Inspection socket

Abstract

We provide inspection sockets with high contact reliability. [Solution] The inspection socket is equipped with first to fourth probe pins, each having a first contact and a second contact at both ends in a first direction. In a second direction intersecting the first direction, the first and second probe pins are positioned opposite each other, and the third and fourth probe pins are positioned opposite each other. In a third direction intersecting the first and second directions, the first and third probe pins are positioned side by side, and the second and fourth probe pins are positioned side by side. The second contact of the third probe pin is located between the second contacts of the first and second probe pins in the second direction. The second contact of the second probe pin is located between the second contacts of the third and fourth probe pins in the second direction. In the second direction, the position where the first contact of the first probe pin contacts the object to be contacted is different from the position where the first contact of the third probe pin contacts the object to be contacted.

Description

Technical Field

[0001] The present disclosure relates to an inspection socket.

Background Art

[0002] Patent Document 1 describes an inspection jig used for continuity inspection, characteristic measurement, and the like of electronic modules.

Prior Art Literature

Patent Literature

[0003]

Patent Document 1

Summary of Invention

Problem to be Solved by the Invention

[0004] The inspection socket including the inspection jig of Patent Document 1 has a plurality of probe pins. Each probe pin is arranged side by side at intervals and housed in a housing in a state of being electrically independent from each other. However, when the interval between the terminals of a contact object (for example, a connector) of the inspection socket is narrow, it is necessary to narrow the interval between the probe pins that contact each terminal. When the interval between the probe pins is narrow, contact failure may occur during inspection.

[0005] An object of the present disclosure is to provide an inspection socket with high contact reliability.

Means for Solving the Problem

[0006] An inspection socket according to one aspect of the present disclosure includes: a housing; a first probe pin, a second probe pin, a third probe pin, and a fourth probe pin, each of which has a first contact provided at one end in a first direction and a second contact provided at the other end in the first direction, and each of which is supported by the housing, The first probe pin and the second probe pin are positioned opposite each other with a gap between them in a second direction intersecting the first direction. The third probe pin and the fourth probe pin are positioned opposite each other with a gap between them in the second direction. In a third direction intersecting the first and second directions, the first probe pin and the third probe pin are arranged side by side. In the third direction, the second probe pin and the fourth probe pin are arranged side by side. Each of the first probe pins, the second probe pin, the third probe pin, and the fourth probe pin has a first contact point that can make contact with the object to be contacted, The second contact of the first probe pin is located on one side in the second direction relative to the second contact of the third probe pin. The second contact of the second probe pin is located on one side in the second direction relative to the second contact of the fourth probe pin. [Effects of the Invention]

[0007] According to this disclosure, a highly reliable contact inspection socket can be provided. [Brief explanation of the drawing]

[0008] [Figure 1] A perspective view showing an inspection socket in one implementation state of this disclosure. [Figure 2] Figure 1 shows an exploded perspective view of the inspection socket. [Figure 3] Perspective view of the probe pin. [Figure 4] Plan view of the probe pin and the object being contacted. [Figure 5] Cross-sectional view along line AA in Figure 4. [Figure 6] Cross-sectional view along line BB in Figure 4. [Figure 7] A cross-sectional view showing a first modified example of the probe pin in Figure 5. [Figure 8] A cross-sectional view showing the first modified probe pin of Figure 6. [Figure 9]A cross-sectional view showing a second modified example of the probe pin in Figure 5. [Figure 10] A cross-sectional view showing a second modified example of the probe pin in Figure 6. [Modes for carrying out the invention]

[0009] An example of this disclosure is described below with reference to the accompanying drawings. The following description is essentially illustrative and is not intended to limit this disclosure, its applications, or its uses. The drawings are schematic, and the proportions of the dimensions, etc., do not necessarily correspond to reality. In addition, the following description uses terms that indicate a specific direction or position (for example, terms including "up," "down," "right," "left," "front," and "back") as needed. However, the use of terms that indicate a specific direction or position is for the purpose of facilitating the understanding of this disclosure with reference to the drawings, and the meaning of those terms does not limit the technical scope of this disclosure.

[0010] An inspection socket 1 in one embodiment of the present disclosure, as shown in Figures 1 and 2, comprises housings 2, 3, 4, 5, and 6, and a plurality of plate-shaped probe pins 7 housed inside the housings 2, 3, 4, 5, and 6.

[0011] As shown in Figure 2, the housing 2 has through holes 2A and 2B that penetrate the housing 2 in the vertical direction (for example, the Z direction shown in each figure). The vertical direction and the Z direction are examples of first directions. In this embodiment, in the vertical direction, the side where the housing 2 is located is upward, and the side where the housing 6 is located is downward.

[0012] The housing 3 includes a base portion 31 and a protruding portion 32 protruding upward from the base portion 31. Here, "protruding upward" means "protruding in a direction from the housing 6 toward the housing 2 along the first direction". The protruding portion 32 has a recessed portion 3A recessed downward. Here, "recessed downward" means "recessed in a direction from the housing 2 toward the housing 6 along the first direction". The protruding portion 32 has, on a bottom surface 31B constituting the recessed portion 31A, a plurality of through holes 3B penetrating the protruding portion 32 in the vertical direction. Each of the plurality of through holes 3B corresponds to each of the plurality of probe pins 7.

[0013] The housing 4 has through holes 4A and 4B penetrating the housing 4 in the vertical direction.

[0014] The housing 5 holds the plurality of probe pins 7 in an arrangement as shown in Figure 2.

[0015] The housing 6 includes a pin 61 protruding upward, and a recessed portion 6A recessed downward from an upper surface (in other words, a surface facing the housing 4 among outer surfaces of the housing 6). The housing 6 has, on a bottom surface constituting the recessed portion 6A, a plurality of through holes 6B penetrating the housing 6 in the vertical direction. Each of the plurality of through holes 6B corresponds to each of the plurality of probe pins 7.

[0016] A lower portion of the housing 5 holding the probe pins 7 is accommodated in the recessed portion 6A of the housing 6. The lower portion of the housing 5 is a portion of the housing 5 that is close to the housing 6 in the first direction. At this time, second contacts 121, 122, 752, and 762 (see Figure 3) of each probe pin 7 are exposed to the outside of the inspection socket 1 through the through holes 6B.

[0017] The housings 2, 3 and 4 are assembled above the housing 6 in which the housing 5 is accommodated. The housings 2, 3 and 4 are assembled to the housing 6 in the order of the housing 4, the housing 3 and the housing 2 from below.

[0018] The pin 61 of housing 6 passes through the through hole 4B of housing 4 and the through hole 2B of housing 2. This positions housings 2 and 4 relative to housing 6.

[0019] The protrusion 32 of the housing 3 penetrates the through-hole 2A of the housing 2 from below. As a result, the protrusion 32 is exposed to the outside of the inspection socket 1, and the housing 3 is positioned relative to the housing 2.

