X-ray diagnostic equipment, X-ray diagnostic system, and program
Patent Information
- Application Number
- JP2025028036
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2025-02-25
- Publication Date
- 2026-09-04
Smart Images

Figure 2026141437000001_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The embodiments disclosed in the present specification and the drawings relate to an X-ray diagnostic apparatus, an X-ray diagnostic system, and a program. BACKGROUND ART
[0002] In an X-ray diagnostic system, an operator wants to check whether the center of the X-ray detector is positioned at the center of the imaging region, or whether the X-ray detector is positioned so as to cover the imaging region. However, since the X-ray detector is hidden behind the body of the subject, there is a problem that the check cannot be performed. For this reason, conventionally, in an X-ray diagnostic system, when an X-ray tube is positioned directly opposite to an X-ray detector tray for imaging, such as when imaging is performed by placing the X-ray detector in the X-ray detector tray provided on a bucky stand or an examination couch used for general standing imaging, there is a technique of estimating the position of the X-ray detector from apparatus information such as Source Image Distance (hereinafter referred to as SID) and displaying the estimated position on a camera image attached to the X-ray tube.
[0003] However, when X-ray imaging is performed with the X-ray detector placed behind the body of the subject, or when X-ray imaging is performed without placing the X-ray detector in the X-ray detector tray, such as when the subject holds the X-ray detector by hand for X-ray imaging like hip joint skyline imaging or hip joint imaging, the position of the X-ray detector cannot be estimated from apparatus information such as SID. For this reason, the operator cannot check whether the center of the X-ray detector is positioned at the center of the imaging region, or whether the X-ray detector is positioned so as to include the imaging region, and thus there is a problem that the operator cannot grasp whether the imaging region is included within the irradiation range of the X-ray irradiation unit including the X-ray tube.
[0004] Therefore, in an X-ray diagnostic system, it is desired to facilitate the positioning work of the X-ray detector by allowing the operator to grasp the position and angle of the X-ray detector when performing X-ray imaging without placing the X-ray detector in the X-ray detector tray. PRIOR ART DOCUMENTS [Patent Documents]
[0005] [Patent Document 1] Japanese Patent Publication No. 2019-184517 [Overview of the project] [Problems that the invention aims to solve]
[0006] One of the problems that the embodiments disclosed herein and in the drawings aim to solve is to facilitate the alignment of the X-ray detector. However, the problems that the embodiments disclosed herein and in the drawings aim to solve are not limited to the above problem. Problems corresponding to the effects of each configuration shown in the embodiments described later can also be positioned as other problems. [Means for solving the problem]
[0007] The X-ray diagnostic apparatus according to the embodiment comprises a detection unit, a calculation unit, and an output unit. The detection unit detects light projected from a light source provided in an X-ray detector that detects X-rays and reflected by an object. The calculation unit calculates at least one of the position and angle of the X-ray detector based on the position of the light detected by the detection unit. The output unit outputs at least one of the position and angle of the X-ray detector as a calculation result from the calculation unit. [Brief explanation of the drawing]
[0008] [Figure 1] This figure shows an example of the configuration of an X-ray diagnostic system according to the first embodiment. [Figure 2] This figure shows an example of the installation position of the detection unit in the X-ray diagnostic system according to the first embodiment. [Figure 3] (a) This figure shows an example of the positional relationship of the light source in the X-ray detection unit. (b) This figure shows another example of the positional relationship of the light source in the X-ray detection unit. [Figure 4]This is a flowchart illustrating the output processing performed in the X-ray diagnostic apparatus according to the first embodiment. [Figure 5] This figure shows an example of a first optical image captured by the first optical camera according to the first embodiment. [Figure 6] This figure shows an example of a second optical image captured by the second optical camera according to the first embodiment. [Figure 7] (a) This figure shows an example of the shape of the projected light from the light source. (b) This figure shows the shape of the projected light from the light source on the first optical image. [Figure 8] This figure shows an example of the configuration of an X-ray diagnostic system according to the second embodiment. [Figure 9] This is a flowchart illustrating the output processing performed in the X-ray diagnostic apparatus according to the second embodiment. [Figure 10] This figure shows an example of the irradiation position of the light source in the X-ray diagnostic system according to the second embodiment. [Figure 11] This figure shows an example of a state in which the irradiation position of the light source unit has been changed in the X-ray diagnostic system according to the second embodiment. [Figure 12] This figure shows an example of the configuration of an X-ray diagnostic system according to Modification Example 1. [Figure 13] This is a flowchart illustrating the output processing performed in the X-ray diagnostic apparatus according to Modification Example 1. [Figure 14] This figure shows an example of the configuration of an X-ray diagnostic system according to Modification 2. [Figure 15] This figure shows an example of the configuration of the scanning unit in an X-ray diagnostic apparatus according to Modification 2. [Figure 16] This figure shows the state of scanning the examination room by the scanning unit of the X-ray diagnostic device according to Modification 2. [Figure 17] This figure shows an example of the scanning result of the scanning unit in an X-ray diagnostic device according to modified example 2. [Figure 18] This figure shows an example of the configuration of an X-ray diagnostic system according to the third embodiment. [Figure 19]It is a diagram for explaining a method of calculating at least one of the position and angle of an X-ray detector according to a third embodiment. [Figure 20] It is a diagram showing an example of the configuration of an X-ray diagnostic system according to Modification 3. [Figure 21] It is a flowchart explaining the content of output processing executed in the X-ray diagnostic apparatus according to Modification 3. MODE FOR CARRYING OUT THE INVENTION
[0009] Hereinafter, embodiments of an X-ray diagnostic apparatus, an X-ray diagnostic system, and a program will be described with reference to the drawings. In the following description, components having substantially the same functions and configurations are denoted by the same reference numerals, and repeated description will be given only when necessary.
[0010] [First Embodiment] Figure 1 is a diagram showing an example of the configuration of an X-ray diagnostic system according to the first embodiment. As shown in Figure 1, the X-ray diagnostic system 1 includes an X-ray diagnostic apparatus 10 and an X-ray detection unit 30. The X-ray diagnostic apparatus 10 shown in Figure 1 is, for example, a mobile X-ray diagnostic apparatus. The X-ray diagnostic apparatus 10 according to the present embodiment is not limited to mobile X-ray diagnostic apparatuses, and can be implemented as any type of X-ray diagnostic apparatus, for example, a general X-ray diagnostic apparatus, a portable X-ray diagnostic apparatus, or the like. Hereinafter, the present embodiment will be described on the premise that X-ray imaging is performed using a mobile X-ray diagnostic apparatus.
[0011] As shown in Figure 1, the X-ray diagnostic apparatus 10 includes an X-ray irradiation unit 11, a detection unit 13, a support unit 15, a processing circuit 17, a high voltage generation circuit 19, an input interface 21, a display 23, a storage circuit 25, and a communication circuit 27.
[0012] The X-ray irradiation unit 11 irradiates a subject P with X-rays. The X-ray irradiation unit 11 is provided, for example, at the tip of the support unit 15. As shown in Figure 1, the X-ray irradiation unit 11 includes an X-ray tube 111 and an X-ray collimator 113.
