Potential-compensated electrostatic shield and potential detection sensor

Abstract

This invention provides a potential-compensated electrostatic shield that prevents the generation of abnormal electric fields within the enclosure. [Solution] The potential-compensating electrostatic shield 1 comprises an outer housing 2 which is a conductor, an inner housing 3 which is a conductor disposed inside the outer housing 2 and electrically insulated from the outer housing, a detection unit 4 which detects the potential of the inner housing 3 or a physical quantity corresponding to that potential, and a variable voltage power supply 5 which applies a potential difference between the outer housing 2 and the inner housing 3. The variable voltage power supply 5 controls the potential difference based on the potential detected by the detection unit 4 or a physical quantity corresponding to that potential.

Description

[Technical Field]

[0001] The present invention generally relates to electrostatic shields and potential sensing sensors used to block the effects of electric fields, and more specifically to potential-compensated electrostatic shields with added potential compensation devices and potential sensing sensors capable of detecting external potentials, for example, in spacecraft used in harsh environments such as outer space. [Background technology]

[0002] The history of spacecraft development worldwide began with Sputnik 1 in 1957, and nearly 70 years have passed since then. The know-how for system and environmental tests conducted before launch must have been accumulated along with this history.

[0003] The costs of developing and operating spacecraft are enormous, so ensuring reliability and increasing the success rate of missions is of paramount importance. However, even in recent years, numerous malfunctions and failures of spacecraft have been reported. For example, both Hayabusa1 and Hayabusa2 experienced ion engine failures.

[0004] A NASA investigation into spacecraft malfunctions and anomalies from 1974 to 1994 revealed that plasma in space was the most common cause of failures, accounting for 36%. Plasma interfered with or degraded spacecraft equipment, leading to issues such as logic inversions in digital circuits, memory bit failures, and performance degradation. The second most common cause was ion radiation, accounting for 33%. Furthermore, transient failures (single-event upsets) accounted for over 42% of the failure modes. The number of malfunction cases investigated exceeded 100 [Non-Patent Literature 1].

[0005] To address the aforementioned problems, spacecraft shielding technology is being developed with the primary objective of avoiding cosmic radiation particles flying around in space ([Non-Patent Literature 2, 3, 4]).

[0006] In the space environment, cosmic rays penetrate the shield of a spacecraft, cause charging, and damage electronic devices. To avoid such problems, as a main countermeasure, attempts have been made to arrange high-voltage electrodes on the hull of a spacecraft to repel charged cosmic ray particles by Coulomb force.

[0007] Since malfunctions and failures of a spacecraft occurring in outer space originate from the natural space environment, tests simulating the space environment are conducted in environmental tests performed before launch. Although such efforts have been continued, the frequent occurrence of failures after the start of operation suggests that the environment assumed during testing may be insufficient.

Prior Art Literature

Non-Patent Literature

[0008]

Non-Patent Literature 1

Non-Patent Literature 2

Non-Patent Literature 3

Non-Patent Literature 4

[0009] The present invention has been made in view of the foregoing facts, and an object of the present invention is to provide a potential-compensated electrostatic shield that prevents the generation of abnormal electric fields within a housing, and a potential detection sensor that enables detection of an external potential capable of generating an abnormal electric field. Means for Solving the Problem

[0010] >(One principle underlying the present invention) The inventor of the present invention found that there is an influence of disturbance that has been overlooked in the development of the aforementioned shielding technology, and reported this in the following paper. According to this paper, the potential inside the shield affects the electron motion of electronic devices within the shield, and induces an electric field particularly in the acceleration process of electrons. This electric field may cause malfunction of electronic devices. It is considered that conventionally used shielding technologies such as Faraday cages do not work effectively against such disturbances. [Paper] Sugiyama T., Generalization of the Lorentz Transformation of the Electromagnetic Four-potential and Concerns About Electrostatic Shielding, IJSCIA, Volume 5, Issue 6, pp.1153-1156, 2024 >(https: / / doi.org / 10.51542 / ijscia.v5i6.16) The embodiments of the present invention for solving the above problems are described below. The operation of the electronic equipment of a spacecraft is guaranteed by tests conducted in an environment with the ground potential of Earth. The present invention aims to eliminate deviations from the ground potential of the spacecraft after launch and avoid potential abnormalities, so the "potential" in the present invention is a potential with the ground potential of Earth as the reference (0 volts). (Potential-compensated electrostatic shielding) A potential-compensated electrostatic shield according to a first aspect of the present invention comprises an outer housing which is a conductor, an inner housing which is a conductor disposed inside the outer housing and electrically insulated from the outer housing, a detection unit which detects the potential of the inner housing or a physical quantity corresponding to the potential, and a variable voltage power supply which applies a potential difference between the outer housing and the inner housing, wherein the variable voltage power supply is configured to control the potential difference based on the potential detected by the detection unit or a physical quantity corresponding to the potential.

[0011] According to a first aspect of the present invention, when a potential-compensating electrostatic shield is placed under an external potential and the outer casing becomes charged due to some factor, the outer casing will have a potential that is the sum of the external potential and the potential increased by the charging, and the inner casing will also have a potential corresponding to the potential of the outer casing. According to the first aspect, a detection unit detects the potential of the inner casing or a physical quantity corresponding to that potential, and a variable voltage power supply that applies a potential difference between the outer casing and the inner casing controls the potential difference based on the potential detected by the detection unit or the physical quantity corresponding to that potential. For example, the variable voltage power supply controls the potential difference applied between the inner and outer casings so as to cancel out the potential detected by the detection unit or the potential determined from the physical quantity corresponding to that potential detected by the detection unit. Preferably, the control of the potential difference by the variable voltage power supply is feedback control with a target potential of 0. Therefore, according to the potential-compensating electrostatic shield of the first aspect of the present invention, the potential of the inner casing can be kept constant, and thus the generation of abnormal electric fields that affect electronic equipment etc. inside the inner casing can be suppressed.

