Test mechanism and method for determining the optimal distance between the device under test and the antenna of the test mechanism.

Abstract

A method and test mechanism for determining the optimized distance between the device under test and the antenna of the test mechanism are presented. The method includes obtaining first measurement data, obtaining second measurement data, and determining the optimized distance between the device under test and the antenna of the test mechanism based on the first and second measurement data. The first measurement data represents a set of far-field measurement results characterizing the device under test for a set of frequencies, or the first measurement data is based on a set of far-field measurement results characterizing the device under test for a set of frequencies. The second measurement data represents a set of near-field measurement results characterizing the device under test for a set of frequencies, or the second measurement data is based on a set of near-field measurement results characterizing the device under test for a set of frequencies. At least two of the near-field measurement results are obtained at different distances between the device under test and the antenna of the test mechanism.

Description

Technical Field

[0001] Embodiments according to the present invention relate to a test mechanism and method for determining an optimized distance between a device under test and an antenna of a test mechanism, particularly using measurement data in the near field and far field.

[0002] Embodiments according to the present invention relate to procedures and algorithms for defining an optimal (or optimized) distance between a device under test (DUT) and a measurement antenna on a wireless (OTA: Over The Air) socket.

Background Art

[0003] Background of the Invention With the progress of wireless communication and the increasing use of wireless devices, it is necessary to accurately and efficiently test devices that radiate and / or receive electromagnetic fields. The electromagnetic field of a device under test includes the near field and the far field. The near field of a device under test can be affected by many factors such as resonance effects, radiation and / or reception wavelengths, the design of the antenna structure, and the material of the test mechanism (e.g., metal). As a result, near-field testing can be highly dependent on the distance between the device under test and the antenna of the test mechanism. To determine the optimal distance from simulations, many parameters need to be considered, which can be time-consuming. Therefore, there is a need for a test mechanism that improves the trade-off between test accuracy, test complexity, and test efficiency.

[0004]

Summary of the Invention

Means for Solving the Problems

[0005] One embodiment of the present invention is directed to a method for determining an optimized (e.g., sufficiently practical, optimal, or ideal) distance between a device under test (e.g., Antenna-in-Package) and an antenna of a test mechanism. The method includes acquiring first measurement data (e.g., reference far-field data). The first measurement data is obtained as the distance between the device under test and the measuring antenna (e.g., Fraunhofer distance (d)). F =2D 2 / λ, where D is the maximum dimension of the radiator or the diameter of the sphere surrounding the radiator or antenna, and λ represents multiple far-field measurements (e.g., power measurement results and / or gain measurement results and / or gain step measurement results and / or gain compression measurement results and / or phase shift measurement results and / or flatness measurement results and / or error vector amplitude measurement results and / or separation measurement results and / or spurious emission measurement results and / or adjacent channel leakage power ratio measurement results and / or IP3 measurement results and / or noise figure measurement results) that characterize the device under test for a set of frequencies (e.g., multiple frequencies) (e.g., including 10, 10, or 12 frequencies) based on measurements at the operating wavelength (e.g., wavelength at the minimum operating wavelength or maximum operating wavelength or average operating wavelength or average operating frequency) (e.g., greater than 10 mm), or the first measurement data is based on multiple far-field measurements characterizing the device under test for a set of frequencies. The method further comprises obtaining second measurement data (e.g., measurement data for different distances x to which near-field conditions between the device under test and the antenna of the test mechanism apply) (e.g., generated by the antenna of the device under test). The second measurement data represents a set of near-field measurements (e.g., a set of multiple near-field measurements associated with different distances) that characterize the device under test for a set of frequencies (e.g., measured at distances within the "Fraunhofer distance" between the device under test and the antenna of the measurement mechanism) (where the antenna of the measurement mechanism used to obtain the near-field measurements may be different from or identical to the measurement antenna used to obtain the far-field measurements), or the second measurement data is based on a set of near-field measurements (e.g., measured at distances within the "Fraunhofer distance" between the device under test and the antenna of the measurement mechanism) that characterize the device under test for a set of frequencies (e.g., measured at distances within the "Fraunhofer distance" between the device under test and the antenna of the measurement mechanism).At least two of the near-field measurement results (or at least two sets of near-field measurement results) are obtained at different distances (in 1 mm step increments) within the range of 20 mm to 40 mm between the device under test and an antenna of the test institution (the antenna of the test institution may be the same as the measurement antenna used to obtain the far-field measurement results or may be different from the antenna used to obtain the far-field measurement results). The method includes determining an optimized distance between the device under test and the antenna of the test institution based on the first measurement data and the second measurement data (e.g., based on a comparison between the first measurement data and the second measurement data) (e.g., considering measurement data at different frequencies).

[0006] It is recognized that the first measurement data provides measurement data obtained from a far-field measurement, and thus has fewer factors affecting the measured value based on the distance between the device under test and the antenna of the test institution. For example, the effect of resonance becomes smaller so that the first measurement data provides a less distorted reference for the device under test. It is recognized that the resonance effect is associated with the wavelength of the near field. Therefore, obtaining the first measurement data representing a set of frequencies or based on a set of frequencies provides a reference that can cover more frequencies, and thus increases the likelihood of determining an optimal distance that is less affected by the resonance effect. The second measurement data is obtained from the near field for a set of frequencies. The set of frequencies can be used as a common link between the first measurement result and the second measurement result, thereby allowing comparison of the far-field measurement value reference with the second measurement data representing or based on the near-field measurement value. It is recognized that when at least two near-field measurement results are obtained at different distances between the device under test and the antenna of the test institution, comparable first measurement data and second measurement data for a set of frequencies can be realized for each distance. Thus, based on the far-field measurement reference, an optimized distance can be determined from two (or more) distances for near-field measurement.

[0007] The optimized distance can be determined from measurements of the test mechanism, rather than by other means such as simulation. Therefore, the optimized distance can be determined without considering potential external factors that may affect near-field measurements. Thus, this method reduces or eliminates the need for complex and resource-intensive simulations of standing wave effects to define the optimized distance between the device under test (e.g., the DUT antenna array of an AiP) and the OTA measurement antenna. Because this method is less dependent on the test mechanism, it can be implemented with various types and models of test mechanisms. As a result, testing can be performed by different users (e.g., with different or new test mechanisms) without determining device-specific characteristics that may affect the near-field. Near-field testing allows for more compact test mechanisms, facilitating low-cost and / or high-capacity over-the-air (OTA) multi-site testing. Because the test mechanism itself can perform the measurements, this method can be implemented with many existing test mechanisms, or by adding test equipment (e.g., a stage supporting the antenna) to an existing test mechanism. Certain handler models that can be used in mass production testing, which involve measurements at short distances (for example, less than 40 mm or less than 30 mm depending on the specific handler model used in mass production testing), can be more reliably used at optimized distances that facilitate mass production testing. At such short distances, a user may have, for example, a measuring antenna with an antenna array transmitting at a certain frequency and a metal component receiving on it (or vice versa). In such a situation, at a certain distance between the antenna (array) of the device under test (DUT of the AiP) and the measuring antenna, for example, resonant waves may exist, which may reduce the measured power at those frequencies. By determining the optimized distance, standing waves can be reduced or avoided in tests using such metal components and frequencies. This method can improve testing of new 5G-enabled devices because it supports high frequencies such as the 5G frequency band.

[0008] This disclosure proposes a method (e.g., procedure and / or algorithm) for determining or finding an ideal or optimized distance between, for example, an antenna in a package antenna array and, for example, a measuring antenna in a radiating near-field socket, for over-the-air (OTA) testing using automated testing equipment (ATE). Such an ideal or optimized distance is based, for example, on the characteristics of the (measuring) antenna's AiP antenna array and, for example, the test program, in particular, the specific frequency being tested. This disclosure can be implemented, for example, as a hardware setup (e.g., a test mechanism or its test equipment) and an algorithm for automatically determining this optimized distance. This method (e.g., procedure / algorithm) is, for example, one of the important parts for the successful design and implementation of radiating near-field sockets (e.g., device sockets) or modification kits (e.g., test equipment) for low-cost, high-capacity over-the-air (OTA) multi-site testing. This procedure or method is, for example, independent of the ATE platform. This method may be used, for example, to perform measurements using an entire application setup including the device under test (e.g., the DUT's AiP, OTA measurement antenna) and a test program (e.g., a target test program (e.g., having multiple test frequencies)) to automatically determine, for example, the distance from the optimized AiP DUT antenna array to the OTA measurement antenna within a maximum limit set by a handler mechanism.

[0009] According to one embodiment, determining the optimized distance involves comparing one or more values ​​(e.g., a first set of values) of second measurement data (e.g., measurement data associated with different frequencies) obtained for a first distance between the device under test and the antenna of the measurement mechanism, or associated with a first distance between the device under test and the antenna of the measurement mechanism, with one or more corresponding values ​​(e.g., a set of far-field measurement data associated with different frequencies) of first measurement data (e.g., a set of far-field measurement data associated with different frequencies), and obtaining a second comparison result (e.g., a correlation value that describes the similarity between second measurement data obtained for a second distance and the first measurement data) between the device under test and the antenna of the measurement mechanism. The method includes comparing one or more values ​​(e.g., a second set of values) of second measurement data (e.g., measurement data associated with different frequencies) obtained for a second distance between or associated with a second distance between the device under test and the antenna of the measurement mechanism with one or more corresponding values ​​of first measurement data (e.g., a set of far-field measurement data associated with different frequencies), and determining an optimized distance based on the first and second comparison results (e.g., for each distance (and selectively for each frequency), one or more values ​​of the first measurement data or one or more values ​​derived from the first measurement data with one or more values ​​of the second measurement data or one or more values ​​derived from the second measurement data (e.g., forming a scalar difference or a difference vector, determining a norm or difference vector, or determining a correlation)).

[0010] Therefore, this method makes it possible to improve test parameters related to reception of the device under test. The first comparison result makes it possible to evaluate the quality of the near-field measurement result at a first distance by using the far-field measurement as a comparison criterion. As a result, the first comparison result has information that makes it possible to determine how much the near-field measurement at the first distance deviates from the far-field measurement. Similarly, the second comparison result has information that makes it possible to determine how much the near-field measurement at the second distance deviates from the far-field measurement. Since the first and second measurements are associated with the first and second distances, the first and second comparison results make it possible to determine which of the first and second distances deviates less from the criterion and is suitable as the optimized distance. The optimized distance thus determined can avoid or reduce the effects of resonance.

[0011] According to one embodiment, the first measurement data and the second measurement data, or at least one of the values ​​of the first measurement data and the second measurement data, are obtained based on the wireless transmission of a signal by the device under test, or when the device under test is transmitting a signal wirelessly (for example, to a test mechanism for the first and / or second measurement or another test mechanism, for example, to the antenna of the device under test).

[0012] Therefore, this method can determine an optimized distance based on the transmission characteristics of the device under test. This method can be performed based on first and second measurement data based on wireless transmission. Therefore, this method does not require measurements performed during this method and can be performed based on far-field measurement results measured at some point in the past (for example, in the same test apparatus or a further test apparatus). However, this method can be used directly while (or immediately after) the measurements of the first and / or second measurement data are being performed.

[0013] According to one embodiment, one or more values ​​of the first measurement data are: a power value (determined, for example, in milliwatts or dBm units, using an evaluation of the signal received by the antenna of the measurement mechanism); a gain value (determined, for example, in decibel units, using an evaluation of the signal received by the antenna of the measurement mechanism); a gain step value (determined, for example, in decibel units, using an evaluation of the signal received by the antenna of the measurement mechanism); a gain compression value (determined, for example, at the 1 dB compression point (P1 dB), using an evaluation of the signal received by the antenna of the measurement mechanism); and a phase shift value (determined, for example, in degrees units, using an evaluation of the signal received by the antenna of the measurement mechanism) (e.g., beamfoil). The measurement includes at least one of the following: phase shift during spectroscopy, gain flatness value (determined, for example, using an evaluation of the signal received by the antenna of the measurement mechanism), error vector amplitude value (determined, for example, in dBc units, using an evaluation of the signal received by the antenna of the measurement mechanism), separation value (determined, for example, the degree of separation between different polarization directions, for example, using an evaluation of one or more signals received by the antenna of the measurement mechanism), spurious value (determined, for example, showing spurious radiation, for example, using an evaluation of the signal received by the antenna of the measurement mechanism), and adjacent channel leakage power ratio value (determined, for example, using an evaluation of the signal received by the antenna of the measurement mechanism). One or more values ​​of the second measurement data include at least one of the following: power value (e.g., in milliwatts or dBm units), gain value (e.g., in decibels units), gain step value (e.g., in decibels units), gain compression value (e.g., 1 dB compression point (P1 dB)), phase shift value (e.g., in degrees units) (e.g., phase shift during beamforming), gain flatness value, error vector amplitude value (e.g., in dBc units), separation value (e.g., degree of separation between different polarization directions), spurious value (e.g., indicating spurious radiation), and adjacent channel leakage power ratio value (or any other metric measurable using the antenna).

