A support system for material testing and the server used therein.

Abstract

This system provides support for efficiently conducting material tests in accordance with test standards. [Solution] The support system 10 for material testing using the test apparatus 200 comprises a terminal device 300 that receives input from the user, and a server 100 that is connected to the terminal device 300 and the test apparatus 200 in a manner that enables communication. Based on the input information from the terminal device 300, the server 100 searches for and obtains standard information corresponding to the target test, and provides the standard information to the user through the terminal device 300.

Description

Technical Field

[0001] The present disclosure relates to a material testing support system and a server used therein, and more particularly to a technique for improving the efficiency of material testing in compliance with test standards.

Background Art

[0002] Japanese Patent No. 4506923 (Patent Document 1) discloses a material testing machine in which test conditions for various tests are stored in advance in a storage unit. In the material testing machine, when a user inputs a standard number corresponding to a target test standard, the test conditions corresponding to the standard number are read out from the storage unit, load conditions are automatically set in the material testing machine, and the test conditions are notified to the user.

[0003] In the material testing machine disclosed in Japanese Patent No. 4506923 (Patent Document 1), even if a user does not understand various standards and is not a professional engineer, the user can perform a required test by inputting the standard number, and erroneous tests can be prevented.

Prior Art Documents

Patent Documents

[0004]

Patent Document 1

Summary of the Invention

Problems to be Solved by the Invention

[0005] In materials testing, to ensure the quality of the tests, it is necessary to follow the test conditions and methods specified in various standards established by organizations such as the Japanese Industrial Standard (JIS), the International Organization for Standardization (ISO), or the American Society for Testing and Materials (ASTM). In this case, the user conducting the materials test usually prepares the test specimens in accordance with the relevant standard, referring to the manual of that standard, and sets the loading conditions (test conditions) to be applied to the test specimens.

[0006] However, understanding the content of each test standard generally requires specialized skills in materials testing. Furthermore, even when performing the same test, it may be necessary to subtly change the parameters to be set depending on the testing machine used. Setting appropriate test conditions for each testing machine is not always easy for users. Moreover, if a user has little knowledge of test standards, they may not even know which test standard to follow in the first place.

[0007] This disclosure was made to solve the above-mentioned problems, and its purpose is to provide a support system for efficiently conducting material tests in accordance with test standards. [Means for solving the problem]

[0008] The support system for material testing using the test apparatus relating to the first aspect of this disclosure comprises a terminal device that receives input from a user, and a server that is connected to the terminal device and the test apparatus in a manner that enables communication. Based on the input information from the terminal device, the server searches for and obtains standard information corresponding to the target test, and provides said standard information to the user through the terminal device.

[0009] The server relating to the second aspect of this disclosure is used in a support system for material testing using a test apparatus. The server comprises a memory in which a program is stored and a processor that executes the program stored in the memory. The server is communicatively connected to a terminal device that receives input from a user and to the test apparatus. Based on the input information from the terminal device, the server searches for and obtains standard information corresponding to the target test and provides said standard information to the user through the terminal device. [Effects of the Invention]

[0010] In the materials testing support system described herein, the target test standard is searched based on user input information entered into a terminal device, and the specification information of the said test standard is provided to the user through the terminal device. Therefore, even if the user has insufficient knowledge of the test standard, the user can appropriately select the target test standard and obtain test conditions in accordance with that test standard. This enables the efficient execution of materials tests in accordance with the test standard. [Brief explanation of the drawing]

[0011] [Figure 1] This is an overall diagram of the support system for material testing related to this disclosure. [Figure 2] This is a functional block diagram illustrating the server configuration in Figure 1. [Figure 3] This diagram illustrates the overview of the standard information learning process in the support system. [Figure 4] This diagram illustrates the overview of the test standard search process in the support system. [Figure 5] This diagram illustrates the overview of the test information search process for a target test standard within the support system. [Figure 6] This diagram illustrates an example of the sequence of events between the user and the server during a test standard search. [Figure 7]This diagram illustrates an example of the sequence of events between the user and the server during a test information retrieval. [Figure 8] This figure shows an example of test results displayed on a terminal device. [Modes for carrying out the invention]

[0012] The embodiments of this disclosure will be described in detail below with reference to the drawings. In the drawings, the same or corresponding parts are denoted by the same reference numerals, and their descriptions will not be repeated.

