Analytical apparatus and analytical method

Abstract

The analysis results regarding the mass concentration and elements of the analyte can be obtained quickly using a simple instrument configuration. [Solution] The analyzer 100 comprises a beta-ray source 51, detection units 7, 7', 7'', and an analysis unit 9. The beta-ray source 51 irradiates the analyte with beta rays. The detection units 7, 7', 7'' simultaneously detect the passing beta rays that have passed through the analyte and the fluorescent X-rays generated by irradiating the analyte with the beta rays, and output a detection signal. The analysis unit 9 obtains a first signal generated by detecting the passing beta rays and a second signal generated by detecting the fluorescent X-rays from the detection signal. Based on the first signal, the analysis unit 9 calculates information regarding the mass concentration of the analyte, and based on the second signal, it calculates information regarding the elements contained in the analyte.

Description

[Technical Field]

[0001] The present invention relates to an analyzer configured to analyze the mass concentration of an analyte and elements contained in the analyte, and a method for analyzing an analyte using the analyzer. [Background Art]

[0002] As an apparatus for analyzing an analyte, there is known an apparatus that measures the mass concentration of the analyte based on the β-ray dose that has passed through the analyte, and can analyze elements contained in the analyte based on fluorescent X-rays emitted from the analyte (for example, Patent Document 1). [Prior Art Document] [Patent Document]

[0003] [Patent Document 1] Japanese Unexamined Patent Publication No. 2005-134270 [Summary of the Invention] [Problem to be Solved by the Invention]

[0004] In the above-described apparatus, particulate matter as an analyte is collected on a collection filter to measure the mass concentration, then the collection filter is moved to shift the collection region of the particulate matter, and fluorescent X-rays are emitted from the particulate matter at the position after movement to analyze the elements contained in the particulate matter. That is, in conventional apparatuses, a position for measuring mass concentration and a position for element analysis are separately provided. For this reason, the apparatus configuration of conventional apparatuses may be complicated. In addition, since mass concentration measurement and elemental analysis are performed separately, a certain amount of time is required to obtain an analysis result, and there is a possibility that the conventional apparatus cannot cope with faster acquisition of analysis results.

[0005] An object of the present invention is to acquire analysis results of the mass concentration of an analyte and elements contained in the analyte in a short time with a simple apparatus configuration. [Means for Solving the Problem]

[0006] Several embodiments for solving the problem are described below. These embodiments can be combined as needed. The analytical apparatus according to the present invention comprises a beta-ray source, a detection unit, and an analysis unit. The beta-ray source irradiates the analyte with beta rays. The detection unit simultaneously detects the transmitted beta rays that have passed through the analyte and the fluorescent X-rays generated by irradiating the analyte with the said beta rays, and outputs a detection signal. The analysis unit obtains a first signal generated by detecting the transmitted beta rays and a second signal generated by detecting the fluorescent X-rays from the detection signal. The analysis unit also calculates information regarding the mass concentration of the analyte based on the first signal and calculates information regarding the elements contained in the analyte based on the second signal.

[0007] The inventors of the present invention have discovered that when a target for analysis is irradiated with beta rays, passing beta rays are generated that pass through the target, and at the same time, fluorescent X-rays are generated from the target. In the above-described analytical apparatus, the detection unit simultaneously detects the passing beta rays and fluorescent X-rays and outputs a detection signal. That is, the detection signal includes a first signal originating from the passing beta rays and a second signal originating from the fluorescent X-rays. Furthermore, the analytical unit calculates information regarding the mass concentration of the target based on the first signal and calculates information regarding the elements contained in the target based on the second signal.

[0008] Thus, the above analytical device, with its simple configuration, can calculate information regarding the mass concentration of the analyte and information regarding the elements contained in the analyte. Furthermore, since the detection unit can simultaneously detect both transmitted beta rays and fluorescent X-rays, the analytical results of the analyte (information regarding mass concentration and elements contained in the analyte) can be obtained in a short time.

[0009] The detection unit may include a first scintillator, a second scintillator, and a photodetector. The first scintillator is positioned opposite the β-ray source and generates first light when passing β-rays are incident on it. The second scintillator is positioned opposite the β-ray source and generates second light when fluorescent X-rays are incident on it. The photodetector detects the first and second lights and outputs a detection signal. This allows for the simple detection of passing β-rays and fluorescent X-rays by converting them into first and second lights, respectively.

[0010] The photodetector may include a first photodetector that detects the first light and outputs a first signal, and a second photodetector that detects the second light and outputs a second signal. This allows the first and second light to be detected simultaneously by separate photodetectors. As a result, the first and second signals can be acquired more easily without signal separation processing on the acquired signals.

[0011] The photodetector may have a third photodetector that detects both the first and second light and outputs a detection signal. This allows both the first and second light to be detected by a single photodetector, thus simplifying the device configuration.

