Self-aligning back-surface contact lenses

Self-aligned back-side contacts for nanosheet transistors are achieved through selective etching and epitaxial growth, addressing process variations and enhancing source/drain growth, thus improving transistor array performance and integration.

JP2026522184APending Publication Date: 2026-07-07INTERNATIONAL BUSINESS MACHINE CORPORATION

Patent Information

Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
INTERNATIONAL BUSINESS MACHINE CORPORATION
Filing Date
2024-06-17
Publication Date
2026-07-07

AI Technical Summary

Technical Problem

Conventional placeholder fabrication techniques for nanosheet transistor structures introduce undesirable process variations when forming transistor arrays with different gate pitches, leading to insufficient source/drain growth near the lower channel.

Method used

The development of self-aligned back-side contacts for nanosheet transistor structures using placeholder fabrication techniques that avoid undesirable process variations, achieved through selective etching and epitaxial growth of sacrificial nanosheets with varying germanium concentrations, followed by the formation of self-aligned placeholders with controlled gate pitches.

Benefits of technology

Enables the formation of self-aligned back-side device contacts without process variations, enhancing source/drain growth and reducing contact resistance, thereby improving the performance and integration of nanosheet transistor arrays.

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Abstract

A semiconductor structure comprising a first transistor having a first placeholder and a first gate pitch, and a second transistor having a second placeholder and a second gate pitch, wherein the first gate pitch is smaller than the second gate pitch, and the first placeholder is smaller than the second placeholder.
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