[0012] A potential-compensated electrostatic shield according to a second aspect of the present invention comprises a grounding body which is a conductor, a housing which is a conductor disposed outside the grounding body and electrically insulated from the grounding body, a detection unit which detects the potential of the housing or a physical quantity corresponding to the potential, and a variable voltage power supply which applies a potential difference between the grounding body and the housing, wherein the variable voltage power supply is configured to control the potential difference based on the potential detected by the detection unit or a physical quantity corresponding to the potential.

[0013] According to a second aspect of the present invention, when a potential-compensated electrostatic shield is placed under an external potential and the grounding body becomes charged due to some factor, the grounding body will have a potential that is the sum of the external potential and the potential increased by the charging, and the housing will also have a potential corresponding to the potential of the grounding body. According to the second aspect, a detection unit detects the potential of the housing or a physical quantity corresponding to that potential, and a variable voltage power supply that applies a potential difference between the grounding body and the housing controls the potential difference based on the potential detected by the detection unit or the physical quantity corresponding to that potential. For example, the variable voltage power supply controls the potential difference applied between the grounding body and the housing so as to cancel out the potential detected by the detection unit or the potential determined from the physical quantity corresponding to that potential detected by the detection unit. Preferably, the control of the potential difference by the variable voltage power supply is feedback control with a target potential of 0.

[0014] Therefore, according to the potential-compensated electrostatic shield of the second aspect of the present invention, the potential of the housing can be kept constant, thereby suppressing the generation of abnormal electric fields that may affect electronic equipment and the like inside the housing. (Detection unit of a potential-compensated electrostatic shield) For example, the detection unit includes a mass spectrometer for detecting the apparent mass m' of a charged particle determined by the potential V, and the potential V is calculated based on the apparent mass m'.

[0015] In a preferred detection unit, the apparent mass m' is measured relative to the S system (potential-compensated electrostatic shield and potential detection sensor in this invention) by the potential V observed in the S system, with respect to the S system:

[0016]

number

[0017] When observed in an S' system moving in a potential-compensated electrostatic shield (in this invention, a charged particle moving within a potential-compensated electrostatic shield), the potential V is a change from the original mass m of the charged particle due to the electric field that appears due to the Lorentz transformation of the four-element electromagnetic potential, and the potential V is calculated based on the difference between the mass m of the charged particle and the apparent mass m'. More specifically, if the charge of the charged particle is q, the speed of light is c, and the Lorentz factor at the speed is γ, then the potential V in SI units is given by the following equation:

[0018]

number

[0019] It is calculated as follows. For example, if the exterior of a spacecraft becomes charged due to the influence of the ionosphere or solar plasma, an electric field may be generated in the electrons flowing through the electronic equipment inside the spacecraft due to the Lorentz transformation of the quaternary electromagnetic potential, potentially affecting the electrons in the electronic equipment.

[0020] According to the above-described detection unit, even if such an abnormal electric field occurs, the detection unit of the present invention accurately detects the potential inside the spacecraft, and the variable voltage power supply controls the potential difference between the housings to cancel out the potential, thereby preventing abnormal operation of electronic equipment.

[0021] A more preferred mass spectrometer comprises a particle source for supplying the charged particles, a static magnetic field generator for applying a static magnetic field B to the charged particles, a high-frequency electromagnetic field generator for applying a high-frequency electromagnetic field to the charged particles that are undergoing circular motion in a plane perpendicular to the static magnetic field B to induce cyclotron resonance, and a time waveform signal i of the current generated by the charged particles that have caused the cyclotron resonance. d The system includes a current acquisition unit that collects (t), and the time waveform signal i of the current. dBased on (t), the cyclotron frequency ωc can be determined, and from this cyclotron frequency ωc, the apparent mass m' of the charged particle can be calculated. This mass spectrometer, which utilizes cyclotron resonance, can detect the apparent mass of the charged particle with great accuracy, and therefore the external potential V can also be detected with great accuracy. (Electrical potential detection sensor) A potential detection sensor for detecting an electric potential V according to a third aspect of the present invention comprises a mass spectrometer for detecting the apparent mass m' of a charged particle determined by the electric potential V, and a potential calculation unit for calculating the electric potential V based on the apparent mass m'.

[0022] Preferably, the apparent mass m' is measured relative to the S system by the velocity of the potential V observed in the S system (in this invention, the potential sensing sensor):

[0023]

number

[0024] When observed in a moving S' system (in this invention, a charged particle (e.g., an electron) that is the target of detection by the potential detection sensor), the mass of the charged particle changes from its original mass m due to the electric field that appears due to the Lorentz transformation of the four-element electromagnetic potential, and the potential calculation unit calculates the potential V based on the difference between the mass m of the charged particle and the apparent mass m'.