[0012] The analysis unit may separate the first signal and the second signal from the detection signal based on the pulse width of the detection signal. This allows for accurate separation of the first signal and the second signal using the pulse width of the detection signal.

[0013] The analysis unit may separate the first signal and the second signal from the detected signal based on the peak intensity of the detected signal. This allows for accurate separation of the first signal and the second signal using the intensity of the detected signal.

[0014] The object of analysis may be particulate matter. In this case, the analytical apparatus may further include a collection device for collecting the particulate matter in a collection filter. Furthermore, the beta-ray source and detection unit may be located within the collection device. This allows for the rapid calculation of the mass concentration of the particulate matter and information regarding the elements contained in it. Additionally, integrating the beta-ray source and detection unit into the collection device allows for a more compact analytical apparatus.

[0015] An analysis method according to another aspect of the present invention comprises the following steps. The step of irradiating an analysis target with β-rays. The step of simultaneously detecting transmitted β-rays that have passed through the analysis target and fluorescent X-rays generated by irradiating the analysis target with β-rays, and outputting detection signals. The step of acquiring, from the detection signals, a first signal generated by detecting the transmitted β-rays and a second signal generated by detecting the fluorescent X-rays. The step of calculating information relating to the mass concentration of the analysis target based on the first signal, and calculating information relating to elements contained in the analysis target based on the second signal.

[0016] In the above analysis method, the transmitted β-rays and fluorescent X-rays generated by irradiating the analysis target with β-rays are simultaneously detected, and detection signals are output. That is, the detection signals include the first signal derived from the transmitted β-rays and the second signal derived from the fluorescent X-rays. Further, in the above analysis method, information relating to the mass concentration of the analysis target is calculated based on the first signal, and information relating to elements contained in the analysis target is calculated based on the second signal.

[0017] As described above, in the above analysis method, transmitted β-rays and fluorescent X-rays are detected simultaneously, so the analysis results of the analysis target (mass concentration and information on elements contained in the analysis target) can be acquired in a short time. Effects of the Invention

[0018] Analysis results regarding the mass concentration and elements of an analysis target can be acquired in a short time with a simple device configuration. Brief Description of the Drawings

[0019] [Figure 1] A diagram showing the configuration of an analysis apparatus. [Figure 2] A diagram showing the detailed configuration of a β-ray irradiation unit and a detection unit. [Figure 3] A flowchart showing an analysis operation in the analysis apparatus. [Figure 4]A diagram showing an example of a verification result of whether fluorescent X-rays can be generated from an analysis target and detected. [Figure 5] A diagram showing the configuration of a detection unit according to the second embodiment. [Figure 6] A diagram showing the configuration of a detection unit according to the third embodiment. MODE FOR CARRYING OUT THE INVENTION

[0020] 1. First Embodiment (1) Overview of Analysis Apparatus The analysis apparatus 100 targets, for example, particulate matter FP generated by combustion processes in factories and the like, brakes of various transportation devices (automobiles, ships, etc.), tires, internal combustion engines, steam engines, exhaust gas purification devices, motors, natural disasters such as volcanic eruptions, and mine development, as well as particulate matter FP contained in the atmosphere. For example, particulate matter FP containing silver (Ag), tin (Sn), or the like can be used as the analysis target. The analysis apparatus 100 can acquire, as analysis results, the mass concentration of the particulate matter FP and information related to elements contained in the particulate matter FP (for example, the contained elements and the content of the elements).

[0021] The "mass concentration of particulate matter FP" is defined as the mass of particulate matter contained in the total volume of collected gas, expressed as a value per unit volume of collected gas, and for example, has a unit of μg / m 3 .

[0022] On the other hand, "element content" has the following two definitions. In the first definition, "element content" is defined as how much mass of a target element (or substance) is contained in the total mass of collected particulate matter FP, expressed as a ratio of the mass of the target element (substance) to the total mass of the particulate matter (the unit is, for example, mg / mg). In the second definition, "element content" is defined as the amount of a specific element contained in the particulate matter included in the total volume of collected gas, expressed as a value per unit volume of gas (the unit is, for example, ng / m 3 ).

[0023] (2) Configuration of the analytical instrument The configuration of the analytical apparatus 100 will be described below using Figures 1 and 2. Figure 1 is a diagram showing the configuration of the analytical apparatus. Figure 2 is a diagram showing the detailed configuration of the beta-ray irradiation unit and the detection unit. The analytical apparatus 100 comprises a collection filter 1, a collection device 3, a beta-ray generation unit 5, a detection unit 7, and an analysis unit 9.

[0024] The collection filter 1 is a tape-shaped component formed by laminating a collection layer (sometimes called a collection region) made of a porous fluororesin-based material having pores capable of collecting particulate matter (FP) onto a reinforcing layer made of a nonwoven fabric of a polymer material (such as polyethylene). With the above configuration, the collection filter 1 can allow gas to flow in the thickness direction of the collection filter 1, while simultaneously improving its strength. In addition, the collection filter 1 can be made less prone to static electricity. Note that other filters can also be used as the collection filter 1, such as a single-layer glass filter or a single-layer fluororesin-based material filter.