[0014] These values ​​may reflect resonance effects and therefore can form the basis for determining the optimized distance for transmission of the device under test. Thus, this method is compatible with multiple measurable parameters. Furthermore, since resonance effects may be reflected in the deviation of multiple measurable parameters, the optimized distance can be determined by measuring one parameter (e.g., a parameter strongly affected by resonance effects and / or a parameter that the test equipment can measure with high accuracy), and then the optimized distance can be used to measure different parameters in further tests.

[0015] According to one embodiment, the first measurement data and the second measurement data, or at least one of the values ​​of the first measurement data and the second measurement data, are obtained based on the wireless reception of a signal by the device under test, or when the device under test is receiving a signal wirelessly (for example, from a test mechanism for the first and / or second measurement or another test mechanism, for example, from the antenna of the test mechanism).

[0016] Therefore, the first and second measurement data can be obtained during the method or before the method is performed. Since these values ​​are measured by the test mechanism, the optimized distance determined from these values ​​is suitable for future measurements of those values.

[0017] According to one embodiment, one or more values ​​of the first measurement data are: power value (for example, in milliwatts or dBm units, measured by the device under test or a test device connected to the device under test), gain value (for example, in decibel units, measured by the device under test or a test device connected to the device under test), gain step value (for example, in decibel units, measured by the device under test or a test device connected to the device under test), tertiary intercept point value (for example, in dBm units, measured by the device under test or a test device connected to the device under test), and (for example, in degrees units). For example, this includes one or more values ​​from the following: phase shift value (e.g., phase shift during beamforming) (measured by the device under test or a test apparatus connected to the device under test), gain flatness value (e.g., in decibels, measured by the device under test or a test apparatus connected to the device under test), error vector amplitude value (e.g., measured by the device under test or a test apparatus connected to the device under test), separation value (e.g., measured by the device under test or a test apparatus connected to the device under test), and noise figure value (e.g., measured by the device under test or a test apparatus connected to the device under test). One or more values ​​of the second measurement data include one or more of the following: power value (e.g., in milliwatts or dBm units), gain value (e.g., in decibels units), third-order intercept point value, phase shift value (e.g., in degrees units) (e.g., phase shift during beamforming), gain flatness value, error vector amplitude value (e.g., in dBc units), separation value (e.g., degree of separation between different polarization directions), and noise figure value (or any other metric measurable using the antenna).

[0018] These values ​​allow for the determination of an optimized distance based on parameters related to the reception of the device under test. The optimized distance may be optimized, for example, to test the reception of the device under test. This method can be adapted to multiple measurable parameters. Furthermore, since resonance effects can be reflected in the deviations of multiple measurable parameters, the optimized distance can be determined by measuring one parameter (e.g., a parameter strongly affected by resonance effects and / or a parameter that the test mechanism can measure with high precision), and then the optimized distance can be used to measure different parameters.

[0019] According to one embodiment, the second measurement data includes a first set of near-field measurement result values ​​associated with a first distance between the device under test and the antenna of the test mechanism (for example, obtained for the first distance between the device under test and the antenna of the test mechanism) (where, for example, the values ​​of the first set of near-field measurement result values ​​are associated with different frequencies and, for example, determined for different frequencies). The second measurement data includes a second set of near-field measurement result values ​​associated with a second distance between the device under test and the antenna of the test mechanism (for example, obtained for the second distance between the device under test and the antenna of the test mechanism) (where, for example, the values ​​of the second set of near-field measurement result values ​​are associated with different frequencies and, for example, determined for different frequencies) (where, for example, the values ​​of the first set of near-field measurement result values ​​may correspond to the values ​​of the second set of near-field measurement result values, except that the values ​​of the first set of measurement result values ​​are determined for a first distance, and the values ​​of the second set of near-field measurement result values ​​are determined for a second distance). The optimized distance is determined based on the deviation between the set of near-field measurement results and the (corresponding) set of far-field measurement results (included in the first measurement data), where the set of far-field measurement results can be considered as reference far-field data.

[0020] As a result, the first set of near-field measurement values ​​relates to the first distance, and the second set of near-field measurement values ​​relates to the second distance. Each set of values ​​defines a set that can be statistically processed, and the deviation determined for each set allows us to determine how much the near-field measurements are affected by the resonance effect and how much they deviate from values ​​that are not affected. Therefore, the deviation determined for each set makes it possible to determine distances that are less affected by the resonance effect or are not affected at all, and facilitates the determination of an optimized distance.

[0021] According to one embodiment, the optimized distance is determined using a plurality of far-field measurements associated with different frequencies (e.g., a set of frequencies) and corresponding near-field measurements (also associated with different frequencies (e.g., a set of frequencies)).

[0022] Corresponding frequencies provide a more accurate link for comparing near-field and near-field measurement results. Since near-field and far-field measurement results can be associated with the same set of frequencies, comparisons between near-field and far-field measurement results become more accurate.

[0023] According to one embodiment, determining the optimized distance involves averaging (e.g., unweighted or weighted) the differences between a number of far-field measurements associated with different frequencies (e.g., a set of frequencies) and the corresponding near-field measurements (also associated with different frequencies (e.g., a set of frequencies)).

[0024] Averaging the differences between multiple far-field measurements and their corresponding near-field measurements provides a measure of the deviation between near-field and near-field measurements. Since deviations can be caused by resonance effects, the average of the differences can indicate how significant the resonance effect is at each distance. A weighted average can increase or decrease the contribution of significant deviations to the mean, thereby facilitating the identification of deviations or reducing the impact of random deviations.

[0025] According to one embodiment, the optimized distance is determined such that the difference between the far-field measurement result and the corresponding near-field measurement result is less than a predetermined maximum deviation for all frequencies in the frequency set, or the optimized distance is determined such that the difference between the far-field measurement result and the corresponding near-field measurement result is less than or equal to a predetermined maximum deviation for all frequencies in the frequency set.

[0026] A predetermined maximum deviation serves as a threshold for determining the severity of the difference between near-field and far-field measurement results. If one or more optimized distances can be determined to have a difference lower than the predetermined maximum deviation, the method may include further selection criteria, or the user may select distances that are better suited, for example, to the test parameters (or the test capability of the test mechanism). Furthermore, multiple distances with differences lower than the predetermined maximum deviation may indicate a test system with low overall resonance effects, which can lead to more reproducible results. If there are few or no distances with differences lower than the predetermined maximum deviation, it may indicate high resonance effects, which may warn of the risk of less reproducible results and suggest adjustment of the test parameters.

[0027] According to one embodiment, the optimized distance is determined such that the difference between a near-field measurement result or a far-field measurement result and the corresponding near-field measurement result does not exhibit a resonance effect (for example, exceeding a predetermined maximum deviation) for all frequencies in the set of frequencies (for example, the presence of a resonance effect can be recognized by comparing the near-field measurement result for a given frequency and multiple distances with the mean value of the near-field measurement results for a given frequency and multiple distances, and a deviation from the mean value greater than a given threshold may be recognized as a resonance effect) (for example, avoiding distances where a significant resonance effect exists that significantly degrades the near-field measurement result at at least one frequency in the set of frequencies)).

[0028] Determining an optimized distance based on resonance effects provides further determinable indicators. For example, resonance effects can be defined by periodicity (which is wavelength-dependent) and the distinct formation of minimums and maximums that depend on the measurement. For example, resonance effects can be identified based on the direction (e.g., sign) or degree (e.g., magnitude) of the deviation. These additional indicators improve the identification of resonance effects and thus allow for the determination of an optimized distance where resonance effects are less likely to occur or do not occur at all.

[0029] According to one embodiment, the method includes determining a single distance, which is used for all frequencies in a set of frequencies (resulting in acceptable near-field measurement results for all frequencies in the set of frequencies), as an optimized distance.

[0030] An optimized single distance facilitates test automation (e.g., requires no selection parameters or user selection). Using a single distance instead of multiple distances (e.g., for a specific frequency band) improves test efficiency and comparability. Because a single optimized distance is determined for a set of frequencies, the measurements are less likely to have asymmetric behavior across the entire frequency set.

[0031] According to one embodiment, the method includes using a test program for manufacturing tests to acquire first measurement data.

[0032] The manufacturing test program can automate the determination of optimized distances, which can then be used to perform further measurements. As a result, testing can be conducted more efficiently. Furthermore, it allows for more reliable and reproducible testing by different users while reducing the risk of user error.

[0033] According to one embodiment, the method includes running a manufacturing test program that controls the testing of the device under test (preferably returning one or more measurement results for each frequency) for multiple test frequencies and multiple distances (e.g., the distance between the device under test and the antenna of the test mechanism) to obtain second measurement data. For example, the manufacturing test program is set and executed by a linear stage (e.g., 20 mm to 40 mm in 1 mm steps) for each distance between the device under test and the antenna of the test mechanism (e.g., the distance from the DUT antenna array of the AiP to the OTA measurement antenna). The results (e.g., measurement results) of each test (e.g., each run, e.g., each test for each distance) may be stored, including (e.g., measurement) results for different measurement frequencies (e.g., frequencies from a set of frequencies).

[0034] Such manufacturing test programs extend the aforementioned advantages related to test efficiency, reliability, and reproducibility to the process of performing measurements to obtain secondary measurement data.

[0035] According to one embodiment, the method includes using a test program of a manufacturing test that is repeated one or more times with a changed distance between the device under test and the antenna of the test mechanism in order to determine an optimized distance, or the method includes using a test program of a manufacturing test that is supplemented by a function that results in repetition (e.g., of a test flow) and a change in the distance between the device under test and the antenna of the test mechanism in order to determine an optimized distance. For example, after the last distance measurement is completed (e.g., at the end of the entire measurement cycle), the results for each distance value (e.g., the measurement result or a value based thereon) may be compared to one or more common distance values ​​for all frequencies to be measured (e.g., a set of frequencies) that do not land in a resonant situation (e.g., do not show resonant effects or standing waves).

[0036] Therefore, the manufacturing test program can be run more efficiently by assisting in controlling the change in distance. The second measurement data forms a basis for determining the optimized distance, and further tests can be performed using this optimized distance, thereby improving the accuracy of these further tests.

[0037] According to one embodiment, the method includes changing the distance between the device under test and the antenna of the test mechanism during a measurement to obtain near-field measurement results (where, for example, the distance is changed using an actuator (e.g., an electric actuator) that can change the position of the antenna of the test mechanism; where, for example, the method includes generating a control signal for the actuator that changes the position of the antenna of the test mechanism).

[0038] The use of actuators enables a simple design that requires only one actuator-driven antenna to achieve different distances. Such actuators can be provided for existing test mechanisms (e.g., in the form of test equipment) to improve the compatibility of the methods disclosed herein.

[0039] According to one embodiment, the method includes stepwise changing the distance between the device under test and the antenna of the test mechanism (for example, using equal and / or fixed steps).

[0040] By gradually changing the distance, it becomes easier to efficiently and reproducibly position the antenna at the distance required for the second measurement data. This stepwise approach is compatible with the iteration of the test program and makes it easier to determine whether the test has been performed for all desired distances.

[0041] According to one embodiment, the method includes determining a subset of second measurement data that has the greatest similarity to the first measurement data from among a plurality of subsets of second measurement data associated with different distances, and determining an optimized distance based on that subset.

