Diagnostic equipment
Patent Information
- Application Number
- JP2025060381
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2025-04-01
- Publication Date
- 2026-10-14
AI Technical Summary
【0009】 本開示の一態様によれば、異常又は劣化が生じている部分に関するグラフ分析を容易且つ適切に行うことができる診断装置を提供することができる。
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Figure 2026167052000001_ABST
Abstract
Description
Technical Field
[0001] One aspect of the present disclosure relates to a diagnostic device.
Background Art
[0002] Patent Document 1 discloses an apparatus including a data processing unit that processes process data to calculate a trend, a display cycle setting unit that presets a data display cycle, and a display unit that displays the process data or trend data as a graph in time series.
Prior Art Documents
Patent Documents
[0003]
Patent Document 1
Summary of the Invention
Problems to be Solved by the Invention
[0004] Here, when analyzing time-series changes of data by graphing them, normally, the normal portion is overwhelmingly longer than the portion where an abnormality or deterioration has occurred. If all time-series changes are displayed, the portion intended for analysis (the portion where an abnormality or deterioration has occurred) will be displayed in a small size. This may make analysis difficult.
[0005] The present disclosure has been made in view of the above circumstances, and an object thereof is to provide a diagnostic device capable of easily and appropriately performing graph analysis on a portion where an abnormality or deterioration has occurred.
Means for Solving the Problems
[0006] A diagnostic device according to one aspect of the present disclosure includes: a collection unit for collecting process data relating to equipment to be monitored; a data processing unit for deriving time-series changes in process data; a determination unit for determining whether or not an abnormal state exists by comparing the time-series changes in process data with a predetermined threshold; a display span setting unit for setting the span of periods in an abnormal state and shortening the span of periods in a normal state with respect to a graph showing time-series changes in process data, where the horizontal axis represents time; and a display unit for displaying the graph after the span setting by the display span setting unit.
[0007] In such diagnostic devices, the time-series changes in process data are compared with a predetermined threshold, and if it is determined that an abnormal state exists (an abnormality or degradation is occurring), the span of the period in the abnormal state is lengthened and the span of the period in the normal state is shortened in the graph showing the time-series changes of the process data. Normally, the normal portion is overwhelmingly longer than the portion where an abnormality or degradation is occurring, and if all time-series changes are displayed, the portion to be analyzed (the portion where an abnormality or degradation is occurring) will be displayed too small, making analysis difficult. In this regard, as described above, when an abnormal state is determined, the span of the period in the abnormal state is lengthened and the span of the period in the normal state is shortened, allowing the time-series changes of the abnormal state that you want to analyze to be displayed in an enlarged view. This makes it easy and appropriate to perform graph analysis on the portion where an abnormality or degradation is occurring.
[0008] In the diagnostic device described above, the process data may be the number of sector abnormalities in the HDD, the number of times the zero-sequence current of the power cable exceeds the threshold per unit time, or the State of Health (SOH) indicating the battery degradation state of the storage battery. With such a configuration, events that result in an abnormal state after a long period of normal conditions (such as the number of sector abnormalities in the HDD) can be displayed in a manner that facilitates analysis by adjusting the display span of the graph as described above. [Effects of the Invention]
[0009] According to one aspect of this disclosure, a diagnostic device can be provided that can easily and appropriately perform graph analysis on parts where abnormalities or deterioration have occurred. [Brief explanation of the drawing]
[0010] [Figure 1] Figure 1 is a schematic diagram illustrating the diagnostic system. [Figure 2] Figure 2 is a block diagram showing an example of the hardware configuration of a diagnostic device. [Figure 3] Figure 3 is a graph showing the trend in the number of sector abnormalities on an HDD. [Figure 4] Figure 4 is a graph showing the trend of the number of times the threshold for zero-sequence current in a power cable is exceeded per unit time. [Figure 5] Figure 5 is a graph showing the progression of battery degradation in a storage battery. [Figure 6] Figure 6 is a diagram illustrating the display span settings. [Modes for carrying out the invention]
[0011] The diagnostic system according to the embodiment will be described below with reference to the drawings. In the following description, the same or equivalent elements will be denoted by the same reference numerals, and redundant explanations will be omitted.