[0013] [Embodiment] (Configuration of the support system) Figure 1 is an overall configuration diagram of the material testing support system 10 according to this embodiment. The support system 10 is, in general terms, a system for providing users with information on various test standards in material testing.

[0014] The support system 10 includes a server 100, a test device 200, and terminal devices 300A and 300B. In the support system 10, the server 100, the test device 200, and the terminal devices 300A and 300B are configured to communicate with each other via a communication network 400, such as the Internet or a corporate intranet. Communication between each device and the communication network 400 can be done via wired or wireless connections. In the following description, terminal devices 300A and 300B may be collectively referred to as "terminal device 300".

[0015] In Figure 1, an example configuration is shown in which the test device 200 communicates with the communication network 400. However, the test device 200 may also be connected to a monitoring terminal device 300A, and communicate with the communication network 400 via the terminal device 300A. Furthermore, in Figure 1, an example of a tensile testing machine is shown as the test device 200. However, the test device 200 is not limited to this and can also be applied to bending testing machines, fatigue testing machines, impact testing machines, hardness testing machines, wear testing machines, and creep testing machines, for example.

[0016] Server 100 includes a processor 110, a memory 120, and a communication device 130. The processor 110, the memory 120 and the communication device 130 are connected to each other via a common bus 140, and are configured to be capable of exchanging information with each other.

[0017] The processor 110 is, for example, a CPU (Central Processing Unit), and is configured to execute predetermined arithmetic processing described in a program. The memory 120 includes a ROM (Read Only Memory) and a RAM (Random Access Memory). The ROM stores programs to be executed by the processor 110. The RAM temporarily stores data generated by execution of programs in the processor 110 and data input via the communication device 130. The RAM also functions as a temporary data memory used as a work area. Further, as the memory 120, a large-capacity storage device such as an HDD (Hard Disc Drive) or an SSD (Solid State Drive) may be provided.

[0018] The communication device 130 is a communication interface for exchanging data with the test device 200 and the terminal devices 300A, 300B via the communication network 400. As described above, communication between the server 100 and the communication network 400 is performed by wire or wirelessly.

[0019] As will be described later with reference to FIG. 2, the server 100 includes an analysis module that performs natural language processing, the analysis module analyzes input information related to a material test input by a user via the terminal device 300, and uses data stored in the memory 120 and / or information acquired from an external database (not shown) to provide the user with parameters such as test standards suitable for the target test and test conditions conforming to the relevant standards.

[0020] Terminal device 300 is an operating device operated by the user and consists of a general-purpose computer or a mobile terminal such as a tablet. Terminal device 300A is a monitoring device for the test device 200, monitoring the operating status of the target test device 200 and storing the results of tests performed on the test device 200. It is also possible to operate the test device 200 from terminal device 300A.

[0021] Terminal device 300B is a device primarily operated by the operator of the test apparatus 200. The operator operates the test apparatus 200 by inputting parameters and operation commands into terminal device 300B. The operator can also use terminal device 300B to retrieve test result information stored in terminal device 300A and display it on the display screen of terminal device 300B to confirm the test results.

[0022] The test device 200 performs test operations based on parameters transmitted from the server 100 and / or terminal device 300. The test device 200 also processes the obtained test results into a format desired by the user and provides them based on the set evaluation parameters.

[0023] Figure 2 is a functional block diagram illustrating the configuration of server 100 in Figure 1. Server 100 includes an input unit 101, an analysis module 102, an output unit 103, a standard selection unit 104, a test information setting unit 105, a test data processing unit 106, a storage unit 107, and a test equipment control unit 108. Each function in server 100 can be performed by software, hardware, or a combination thereof.