[0042] Maximum similarity is a criterion that can be defined in various mathematical algorithms and processes (e.g., processes for fitting measurements, using metrics to determine differences between measurements, determining variance, applying distance and / or frequency-specific weights, determining similarity in the frequency domain), allowing for a customizable criterion that can be efficiently executed by programs. Furthermore, distances with low or no resonance effects tend to have a high similarity to the initial measurement data and can therefore be used as an optimized distance metric.

[0043] According to one embodiment, the method further extends to each frequency in the set of frequencies (for example, S 11 Maximum values ​​of the scattering parameters and / or S 21 This involves determining the distance at which standing wave behavior occurs (at the minimum value of the scattering parameter), and the optimized distance is determined from the distance at which standing wave behavior does not occur or is minimal.

[0044] Determining distance based on standing wave behavior provides further indicators that enable testing of optimized distances. For example, scattering parameters may exhibit local maxima or minimums depending on the presence of standing waves. Therefore, identifying such maxima or minimums forms the basis for determining standing waves, and thus allows for the determination of optimized distances (where there are few or no standing waves).

[0045] According to one embodiment, the method may further include generating a control signal for controlling the movement of a stage (e.g., a linear stage) (e.g., equipped with a motor) that supports the antenna of the test mechanism. The control signal moves the stage to at least two of different distances (e.g., by driving the motor). Alternatively, the movement of the stage may be controlled manually.

[0046] The control signal allows for the control of the stage's movement, and therefore the control of the distance between the device under test and the antenna of the test mechanism. The control signal can be used directly with a linear stage or motor, making the measurement of second measurement data easy and rapid.

[0047] One embodiment of the present invention is directed to a method for testing multiple devices under test. The method includes determining an optimized distance between the devices under test and the antenna of a test mechanism using a method such as that disclosed herein. The optimized distance is determined using a manufacturing test program in which a changed distance between the devices under test and the antenna of the test mechanism is repeated one or more times to determine the optimized distance, or the optimized distance is determined using a manufacturing test program in which iterations (e.g., of a test flow) and functions that result in changes in the distance between the devices under test and the antenna of the test mechanism are used to determine the optimized distance. The method includes testing multiple devices under test using a manufacturing test program, wherein the distance between the devices under test is kept constant at a predetermined optimized distance.

[0048] This method automates the steps of determining the optimized distance, changing the distance, and testing multiple devices. Therefore, a manufacturing test program can determine the optimized distance using the first device under test, and then test further devices using that optimized distance. Since the optimized distance is determined in the near-field, testing of multiple devices can also be performed in the near-field, which facilitates high-volume testing (e.g., with a more compact setup) and allows the use of handler models used in high-volume testing in the near-field.

[0049] One embodiment of the present invention is directed to a computer program for performing the method described herein when the computer program is run on a computer (or a computer program product that includes instructions causing one or more processors to perform the method described herein).

[0050] This program can be run on different test chambers (e.g., new test chambers, existing test chambers, or test chambers of different users), thereby improving compatibility with available test chambers. Furthermore, the computer program can realize the advantages of the method disclosed herein.

[0051] One embodiment of the present invention is directed to a test mechanism (e.g., a test system or automated test apparatus) for determining an optimized distance between the device under test (e.g., an antenna-in-package) and the antenna of the test device. The test mechanism is configured to obtain first measurement data (e.g., reference far-field data) (e.g., the test mechanism may determine the first measurement data itself, or may receive the first measurement data from an external source, for example, if the far-field measurement is performed in a different measurement environment). The first measurement data characterizes the device under test for a set of frequencies (e.g., for multiple frequencies) (including, for example, frequencies 10, 11, or 12) (e.g., in the frequency range from 24 GHz to 53 GHz) (e.g., the distance between the device under test and the Fraunhofer distance (d F =2D2 / λ, where D is the maximum dimension of the radiator or the diameter of the sphere surrounding the radiator or antenna, and λ is the wavelength of use (e.g., the wavelength at the minimum or maximum wavelength of use or the average wavelength of use or the average frequency of use). The first measurement data represents multiple far-field measurement results (e.g., power measurement results and / or gain measurement results and / or gain step measurement results and / or gain compression measurement results and / or phase shift measurement results and / or flatness measurement results and / or error vector amplitude measurement results and / or separation measurement results and / or spurious emission measurement results and / or adjacent channel power leakage ratio measurement results and / or IP3 measurement results and / or noise figure measurement results) based on measurements at a distance greater than (e.g., greater than 10 mm) from the measuring antenna, or the first measurement data is based on multiple far-field measurement results characterizing the device under test for a set of frequencies. The test apparatus is configured to obtain second measurement data (e.g., measurement data for different distances x to which near-field conditions apply between the device under test and the antenna of the test apparatus) (e.g., generated by the antenna of the test apparatus). The second measurement data represents a set of near-field measurements (e.g., a set of multiple near-field measurements associated with different distances) (measured at the distance between the device under test and the antenna of the measurement apparatus which is within the “Fraunhofer distance”) that characterizes the device under test for a set of frequencies (where the antenna of the measurement apparatus used to obtain near-field measurements may be different from or identical to the measurement antenna used to obtain far-field measurements), or the second measurement data is based on a set of near-field measurements (e.g., measured at the distance between the device under test and the antenna of the measurement apparatus which is within the “Fraunhofer distance”) that characterizes the device under test for a set of frequencies (e.g., a set of multiple near-field measurements associated with different distances).At least two near-field measurement results (or at least two sets of near-field measurement results) are obtained at different distances (in the range of 20 mm to 40 mm) between the device under test and the antenna of the test mechanism (in 1 mm step increments) (wherein the antenna of the test mechanism may be the same as the measurement antenna used to obtain the far-field measurement results, or it may be different from the antenna used to obtain the far-field measurement results). The test mechanism is configured to determine an optimized distance between the device under test and the antenna of the test mechanism based on the first and second measurement data (for example, based on a comparison between the first and second measurement data) (for example, taking into account the measurement data at different frequencies).

[0052] Therefore, it is possible to provide a test mechanism that can solve the above problems and offer the advantages described herein.

[0053] According to one embodiment, the test mechanism further comprises a device socket configured to receive a device under test. The test mechanism is configured to perform a number of tests when the device under test is placed in the device socket in order to obtain near-field measurement results for a set of frequencies. At least two of the tests are performed at different distances between the device under test and the antenna of the test mechanism in order to obtain near-field measurement results for at least two different distances.

[0054] The socket allows for the insertion and positioning of the device under test so that near-field measurement results can be obtained accurately and efficiently. Furthermore, the socket facilitates communication between the device under test and the test mechanism (e.g., its signal source and / or signal receiver) for, for example, controlling the device under test (e.g., the emission of electromagnetic waves by the device under test) and / or receiving signals from the device under test (e.g., regarding electromagnetic waves received by the device under test).

[0055] According to one embodiment, the test mechanism further comprises a stage (e.g., a motorized) (e.g., a linear stage) configured to support the antenna of the test mechanism and move (e.g., by motor operation) to at least two different distances relative to the device socket. For example, the linear stage may have a motor controlled by the test mechanism (e.g., an ATE measurement system) configured to move the antenna relative to the device under test and / or the device socket (e.g., configured to move the antenna distance with respect to the DUT antenna array of the AiP). The test mechanism may include a control circuit (e.g., an auxiliary circuit) for controlling the stage (e.g., the motor of the stage). The test mechanism may be configured to supply power to the motor (e.g., via a control circuit or a separate power supply circuit). For example, an auxiliary circuit for controlling the motor (e.g., a commercially available motor control integrated circuit) may be mounted on a carrier structure (e.g., a DUT test fixture or load board). The test mechanism may include a digital channel / resource for controlling or programming the motor's control circuit and / or a power channel / resource configured to supply power to the motor. In other words, for example, the digital channels / resources of the ATE system may be used to program, for example, a motor controller integrated circuit (IC), and / or for example, the power channels / resources of the ATE system may be used to supply, for example, the power required for a motor.

[0056] The stage facilitates the positioning of the antenna for performing measurements at different distances, allowing the device under test (and optionally any further devices under test) to be positioned at the determined, optimized distance. A motor controllable by the test mechanism facilitates the automation of distance changes, and thus near-field and / or far-field measurements.

[0057] According to one embodiment, the test mechanism further comprises a far-field test apparatus configured to perform tests on a set of frequencies under far-field conditions (for example, at a sufficiently large distance between the antenna of the test mechanism and the device under test) in order to obtain first measurement data.

[0058] The far-field testing apparatus enables the determination of first measurement data that serves as reference data. The testing apparatus can be attached to existing testing mechanisms, thereby improving compatibility between the methods disclosed herein and the testing mechanisms.

[0059] According to one embodiment, the test mechanism further comprises a data interface (for example, for user input or data input) configured to receive first measurement data and / or second measurement data (determined, for example, by an apparatus other than the test mechanism).

[0060] The data interface allows for the measurement of first and / or second measurement data at different times and / or using different test mechanisms. Therefore, measurements can be scheduled and executed more flexibly (e.g., by the manufacturer of the device under test), thereby improving the efficiency of methods and further testing.

[0061] According to one embodiment, the test mechanism is configured to perform a method as disclosed herein.

[0062] Therefore, the testing apparatus can solve the problems described herein and provide advantages in the context of the method. [Brief explanation of the drawing]

[0063] The drawings are not necessarily to scale, and instead, the focus is generally on illustrating the principles of the present invention. In the following description, various embodiments of the present invention will be described with reference to the following drawings. [Figure 1]Figure 1 is a perspective view of an example of a test mechanism equipped with the device under test. [Figure 2] Figure 2 is a close-up perspective view of the test mechanism and the device under test shown in Figure 1. [Figure 3] Figure 3 is a perspective view showing an example of a device under test relative to the antenna of a test mechanism. [Figure 4] Figure 4 is a rear perspective view of the test mechanism shown in Figures 1 and 2. [Figure 5] Figure 5 is a perspective view of an example of a test mechanism. [Figure 6A] Figure 6A is a schematic diagram of an electromagnetic wave radiated from a point source and received by a receiving antenna having length D. [Figure 6B] Figure 6B is a schematic diagram showing examples of different electromagnetic fields around an antenna. [Figure 6C] Figure 6C is a top view of an example of the device under test. [Figure 7] Figure 7 is a schematic diagram showing an example of different electromagnetic field regions around the antenna under test. [Figure 8] Figure 8 is a flowchart of a method for determining the optimal distance between the device under test and the antenna of the test mechanism. [Figure 9] Figure 9 is a flowchart illustrating an exemplary method for controlling the distance between the device under test and the antenna. [Figure 10A] Figure 10A shows the simulation results of the transmission of scattering parameters S11 and S21 for different separation distances between the device under test and the antenna. [Figure 10B] Figure 10B shows the results of the simulated phase difference between the S21 transmission phase and the linear phase for different isolation distances between the device under test and the antenna. [Figure 11A] Figure 11A shows an example of the first and second measurement data. [Figure 11B] Figure 11B shows the selection of values ​​from the first and second measurement data shown in Figure 11A. [Figure 12A]Figure 12A shows the sets associated with the first and second measurement data in Figure 11A. [Figure 12B] Figure 12B shows an example of the deviation of the set in Figure 12A. [Figure 13] Figure 13 is a flowchart illustrating an exemplary method for testing multiple devices under test. [Figure 14A] Figure 14A shows a schematic diagram of an example of the device under test. [Figure 14B] Figure 14B is a schematic diagram showing another example of the device under test. [Modes for carrying out the invention]

[0064] Detailed description of the embodiment In the following description, equivalent or related elements, or elements with equivalent or related functions, will be indicated by equivalent or related reference numbers, even if they appear in different diagrams.

[0065] The following description includes several details to provide a more overall description of embodiments of the present invention. However, it will be apparent to those skilled in the art that embodiments of the present invention can be carried out without these specific details. In other examples, well-known structures and devices are shown in block diagram form rather than in detail to avoid obscuring embodiments of the present invention. Furthermore, features of different embodiments described herein can be combined with each other as arbitrary, unless otherwise specified.

[0066] The following describes an example of a test mechanism for determining the optimized distance between the device under test and the antenna of the test mechanism. Subsequently, the method for determining the optimized distance (for example, using such a test mechanism) is further described below.

[0067] Figure 1 is a perspective view of an example of a test mechanism 120 equipped with the device under test 110.