[0020] The first connection portion 11 of each probe pin 7 (see Figures 5 and 6) passes through the through hole 4A of the housing 4 from below. The first contacts 111, 751, and 761 of each probe pin 7 (see Figure 3) are exposed to the outside of the inspection socket 1 through the through hole 3B of the housing 3.

[0021] The inspection socket 1 is connected to an inspection device (not shown), and the object to be contacted 8 (see Figures 4, 5, and 6) is connected to the inspection socket 1. In the above connection state, continuity between the object to be contacted 8 and the inspection device is inspected.

[0022] The inspection socket 1 is placed on the circuit board of the inspection device. As a result, the second contacts 121, 122, 752, and 762 (see Figure 3) of each probe pin 7, which are exposed to the outside of the inspection socket 1 through the through hole 6B, are electrically connected to conductive pads formed on the circuit board.

[0023] The contact object 8 shown in Figures 4, 5, and 6 is fitted into the recess 3A of the housing 3. As shown in Figures 5 and 6, the contact object 8 has a plurality of terminals 81. When the contact object 8 is fitted into the recess 3A of the housing 3, each terminal 81 is electrically connected to the first contacts 111, 751, and 761 (see Figure 3) of each probe pin 7 exposed to the outside of the inspection socket 1 through the through hole 3B.

[0024] As shown in Figures 3 and 4, the probe pin 7 comprises a first probe pin 71, a second probe pin 72, a third probe pin 73, a fourth probe pin 74, a fifth probe pin 75, and a sixth probe pin 76. At least one of each of the first probe pin 71, second probe pin 72, third probe pin 73, fourth probe pin 74, fifth probe pin 75, and sixth probe pin 76 is provided. In this embodiment, the probe pin 7 comprises 13 first probe pins 71, 13 second probe pins 72, 13 third probe pins 73, 13 fourth probe pins 74, 2 fifth probe pins 75, and 2 sixth probe pins 76.

[0025] In this embodiment, the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 are signal terminals, and the fifth probe pin 75 and the sixth probe pin 76 are power terminals or ground terminals. However, the types of each probe pin are not limited to these.

[0026] Each of the first probe pins 71, second probe pin 72, third probe pin 73, fourth probe pin 74, fifth probe pin 75, and sixth probe pin 76 is spaced apart. In other words, each of the first probe pins 71, second probe pin 72, third probe pin 73, fourth probe pin 74, fifth probe pin 75, and sixth probe pin 76 is electrically insulated from one another.

[0027] The first probe pin 71, the third probe pin 73, and the fifth probe pin 75 are spaced apart along the front-to-back direction (for example, the Y direction shown in each figure) that intersects (orthogonal in this embodiment) with the vertical direction of the inspection socket 1. The front-to-back direction and the Y direction are the thickness directions of the probe pins 7, and are an example of a third direction. The first probe pin 71 and the third probe pin 73 are arranged alternately in the front-to-back direction.

[0028] The two fifth probe pins 75 sandwich the thirteen first probe pins 71 and the thirteen third probe pins 73 in the front-to-back direction. In other words, the two fifth probe pins 75 are positioned at the foremost and rearmost positions among the first probe pins 71, the third probe pins 73, and the fifth probe pins 75.

[0029] The second probe pin 72, the fourth probe pin 74, and the sixth probe pin 76 are spaced apart along the front-to-back direction of the inspection socket 1. The second probe pin 72 and the fourth probe pin 74 are arranged alternately in the front-to-back direction.

[0030] The two sixth probe pins 76 are positioned in the front-to-back direction, sandwiching the 13 second probe pins 72 and the 13 fourth probe pins 74. In other words, the two sixth probe pins 76 are located at the foremost and rearmost positions among the second probe pins 72, the fourth probe pins 74, and the sixth probe pins 76.

[0031] As shown in Figure 5, each first probe pin 71 and each second probe pin 72 are positioned opposite each other with a gap in the left-right direction (for example, the X direction shown in each figure) which intersects both the vertical and front-back directions (orthogonal to both the vertical and front-back directions in this embodiment). The left-right direction and the X direction are examples of second directions.

[0032] As shown in Figure 6, the third probe pins 73 and the fourth probe pins 74 are positioned opposite each other with a gap between them in the left-right direction.

[0033] In this embodiment, the first probe pin 71 and the fourth probe pin 74 have the same configuration (in other words, the same size and shape). The fourth probe pin 74 is the first probe pin 71 positioned in the opposite direction in the left-right direction.

[0034] In this embodiment, the second probe pin 72 and the third probe pin 73 have the same configuration (in other words, the same size and shape). The third probe pin 73 is the second probe pin 72 positioned in the opposite direction in the left-right direction.

[0035] Therefore, in this embodiment, instead of having four types of probe pins 7 with different configurations, the inspection socket 1 has two types of probe pins 7. One of the two types of probe pins 7 is probe pins 71 and 74, and the other of the two types of probe pins 7 is probe pins 72 and 73.

[0036] As shown in Figure 3, the fifth probe pins 75 and the sixth probe pins 76 are positioned opposite each other with a gap between them in the left-right direction.

[0037] In this embodiment, the fifth probe pin 75 and the sixth probe pin 76 have the same configuration (in other words, the same size and shape). In this embodiment, the fifth probe pin 75 and the sixth probe pin 76 are arranged in opposite directions in the left-right direction. The fifth probe pin 75 and the sixth probe pin 76 are arranged symmetrically with respect to a virtual line L1 extending vertically between the fifth probe pin 75 and the sixth probe pin 76.

[0038] The configuration of each probe pin 7 will be described below. In this embodiment, each first probe pin 71, each second probe pin 72, each third probe pin 73, each fourth probe pin 74, each probe pin 75, and each probe pin 76 have generally the same configuration. Therefore, the configuration of the first probe pin 71 will be described below, and the descriptions of the configurations of the other probe pins will be omitted in principle. In each figure, common features of the configuration are denoted by the same reference numerals. However, configurations of other probe pins that differ from the first probe pin 71 will be described. In the following description, "left" and "right" in the left-right direction have the following meanings. That is, in the first probe pin 71 and the third probe pin 73, the side with the curved portion 133 is "left," and the side opposite the curved portion 133 is "right." On the other hand, for the second probe pin 72 and the fourth probe pin 74, in the left-right direction, the side opposite the curved portion 133 is "left," and the side with the curved portion 133 is "right."

[0039] As shown in Figure 5, the first probe pin 71 comprises a first connecting portion 11, a second connecting portion 12, and an elastic portion 13. The first connecting portion 11 is connected to a first end 13A, which is one of the two ends of the elastic portion 13 in the vertical direction (in this embodiment, the upper end of the elastic portion 13). In other words, the lower end of the first connecting portion 11 (in this embodiment, the end closer to the elastic portion 13 in the vertical direction) is connected to the upper end of the elastic portion 13. The second connecting portion 12 is connected to a second end 13B, which is the other of the two ends of the elastic portion 13 in the vertical direction (in this embodiment, the lower end of the elastic portion 13). In other words, the upper end of the second connecting portion 12 (in this embodiment, the end closer to the elastic portion 13 in the vertical direction) is connected to the lower end of the elastic portion 13.