[0025] For example, one end of the collection filter 1 in the longitudinal direction is connected to a winding reel 11a, and the other end is connected to a feed-out reel 11b. The winding reel 11a is rotatable in a predetermined direction by, for example, a motor (not shown). With this configuration, by rotating the winding reel 11a, the collection filter 1 is fed out from the feed-out reel 11b and wound onto the winding reel 11a. In other words, the collection filter 1 can move in the longitudinal direction (indicated by the thick arrow in Figure 1) by the rotation of the winding reel 11a.

[0026] The mechanism for moving the collection filter 1 is not limited to the mechanism described above. For example, a pin may be provided along the length of the collection filter 1, allowing the direction of movement of the collection filter 1 to be changed. Alternatively, a tension controller may be provided on the collection filter 1 to adjust its tension.

[0027] The collection device 3 collects particulate matter (FP) suspended in the measurement atmosphere into the collection filter 1. The collection device 3 includes a suction member 31 and a discharge member 33. The suction member 31 is positioned directly below the reinforcing layer side of the collection filter 1. The suction member 31 has a first opening 31a that is connected to a suction pump 35.

[0028] The discharge member 33 is positioned directly above the surface of the collection area of ​​the collection filter 1, facing the suction member 31. The discharge member 33 has a second opening 33a that faces the first opening 31a. The second opening 33a can discharge particulate matter FP collected via the collection member 37 toward the collection filter 1 by the suction force of the first opening 31a. The particulate matter FP discharged from the discharge member 33 is collected by the collection filter 1.

[0029] The collection member 37 may have various devices for collecting particulate matter (FP). For example, if the target of analysis is particulate matter (FP) in the atmosphere, the collection member 37 may have a classifier for classifying the particulate matter (FP). Also, for example, if the target of analysis is particulate matter (FP) in exhaust gas, the collection member 37 may have a sampling unit (for example, a sampling probe).

[0030] The beta-ray generating unit 5 is positioned at the second opening 33a of the discharge member 33 and irradiates the particulate matter FP collected in the collection filter 1 with beta rays. As shown in Figure 2, the beta-ray generating unit 5 has a beta-ray source 51. The beta-ray source 51 irradiates the particulate matter FP collected in the collection filter 1 with beta rays. The beta-ray source 51 is, for example, carbon 14 ( 14 C), Strontium-90 ( 90 Sr), Promethium-147 ( 147 These are Pm. By using these as beta-ray sources 51, the generation of unwanted radiation such as gamma rays can be suppressed.

[0031] The beta-ray generating unit 5 may have a limiting member 53. The limiting member 53 adjusts the intensity of the beta rays irradiated toward the particulate matter FP by shielding a portion of the beta rays generated from the beta-ray source 51. The limiting member 53 is, for example, a plate-shaped member made of acrylic.

[0032] The detection unit 7 can be positioned, for example, at the first opening 31a of the suction member 31. This allows the detection unit 7 to be positioned opposite the beta-ray generating unit 5. The detection unit 7 detects beta rays (referred to as passed beta rays) that are generated from the beta-ray generating unit 5 and have passed through the particulate matter FP and the collection filter 1, and fluorescent X-rays generated by irradiating the particulate matter FP with beta rays. As shown in Figure 2, the detection unit 7 of this embodiment simultaneously detects the beta rays that have passed through the particulate matter FP and the collection filter 1, and the fluorescent X-rays generated from the particulate matter FP, using separate detectors. Specifically, the detection unit 7 includes a first scintillator 71, a first photodetector 73, a second scintillator 75, and a second photodetector 77.

[0033] The first scintillator 71 can be positioned, for example, opposite the beta-ray generating unit 5 at the first aperture 31a. The first scintillator 71 generates light corresponding to the passing beta rays. The first scintillator 71 is a component that generates light when passing beta rays are incident on it, and is a scintillator made of a low-density material, such as a plastic scintillator made of polyvinyltoluene.

[0034] The first photodetector 73 detects the light (referred to as the first light) generated in the first scintillator 71 and outputs a first signal. In other words, the first photodetector 73 outputs a first signal by detecting the passing beta rays in the first scintillator 71. The first photodetector 73 is a detector that detects light from, for example, a SiPM (Silicon PhotoMultiplier), a photomultiplier tube, or a silicon semiconductor detector and outputs a signal.

[0035] The second scintillator 75 is positioned below the first scintillator 71, facing the beta-ray generating unit 5 at the first aperture 31a. The second scintillator 75 generates light corresponding to the fluorescent X-rays generated from the particulate matter FP and passing through the first scintillator 71. The second scintillator 75 is a component that generates light when X-rays are incident on it, and is made of an inorganic material such as cesium iodide (CsI) or sodium iodide (NaI).