[0025] The aforementioned potential calculation unit, If the charge of the charged particle is q, the speed of light is c, and the Lorentz factor at the speed is γ, then the potential V can be expressed in SI units as follows:

[0026]

number

[0027] It is characterized by being calculated using [this method]. A preferred mass spectrometer includes a particle source for supplying the charged particles, a static magnetic field generator for applying a static magnetic field B to the charged particles, a high-frequency electromagnetic field generator for applying a high-frequency electromagnetic field to the charged particles that are undergoing circular motion in a plane perpendicular to the static magnetic field B to induce cyclotron resonance, and a time waveform signal i of the current generated by the charged particles that have caused the cyclotron resonance. d It is configured to include a current acquisition unit that collects (t), and

[0028] For example, the potential calculation unit receives the time waveform signal i of the current output from the current acquisition unit. d Based on (t), the cyclotron frequency ωc is determined, and the apparent mass m' of the charged particle is calculated from the cyclotron frequency ωc. More specifically, the potential calculation unit calculates the time waveform signal i of the current output from the current acquisition unit. d (t) is Fourier transformed to calculate the frequency spectrum I(ω), the frequency ωp that gives the peak value in the frequency spectrum I(ω) is detected, and the apparent mass m' is calculated using the following equation with the frequency ωp as the cyclotron frequency.

[0029]

number

[0030] The potential V is calculated based on the difference between the mass m of the charged particle and the apparent mass m'. A potential detection sensor in another embodiment is placed in the S system to detect the potential V of the S system, The four electromagnetic potentials of the aforementioned electric potential V are Velocity relative to the S system:

[0031]

number

[0032] The system is configured to detect the potential V based on the motion of charged particles in the S' system, which are affected by the electric field that appears when the S' system, which is moving in the S' system, is subjected to a Lorentz transformation. For example, the motion of charged particles can be, but is not limited to, the radius of rotation of a circular motion in a static magnetic field.

[0033] If the charge of the aforementioned charged particle is q, the speed of light is c, and the Lorentz factor at the aforementioned speed is γ, The aforementioned electric field is,

[0034]

number

[0035] It is represented as follows. Potential detection sensors according to other embodiments can also be used as the detection unit of the above-mentioned potential-compensated electrostatic shield. [Effects of the Invention]

[0036] According to the present invention, the potential inside the enclosure to be shielded is detected by a potential detection sensor, and the potential difference generated by the power supply is controlled to apply a potential difference between the inside and outside of the double enclosure or between the independent enclosure and the grounding body, thereby keeping the potential inside the enclosure to be shielded constant. This measure prevents the generation of a potential inside the enclosure that differs from that on Earth. In other words, it prevents unexpected induction from occurring.

[0037] In any case, if the potential inside the spacecraft is equal to the Earth's ground potential due to the potential compensation of the present invention, electrons moving within the electronic equipment installed for the spacecraft's mission will be able to perform as expected, regardless of their speed, just as they did when tested on the ground. In particular, the present invention makes it possible to guarantee the operation of equipment that deals with significant acceleration of charged particles, such as ion engines and vacuum tubes. [Brief explanation of the drawing]

[0038] [Figure 1]FIG. 1 is a schematic configuration diagram of a potential-compensated electrostatic shield with a double-structured housing according to a first embodiment of the present invention. [Figure 2] FIG. 2 is a schematic configuration diagram of a potential-compensated electrostatic shield with an independent housing according to a second embodiment of the present invention. [Figure 3] FIG. 3 is a block diagram of a variable voltage source provided in the potential-compensated electrostatic shield according to the first and second embodiments of the present invention. [Figure 4] FIG. 4 is a schematic configuration diagram of an example of a detection unit provided in the potential-compensated electrostatic shield according to the first and second embodiments of the present invention. [Figure 5] FIG. 5 is a functional block diagram of a potential calculation circuit that calculates an external potential from a current signal output from the detection unit of FIG. 4. MODE FOR CARRYING OUT THE INVENTION

[0039] Hereinafter, potential-compensated electrostatic shields according to the first and second embodiments of the present invention will be described with reference to the drawings. <Potential-compensated electrostatic shield: first embodiment> FIG. 1 shows a potential-compensated electrostatic shield 1 according to the first embodiment of the present invention. As shown in this figure, the potential-compensated electrostatic shield 1 comprises an outer housing 2 that is a conductor, an inner housing 3 that is a conductor disposed inside the outer housing 2 and electrically insulated from the outer housing 2, and a potential V of the inner housing 3 safe or a potential V safe a detection unit 4 that detects a physical quantity corresponding to , and a variable voltage source 5 that applies a potential difference Vc between the outer housing 2 and the inner housing 3. That is, the potential-compensated electrostatic shield 1 is configured as a housing with a double-structured wall, and each housing has, for example, a shape surrounded by conductor walls, but is not limited to the illustrated shape example. The inner housing 3 has an internal space, and an electronic device can be disposed in the internal space. Note that the location where the variable voltage source 5 is disposed is not limited to the inside of the inner housing 3.

[0040] The variable voltage source 5 adjusts the potential V detected by the detection unit 4 safe or a potential V safeThe potential difference Vc is controlled based on the corresponding physical quantity. Next, the operation of the potential-compensated electrostatic shield 1 will be explained. The outer casing 2 is charged, and the potential component that has risen due to the charge is V charge Let's assume that the potential outside the outer casing 2 is V ext In that case, the potential V inside the outer casing 2 body teeth, V body =V ext +V charge (1-1) This is the result. Note that the electric potential discussed here does not refer to an absolute value. This is self-evident from electromagnetism and is a quantity that can be dealt with by defining a reference electric potential. Here, we will proceed with the explanation assuming the Earth's surface electric potential is a reference value of 0 volts.