[0040] The first connection portion 11 includes a first contact 111 provided at the upper end of the first connection portion 11 (in this embodiment, the end furthest from the second connection portion 12 in the vertical direction). The second connection portion 12 includes a second contact 121 provided at the lower end of the second connection portion 12 (in this embodiment, the end furthest from the first connection portion 11 in the vertical direction). In other words, the first probe pin 71 includes a first contact 111 provided at one end in the vertical direction (the upper end in this embodiment) and a second contact 121 provided at the other end in the vertical direction (the lower end in this embodiment).

[0041] The elastic portion 13 has a first portion 131, a second portion 132, and a curved portion 133.

[0042] The first part 131 extends from the first end 13A in the left-right direction. The second part 132 extends from the second end 13B in the left-right direction. The second part 132 extends to the same side as the first part 131 in the left-right direction. In the example shown in Figure 5, the first part 131 extends to the left from the first end 13A, and the second part 132 extends to the left from the second end 13B.

[0043] The curved portion 133 has a curved shape. The curved portion 133 connects the end of the first portion 131 that is away from the first end 13A (for example, the left end in Figure 5) and the end of the second portion 132 that is away from the second end 13B (the left end in Figure 5).

[0044] The first end 13A and the second end 13B, which are both ends of the elastic portion 13, are connected to the first connecting portion 11 and the second connecting portion 12 from the same side (the left side in this embodiment) in the left-right direction. In other words, the elastic portion 13 is located on the same side (the left side in this embodiment) as one side (the left side in this embodiment) of the first connecting portion 11 in the left-right direction.

[0045] The vertical length L2 between the end 11A to which the first end 13A of the first connecting portion 11 is connected and the end 12A to which the second end 13B of the second connecting portion 12 is connected is longer than the inner diameter R1 of the curve of the elastic portion 13. In this embodiment, the end 11A is the lower end of the first connecting portion 11, and the end 12A is the upper end of the second connecting portion 12. Also in this embodiment, the inner diameter R1 of the curve of the elastic portion 13 is the inner diameter R1 of the curved portion 133.

[0046] The elastic portion 13 comprises a plurality of elongated plate portions 134 (in this embodiment, three elongated plate portions 134A, 134B, and 134C). Each elongated plate portion 134A, 134B, and 134C extends over a first portion 131, a second portion 132, and a curved portion 133.

[0047] Each of the long plate sections 134A, 134B, and 134C extends along the longitudinal direction of the elastic section 13. The longitudinal direction of the elastic section 13 is the direction in which the elastic section 13 extends from the first section 131 through the curved section 133 to the second section 132. In other words, the longitudinal direction of the elastic section 13 is the left-right direction in the first section 131 and the second section 132, and the direction along the curved shape in the curved section 133.

[0048] Each of the long plate sections 134A, 134B, and 134C is arranged in a line with spacing along the width direction of the elastic section 13. The width direction of the elastic section 13 is perpendicular to both the front-to-back direction (the thickness direction of the probe pin 7 in this embodiment) and the length direction of the elastic section 13.

[0049] The multiple long plate sections 134 are longer in the width direction the further they are located on the outside of the curved shape of the curved section 133. In this embodiment, the long plate section 134A is longer in the width direction than the long plate section 134B, and the long plate section 134B is longer in the width direction than the long plate section 134C.

[0050] The second part 132 extends upward as it moves to the right on the plane of Figure 5. In other words, the second part 132 extends so that it approaches the first end 13A in the vertical direction as it approaches the second end 13B in the horizontal direction. That is, the surfaces that make up the radial inner edge and the surfaces that make up the outer edge of the second part 132 are inclined surfaces that are inclined with respect to the horizontal direction.

[0051] The upper edge 12B of the second connection portion 12 extends downward as the plane of the paper in Figure 5 moves to the right. In other words, the edge 12B of the second connection portion 12 on the side of the first connection portion 11 in the vertical direction (the upper side in this embodiment) extends away from the first connection portion 11 in the vertical direction as it moves away from the elastic portion 13 in the horizontal direction. In other words, the edge 12B is an inclined surface that is inclined with respect to the horizontal direction. The edge 12B may also extend along the horizontal direction. As shown in Figure 3, the edges 12B of the fifth probe pin 75 and the sixth probe pin 76 extend along the horizontal direction.

[0052] As shown in Figure 5, the first contact 111 is a projection and protrudes upward from the upper end of the first connection portion 11 (in this embodiment, in the direction away from the second connection portion 12 in the first direction). The first contact 111 comprises an inclined surface 111A and a projection 111B.

[0053] The inclined surface 111A is located on one side of the first contact point 111 in the left-right direction. The inclined surface 111A is inclined in the vertical direction such that it moves away from the center line C as it moves away from the elastic portion 13. The center line C is a line that passes through the center of the first connection portion 11 in the left-right direction and extends in the vertical direction.

[0054] The projection 111B protrudes upward (in this embodiment, in the direction away from the second connecting portion 12 in the first direction). The projection 111B faces the inclined surface 111A with a gap between them in the left-right direction. The protruding tip of the projection 111B (the upper end in this embodiment) is located below the upper end of the inclined surface 111A and above the lower end of the inclined surface 111A. In other words, in the first direction, the protruding tip of the projection 111B is located between the end of the inclined surface 111A that is farther from the elastic portion 13 and the end that is closer to it.

[0055] The terminal 81 of the object to be contacted 8 can make contact with the inclined surface 111A and the projection 111B. When the object to be contacted 8 is fitted into the recess 3A of the housing 3, the terminal 81 has a U-shaped portion in a side view along the front-rear direction. That is, the terminal 81 has a downwardly convex curved portion at its tip. The inclined surface 111A contacts the curved portion of the terminal 81 from one side in the left-right direction.

[0056] In this embodiment, the first contact 111 has only one inclined surface that can contact the object to be contacted 8. In other words, in this embodiment, the only inclined surface of the first contact 111 that can contact the object to be contacted 8 is the inclined surface 111A.

[0057] The second contact 121 is protruding and extends downward from the lower end of the second connection portion 12 (in this embodiment, in the direction away from the first connection portion 11 in the first direction). The second contact 121 has a notch 121C. The notch 121C is cut out from the lower surface of the second contact 121 upward (towards the first connection portion 11 in the first direction in this embodiment).

[0058] The second connecting portion 12 has a notch 12C. The notch 12C is provided between the second contact point 121 and the second portion 132 of the elastic portion 13. The notch 12C is cut out from the left-right end of the second connecting portion 12 along the left-right direction.

[0059] The first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 differ in their orientation, configuration, and other aspects. These differences are described in detail below.

[0060] As shown in Figure 5, the first probe pin 71 and the second probe pin 72 are positioned opposite each other in the left-right direction so that their elastic portions 13 face outward in the left-right direction. As shown in Figure 6, the third probe pin 73 and the fourth probe pin 74 are positioned opposite each other in the left-right direction so that their elastic portions 13 face outward in the left-right direction.