[0068] The test mechanism 120 may include a carrier structure 126 (for example, having a printed circuit board, e.g., a PCB (Printed Circuit Board) test fixture). The test mechanism 120 may have a signal source and / or signal receiver 129 configured to transmit a signal to and / or receive a signal from the antenna 122 of the test mechanism 120 (e.g., an OTA measurement antenna). The test mechanism 120 may be an automated test apparatus (ATE).

[0069] The test mechanism 120 may have a device socket 128 (for example, configured to receive the device under test 110) into which the device under test 110 is inserted. The test mechanism 120 may be configured to perform multiple tests when the device under test 110 is placed in the device socket 128 in order to obtain far-field and / or near-field measurement results for a set of frequencies. At least two of the near-field tests may be performed at different distances between the device under test 110 and the antenna 122 of the test mechanism in order to obtain near-field measurement results for at least two different distances.

[0070] Figure 2 is a close-up perspective view of the test mechanism 120 and the device under test 110 shown in Figure 1.

[0071] The test mechanism 120 may have an antenna 122 (e.g., a measurement patch) and be configured to detect the electromagnetic field radiated by the device under test 110 and / or radiate the electromagnetic field received by the device under test 110.

[0072] Antenna 122 may be connected (or be connectable) via coaxial cables 129a, b to the connectors of the signal source and / or signal receiver 129 (for example, directly or indirectly via the carrier structure 126). Device socket 128 may be coupled (for example, directly or indirectly via the carrier structure 126) to the signal source and / or signal receiver 129. As a result, when the device under test 110 is inserted into the device socket 128, the signal source and / or signal receiver 129 may be configured to receive a signal from the device under test 110 (for example, here the device under test 110 generates a signal in response to receiving an electromagnetic field from antenna 122) and / or transmit a signal to the device under test 110 (for example, causing the device under test 110 to generate a signal that is received by antenna 122). Furthermore, the signal source and / or signal receiver 129 may be configured to receive a signal from the antenna 122 (for example, here the antenna 122 generates a signal in response to receiving an electromagnetic field from the device under test) and / or transmit a signal to the antenna 122 (for example, causing the antenna 112 to generate a signal to be received by the device under test 110).

[0073] The antenna 122 shown in Figure 2 is mounted (or is mounted as a PCB) on a printed circuit board (PCB) coupled to coaxial cables 129a,b (e.g., manufactured, e.g., provided). For example, the PCB may be the antenna 122 or may have the antenna 122. For example, the antenna 122 may be formed by at least one of the following: circuits printed on the PCB and circuits mounted on the PCB (e.g., in the form of one or more electrical components such as chips mounted on the PCB). The antenna 122 may have a PCB and optionally have further components (e.g., a retaining frame for handling). However, the antenna 122 may have a different structure. For example, the antenna 122 may have an antenna housing (e.g., formed from metal) in which a waveguide (e.g., having a double-ridge or quadruple-ridge structure) is formed and coupled to an opening in the antenna housing (e.g., a radiating aperture, e.g., having a circularly polarized antenna structure).

[0074] The test mechanism 120 may include a test apparatus 140 having an antenna 122 and a support structure 142 for supporting the antenna 122. The test apparatus 140 (or test mechanism 120) may have a (e.g., linear) stage 144 configured to move relative to the device socket 128 (e.g., in a direction along the main lobe of the device under test 110 in the device socket 128, e.g., in a direction perpendicular to the radiating plane of the device under test 110 in the device socket 128, e.g., in a direction perpendicular to the carrier structure 126). The test apparatus 140 may have a motor 146 configured to move the stage 144 (e.g., using a screw tightening system assembled on a shaft rotatable by the motor 146). Alternatively, the test apparatus 140 may be configured to move the device socket 128 relative to the carrier structure 126. The test apparatus 140 has an electrical connection 148 (e.g., a motor control cable) for coupling the motor 146 to a signal source and / or signal receiver 129 or a computer (e.g., an ATE system connected to the signal source and / or signal receiver 229).

[0075] The method may include generating a control signal (for example, by a signal source and / or signal receiver 229 or a computer) to control the movement of the stage 144 supporting the antenna 142 of the test mechanism 120. The control signal moves the stage 144 to at least two of different distances (for example, by driving a motor 146).

[0076] Alternatively or additionally, the test apparatus 140 may have multiple antennas positioned at different distances from the device socket 128. Multiple antennas can enable measurements at different distances with little or no movement of the stage 144.

[0077] Figure 3 is a perspective view of an example of the device under test 310 relative to the antenna 322 of the test mechanism. The device under test 310 may be any device under test disclosed herein (for example, device under test 110 or 510). The antenna 322 may be any antenna of the test mechanism disclosed herein (for example, test mechanism 120 or 520).

[0078] The device under test 310 (e.g., the patch under test) may be (or have) an antenna nine package (AiP). The device under test 310 may have at least one of an antenna, an antenna array (e.g., beamforming), and a circularly polarized antenna structure. The device under test 310 may be configured for receiving or radiating signals in the 5G(NR) frequency band. For example, the device under test 310 may be configured to radiate and / or receive signals in frequency range 2 (FR2), for example, between 24 GHz and 53 GHz. The device under test 310 may be an antenna device used in mobile phone, automotive, television, or computer applications. The device under test 310 may have a first port 312 coupled to, or capable of coupling to, a signal source and / or signal receiver (e.g., a signal source and / or signal receiver 129).

[0079] Antenna 122 (e.g., a measurement patch), which is part of a test mechanism such as an automated test apparatus (ATE), may be configured to detect the electromagnetic field radiated by the device under test 110 and / or radiate the electromagnetic field received by the device under test 110. Antenna 122 may have a second port 124 for a signal source and / or signal receiver (e.g., a signal source and / or signal receiver 129).

[0080] Figure 14A shows a schematic diagram of an example of the device under test 1410a.

[0081] The device under test 1410a includes, for example, a transceiver 1416 (e.g., a 5G transceiver) and a front end 1417a (e.g., a 5G front end). For transmission, the transceiver 1416 may be configured to generate a radio frequency (RF) signal based on a baseband 1415a signal and provide the RF signal to the front end 1417a. The front end 1417a may have one or more antennas from which radio signals based on the RF signal can be emitted, or may be coupled to one or more antennas. For reception, radio signals received by one or more antennas may be converted in the front end 1417a into RF signals provided to the transceiver 1416.

[0082] Figure 14B shows a schematic diagram of another example of the device under test 1410b.

[0083] The device under test 1410b includes, for example, an intermediate frequency (IF) transceiver 1418a, a radio frequency (RF) transceiver (TRX) 1418b, and a front end 1417b (e.g., a 5g front end). For transmission, the IF transceiver 1418a may generate an IF signal based on a baseband 1415b signal and forward the RF signal to the RF transceiver 1418b. The RF transceiver 1418b may generate an RF signal based on the IF signal. The front end 1417b may have one or more antennas, or be coupled to one or more antennas, through which radio signals based on the RF signal may be radiated. For reception, the RF transceiver 1418b may be configured to generate an RF signal based on radio signals received by one or more antennas and forward the RF signal to the IF receiver 1418a. The IF receiver 1418a may be configured to generate a baseband 1415b signal based on the IF signal.

[0084] The devices under test 1410a and 14b shown in Figures 14A and 14B provide examples of components that contribute to signal processing, each of which may contribute to and affect the transmission and / or reception of devices 1410a and 14b. By testing device 1410a, deviations in device function and / or defects of the device under test can be identified. Such testing can be improved in terms of accuracy (for example, by determining an optimized distance with little or no resonance) and test efficiency (for example, by enabling the use of near-field test mechanisms with mass production testing) by the methods and test mechanisms disclosed herein.

[0085] Figure 4 is a perspective view of the back side of the test mechanism 120 shown in Figures 1 and 2.

[0086] The test apparatus 140 may have a sensor 150 configured to detect a predefined position of the stage 144. For example, the sensor 150 may include a (e.g., reset) switch that detects physical contact between the reference structure 152 of the test apparatus 140 and a switch (e.g., further sends a signal to a signal source and / or signal receiver 129 or computer). The predefined position of the stage 144 can be used as a reference point (e.g., start or end point) for the movement of the stage 144. In other words, the (reset) switch provides, for example, a reference point for the (linear) stage 144. For example, a dimensional measurement of the distance between the device under test 110 (e.g., an AiP DUT antenna array), the device socket 128 (e.g., an ATE OTA socket), and the antenna 122 (e.g., a measuring antenna) is performed, for example, at its reset point.

[0087] Figure 5 is a perspective view of an example of a test mechanism 520 that may replace any of the test mechanisms disclosed herein (such as test mechanism 120). For example, test mechanism 520 may be a far-field test mechanism.

[0088] The test mechanism 520 includes an antenna 522 configured to detect and / or radiate an electromagnetic field. The antenna 522 shown in Figure 5 has a frequency range of 18.0 to 54.0 GHz, a typical gain of 15 dBi, dual polarization, a 3 dB beamwidth of 54 to 21 degrees, a typical cross-polarization separation of 30 dB (minimum 20 dB), a typical inter-port separation of 35 dB (minimum 25 dB), a typical voltage standing wave ratio (VSWR) of 1.5:1 (maximum 2.0:1), a 2.4 mm-female connector or a 1.85 mm-female connector, and a maximum power rating of 10 W continuous wave (CW) (2.4 mm-female connector) or 5 W continuous wave (CW) (1.85 mm-female connector). The antenna may be formed from or contain aluminum. For example, the size (dimensions) of the antenna may be 33.4 mm x 33.4 mm x 61.5 mm. The net weight of the antenna may be, for example, approximately 0.07 kg.

[0089] The test mechanism 520 may include a carrier structure 526 (such as carrier structure 126). The test mechanism 520 may include a signal source and / or signal receiver 529 (such as signal source and / or signal receiver 129) configured to transmit a signal to and / or receive a signal from antenna 522 (such as antenna 122). Antenna 522 may be connected (or can be connected) to the connector of the signal source and / or signal receiver 529 (for example, directly or indirectly via carrier structure 526) via coaxial cables 529a, b.

[0090] The test mechanism 520 may include a device socket 528 (such as device socket 128) for inserting the device under test 510 (such as device 110), which is configured to receive the device under test 510. The test mechanism 520 may be configured to perform multiple tests to obtain far-field and / or near-field measurement results for a set of frequencies when the device under test 510 is placed in the device socket 528.

[0091] The device socket 528 can be coupled with a signal source and / or signal receiver 529. As a result, when the device under test 510 is inserted into the device socket 528, the signal source and / or signal receiver 529 may be configured to receive signals from and / or transmit signals to the device under test 510.

[0092] The test mechanism 520 may include a test apparatus 540 having an antenna 522 and a support structure 542 for supporting the antenna 522. The support structure 542 may be (removably) attached to at least one of the carrier structure 526, the device socket 528, and the signal source and / or signal receiver 529. The support structure 542 may be height-adjustable or fixed. The test apparatus 540 may have a set of support structures 542 (e.g., interchangeable). Each set of support structures 542 is configured to position the antenna 522 at a different distance (e.g., height) from the device socket 528.

[0093] Antenna 522 may be positioned (for example, by a support structure 542) to measure the far-field of the device under test 510. In the example shown in Figure 5, the antenna is positioned at a distance of 25 cm from the device under test 510. However, longer or shorter distances (e.g., 10 mm) are also possible. For example, the distance between antenna 522 and the device under test 510 may be longer than the Fraunhofer distance.

[0094] The Fraunhofer distance is given by equation d F =2D 2 Defined by / λ, where D is the maximum dimension of the radiator or the diameter of the sphere surrounding the radiator or antenna. Where λ is the wavelength used (e.g., the wavelength at the minimum, maximum, average, or average operating wavelength).

[0095] FIG. 6A is a schematic diagram of an electromagnetic wave radiated by a point source 630 and received by a receiving antenna 632 having a length D. It should be noted that the same principle applies when the receiving antenna 632 radiates the electromagnetic wave received by the point source 630. In the context of FIGS. 6A to 6C, the term "antenna" is used not only for the antennas of the test apparatus but also for any object that radiates (or receives) an electromagnetic field.

[0096] Due to its limited size, the receiving antenna 632 cannot receive the electromagnetic wave radiated by the point source 630 in its entirety (i.e., the entire spherical wavefront), but can receive only a portion thereof covered by its maximum dimension (i.e., length D). This aspect is visualized in FIG. 6A in the form of a wave truncated to the vertical length D.