[0041] As described above, the variable voltage power supply 5 applies a potential difference Vc between the outer casing 2 and the inner casing 3, so the potential of the outer casing 2 is V body When this is the case, the potential V of the inner casing 3 safe It can be expressed as follows: V safe =V body +Vc (1-2) The variable voltage power supply 5 controls the potential V of the inner casing 3. safe Vc is adjusted so that it decreases to a threshold that does not affect the electronic equipment located inside the inner housing 3. Preferably, V safe Adjust Vc so that it effectively becomes 0 (volts). In this case, Vc is expressed by the following formula. Vc = -V body (1-3) According to the potential-compensated electrostatic shield 1 of the first embodiment of the present invention, a potential V is present in the external space in which the potential-compensated electrostatic shield 1 is placed. ext If there is a V charge Even if it becomes charged, the potential V inside the outer casing 2 bodySince a potential difference Vc is applied between the outer casing 2 and the inner casing 3 to cancel out the effects, it is possible to prevent failure of electronic equipment placed inside the inner casing 3 even in the above-mentioned case. Furthermore, even if the external potential changes, the potential inside the casing can be kept approximately constant, preventing the generation of abnormal electric fields inside the casing.

[0042] Note that equations (1-1) and (1-2) were used to explain the distribution of potential, and the V appearing in these equations charge Yes, V ext This may be unknown to the operation of the control system. <Potential-compensated electrostatic shield: Second embodiment> Figure 2 shows a potential-compensated electrostatic shield 1b according to a second embodiment of the present invention. As shown in the figure, the potential-compensated electrostatic shield 1b comprises a grounding body 6 which is a conductor, a housing 7 which is a conductor positioned outside the grounding body 6 and electrically insulated from the grounding body 6, and the potential V of the housing 6. safe or the potential V safe The system includes a detection unit 4 that detects a corresponding physical quantity, and a variable voltage power supply 5 that applies a potential difference Vc between the grounding body 6 and the housing 7. Here, the same reference numerals are used for the same configuration elements as in the first embodiment. Note that the location of the variable voltage power supply 5 is not limited to inside the housing 7.

[0043] As described above, the potential-compensated electrostatic shield 1b according to the second embodiment does not have a configuration in which the outer housing 2 covers the inner housing 3 as in the first embodiment, but rather has a grounding body 6 provided on the outside of the housing 7 (corresponding to the inner housing 3 in the first embodiment).

[0044] The grounding body 6 may have a housing structure with an internal space, as in the outer housing 2 of the first embodiment, or any structure can be used as long as it is a conductor. The operation and effects of the potential-compensated electrostatic shield 1b according to the second embodiment are the same as those of the potential-compensated electrostatic shield 1 according to the second embodiment, so a detailed explanation is omitted. <An embodiment of a variable voltage power supply> Next, an embodiment (5a) of the variable voltage power supply 5 will be described using Figure 3. In Figure 3, the same reference numerals are used for the same components as in the first and second embodiments, and detailed explanations are omitted.

[0045] As shown in Figure 3, the variable voltage power supply 5a according to one embodiment receives the detection signal i output from the detection unit 4. d A potential calculation circuit 10 calculates the potential of housings 3 and 7, and the target potential of housings 3 and 7 is set to 0 (volts), and the potential V calculated by the potential calculation circuit 10 is calculated. safe The system includes a deviation calculation unit 11 that calculates the deviation e from the target potential 0, a PID calculator 12 that calculates a control amount based on PID (proportional-integral-derivative) control based on the deviation e calculated by the deviation calculation unit 11, and an output voltage changing circuit 13 that adjusts the voltage from the power supply 14 based on the control amount calculated by the PID calculator 12 and applies the control voltage Vc to the (internal) housing 3,7. The output voltage changing circuit 13 can be configured to control the resistance of a variable resistor or to output a desired voltage by controlling a transistor, etc.

[0046] Controlled by the variable voltage power supply 5a, V is quickly generated as shown in the following equation. safe It becomes possible to effectively reduce it to zero. V safe ~0 (1-4) That is, V charge Yes, V ext V fluctuates safe Even if the value changes, the feedback control by the detection unit 4 and the variable voltage power supply 5 is maintained by V safe Automatically adjusts to the deviation from the target value of 0 volts. safe This asymptotically approaches 0 volts.

[0047] The configuration of the variable voltage power supply of the present invention is not limited to the above embodiment and can be arbitrarily and suitably changed. For example, feedback control other than PID control or feedforward control may be used. <An embodiment of the detection unit> The detection unit 4 can be configured as a potential detection sensor that directly detects the potential of the (internal) housings 3 and 7. In this case, the potential calculation circuit 10 shown in Figure 3 is not necessarily required.

[0048] On the other hand, as published in the above-mentioned paper, the inventors of this invention discovered that when a constant, position-independent background potential V observed in the S system is observed in the S' system moving at velocity ν relative to the S system, an electric field proportional to the background potential V and acceleration dv / dt is generated by the Lorentz transformation of the four-element electromagnetic potential. Therefore, it is understood that a charged particle is subjected to a force from the electric field caused by the background potential V, and its apparent mass changes. Using this fact, it is possible to calculate the background potential V from the measured apparent mass of the charged particle. As will be described in detail later, if the mass of the charged particle is m, the calculated apparent mass of the charged particle is m', the speed of light is c, the charge of the charged particle is q, and the Lorentz factor is γ, the potential V to be obtained can be calculated in the SI unit system by the following equation.

[0049]

number

[0050] According to equation (1-5), the potential V can be measured by configuring the detection unit 4 as a sensor for measuring the mass of charged particles. As an example, the detection unit 4 shown in Figure 3 is a mass spectrometer 4a. The mass spectrometer 4a is configured to observe the apparent mass m' of charged particles with a known mass m generated from a particle source. Examples of mass spectrometer 4a types include quadrupole type, double focusing type, ion trap type, and time-of-flight type, but the mass spectrometer of the present invention is not limited to these. (Omegatron Mass Spectrometer) One preferred embodiment of the mass spectrometer according to the present invention is an ion (electron) cyclotron resonance mass spectrometer, also known as an omegatron. The detection unit 4b, configured as an omegatron, will be described below with reference to Figure 4.