[0061] As shown in Figures 5 and 6, the inclined surfaces 111A of the first probe pin 71 and the fourth probe pin 74 are located on the side of the curved portion 133 of the elastic portion 13 at the first contact point 111 in the left-right direction. The inclined surfaces 111A of the first probe pin 71 and the fourth probe pin 74 face away from the curved portion 133 of the elastic portion 13 in the left-right direction. The projections 111B of the first probe pin 71 and the fourth probe pin 74 are located on the side of the curved portion 133 of the elastic portion 13 relative to the inclined surface 111A in the left-right direction.

[0062] The inclined surface 111A of the first probe pin 71 is located to the left of the first contact 111 on the plane of Figure 5, extends downwards as it moves to the right, and points to the upper right. The projection 111B of the first probe pin 71 is located to the right of the inclined surface 111A of the first probe pin 71 on the plane of Figure 5. The inclined surface 111A of the fourth probe pin 74 is located to the right of the first contact 111 on the plane of Figure 6, extends downwards as it moves to the left, and points to the upper left. The projection 111B of the fourth probe pin 74 is located to the left of the inclined surface 111A of the fourth probe pin 74 on the plane of Figure 6.

[0063] As shown in Figures 5 and 6, the inclined surfaces 111A of the second probe pin 72 and the third probe pin 73 are located on the opposite side of the elastic portion 13 at the first contact point 111 in the left-right direction. The inclined surfaces 111A of the second probe pin 72 and the third probe pin 73 face the curved portion 133 side of the elastic portion 13 in the left-right direction. The projections 111B of the second probe pin 72 and the third probe pin 73 are located on the elastic portion 13 side relative to the inclined surface 111A in the left-right direction.

[0064] The inclined surface 111A of the second probe pin 72 is located to the left of the first contact 111 on the plane of Figure 5, extending downwards as it moves to the right, and pointing to the upper right. The projection 111B of the second probe pin 72 is located to the right of the inclined surface 111A of the second probe pin 72 on the plane of Figure 5. The inclined surface 111A of the third probe pin 73 is located to the right of the first contact 111 on the plane of Figure 6, extending downwards as it moves to the left, and pointing to the upper left. The projection 111B of the third probe pin 73 is located to the left of the inclined surface 111A of the third probe pin 73 on the plane of Figure 6.

[0065] As shown in Figure 5, the inclined surface 111A of the first contact 111 of the first probe pin 71 and the inclined surface 111A of the first contact 111 of the second probe pin 72 face the same side in the left-right direction (to the right in this embodiment). As shown in Figure 6, the inclined surface 111A of the first contact 111 of the third probe pin 73 and the inclined surface 111A of the first contact 111 of the fourth probe pin 74 face the same side in the left-right direction (to the left in this embodiment).

[0066] Furthermore, as shown in Figures 5 and 6, the inclined surface 111A of the first contact 111 of the first probe pin 71 (see Figure 5) and the inclined surface 111A of the first contact 111 of the third probe pin 73 (see Figure 6) face opposite directions in the left-right direction. The inclined surface 111A of the first contact 111 of the second probe pin 72 (see Figure 5) and the inclined surface 111A of the first contact 111 of the fourth probe pin 74 (see Figure 6) face opposite directions in the left-right direction.

[0067] Furthermore, when viewed along the front-to-back direction, the inclined surface 111A of the first contact 111 of the first probe pin 71 and the inclined surface 111A of the first contact 111 of the third probe pin 73 face each other in the left-to-right direction. When viewed along the front-to-back direction, the inclined surface 111A of the first contact 111 of the second probe pin 72 and the inclined surface 111A of the first contact 111 of the fourth probe pin 74 face each other in the left-to-right direction.

[0068] The first probe pin 71 and the fourth probe pin 74 are provided with a second contact 121 and a notch 12C. The second probe pin 72 and the third probe pin 73 are provided with a second contact 122 instead of the second contact 121. The second contact 122 does not have a notch 12C. The second contact 122 differs from the second contact 121 in that it does not have a notch 121C.

[0069] In the first probe pin 71 and the fourth probe pin 74, the second contact 121 is located away from the first contact 111 when viewed along the vertical direction. In the first probe pin 71 and the fourth probe pin 74, the second contact 121 is located away from the inclined surface 111A when viewed along the vertical direction. In the first probe pin 71 and the fourth probe pin 74, the portion of the second connection part 12 including the second contact 121 overlaps with the elastic part 13 when viewed along the vertical direction. In other words, in the first probe pin 71 and the fourth probe pin 74, in the left-right direction, at least a portion of the portion of the second connection part 12 including the second contact 121 is in the same position as at least a portion of the elastic part 13. Also, in the first probe pin 71 and the fourth probe pin 74, the elastic part 13 and the second contact 121 are located on the same side in the left-right direction relative to the first connection part 11.

[0070] In the second probe pin 72 and the third probe pin 73, when viewed along the vertical direction, the second contact 122 and the first contact 111 are in positions where at least a portion of each other overlaps. That is, in the left-right direction, in the second probe pin 72 and the third probe pin 73, at least a portion of the second contact 122 is in the same position as at least a portion of the first contact 111. Also, in the second probe pin 72 and the third probe pin 73, the first contact 111 and the second contact 122 are located on the same side in the left-right direction with respect to the elastic portion 13. In the second probe pin 72 and the third probe pin 73, when viewed along the vertical direction, the second contact 122 and the inclined surface 111A are in positions where at least a portion of each other overlaps. That is, in the left-right direction, in the second probe pin 72 and the third probe pin 73, at least a portion of the second contact 122 is in the same position as at least a portion of the inclined surface 111A. Furthermore, in the case of the second probe pin 72 and the third probe pin 73, the inclined surface 111A and the second contact point 122 are located on the same side in the left-right direction with respect to the elastic portion 13.

[0071] As shown in Figure 5, the inclined surface 111A is provided on the left side of the first contact 111 for the first probe pin 71 and the second probe pin 72. As shown in Figure 6, the inclined surface 111A is provided on the right side of the first contact 111 for the third probe pin 73 and the fourth probe pin 74. The left side in Figures 5 and 6 (and Figures 7 to 10 described later) is an example of one side in the left-right direction, and the right side in Figures 5 and 6 (and Figures 7 to 10 described later) is an example of the other side in the left-right direction.

[0072] As shown in Figures 5 and 6, the second contact 121 of the first probe pin 71 is located to the left of the second contact 122 of the third probe pin 73. In other words, when viewed along the front-to-back direction, the second contact 121 of the first probe pin 71 does not overlap with the second contact 122 of the third probe pin 73. That is, in the left-to-right direction, the second contact 121 of the first probe pin 71 is in a different position from the second contact 122 of the third probe pin 73. However, when viewed along the front-to-back direction, the second contact 121 of the first probe pin 71 may only partially overlap with the second contact 122 of the third probe pin 73. In other words, in the left-to-right direction, the second contact 121 of the first probe pin 71 may be in a partially the same position as the second contact 122 of the third probe pin 73.

