X-ray systems and methods

Abstract

The X-ray system comprises a first X-ray source and a second X-ray source. The first X-ray detector and the second X-ray detector have a first detector surface and a second detector surface configured to detect X-rays. The X-rays emitted from the first X-ray source and the second X-ray source are detected by the second X-ray detector and the first X-ray detector, respectively. The first X-ray source and the second X-ray source are configured to irradiate a target volume between the first X-ray source and the second X-ray source with X-rays, exposing an object within the target volume to X-rays. The X-rays emitted from the first X-ray source pass through the first detector surface before reaching the target volume. The X-rays emitted from the second X-ray source pass through the second detector surface of the second X-ray detector before reaching the target volume.

Description

Technical Field

[0001] The present disclosure relates to an X-ray system and an X-ray method for obtaining X-ray measurements for, for example, medical X-ray imaging or for general use of X-rays.

Background Art

[0002] X-ray systems are used in a wide range of fields such as medical diagnosis, image guidance, industrial inspection, quality control and measurement, and security. X-ray measurements such as X-ray imaging are based on the fact that the X-ray absorption coefficient varies depending on the substance.

[0003] Conventional X-ray imaging has been known since the 19th century and generates a single two-dimensional (2D) projection image of a three-dimensional (3D) object on an X-ray detection plate. Computed tomography (CT) is a more advanced imaging technique that generates a number of cross-sectional images of an object by collecting a series of 2D images of the same object viewed from different angles. A 3D image of the object can be reconstructed from these multiple 2D images. Thereby, the internal structure of the object can be clarified.

[0004] In a conventional CT scanner commonly used for medical image diagnosis, a single X-ray source (such as an X-ray tube) and an X-ray detector array facing it rotate around an object (such as a patient) placed inside a gantry that supports the X-ray source and the detector. By imaging hundreds of 2D projection images, a 3D stereoscopic image can be reconstructed.

[0005] Although these devices are effective for reconstructing 3D structures, conventional X-ray scanners are large devices and are costly to manufacture and maintain. Also, since they generate a high dose of radiation, they pose risks to operators and patients. Due to the structure of the detector, the spatial resolution is limited, and since it is necessary to move the parts of the detector, image reconstruction artifacts occur and the acquisition time becomes long. The latter is particularly a problem in CT scanners for industrial inspection applications where rapid throughput is required. Furthermore, it is necessary to move the object or human being to be imaged to the imaging device, which may be inconvenient.

[0006] Alternatively, CT scanners may feature multiple fixed, ring-shaped X-ray detectors, rotating the X-ray source around the gantry to acquire multiple 2D images. This is used in some devices, such as mammography systems. While these systems offer some advantages over rotating source / detector pair configurations, moving parts still introduce image artifacts, and acquiring images from multiple directions necessary for 3D image reconstruction requires a relatively large distance between the source and detectors. If the X-ray irradiation area of ​​the target is uneven, high doses of radiation are generated. Typically, large thermionic radiation sources are used. [Prior art documents] [Patent Documents]

[0007] [Patent Document 1] U.S. Patent No. 7634045 [Overview of the project] [Problems that the invention aims to solve]

[0008] U.S. Patent No. 7,634,045 describes a further alternative configuration for acquiring CT images, in which an electron beam generator produces an electron beam, which is electromagnetically guided to a series of focal points on an anode ring arranged around the patient, from which X-rays are generated. The generated X-rays are directed to detectors arranged concentrically around the system axis. This eliminates the need for moving parts and somewhat reduces image artifacts. However, acquiring images from multiple directions necessary for 3D image reconstruction still requires a large distance between the source and detectors, and the X-ray irradiation range to the tissue remains non-uniform.

[0009] Therefore, there is still a need for X-ray systems and methods that address some or all of these shortcomings. [Means for solving the problem]

[0010] According to a first embodiment, an X-ray system is provided comprising a first X-ray source configured to emit X-rays and a first X-ray detector having a first detector surface configured to detect X-rays, wherein at least a portion of the X-rays emitted from the first X-ray source propagates in a first emission direction, the first emission direction is away from the first detector surface, and lines along the first emission direction intersect the first detector surface.

[0011] This configuration allows the detector and radiation source to be superimposed on each other, providing a compact, integrated detector / radiation source device with no moving parts. This offers significant advantages in terms of portability and flexibility during X-ray measurement and imaging.

[0012] Optionally, the first emission direction is perpendicular to the first detector surface. This clearly defines the detection area and the direction of X-ray emission. Optionally, the first X-ray source is configured to irradiate a target volume with X-rays in order to expose an object within the target volume to X-rays. Optionally, the first emission direction is directed toward the target volume. This allows for measurement and image acquisition of an object within the target volume.