[0012] Figure 1 is a schematic diagram of the diagnostic system 1. In the diagnostic system 1, process data related to the monitored equipment 10 is processed to derive time-series changes in the process data, and a graph showing the time-series changes in the process data is displayed in a display mode corresponding to the state of the time-series changes. Specifically, in the diagnostic system 1, the time-series changes in the process data are compared with a predetermined threshold, and if it is determined that the state is abnormal, the span of the period in the abnormal state is lengthened and the span of the period in the normal state is shortened, and a graph showing the time-series changes in the process data is displayed. Normally, the normal portion is overwhelmingly longer than the portion where abnormality or deterioration is occurring, and if all time-series changes are displayed, the portion to be analyzed (the portion where abnormality or deterioration is occurring) will be displayed small, making analysis difficult. In this regard, as described above, when it is determined that the state is abnormal, the span of the period in the abnormal state is lengthened and the span of the period in the normal state is shortened, so that the time-series changes of the abnormal state that you want to analyze can be displayed in an enlarged view. This makes it easy and appropriate to perform graph analysis on the portion where abnormality or deterioration is occurring.
[0013] As shown in Figure 1, the diagnostic system 1 comprises a monitored equipment 10, a diagnostic device 20, and a display 30.
[0014] The monitored equipment 10 is, for example, power equipment, and is the equipment that is monitored and diagnosed by the diagnostic device 20. Although only one monitored equipment 10 is shown in Figure 1, the diagnostic system 1 may include multiple monitored equipment 10. The monitored equipment 10 transmits various process data related to the monitored equipment 10 to the diagnostic device 20. The monitored equipment 10 may transmit process data to the diagnostic device 20 at regular intervals. The process data may be, for example, the number of sector abnormalities in an HDD (Hard Disk Drive), the number of times the zero-sequence current of a power cable exceeds the threshold per unit time, or the State of Health (SOH) indicating the battery degradation state of a storage battery.
[0015] The number of sector errors in an HDD refers to, for example, the number of bad sectors (sectors that can no longer be read or written to). A high number of sector errors increases the risk of failure. Power cable zero-sequence current is an abnormal current (leakage current) that occurs when the sum of the currents of each phase of a three-phase AC is not zero. The number of zero-sequence current threshold exceedances per unit time refers to the number of zero-sequence currents that exceed a predetermined threshold in a predetermined period of time, such as one hour. If power cable zero-sequence current is frequently detected, a ground fault circuit interrupter may trip, and it can also cause equipment failure or fire. State of Health (SOH) of a storage battery is an index that shows how much the battery has deteriorated compared to when it was new. SOH is calculated by comparing the current maximum charge capacity of the battery with the capacity when it was new and expressing the ratio as a percentage. For example, if the SOH is 90%, it means that the battery can only be charged to 90% of its capacity when it was new.
[0016] The diagnostic device 20 determines whether or not an abnormal state is present based on the collected process data, and if an abnormal state is present, it displays the time-series changes in the process data with a longer span for periods of abnormality and a shorter span for periods of normality. Figure 2 is a block diagram showing an example of the hardware configuration of the diagnostic device 20. The diagnostic device 20 is composed of one or more control computers. For example, the diagnostic device 20 has the circuit 220 shown in Figure 2. The circuit 220 has one or more processors 221, a memory 222, a storage 223, and an input / output port 224. The storage 223 has a storage medium that can be read by the computer, such as a hard disk. The storage medium stores a program that causes the diagnostic device 20 to execute a predetermined processing procedure. The storage medium may be a removable medium such as a non-volatile semiconductor memory, a magnetic disk, or an optical disk. The memory 222 temporarily stores the program loaded from the storage medium of the storage 223 and the calculation results by the processor 221. The processor 221, in cooperation with the memory 222, executes the above-mentioned program to configure each of the functional modules described above. The input / output port 224 performs input and output of electrical signals to and from the monitored equipment 10 according to commands from the processor 221. Note that the hardware configuration of the diagnostic device 20 is not necessarily limited to configuring each functional module by program. For example, each functional module of the diagnostic device 20 may be composed of a dedicated logic circuit or an ASIC (Application Specific Integrated Circuit) that integrates such circuits.