[0036] The second photodetector 77 detects the light (referred to as the second light) generated in the second scintillator 75 and outputs a second signal. In other words, the second photodetector 77 outputs a first signal by detecting the fluorescent X-rays generated by the particulate matter FP in the second scintillator 75. The second photodetector 77 is a detector that detects light from, for example, a SiPM (Silicon PhotoMultiplier), a photomultiplier tube, or a silicon semiconductor detector and outputs a signal.

[0037] The detection unit 7 further includes a light shielding member 79. The light shielding member 79 prevents external light from entering the detection unit 7. That is, the light shielding member 79 prevents external light from entering the first photodetector 73 and the second photodetector 77. This suppresses the entry of light other than the light generated by the scintillator (first light, second light) into the first photodetector 73 and the second photodetector 77. As a result, transmitted beta rays and fluorescent X-rays generated from particulate matter FP can be detected more accurately.

[0038] The analysis unit 9 is a computer system having a CPU, RAM, ROM, HDD, SSD and other storage devices, various interfaces, a display, etc. The analysis unit 9 controls each component of the analysis device 100 and performs various information processing related to the analysis device 100. The analysis unit 9 has a calculation unit 91 and a display unit 93.

[0039] The arithmetic unit 91 consists of the CPU, memory device, and various interfaces of the analysis unit 9, and performs control of each component of the analysis device 100 and various information processing related to the analysis device 100. The arithmetic unit 91 implements the control of each component of the analysis device 100 and the various information processing related to the analysis device 100 by software stored in the memory device of the computer system constituting the analysis unit 9 and executable by the analysis unit 9. The arithmetic unit 91 may also implement some of the above control and information processing in hardware.

[0040] Specifically, the calculation unit 91 controls the suction pump 35 to collect particulate matter FP in the collection filter 1. The calculation unit 91 also controls the motor that rotates the winding reel 11a to control the longitudinal movement of the collection filter 1. The calculation unit 91 controls the beta-ray source 51 to control the beta rays irradiated onto the particulate matter FP. Based on the first signal input from the first photodetector 73, the calculation unit 91 calculates information regarding the mass concentration of the particulate matter FP. Based on the second signal input from the second photodetector 77, it calculates information regarding the elements contained in the particulate matter FP.

[0041] The display unit 93 is the display for the analysis unit 9 and displays various information related to the analysis device 100, as well as the analysis results of particulate matter FP (information on mass concentration, information on elements). The display unit 93 is, for example, a liquid crystal display or an organic EL display.

[0042] (3) Analytical operation in the analytical instrument Figure 3 will be used to explain the analysis operation of particulate matter FP in the analyzer 100. Figure 3 is a flowchart showing the analysis operation in the analyzer. First, a process is performed to collect particulate matter FP suspended in the measurement atmosphere into the collection filter 1 (step S1). Specifically, the calculation unit 91 of the analysis unit 9 operates the suction pump 35 to collect particulate matter FP into the collection filter 1.

[0043] During the above collection operation, or after collecting particulate matter FP for a predetermined time, the calculation unit 91 generates beta rays from the beta ray source 51 (step S2). As a result, the beta rays irradiate the particulate matter FP. A portion of the beta rays irradiated onto the particulate matter FP passes through the particulate matter FP and the collection filter 1 and enters the detection unit 7. In addition, by irradiating the particulate matter FP with beta rays, fluorescent X-rays are generated from the particulate matter FP, which pass through the collection filter 1 and enter the detection unit 7.

[0044] While β rays are irradiated onto the particulate matter FP, the calculation unit 91 detects the β rays and fluorescent X-rays incident on the detection unit 7 (step S3). When the transmitted β rays that have passed through the particulate matter FP and the collection filter 1 are incident on the first scintillator 71, light (first light) is generated in the first scintillator 71. The first photodetector 73, which has detected the first light, outputs a first signal. The calculation unit 91 receives this first signal from the first photodetector 73 as a signal representing the intensity of the transmitted β rays.

[0045] As described above, the first scintillator 71 is made of a low-density material such as a plastic scintillator. In this case, most of the transmitted beta rays do not pass through the first scintillator 71, while the fluorescent X-rays from the particulate matter FP pass through the first scintillator 71 and are incident on the second scintillator 75. As a result, a second light caused by the fluorescent X-rays is generated in the second scintillator 75. The second photodetector 77, which detects the second light, outputs a second signal. The calculation unit 91 receives this second signal from the second photodetector 77 as a signal representing the intensity of the fluorescent X-rays generated from the particulate matter FP.

