment and the aforementioned high-voltage module are connected in parallel. A voltage withstand test circuit for equipment, characterized in that the voltage adjustment module is used to adjust the voltage input to the test electrical equipment, the protection module is used to control the current input to the test electrical equipment, and the high-voltage module is used to measure the resonance point of the test electrical equipment and generate a high voltage based on the resonance point, wherein the voltage at the resonance point is the highest.

2. The voltage regulation module includes a voltage regulator and a transformer, The withstand voltage test circuit for the equipment according to claim 1, characterized in that the voltage regulator and the transformer are connected in series, and the transformer and the protection module are connected in parallel.

3. The protection module includes a first resistor, a second resistor, and a sphere gap. The first resistor and the voltage adjustment module are connected in series, the first resistor and the second resistor are connected in parallel, the second resistor and the sphere gap are connected in series, and the sphere gap and the voltage adjustment module are connected in parallel. The withstand voltage test circuit for the device according to claim 1, characterized in that the first resistor and the high-voltage module are connected in parallel, the second resistor and the high-voltage module are connected in parallel, and the sphere gap and the high-voltage module are connected in parallel.

4. The high-voltage module includes a reactor, a first capacitor, a second capacitor, and a voltmeter. The reactor and the protection module are connected in parallel, and the reactor and the test electrical equipment are connected in parallel. The test electrical equipment and the first capacitor are connected in parallel, the first capacitor and the second capacitor are connected in series, and the second capacitor and the test electrical equipment are connected in parallel. The withstand voltage test circuit for the device according to claim 1, characterized in that the voltmeter and the second capacitor are connected in parallel.

5. A step of monitoring the first capacitive reactance value of the first capacitor and the second capacitive reactance value of the second capacitor in the high-voltage module of the equipment in the withstand voltage test circuit of the equipment, and monitoring the inductive reactance value of the reactor of the high-voltage module, wherein the withstand voltage test circuit of the equipment and the test electrical equipment are connected in parallel, and the step of monitoring the first capacitive reactance value of the first capacitor and the second capacitive reactance value of the second capacitor in the high-voltage module in the withstand voltage test circuit of the equipment, wherein the withstand voltage test circuit of the equipment and the test electrical equipment are connected in parallel, A step of determining that the withstand voltage test circuit of the equipment has reached a resonance point when the sum of the inductive reactance value and the capacitive reactance value is equal, wherein the sum of the capacitive reactance values ​​is the sum of the first capacitive reactance value and the second capacitive reactance value, When it is determined that the withstand voltage test circuit of the equipment has reached the resonance point, the steps are to obtain the voltage value of the second capacitor, and to obtain the first capacitance value of the first capacitor and the second capacitance value of the second capacitor, A method for testing the withstand voltage of equipment, comprising the steps of: calculating the voltage of the first capacitor based on the voltage of the second capacitor, the first capacitance value, and the second capacitance value, and determining the voltage of the first capacitor as the withstand voltage value of the test electrical equipment.

6. The step of calculating the voltage value of the first capacitor based on the voltage value of the second capacitor, the first capacitance value, and the second capacitance value described above is: The steps include performing a quotient calculation between the first capacity value and the second capacity value to obtain the quotient result, The method according to claim 5, characterized by comprising the step of performing a product calculation between the voltage value of the second capacitor and the quotient result to obtain the voltage value of the first capacitor.

7. A monitoring unit used to monitor the first capacitive reactance value of a first capacitor and the second capacitive reactance value of a second capacitor in the high-voltage module of the equipment in the withstand voltage test circuit of the equipment, and to monitor the inductive reactance value of the reactor of the high-voltage module, wherein the withstand voltage test circuit of the equipment and the test electrical equipment are connected in parallel, the monitoring unit and A first determination unit used to determine that the withstand voltage test circuit of the equipment has reached a resonance point when the sum of the inductive reactance value and the capacitive reactance value is equal, wherein the sum of the capacitive reactance values ​​is the sum of the first capacitive reactance value and the second capacitive reactance value, When it is determined that the withstand voltage test circuit of the aforementioned device has reached the resonance point, an acquisition unit is used to acquire the voltage value of the second capacitor, and to acquire the first capacitance value of the first capacitor and the second capacitance value of the second capacitor, A device for testing the withstand voltage of equipment, comprising: a second determination unit used to calculate the voltage of the first capacitor based on the voltage of the second capacitor, the first capacitance value, and the second capacitance value, and to determine the voltage of the first capacitor as the withstand voltage value of the test electrical equipment.

8. At least one processor, The system comprises a memory that is communicably connected to at least one of the processors, The memory stores instructions that can be executed by the at least one processor, and the at least one processor is able to perform the method according to any one of claims 5 to 6 by executing the instructions.

9. A non-temporary computer-readable storage medium in which computer instructions are stored, wherein the computer instructions are used to cause the computer to perform the method described in any one of claims 5 to 6.

10. A computer program product comprising a computer program, wherein when the computer program is executed by a processor, the method described in any one of claims 5 to 6 is realized.

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