[0013] The X-ray tube 111 generates X-rays from the X-ray focal point (hereinafter referred to as the tube focal point) based on the tube current supplied from the high-voltage generation circuit (described later) and the tube voltage applied by the high-voltage generation circuit. The position where these X-rays are generated is the tube focal point position. The X-rays generated at the tube focal point are directed towards the irradiation range limited by the X-ray diaphragm 113. The X-ray tube 111 is connected to the high-voltage generation circuit via a high-voltage cable provided in the support section 15.
[0014] The X-ray diaphragm 113 limits the X-ray irradiation area according to the operator's instructions. Specifically, the X-ray diaphragm 113 limits the irradiation area according to the irradiation area of the subject P's body surface, in order to prevent unnecessary exposure of areas other than those desired by the operator to the X-ray tube focal point. The X-ray diaphragm 113 is sometimes called a collimator.
[0015] Furthermore, the X-ray aperture 113 may have a plurality of predetermined filters (hereinafter referred to as beam quality adjustment filters) for the purpose of reducing the radiation dose to the subject P and improving image quality. The plurality of beam quality adjustment filters may each be made of different materials and have the same thickness. The beam quality adjustment filters are changed according to the thickness of the X-rays generated at the tube focal point. The beam quality adjustment filters are made of, for example, aluminum, copper, etc.
[0016] The detection unit 13 detects light projected from a light source unit provided in the X-ray detector (described later) and reflected by an object. The detection unit 13 outputs the detection result to a processing circuit (described later). In this embodiment, the detection unit 13 is an optical camera. This optical camera outputs an optical image, which is the result of the capture, to the processing circuit as the detection result. In this embodiment, multiple optical cameras, which are the detection units 13, are provided. These detection units 13 are provided on at least one of the walls of the examination room and the exterior of the X-ray diagnostic device.
[0017] Figure 2 shows an example of the installation position of the detection unit in the X-ray diagnostic system 1 according to the first embodiment. As shown in Figure 2, the detection unit 13 has a first optical camera 131 and a second optical camera 133. In the example shown in Figure 2, the first optical camera 131 is provided near the X-ray tube 111 in the X-ray irradiation unit 11, which is one of the exterior parts of the X-ray diagnostic device body, and the second optical camera 133 is provided on the ceiling surface S2 of the examination room R as a wall in the examination room.
[0018] The support portion 15 is a support member that supports the X-ray irradiation unit 11 so that it can move in multiple directions. The support portion 15 comprises an arm portion 151 and a support body portion 153. In Figure 1, the case in which the support portion 15 is composed of two elements, the arm portion 151 and the support body portion 153, is explained, but the number of elements constituting the support portion 15 is arbitrary. For example, the support portion 15 may be composed of three or more elements.
[0019] The arm portion 151 movably supports the X-ray irradiation unit 11 at one of its ends. The other end of the arm portion 151 is supported by the support body portion 153. Furthermore, the arm portion 151 comprises a first arm 1511, a joint portion 1512, and a second arm 1513.
[0020] The first arm 1511 supports the X-ray irradiation unit 11 at one of its ends so that it can slide and / or rotate. The other end of the first arm 1511 is connected to the joint 1512. The first arm 1511 is configured to extend and retract along its longitudinal direction, i.e., in the direction of arrow a1 shown in Figure 2. As the first arm 1511 extends and retracts, the X-ray irradiation unit 11 slides along the direction of arrow a1. The first arm 1511 is attached to the second arm 1513 so that the angle between the first arm 1511 and the second arm 1513 can be opened and closed around the joint 1512. That is, the first arm 1511 is attached to the second arm 1513 via the joint 1512 so that it can be opened and closed in the direction of arrow a2 shown in Figure 1, i.e., vertically.
[0021] The joint 1512 connects the first arm 1511 and the second arm 1513 so that the first arm 1511 can open and close in the direction of arrow a2 shown in Figure 1. The structure of the joint 1512 is arbitrary, but after the operator has opened or closed the angle between the first arm 1511 and the second arm 1513, a stopper mechanism is provided that allows the first arm 1511 to be held still at the angle at which the operation was completed.
[0022] The second arm 1513 is attached to the support body 153 so as to be extendable and retractable in the longitudinal direction of the second arm 1513. That is, the second arm 1513 is attached to the support body 153 so as to be able to move (slide) up and down along the direction of arrow a3 shown in Figure 1. Furthermore, as described above, the second arm 1513 supports the first arm 1511 via the joint 1512 so as to be able to open and close in the direction of arrow a2 shown in Figure 1.
[0023] The support body 153 is a housing that supports the arm 151. The support body 153 comprises a main body 1531 and a movable part 1532.
[0024] The main unit 1531 includes processing circuits for controlling various parts of the X-ray diagnostic apparatus 10, storage circuits for storing various data, input interfaces for receiving various operations, and output interfaces for outputting various information. The main unit 1531 also performs control of various processes related to the acquisition of X-ray images.
[0025] The movable part 1532 is a portable support mechanism provided at the lower part of the main body 1531, and is composed of, for example, wheels, casters, etc. The movable part 1532 moves in the direction of arrow a4 shown in Figure 1, i.e., horizontally, in response to operation by the operator. As the movable part 1532 moves, the arm 151 also moves in the direction of arrow a4 shown in Figure 1. In addition, at least one of the wheels provided at the lower part of the main body 1531 may be a drive wheel connected to a drive device such as a motor. In this case, the drive wheel is driven in response to operation by the operator.
[0026] The processing circuit 17 is a control circuit that performs overall control of the X-ray diagnostic apparatus 10. The processing circuit 17 is also an arithmetic circuit that performs various calculations and is composed of a processor such as a CPU or GPU. In this embodiment, the processing circuit 17 calculates at least one of the position and angle of the X-ray detector, and outputs at least one of the position and angle of the X-ray detector.
[0027] Therefore, the processing circuit 17 according to this embodiment has an acquisition function 171, a calculation function 172, an output function 173, and a shooting control function 174. The acquisition function 171 corresponds to the acquisition unit in this embodiment, the calculation function 172 corresponds to the calculation unit in this embodiment, the output function 173 corresponds to the output unit in this embodiment, and the shooting control function 174 corresponds to the shooting control unit in this embodiment.
[0028] In the embodiment shown in Figure 1, each processing function performed by the acquisition function 171, calculation function 172, output function 173, and shooting control function 174 is stored in the memory circuit 25 in the form of a program that can be executed by a computer. The processing circuit 17 is a processor that reads the program from the memory circuit 25 and executes it to realize the function corresponding to each program. In other words, the processing circuit 17, in the state in which each program has been read, will have the functions shown in the processing circuit 17 of Figure 1. Although Figure 1 describes the acquisition function 171, calculation function 172, output function 173, and shooting control function 174 as being realized by a single processing circuit 17, it is also possible to configure the processing circuit 17 by combining multiple independent processors, and each processor will realize these functions by executing a program.