[0046] After acquiring a first signal corresponding to the passing beta rays and a second signal corresponding to the fluorescent X-rays from the particulate matter FP, the calculation unit 91 performs an analysis on the particulate matter FP based on these signals (step S4). Specifically, the calculation unit 91 calculates the mass concentration of the particulate matter FP based on the intensity of the passing beta rays represented in the first signal. The calculation unit 91 also identifies the elements contained in the particulate matter FP based on the energy and intensity of the fluorescent X-rays represented in the second signal, and calculates the content of those elements in the particulate matter FP.

[0047] Once the analysis of particulate matter (FP) is complete, the calculation unit 91 displays the analysis results of the particulate matter (FP) on the display unit 93. Furthermore, the calculation unit 91 may issue an alarm, for example, if the mass concentration of the particulate matter (FP) exceeds a predetermined threshold, or if the particulate matter (FP) contains a specific element in a predetermined amount or more. The alarm can be issued by, for example, displaying an alarm on the display unit 93 or by emitting a sound.

[0048] After the analysis is complete, if, for example, a command is issued to stop the analysis of particulate matter FP (Yes in step S5), the analysis operation in the analyzer 100 will stop. On the other hand, if no command is issued to stop the analysis of particulate matter FP (No in step S5), the analysis operation in the analyzer 100 will continue. Specifically, the calculation unit 91 rotates the winding reel 11a to move the collection filter 1 in the longitudinal direction, so that the portion of the collection filter 1 where particulate matter FP has not been collected is positioned directly below the discharge member 33. After that, steps S1 to S4 described above are executed to perform a new analysis of particulate matter FP.

[0049] In this way, by detecting the intensity of the transmitted beta rays with the first photodetector 73 and detecting the fluorescent X-rays generated from the particulate matter FP with the second photodetector 77, the transmitted beta rays generated by irradiating the particulate matter FP with beta rays and the fluorescent X-rays from the particulate matter FP can be detected in situ. That is, the calculation unit 91 can simultaneously acquire a first signal for calculating information on the mass concentration of the particulate matter FP and a second signal for calculating information on the elements contained in the particulate matter FP. As a result, the analysis results of the particulate matter FP (information on mass concentration and information on elements) can be obtained in a short time.

[0050] Furthermore, by detecting the transmitted beta rays and fluorescent X-rays with separate photodetectors, the first signal corresponding to the transmitted beta rays and the second signal corresponding to the fluorescent X-rays can be acquired separately. As a result, the first and second signals can be acquired more easily without signal separation processing on the acquired signals.

[0051] (4) Examples The following describes the results of an investigation into whether fluorescent X-rays can be generated from an analyte by irradiating it with beta rays and detected by a photodetector. In this example, a lead (Pb) plate was used as the analyte. Carbon-14 was used as the beta ray source. 14 C) was used. A scintillator made of cesium iodide (CsI) was used as the scintillator for detecting the fluorescent X-rays generated by irradiating the analyte with beta rays generated from this beta-ray source. The light generated from this scintillator was detected by a photodetector (e.g., SiPM (Silicon PhotoMultiplier), photomultiplier tube, silicon semiconductor detector, etc.).

[0052] Figure 4 shows an example of the verification results for whether fluorescent X-rays can be generated and detected from an analyte by irradiating it with beta rays. As shown in Figure 4, when the analyte (lead plate) is irradiated with beta rays, the photodetector can detect an X-ray intensity that is significant relative to the background at the energy value of the Kα rays of lead (Pb). In other words, the photodetector can detect the fluorescent X-rays generated when the analyte is irradiated with beta rays. The background corresponds to the intensity of the light (X-rays) detected by the photodetector when no beta rays are generated from the beta ray source.

[0053] 2. Second Embodiment In the first embodiment described above, the transmitted beta rays and fluorescent X-rays were detected by separate detectors. However, the invention is not limited to this, and the transmitted beta rays and fluorescent X-rays can also be detected by a common detector. In the second embodiment in which the transmitted beta rays and fluorescent X-rays are detected by a common detector, the detection unit 7' has a first scintillator 71, a second scintillator 75, and a third photodetector 81, as shown in Figure 5. Figure 5 is a diagram showing the configuration of the detection unit in the second embodiment.

[0054] The first scintillator 71 and the second scintillator 75 of the detection unit 7' are the same as in the first embodiment, so their description is omitted here. The third photodetector 81 is located below the second scintillator 75 and simultaneously detects the first light generated when passing β rays are incident on the first scintillator 71 and the second light generated when fluorescent X-rays are incident on the second scintillator 75. The third photodetector 81 is a detector that detects light and outputs a signal, for example, from a SiPM (Silicon PhotoMultiplier), a photomultiplier tube, or a silicon semiconductor detector.

[0055] In this way, by detecting the first and second rays with a single detector, the number of detectors required to detect the transmitted beta rays and fluorescent X-rays can be reduced, thus simplifying the configuration of the analytical apparatus 100.