[0013] Optionally, X-rays emitted from the first X-ray source pass through the first detector surface before reaching the target volume. This prevents the X-ray source from interfering with the X-rays reaching the detector surface from the target volume, thereby improving detection performance.

[0014] According to a second embodiment, an X-ray system is provided comprising a first X-ray source configured to emit X-rays and a first X-ray detector having a first detector surface configured to detect X-rays, wherein the first X-ray source is configured to irradiate a target volume with X-rays in order to expose an object within the target volume to X-rays, and the X-rays emitted from the first X-ray source pass through the first detector surface before reaching the target volume.

[0015] This configuration allows the detector and the radiation source to be superimposed on each other, providing a compact detector / radiation source integrated device without moving parts. The X-ray source does not obstruct the X-rays reaching the detector surface from the target volume, thereby improving detection performance.

[0016] Optionally, the system is configured such that a) the signal from the first X-ray detector due to X-rays emitted from the first X-ray source is ignored, and / or b) the first X-ray detector does not generate a signal in response to X-rays emitted from the first X-ray source and passing through the first detector surface. This prevents the X-ray detector from being affected by X-rays passing from the X-ray source through the detector surface, thereby improving the performance of the detector.

[0017] Optionally, this system may be equipped with multiple primary X-ray sources. This allows for improved X-ray irradiation of the object being measured.

[0018] The first X-ray source can be selectively controlled as needed. Each first X-ray source can be selectively controlled individually as needed. This makes it possible to irradiate different parts of a target at different times, which can be used, for example, to construct CT images.

[0019] Optionally, the system is configured to selectively control the first X-ray sources so that the maximum power consumption of multiple first X-ray sources falls below a predetermined power threshold while the first X-ray source is emitting X-rays. This limits the power requirements of the system so that it can be operated using readily available power supplies or even battery systems. This further improves portability and flexibility of use.

[0020] Optionally, the first X-ray source is located in the emitter layer and the first detector surface is located in the detector layer. This provides the device with a clear layered structure, which may be advantageous in terms of improving ease of manufacture.

[0021] Optionally, the detector layer is adjacent to or in contact with the emitter layer. This provides a clear spatial relationship between the detector and the radiation source and can improve compactness.

[0022] Optionally, the system includes a plurality of first X-ray sources that are uniformly distributed across the emitter layer. The uniform distribution results in more uniform irradiation of the object being measured.

[0023] Optionally, the first X-ray sources are configured to emit X-rays through the detector layer. This enables the X-ray sources to not block the X-rays reaching the detector surface from the target volume and can improve detection performance.

[0024] Optionally, the emitter layer and the detector layer are flat and / or parallel. This clearly defines the emission direction and the detection direction of the system.

[0025] Optionally, the system further includes a filtering element configured to absorb X-rays emitted from the first X-ray sources and having an energy below a predetermined threshold. Some types of X-ray sources may emit low-energy X-rays. These low-energy X-rays are not suitable for high-quality measurements and may introduce unwanted noise into the detection signal. Therefore, filtering them can improve the measurement quality.

[0026] Optionally, the first X-ray sources are configured to irradiate the target volume with X-rays to expose an object within the target volume to the X-rays, and the system further includes a shielding element configured to absorb the X-rays that have passed through the first detector surface in a direction away from the target volume. This can reduce the leakage of X-rays from the target volume and reduce the radiation exposure to the operator, other nearby people, and equipment.

[0027] Optionally, the system includes a plurality of first X-ray detectors. This enables detection from multiple angles and positions, improves the imaging resolution, and allows for CT reconstruction of three-dimensional images.

[0028] The first detector surfaces of multiple first X-ray detectors are arbitrarily arranged on the same plane. This ensures uniform distance and arrangement between detectors, allowing for easy integration and analysis of measurement results.

[0029] The maximum overall dimension of the first detector surface of multiple first X-ray detectors within the plane of the first X-ray detectors is 40 cm or less, arbitrarily 30 cm or less, or arbitrarily 25 cm or less. This improves the compactness of the system and enables high portability and flexibility of use.

[0030] Optionally, the minimum overall dimension of the first detector surface of multiple first X-ray detectors within the plane of the first X-ray detectors is 5 cm or more, and optionally 10 cm or more. This ensures a minimum measurement area for good quality measurements in some applications, such as medical imaging diagnostics.

