Thermomechanical Analysis Device
By incorporating irregularities on the contact surfaces of sample stages or tubes, the thermomechanical analyzer stabilizes the contact area, addressing inaccuracies and enhancing measurement precision in expansion/compression and penetration modes.
JP2026115348APending Publication Date: 2026-07-09HITACHI HIGH TECH ANALYSIS CORP
Patent Information
- Application Number
- JP2024231993
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2024-12-27
- Publication Date
- 2026-07-09
Smart Images
Figure 2026115348000001_ABST
Abstract
To provide a thermomechanical analyzer with improved measurement accuracy. [Solution] A thermomechanical analyzer 1 comprises a sample stage 15 on which a sample S is placed, a sample tube 11 on which the sample stage is placed and fixed to the measurement system, a probe 10 extending in the axial direction L, with one end of itself in direct or indirect contact with the sample and applying a load to the sample, and heating furnaces 12a, 12b for heating the sample, wherein the contact surface of the sample stage with the sample is provided with irregularities 15p.
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Citation Information
Patent Citations
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