[0056] As described above, the third photodetector 81 simultaneously detects the first and second light. Therefore, the detection signal output from the third photodetector 81 by detecting these lights is a signal that is the sum of the first signal caused by the first light (transmitted beta rays) and the second signal caused by the second light (fluorescent X-rays). In order to measure the transmitted beta rays and fluorescent X-rays from this detection signal, the calculation unit 91 separates the first signal and the second signal from this detection signal.

[0057] In a radiation detection unit using a scintillator, a pulsed detection signal is output from the photodetector when radiation is detected. The peak intensity of the pulsed detection signal corresponds to the energy of the detected radiation. Also, the number of pulsed detection signals per unit time corresponds to the intensity of the detected radiation. Furthermore, the energy value of the fluorescent X-rays emitted from the analyte is specific to the elements contained in the analyte.

[0058] Utilizing the above characteristics, the calculation unit 91 separates a first signal caused by transmitted beta rays and a second signal caused by fluorescent X-rays based on the peak intensity of the pulsed detection signal output from the third photodetector 81. Specifically, for example, the first and second signals can be separated as follows: The calculation unit 91 first identifies the peak intensity of the input pulsed detection signal and calculates the energy value corresponding to this peak intensity. If the calculated energy value does not correspond to the energy value of the fluorescent X-rays of the element expected to be included in the analyte, the calculation unit 91 can determine that the detection signal is the first signal.

[0059] On the other hand, if the calculated energy value corresponds to the energy value of the fluorescent X-rays of the elements predicted to be included in the target of analysis, the calculation unit 91 can calculate a second signal (the count value of the detection signal caused by fluorescent X-rays) by subtracting the count value of the transmitted β rays corresponding to the intensity of the component having that energy value from the count value of the detection signal.

[0060] In addition, the pulse width of the detection signal also corresponds to the energy value of the detected radiation. Therefore, the calculation unit 91 can also separate the first signal and the second signal based on the pulse width of the detection signal output from the third photodetector 81. For example, the calculation unit 91 identifies the pulse width of the input pulsed detection signal and calculates the energy value corresponding to this pulse width. If the calculated energy value does not correspond to the energy value of the fluorescent X-rays of the element expected to be included in the analysis target, the calculation unit 91 can determine that the detection signal is the first signal. The second signal can be separated in the same manner as described above.

[0061] 3. Third Embodiment In the first embodiment described above, the first scintillator 71 and first photodetector 73 for detecting transmitted β rays, and the second scintillator 75 and second photodetector 77 for detecting fluorescent X-rays, were both arranged in the first opening 31a of the suction member 31. However, the detection unit 7'' of the third embodiment can have a configuration for detecting fluorescent X-rays, namely the second scintillator 75' and the second photodetector 77', arranged outside the suction member 31. Specifically, the second scintillator 75' and the second photodetector 77' can be arranged at any position on a spherical surface having a predetermined radius from the position where the particulate matter FP of the collection filter 1 is collected. It is preferable to arrange the second scintillator 75' and the second photodetector 77' as close as possible to the position where the particulate matter FP of the collection filter 1 is collected (i.e., it is preferable to reduce the predetermined radius).

[0062] For example, as shown in Figure 6, the second scintillator 75' and the second photodetector 77' can be positioned on the side of the collection filter 1 where particulate matter FP is collected, at a predetermined distance from the position where the particulate matter FP is collected. Alternatively, the second scintillator 75' and the second photodetector 77' can be positioned on the opposite side of the collection filter 1 from where the particulate matter FP is collected. Figure 6 shows the configuration of the detection unit of the third embodiment.

[0063] When beta rays are irradiated from the beta-ray generator 5 onto the particulate matter FP collected in the collection filter 1, fluorescent X-rays are emitted radially from the particulate matter FP collected in the collection filter 1. Therefore, even if the second scintillator 75' and the second photodetector 77' are placed at any position on a spherical surface having a predetermined radius from the position where the particulate matter FP is collected in the collection filter 1, fluorescent X-rays generated from the particulate matter FP can be detected.

[0064] Furthermore, the detection unit 7'' having the above configuration can be realized by adding the second scintillator 75' and the second photodetector 77' to an existing analytical apparatus that has a configuration for detecting passing β rays (first scintillator 71 and first photodetector 73) provided at the first aperture 31a. In other words, the detection unit 7'' has a configuration that makes it easy to expand existing analytical apparatuses.

[0065] 4. Features of the Embodiment The first to third embodiments described above have the following characteristics. (1) The analyzer (e.g., analyzer 100) comprises a beta-ray source (e.g., beta-ray source 51), a detection unit (e.g., detection units 7, 7', 7''), and an analysis unit (e.g., analysis unit 9). The beta-ray source irradiates the analyte with beta rays. The detection unit simultaneously detects the passing beta rays that have passed through the analyte and the fluorescent X-rays generated by irradiating the analyte with the beta rays, and outputs a detection signal. The analysis unit obtains a first signal generated by detecting the passing beta rays and a second signal generated by detecting the fluorescent X-rays from the detection signal. The analysis unit also calculates information regarding the mass concentration of the analyte based on the first signal and calculates information regarding the elements contained in the analyte based on the second signal.