[0097] As seen in FIG. 6A, the wavefront of the first wave 634a close to the point source 630 has a large curvature (i.e., a small radius, e.g., less planar), while the wavefront of the second wave 634b farther from the point source 630 than the first wave 634a has a small curvature (i.e., a larger radius, e.g., more planar). This curvature causes a phase difference Δφ of the electromagnetic wave received along the length D of the receiving antenna 632. As the distance increases, the curvature of the wavefront and the phase difference Δφ decrease (e.g., having a more planar shape). At the Fraunhofer distance d F = 2D 2 / λ, the phase difference does not change by more than π / 8 radians. In other words, the physical meaning of this distance is that a radiation point source having a distance of 2D 2 / λ or more from the receiving antenna of length D generates a spherical wavefront such that the phase does not change by more than π / 8 radians over the entire length D.

[0098] FIG. 6B is a schematic diagram showing an example of different electromagnetic fields around the antenna.

[0099] The Fraunhofer distance R0 = d F = 2D 2A region located at a distance of less than or equal to / λ can be defined as a neighborhood boundary. This neighborhood boundary has a radius R0 equal to the Fraunhofer distance R0=d F =2D 2 Less than / λ, R = 0.62 × (D 3 / λ) 0.5 For a larger Fresnel region (or radiative near field), R = 0.62 × (D 3 / λ) 0.5 It can be separated into smaller distance (reactive) neighboring areas.

[0100] Figure 6C is a top view of an example of the device under test 610. The device under test 610 shown in Figure 6C can be implemented as any device under test disclosed herein and can be used in any test mechanism disclosed herein.

[0101] The device under test 610 has an antenna array 613 including four single antennas 614a, b, c, and d. The maximum dimension D of the single antennas 614a to d is sa It is approximately 4.4 mm, and the maximum dimension D of the antenna array 613 aa It is approximately 23.1 mm. The wavelength λ0 in air (measured in mm) can be determined by the following formula.

number

[0102] For an example frequency of 24 GHz, the wavelength can be determined as follows: λ0 (24GHz) = 12.45mm

[0103] Using the maximum dimensions of antenna array 613 in Figure 6C (e.g., 23.1 mm), the maximum dimensions of single antenna 614a (e.g., 4.1 mm), and a wavelength of 12.45 mm, the Fraunhofer distance (and therefore the low threshold for the far field) for antenna array 613 is:

number

number

[0104] The above are examples of distances defining the regions of the near-field and far-field, and it should be noted that such distances are described exemplarily in terms of Fraunhofer distances at 24 GHz. Other definitions for distances separating the near-field and far-field, as well as other parameters defining the distance (e.g., antenna dimensions and frequency), may be used.

[0105] Figure 7 is a schematic diagram showing examples of different electromagnetic field regions around the Antenna Under Test (AUT) 730.

[0106] Parameter D can be defined as the diameter of the sphere surrounding the antenna 630 under test.

[0107] As shown in Figure 7, the reactive neighbor can be defined down to a distance of λ / 2π. The radial neighbor (or Fresnel region) is 2D 2 The distance may be defined up to / λ (or Fraunhofer distance). Fraunhofer distance 2D 2 The region with distances greater than / λ may be defined as the far field (or Fraunhofer distance). In the far field, angular changes are less dependent on distance, and waves become more locally planar. In the reactive near field, non-radiative fields are dominant.

[0108] Compared to the near-field, the far-field is generally a more suitable region for OTA testing. However, mechanical requirements can make multi-site integration in a standard test cell difficult (low multi-site count). For example, commercial handlers may not have enough available space to integrate such a large mechanical setup. For instance, a commercially available handler may only allow a distance of, for example, 5 cm between the device under test and the measuring antenna. To implement a distance of, for example, 30 cm (for far-field testing), an entirely new or significantly modified handler design may be required. Also, in a multi-site setup, separating adjacent far-field setups can be difficult. For example, it may be necessary to create a small anechoic chamber box for each site, limiting the number of possible sites in the test cell (for example, limiting it to only 2 sites instead of more than 8 sites as is common). In other words, the near-field may be a less suitable region for OTA testing (compared to the far-field). However, its mechanical dimensions can facilitate multi-site integration (high multi-site count) in a standard test cell.

[0109] Figure 8 shows a flowchart 800 of a method for determining the optimal distance between the device under test and the antenna of the test mechanism.

[0110] The following description will primarily refer to the test apparatus 120 shown in Figures 1 and 2. However, any test apparatus disclosed herein (such as test apparatuses 120 and 520) may be used (alone or in combination with other test apparatuses) to perform any of the methods disclosed herein.

[0111] The method includes obtaining first measurement data in step 802. The first measurement data represents a plurality of far-field measurement results characterizing the device under test 110 for a set of frequencies, or the first measurement data is based on a plurality of far-field measurement results characterizing the device under test 110 for a set of frequencies.

[0112] The method includes obtaining second measurement data in step 804. The second measurement data represents a set of near-field measurement results characterizing the device under test for a set of frequencies, and based on the set of near-field measurement results characterizing the device under test for a set of frequencies, at least two of the near-field measurement results are obtained at different distances between the device under test and the antenna of the test mechanism.

[0113] This method includes, in step 806, determining an optimized distance between the device under test and the antenna of the test mechanism based on the first and second measurement data.

[0114] The method may include determining a single optimized distance to be used for all frequencies in a set of frequencies. Alternatively, the method may include determining multiple optimized distances (for example, one to be used for all frequencies in a set of frequencies, or one to be used for a subset of frequencies in a set of frequencies).

[0115] The first measurement data may be obtained using measurements performed by the test mechanism 120. For example, the stage 144 may be positioned at a distance (e.g., Fraunhofer distance, a multiple of Fraunhofer distance, or a predefined distance such as 10 cm, 20 cm, or 25 cm) such that the antenna 122 is located in the far field of the device under test 110. The stage 144 may be driven to that distance by the operation of the motor 146 or manually. The stage 144 can be positioned at that distance by selecting a carrier structure 126 having a (target) distance from a set of support structures 542 and attaching the selected carrier structure 126 to the carrier structure 126. The test apparatus 140 may include a plurality of antennas positioned at different distances from the device socket 128. Measurements for the first measurement data are performed by controlling (e.g., causing electromagnetic radiation and / or reading out received electromagnetic radiation) the antenna among the plurality of antennas having a (target) distance from the device under test 110.

[0116] The first measurement data may be obtained by measurements performed by a further test mechanism different from the test mechanism (such as test mechanism 120) that performs near-field measurements of the device under test 110. For example, measurements for generating the first measurement data may be performed at the manufacturing site of the device under test 110. The device under test and the first measurement data are then provided to test mechanism 120 (or a device that controls test mechanism 120) in order to perform the method disclosed herein. For this purpose, test mechanism 120 may have a data interface configured to receive the first measurement data and / or the second measurement data. For example, the first measurement data and / or the second measurement data may be received via an internet connection or a storage device (e.g., a compact disk or flash drive). A program configured to perform any of the methods disclosed herein is compatible with and / or can import the first measurement data and / or the second measurement data.

[0117] The test mechanism 520 shown in Figure 5 may be used to perform measurements of the first and second measurement data. However, the test mechanism 520 may be used to perform measurements only for the first measurement data (or only for the second measurement data).

[0118] The test mechanism 520 may form a far-field test apparatus, or a part of the test mechanism 520 may form a far-field test apparatus. For example, the test apparatus 540 may form a far-field test apparatus, which has an antenna 522 and a support structure 542 suitable for far-field measurements (e.g., a dimensionally sized support structure). In such a case, the test apparatus 540 may be placed on the carrier structure of the test mechanism (e.g., carrier structure 126 or 526) (e.g., instead of, or in addition to, a support structure for supporting an antenna for near-field measurements).

[0119] This method may include using a manufacturing test program to obtain first measurement data. The manufacturing test program may define a set of frequencies or include an algorithm for determining a set of frequencies based on user input. The manufacturing test program may define a distance for far-field measurement. The manufacturing test program may include instructions for controlling an actuator (e.g., motor 146) of the test mechanism 120 for moving the antenna 122 over the distance for far-field measurement. The test mechanism (e.g., test mechanism 120 or 520) may include a computer for running the manufacturing test program or may be communicatively coupled to a computer for running the manufacturing test program. Such a computer program may be provided to the manufacturer of the device under test to facilitate reproducible and uniform measurements.

[0120] A set of frequencies can define two or more frequencies, for example, three, four, five, six, or twelve or more. At least some of the frequencies in the set of frequencies may be separated by equal frequency intervals or wavelength intervals. A set of frequencies can cover one or more frequency bands of 5G technology. For example, a set of frequencies can define twelve frequencies (for example, with equal frequency intervals of about 2.6 GHz) covering the range from 24 GHz to 53 GHz. In such a case, the set of frequencies can define twelve frequencies f1 to f12, with f1=24 GHz, f2~26.6 GHz, f3~29.3 GHz, f4~31.9 GHz, f5~34.5 GHz, f6~37.2 GHz, f7~39.8 GHz, f8~42.5 GHz, f9~45.1 GHz, f10=47.7 GHz, f11~50.4 GHz, and f12=53 GHz. Alternatively, the set of frequencies can be defined with other step sizes, such as 1 GHz steps. Yet another way is to define the set of frequencies with unequal step sizes (for example, optionally increasing or decreasing).

[0121] Multiple far-field measurement results may include at least one of the following: power measurement results (e.g., transmit and / or receive of the device under test), gain measurement results (e.g., transmit and / or receive of the device under test), gain step measurement results (e.g., transmit and / or receive of the device under test), gain compression measurement results, phase shift measurement results (e.g., beamforming transmit and / or receive of the device under test), flatness measurement results (e.g., transmit and / or receive of the device under test), error vector amplitude measurement results (e.g., transmit and / or receive of the device under test), separation measurement results (e.g., transmit and / or receive of the device under test), spurious emission measurement results, adjacent channel leakage power ratio measurement results, IP3 measurement results, and noise figure measurement results.

[0122] The first measurement data represents multiple far-field measurement results (e.g., in the form of directly measured calibration units or arbitrary units) characterizing the device under test for a set of frequencies, or is based on multiple far-field measurement results characterizing the device under test for a set of frequencies (e.g., filtered, rescaled, denoised, transformed, convolutional, clipped, and compressed).

[0123] The first measurement data, or at least one value of the first measurement data, may be obtained based on the wireless transmission of a signal by the device under test 110, or when the device under test 110 is wirelessly transmitting a signal (for example, to the test mechanism 120 or another test mechanism for the first measurement, for example to the antenna 122 of the test mechanism 120).

[0124] The second measurement data is the near-field condition (e.g., Fraunhofer distance 2D) between the device under test and the antenna of the test mechanism. 2 A threshold (such as / λ between the far field and the nearby field) may be applied to different distances x.

[0125] The second measurement data may include a first set of near-field measurement results associated with a first distance between the device under test 110 and the antenna 122 of the test mechanism 120 (for example, obtained for a first distance between the device under test 110 and the antenna 122 of the test mechanism 120) (where, for example, the values ​​of the first set of near-field measurement results are associated with different frequencies and determined for different frequencies). The second measurement data may include a second set of near-field measurement results associated with a second distance between the device under test 110 and the antenna 122 of the test mechanism 120 (for example, obtained for a second distance between the device under test 110 and the antenna 122 of the test mechanism 120) (where, for example, the values ​​of the second set of near-field measurement results are associated with different frequencies and determined for different frequencies).

[0126] The values ​​in a first set of near-field measurement results may correspond to the values ​​in a second set of near-field measurement results (for example, measured over at least substantially the same frequency or subset of frequencies), except that the values ​​in the first set of measurement results are determined for a first distance, and the values ​​in the second set of near-field measurement results are determined for a second distance.

[0127] The second measurement data may include one or more values. One or more values ​​of the second measurement data may include at least one of the following: power value (e.g., in milliwatts or dBm units), gain value (e.g., in decibels units), gain step value (e.g., in decibels units), gain compression value (e.g., 1 dB compression point (P1 dB)), phase shift value (e.g., in degrees units) (e.g., phase shift during beamforming), gain flatness value, error vector amplitude value (e.g., in dBc units), separation value (e.g., degree of separation between different polarization directions), spurious value (e.g., indicating spurious radiation), and adjacent channel leakage power ratio value.