[0031] Optionally, this system may include multiple first X-ray sources, the maximum overall dimensions of the first X-ray sources being less than or equal to the maximum overall dimensions of the first detector surfaces of the multiple first X-ray detectors within the plane of the first X-ray detectors. This allows the X-ray sources to be housed within the dimensions of the detectors, thus maintaining a compact overall system.

[0032] Optionally, the X-ray system further comprises a second X-ray source configured to emit X-rays and a second X-ray detector having a second detector surface configured to detect X-rays, wherein the system is configured such that X-rays emitted from the first X-ray source are detected by the second X-ray detector, and X-rays emitted from the second X-ray source are detected by the first X-ray detector. By including the second X-ray source and the second X-ray detector, it becomes possible to detect X-rays after they have passed through the target volume from potentially different directions, enabling more complete measurement and imaging applications.

[0033] Optionally, at least a portion of the X-rays emitted from the second X-ray source propagates toward the first X-ray source in the direction of the second emission. This results in the X-ray sources irradiating the target from different directions.

[0034] According to a third aspect, an X-ray system is provided, the X-ray system comprising a first X-ray source configured to emit X-rays, a second X-ray source configured to emit X-rays, a first X-ray detector having a first detector surface configured to detect X-rays, and a second X-ray detector having a second detector surface configured to detect X-rays, wherein the X-rays emitted from the first X-ray source are detected by the second X-ray detector, the X-rays emitted from the second X-ray source are detected by the first X-ray detector, and at least a portion of the X-rays emitted from the second X-ray source propagate toward the first X-ray source in the second emission direction.

[0035] By arranging the X-ray source and detector opposite each other, a compact system that provides high-resolution measurements and CT images without using moving parts can be realized.

[0036] Optionally, at least a portion of the X-rays emitted from the first X-ray source propagate in the first emission direction, while the second emission direction is parallel to and opposite to the first emission direction. This ensures that the orientations of the first and second X-ray sources are clearly opposite.

[0037] According to a fourth aspect, an X-ray system is provided, comprising a first X-ray source configured to emit X-rays, a second X-ray source configured to emit X-rays, a first X-ray detector having a first detector surface configured to detect X-rays, and a second X-ray detector having a second detector surface configured to detect X-rays, wherein X-rays emitted from the first X-ray source are detected by the second X-ray detector, X-rays emitted from the second X-ray source are detected by the first X-ray detector, at least a portion of the X-rays emitted from the first X-ray source propagates in a first emission direction, and at least a portion of the X-rays emitted from the second X-ray source propagates in a second emission direction which is parallel to and opposite to the first emission direction.

[0038] This ensures that the orientations of the first and second X-ray sources are clearly opposite. This configuration also enables the realization of a compact system that provides high-resolution measurements and CT images without the use of moving parts.

[0039] Optionally, this system can be equipped with multiple first X-ray sources and multiple second X-ray sources. This allows for improved X-ray irradiation of the object being measured.

[0040] Optionally, the system is configured so that multiple first-order X-ray detectors detect X-rays emitted from two or more second-order X-ray sources. This allows for measurement of the target from different angles and orientations.

[0041] Optionally, the system can be configured to selectively control the second X-ray source to sequentially emit X-rays so that X-rays emitted from different second X-ray sources are detected by the first X-ray detector at different times. Optionally, the system can be configured to selectively control the first X-ray source to sequentially emit X-rays so that X-rays emitted from different first X-ray sources are detected by the second X-ray detector at different times. This allows for the separation of signals from different X-ray sources, which can be used for applications such as CT reconstruction.

[0042] Optionally, this system may include multiple first-order X-ray detectors, each configured to detect X-rays emitted from different subsets of the second-order X-ray source. Optionally, this system may also include multiple second-order X-ray detectors, each configured to detect X-rays emitted from different subsets of the first-order X-ray source group. This allows for detection from multiple angles and positions, improving imaging resolution and enabling CT reconstruction of 3D images.

[0043] Optionally, the first X-ray source and / or the second X-ray source are configured to irradiate a target volume located between the first and second X-ray sources with X-rays in order to expose an object within the target volume to X-rays. This allows for measurement and image acquisition of the object within the target volume. By providing the volume between the two X-ray sources, irradiation can be performed from multiple directions.

[0044] Optionally, the system is configured to acquire sufficient X-ray images to perform two-dimensional and / or three-dimensional tomographic reconstruction of an object within a target volume, and optionally, the object includes mammalian tissue. This makes it possible to determine the detailed structure of the object, for example, for medical purposes.

[0045] Optionally, X-rays emitted from the second X-ray source pass through the second detector surface of the second X-ray detector before reaching the target volume. This prevents the second X-ray source from blocking X-rays reaching the second detector surface from the target volume, thereby improving detection performance.