[0073] The second contact 122 of the second probe pin 72 is located to the left of the second contact 121 of the fourth probe pin 74. In other words, when viewed along the front-to-back direction, the second contact 122 of the second probe pin 72 does not overlap with the second contact 121 of the fourth probe pin 74. That is, in the left-to-right direction, the second contact 122 of the second probe pin 72 is in a different position from the second contact 121 of the fourth probe pin 74. However, when viewed along the front-to-back direction, the second contact 122 of the second probe pin 72 may only partially overlap with the second contact 121 of the fourth probe pin 74. In other words, in the left-to-right direction, the second contact 122 of the second probe pin 72 may be in a partially the same position as the second contact 121 of the fourth probe pin 74.

[0074] As mentioned above, in the first probe pin 71 and the second probe pin 72, the inclined surface 111A is located on the left side of the first contact 111. Also, the second contact 121 of the first probe pin 71 is located to the left of the second contact 122 of the third probe pin 73, and the second contact 122 of the second probe pin 72 is located to the left of the second contact 121 of the fourth probe pin 74. In other words, the inclined surface 111A of the first contact 111 of the first probe pin 71 is located on the left side in the left-right direction, which is the side of the first contact 111 of the first probe pin 71 that is positioned relative to the second contact 121 of the first probe pin 71 relative to the second contact 122 of the third probe pin 73. Furthermore, the inclined surface 111A of the first contact 111 of the second probe pin 72 is located on the left side in the left-right direction, where the second contact 122 of the second probe pin 72 is positioned relative to the second contact 121 of the fourth probe pin 74.

[0075] As mentioned above, in the third probe pin 73 and the fourth probe pin 74, the inclined surface 111A is provided on the right side of the first contact 111. Also, the second contact 122 of the third probe pin 73 is located to the right of the second contact 121 of the first probe pin 71, and the second contact 121 of the fourth probe pin 74 is located to the right of the second contact 122 of the second probe pin 72. In other words, the inclined surface 111A of the first contact 111 of the third probe pin 73 is located in the left-right direction, Of the first contacts 111 of the third probe pin 73, the second contact 122 of the third probe pin 73 is located on the right side relative to the second contact 121 of the first probe pin 71. In addition, the inclined surface 111A of the first contact 111 of the fourth probe pin 74 is located on the right side in the left-right direction, relative to the second contact 121 of the fourth probe pin 74.

[0076] The first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 can provide the following effects.

[0077] In the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74, the length L2 along the vertical direction between end 11A and end 12A is longer than the inner diameter R1 of the curve of the elastic portion 13. The edge 12B of the second connecting portion 12 on the first connecting portion 11 side in the vertical direction extends so that it moves away from the elastic portion 13 in the left-right direction and away from the first connecting portion 11 in the vertical direction. Therefore, the vertical stroke of the elastic portion 13 can be increased in the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74. As a result, the contact reliability of the probe pins 7 can be improved.

[0078] The second portion 132 extends so that it approaches the second end 13B in the left-right direction and approaches the first end 13A in the up-down direction. Therefore, the portion occupied by the elastic part 13 can be reduced in each probe pin 7.

[0079] The elastic section 13 comprises a plurality of elongated plate sections 134. The elongated plate sections 134 are longer in the width direction the further they are located on the outside of the curved shape of the curved section 133. This makes the elastic section 13 more flexible.

[0080] The first contact 111 has an inclined surface 111A that can contact the object to be contacted 8. For example, if the terminal 81 of the object to be contacted 8 has a curved portion at its tip, the inclined surface 111A will contact the curved portion of the terminal 81 from one side in the left-right direction. If only one side of the curved portion of the terminal 81 is gold-plated and the other side is tin-plated, the inclined surface 111A can be brought into contact with the gold-plated portion.

[0081] The first contact point 111 has a projection 111B in addition to the inclined surface 111A. Therefore, the first contact point 111 can make contact with the object 8 at multiple points.

[0082] The first probe pin 71 and the fourth probe pin 74 can provide the following effects.

[0083] When viewed along the vertical direction, the second contacts 121 of the first probe pin 71 and the fourth probe pin 74 are located away from the inclined surface 111A. Therefore, in a configuration in which the first probe pin 71 and the third probe pin 73 are arranged side by side in the front-to-back direction, the left-to-right positions of the second contact 121 of the first probe pin 71 and the second contact 122 of the third probe pin 73 can be set to different positions. Similarly, in a configuration in which the fourth probe pin 74 and the second probe pin 72 are arranged side by side in the front-to-back direction, the left-to-right positions of the second contact 121 of the fourth probe pin 74 and the second contact 122 of the second probe pin 72 can be set to different positions.

[0084] The second connection portion 12 of the first probe pin 71 and the fourth probe pin 74 has a notch 12C. This allows the second contact 121 to bend in the vertical direction.

[0085] The second probe pin 72 and the third probe pin 73 can provide the following effects.

[0086] When viewed along the vertical direction, at least a portion of the second contacts 122 of the second probe pin 72 and the third probe pin 73 overlaps with at least a portion of the inclined surface 111A. Therefore, in a configuration in which the second probe pin 72 and the fourth probe pin 74 are arranged side by side in the front-to-back direction, the left-to-right positions of the second contact 122 of the second probe pin 72 and the second contact 121 of the fourth probe pin 74 can be set to different positions. Similarly, in a configuration in which the third probe pin 73 and the first probe pin 71 are arranged side by side in the front-to-back direction, the left-to-right positions of the second contact 122 of the third probe pin 73 and the second contact 121 of the first probe pin 71 can be set to different positions.

[0087] Inspection socket 1 can provide the following benefits:

[0088] The second contact 121 of the first probe pin 71 is located to the left of the second contact 122 of the third probe pin 73, and the second contact 122 of the second probe pin 72 is located to the left of the second contact 121 of the fourth probe pin 74. With this configuration, when the first probe pin 71 and the third probe pin 73 are arranged alternately in the front-to-back direction, the pitch between two adjacent second contacts in the front-to-back direction can be increased. This will be described in detail below. If the left-to-right positions of the second contact 121 of the first probe pin 71 and the second contact 122 of the third probe pin 73 are the same, then the second contacts 121 and 122 of the first probe pin 71 and the third probe pin 73, when arranged alternately in the front-to-back direction, will be adjacent to each other in the front-to-back direction. On the other hand, if the second contact 121 of the first probe pin 71 is located to the left of the second contact 122 of the third probe pin 73, the second contacts 121 and 122 of the first probe pins 71 and third probe pins 73, which are arranged alternately in the front-to-back direction, will not be adjacent to each other in the front-to-back direction. In this case, the second contacts 121 and 121 of the two first probe pins 71 will be adjacent to each other in the front-to-back direction. In other words, the pitch between two adjacent second contacts becomes larger because the third probe pin 73 is not located between the two first probe pins 71. Similarly, if the second probe pins 72 and fourth probe pins 74 are arranged alternately in the front-to-back direction, the pitch between two adjacent second contacts in the front-to-back direction can also be increased. As a result, the contact reliability of the inspection socket 1 can be improved.