[0051] As shown in Figure 4, the detection unit 4b includes a particle source (not shown) that supplies charged particles into the vacuum chamber 20, a static magnetic field generator 21 that applies a static magnetic field B in the z direction perpendicular to the xy plane (plane on the drawing), high-frequency electrodes 22, 22 positioned to apply a high-frequency electromagnetic field to charged particles moving in a circular motion in the xy plane due to the static magnetic field B, a high-frequency oscillator 23 for generating a high-frequency electromagnetic field by applying a high-frequency AC voltage to the high-frequency electrodes 22, 22, current electrodes 25, 25 that generate a current due to charged particles moving along the orbit 24 by cyclotron resonance caused by the high-frequency electromagnetic field, and an image current generated at the current electrodes 25, 25 that amplifies the image current to produce a time waveform signal i of the image current. d It includes a current amplifier 26 that outputs as (t), and

[0052] The operation of the detection unit 4b will be described below. A particle source supplies charged particles with charge q and mass m into the vacuum chamber 20, and a static magnetic field generator 21 applies a static magnetic field B (magnetic flux density B) in the z direction into the vacuum chamber 20. At this time, due to the Lorentz force generated by the static magnetic field B, the charged particles undergo circular motion in the xy plane perpendicular to the z direction at a cyclotron (angular) frequency ωc, which is expressed by the following equation.

[0053]

number

[0054] As described above, with the charged particle in circular motion, a high-frequency AC voltage is applied from the high-frequency oscillator 23 to the high-frequency electrodes 22, 22. This high-frequency AC voltage includes various frequencies within a certain range, including the cycloton frequency ωc obtained by substituting the known mass of the charged particle into equation (1-6), so that the charged particle can induce cyclotron resonance even if the mass m of the charged particle changes to m' due to the potential V.

[0055] When a certain frequency of the high-frequency electromagnetic field generated by the high-frequency electrodes 22, 22 matches the frequency of the circular motion of the charged particle in the xy-plane, cyclotron resonance occurs. The cyclotron-resonating charged particle gains kinetic energy from the high-frequency electromagnetic field, and the radius of its rotational motion gradually increases as shown in the orbit 24. As the charged particle moves along the orbit 24, it approaches or strikes the current electrode 25, causing a current to flow between the current electrodes 25, 25. The generated current is amplified by the amplifier 26 to form the time waveform signal i of the image current. d It will be output as (t).

[0056] When electrons are used as the charged particles mentioned above, the calculations in equations (1-5) and (1-6) are performed using q = e (electron charge). The charged particles in the vacuum chamber 20 are undergoing accelerated motion under potential V as described above. Therefore, they are actually subjected to a force from the electric field represented by equation (20), which will be described later, along with the Lorentz force from the static magnetic field B. For this reason, the charged particles are undergoing circular motion in a state where the resultant force of the Lorentz force and the force from the electric field in equation (20) is balanced by the centrifugal force. From this equilibrium condition, the radius of rotation r of the circular motion is:

[0057]

number

[0058] This is the result. Here, ν is the velocity of the charged particle, and the charge q of the charged particle is given as an absolute value. The velocity ν of the charged particle can be considered to be sufficiently slow compared to the speed of light, given the dimensions of the omegatron actually used, so the Lorentz factor γ is approximated as 1 in equation (1-7).

[0059] The rotational frequency f of a charged particle is given by ν=rω, ω=2πf, so from equation (1-7),

[0060]

number

[0061] To obtain. If the electric potential V is 0V, and the charged particle is an electron, then the electron mass m = 9.109 × 10⁻⁶ -31 [kg], electron charge q = -1.602 × 10 -19 [C], and the speed of light c = 2.9978 × 10⁻⁶ 8 Substituting [m / s] into equation (1-8), f = 2.80 × 10 9 [Hz] To obtain.

[0062] When the potential V is 100,000V, from equation (1-8) f = 2.34 × 10 9 [Hz] To obtain.

[0063] From the above calculation results, the electron rotation frequency f (cyclotron frequency) is affected by the electric potential V; if the electric potential V is positive, f decreases, and if the electric potential V is negative, f increases. In other words, it is suggested that the Omegatron can be used as an electric potential sensor.

[0064] Furthermore, equation (1-7) suggests that the potential V can also be measured by detecting the rotational radius of the charged particle. <Electricity Calculation Unit> The potential calculation unit 10 shown in Figure 3 processes the time waveform signal i of the image current output from the detection unit 4b. d (t) From the potential V (=V safe The calculation is performed by the potential calculation unit 10. The calculation process flow of the potential calculation unit 10 will be explained with reference to Figure 5.

[0065] In the potential calculation unit 10, first, the calculation block 100 calculates the time waveform signal i d The frequency spectrum I(ω) is obtained by performing a Fourier transform on (t) and stored in memory 101. Next, in the calculation block 102, the peak frequency ωp that gives the peak intensity is detected from the frequency spectrum I(ω). Since the detected peak frequency ωp is considered to be the cyclotron resonance frequency ωc (=ωp), the calculation block 103 calculates the apparent mass m' of the charged particle according to the following equation obtained by rearranging equation (1-6).