[0024] The input unit 101 is an input interface that receives information from the terminal device 300 via the communication network 400. The input unit 101 acquires character information entered by an input device such as a keyboard or scanner, or voice information entered through a microphone, at the terminal device 300. The character information or voice information received by the input unit 101 is then processed in natural language by the analysis module 102, and information related to the test standards contained in the information is extracted.

[0025] The standard selection unit 104 searches the data stored in the storage unit 107 or an external database based on the information extracted by the analysis module 102, and obtains the test standards related to the material test desired by the user. The analysis module 102 includes a so-called generative AI (Artificial Intelligence) engine, which processes the acquired test standard information using natural language processing to generate text data for output to the user. The generated text data is output from the output unit 103 to the terminal device 300 via the communication network 400. The terminal device 300 is equipped with a display device such as an LCD screen and an audio output device such as a speaker. The generated text data is conveyed to the user by displaying text on the display screen and / or by outputting audio through the speaker.

[0026] Furthermore, in the case of new additions or updates to the latest information of test standard information, the standard selection unit 104 registers the information transmitted from the terminal device 300 in the storage unit 107. Alternatively, if a machine learning learning model is stored in the storage unit 107 for information retrieval, the standard selection unit 104 retrains the learning model using the acquired test standard information. As a learning model, for example, deep learning using a multi-layer neural network may be used.

[0027] The test information setting unit 105 searches the storage unit 107 based on the information extracted by the analysis module 102 and the standard information selected by the standard selection unit 104, and extracts the setting parameters and evaluation parameters of the test device 200 suitable for the test. The extracted parameters are output to the terminal device 300 via the analysis module 102 and the output unit 103. Furthermore, if instructed by the user, the test information setting unit 105 may output these parameters to the test device 200 via the test device control unit 108 to automatically prepare the test device 200. The test device control unit 108 outputs the parameters to the test device 200 and also obtains the results of the test performed by the test device 200.

[0028] The test data processing unit 106 receives information regarding test results acquired from the test apparatus 200 and converts this information into an output format desired by the user. For example, the test data processing unit 106 generates a graph showing the changes in parameters during the test period, or calculates the obtained data and converts it into predetermined physical quantities. The generated data is output to the terminal device 300 via the output unit 103, displayed on the display screen of the terminal device 300, and stored in the storage device.

[0029] (Description of functions in the support system) Material testing must be conducted according to the test conditions and methods specified in various standards established by organizations such as the Japanese Industrial Standards (JIS), the International Organization for Standardization (ISO), or the American Society for Testing and Materials (ASTM). In this case, the user conducting the material testing usually prepares the test specimens in accordance with the relevant test standard, referring to the manual for that standard, and sets the loading conditions (test conditions) to be applied to the test specimens.

[0030] However, understanding the content of each test standard generally requires specialized skills in materials testing. Furthermore, even when performing the same test, different testing machines may require subtle changes to the parameters to be set, making it difficult to set appropriate test conditions for each machine. Moreover, if the user lacks knowledge of test standards, they may not even know which test standard to follow.

[0031] The support system 10 according to this embodiment obtains information necessary for a user who wants to perform a material test to select a standard, searches for candidate test standards, and provides them to the user. Then, when a test standard is selected by the user, the support system 10 searches for information necessary for performing the test in accordance with the corresponding test standard, as well as the setting parameters of the target test apparatus 200, and provides them to the user.

[0032] The support system 10 includes a generative AI that performs natural language processing and, by responding to the user in an interactive format, facilitates the input of information to be obtained from the user and provides search information in a manner that is easy for the user to understand. With this configuration, even users who do not have sufficient knowledge of material testing can select the target test standard and set test conditions suitable for the test equipment to be used without referring to a complex manual.

[0033] The following describes the specific functions of the support system 10 according to this embodiment.

[0034] (1) Registration and learning function for standard information First, we will explain the registration and learning functions for standard information regarding tests in the support system 10. In this specification, "standard information" includes the name of the test standard and the test information corresponding to each standard.

[0035] In order for the support system 10 to provide users with various information regarding test standards, it is necessary to acquire information about those test standards in advance and store it in a memory device. Test standards are published by organizations such as JIS, ISO, and ASTM as mentioned above, but the content of these standards is updated periodically or irregularly. Therefore, it is necessary for the support system 10 to acquire the latest standard information and keep it updated.