[0046] Optionally, the maximum linear dimension of the target volume is 50% or more, optionally 70% or more, or optionally 80% or more of the distance between the first and second X-ray sources. Optionally, the minimum linear dimension of the target volume is 10% or more, optionally 20% or more, or optionally 40% or more of the distance between the first and second X-ray sources. By ensuring that the target volume occupies most of the space between the two X-ray sources, the compactness relative to the size of the object being measured can be improved.

[0047] Optionally, the minimum linear dimension of the target volume is 5 cm or more, and optionally 10 cm or more. This ensures a target volume large enough to accommodate typical objects to be measured.

[0048] Optionally, this system comprises multiple first X-ray sources and multiple second X-ray sources, and includes one or both of the following: a) The maximum linear dimension of the target volume is 25% or more, optionally 50% or more, optionally 70% or more, or optionally 80% or more of the maximum distance between any first X-ray source and any second X-ray source. b) The minimum linear dimension of the target volume is 10% or more, optionally 20% or more, or optionally 40% or more of the maximum distance between any first X-ray source and any second X-ray source. By having the target volume occupy most of the space between sources, compactness relative to the size of the object being measured can be improved.

[0049] Optionally, the arrangement of the first and second X-ray sources is such that, when all first and second X-ray sources are operating simultaneously, at least a portion of the target volume is irradiated by X-rays emitted from at least two different first or second X-ray sources. This allows for measurements from different angles, providing more information about the target and enabling CT reconstruction.

[0050] Optionally, the system comprises at least two different first or second X-ray sources, each comprising at least one first X-ray source and at least one second X-ray source. Performing measurements using X-rays propagating in opposite directions is particularly advantageous in improving irradiation uniformity and measurement quality.

[0051] Optionally, the system comprises a first X-ray detector having a first detector surface configured to detect X-rays, and a second X-ray detector having a second detector surface configured to detect X-rays, wherein the first detector surface of the first X-ray detector and the second detector surface of the second X-ray detector are flat and parallel to each other. This ensures that the orientations of the first X-ray detector and the second X-ray detector are clearly opposite.

[0052] The distance between the first and second X-ray sources can be arbitrarily set to 40 cm or less, arbitrarily 30 cm or less, or arbitrarily 22 cm or less. This allows the system to maintain a compact configuration, improving portability and ease of use.

[0053] The distance between the first and second X-ray sources can be 5 cm or more, optionally 10 cm or more, or optionally 15 cm or more. This ensures a space large enough to accommodate typical objects to be measured.

[0054] Optionally, the system comprises a plurality of first X-ray sources and a plurality of second X-ray sources, the system comprises a plurality of first X-ray detectors and a plurality of second X-ray detectors, the first detector surface of the first X-ray detector and the second detector surface of the second X-ray detector are arranged such that the cross-section passing through the first and second detector surfaces forms a regular polygon having an even number of sides, the first X-ray sources and the second X-ray sources are arranged at the periphery of the regular polygon, each first X-ray detector is configured to detect X-rays emitted from a second X-ray source located on the opposite side of the regular polygon from the side on which the first X-ray detector is located, and each second X-ray detector is configured to detect X-rays emitted from a first X-ray source located on the opposite side of the regular polygon from the side on which the second X-ray detector is located. Optionally, the regular polygon has four or more sides, optionally six or more sides, or optionally eight sides. This allows for imaging of the target from a wider range of angles and orientations, further improving the detail of the measurement and the quality of the imaging performance.

[0055] Optionally, the system includes a support configured to support a first X-ray source and a first X-ray detector, the support configured to be fixedly engaged with a frame that holds the object to be irradiated with X-rays, and optionally, the frame is a stereotactic head frame. This allows for the fixing of the spatial relationship between the X-ray source, the X-ray detector, and the object, and enables the obtaining of the precise relative position of the frame and the object.

[0056] According to a fifth aspect, an X-ray system is provided, comprising a first X-ray source configured to emit X-rays, a second X-ray detector having a second detector surface configured to detect X-rays emitted from the first X-ray source, and a support configured to support the first X-ray source and the second X-ray detector, wherein the support is configured to be fixedly engaged with a frame for performing brain measurements, the frame being a stereotactic head frame, and the distance between the first X-ray source and the second X-ray detector is 40 cm or less.

[0057] This makes it possible to provide an X-ray system that is compact enough to be mounted on the head of a stereotactic frame. This allows for medical imaging diagnosis of patients in the preparatory stages of neurosurgery. It offers significant advantages, including greater comfort and easier setup and implementation for the attending physician.