[0029] The high-voltage generation circuit 19 includes various control circuits for controlling tube current, tube voltage, exposure time, etc., as well as a high-voltage transformer, a high-voltage rectifier, a filament transformer, and the like. The high-voltage generation circuit 19 generates the tube current supplied to the X-ray tube 111 and the tube voltage applied to the X-ray tube 111. Specifically, under the control of the processing circuit 17, the high-voltage generation circuit 19 supplies a tube current suitable for X-ray imaging to the X-ray tube 111 and applies a tube voltage suitable for X-ray imaging to the X-ray tube 111 according to the X-ray imaging conditions. Here, the X-ray imaging conditions are, for example, conditions related to X-ray imaging such as tube current, tube voltage, irradiation time, SID, size of the X-ray irradiation field, imaging site, type of imaging, and arrangement of the X-ray tube 111.
[0030] The input interface 21, for example, receives various input operations from the operator, converts the received input operations into electrical signals, and outputs them to the processing circuit 17. For example, the input interface 21 receives input of information about the subject P and X-ray imaging conditions when imaging the subject P. This input interface 21 can be implemented using, for example, a mouse, keyboard, trackball, manual switch, foot switch, button, joystick, etc. The input interface 21 may also consist of the X-ray diagnostic device 10 main unit and a tablet terminal or the like that can communicate wirelessly.
[0031] The display 23 is connected to the processing circuit 17, etc., and displays various images and information based on signals supplied from the processing circuit 17, etc. For example, the display 23 displays at least one of the position and angle of the X-ray detector output by the output function 173, or a GUI (Graphical User Interface) for accepting various operations from the operator. In this embodiment, the display 23 is composed of, for example, a liquid crystal display or a CRT (Cathode Ray Tube) display.
[0032] The memory circuit 25 is implemented by, for example, a semiconductor memory element such as RAM (Random Access Memory) or flash memory, a hard disk, or an optical disc. In this embodiment, for example, the memory circuit 25 stores programs executed by circuits included in the X-ray diagnostic apparatus 10, and results calculated by the calculation function 172.
[0033] The communication circuit 27 has an antenna and is a transmitting and receiving circuit for wireless communication with the detection unit 13 and the X-ray detection unit 30. For example, the communication circuit 27 receives detection results from the detection unit 13 and X-ray image data from the X-ray detection unit 30.
[0034] The X-ray detection unit 30 detects X-rays irradiated from the X-ray tube 111 that have passed through the subject P. The X-ray detection unit 30 is a portable detection unit and can be positioned independently of the X-ray tube 111. The X-ray detection unit 30 can be placed, for example, by an operator between the subject P and the examination table B, or the subject can grasp the X-ray detection unit 30 with their hand and place it so that the imaging area is positioned between the X-ray detection unit 30 and the X-ray tube 111. In the example shown in Figure 1, the X-ray detection unit 30 is placed by an operator between the subject P and the examination table B. This X-ray detection unit 30 corresponds to the X-ray detection unit in this embodiment. The X-ray detection unit 30 includes an X-ray detector 31 that detects X-rays that have passed through the subject P, and a light source unit 33 provided in the X-ray detector 31.
[0035] The X-ray detector 31 detects X-rays. Specifically, the X-ray detector 31 is implemented, for example, by a flat panel detector (FPD). The FPD has a plurality of semiconductor detection elements arranged in two dimensions. Each semiconductor detection element detects the X-rays irradiated from the X-ray irradiation unit 11 and transmitted through the subject P, and converts the detected X-rays into electrical signals. The electrical signals generated in each semiconductor detection element are output to an analog-to-digital converter (A / D converter). The A / D converter converts the electrical signals into digital data. The A / D converter generates digital data. The generated digital data is output to an image generation circuit. The image generation circuit generates X-ray image data based on this digital data, and this X-ray image data is output to an image memory. The digital data generated in the X-ray detector 31 by X-ray imaging may be read out by an X-ray detector readout device provided in the X-ray diagnostic device 10, or by an X-ray detector readout device other than the X-ray diagnostic device 10.
[0036] The light source unit 33 is positioned around the X-ray detector 31 and emits light. Specifically, the light source unit 33 is installed on the X-ray detector 31 so that it can project onto the walls and ceiling of the examination room. The light source unit 33 also has multiple light sources. Each of the multiple light sources emits directional light. Each of the multiple light sources projects either a character or a symbol. The first light source 331 and the second light source 333, which are the multiple light sources, are positioned at different locations on the side of the X-ray detector 31. In the example shown in Figure 1, the first light source 331 and the second light source 333 are positioned at different locations by being placed on different sides of the X-ray detector 31. By positioning the first light source 331 and the second light source 333 at different locations in this way, the light emitted from the first light source 331 and the second light source 333 respectively is emitted to different locations within the examination room R. In the example shown in Figure 2, the first light source 331 projects a star-shaped first illumination RL1 onto the first wall surface S1 inside the examination room R, and the second light source 333 projects a star-shaped second illumination RL2 onto the ceiling surface S2 inside the examination room R.
[0037] Figure 3(a) shows an example of the positional relationship of the light source unit 33 in the X-ray detection unit 30. Figure 3(b) shows another example of the positional relationship of the light source unit 33 in the X-ray detection unit 30. In the examples shown in Figures 3(a) and 3(b), the first light source 331 and the second light source 333 are positioned at different locations on the side surface of the X-ray detector 31 so that the irradiation direction of the first light source 331 and the irradiation direction of the second light source 333 are orthogonal. Specifically, in the example shown in Figure 3(a), the first light source 331 is positioned in or near the center of the first side surface SS1 of the X-ray detector 31, and the second light source 333 is positioned in or near the center of the second side surface SS2, which is a surface orthogonal to the first side surface SS1 of the X-ray detector 31. Also, in the example shown in Figure 3(b), the first light source 331 is positioned at one corner of the X-ray detector 31, and the second light source 333 is positioned at the corner adjacent to the first corner.
[0038] Figure 4 is a flowchart illustrating the output processing performed in the X-ray diagnostic apparatus 10 according to the first embodiment. This output processing involves acquiring the detection results from the detection unit 13, calculating at least one of the position and angle of the X-ray detector 31, and outputting the calculation results. For example, the output processing is performed when the operator inputs X-ray imaging conditions via the input interface 21.
[0039] As shown in Figure 4, first, the acquisition function 171 in the processing circuit 17 of the X-ray diagnostic apparatus 10 acquires the detection result (step S11). Specifically, the acquisition function 171 acquires the optical image captured by the optical camera as the detection result by the detection unit 13. More specifically, the acquisition function 171 acquires the first optical image captured by the first optical camera 131 and the second optical image captured by the second optical camera 133 as the detection result by the detection unit 13.