[0036] Furthermore, since the standards information published by the above-mentioned organizations is generalized information, past actual test results may be useful as a reference for test conditions suitable for specific test equipment. Moreover, if new materials not included in the published standards information are developed, information described in various technical documents such as papers may be useful. For this reason, the support system 10 also registers this technical information provided by users.

[0037] Figure 3 is a diagram illustrating the overview of the standard information learning process in the support system 10. The server 100 periodically acquires the latest standard information from an external standard database 450 owned by an external organization such as JIS, via the communication network 400. For example, the server 100 acquires information from the external standard database 450 at intervals such as once a day or once a week.

[0038] Furthermore, the server 100 acquires technical information literature or test result information from the user. If this data is in paper format, it is input into the server 100 as digitized data using a scanner with OCR (Optical Character Reader) functionality. The server 100 extracts the information necessary for testing from the acquired content by performing natural language processing on the latest standards information and technical information from the user, and registers and stores the extracted information in a database in memory 120 in a format suitable for search processing. Here, the information necessary for testing includes information on the test specimens used in the test, information on the test equipment, information on the test procedure, information on the test environment, and information on the evaluation items to be described in the report.

[0039] Furthermore, if server 100 has an AI-powered search engine, the extracted information is used to retrain the learning model of that search engine. In the learning model, the relationship between user input information and standard information is predetermined, and when input information is received, the corresponding standard information is output.

[0040] In this way, the standards information within server 100 is kept up-to-date, and the latest information regarding test standards can be provided to users.

[0041] (2) Search function for test standards Next, we will explain the search function for target test standards in the support system 10. Figure 4 is a diagram illustrating the overview of the test standard search in the support system 10. Referring to Figure 4, when searching for test standards, the information that must be obtained from the user includes at least information about the "component" to be tested, the "material" of that component, and the "type of test." For example, the component is a "screw," the material is "rubber," and the type of test is "tensile strength."

[0042] If this information is included in the user's input, the server 100 searches for suitable test standard candidates based on the user's input by applying a database stored in memory 120 or an AI learning model. The server then provides the user with a list of the test standard candidates obtained through the search.

[0043] Furthermore, if the server 100 cannot extract information corresponding to the above-mentioned "components," "materials," and "type of test" from the user's input information, it will provide the user with information prompting them to input the missing information. By responding to the server's inquiry, the user can easily input the information necessary for the search without using a manual.

[0044] The database used for searching does not necessarily have to be located within server 100; it may be located outside of server 100. If the database is located within server 100, the search process can be executed solely on server 100, contributing to a smaller overall system size and faster processing. On the other hand, if the database is located outside of server 100, server 100 itself can be made smaller.

[0045] (3) Search function for exam information Next, we will explain the test information search function in the support system 10. Figure 5 is a diagram illustrating the overview of the test information search for a target test standard in the support system 10.

[0046] Once the test standard to be used is determined, the server 100 searches for test information, including setting parameters to be applied to the test equipment 200 actually used in the test, and evaluation parameters that define the output method of the test results. This search for test information uses, for example, information on the "test standard," information on the "test machine model" to be used, methods related to the "test conditions," and information on the "evaluation items." Note that the information on the "test standard" may be entered by selecting from the list of test candidates proposed in the test standard search described in Figure 4.

[0047] The "test conditions" section includes more specific information, such as the type of test (e.g., "tensile," "compression," or "bending") in the case of a strength test, as well as the temperature of the test environment. The "evaluation items" section includes, for example, "elastic modulus," "tensile strength," and "yield point."

[0048] If this information is included in the user's input, the server 100 searches for information about the test specimens to be used in the test, the setting parameters for operating the test apparatus 200, and the evaluation parameters used to calculate the test results, based on the input information, by using a database stored in memory 120 or by applying an AI learning model. The server then outputs the test information obtained through the search to the terminal device 300. The user can change the presented parameters as needed within the allowed setting range.