[0017] Returning to Figure 1, the diagnostic device 20 comprises a data collection unit 21, a data processing unit 22, a determination unit 23, a display span setting unit 24, and a display unit 25.
[0018] The collection unit 21 collects process data related to the monitored target facility 10. The collection unit 21 may collect the process data each time the process data is transmitted from the monitored target facility 10, or may collectively collect the process data transmitted from the monitored target facility 10 within a certain period. The collection unit 21 outputs the collected process data to the data processing unit 22.
[0019] The data processing unit 22 processes and computes the process data to derive a time-series change of the process data. The data processing unit 22 derives the time-series change of the process data from the process data at a plurality of time points related to the same item (for example, the number of HDD sector failures) input from the collection unit 21. Such a time-series change of the process data can be represented by a graph with the horizontal axis representing time and the vertical axis representing the process data. The time-series change of each piece of process data is common in that "the value hardly changes within the normal range at the beginning of operation, but the value changes abruptly as deterioration progresses".
[0020] FIG. 3 is a graph showing the transition of the number of HDD sector failures, which is an example of process data. In FIG. 3, the horizontal axis represents the elapsed time since the start of operation, and the vertical axis represents the number of HDD sector failures. As shown in FIG. 3, for a while after the start of operation, since deterioration has not progressed, the number of HDD sector failures is a value close to approximately 0. On the other hand, as deterioration progresses, the number of sector failures increases sharply, and when a failure occurs, the number of sector failures becomes constant at a high value.
[0021] FIG. 4 is a graph showing the transition of the number of threshold excesses per unit time of the zero-sequence current of a power cable, which is an example of process data. In FIG. 4, the horizontal axis represents the elapsed time since the start of operation, and the vertical axis represents the number of threshold excesses per unit time of the zero-sequence current of the power cable. As shown in FIG. 4, for a while after the start of operation, since deterioration has not progressed, the number of threshold excesses per unit time of the zero-sequence current of the power cable is a value close to approximately 0. On the other hand, as deterioration progresses, the number of threshold excesses increases sharply, and when a failure occurs, it becomes 0.
[0022] Figure 5 is a graph showing the progression of battery degradation in a storage battery, which is an example of process data. In Figure 5, the horizontal axis represents elapsed time, and the vertical axis represents the State of Health (SOH) (%), which indicates the battery degradation state of the storage battery. As shown in Figure 5, for a while after the start of operation, degradation has not progressed, so the SOH is close to 100%. On the other hand, as degradation progresses, the SOH gradually decreases.
[0023] Thus, since the values of each process data change rapidly from a certain point in time when an abnormality occurs or deterioration progresses, by setting a threshold that takes into account the characteristics of time-series changes in advance, it is possible to easily and appropriately determine whether the state is abnormal or not (i.e., normal).
[0024] The determination unit 23 determines whether or not an abnormal state exists by comparing the time-series changes in process data with predetermined thresholds, assuming that thresholds as described above have been set in advance. For example, regarding the number of sector abnormalities in the HDD shown in Figure 3, the determination unit 23 determines that an abnormal state exists if the number of sector abnormalities exceeds a predetermined threshold. For example, regarding the number of times the threshold for the zero-sequence current of the power cable is exceeded per unit time, as shown in Figure 4, the determination unit 23 determines that an abnormal state exists if the number of times the threshold for the zero-sequence current of the power cable is exceeded per unit time exceeds a predetermined threshold. For example, regarding the battery degradation state of the storage battery shown in Figure 5, the determination unit 23 determines that an abnormal state exists if the SOH falls below a predetermined threshold.
[0025] The display span setting unit 24, when the determination unit 23 determines that an abnormal state exists, lengthens (increases) the span for the period in an abnormal state and shortens (decreases) the span for the period in a normal state with respect to a graph showing the time-series changes of process data, where the horizontal axis represents time.
[0026] Figure 6 illustrates the display span settings. In Figures 6(a) and 6(b), the horizontal axis represents time, and the vertical axis represents the process data values. Figure 6(a) shows the display span settings for a comparative example, and the graph shows a constant span for the entire period regardless of whether the condition is abnormal or not. As shown in Figure 6(a), the normal portion is overwhelmingly longer than the portion that is abnormal (where abnormality or deterioration is occurring). Therefore, if the graph is shown on a time axis that reflects the actual period, the portion of the abnormal condition that we want to analyze in detail becomes relatively small, making analysis difficult.