[0058] Optionally, the support is configured to engage with the frame such that when the support engages with the frame, the first X-ray source and the first X-ray detector assume a predetermined positional relationship with the frame. This allows for the precise relative position of the frame and the structure identified in the X-ray measurement.

[0059] Optionally, the support comprises one or more engagement features configured to engage with corresponding mounting features of a frame. This allows the X-ray system to be easily and conveniently attached to and detached from the frame. According to a sixth embodiment, a system is provided for preparing a surgical instrument configured to engage with a stereotactic head frame, the system comprising the X-ray system of the fifth embodiment and a processor configured to determine the settings of the surgical instrument based on measurements made using the X-ray system.

[0060] Frame-mounted X-ray systems allow for the fixing of the spatial relationship between the X-ray source, X-ray detector, and object, enabling the acquisition of precise relative positions between the frame and the object. For surgical instruments, this allows for the automatic determination of complex and time-consuming settings, such as the position and trajectory of the surgical instrument, which would otherwise require manual determination.

[0061] According to the seventh embodiment, a radiotherapy system is provided, the radiotherapy system comprising an X-ray system according to the third or fourth embodiment, and a processor configured to acquire measurements of a subject using the X-ray system, identify a target structure within the subject based on the measurements, and control the X-ray system to irradiate the target structure with a therapeutic X-ray dose, wherein the processor is configured to control a first X-ray source and / or a second X-ray source to emit X-rays at a first intensity while acquiring measurements, and the processor is configured to control the first X-ray source and / or the second X-ray source to emit X-rays at a second intensity while irradiating a therapeutic dose, the first intensity being lower than the second intensity.

[0062] This allows for real-time tracking of the sub-region to which therapeutic radiation is irradiated, and corresponding adjustments to the irradiation location. This can enhance the therapeutic effect and reduce radiation exposure to surrounding healthy areas.

[0063] This system is portable and can be carried by a person at will. This improves the ease of use of the system and the comfort of the patient.

[0064] The first X-ray source and first X-ray detector remain stationary while the target is being irradiated using this system. This reduces mechanical complexity and improves measurement quality.

[0065] Optionally, the first X-ray source is configured to emit X-rays with controllable energy. This allows for energy adjustment to suit various applications, such as measuring objects containing different materials.

[0066] Optionally, the first X-ray source is configured to emit cone-beam X-rays. This results in an easily available X-ray source configuration that can cover a wide area.

[0067] Optionally, the system includes a collimator configured to shape the X-ray beam emitted from the first X-ray source. Optionally, the collimator is configured to shape the beam into a rectangular beam, or optionally into a square beam. This allows for more precise control of the volume irradiated with X-rays.

[0068] Optionally, the first X-ray source includes a cold cathode field emission electron source, such as a carbon nanotube layer, a graphene multilayer structure, bulk graphene, or a spint emitter. These X-ray sources have advantages over conventional X-ray sources such as X-ray tubes, including a compact design and low power requirements.

[0069] Optionally, the first X-ray source includes a transmission X-ray target, which optionally includes tungsten, tantalum, or molybdenum. These targets convert high-energy electrons within the X-ray source into X-rays that can be used for measurement.

[0070] Optionally, the first X-ray detector is a digital X-ray detector, such as an organic photodetector (OPD), an organic-inorganic hybrid semiconductor, or a low-gain avalanche diode (LGAD). These detectors are compact and can be easily integrated into digital systems.

[0071] Optionally, an X-ray system is an X-ray imaging system. This is a particularly desirable application, for example, in medical imaging diagnosis or industrial surveillance.

[0072] According to the eighth aspect, a method for performing X-ray measurement of an object is provided, in which X-rays are emitted from a first X-ray source to irradiate a target volume containing the object, at least a portion of the X-rays emitted from the first X-ray source propagates in a first emission direction, the first emission direction is away from the first detector surface of the first X-ray detector, and the line along the first emission direction intersects with the first detector surface, and in this method, X-rays from the first X-ray source are detected on the second detector surface of the second X-ray detector.

[0073] This configuration allows the detector and radiation source to be superimposed on each other, providing a compact, integrated detector / radiation source device with no moving parts. This offers significant advantages in terms of portability and flexibility in X-ray measurement and imaging.

[0074] Optionally, at least a portion of the X-rays emitted from the first X-ray source passes through the first detector surface of the first X-ray detector before reaching the target volume. This prevents the X-ray source from blocking the X-rays reaching the detector surface from the target volume, thereby improving detection performance.