[0040] Figure 5 shows an example of a first optical image taken by the first optical camera 131 according to the first embodiment, and Figure 6 shows an example of a second optical image taken by the second optical camera 133 according to the first embodiment. As shown in Figure 5, the first optical image IM1 captures the subject P, the first irradiation light RL1 projected onto the first wall surface S1 of the examination room R, and the second irradiation light RL2 projected onto the ceiling surface of the examination room R. As shown in Figure 6, the second optical image IM2 captures the subject P, the X-ray detector 31, the second light source 333, the X-ray irradiation unit 11, and the first irradiation light RL1 projected onto the first wall surface S1 of the examination room R. Note that in the examples shown in Figures 5 and 6, the examination table B is omitted from the first optical image IM1 and the second optical image IM2.
[0041] Next, as shown in Figure 4, the calculation function 172 in the processing circuit 17 of the X-ray diagnostic apparatus 10 calculates at least one of the position and angle of the X-ray detector 31 (step S13). Specifically, the calculation function 172 calculates at least one of the position and angle of the X-ray detector 31 based on the position of light in the optical image acquired as a detection result in step S11. More specifically, the calculation function 172 identifies any of the characters or symbols projected by the light source unit 33 in the optical image acquired as a detection result in step S11, and calculates the position of the X-ray detector 31 relative to the X-ray tube 111 from the position of the first irradiation light RL1 projected from the first light source 331 onto the first wall surface S1 in the first optical image IM1 and the position of the second irradiation light RL2 projected from the second light source 333 onto the ceiling surface S2 in the second optical image IM2. Furthermore, the calculation function 172 calculates the angle of the X-ray detector relative to the X-ray tube 111 from the shape of the first irradiation light RL1 projected from the first light source 331 onto the first wall surface S1 in the first optical image IM1, and the shape of the second irradiation light RL2 projected from the second light source 333 onto the ceiling surface S2 in the second optical image IM2.
[0042] Figure 7 shows an example of the shape of the irradiated light. Figure 7(a) shows an example of the shape of the irradiated light projected from the light source. Figure 7(b) shows the shape of the irradiated light projected from the light source on the first optical image. When the first light source 331 is directly facing the first wall surface S1, a star-shaped first irradiated light RL1 with the same aspect ratio is projected onto the first wall surface S1, as shown in Figure 7(a). On the other hand, when the first light source 331 is at an angle to the first wall surface S1, a star-shaped first irradiated light RL1 with a different aspect ratio is projected onto the first wall surface S1, as shown in Figure 7(b). Therefore, the angle of the X-ray detector 31 can be calculated based on the shape of the first irradiated light RL1 in the first optical image IM1.
[0043] Next, as shown in Figure 4, the output function 173 in the processing circuit 17 of the X-ray diagnostic apparatus 10 outputs the calculation result (step S15). Specifically, the output function 173 outputs at least one of the position and angle of the X-ray detector 31 as the calculation result in step S13. More specifically, the output function 173 outputs at least one of the position and angle of the X-ray detector 31 by superimposing the position of the X-ray detector 31 relative to the X-ray tube 111 and the angle of the X-ray detector relative to the X-ray tube 111 onto the first optical image IM1 and displaying it on the display 23.
[0044] By executing step S15, the output processing according to this embodiment is completed. After executing step S15, the operator moves the X-ray tube 111 relative to the X-ray detector 31 based on the outputted calculation results.
[0045] As described above, according to the X-ray diagnostic device 10 in the X-ray diagnostic system 1 of the first embodiment, the detection unit 13 has a first optical camera 131 and a second optical camera 133, and the calculation function 172 calculates at least one of the position and angle of the X-ray detector 31 based on the position of the first irradiation light RL1 of the first light source 331 included in the first optical image IM1 captured by the first optical camera 131 and the position of the second irradiation light RL2 of the second light source 333 included in the second optical image IM2 captured by the second optical camera 133, and outputs at least one of the position and angle of the X-ray detector 31. By making it possible to grasp the position and angle of the X-ray detector, the work of aligning the X-ray detector can be made easier.
[0046] [Second Embodiment] In the X-ray diagnostic system 1 according to the first embodiment described above, if the surface onto which the irradiation light is projected is an uneven surface, the angle of the light source may be adjusted so that the irradiation light is projected onto a uniform surface. The following describes the parts that differ from the first embodiment.
[0047] Figure 8 is a diagram showing an example of the configuration of the X-ray diagnostic system 1 according to the second embodiment, and corresponds to Figure 1. As shown in Figure 8, the X-ray diagnostic system 1 according to the second embodiment is configured by adding a first determination function 175 and a light source control function 176 to the processing circuit 17 of the X-ray diagnostic device 10, and a light source irradiation angle adjustment unit 35 to the X-ray detection unit 30, compared to the X-ray diagnostic system 1 according to the first embodiment.
[0048] The first determination function 175 determines whether the statistical value calculated by the calculation function 172 is lower than a predetermined threshold. The statistical value is a value relating to the distribution of light, and is at least one of the mean, median, variance, standard deviation, and sum of squared residuals of the light distribution. The statistical value being lower than the predetermined threshold occurs when the light emitted from the light source 33 is irradiated by curtains, shelves, or people such as operators in the examination room R, resulting in a lack of uniformity in the emitted light and distortion of the light, such as the occurrence of mottled patterns due to curtains, etc. In such cases of light distortion, it becomes difficult for the calculation function 172 to accurately calculate at least one of the position and angle of the X-ray detector based on the position of the light in the optical image, so it is necessary to change the light irradiation position. The first determination function 175 corresponds to the first determination unit in this embodiment.
[0049] The light source control function 176 controls the light source irradiation angle adjustment unit 35 based on the change information output by the output function 173. The change information is information for changing the direction of light emission from the light source. This change information is, for example, a fixed value for changing the direction of light emission from the light source by a predetermined value. This change information is stored in the memory circuit 25. Although the change information is described as a fixed value, the change information may also be a variable value depending on the irradiation position of the light emitted from the light source.
[0050] The light source irradiation angle adjustment unit 35 is a mechanism for adjusting the irradiation angle of the light source unit 33. In the example shown in Figure 8, the light source irradiation angle adjustment unit 35 includes a first light source irradiation angle adjustment mechanism 351 for adjusting the irradiation angle of the first light source 331, and a second light source irradiation angle adjustment mechanism 353 for adjusting the irradiation angle of the second light source 333.
[0051] Figure 9 is a flowchart illustrating the output processing performed in the X-ray diagnostic apparatus 10 according to the second embodiment, and corresponds to Figure 4. In the output processing according to the second embodiment, the detection result of the detection unit 13 is acquired, statistical values are calculated, it is determined whether the statistical values are lower than a predetermined threshold, change information is output, the projection direction is changed, at least one of the position and angle of the X-ray detector 31 is calculated, and the calculation results are output. For example, the output processing is performed when the operator inputs X-ray imaging conditions via the input interface 21. Note that the processing in step S11 of Figure 9 is equivalent to the processing in step S11 of Figure 4, so its explanation is omitted.