[0027] Figure 6(b) shows the display span setting by the display span setting unit 24 according to this embodiment, showing a graph in which the span for periods of abnormality is long (large) and the span for periods of normality is short (small). In such a graph, the time-series changes of the abnormal state to be analyzed can be displayed in an enlarged view. This makes it easy and appropriate to perform graph analysis on the parts where abnormalities or deterioration are occurring.
[0028] The display unit 25 displays the graph (a graph showing the time-series changes in process data) after the span setting by the display span setting unit 24. More specifically, the display unit 25 outputs the graph after the span setting to the display 30, and the graph is displayed via the display 30. The display 30 displays a graph with a longer (larger) span for periods that are not abnormal. By checking such a graph, the user can easily and appropriately analyze the graph.
[0029] Next, the effects and benefits of the diagnostic device 20 according to this embodiment will be described.
[0030] The diagnostic device 20 includes a collection unit 21 that collects process data relating to the monitored equipment 10, a data processing unit 22 that derives time-series changes in the process data, a determination unit 23 that determines whether or not the process data is in an abnormal state by comparing the time-series changes in the process data with a predetermined threshold, a display span setting unit 24 that, if the determination unit 23 determines that the process data is in an abnormal state, lengthens the span for periods in an abnormal state and shortens the span for periods in a normal state in a graph showing time-series changes in the process data where the horizontal axis represents time, and a display unit 25 that displays the graph after the span setting by the display span setting unit 24.
[0031] In such a diagnostic device 20, the time-series changes in process data are compared with a predetermined threshold, and if it is determined that the process data is in an abnormal state (abnormality or deterioration is occurring), the span of the period in the abnormal state is lengthened and the span of the period in the normal state is shortened in the graph showing the time-series changes in the process data. Normally, the normal portion is overwhelmingly longer than the portion where abnormality or deterioration is occurring, and if all time-series changes are displayed, the portion to be analyzed (the portion where abnormality or deterioration is occurring) will be displayed too small, making analysis difficult. In this regard, as described above, when an abnormal state is determined, the span of the period in the abnormal state is lengthened and the span of the period in the normal state is shortened, allowing the time-series changes of the abnormal state that are to be analyzed to be displayed in an enlarged view. This makes it easy and appropriate to perform graph analysis on the portion where abnormality or deterioration is occurring.
[0032] In the diagnostic device 20 described above, the process data may be the number of sector abnormalities in the HDD, the number of times the zero-sequence current of the power cable exceeds the threshold per unit time, or the State of Health (SOH) indicating the battery degradation state of the storage battery. With such a configuration, events that result in an abnormal state after a long period of normal conditions (such as the number of sector abnormalities in the HDD) can be displayed in a manner that facilitates analysis by adjusting the display span of the graph as described above. [Explanation of Symbols]
[0033] 10... Equipment to be monitored, 20... Diagnostic device, 21... Data collection unit, 22... Data processing unit, 23... Judgment unit, 24... Display span setting unit, 25... Display unit.
Claims
1. A data collection unit that collects process data related to the monitored equipment, A data processing unit that derives the time-series changes of the aforementioned process data, A determination unit that determines whether or not an abnormal state exists by comparing the time-series changes of the process data with a predetermined threshold, When the determination unit determines that the process data is in an abnormal state, the display span setting unit lengthens the span of the period in the abnormal state and shortens the span of the period when the process data is not in an abnormal state, in relation to the graph showing the time-series changes of the process data, where the horizontal axis represents time. A diagnostic device comprising a display unit that displays a graph after the span has been set by the display span setting unit.
2. The diagnostic device according to claim 1, wherein the process data is the number of sector abnormalities in the HDD, the number of times the zero-sequence current of the power cable exceeds the threshold per unit time, or the State of Health (SOH) indicating the battery degradation state of the storage battery.
Citation Information
Patent Citations
Trend graph display device
JP1994117876A