[0066]

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[0067] The calculation block 104 calculates and outputs the electric potential V by substituting the apparent mass m' of the charged particle, calculated using equation (1-9), into equation (1-5). Note that equation (1-5) includes the Lorentz factor γ, but the velocity v of the charged particle relative to the electric potential-compensated electrostatic shields 1 and 1b is also calculated. s When can be considered sufficiently small compared to the speed of light, the calculation block 104 may approximate γ=1 and calculate equation (1-5). Within the potential-compensated electrostatic shields 1 and 1b, for example, the charged particle velocity v s If the speed is accelerated to near the speed of light, the calculation block 104 calculates the velocity v s The Lorentz factor γ is calculated using [this method]. <Basis for equation (1-5)> Equations (1-5) are based on the content published by the inventor of the present invention in the above-mentioned paper, and are derived as follows.

[0068] The electromagnetic four-potential observed in the S system is

[0069]

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[0070] And the velocity relative to the S system

[0071]

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[0072] The electromagnetic four-potential observed in the S' system moving in that state is

[0073]

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[0074] Let's assume that. The conventionally used Lorentz transformation for electromagnetic four-potential systems only addresses the case where the S' system is moving linearly in each of the three axes, and the following transformation formula is known.

[0075] When system S' is moving in the X-axis direction with velocity ν, the Lorentz transformation of the electromagnetic four-potential is:

[0076]

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[0077] Therefore, when system S' is moving in the Y-axis direction with velocity ν, the Lorentz transformation of the electromagnetic four-potential is,

[0078]

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[0079] Therefore, when the S' system is moving in the Z-axis direction with velocity ν, the Lorentz transformation of the electromagnetic four-potential is,

[0080]

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[0081] In the above formula,

[0082]

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[0083] Here, ν is the velocity of motion in the S' system, and c is the speed of light. Equation (1) can be written out for each component as follows:

[0084]

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[0085] Similarly, the components of equations (2) and (3) can be written out as follows:

[0086]

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[0087]

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[0088] When the direction of the velocity of the S' system is arbitrary, the electromagnetic four-potential observed from the S' system can be obtained by combining equations (6), (7), and (8) as follows.

[0089]

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[0090] Here,

[0091]

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[0092]

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[0093] is the velocity vector

[0094]

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[0095] They are parallel and perpendicular to each other, respectively. They can be defined as follows:

[0096]

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[0097] Substituting equation (10) into equation (9), we obtain the following equation.

[0098]

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[0099] Equation (11) is an arbitrary velocity vector

[0100]

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[0101] The electromagnetic four-potential observed from the S' system moving in that region.

[0102]

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[0103]

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[0104] This makes it possible to calculate. (Proof) The fact that equation (11) is a reliable Lorentz transformation can be proven as follows:

[0105] If the four-element electromagnetic potential follows a Lorentz transformation, then the following relationship must hold:

[0106]

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[0107] By substituting equation (11) into equation (12), the right-hand side of equation (12) is obtained as follows:

[0108]

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[0109] The following relation was used in this derivation process.

[0110]

number

[0111] As shown above, it has been proven that equation (11) represents the Lorentz transformation of the electromagnetic four-potential. (Advantages of formula (11)) Conventional equations (1), (2), and (3) are written under the assumption that they deal with linear motion in the direction of the coordinate axes, but are not suitable for curvilinear motion. The advantage of equation (11) is that it can be applied even if the direction of the velocity vector is arbitrary, and it can be easily applied even when the direction of velocity changes with time.

[0112]

number

[0113] Therefore,

[0114]

number

[0115] Under these conditions, equation (11) can be simplified as follows:

[0116]

number

[0117] (Field of an acceleration system in a constant potential space) There exists a space in which the electromagnetic four-potential is given by the following equation.

[0118]

number

[0119] Here, we assume that V takes a constant value that does not depend on the position in space.

[0120]

number

[0121] The electromagnetic four-potential appearing in the S' system in motion can be obtained by substituting equation (16) into equation (11) as follows:

[0122]

number

[0123] The electric field that appears in the S' system.

[0124]

number

[0125] and magnetic field

[0126]

number

[0127] It can be expressed by the following equation.

[0128]

number

[0129] Substituting equation (17) into equations (18) and (19), we obtain the following equation.

[0130]

number

[0131] Equation (20) shows that in a constant potential space, the acceleration system is given by the background potential V and acceleration

[0132]

number

[0133] This means that an electric field proportional to is generated. Also, as shown in equation (21), no magnetic field exists. When the electric and magnetic fields in system S are transformed into the electric and magnetic fields in system S' via the Lorentz transformation without using the electromagnetic four-potential, equation (20) cannot be obtained. This is because some information is lost when the electromagnetic four-potential is transformed into electric and magnetic fields. The constant component contained in the electrostatic potential is lost via the operator grad. Also, the gradient component and constant vector component contained in the vector potential are lost via the operator rot. (Equation of motion for a charged particle moving in a space of constant potential) If there is a charged particle moving with the S' system, and its charge is q, then the force acting on this charged particle is...

[0134]

number

[0135] It can be expressed as follows:

[0136]

number

[0137] Here,

[0138]

number

[0139] This is the electric field that appears in the S' system,

[0140]

number

[0141] teeth, electric field

[0142]

number

[0143] This is an external force acting on a charged particle due to factors other than those mentioned above. Substituting equation (20) into equation (22), we obtain the following equation.

[0144]

number

[0145] Here, the equation of motion for the particle is given by the following equation.

[0146]

number

[0147] In the above equation, m is the mass of the particle. From equations (23) and (24), the following equation is obtained.

[0148]

number

[0149] The right-hand side of equation (25)

[0150]

number

[0151] Since is the dimension of mass, the particle is interpreted as having an apparent mass m' defined by the following equation.