[0075] According to the ninth aspect, a method is provided for obtaining an X-ray measurement of a target, the method comprising emitting X-rays from a first X-ray source to irradiate a target volume containing the target, at least a portion of the X-rays emitted from the first X-ray source passing through a first detector surface of a first X-ray detector before reaching the target volume, and the method detecting the X-rays from the first X-ray source on a second detector surface of a second X-ray detector.

[0076] This prevents the X-ray source from blocking the X-rays reaching the detector surface from the target volume, thereby improving detection performance.

[0077] Optionally, a portion of the X-rays emitted from the first X-ray source propagates in the first emission direction, which is away from the first detector surface, and the line along the first emission direction intersects with the first detector surface. This configuration allows the detector and the X-ray source to be superimposed on each other, providing a compact detector / source integrated device without moving parts.

[0078] Optionally, this method further involves emitting X-rays from a second X-ray source to irradiate the target volume and detecting the X-rays from the second X-ray source on the first detector surface. By including the second X-ray source, the X-rays that have passed through the target volume can be detected from different directions in some cases, allowing for more complete measurements and application to imaging purposes.

[0079] Optionally, at least a portion of the X-rays emitted from the second X-ray source propagates in the second emission direction, the second emission direction is away from the second detector surface, and the line along the second emission direction intersects with the second detector surface.

[0080] Optionally, some of the X-rays emitted from the second X-ray source pass through the second detector surface before reaching the target volume. This prevents the X-ray source from blocking the X-rays reaching the detector surface from the target volume, thereby improving detection performance.

[0081] According to the tenth embodiment, a method is provided for obtaining X-ray measurements of a target, in which X-rays are emitted from a first X-ray source to irradiate a target volume containing the target, X-rays are emitted from a second X-ray source to irradiate the target volume, at least a portion of the X-rays emitted from the second X-ray source propagates toward the first X-ray source, the method detects the X-rays from the first X-ray source on the second detector surface of the second X-ray detector and detects the X-rays from the second X-ray source on the first detector surface of the first X-ray detector. As a result, the X-ray sources irradiate the target from different directions.

[0082] According to the eleventh embodiment, a method is provided for obtaining X-ray measurements of a target, which involves emitting X-rays from a first X-ray source in a first emission direction to irradiate a target volume containing the target, emitting X-rays from a second X-ray source in a second emission direction to irradiate the target volume containing the target, detecting X-rays from the first X-ray source on the second detector surface of the second X-ray detector, and detecting X-rays from the second X-ray source on the first detector surface of the first X-ray detector, wherein the second emission direction is parallel to and opposite to the first emission direction. As a result, the X-rays from the first X-ray source and the second X-ray source are clearly in opposite directions.

[0083] According to the twelfth aspect, a method is provided for preparing an apparatus to interact with an object, the method of acquiring measurements of the object using an X-ray system from any one of the first to seventh aspects, and determining the apparatus settings based on the measurements. Automatically determining the apparatus settings can simplify processes such as industrial manufacturing that rely on X-ray measurements for feedback or monitoring.

[0084] According to the 13th aspect, a method is provided for preparing a surgical instrument configured to engage with a stereotactic head frame, the method comprising engaging a support of an X-ray system with the stereotactic head frame while the stereotactic head frame is mounted on the patient's head, obtaining measurements of at least a portion of the patient's head using the X-ray system, and adjusting the settings of the surgical instrument based on the measurements.

[0085] Frame-mounted X-ray systems allow for the fixing of the spatial relationship between the X-ray source, X-ray detector, and target, enabling the acquisition of precise relative positions between the frame and the target. In the case of surgical instruments, this allows for the automatic determination of settings that would otherwise be complex and time-consuming to determine manually, such as the position and trajectory of the surgical device.

[0086] Optionally, the X-ray system comprises a first X-ray source configured to emit X-rays and a first X-ray detector having a first detector surface configured to detect X-rays, wherein the support of the X-ray system is configured to support the first X-ray source and the first X-ray detector, and the support of the X-ray system is configured to engage with a stereotactic head frame such that when the X-ray system engages with the frame, the first X-ray source and the first X-ray detector assume a predetermined positional relationship with respect to the stereotactic head frame. This allows for obtaining the precise relative position between the frame and the structure identified in the X-ray measurement.

[0087] Optionally, the first X-ray source and the first X-ray detector remain stationary relative to the positioning head frame during the measurement. This reduces artifacts caused by movement of the source and detector, and consequently improves measurement quality.

[0088] Optionally, the position of at least a portion of the surgical instrument relative to the patient's head when the surgical instrument is engaged with the stereotactic head frame is included in the instrument settings. These settings are typically determined manually in current procedures, which is time-consuming and inefficient.