[0128] The second measurement data, or at least one of the values ​​of the second measurement data, may be obtained based on the wireless transmission of a signal by the device under test 110, or when the device under test 110 is wirelessly transmitting a signal (for example, to the test mechanism 120 for the second measurement, for example, to the antenna 122 of the test mechanism 120).

[0129] The method may include running a manufacturing test program that controls the testing of the device under test 110 for multiple test frequencies and multiple distances (for example, between the device under test 110 and the antenna 112 of the test mechanism 120), (preferably returning one or more re-measured values ​​for each frequency), thereby obtaining second measurement data. The manufacturing test program may assign predetermined values ​​for multiple test frequencies and / or multiple distances to different types of devices under test 110 (for example, from different manufacturers or different production lines of a manufacturer). The manufacturing test program may be configured to identify the device under test 110 based on user input, a time schedule, or an optical sensor, and to set predetermined values ​​for multiple test frequencies and / or multiple distances based on the identified device under test 110. At least one of the multiple test frequencies and multiple distances may be set by the user.

[0130] The method may include using a manufacturing test program that is repeated one or more times at a changed distance between the device under test 110 and the antenna 122 of the test mechanism 120. The method may include using a manufacturing test program that is supplemented by functions that result in repetition (e.g., a test flow) and a change in the distance between the device under test 110 and the antenna 122 of the test mechanism 120. For example, the manufacturing test program may start a function for changing the distance and then start a function for testing at a set of frequencies (the set of frequencies may be the same or may change based on distance, for example).

[0131] The method may include varying the distance between the device under test 110 and the antenna 122 of the test mechanism 120 between measurements used to obtain near-field measurement results (where, for example, the distance is varied using an actuator (e.g., an electric actuator, e.g., a motor 146) that can change the position of the antenna 122 of the test mechanism 120). The method may include generating a control signal for the actuator (e.g., a motor 146) that changes the position of the antenna 122 of the test mechanism 120. The method may include stepwise variation of the distance between the device under test and the antenna of the test mechanism (e.g., using equal and / or fixed steps or a varying step size).

[0132] The method may include generating a control signal to control the movement of a stage 144 (e.g., a linear stage, equipped with a motor) supporting the antenna 122 of the test mechanism 120. The control signal moves the stage to at least two of different distances (e.g., by driving a motor 146).

[0133] This method may include generating a control signal to move the stage 144 to a predetermined initial position (for example, using the signal from sensor 150 and the signal from the reset switch). This method may further include generating a control signal to move the stage 144 by a distance increment from the predetermined initial position.

[0134] Figure 9 shows a flowchart 960 of an exemplary method for controlling the distance between the device under test 110 and the antenna 120 of the test mechanism 120. However, any step of this method can be used with other test mechanisms and / or devices under test disclosed herein.

[0135] The method may include, in step 961, initiating a reset of the position of the stage supporting the antenna 122 (e.g., stage 144). The method may include resetting the stage to a predetermined starting position (e.g., resetting a linear stage to a predetermined starting position). The reset may be initiated by user input, a test program for a manufacturing test, a switch on the test mechanism, and at least one of one or more sensors that detect that one or more criteria have been met (e.g., that the device under test 110 has been inserted into the device socket 128 and / or that the test apparatus 140 has been coupled to the carrier structure 126).

[0136] In this method, in step 962, the stage 144 is moved to a predetermined position x min To move (for example, the linear stage to x min The method may include moving the device under test 110 to the antenna 122 (or stage 144) until a criterion is met. The criterion may include the stage 144 stopping (for example, by moving to a terminal stop position) and the sensor 150 detecting a predetermined position (for example, contact between the criterion structure 152 and the switch of the sensor 150). The predetermined position may be the position where the criterion is met, or it may be a position offset from the position where the criterion is met. For example, the stage 144 is moved to a terminal stop position (for example, downwards), and then to the predetermined position x min It may be moved by a predetermined increment (for example, upward) up to a certain position x. In another example, the stage 144 is moved when the sensor 150 is at a predetermined position x min The stage may be moved (for example, downward) until contact is detected between it and the reference structure 152 that defines the sensor. In another example, the stage 144 may be moved (for example, downward) until the sensor 150 detects contact between the reference structure 152 and the switch of the sensor 150, and then the stage 144 may be moved by a predetermined increment (for example, upward), or the stage 144 may be moved until the sensor 150 detects that there is no longer contact between the reference structure 152 and the switch of the sensor 150.

[0137] In this method, in step 963, parameter p x (This may be a distance x, a parameter representing the distance x, or a parameter representing the position of stage 144) with the value p x,min (predetermined position x min It may be, and the predetermined position x min This may include setting the parameter p (which may be a representative parameter) to a specific value. x This may be measured in terms of distance (for example, in millimeters), the position of the movable element of the motor 135 (for example, the shaft rotatable by the motor 135), or other parameters indicating the position of the stage 144 (or the position of the antenna 122).

[0138] The method may, in step 964, include running a test program for the set of frequencies to be tested and recording the results (e.g., scaling, processing, and saving). The test program may include any method disclosed herein for testing the near-field of the device under test 110.

[0139] In this method, in step 965, parameter p x to the previous value p x and the step (interval) or distance difference x step or a representative value p x,step This may include setting the new value to the sum of the two values. x,step (and / or x step ) may be a constant (for example, predetermined) value, or it may change with each step. For example, the value p x,step Here, x is the distance and p is the parameter. x , and x or p x,step It may be based on at least one of the gradients of the curve. For example, the value p x,step This may define or correspond to a step interval between 0.1 and 2.0 mm (for example, 1 mm).

[0140] In this method, in step 966, the (new) parameter p x is threshold p x,max This may include comparing whether or not it exceeds a threshold p. x,max The threshold distance x max or threshold distance x max Represents the threshold distance x. max This may be at least one of the following: the maximum distance that stage 144 can travel, a predetermined threshold, a distance that defines the transition between the near-field and the far-field (e.g., the Fraunhofer distance), and a threshold associated with the device under test 110. max The threshold distance (e.g., threshold distance x) may be defined based on one or more geometric properties of a given test mechanism, such as a test mechanism used for subsequent measurements (e.g., using an optimized distance). For example, the given threshold distance may be the maximum distance allowed by the test mechanism (e.g., the distance between the device under test 110 and the antenna of the test mechanism), or may be based on this maximum distance. The given test mechanism (e.g., for subsequent measurements) may be a commercially available handler or a high-capacity handler. The handler may include a coupling mechanism (e.g., one comprising a clamp) configured to couple with a socket (e.g., any device socket disclosed herein) or a carrier structure (e.g., any carrier structure disclosed herein) to position the handler's antenna at a predetermined distance from the device under test (e.g., any device under test disclosed herein). For example, the predetermined distance between the handler's antenna and the device under test may be in the range between 4 cm and 6 cm, such as 5 cm. maxThe threshold (threshold distance x) may be a predetermined distance from the handler. However, the predetermined distance may be defined based on a predetermined distance to take into account one or more factors, such as the thickness of the handler's antenna and / or the thickness of the device under test. For example, the predetermined distance between the handler's antenna and the socket may be 5 cm, the thickness of the handler's antenna may be 0.1 cm, and the thickness of the device under test may be 0.2 cm. In such a case, the predetermined threshold (threshold distance x) may be a predetermined threshold (threshold distance x) max ) may be 5cm - 0.1cm - 0.2cm = 4.7cm. In other words, a given threshold (therefore, for example, threshold distance x max ) may be, for example, the maximum distance allowed by a commercially available handler for standard (e.g., unmodified) integration of an OTA (Over-the-Air) test setup. For example, that distance (e.g., threshold distance x) max ) may be 5 cm or 4 cm (or a range between 4 cm and 5 cm), depending on several factors such as the thickness of the measuring antenna and the thickness of the package of the device under test. Step 966 may, in short, function as a check to see whether Stage 144 has reached the final distance of the distance range being tested.

[0141] Comparison step 966 is performed on parameter p x is threshold p x,max If it is concluded that it does not exceed, this method further determines in step 967 that the value p x,step Step x corresponding to step The method may include moving the stage 144 (for example, upward) by a distance (for example, within a range of 0.1 mm to 2.0 mm, for example, 1 mm). The method may then repeat steps 964, 965, and 966 described above.

[0142] Comparison step 966 is performed on parameter p x is threshold p x,maxIf it is concluded that the value exceeds a certain threshold, the method may include completing a second set of measurement data (e.g., near-field measurement data) in step 967. The second set of measurement data may be generated after measuring the near-field at the last distance (e.g., based on transient data) or may be generated continuously during the measurements at each distance.

[0143] Referring to Figures 10A and 10B, we will describe an example of near-field measurement values ​​determined for different distances. Then, we will describe an example of determining the optimized distance shown in Figure 9.

[0144] Figure 10A shows the scattering parameter S for different separation distances between the device under test 110, which corresponds to port 1 of the scattering parameter, and the antenna 122, which corresponds to port 2 of the scattering parameter. 11 (Reflection) and S 21 The results of the (transparency) simulation are shown.

[0145] The simulation was performed for a simple case where, for example, the device under test is implemented as a patch antenna (e.g., device under test 310 in Figure 3), and antenna 12 is implemented as a measurement patch (e.g., antenna 322 in Figure 3). The simulation was performed at an exemplary wavelength of 12.49 mm, corresponding to 24 GHz (i.e., the lower limit of the FR2 frequency range).

[0146] The simulation results in Figure 10A illustrate, for example, the behavior of standing waves in a simple patch antenna case. For example, in an ideal case, resonant behavior may occur at a specific distance between the device under test (e.g., the DUT antenna array of the AiP) and antenna 12 (e.g., the OTA measurement antenna). The resonant behavior will vary with distance. Such resonant behavior may have a periodicity of, for example, half the transmission wavelength (e.g., 12.45 mm) (e.g., approximately 6.2 mm). Note that Figure 10A shows the simulation results for a single wavelength (or frequency) to illustrate the resonant effect. The method disclosed herein is performed for a set of frequencies and can therefore be performed for multiple frequencies.

[0147] Figure 10B shows the simulated S for different separation distances between the device under test 110 and the antenna 122. 21 The results of the phase difference between the transmission phase and the linear phase are shown.

[0148] The phase results shown in Figure 10B show variations with respect to different distances, compared to the expected linear phase changes that indicate multiple resonance points. The periodicity of the resonance in the phase difference also corresponds to half the transmission wavelength.

[0149] Significant resonance effects can reduce measurement accuracy when performing near-field measurements. In the example in Figure 10A, S 21 Parameters and S 11 The transmission of the parameter differs at a distance of approximately 12 mm compared to a distance of 15 mm, where resonance is not significant. Therefore, measurement accuracy can be improved by selecting a distance at which the effects of resonance are reduced or avoided. The method disclosed herein includes determining such an optimized (e.g., sufficiently usable, optimal, or ideal) distance based on first and second measurement data.

[0150] The optimized distance can be determined using multiple far-field measurements associated with different frequencies (e.g., a set of frequencies) and their corresponding near-field measurements (which are also associated with different frequencies (e.g., a set of frequencies)). Determining the optimized distance may involve averaging (e.g., unweighted or weighted) the differences between multiple far-field measurements associated with different frequencies (e.g., a set of frequencies) and their corresponding near-field measurements (which are also associated with different frequencies (e.g., a set of frequencies)).

[0151] Referring here to Figure 9, one example of determining the optimized distance includes, in the step, comparing each distance x measurement data with reference far-field data to find the distance x for which the correlation between the first measurement data and the second measurement data is optimal. Note that Figure 9 shows an example of a method for obtaining the second measurement and a method for determining the optimized distance. However, any other method for obtaining the second measurement disclosed herein can be combined with any example for determining the optimized distance disclosed herein.