[0089] If the spacing between probe pins is narrow, the spacing between pads on the substrate on which the inspection socket is mounted will also be narrow, which may make it difficult to form each pad. In the inspection socket 1 of this embodiment, as described above, the pitch between two adjacent second contacts in the front-to-back direction can be increased. This allows for a wider spacing between pads on the substrate, making it easier to form each pad.

[0090] When viewed along the vertical direction, the first contact 111 of the first probe pin 71 and the fourth probe pin 74 are located away from the second contact 121. When viewed along the vertical direction, the first contact 111 and the second contact 122 of the second probe pin 72 and the third probe pin 73 are located in overlapping positions. As a result, when the first probe pin 71 and the third probe pin 73 are arranged alternately in the front-to-back direction, the left-to-right positions of the second contact 121 of the first probe pin 71 and the second contact 122 of the third probe pin 73 can be set to be different. Also, when the second probe pin 72 and the fourth probe pin 74 are arranged alternately in the front-to-back direction, the left-to-right positions of the second contact 122 of the second probe pin 72 and the second contact 121 of the fourth probe pin 74 can be set to be different.

[0091] The third probe pin 73 has the same configuration as the second probe pin 72, but is positioned in the opposite direction to the second probe pin 72 in the left-right direction. The fourth probe pin 74 has the same configuration as the first probe pin 71, but is positioned in the opposite direction to the first probe pin 71 in the left-right direction. This reduces the number of types of probe pins that the inspection socket 1 can have.

[0092] The inclined surfaces 111A of the first probe pin 71 and the second probe pin 72, which are positioned opposite each other in the left-right direction, face the same side in the left-right direction. The inclined surfaces 111A of the third probe pin 73 and the fourth probe pin 74, which are positioned opposite each other in the left-right direction, face the same side in the left-right direction. This allows the inclined surfaces 111A of two probe pins positioned opposite each other in the left-right direction to contact the object 8 from the same side in the left-right direction.

[0093] The inclined surfaces 111A of the first probe pin 71 and the third probe pin 73, which are arranged side by side in the front-to-back direction, face opposite directions in the left-to-right direction. The inclined surfaces 111A of the second probe pin 72 and the fourth probe pin 74, which are arranged side by side in the front-to-back direction, face opposite directions in the left-to-right direction. This allows the inclined surfaces 111A of two probe pins arranged side by side in the front-to-back direction to contact the object 8 from opposite sides in the left-to-right direction.

[0094] Viewed along the front-to-back direction, the inclined surfaces 111A of the first probe pin 71 and the third probe pin 73, which are arranged side by side in the front-to-back direction, face each other in the left-to-right direction. Viewed along the front-to-back direction, the inclined surfaces 111A of the second probe pin 72 and the fourth probe pin 74, which are arranged side by side in the front-to-back direction, face each other in the left-to-right direction. This allows the inclined surface 111A of each probe pin to contact the object 8 from the outside in the left-to-right direction.

[0095] Each of the first probe pins 71, 72, 73, and 74 has only one first contact point 111, which is capable of contacting the object to be contacted 8. If the first contact point 111 had two inclined surfaces capable of contacting the object to be contacted 8, the object to be contacted 8 would be pressed against one inclined surface, increasing the likelihood that it would move away from the other inclined surface. However, this configuration reduces the possibility of the inclined surface 111A not making contact with a desired position on the object to be contacted 8.

[0096] The inspection socket 1 can also be configured as follows:

[0097] In the embodiment described above, a configuration is described in which the inspection socket 1 is equipped with two types of probe pins 7. One of the two types of probe pins 7 is a first probe pin 71 and a fourth probe pin 74, which have the same configuration as each other. The other of the two types of probe pins 7 is a second probe pin 72 and a third probe pin 73, which have the same configuration as each other. However, the types of probe pins 7 equipped in the inspection socket 1 are not limited to two types.

[0098] Figures 7 and 8 show a configuration in which the inspection socket 1 has four types of probe pins 7. In Figures 7 and 8, parts with the same configuration as the probe pins shown in Figures 5 and 6 are denoted by the same reference numerals and their descriptions are omitted. In the configuration shown in Figures 7 and 8, the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 each have second contacts with different configurations. Specifically, the first probe pin 71 has a second contact 123, the second probe pin 72 has a second contact 124, the third probe pin 73 has a second contact 125, and the fourth probe pin 74 has a second contact 126. The second contacts 123, 124, 125, and 126 differ in the number of notches they have. The second contact 123 has three notches, the second contact 124 has two notches, the second contact 125 has no notches, and the second contact 126 has one notch.

[0099] In the embodiment described above, a configuration was described in which the first contact 111 has only one inclined surface 111A that can contact the object to be contacted 8. However, the first contact 111 may have multiple inclined surfaces.

[0100] Figures 9 and 10 show a configuration in which the first contact 111 has two inclined surfaces (inclined surface 111A and second inclined surface 111C). In Figures 9 and 10, parts with the same configuration as the probe pins shown in Figures 5 and 6 are denoted by the same reference numerals and their descriptions are omitted. In the configuration shown in Figures 9 and 10, the first contact 111 of each probe pin 7 has a second inclined surface 111C in addition to the inclined surface 111A. The second inclined surface 111C is opposite to the inclined surface 111A in the left-right direction. The inclined surface 111C is inclined in the opposite direction to the inclined surface 111A, which is opposite to it in the left-right direction. For example, if the inclined surface 111A is inclined to face upwards to the right, the second inclined surface 111C is inclined to face upwards to the left. The terminal 81 of the object to be contacted 8 can contact the second inclined surface 111C, just as it can contact the inclined surface 111A. The inclined surface 111A contacts the curved portion of the terminal 81 from one side in the left-right direction. On the other hand, the second inclined surface 111C contacts the curved portion of the terminal 81 from the other side in the left-right direction.

[0101] Housings 2, 3, 4, 5, and 6 can be arbitrarily modified in shape and configuration according to the design of the inspection socket 1, etc. For example, the shape of housings 2, 3, 4, 5, and 6 is not limited to a roughly rectangular prism shape, but may also be a roughly cylindrical shape, or a roughly polygonal shape other than a roughly rectangular prism shape. Housing 10 is not limited to being composed of five members, but may also be composed of one member, or a number of members other than five.

[0102] The number of probe pins 7 on the inspection socket 1 can be arbitrarily changed depending on the design of the inspection socket 1.

[0103] For example, in the configuration shown in Figures 3 and 4, the probe pin 7 comprises 13 first probe pins 71, 13 second probe pins 72, 13 third probe pins 73, 13 fourth probe pins 74, 2 fifth probe pins 75, and 2 sixth probe pins 76. Here, a pair of probe pins 71 and 72 facing each other in the left-right direction and a pair of probe pins 73 and 74 facing each other in the left-right direction are arranged in a front-back direction to form one probe tweezers set. In this case, in the configuration shown in Figures 3 and 4, 13 probe tweezers are arranged in the front-back direction. With this arrangement, when viewed along the vertical direction, the left-right positions of adjacent second contacts 121 and 122 are different. The number of probe tweezers arranged in the front-back direction may be other than 13.