[0089] Optionally, obtaining measurements involves acquiring multiple images sufficient to perform two-dimensional and / or three-dimensional tomographic reconstruction of the patient's head. This allows for the determination of detailed head structure, for example, for planning neurosurgical procedures.

[0090] Optionally, the adjustment of settings includes determining the trajectory from the outside of the head to the target structure inside the head, based on a tomographic reconstruction of the head. Trajectory planning is a time-consuming process in planning neurosurgical procedures, but the additional automation provided by this method can improve efficiency.

[0091] Optionally, the adjustment of the settings includes determining the position of the target structure within the head using predetermined positions of the first X-ray source and the first X-ray detector. The predetermined positions relative to the head frame allow for precise determination of the target position.

[0092] Optionally, position determination does not involve the use of one or more reference markers in the image. Reference markers are commonly used in current methods, but their placement and setup are time-consuming. This method eliminates the need for markers because the positions of the radiation source and detector are predetermined.

[0093] According to a fourteenth aspect, a method is provided for determining the location of a structure within an object, the method comprising engaging a support of an X-ray system with a frame mounted on the object, the X-ray system comprising a first X-ray source configured to emit X-rays and a first X-ray detector having a first detector surface configured to detect X-rays, the support being configured to support the first X-ray source and the first X-ray detector, the method obtaining measurements of the object using the X-ray system and determining the location of a structure within the object based on the measurements, the X-ray system being configured to engage with the frame such that when the X-ray system engages with the frame, the first X-ray source and the first X-ray detector are in a predetermined positional relationship with respect to the frame, and the location of the structure is defined by coordinates with respect to the frame. The method makes it possible to obtain the precise relative position between the frame and the structure identified in the X-ray measurement.

[0094] Optionally, the first X-ray source and the first X-ray detector remain stationary relative to the frame during the measurement. This reduces artifacts caused by the movement of the source and detector, and consequently improves the measurement quality.

[0095] The subject is an animal, and the structure is an anatomical structure. This is one of the important applications of X-ray systems, such as for medical purposes.

[0096] Optionally, the subject is a human head, and the frame is a stereotactic head frame. This allows the method to be used for applications such as planning brain surgery.

[0097] Optionally, obtaining measurements involves acquiring multiple images sufficient to perform two-dimensional and / or three-dimensional tomographic reconstruction of the object. This allows for the determination of the object's detailed structure.

[0098] Optionally, position determination includes using predetermined positions of the first X-ray source and the first X-ray detector. The target position can be accurately determined by a predetermined positional relationship with respect to the head frame.

[0099] Optionally, position determination does not involve the use of one or more reference markers in the image. Reference markers are commonly used in current methods, but their placement and setup are time-consuming. In this method, the positions of the radiation source and detector are predetermined, eliminating the need for markers.

[0100] According to the 15th embodiment, a radiotherapy method is provided, which involves obtaining measurements of a subject using an X-ray system of the third or fourth embodiment, identifying a target structure within the subject based on the measurements, controlling the X-ray system to irradiate the target structure with a therapeutic X-ray dose, controlling the first X-ray source and / or second X-ray source to emit X-rays at a first intensity while obtaining measurements, and controlling the first X-ray source and / or second X-ray source to emit X-rays at a second intensity while irradiating with a therapeutic dose, wherein the first intensity is lower than the second intensity.

[0101] This allows for real-time tracking of the target structure to which therapeutic radiation is being delivered, and adjustment of the radiation delivery location accordingly. This can enhance the therapeutic effect and reduce radiation exposure to surrounding healthy areas. [Brief explanation of the drawing]