[0152]

number

[0153] By solving equation (26) for V, we can obtain equation (1-5). Equation (26) means that the apparent mass of a charged particle changes in response to the background potential. This affects, for example, the cyclotron frequency. Therefore, as mentioned above, the apparent mass m' of a charged particle can be determined by measuring the cyclotron frequency.

[0154] In electronic devices that handle electron motion with extreme sensitivity, if attention is not paid to the potential of the space in which the device is placed, the apparent mass of the electrons can change, potentially leading to malfunctions.

[0155] Even if space probes pass thorough system tests before launch, numerous unexpected malfunctions have been reported once they are actually deployed in space. The primary trigger for these malfunctions is thought to be electrical stimulation from the sun or Earth's radiation belt.

[0156] While the reliability of spacecraft shielding technology is typically tested against the effects of ESD, EMI, and EMP, the above discussion suggests that the effects of external potentials should also be considered.

[0157] Even if the electric field inside the space within the electrostatic shield of the probe is zero, the external potential penetrates the inside of the shield, and as a result, even if the electronic device is placed inside the shield, the electrons in the circuit will be affected by the potential V according to equation (20).

[0158] Even if the potential in a space is constant, charged particles moving within that space can be affected by that potential. This prediction suggests that Faraday shields installed to protect electronic devices may not function effectively in environments where high-voltage systems and electronic devices coexist.

[0159] According to the present invention, it is understood that electronic devices can be properly protected even when the above-mentioned potential exists. <Observational evidence demonstrating the influence of electric potential on nearby currents> Equation (20) shows that if the motion of charged particles in the S' system is accelerating, the four-element electromagnetic potential of the S' system changes over time, thus generating an electric field. Since the strength of the electric field shown in equation (20) is proportional to the potential V, the higher the potential V, the greater the effect of the generated electric field on the charged particles. I. Observed Facts The inventors of this invention observed the following (1) and (2) as examples of how electric potential, particularly high potential, can affect nearby currents. (1) Telephone test (1986) When the receiver of an analog telephone is removed and a timeout occurs, the phantom power supply to the line and the dial tone stop, and the phone enters a high-and-dry (H&D) state. In this state, if the receiver is held to the ear, radio audio can sometimes be heard. Turning on the radio in the room revealed that the audio coming from the receiver was the same as that of an AM Tohoku Broadcasting program. It is presumed that there is a Tohoku Broadcasting transmission station nearby, and its radio waves were being guided into the telephone line.

[0160] In a high-and-dry state, after phantom power is cut off, a high-voltage pulse for health monitoring is applied to the telephone line at a rate of once every 10 seconds. Radio broadcasts could be heard from the receiver immediately after the health monitoring pulse was generated, and then the volume rapidly decreased, becoming almost zero after 1 second. Each time a high-voltage pulse was generated, the radio audio would start to be heard from the receiver and then gradually decrease in volume.

[0161] The above observations indicate that under high potential conditions, the current signal induced in the telephone line is amplified or attenuated. (2) Tesla coil experiment (1995) When a small Tesla coil wound with ultra-fine wire (φ0.1 mm) was energized with the output of a high-frequency power supply, more current flowed to the power supply's output side than during a short circuit. The inventors of this invention considered that if the Tesla coil resonated with the internal components (coils and capacitors) of the power supply, the output current might increase, and measured the input power to the Tesla coil. However, the measured input power was actually lower than the input power before observing the increased current, revealing that the above assumption was incorrect.

[0162] The above observations suggest that some kind of electromotive force was generated under the high potential of the Tesla coil, accelerating the current. The above describes embodiments of the present invention, but the present invention is not limited to the above examples and can be arbitrarily and suitably modified within the scope of the present invention. For example, in the mass spectrometer 4b shown in Figure 4, the high-frequency AC voltage of the high-frequency oscillator 23 is assumed to include AC voltages of various frequencies over a certain range, including the cycloton frequency ωc obtained by substituting the known mass of the charged particle into equation (1-6). However, the frequency of the AC voltage may be continuously changed over the above certain range to detect the frequency that gives a peak value.

[0163] Furthermore, in the above embodiment, the apparent mass of the charged particle was detected in order to detect the potential V. However, the present invention is not limited to the above example and also includes other embodiments in which the potential V is detected by directly or indirectly detecting the electric field of equation (20). [Explanation of Symbols]

[0164] 1. Potential-compensated electrostatic shield (first embodiment) 1b Potential-compensated electrostatic shield (second embodiment) 2. Outer enclosure 3. Inner enclosure 4. Detection Unit 4a mass spectrometer 4b Mass spectrometer utilizing an omegatron 5 Variable voltage power supply 6 Grounding member 7 Housing 10 Potential calculation circuit 11 Deviation calculation unit 12 PID calculator 13 Output voltage changing circuit 14 Power supply 20 Vacuum chamber 21 Static magnetic field generator 22 High-frequency electrode 23 High-frequency oscillator 24 Orbit 25 Current electrode 26 Current amplifier 100 Fourier transform 101 Memory (frequency spectrum) 102 Peak frequency detection 103 Apparent mass calculation 104 Background potential V calculation

Claims

1. A potential-compensated electrostatic shield, The outer casing is a conductor, An inner housing, which is a conductor, is disposed inside the outer housing and electrically insulated from the outer housing, A detection unit for detecting the potential of the inner housing or a physical quantity corresponding to that potential, A variable voltage power supply that applies a potential difference between the outer casing and the inner casing, Equipped with, The variable voltage power supply controls the potential difference based on the potential detected by the detection unit or a physical quantity corresponding to that potential, and is a potential-compensated electrostatic shield.