[0066] In the analytical apparatus described above, the detection unit simultaneously detects both transmitted beta rays and fluorescent X-rays and outputs a detection signal. Specifically, the detection signal includes a first signal derived from transmitted beta rays and a second signal derived from fluorescent X-rays. The analytical unit also calculates information regarding the mass concentration of the analyte based on the first signal and information regarding the elements contained in the analyte based on the second signal.

[0067] Thus, the above analytical device, with its simple configuration, can calculate information regarding the mass concentration of the analyte and information regarding the elements contained in the analyte. Furthermore, since the detection unit can simultaneously detect both transmitted beta rays and fluorescent X-rays, the analytical results of the analyte (information regarding mass concentration and elements contained in the analyte) can be obtained in a short time.

[0068] (2) In the analytical apparatus described in (1) above, the detection unit may include a first scintillator (e.g., a first scintillator 71), a second scintillator (e.g., second scintillators 75, 75'), and a photodetector. The first scintillator is positioned opposite the β-ray source and generates first light when passing β-rays are incident on it. The second scintillator is positioned opposite the β-ray source and generates second light when fluorescent X-rays are incident on it. The photodetector detects the first light and the second light and outputs a detection signal. This allows for the easy detection of passing β-rays and fluorescent X-rays by converting the passing β-rays and fluorescent X-rays into first light and second light, respectively.

[0069] (3) In the analytical apparatus described in (2) above, the photodetector may include a first photodetector (e.g., a first photodetector 73) that detects the first light and outputs a first signal, and a second photodetector (e.g., second photodetectors 77, 77') that detects the second light and outputs a second signal. This allows the first light and the second light to be detected simultaneously by separate photodetectors. As a result, the first signal and the second signal can be acquired more easily without signal separation processing on the acquired signals.

[0070] (4) In the analytical apparatus described in (2) above, the photodetector may have a third photodetector (for example, a third photodetector 81) that detects both the first light and the second light and outputs a detection signal. This allows the first light and the second light to be detected by a single photodetector, thus simplifying the apparatus configuration.

[0071] (5) In the analysis apparatus described in (4) above, the analysis unit may separate the first signal and the second signal from the detection signal based on the pulse width of the detection signal. This makes it possible to accurately separate the first signal and the second signal using the pulse width of the detection signal.

[0072] (6) In the analytical apparatus described in (4) above, the analytical unit may separate the first signal and the second signal from the detection signal based on the peak intensity of the detection signal. This makes it possible to accurately separate the first signal and the second signal using the intensity of the detection signal.

[0073] (7) In the analytical apparatus described in (1) to (6) above, the object of analysis may be particulate matter (e.g., particulate matter FP). In this case, the analytical apparatus may further include a collection device (e.g., collection device 3) for collecting particulate matter in a collection filter (e.g., collection filter 1). The β-ray source and detection unit may also be provided in the collection device. This allows for the calculation of the mass concentration of the particulate matter and information on the elements contained in the particulate matter in a short time. Furthermore, by providing the β-ray source and detection unit in the collection device, the analytical apparatus can be made more compact.

[0074] (8) The analysis method comprises the following steps: ◎Step of irradiating the object to be analyzed with beta rays (for example, step S2). ◎ A step (for example, step S2) that simultaneously detects the passing beta rays that have passed through the analyte and the fluorescent X-rays generated by irradiating the analyte with beta rays, and outputs a detection signal. ◎A step (for example, step S3) to obtain a first signal generated by detecting passing beta rays and a second signal generated by detecting fluorescent X-rays from the detection signal. ◎A step (for example, step S4) to calculate information regarding the mass concentration of the analyte based on the first signal and to calculate information regarding the elements contained in the analyte based on the second signal.

[0075] In the above analysis method, the transmitted beta rays and fluorescent X-rays generated by irradiating the analyte with beta rays are simultaneously detected and a detection signal is output. That is, the detection signal includes a first signal originating from the transmitted beta rays and a second signal originating from the fluorescent X-rays. Furthermore, in the above analysis method, information regarding the mass concentration of the analyte is calculated based on the first signal, and information regarding the elements contained in the analyte is calculated based on the second signal.

[0076] As described above, the analysis method simultaneously detects both transmitted beta rays and fluorescent X-rays, allowing for the acquisition of analysis results (mass concentration and information on the elements contained in the analyte) in a short time.