[0052] Next, as shown in Figure 9, the calculation function 172 in the processing circuit 17 of the X-ray diagnostic apparatus 10 calculates statistical values (step S21). Specifically, the calculation function 172 calculates statistical values by calculating the average value of the light distribution contained in the optical image acquired as a detection result in step S11, based on the optical image.
[0053] Figure 10 shows an example of the irradiation position of the light source unit 33 in the X-ray diagnostic system 1 according to the second embodiment. In the example shown in Figure 10, the first irradiation light RL1 irradiated from the first light source 331 and projected is projected onto the curtain C1.
[0054] Next, as shown in Figure 9, the first determination function 175 in the processing circuit 17 of the X-ray diagnostic apparatus 10 determines whether the statistical value is lower than a predetermined threshold (step S23). Specifically, the first determination function 175 determines whether the statistical value calculated in step S21 is lower than a predetermined threshold stored in the memory circuit 25.
[0055] Then, in step S23, if the statistical value is lower than a predetermined threshold (step S23: Yes), that is, if the light in the optical image is distorted, the acquisition function 171 in the processing circuit 17 of the X-ray diagnostic device 10 acquires change information (step S25). Specifically, the acquisition function 171 acquires change information stored in the memory circuit 25.
[0056] Next, as shown in Figure 9, the output function 173 in the processing circuit 17 of the X-ray diagnostic apparatus 10 outputs change information (step S27). Specifically, the output function 173 outputs the change information acquired in step S25 to the light source control function 176.
[0057] Next, as shown in Figure 9, the light source control function 176 in the processing circuit 17 of the X-ray diagnostic apparatus 10 changes the direction of light emission from the light source unit 33 (step S29). Specifically, the light source control function 176 controls the light source irradiation angle adjustment unit 35 of the X-ray detection unit 30 via the communication circuit 27 based on the change information output in step S27. After step S29, the process returns to step S11 and repeats the process from step S11 until the irradiation light from the light source unit 33 irradiates a uniform surface.
[0058] Figure 11 shows an example of a state in which the irradiation position of the light source unit 33 has been changed in the X-ray diagnostic system 1 according to the second embodiment. In the example shown in Figure 11, the light source control function 176 changes the projection direction of the first light source 331 and the second light source 333 of the light source unit 33 based on the change information. As a result, the first irradiation light RL1 from the first light source 331 is projected onto the third wall surface S3 of the examination room R.
[0059] On the other hand, in step S23, if the statistical value is not lower than a predetermined threshold (step S23: No), that is, if the light in the optical image is not distorted, the calculation function 172 in the processing circuit 17 of the X-ray diagnostic apparatus 10 calculates at least one of the position and angle of the X-ray detector 31 (step S13). Note that the processing in steps S13 and S15 from step S13 onward is equivalent to the processing in steps S13 and S15 in Figure 4, so the explanation is omitted. The output processing according to this embodiment is terminated by executing step S15. After the execution of step S15, the operator moves the X-ray tube 111 relative to the X-ray detector based on the output calculation result.
[0060] As described above, the X-ray diagnostic device 10 in the X-ray diagnostic system 1 according to the second embodiment calculates statistical values regarding the distribution of light, determines whether the statistical values are lower than a predetermined threshold, and outputs change information to change the projection direction of the light source unit 33 if the statistical values are lower than the predetermined threshold. Therefore, when the irradiation light from the light source unit 33 is irradiated onto a uniform surface, at least one of the position and angle of the X-ray detector 31 can be calculated. This makes it possible to more accurately determine the position and angle of the X-ray detector, thereby making the alignment work of the X-ray detector easier.
[0061] [Variation 1] In the X-ray diagnostic system 1 according to the first embodiment described above, if the irradiation light is not irradiated onto a preset object, the angle of the light source may be adjusted so that it is projected onto the preset object. The following describes the parts that differ from the first and second embodiments.
[0062] Figure 12 is a diagram showing an example of the configuration of the X-ray diagnostic system 1 according to Modification 1, and is a diagram corresponding to Figure 1. As shown in Figure 12, the X-ray diagnostic system 1 according to Modification 1 is configured by adding a light source control function 176 and a second determination function 177 to the processing circuit 17 of the X-ray diagnostic device 10, and a light source irradiation angle adjustment unit 35 to the X-ray detection unit 30, compared to the X-ray diagnostic system 1 according to the first embodiment. Note that the functions and configurations other than the light source control function 176, the second determination function 177, and the light source irradiation angle adjustment unit 35 are the same as in Figure 1, so their explanation is omitted. Also, the functions and configurations of the light source control function 176 and the light source irradiation angle adjustment unit 35 are the same as in Figure 8, so their explanation is omitted.
[0063] The second determination function 177 determines whether or not light is projected onto a pre-defined object in multiple captured optical images. The pre-defined object is an object other than a person, such as a curtain, a shelf, or a uniform surface like the wall or ceiling of the examination room R.
[0064] Figure 13 is a flowchart illustrating the output processing performed in the X-ray diagnostic apparatus 10 according to Modification 1, and corresponds to Figure 4. In the output processing according to Modification 1, the detection result of the detection unit 13 is acquired, it is determined whether or not it is projected onto a preset object, change information is output, the projection direction is changed, at least one of the position and angle of the X-ray detector 31 is calculated, and the calculation result is output. For example, the output processing is performed when the operator inputs X-ray imaging conditions via the input interface 21. Note that the processing in step S11 of Figure 13 is equivalent to the processing in step S11 of Figure 4, so the explanation is omitted.
[0065] Next, as shown in Figure 13, the second determination function 177 in the processing circuit 17 of the X-ray diagnostic apparatus 10 determines whether or not the light from the light source 33 is projected onto a preset object (step S23). Specifically, the first determination function 175 determines whether or not the light from the light source 33 is projected onto a preset object based on the multiple optical images captured as detection results in step S11.
[0066] Then, if the projection is not on a pre-defined object (step S31: No), change information is acquired (step S25). Note that the processes from step S25 onwards in Figure 13, steps S25, S27, and S29 are equivalent to the processes in steps S25, S27, and S29 in Figure 9, so their explanation is omitted.
[0067] On the other hand, if the X-ray is projected onto a preset object in step S31 (step S31: Yes), the calculation function 172 in the processing circuit 17 of the X-ray diagnostic device 10 calculates at least one of the position and angle of the X-ray detector 31 (step S13). Note that the processing in steps S13 and S15 from step S13 onward is equivalent to the processing in steps S13 and S15 in Figure 4, so the explanation is omitted. The output processing according to this embodiment is completed by executing step S15. After the execution of step S15, the operator moves the X-ray tube 111 relative to the X-ray detector 31 based on the output calculation result.
[0068] As described above, the X-ray diagnostic device 10 in the X-ray diagnostic system 1 according to Modification 1 determines whether or not the light is projected onto a preset object, and if it is not projected onto a preset object, it outputs change information and changes the projection direction of the light source unit 33. Therefore, even when the light emitted from the light source unit 33 is irradiated onto an object that is not preset, such as a curtain, shelf, or person, at least one of the position and angle of the X-ray detector 31 can be calculated. This makes it possible to more accurately determine the position and angle of the X-ray detector, thereby making the alignment of the X-ray detector easier.