[0104] Having described in detail various embodiments of this disclosure with reference to the drawings above, we will now conclude by describing various aspects of this disclosure. Reference numerals are also included in the following description as an example.

[0105] (1) The inspection socket 1 of this disclosure is Housing 5 and It comprises a first probe pin 71, a second probe pin 72, a third probe pin 73, and a fourth probe pin 74, each having a first contact 111 provided at one end in the first direction and second contacts 121 and 122 provided at the other end in the first direction, and each being supported by the housing 5. The first probe pin 71 and the second probe pin 72 are positioned opposite each other with a gap between them in a second direction intersecting the first direction. The third probe pin 73 and the fourth probe pin 74 are arranged opposite each other with a gap between them in the second direction. In a third direction intersecting the first and second directions, the first probe pin 71 and the third probe pin 73 are arranged side by side. In the third direction, the second probe pin 72 and the fourth probe pin 74 are arranged side by side. The second contact 122 of the third probe pin 73 is located between the second contact 121 of the first probe pin 71 and the second contact 122 of the second probe pin 72 in the second direction. The second contact 122 of the second probe pin 72 is located between the second contact 122 of the third probe pin 73 and the second contact 121 of the fourth probe pin 74 in the second direction. When the object to be contacted 8 is brought into contact with the first contact 111 of the first probe pin 71 and the first contact 111 of the third probe pin 73 from the first direction, the first contact 111 of the first probe pin 71 makes contact with the object to be contacted 8 at a first position, and the first contact 111 of the third probe pin 73 makes contact with the object to be contacted 8 at a second position that is different from the first position in the second direction.

[0106] (2) In the inspection socket 1 of (1), When the object to be contacted 8 is brought into contact with the first contact 111 of the second probe pin 72 and the first contact 111 of the fourth probe pin 74 from the first direction, the first contact 111 of the second probe pin 72 may make contact with the object to be contacted 8 at a third position, and the first contact 111 of the fourth probe pin 74 may make contact with the object to be contacted 8 at a fourth position that is different from the third position in the second direction.

[0107] (3) The inspection socket 1 of this disclosure is Housing 5 and It comprises a first probe pin 71, a second probe pin 72, a third probe pin 73, and a fourth probe pin 74, each having a first contact 111 provided at one end in the first direction and second contacts 121 and 122 provided at the other end in the first direction, and each being supported by the housing 5. The first probe pin 71 and the second probe pin 72 are positioned opposite each other with a gap between them in a second direction intersecting the first direction. The third probe pin 73 and the fourth probe pin 74 are arranged opposite each other with a gap between them in the second direction. In a third direction intersecting the first and second directions, the first probe pin 71 and the third probe pin 73 are arranged side by side. In the third direction, the second probe pin 72 and the fourth probe pin 74 are arranged side by side. The second contact 122 of the third probe pin 73 is located between the second contact 121 of the first probe pin 71 and the second contact 122 of the second probe pin 72 in the second direction. The second contact 122 of the second probe pin 72 is located between the second contact 122 of the third probe pin 73 and the second contact 121 of the fourth probe pin 74 in the second direction. When viewed along the third direction, the shape of the first contact 111 of the first probe pin 71 is different from the shape of the first contact 111 of the third probe pin 73.

[0108] (4) In the inspection socket 1 of (3), When viewed along the third direction, the shape of the first contact 111 of the second probe pin 72 may differ from the shape of the first contact 111 of the fourth probe pin 74.

[0109] (5) In any one of the inspection sockets 1 from (1) to (4), The first contact 111 of each of the first probe pins 71, 72, 73, and 74 may have an inclined surface 111A.

[0110] (6) In the inspection socket 1 of (5), The inclined surface 111A of the first probe pin 71 and the inclined surface 111A of the second probe pin 72 may face the same side in the second direction. The inclined surface 111A of the third probe pin 73 and the inclined surface 111A of the fourth probe pin 74 may face the same side in the second direction.

[0111] (7) In the inspection socket 1 of (5) or (6), The inclined surface 111A of the first probe pin 71 and the inclined surface 111A of the third probe pin 73 may be facing opposite directions in the second direction. The inclined surface 111A of the second probe pin 72 and the inclined surface 111A of the fourth probe pin 74 may be facing opposite directions in the second direction.

[0112] (8) In any one of the inspection sockets 1 from (5) to (7), The inclined surfaces 111A of each of the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 may be able to contact the object to be contacted 8.

[0113] (9) In any one of the inspection sockets 1 from (5) to (8), In the second direction, the position of the inclined surface 111A of the first probe pin 71 may be different from the position of the inclined surface 111A of the third probe pin 73.

[0114] (10) In any one of the inspection sockets 1 from (5) to (9), In the second direction, the position of the inclined surface 111A of the second probe pin 72 may be different from the position of the inclined surface 111A of the fourth probe pin 74.

[0115] (11) In any one of the inspection sockets 1 from (1) to (10), When viewed along the first direction, the first contact 111 of the first probe pin 71 may be located away from the second contact 121 of the first probe pin 71. When viewed along the first direction, the first contact 111 of the fourth probe pin 74 may be located away from the second contact 121 of the fourth probe pin 74.

[0116] (12) In any one of the inspection sockets 1 from (1) to (11), When viewed along the first direction, the first contact 111 of the second probe pin 72 and the second contact 122 of the second probe pin 72 may be in positions that partially overlap each other. When viewed along the first direction, the first contact 111 of the third probe pin 73 and the second contact 122 of the third probe pin 73 may be in positions that partially overlap each other.

[0117] (13) In any one of the inspection sockets 1 from (1) to (12), The third probe pin 73 may have the same configuration as the second probe pin 72 and be arranged in the opposite direction to the second probe pin 72 in the second direction.

[0118] (14) In any one of the inspection sockets 1 from (1) to (13), The fourth probe pin 74 may have the same configuration as the first probe pin 71 and be arranged in the opposite direction to the first probe pin 71 in the second direction.

[0119] (15) In any one of the inspection sockets 1 from (1) to (14), The first probe pin 71 may be equipped with an identification unit 121C that enables identification of the second probe pin 72.

[0120] (16) Any one of the inspection sockets 1 from (1) to (15) is, The power terminal or ground terminal may include a fifth probe pin 75 supported by the housing 5.

[0121] (17) The inspection socket 1 of (16) is The device may also be provided with two of the aforementioned fifth probe pins 75. The two fifth probe pins 75 may be positioned to sandwich the first probe pin 71 and the third probe pin 73 in the third direction.

[0122] (18) In the inspection socket 1 of (16) or (17), The thickness of the fifth probe pin 75 may be greater than the thickness of the first probe pin 71.

[0123] (19) In any one of the inspection sockets 1 from (16) to (18), In the third direction, the gap between the fifth probe pin 75 and the first probe pin 71 may be larger than the gap between the first probe pin 71 and the third probe pin 73.