[0049] Furthermore, once the parameters for the test apparatus 200 are determined, the server 100 transmits the determined parameter information to the test apparatus 200 upon instruction from the user. The test apparatus 200 then uses the transmitted parameter information to configure each component within the test apparatus 200. By configuring the parameters of the test apparatus 200 from the server 100 in this way, the user is eliminated from the need to manually input these parameters into the test apparatus 200, thus enabling efficient material testing.

[0050] (Example of implementation in a support system) An example of execution in the support system 10 will be explained using Figures 6 to 8.

[0051] (1) Search process for test standards Figure 6 illustrates an example of the sequence between the user and the server 100 during a test standard search.

[0052] Referring to Figure 6, first, in step 100 (hereinafter, step will be abbreviated as S), the user inputs, either by text or voice, that they want to perform a material strength test on the terminal device 300.

[0053] Since the user input information above lacks information on "components" and "materials," server 100, via S200, communicates to the user, both in text and voice, a response prompting them to input information about the components to be used in the test.

[0054] When the user responds to the inquiry from server 100 that the component is a "screw" (S110), server 100 then transmits a response to the user prompting them to input information about the material of the "screw" (S210).

[0055] In response, when the user inputs that the material of the "screw" is "metal" (S120), the server 100 searches the database or performs calculations using a learning model based on this information to extract candidate test standards. The server 100 then lists the extracted candidate test standards and displays them on the terminal device 300 (S220).

[0056] The user can select the target test standard based on the list of candidate test standards displayed on the terminal device 300 (S130).

[0057] (2) Search / set processing of test information Figure 7 is a diagram illustrating an example of the sequence between the user and the server 100 during test information retrieval.

[0058] Referring to Figure 7, the user inputs the target test standard into the terminal device 300 in S300. The test standard input may be automatically set based on the selection made in S130 in Figure 6.

[0059] Server 100 requests input regarding the model number of the test equipment 200 to be used for the test in S400. If Server 100 has information on the test equipment owned by the user, it may display the selectable test equipment models in a list format on Terminal Device 300. If the user owns only one test equipment, Server 100 may proceed to S410 without querying the user in S400.

[0060] In response to an inquiry from server 100 of S400, the user inputs information regarding the model number of the test equipment 200 to be used for the test into terminal device 300 at S310. For example, the model number of test equipment 200 is "AAA-1234".

[0061] Next, in S410, the server 100 prompts the user to input test conditions. When the user inputs the conditions "BB" and "CC" as test conditions, the server 100 prompts the user in S420 to select evaluation items to be output. At this time, the server 100 may display a list of outputtable evaluation items on the terminal device 300 (S330). As an example, the evaluation items may include "stress-strain diagram," "elastic modulus," "tensile strength," "elongation at break," and "yield point."

[0062] When the user selects an evaluation item (S330), the server 100 displays on the terminal device 300 the recommended values ​​for the setting parameters that are suitable for the test apparatus entered in S310, the evaluation parameters used for the evaluation calculation, and information about the test specimen (S430). The recommended values ​​for the setting parameters may be standard default values, or corrected values ​​that have been adjusted from the standard values ​​considering the test conditions etc. specified in S320. The server 100 then asks the user whether or not it is necessary to modify the displayed parameters.

[0063] In response, the user modifies the presented parameters as needed. If no modification is necessary, the user inputs that no modification is required into the terminal device 300, as in S340.

[0064] Once the user has completed input in S340, the server 100 prompts the user to execute the test in S440. If the user grants permission, the server 100 transmits the determined parameters to the test device 200 via the communication network 400. The actual execution of the test is carried out by user commands, not commands from the server 100 (S445).

[0065] Once the test using the test device 200 is complete, the server 100 retrieves the test results from the test device 200, processes the results as needed, and outputs them to the terminal device 300 (S450). In S350, the user can check the test results displayed on the terminal device 300.

[0066] In Figure 7, once the various parameters are determined, the test is executed (S440). However, if a test specimen is prepared according to the information presented in S430, the processing from S440 onwards may be executed at a different time.