[0069] [Variation 2] According to the X-ray diagnostic device 10 in the X-ray diagnostic system 1 of the first embodiment described above, the positional relationship between the light source unit 33 and the surrounding objects may be scanned so that the irradiation light is irradiated onto a uniform surface. The following describes the parts that differ from the first embodiment.
[0070] Figure 14 is a diagram showing an example of the configuration of an X-ray diagnostic system according to Modification 2, and corresponds to Figure 1. As shown in Figure 14, the X-ray diagnostic system 1 according to Modification 2 is configured by adding a scanning unit 50, a first determination function 175 and a light source control function 176a to the processing circuit 17 of the X-ray diagnostic device 10, and a light source irradiation angle adjustment unit 35 to the X-ray detection unit 30, compared to the X-ray diagnostic system 1 according to the first embodiment. Note that the functions and configurations other than the scanning unit 50, the first determination function 175a, the light source control function 176, and the light source irradiation angle adjustment unit 35 are the same as in Figure 1, so their explanation is omitted. Also, the functions and configurations of the light source control function 176 and the light source irradiation angle adjustment unit 35 are the same as in Figure 8, so their explanation is omitted.
[0071] The scanning unit 50 is a device for scanning the positional relationship between the light source unit 33 and surrounding objects. The scanning unit 50 is composed of a device that acquires three-dimensional information using a three-dimensional information acquisition device such as LiDAR (Light Detection and Ranging). As shown in Figure 14, the scanning unit 50 is attached to the support body unit 153. The scanning results of the scanning unit 50 are output to the processing circuit 17. Figure 15 is a diagram showing an example of the configuration of the scanning unit 50 according to Modification 2. As shown in Figure 15, the scanning unit 50 has a scanning unit body 51 and a rotating mirror 53.
[0072] The scanning unit 51 emits laser light via the rotating mirror 53, detects the laser reflected light from the object to be measured, and measures the distance from the scanning unit 50 to the object to be measured based on the time at which the emitted and reflected light were detected and the speed of the emitted light. The scanning unit 50 generates distance image data based on the measured distance to the object to be measured. The rotating mirror 53 distributes the laser light under the control of the processing circuit 17.
[0073] Figure 16 shows the state of scanning the examination room R by the scanning unit 50 in the X-ray diagnostic apparatus 10 according to Modification 2. Figure 17 shows an example of the scanning result of the scanning unit 50 in the X-ray diagnostic apparatus 10 according to Modification 2. As shown in Figure 16, the examination room R is surrounded by a first wall S1, a second wall S2, a third wall S3, and a fourth wall S4. An object OB1 is placed inside the examination room R. As shown in Figure 16, the scanning unit 50 is located inside the examination room R. The scanning unit 50 scans the examination room R by rotating a rotating mirror 53 while the scanning unit body 51 irradiates laser light L1.
[0074] As shown in Figure 17, the inspection room R is modeled, and as a result of scanning by the scanning unit 50, the inspection room map MA is generated. The inspection room map MA shown in Figure 17 includes a first wall model M51 in which the first wall S1 is modeled, a second wall model M52 in which the second wall S2 is modeled, a third wall model M53 in which the third wall S3 is modeled, and an object model MOB in which the object OB1 is modeled. In addition, the inspection room map MA shown in Figure 17 has a scanning unit model M50 in which the scanning unit 50 is modeled.
[0075] Based on the inspection room map MA, the light source control function 176a controls the light source irradiation angle adjustment unit 35 so that the light source unit 33 irradiates a uniform surface. Specifically, the light source control function 176a controls the light source irradiation angle adjustment unit 35 so that the light from the light source unit 33 irradiates the first wall surface S1, the second wall surface S2, and the third wall surface S3, while avoiding the light from the light source unit 33 irradiating the object OB1.
[0076] As described above, in the X-ray diagnostic device 10 of the modified X-ray diagnostic system 1, the scanning unit 50 scans the positional relationship of the light source unit 33 with surrounding objects, and the light source control function 176a controls the light source irradiation angle adjustment unit 35 based on the examination room map MA as a scanning result. Therefore, the possibility of light irradiating an uneven surface is reduced, and at least one of the position and angle of the X-ray detector 31 can be output as a calculation result by the calculation function 172 without changing the irradiation position of the light source unit 33.
[0077] In the X-ray diagnostic apparatus 10 according to Modification 2, the examination room map MA is generated by scanning the positional relationship of the light source unit 33 with surrounding objects using the scanning unit 50. However, the examination room R may be scanned in advance, and the examination room map MA of examination room R may be stored in the memory circuit 25. In other words, the scanning unit 50 may not be provided.
[0078] [Third Embodiment] In the X-ray diagnostic system 1 according to the first embodiment described above, when light from the light source unit 33 is irradiated onto a non-uniform surface, the irradiation position of the light source unit 33 is changed by controlling the light source irradiation angle adjustment unit 35. However, it may be possible to use a trained model that has been machine-learned to capture the shape of the irradiated light when it is irradiated onto a uniform surface and the shape of the irradiated light when it is irradiated onto a non-uniform surface, and to calculate at least one of the position and angle of the X-ray detector 31 based on distribution information regarding the distribution of the position where the light source exists from an optical image that includes the shape of the irradiated light when it is irradiated onto a uniform surface and the shape of the irradiated light when it is irradiated onto a non-uniform surface. The following describes the parts that differ from the first and second embodiments.
[0079] Figure 18 shows an example of the configuration of the X-ray diagnostic system 1 according to the third embodiment. As shown in Figure 18, the X-ray diagnostic apparatus 10 according to the third embodiment is configured by adding a learning function 178 to the processing circuit 17 compared to the X-ray diagnostic apparatus 10 according to the first embodiment described above. In addition, the calculation function 172 of the X-ray diagnostic system 1 according to the third embodiment is different and will be referred to as the calculation function 172a. The learning function 178 corresponds to the learning unit according to this embodiment. Furthermore, the configuration and functions other than the learning function 178 and the calculation function 172a are the same as those in Figure 1 and will not be explained.
[0080] The calculation function 172a takes an optical image as input data ID and uses machine learning to input a distribution information about the distribution of the positions of the light source 33 as output data. The optical image is input to a trained model, and the trained model outputs the distribution information. Based on this distribution information, the function calculates at least one of the positions and angles of the X-ray detector. Machine learning may include, for example, machine learning using SVM (Support Vector Machine) or deep learning using multi-layer neural networks such as CNN (Convolutional Neural Network) or Convolutional Deep Belief Neural Network. The following explanation shows an example where machine learning is deep learning using a neural network, and the machine learning model is a trained model using deep learning.
[0081] Figure 19 is an explanatory diagram illustrating an example of the data flow in the calculation function 172a. As shown in Figure 19, the calculation function 172a inputs the optical image IM, which includes the first irradiation light RL1 acquired by the acquisition function 171, as input data to the trained model 70. The trained model 70 outputs distribution information DIS, and based on the distribution information DIS, the calculation function calculates at least one of the position and angle of the X-ray detector 31.