[0152] The method described with reference to Figure 9 involves, for example, determining the distance between the device under test 110 and the antenna 112 of the test mechanism 120 (e.g., the distance from the optimized or ideal DUT AiP to the measurement antenna) as a minimum distance x min From the maximum distance x max up to, step size x step This can be used as an algorithm for determining the distance between the device under test 110 (e.g., the AIP of the DUT) and the antenna 122 of the test mechanism 120 (e.g., the ATE measurement antenna). The "golden device" (e.g., the device under test measured for reference data) may be measured before or after, for example, in the far field.

[0153] Figure 11A shows an example of the first measurement data 970 and the second measurement data 974. The example shown in Figure 11A is the radiated power P of the device under test (for example, any device under test disclosed herein). out The value is depicted. Alternatively or additionally, any other metric (or value) disclosed herein may be used.

[0154] The first measurement data 970 includes a first value 972a measured in the far field at a first frequency in the frequency set, which is drawn as a horizontal dashed line. The first measurement data 970 also includes a second value 972b measured in the far field at a second frequency in the frequency set, which is drawn as a horizontal continuous line. The frequency set may contain more than the first and second frequencies. Note that the first and second values ​​972a and b are drawn as horizontal lines to facilitate comparison with the values ​​in the second measurement data 974, and should not be understood as constant values ​​for all distances.

[0155] The second measurement data 974 includes a first set of values ​​976a to 976l (indicated by circles in Figure 11A) measured at a first frequency of a set of frequencies, associated with multiple distances (a total of 12 distances in the example in Figure 11) between the device under test 110 and the antenna 122 of the test apparatus 120, or (for example, considering rescaling) with respect to multiple distances between the device under test 110 and the antenna 122 of the test apparatus 120, and measured at a first frequency of a set of frequencies.

[0156] The second measurement data 974 includes a second set of values ​​978a to 978d (shown as squares in Figure 11) measured at a second frequency in a set of frequencies, associated with multiple distances (a total of 12 distances in the example in Figure 11) between the device under test 110 and the antenna 122 of the measurement mechanism 120, or (for example, considering rescaling) with multiple distances between the device under test 110 and the antenna 122 of the test apparatus 120, and measured at a second frequency in a set of frequencies.

[0157] The first measurement data and / or the second measurement data 974 may include values ​​obtained by direct measurement or values ​​associated with values ​​obtained by measurement. For example, the first measurement data and / or the second measurement data 974 may be rescaled (for example, to account for attenuation at greater distances) or otherwise processed (for example, filtering, denoising, or compression).

[0158] Figure 11B shows the selection of values ​​from the first and second measurement data shown in Figure 11A. This selection of values ​​allows the method disclosed herein to be explained using only two frequencies and two distances, making it easier to understand.

[0159] The second measurement data includes a value of 976g obtained for the first distance (shown as a circle in Figure 11B), and a value of 976i at the second distance between the device under test 122 and the antenna 122 of the test apparatus 120, or values ​​976g and 976i associated with the first and second distances between the device under test 110 and the antenna 122 of the test apparatus 120 measured at the first frequency.

[0160] The second measurement data includes a value of 978g obtained for the first distance (shown as a rectangle in Figure 11B), and a value of 978i at the second distance between the device under test 122 and the antenna 122 of the test apparatus 120, or values ​​978g and 978i associated with the first and second distances between the device under test 110 and the antenna 122 of the test apparatus 120, measured at a second frequency.

[0161] Determining the optimized distance may involve comparing a value 976g of second measurement data obtained for a first distance (e.g., measurement data associated with a first frequency) (e.g., one value from a first set of values) with one or more corresponding values ​​972a of the first measurement data 970 to obtain a first comparison result. The first comparison result can describe the similarity between the second measurement data obtained for the first distance (e.g., value 976g) and the first measurement data 970. In the example shown in Figure 11B, the first comparison result is the difference 980g between the value 978g measured in the far field at the first frequency and the first value 972a. Alternatively, other similarity measures may be used, such as comparison with the square root of the distance or a (fixed or variable) threshold. Note that the corresponding values ​​972a of the first measurement data 970 are not limited to the same frequency. One or more corresponding values ​​972a of the first measurement data 970 may be one or more nearest frequencies or one or more frequencies within a threshold.

[0162] Determining the optimized distance may further involve comparing a value 976i of the second measurement data obtained for the second distance (e.g., one value from the second set of values) with one or more corresponding values ​​972a of the first measurement data in order to obtain a second comparison result (e.g., difference 980i).

[0163] Determining the optimized distance may involve determining the optimized distance based on the first and second comparison results. For example, the optimized distance may be determined as the distance with the smallest comparison result. In the example shown in Figure 11B, since the difference of the first comparison result, 980g, is smaller than the difference of the second comparison result, 980i, the optimized distance may be determined as the distance associated with the value 976g (or the first comparison result, 980g).

[0164] In the example above, the value of the second measurement data 974, obtained only at the first frequency, is used. Values ​​obtained at multiple frequencies may also be used.

[0165] This method may include determining a first comparison result associated with a first distance (e.g., a difference 980g determined for the first frequency and a difference 981g determined for the second frequency) and a second distance (e.g., a difference 980i determined for the first frequency and a difference 981i determined for the second frequency), which are determined from second measurement data 974 obtained for the first and second frequencies.

[0166] Determining the optimized distance may involve determining the optimized distance based on the results of a first and a second comparison. Using the examples of differences 980g, 980i, 981g, and 98i between the second measurement data value 974 and the first measurement result 972, a scale (e.g., sum of differences, arithmetic mean, geometric mean, or harmonic mean) representing each combination of differences may be formed for each of the first and second distances, and the resulting scales for each distance may be compared. For example, the first comparison result may include the sum of differences 980g and 978g, and the second comparison result may include the sum of differences 980i and 976i. In the example shown in Figure 11B, the sum of differences 980g and 978g is smaller than the sum of differences 980i and 976i. Therefore, the distances associated with the values ​​976g and 978g may be determined as the optimized distance.

[0167] In the example shown in Figure 11B, the optimized distance is determined based on the values ​​of the second measurement data 974 associated with only two distances. Alternatively, more than two distances (e.g., three, four, five, or more) may be used. For example, in Figure 11A, the second measurement data 974 for all 12 distances can be used.

[0168] In the examples shown in Figures 11A and 11B, the first and second measurement data are determined only for the first and second frequencies. However, more than two frequencies (for example, three, four, five, or more) may be used.

[0169] Figure 12A shows sets 982a to 982l associated with the first and second measurement data in Figure 11A.

[0170] The second measurement data 974 may include a first set 982a of near-field measurement results associated with a first distance between the device under test 110 and the antenna 122 of the test mechanism 120 (for example, obtained for a first distance between the device under test 110 and the antenna 122 of the test mechanism 120). For example, the values ​​in the first set 982a of near-field measurement results are associated with different frequencies (for example, a first frequency and a second frequency).

[0171] The second measurement data 974 includes a second set 982b of near-field measurement results associated with a second distance between the device under test 110 and the antenna 122 of the test mechanism 120 (for example, obtained for a second distance between the device under test 110 and the antenna 122 of the test mechanism 120). For example, the values ​​in the second set 982b of near-field measurement results are associated with different frequencies (for example, a first frequency and a second frequency).

[0172] The values ​​in the first set 982a of the near-field measurement results may correspond to the values ​​in the second set 982b of the near-field measurement results, except that the values ​​in the first set 982a of the measurement results are determined for a first distance, and the values ​​in the second set 982b of the near-field measurement results are determined for a second distance. As can be seen in Figure 12A, the second measurement data 974 may contain two or more sets 982. However, with reference to Figure 12A, an example of the method will be illustrated using only the first set 982a and the second set 982b.

[0173] The optimized distance may be determined based on the deviation between the set of near-field measurement results 982a, b and the (corresponding) set of far-field measurement results (included in the first measurement data). The set of far-field measurement results can be considered as reference far-field data. The set of far-field measurement results may include one or more values ​​for each frequency in the set of frequencies (Figure 12A shows, exemplarily, values ​​972a for the first frequency and 972b for the second frequency).

[0174] The deviation may be determined, for example, as an unsigned (or absolute) deviation (e.g., the sum of the absolute differences between the near-field and far-field measurements), a signed deviation (e.g., the sum of the differences between the near-field and far-field measurements), or a squared deviation (e.g., the sum of the squares of the differences between the near-field and far-field measurements). Alternatively or additionally, the optimized distance may be determined based on the deviation between the set of near-field measurements 982a,b and the mean values ​​of the set of near-field measurements 982a,b.

[0175] Figure 12B shows an example of the deviations determined (indicated by triangles) for the set 982a–982l in Figure 12A.

[0176] The deviation obtained for the first set 982a is greater than the deviation obtained for the second set 982b. Therefore, when using only the first set 982a and the second set 982b, the optimized distance may be the distance associated with the second set 982b because its deviation is small.

[0177] If all 12 sets 982a to 982l are used, more distances are available to determine the optimized distance. In the example shown in Figure 12B, the deviation of set 982l is the smallest among sets 982a to 982l. Therefore, the distance associated with set 982l may be determined as the optimized distance. However, other factors may be considered. For example, the deviation or the value used to determine the deviation may be changed. For example, the deviation may be scaled according to the associated distance (for example, if smaller or larger distances are preferred, for example, the deviations of sets 982a to 982l may be multiplied by a scaling factor based on their respective distances).

[0178] The optimized distance may be determined such that the difference between the far-field measurement result and the corresponding near-field measurement result is less than a predetermined maximum deviation for all frequencies in the frequency set, or the optimized distance may be determined such that the difference between the far-field measurement result and the corresponding near-field measurement result is less than or equal to a predetermined maximum deviation for all frequencies in the frequency set. If, for multiple distances, the difference is determined to be less than (or equal to) a predetermined maximum deviation for all frequencies in the frequency set, the multiple distances may be suitable for further testing. The multiple distances may be output to the user (for example, for distance selection). If, for any distance, the difference is not determined to be less than (or equal to) a predetermined maximum deviation for all frequencies in the frequency set, an output indicating that none of the distances meet the requirements may be generated.

[0179] The optimized distance may be determined such that the difference between the near-field measurement result or the far-field measurement result and the corresponding near-field measurement result does not exhibit a resonance effect (for example, exceeding a predetermined maximum deviation) for all frequencies in the frequency set.

[0180] The presence of a resonance effect may be recognized by comparing the near-field measurement results for a given frequency and multiple distances with the average value of the near-field measurement results for a given frequency and multiple distances. A deviation from the average value greater than a predetermined threshold may be recognized as a resonance effect. This method may include avoiding distances where a significant (e.g., exceeding a threshold) resonance effect exists that significantly degrades the near-field measurement results at at least one frequency in the set of frequencies.

[0181] The method may include determining one or more distances at which a resonant effect occurs. The method may include fitting near-field measurements at the same frequency to a comparison function (determined, for example, based on at least one of a given function, one or more values ​​of near-field measurements at the same frequency, and the mean of one or more values ​​of near-field measurements at the same frequency), and determining distances at which the near-field measurements satisfy a deviation criterion from the fitted near-field measurements, such as absolute or relative deviations. The method may include determining one or more periodic patterns in the near-field measurements (for example, using at least one of the Fourier transform and the wavelength used for the near-field measurements), and determining extrema (e.g., maximum and / or minimum values). Determining one or more distances at which a resonant effect occurs may be based on the value type of the near-field measurement. For example, in a measurement of DUT radiated power, the resonant effect may be identified as a minimum, while in a measurement of DUT reflected power, the resonant effect may be identified as a maximum. For example, in a measurement of phase difference, the resonant effect may identify a maximum or minimum with the largest absolute value (e.g., of the determined pattern period).

[0182] The method may include assigning a resonance indicator related to the resonance effect to each of one or more distances. The method may include not assigning a resonance indicator to distances that do not exhibit a resonance effect, or assigning a resonance indicator to distances that do not exhibit a resonance effect to indicate that the distance does not exhibit a resonance effect. The resonance indicator may indicate that resonance has been determined for the assigned distance. The resonance indicator may indicate a measure (or degree) of the resonance effect (for example, based on the deviation or absolute value of the near-field measurement results). The method may include determining the optimized distance as a distance with no resonance effect or a distance with minimal resonance effect (for example, based on the resonance indicator for each distance, for example, based on the sum of the measures (or degrees) of the resonance effect for each distance).