[0067] (3) Test result display screen Figure 8 shows an example of test results displayed on the display screen of the terminal device 300. In the example in Figure 8, the upper left area 310 of the screen shows information about the test conditions. For example, the information about the test conditions includes the identification number of the test, the number of the test specimen, the material of the test specimen, and the model of the test equipment used for the test.

[0068] Additionally, the upper right area 320 of the screen displays a graph of the stress-strain diagram. The lower area 330 of the screen displays the calculated values ​​for the evaluation items specified: "elastic modulus," "tensile strength," "yield point," and "elongation at break."

[0069] Note that the example of test result display in Figure 8 is just one example, and the displayed content may change depending on the selected evaluation items. Also, if the target test standard is different, the items to be displayed will change accordingly.

[0070] By using the support system described above, even users with insufficient knowledge of materials testing can select the appropriate test standard and set test conditions suitable for the test equipment they will be using, without having to refer to complex manuals. Therefore, materials testing in accordance with the test standard can be performed efficiently. In particular, by using a generative AI that performs natural language processing to create an interactive input format, it is possible to make it easier for users to input the information they need to obtain, and to provide searchable information in a manner that is easy for users to understand.

[0071] [Note] Those skilled in the art will understand that the above-described exemplary embodiments are specific examples of the following embodiments.

[0072] (Article 1) A support system for material testing using a test apparatus according to one embodiment comprises a terminal device that receives input from a user, and a server that is connected to the terminal device and the test apparatus in a manner that enables communication. The server searches for and obtains standard information corresponding to the target test based on the input information from the terminal device, and provides said standard information to the user through the terminal device.

[0073] In the material testing system described in paragraph 1, the target test standard is searched based on user input information entered into the terminal device, and the specification information of the said test standard is provided to the user through the terminal device. Therefore, even if the user's knowledge of the test standard is insufficient, the user can appropriately select the target test standard and obtain test conditions in accordance with that test standard. This enables the efficient execution of material testing in accordance with the test standard.

[0074] (Article 2) In the support system described in Article 1, the server is configured to communicate with an external database in which standard information is stored, and retrieves the corresponding standard information by searching the external database using input information from the terminal device.

[0075] In the support system described in paragraph 2, the server can obtain standard information by searching an external database. By using an external database, the size of the server itself can be reduced.

[0076] (Article 3) In the support system described in Article 1, the server includes a memory device that stores a learning model that has been pre-learned to determine the relationship between input information and standard information. The server uses this learning model to obtain the corresponding standard information from the input information from the terminal device.

[0077] In the support system described in paragraph 3, the server can acquire standard information using a learning model stored on the server. Since the search process can be performed by the server alone, it can contribute to miniaturization of the entire system and speeding up processing.

[0078] (Section 4) In the support system described in Section 3, the server is configured to communicate with an external database in which standard information is stored. The server retrains the learning model based on at least one of the standard update information obtained from the external database and the technical information registered by the user.

[0079] In the support system described in paragraph 4, the learning model can be updated to the latest state by retraining it with additional information. Therefore, the user can be provided with the latest information regarding the test standards.

[0080] (Article 5) In the support system described in any one of Articles 1 to 4, the input information includes first information regarding the component to be tested, second information regarding the material of the component, and third information regarding the type of test to be performed. The standard information includes a list of standard candidates corresponding to the input information.

[0081] In the support system related to paragraph 5, a "standard candidate list" can be obtained by inputting three pieces of information: "information on the component to be tested," "information on the material of the component," and "information on the type of test."

[0082] (Article 6) In the support system described in Article 5, if any of the first information, second information, or third information is missing from the user's input information, the server shall request the user to input the missing information.

[0083] In the support system described in paragraph 6, if the minimum input information required for the search is insufficient, the user will be prompted to provide additional information, so even users with little knowledge of the test can obtain information on candidate standards.

[0084] (Section 7) In the support system described in Section 5 or 6, the standard information further includes test information corresponding to each standard included in the list of candidate standards.

[0085] In the support system described in paragraph 7, users can obtain further test information regarding the target test standard.