[0124] (20) In any one of the inspection sockets 1 from (16) to (19), Each of the first probe pin 71 and the fifth probe pin 75 may have an elastic portion 13 having a curved shape. When viewed along the third direction, the shape of the elastic portion 13 of the fifth probe pin 75 may differ from the shape of the elastic portion 13 of the first probe pin 71.

[0125] (21) Any one of the inspection sockets 1 from (16) to (20) is, A power terminal or ground terminal, which may include a sixth probe pin 76 supported by the housing 5, The fifth probe pin 75 and the sixth probe pin 76 may be positioned opposite each other with a gap between them in the second direction.

[0126] (22) The inspection socket 1 of (21) is It may also have two sixth probe pins 76, The two sixth probe pins 76 may be positioned to sandwich the second probe pin 72 and the fourth probe pin 74 in the third direction.

[0127] (23) In the inspection socket 1 of (21) or (22), The sixth probe pin 76 may have the same configuration as the fifth probe pin 75 and be arranged in the opposite direction to the fifth probe pin 75 in the second direction.

[0128] While this disclosure is adequately described in relation to preferred embodiments with reference to the accompanying drawings, various variations and modifications will be obvious to those skilled in the art. Such variations and modifications should be understood to be included within the scope of this disclosure as defined by the attached claims. [Industrial applicability]

[0129] The inspection socket of this disclosure can be applied to inspection equipment used for inspecting electronic modules, such as optical modules. [Explanation of Symbols]

[0130] 1 Inspection socket 2, 3, 4, 5, 6 Housing 11. First connection section 11A end 12. Second connection section 12A end 12C Notch 13 Elastic part 131 Part 1 132 Part 2 133 Curved section 134 Long plate section 13A 1st end 13B 2nd end 71 First probe pin 72 Second probe pin 73 Third probe pin 74. Fourth probe pin 111 First contact point 111A Slope 111B Protrusion 121, 122 Second contact point

Claims

1. Housing and It comprises a first probe pin, a second probe pin, a third probe pin, and a fourth probe pin, each having a first contact provided at one end in the first direction and a second contact provided at the other end in the first direction, and each being supported by the housing, The first probe pin and the second probe pin are positioned opposite each other with a gap between them in a second direction intersecting the first direction. The third probe pin and the fourth probe pin are positioned opposite each other with a gap between them in the second direction. In a third direction intersecting the first and second directions, the first probe pin and the third probe pin are arranged side by side. In the third direction, the second probe pin and the fourth probe pin are arranged side by side. The first contact of each of the first probe pin and the third probe pin has a projection protruding in the first direction and at least one inclined surface positioned with a gap between it and the projection in the second direction. The tip of the projection is located in the first direction between the end of the inclined surface furthest from the second contact point and the end of the inclined surface closest to the second contact point. In an inspection socket, when viewed along the third direction, the inclined surface of the first probe pin is in a different position in the second direction from the inclined surface of the third probe pin.

2. The inspection socket according to claim 1, wherein, in the second direction, the projection is located between the inclined surface of the first probe pin and the inclined surface of the third probe pin.

3. The inspection socket according to claim 1 or 2, wherein the first contact has a recess between the projection in the second direction and the inclined surface, which is recessed in the first direction toward the second contact.

4. The inspection socket according to claim 1 or 2, wherein the distance in the second direction between the second contact of the first probe pin and the second contact of the third probe pin is the same as the distance in the second direction between the second contact of the second probe pin and the second contact of the fourth probe pin.

5. The first contact of each of the second probe pin and the fourth probe pin has a projection protruding in the first direction and at least one inclined surface positioned with a gap between it and the projection in the second direction. The inspection socket according to claim 1 or 2, wherein in the second direction, the projection is located between the inclined surface of the second probe pin and the inclined surface of the fourth probe pin.

6. The inclined surface of the first probe pin and the inclined surface of the second probe pin face the same side in the second direction. The inspection socket according to claim 1 or 2, wherein the inclined surface of the third probe pin and the inclined surface of the fourth probe pin face the same side in the second direction.

7. The inclined surface of the first probe pin and the inclined surface of the third probe pin face opposite directions in the second direction. The inspection socket according to claim 1 or 2, wherein the inclined surface of the second probe pin and the inclined surface of the fourth probe pin face opposite directions in the second direction.

8. In the second direction, the position of the inclined surface of the first probe pin is different from the position of the inclined surface of the third probe pin, as described in claim 1 or 2.

9. In the second direction, the position of the inclined surface of the second probe pin is different from the position of the inclined surface of the fourth probe pin, as described in claim 1 or 2.

10. When viewed along the first direction, the first contact of the first probe pin is located away from the second contact of the first probe pin. The inspection socket according to claim 1 or 2, wherein, when viewed along the first direction, the first contact of the fourth probe pin is located away from the second contact of the fourth probe pin.

11. When viewed along the first direction, the first contact of the second probe pin and the second contact of the second probe pin are in positions where they partially overlap each other. The inspection socket according to claim 1 or 2, wherein, when viewed along the first direction, the first contact of the third probe pin and the second contact of the third probe pin are in a position where they partially overlap each other.

12. The inspection socket according to claim 1 or 2, wherein the third probe pin has the same configuration as the second probe pin and is arranged in the opposite direction to the second probe pin in the second direction.

13. The inspection socket according to claim 1 or 2, wherein the fourth probe pin has the same configuration as the first probe pin and is arranged in the opposite direction to the first probe pin in the second direction.

14. The inspection socket according to claim 1 or 2, wherein the first probe pin is provided with an identification portion that enables identification of the second probe pin.

15. The inspection socket according to claim 1 or 2, comprising a power terminal or ground terminal, and a fifth probe pin supported by the housing.

16. The device comprises two of the aforementioned fifth probe pins, The inspection socket according to claim 15, wherein the two fifth probe pins sandwich the first probe pin and the third probe pin in the third direction.

17. The inspection socket according to claim 15, wherein the thickness of the fifth probe pin is greater than the thickness of the first probe pin.

18. The inspection socket according to claim 15, wherein, in the third direction, the gap between the fifth probe pin and the first probe pin is greater than the gap between the first probe pin and the third probe pin.

19. A power terminal or ground terminal comprising a sixth probe pin supported by the housing, The inspection socket according to claim 15, wherein the fifth probe pin and the sixth probe pin are arranged opposite to each other with a gap between them in the second direction.

20. Equipped with two sixth probe pins, The inspection socket according to claim 19, wherein the two sixth probe pins sandwich the second probe pin and the fourth probe pin in the third direction.

21. The inspection socket according to claim 19, wherein the sixth probe pin has the same configuration as the fifth probe pin and is arranged in the opposite direction to the fifth probe pin in the second direction.

22. The inspection socket according to claim 1 or 2, wherein, when viewed along the third direction, the end of the inclined surface of the first probe pin on the second contact side in the first direction is in a different position in the second direction from the end of the inclined surface of the third probe pin on the second contact side in the first direction.

Images