[0183] The above method makes it possible to determine an optimized distance for testing the device under test 110. The optimized distance may then be used to test further devices under test (e.g., devices of the same (or at least similar) type, e.g., devices having the same (or at least similar) near-field and / or far-field).

[0184] Figure 13 shows a flowchart 1390 of an exemplary method for testing multiple devices under test. This method can be used with any device under test 110 and any test mechanism disclosed herein.

[0185] The method includes, in step 1391, determining an optimized distance between the device under test 110 and the antenna 122 of the test mechanism 120 using the method described herein. The optimized distance is determined using a test program of a manufacturing test that is repeated one or more times with a modified distance between the device under test 110 and the antenna 122 of the test mechanism 120 to detect the optimized distance, or the optimized distance is determined using a manufacturing test program supplemented by a function that results in iteration (e.g., of the test flow) and a change in the distance between the device under test and the antenna of the test mechanism to determine the optimized distance.

[0186] This method includes, in step 1392, testing multiple devices under test using a manufacturing test program. The distance between the devices under test is kept constant at a predetermined optimized distance.

[0187] Alternative Implementation Although some embodiments have been described in the context of the apparatus, it is clear that these embodiments also represent descriptions of the corresponding methods, where the blocks or apparatus correspond to method steps or features of method steps. Similarly, embodiments described in the context of method steps also represent descriptions of the corresponding blocks, items, or features of the corresponding apparatus.

[0188] Depending on specific implementation requirements, embodiments of the present invention can be implemented in hardware or software. The implementation may be carried out using a digital storage medium, such as a floppy disk, DVD, CD, ROM, PROM, EPROM, EEPROM, or FLASH memory, which has electronically readable control signals stored thereon and which cooperates (or can cooperate) with a computer system that is programmable to perform each method.

[0189] Some embodiments of the present invention include a data carrier having an electronically readable control signal. These data carriers can cooperate with a programmable computer system so that one of the methods described herein is performed.

[0190] Generally, embodiments of the present invention can be implemented as a computer program product having program code. The program code is operable to perform one of the methods when the computer program product is executed on a computer. The program code can be stored, for example, on a machine-readable carrier.

[0191] Other embodiments include a computer program stored on a machine-readable carrier for performing one of the methods described herein.

[0192] In other words, embodiments of the method of the present invention are, therefore, computer programs having program code for performing one of the methods of the present invention when the computer program is executed on a computer.

[0193] Accordingly, a further embodiment of the method of the present invention is a data carrier (or digital storage medium, or computer-readable medium) on which a computer program for performing one of the methods described herein is recorded. The data carrier, digital storage medium, or recording medium is typically tangible and / or non-transient.

[0194] Accordingly, a further embodiment of the method of the present invention is a data stream or sequence of signals representing a computer program for performing one of the methods defined herein. The data stream or sequence of signals may be configured to be transmitted over a data communication connection, such as the Internet.

[0195] Further embodiments include processing means, such as a computer or a programmable logic device, configured or adapted to perform one of the methods specified herein.

[0196] Further embodiments include a computer on which a computer program for performing one of the methods described herein is installed.

[0197] Further embodiments of the present invention include an apparatus or system configured to transmit (e.g., electronically or optically) a computer program for performing one of the methods described herein to a receiver. The receiver may be, for example, a computer, a mobile device, a memory device, etc. The apparatus or system may include, for example, a file server for transmitting the computer program to the receiver.

[0198] In some embodiments, a programmable logic device (e.g., a field-programmable gate array) can be used to perform some or all of the functionality of the methods described herein. In some embodiments, a field-programmable gate array can cooperate with a microprocessor to perform one of the methods described herein. Generally, the methods are preferably performed by any hardware device.

[0199] The apparatus described herein can be implemented using hardware devices, a computer, or a combination of hardware devices and a computer.

[0200] The apparatus described herein, or any component of the apparatus described herein, can be implemented at least in part in hardware and / or software.

[0201] The methods described herein can be performed using hardware devices, or using a computer, or using a combination of hardware devices and a computer.

[0202] The embodiments described above are merely illustrative of the principles of the present invention. Modifications and variations of the arrangements and details described herein will be obvious to those skilled in the art. Therefore, the invention is intended to be limited only by the following claims and not by the specific details presented herein.

Claims

1. A method for determining the optimal distance between the device under test and the antenna of the test mechanism, To obtain the first measurement data, To obtain the second measurement data, This includes determining the optimized distance between the device under test and the antenna of the test mechanism based on the first and second measurement data, The first measurement data represents a plurality of far-field measurement results that characterize the device under test for a set of frequencies, or the first measurement data is based on a plurality of far-field measurement results that characterize the device under test for a set of frequencies. The second measurement data represents a plurality of near-field measurement results that characterize the device under test for the set of frequencies, or the second measurement data is based on a plurality of near-field measurement results that characterize the device under test for the set of frequencies. At least two of the aforementioned near-field measurement results are obtained at multiple different distances between the device under test and the antenna of the test mechanism. method.

2. Determining the optimized distance is To obtain a first comparison result, one or more values ​​of the second measurement data obtained for a first distance between the device under test and the antenna of the measurement mechanism, or associated with the first distance between the device under test and the antenna of the measurement mechanism, are compared with one or more corresponding values ​​of the first measurement data. To obtain a second comparison result, one or more values ​​of the second measurement data obtained for the second distance between the device under test and the antenna of the measurement mechanism, or associated with the second distance between the device under test and the antenna of the measurement mechanism, are compared with one or more corresponding values ​​of the first measurement data. The process includes determining the optimized distance based on the first and second comparison results, The method according to claim 1.

3. The first measurement data and the second measurement data, or at least one of the values ​​of the first measurement data and the second measurement data, are obtained based on the wireless transmission of a signal by the device under test, or are obtained when the device under test is wirelessly transmitting a signal. The method according to claim 2.

4. One or more values ​​of the first measurement data include at least one of the following: power value, gain value, gain step value, gain compression value, phase shift value, gain flatness value, error vector amplitude value, separation value, spurious value, and adjacent channel leakage power ratio value. One or more values ​​of the second measurement data include at least one of the following: power value, gain value, gain step value, gain compression value, phase shift value, gain flatness value, error vector amplitude value, separation value, spurious value, and adjacent channel leakage power ratio value. The method according to claim 2 or 3.

5. The first measurement data and the second measurement data, or at least one of the values ​​of the first measurement data and the second measurement data, are obtained based on the wireless reception of the signal by the device under test, or are obtained when the device under test is receiving the signal wirelessly. The method according to any one of claims 2 to 4.

6. The first measurement data includes at least one of the following values: power, gain value, gain step value, third-order intercept point value, phase shift value, gain flatness value, error vector amplitude value, separation value, and noise figure value. One or more values ​​of the second measurement data include at least one of the following: power value, gain value, third-order intercept point value, phase shift value, gain flatness value, error vector amplitude value, separation value, and noise figure value. The method according to any one of claims 2 to 5.

7. The second measurement data includes a first set of near-field measurement results associated with a first distance between the device under test and the antenna of the test mechanism, The second measurement data includes a second set of near-field measurement results associated with a second distance between the device under test and the antenna of the test mechanism, The optimized distance is determined based on the deviation between the set of near-field measurement results and the set of far-field measurement results. The method according to any one of claims 2 to 6.

8. The optimized distance is determined using a plurality of far-field measurement results associated with different frequencies and corresponding near-field measurement results. The method according to any one of claims 1 to 7.

9. Determining the optimized distance involves averaging the differences between a plurality of far-field measurement results associated with different frequencies and the corresponding near-field measurement results. The method according to any one of claims 1 to 8.

10. The optimized distance is determined such that the difference between the far-field measurement result and the corresponding near-field measurement result is smaller than a predetermined maximum deviation for all frequencies in the set of frequencies, or The optimized distance is determined such that the difference between the far-field measurement result and the corresponding near-field measurement result is less than or equal to a predetermined maximum deviation for all frequencies in the set of frequencies. The method according to any one of claims 1 to 9.

11. The optimized distance is determined such that the difference between the far-field measurement result and the corresponding near-field measurement result, or the near-field measurement result, does not exhibit a resonance effect for any frequency in the set of frequencies. The method according to any one of claims 1 to 10.

12. The method includes determining a single distance used for all frequencies in the set of frequencies as the optimized distance. The method according to any one of claims 1 to 11.

13. The method includes using a test program for manufacturing tests to obtain the first measurement data, The method according to any one of claims 1 to 12.

14. The method includes, in order to obtain the second measurement data, executing a manufacturing test program that controls the testing of the device under test for a plurality of distances and a plurality of test frequencies, The method according to any one of claims 1 to 13.

15. The method involves using a test program of a manufacturing test, which is repeated one or more times with a modified distance between the device under test and the antenna of the test mechanism to determine the optimized distance, or The method includes using a test program of a manufacturing test, supplemented by a function that results in iteration and changes in the distance between the device under test and the antenna of the test mechanism, in order to determine the optimized distance. The method according to any one of claims 1 to 14.

16. The method includes changing the distance between the device under test and the antenna of the test mechanism during the measurement used to obtain the near-field measurement result. The method according to any one of claims 1 to 15.

17. The method includes stepwise changing the distance between the device under test and the antenna of the test mechanism. The method according to any one of claims 1 to 16.

18. The method includes determining which of several subsets of the second measurement data associated with different distances has the greatest similarity to the first measurement data. The method includes determining the optimized distance based thereon, The method according to any one of claims 1 to 17.

19. The method further includes determining a distance over which the standing wave behavior occurs for each frequency in the set of frequencies. The optimized distance is determined from the distances where there is no standing wave behavior or minimal standing wave behavior. The method according to any one of claims 1 to 18.

20. The method further includes generating a control signal for controlling the movement of the stage supporting the antenna of the test mechanism, The control signal moves the stage to at least two of the different distances. The method according to any one of claims 1 to 19.

21. A method for testing multiple devices under test, The method includes determining an optimized distance between the device under test and the antenna of the test mechanism using the method described in any one of claims 1 to 20. The optimized distance is determined using a manufacturing test program that is repeated one or more times with a modified distance between the device under test and the antenna of the test mechanism to determine the optimized distance, or the optimized distance is determined using a manufacturing test program that is supplemented by a function that results in repetition and a change in the distance between the device under test and the antenna of the test mechanism to determine the optimized distance. The method includes testing a plurality of devices under test using the manufacturing test program, wherein the distance between the devices under test is kept constant at a predetermined optimized distance. method.

22. A computer program for performing the method described in any one of claims 1 to 21, The aforementioned computer program is executed on a computer. Computer program.

23. A test mechanism for determining the optimal distance between the device under test and the antenna of the test apparatus, The aforementioned test mechanism is configured to acquire first measurement data. The aforementioned test mechanism is configured to acquire second measurement data, The test mechanism is configured to determine the optimized distance between the device under test and the antenna of the test mechanism based on the first measurement data and the second measurement data. The first measurement data represents a plurality of far-field measurement results that characterize the device under test for a set of frequencies, or the first measurement data is based on a plurality of far-field measurement results that characterize the device under test for a set of frequencies. The second measurement data represents a plurality of near-field measurement results that characterize the device under test for the set of frequencies, or the second measurement data is based on a plurality of near-field measurement results that characterize the device under test for the set of frequencies. At least two of the aforementioned near-field measurement results are obtained at multiple different distances between the device under test and the antenna of the test mechanism. Testing facility.

24. The device further comprises a device socket configured to receive the device under test, The test mechanism is configured to perform a number of tests when the device under test is placed in the device socket in order to obtain the near-field measurement results for the set of frequencies. At least two of the aforementioned tests are performed at different distances between the device under test and the antenna of the test mechanism in order to obtain the near-field measurement results for at least two different distances. The test mechanism according to claim 23.

25. The test mechanism further comprises a stage configured to support the antenna and move at least two different distances relative to the device socket, The test mechanism according to claim 23 or 24.

26. To obtain the first measurement data, the system further comprises a far-field test apparatus configured to perform tests on the device under test with the set of frequencies under far-field conditions. The test mechanism according to any one of claims 23 to 25.

27. The system further comprises a data interface configured to receive the first measurement data and / or the second measurement data. The test mechanism according to any one of claims 23 to 26.

28. A method described in any one of claims 1 to 21, The test mechanism according to any one of claims 23 to 27.

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