[0086] (Section 8) In the support system described in any one of Sections 1 to 4, the input information includes Section 4 information relating to the test standard to be used, Section 5 information relating to the test equipment used for the test, Section 6 information relating to the test conditions, and Section 7 information relating to the evaluation items in the test results. The standard information includes information relating to the test specimen used for the test, setting parameters of the test equipment, and at least one of the evaluation parameters used in calculating the test results.

[0087] In the support system related to paragraph 8, the setting parameters of the test equipment and the evaluation parameters of the test results can be obtained by inputting four pieces of information: "information on the test standards to be used," "information on the test equipment used for the test," "information on the test conditions," and "information on the evaluation items in the test results."

[0088] (Paragraph 9) In the support system described in Paragraph 8, if any of the information from the 4th, 5th, 6th, and 7th pieces of information is missing from the user's input information, the server shall request the user to input the missing information.

[0089] In the support system described in paragraph 9, if the minimum input information required for the search is insufficient, the user will be prompted to provide additional information, so even users with little knowledge of the test can obtain information on candidate standards.

[0090] (Clause 10) In the support system described in Clause 8 or 9, if the standard information includes setting parameters, the server shall output the acquired setting parameters to the test equipment used for the test.

[0091] In the support system described in paragraph 10, setting parameters can be sent from the server to the test equipment used for testing, thus eliminating the need for the user to manually input the parameters into the test equipment. Therefore, material testing can be performed efficiently.

[0092] (Clause 11) In the support system described in any one of Clauses 8 to 10, if the standard information includes evaluation parameters, the server shall output the acquired evaluation parameters to the test equipment used for the test.

[0093] In the support system described in paragraph 11, evaluation parameters can be transmitted and set from the server to the test equipment used for testing, thus eliminating the need for the user to manually input the parameters into the test equipment. Therefore, material testing can be performed efficiently.

[0094] (Section 12) In the support system described in Section 8, the server is configured to change the acquired configuration parameters and evaluation parameters according to the user's request, to the extent permitted by the test standard used.

[0095] In the support system described in paragraph 12, the user can modify the parameters obtained through server searches as needed, enabling efficient parameter setting and allowing the user to perform desired tests.

[0096] (Article 13) In the support system described in any one of Articles 5 to 12, the server includes an analysis module that performs natural language processing. The server performs natural language processing on the input information entered by the user and extracts information from the input information for use in searching.

[0097] In the support system described in paragraph 13, information for use in searches can be extracted by analyzing the text or voice input from the user, thereby reducing the user's input burden.

[0098] (Clause 14) In the support system described in any one of paragraphs 5 to 12, the server includes an analysis module that performs natural language processing. The server generates text containing the content of the standard information obtained by the search and provides it to the user through natural language processing.

[0099] In the support system described in paragraph 14, the information provided to the user is generated as text through natural language processing, so the user can easily understand the content of the standard information.

[0100] (Paragraph 15) In the support system described in any one of paragraphs 1 to 14, the terminal device includes a display device for displaying standard information output from the server.

[0101] In the support system described in paragraph 15, information provided by the server is displayed on the terminal device's display device, allowing the user to easily understand the presented information.

[0102] (Article 16) In the support system described in any one of paragraphs 1 to 14, The terminal device includes an audio output device for notifying standard information output from the server via voice.

[0103] In the support system described in paragraph 16, the information provided by the server is delivered as audio, so the user can easily understand the presented information.

[0104] (Clause 17) A server according to one embodiment is used in a support system for material testing using a test apparatus. The server comprises a memory in which a program is stored and a processor that executes the program stored in the memory. The server is communicatively connected to a terminal device that receives input from a user and to the test apparatus. Based on the input information from the terminal device, the server searches for and obtains standard information corresponding to the target test and provides the standard information to the user through the terminal device.

[0105] In the server described in paragraph 17, the target test standard is searched based on user input information entered into the terminal device, and the standard information of the said test standard is provided to the user through the terminal device. Therefore, even if the user's knowledge of the test standard is insufficient, the user can appropriately select the target test standard and obtain test conditions in accordance with that test standard. This enables the efficient execution of material tests in accordance with the test standard.