[0082] Distribution information DIS is information regarding the distribution of the locations where the light source unit 33 is located. In the example shown in Figure 19, the distribution information DIS is, for example, a graph G1 relating to the distribution of locations where the light source unit 33 is likely to be located, with the location of the optical camera, which is the detection unit 13, as the origin.
[0083] In this embodiment, in step S13 of the output processing, the calculation function 172a inputs each of the optical images, including the first irradiation light RL1 from two directions acquired by the acquisition function 171, as input data to the trained model, and calculates the position of the X-ray detector 31 by superimposing graphs of distribution information based on each of the optical images from two directions, and using the intersection of these graphs as the light source position.
[0084] The learning function 178 is a function for constructing a trained model. In this embodiment, the learning function 178 constructs a trained model by using multiple images, including the irradiated light, as training data, and the position of the first irradiated light relative to the position of the optical camera as training data. These multiple images, which are the training data, may be optical images taken by an optical camera in real space, or they may be CG images created using CG technology. Furthermore, the training data may include not only images of irradiated light shining on a uniform surface, but also images of irradiated light shining on a non-uniform surface. By including images of irradiated light shining on a non-uniform surface in this way, distribution information can be output even when optical images of irradiated light shining on a non-uniform surface are input to the trained model 70 as input data.
[0085] Various methods can be used for this type of learning and for constructing the trained model. Furthermore, the trained parameter data and neural network constituting the trained model 70 are stored in the memory circuit 25 in the form of a program. The trained parameter data may also be stored in a storage medium connected to the processing circuit 17. When the trained model 70 (neural network and trained parameter data) is stored in the memory circuit 25, the calculation function 172 implemented by the processor of the processing circuit 17 reads the trained model 70 from the memory circuit 25 and executes it. This inputs an optical image to the trained model 70, and the trained model 70 outputs at least one of the position and angle of the X-ray detector 31, thereby allowing the calculation of at least one of the position and angle of the X-ray detector 31. The trained model 70 may also be constructed using an integrated circuit such as an ASIC (Application Specific Integrated Circuit) or an FPGA (Field Programmable Gate Array).
[0086] As described above, according to the X-ray diagnostic device 10 in the X-ray diagnostic system 1 of the third embodiment, the calculation function 172a takes an optical image as input data and outputs distribution information to a trained model 70, which outputs distribution information. Based on this distribution information, the calculation function 172a calculates at least one of the position and angle of the X-ray detector. This improves the accuracy of estimating the position of the light source unit 33 and makes it easier to align the X-ray detector by more accurately determining the position and angle of the X-ray detector.
[0087] [Variation 3] According to the X-ray diagnostic device 10 in the X-ray diagnostic system 1 of the first embodiment described above, target position information regarding the target position of the movement of the X-ray tube may be output. The following describes the parts that differ from the first to third embodiments.
[0088] Figure 20 shows an example of the configuration of the X-ray diagnostic system 1 according to Modification 3. As shown in Figure 20, the X-ray diagnostic apparatus 10 according to Modification 3 is configured by adding a drive unit 29 to the X-ray diagnostic apparatus 10 according to the first embodiment. Also, as shown in Figure 20, the X-ray diagnostic apparatus 10 according to Modification 3 has different calculation and imaging control functions, so they are referred to as calculation function 172b and imaging control function 174a. Note that the configuration and functions other than the drive unit 29, calculation function 172b, and imaging control function 174a are the same as in Figure 1, so their explanation is omitted.
[0089] The drive unit 29 reads drive signals from the processing circuit 17 and moves the support unit 15 by extending and retracting, moving it up and down, rotating it, or moving it. The drive unit 29 is composed of, for example, a motor or a linear actuator. In the example shown in Figure 20, the drive unit 29 is provided on the first arm 1511, but the location of the drive unit 29 is not limited to this. The drive unit 29 may also be provided on the second arm 1513, the joint 1512, or the support body 153. Furthermore, the drive unit 29 is not limited to being provided in one location, but may be provided in multiple locations. In other words, the number of drive units 29 is arbitrary, and it is sufficient that they are provided in at least one location on the support unit 15.
[0090] The calculation function 172b calculates at least one of the position and angle of the X-ray detector 31 relative to the X-ray tube 111 based on the detection result of the detection unit 13. The calculation function 172b also calculates the irradiation position of the X-ray tube 111 relative to the X-ray detector 31 based on the imaging conditions. Furthermore, the calculation function 172b calculates target position information, which is the target position for the movement of the X-ray tube 111, based on at least one of the position and angle of the X-ray detector 31 relative to the X-ray tube 111 and the irradiation position of the X-ray tube 111 relative to the X-ray detector 31.
[0091] The imaging control function 174a controls the support unit based on target position information. Specifically, the imaging control function 174a controls the drive unit 29 to move the X-ray tube 111 to the target position based on the target position information. The imaging control function 174a corresponds to the control unit in this embodiment.
[0092] Figure 21 is a flowchart illustrating the output processing performed in the X-ray diagnostic apparatus 10 according to Modification 3, and corresponds to Figure 4. In the output processing according to Modification 1, the detection result of the detection unit 13 is obtained, at least one of the position and angle of the X-ray detector 31 is calculated, the imaging conditions are obtained, the irradiation position of the X-ray tube 111 is calculated, target position information is calculated, the calculation results are output, and the support unit is controlled. For example, the output processing is performed when the operator inputs X-ray imaging conditions via the input interface 21. Note that the processing in steps S11 and S13 in Figure 21 is equivalent to the processing in steps S11 and S13 in Figure 4, so the explanation is omitted.
[0093] Next, as shown in Figure 21, the acquisition function 171 in the processing circuit 17 of the X-ray diagnostic device 10 acquires the imaging conditions (step S41). Specifically, the acquisition function 171 acquires the SID as the imaging conditions.
[0094] Next, as shown in Figure 21, the calculation function 172b in the processing circuit 17 of the X-ray diagnostic device 10 calculates the irradiation position of the X-ray tube 111 (step S43). Specifically, the calculation function 172b calculates the irradiation position of the X-ray tube 111 relative to the X-ray detector 31 based on the imaging conditions acquired in step S41. More specifically, the calculation function 172b calculates the irradiation position of the X-ray tube 111 relative to the X-ray detector 31 as a position facing the X-ray detector 31 and at a distance equal to the SID from the X-ray detector 31.
[0095] Next, as shown in Figure 21, the calculation function 172b calculates the target position information (step S45). Specifically, the calculation function 172b calculates the target position information based on at least one of the position and angle of the X-ray detector 31 calculated in step S13 and the irradiation position of the X-ray tube 111 calculated in step S43. Note that the processing in step S17 after step S45 is equivalent to the processing in step S17 in Figure 1, so the explanation is omitted.
[0096] Next, as shown in Figure 21, the output function 173 in the processing circuit 17 of the X-ray diagnostic device 10 outputs target position information (step S47). Specifically, the output function 173 outputs the target position information calculated in step S45 to the imaging control function 174a.