2. A potential-compensated electrostatic shield, A grounding body which is a conductor, A housing which is a conductor disposed on the outside of the grounding body and electrically insulated from the grounding body, A detection unit for detecting the potential of the housing or a physical quantity corresponding to that potential, A variable voltage power supply that applies a potential difference between the grounding body and the housing, Equipped with, The variable voltage power supply controls the potential difference based on the potential detected by the detection unit or a physical quantity corresponding to that potential, and is a potential-compensated electrostatic shield.

3. The potential-compensated electrostatic shield according to claim 1 or 2, wherein the variable voltage power supply controls the potential difference so as to cancel out the potential detected by the detection unit, or the potential determined from a physical quantity related to the potential detected by the detection unit.

4. The potential difference control is a feedback control that sets the target potential to zero, as described in claim 3, for a potential-compensated electrostatic shield.

5. The detection unit is located within the potential-compensating electrostatic shield of the S system in order to detect the potential V of the S system, The four electromagnetic potentials of the aforementioned electric potential V are Speed ​​relative to the S system: [Math 1] The potential-compensated electrostatic shield according to claim 3, comprising a mass spectrometer for detecting the apparent mass m' of charged particles in a system S' that are affected by an electric field appearing as a result of a Lorentz transformation of the system S' moving in a certain direction, wherein the potential V is calculated based on the mass m of the charged particles and the apparent mass m'.

6. If the charge of the charged particle is q, the speed of light is c, and the Lorentz factor at the speed is γ, then the potential V is given by the following equation in the SI unit system: [Math 2] The potential-compensated electrostatic shield according to claim 5, characterized in that it is calculated by [method].

7. The aforementioned mass spectrometer is A particle source that supplies the charged particles, A static magnetic field generator that applies a static magnetic field B to the charged particles, A high-frequency electromagnetic field generator that applies a high-frequency electromagnetic field to a charged particle undergoing circular motion in a plane perpendicular to the static magnetic field B, thereby inducing cyclotron resonance, The time waveform signal i of the current generated by the charged particles that caused the cyclotron resonance. ｄ A current acquisition unit that collects (t), A potential-compensated electrostatic shield according to claim 6, comprising the features described above.

8. The time waveform signal i of the current ｄ The potential-compensated electrostatic shield according to claim 7, wherein the cyclotron frequency ωc is determined based on (t), and the apparent mass m' of the charged particle is calculated from the cyclotron frequency ωc.

9. The detection unit is positioned in the S system to detect the potential V of the S system, The four electromagnetic potentials of the aforementioned electric potential V are Speed ​​relative to the S system: [Math 3] The potential-compensated electrostatic shield according to claim 3, configured to detect the potential V based on the motion of charged particles in the S' system affected by an electric field appearing due to a Lorentz transformation to the S' system in motion.

10. If the charge of the aforementioned charged particle is q, the speed of light is c, and the Lorentz factor at the aforementioned speed is γ, The aforementioned electric field is, [Math 4] A potential-compensated electrostatic shield according to claim 9, as represented by [the relevant part of the description].

11. It is a potential detection sensor, The aforementioned potential detection sensor is placed in the S system to detect the potential V of the S system, The four electromagnetic potentials of the aforementioned electric potential V are Speed ​​relative to the S system: [Math 5] A mass spectrometer for detecting the apparent mass m' of charged particles in the S' system that are affected by the electric field that appears when the S' system undergoes a Lorentz transformation, A potential detection sensor comprising a potential calculation unit that calculates the potential V based on the mass m and apparent mass m' of the charged particle.

12. The aforementioned potential calculation unit, If the charge of the charged particle is q, the speed of light is c, and the Lorentz factor at the speed is γ, then the potential V can be expressed in SI units as follows: [Math 6] The potential detection sensor according to claim 11, characterized in that it calculates using [a specific method].

13. The aforementioned mass spectrometer is A particle source that supplies the charged particles, A static magnetic field generator that applies a static magnetic field B to the charged particles, A high-frequency electromagnetic field generator that applies a high-frequency electromagnetic field to a charged particle undergoing circular motion in a plane perpendicular to the static magnetic field B, thereby inducing cyclotron resonance, The time waveform signal i of the current generated by the charged particles that caused the cyclotron resonance. ｄ A current acquisition unit that collects (t), The potential detection sensor according to claim 11, comprising:

14. The aforementioned potential calculation unit, The time waveform signal i of the current output from the current acquisition unit ｄ The potential detection sensor according to claim 13, wherein the cyclotron frequency ωc is determined based on (t), and the apparent mass m' of the charged particle is calculated from the cyclotron frequency ωc.

15. The aforementioned potential calculation unit, The time waveform signal i of the current output from the current acquisition unit ｄ Perform a Fourier transform on (t) to calculate the frequency spectrum I(ω), The frequency ωp that gives a peak value in the frequency spectrum I(ω) is detected, Taking the frequency ωp as the cyclotron frequency, the apparent mass m' is calculated using the following equation: [Number 7] The potential detection sensor according to claim 14, which calculates the potential V based on the difference between the mass m of the charged particle and the apparent mass m'.

16. It is a potential detection sensor, The aforementioned potential detection sensor is placed in the S system to detect the potential V of the S system, The four electromagnetic potentials of the aforementioned electric potential V are Speed ​​relative to the S system: [Number 8] A potential detection sensor configured to detect the potential V based on the motion of charged particles in the S' system, which are affected by the electric field that appears when the S' system undergoes a Lorentz transformation.

17. If the charge of the aforementioned charged particle is q, the speed of light is c, and the Lorentz factor at the aforementioned speed is γ, The aforementioned electric field is, [Number 9] The potential detection sensor according to claim 16, as shown.

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