[0106] The embodiments disclosed herein should be considered in all respects to be illustrative and not restrictive. The scope of the present invention is indicated by the claims rather than by the description of the embodiments above, and all modifications within the meaning and scope equivalent to the claims are intended to be included. [Explanation of Symbols]

[0107] 10 Support system, 100 Server, 101 Input unit, 102 Analysis module, 103 Output unit, 104 Standard selection unit, 105 Test information setting unit, 106 Test data processing unit, 107 Storage unit, 108 Test equipment control unit, 110 Processor, 120 Memory, 130 Communication device, 140 Bus, 200 Test equipment, 300, 300A, 300B Terminal device, 310-330 Area, 400 Communication network, 450 External standard database.

Claims

1. A support system for material testing using a testing device, A terminal device that accepts input from users, The terminal device and the test device are connected to a server that can communicate with them, The server is a support system that searches for and obtains standard information corresponding to the target test based on input information from the terminal device, and provides said standard information to the user through the terminal device.

2. The support system according to claim 1, wherein the server is configured to communicate with an external database in which the standard information is stored, and the system searches the external database using the input information from the terminal device to obtain the corresponding standard information.

3. The server includes a storage device that stores a learning model that has been pre-learned the relationship between the input information and the standard information. The support system according to claim 1, wherein the server uses the learning model to obtain the corresponding standard information from the input information from the terminal device.

4. The server is configured to communicate with an external database in which the standard information is stored. The support system according to claim 3, wherein the server retrains the learning model based on at least one of the updated standard information obtained from the external database and the technical information registered by the user.

5. The input information includes first information relating to the component to be tested, second information relating to the material of the component, and third information relating to the type of test to be performed. The support system according to any one of claims 1 to 4, wherein the standard information includes a list of candidate standards corresponding to the input information.

6. The support system according to claim 5, wherein the server requests the user to input the missing information if any of the first information, second information, or third information is missing from the input information from the user.

7. The support system according to claim 5, further comprising test information corresponding to each standard included in the list of candidate standards.

8. The input information includes, 4. Information relating to the test standard to be used, 5. Information relating to the test equipment used for the test, 6. Information relating to the test conditions, and 7. Information relating to the evaluation items in the test results. The support system according to any one of claims 1 to 4, wherein the standard information includes at least one of the following: information about the test specimen used in the test, setting parameters of the test apparatus, and evaluation parameters used in calculating the test results.

9. The support system according to claim 8, wherein the server requests the user to input the missing information if any of the fourth information, fifth information, sixth information, and seventh information is missing from the input information from the user.

10. The support system according to claim 8, wherein the server outputs the acquired setting parameters to the test apparatus used for the test if the standard information includes the setting parameters.

11. The support system according to claim 8, wherein the server outputs the acquired evaluation parameters to the test apparatus used for the test if the standard information includes the evaluation parameters.

12. The support system according to claim 8, wherein the server is configured to change the acquired setting parameters and evaluation parameters according to the user's request, within the limits permitted by the test standard used.

13. The server includes an analysis module that performs natural language processing, The support system according to claim 1, wherein the server performs natural language processing on the input information entered by the user and extracts information from the input information for use in searching.

14. The server includes an analysis module that performs natural language processing, The support system according to claim 1, wherein the server generates a document containing the content of the standard information obtained by the search using natural language processing and provides it to the user.

15. The support system according to claim 1, wherein the terminal device includes a display device for displaying the standard information output from the server.

16. The support system according to claim 1, wherein the terminal device includes an audio output device for notifying the standard information output from the server by voice.

17. A server used in a support system for material testing using a testing device, The memory in which the program is stored, The system comprises a processor that executes the program stored in the memory, The server is connected to a terminal device that accepts input from a user and the test device so as to be able to communicate with them. The aforementioned server, Based on the input information from the terminal device, the system searches for and retrieves the standard information corresponding to the target test. A server that provides the user with the standard information through the aforementioned terminal device.

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