[0097] Next, as shown in Figure 21, the imaging control function 174a in the processing circuit 17 of the X-ray diagnostic apparatus 10 moves the X-ray tube 111 (step S49). Specifically, the imaging control function 174a moves the X-ray tube 111 to the target position by controlling the drive unit 29 based on the target position information output in step S47.
[0098] By executing step S49, the output processing according to this embodiment is terminated.
[0099] As described above, in the X-ray diagnostic device 10 of the X-ray diagnostic system 1 according to the modified example 3, the calculation function 172b calculates target position information, and the imaging control function 174 controls the drive unit 29 based on the target position information to move the X-ray tube 111 to the target position, thereby making the alignment of the X-ray detector 31 easier.
[0100] In the above explanation, the term "processor" refers to circuits such as a CPU (Central Processing Unit), a GPU (Graphics Processing Unit), an Application Specific Integrated Circuit (ASIC), or a programmable logic device (e.g., a Simple Programmable Logic Device (SPLD), a Complex Programmable Logic Device (CPLD), and a Field Programmable Gate Array (FPGA)). The processor functions by reading and executing a program stored in the memory circuit 25. Alternatively, instead of storing the program in the memory circuit 25, the processor may be configured to directly incorporate the program into its circuitry. In this case, the processor functions by reading and executing the program incorporated into the circuitry. The processor is not limited to being configured as a single circuit; it may also be configured by combining multiple independent circuits to form a single processor and achieve its functions. Furthermore, the multiple components shown in Figures 1, 8, 12, 14, 18, and 20 may be integrated into a single processor to realize its functions.
[0101] According to at least one embodiment described above, the alignment of the X-ray detector can be facilitated.
[0102] Although several embodiments have been described above, these embodiments are presented only as examples and are not intended to limit the scope of the invention. The novel apparatus and methods described herein can be implemented in a variety of other forms. Furthermore, various omissions, substitutions, and modifications can be made to the embodiments of the apparatus and methods described herein, without departing from the spirit of the invention. The appended claims and equivalents are intended to include such embodiments and modifications that are included in the scope and spirit of the invention. [Explanation of Symbols]
[0103] 1...X-ray diagnostic system, 10...X-ray diagnostic device, 11...X-ray irradiation unit, 13...Detection unit, 15...Support unit, 17...Processing circuit, 19...High voltage generation circuit, 21...Input interface, 23...Display, 25...Memory circuit, 27...Communication circuit, 29...Drive unit, 30...X-ray detection unit, 31...X-ray detector, 33...Light source unit, 35...Light source irradiation angle adjustment unit, 50...Scanning unit, 51...Scanning unit main body, 53...Rotating mirror, 70...Learned model, 111...X-ray tube, 13 1…First optical camera, 133…Second optical camera, 151…Arm section, 153…Support body section, 171…Acquisition function, 172, 172a, 172b…Calculation function, 173…Output function, 174, 174a…Shooting control function, 175, 175a…First judgment function, 176, 176a…Light source control function, 177…Second judgment function, 178…Learning function, 331…First light source, 333…Second light source, 351…First light source irradiation angle adjustment mechanism, 353…Second light source irradiation angle adjustment mechanism
Claims
1. A detection unit that detects light projected from a light source unit in an X-ray detector that detects X-rays and reflected by an object, A calculation unit calculates at least one of the position and angle of the X-ray detector based on the position of the light detected by the detection unit, An output unit outputs at least one of the position and angle of the X-ray detector as a result of the calculation by the calculation unit, An X-ray diagnostic device equipped with [specific features / features].
2. The detection unit is an optical camera, The X-ray diagnostic apparatus according to claim 1, wherein the calculation unit calculates at least one of the position and angle of the X-ray detector based on the position of the light contained in the optical image captured by the optical camera.
3. The X-ray diagnostic apparatus according to claim 1, wherein the detection unit is provided on at least one of the walls of the examination room and the exterior of the X-ray diagnostic apparatus body.
4. The X-ray diagnostic apparatus according to claim 2, wherein the calculation unit identifies either a character or a symbol projected by the light source unit in the optical image.
5. The X-ray diagnostic apparatus according to claim 2, wherein the calculation unit calculates at least one of the position and angle of the X-ray detector by inputting the optical image and using a trained model that outputs at least one of the position and angle of the X-ray detector.
6. It further includes an X-ray tube for irradiating the subject with X-rays, The X-ray diagnostic apparatus according to claim 2, wherein the calculation unit calculates at least one of the position and angle of the X-ray detector and calculates target position information relating to the target position of the movement of the X-ray tube.
7. The following further comprises a support for the X-ray tube: The X-ray diagnostic apparatus according to claim 6, further comprising a control unit that controls the support unit based on the target position information output as a calculation result by the output unit.
8. The calculation unit calculates statistical values relating to the distribution of light contained in the optical image based on the optical image, The system further includes a first determination unit that determines whether the statistical value calculated by the calculation unit is lower than a predetermined threshold, The X-ray diagnostic apparatus according to claim 2, wherein if the first determination unit determines that the statistical value is lower than a predetermined threshold, the output unit outputs change information which is information for changing the light projection direction of the light source unit.
9. The optical camera captures the optical image, The system further includes a second determination unit that determines whether or not light is projected onto a preset object in a plurality of captured optical images. The X-ray diagnostic apparatus according to claim 2, wherein if the second determination unit determines that light is being projected onto an object other than a preset object, the output unit outputs change information, which is information for changing the projection direction of the light source unit.
10. The X-ray diagnostic apparatus according to claim 1, wherein the detection unit detects light projected from each of the plurality of light sources of the light source unit and reflected from the object.
11. An X-ray diagnostic system comprising an X-ray detection unit for detecting X-rays and an X-ray diagnostic device, The aforementioned X-ray detection unit is An X-ray detector that detects the aforementioned X-rays, The X-ray detector is surrounded by a light source unit that emits light, The aforementioned X-ray diagnostic apparatus, A detection unit that detects light projected from the light source and reflected by an object, A calculation unit calculates at least one of the position and angle of the X-ray detector based on the position of the light detected by the detection unit, The system includes an output unit that outputs the calculation result from the calculation unit, X-ray diagnostic system.
12. The light source unit has a plurality of light sources, The detection unit detects light projected from each of the multiple light sources and reflected off the object. The X-ray diagnostic system according to claim 11.
13. The X-ray diagnostic system according to claim 11, wherein the light source unit emits directional light.
14. The X-ray diagnostic system according to claim 11, wherein the light source unit projects either characters or symbols.
15. A step of calculating at least one of the position and angle of the X-ray detector based on the position of light projected from a light source unit provided in the X-ray detector that detects X-rays and detected by a detection unit that detects light reflected by an object, Steps to output the calculation results, A program to cause an X-ray diagnostic device to execute a command.
Citation Information
Patent Citations
X-ray detector and x-ray imaging device
JP2019184517A