[0077] 5. Other Embodiments Although several embodiments of the present invention have been described above, the present invention is not limited to the above embodiments, and various modifications are possible without departing from the spirit of the invention. In particular, the multiple embodiments and modifications described herein can be arbitrarily combined as needed. (A) The processing order and / or processing content of each step of the analysis operation described with reference to Figure 3 can be modified as appropriate without departing from the spirit of the invention.

[0078] (B) Based on the analysis results of the object to be analyzed output by the analysis unit 9 of the analysis device 100 described above, other devices may be controlled. For example, if particulate matter FP generated in a waste incineration facility is the object to be analyzed, the analysis result may be output as whether or not harmful substances (elements) are contained in the particulate matter FP, and when this analysis result is output, a predetermined device of the waste incineration facility may be operated.

[0079] (C) By combining the above-mentioned analytical device 100 with other analytical devices (for example, a gas analyzer), a system can be constructed to perform a more detailed analysis of the object to be analyzed.

[0080] (D) A beta-ray source for generating beta rays and an X-ray source for generating X-rays, etc., for generating fluorescent X-rays from particulate matter FP may be provided separately. In this case, for example, the beta-ray source and the X-ray source can be placed adjacent to each other in the second aperture 33a. This allows both beta rays and fluorescent X-rays to be detected simultaneously by a single detection unit 7 located in the first aperture 31a. Alternatively, the X-ray source can be placed on the side of the collection filter 1 opposite to the side where the particulate matter FP is collected.

[0081] (E) The β-ray source 51 may be positioned away from the second aperture 33a. Specifically, the β-ray source 51 may be positioned away from the second aperture 33a and tilted with respect to the extension direction of the second aperture 33a. In this case, the β-ray source 51 irradiates the second aperture 33a at an oblique angle. This prevents the β-ray source 51 from obstructing the flow of particulate matter FP through the second aperture 33a. As a result, particulate matter FP can be collected evenly and uniformly on the collection surface of the collection filter 1. [Industrial applicability]

[0082] This invention can be widely applied to particulate matter analyzers that analyze fine particulate matter suspended in a measurement space. [Explanation of Symbols]

[0083] 100: Analyzer 1: Collection filter 11a: Retractable reel 11b: Feedback reel 3: Collection device 31: Suction component 31a: 1st opening 33: Discharge component 33a: 2nd opening 35: Suction pump 37: Collection member 5: Beta ray generating section 51 :β-ray source 53: Restricting member 7, 7', 7'': Detection part 71: First scintillator 73: First photodetector 75, 75': Second scintillator 77, 77': Second photodetector 79: Light-shielding material 81: Third photodetector 9:Analysis Department 91: Arithmetic section 93: Display section FP: Particulate matter

Claims

1. A beta-ray source that irradiates the object to be analyzed with beta rays, A detection unit that simultaneously detects the passing beta rays that have passed through the target of analysis and the fluorescent X-rays generated by irradiating the target of analysis with the beta rays, and outputs a detection signal. An analysis unit that obtains a first signal generated by detecting the passing β rays and a second signal generated by detecting the fluorescent X-rays from the detection signal, calculates information regarding the mass concentration of the analyte based on the first signal, and calculates information regarding the elements contained in the analyte based on the second signal. An analytical device equipped with the following features.

2. The detection unit is A first scintillator is positioned opposite the beta-ray source and generates first light when the passing beta rays are incident on it, A second scintillator is positioned opposite the aforementioned beta-ray source and generates a second light when the aforementioned fluorescent X-rays are incident on it, A light detection unit that detects the first light and the second light and outputs the detection signal, The analytical apparatus according to claim 1, having the following features.

3. The analytical apparatus according to claim 2, wherein the light detection unit includes a first photodetector that detects the first light and outputs the first signal, and a second photodetector that detects the second light and outputs the second signal.

4. The analytical apparatus according to claim 2, wherein the light detection unit has a third photodetector that detects both the first light and the second light and outputs the detection signal.

5. The analysis apparatus according to claim 4, wherein the analysis unit separates the first signal and the second signal from the detection signal based on the pulse width of the detection signal.

6. The analysis apparatus according to claim 4, wherein the analysis unit separates the first signal and the second signal from the detection signal based on the peak intensity of the detection signal.

7. The object of analysis is particulate matter, The collection device further comprises a collection device for collecting the aforementioned particulate matter in a collection filter. The β-ray source and the detection unit are provided in the collection device. The analytical apparatus according to any one of claims 1 to 6.

8. The steps include irradiating the object to be analyzed with beta rays, The steps include simultaneously detecting the passing beta rays that have passed through the target of analysis and the fluorescent X-rays generated by irradiating the target of analysis with the beta rays, and outputting a detection signal. The steps include obtaining a first signal generated by detecting the passing beta rays and a second signal generated by detecting the fluorescent X-rays from the detection signal, The steps include: calculating information regarding the mass concentration of the analyte based on the first signal, and calculating information regarding the elements contained in the analyte based on the second signal; An analytical method that includes the following features.

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