[0102] Embodiments of the present invention will be described by non-limiting examples with reference to the accompanying drawings. [Figure 1] This is a diagram showing the X-ray system. [Figure 2] This figure shows an X-ray system having an emitter layer and a detector layer. [Figure 3] This figure shows the X-ray system in Figure 1 that irradiates the target volume. [Figure 4] This is a diagram showing another X-ray system. [Figure 5] This figure shows an X-ray system equipped with multiple X-ray sources and X-ray detectors. [Figure 6] This figure shows an example of the arrangement of the X-ray source and X-ray detector. [Figure 7] This figure shows another example of the arrangement of the X-ray source and X-ray detector. [Figure 8] This diagram shows an X-ray system comprising a first X-ray source and a second X-ray source, and a first X-ray detector and a second X-ray detector. [Figure 9] This figure shows an X-ray system comprising multiple first X-ray sources and second X-ray sources, and multiple first X-ray detectors and second X-ray detectors. [Figure 10] This is a diagram showing a conventional X-ray system. [Figure 11] This figure shows a conventional X-ray system equipped with multiple X-ray sources. [Figure 12] This figure shows the X-ray irradiation of an object using the type of X-ray system shown in Figure 9. [Figure 13] This figure shows the irradiation of a target with X-rays using an X-ray system of the type shown in Figure 9, which has more X-ray sources than the system in Figure 12. [Figure 14] This diagram shows a system in which the first and second X-ray sources, and the first and second X-ray detectors are arranged in a square. [Figure 15] This diagram shows a system in which the first and second X-ray sources, and the first and second X-ray detectors are arranged in a hexagonal pattern. [Figure 16] This diagram shows a system in which the first and second X-ray sources and the first and second X-ray detectors are arranged in an octagon, and selective control of the X-ray sources is used to acquire measurements of a portion of the target object. [Figure 17] This figure shows an example of the system implementation shown in Figure 15 for medical image diagnosis. [Figure 18] This figure shows an example of the system implementation shown in Figure 15 for X-ray fluorescence measurement. [Figure 19] This figure shows a system in which an X-ray source and an X-ray detector are supported by a support. [Figure 20] This figure shows a system configured in which a support is engaged with a positioning head frame. [Figure 21] This diagram shows the system in Figure 20 engaged with the positioning head frame. [Figure 22] This is a flowchart showing how to obtain X-ray measurements. [Figure 23] This is a flowchart showing how to prepare the equipment or locate the structure. [Modes for carrying out the invention]

[0103] To address the various limitations of existing X-ray systems as described above, this disclosure provides an X-ray system 1 as shown in Figure 1. The X-ray system 1 may be an X-ray imaging system configured, for example, to acquire two-dimensional images.

[0104] The X-ray system 1 may be portable and may be optionally carried by a person. The size and weight of the X-ray system 1 may be such that it can be carried or moved by two people, or optionally one person, without mechanical assistance. The X-ray system 1 may be configured to be worn or carried by a person. This is optional, and the size of the X-ray system 1 in a particular implementation will vary depending on the requirements of the specific application. For example, as will be discussed later, an implementation of the X-ray system 1 for medical imaging of the brain may be significantly smaller than an implementation for industrial inspection of large components.

[0105] The X-ray system 1 includes a first X-ray source 3 configured to emit X-rays. The first X-ray source 3 can be configured to emit X-rays with wavelengths from 10 nm to 10 pm. The first X-ray source 3 can be configured to emit X-rays of controllable energy or wavelength. In other words, the energy or wavelength of the X-rays emitted from the first X-ray source 3 is controllable. This enables spectral X-ray measurements, allowing for measurements at multiple different wavelengths of a target and obtaining different information.

[0106] The first X-ray source 3 may be configured to emit X-rays with controllable intensity. This allows the output of the emitted X-rays to be varied while keeping the wavelength of the emitted X-rays constant. Intensity control may be achieved by any suitable method, such as reducing the continuous output of the first X-ray source 3 or changing the duty cycle of the first X-ray source 3.

[0107] The first X-ray source 3 may comprise any suitable known type of X-ray source. The most common X-ray source comprises a cathode configured to emit an electron beam (i.e., an electron source) and an anode (X-ray target) to which the electron beam is irradiated. High-energy electrons colliding with the anode cause the emission of X-rays.

[0108] Preferably, the first X-ray source 3 includes a cold cathode field emission electron source. In a field emission electron source, a high electric field is applied to a cathode with a high aspect ratio shape, thereby enhancing the electric field at the tip of the cathode. This allows electrons to be emitted without raising the cathode temperature. The cathode of the first X-ray source 3 may not be heated above 100°C during X-ray emission by the first X-ray source 3, and may optionally not be heated above 50°C. This is in comparison to the typical temperature of 2500°C or higher for conventional hot cathode X-ray tubes. This type of electron source is advantageous compared to conventional X-ray sources in terms of miniaturization of the X-ray system and reduction of power requirements. For example, the first X-ray source 3 may include a carbon nanotube layer, a graphene multilayer structure, bulk graphene, or a spint emitter.

[0109] The first X-ray source 3 may include a transmission X-ray target. The X-ray target is usually a metal. For example, the X-ray target may include tungsten, tantalum, or molybdenum.

[0110] The first X-ray source 3 may be configured to emit cone-beam-shaped X-rays. The cone beam may have a cone angle of up to 60 degrees, optionally up to 30 degrees, optionally up to 20 degrees, optionally up to 12 degrees, and optionally up to 5 degrees.

[0111] The X-ray system 1 may include a collimator configured to shape the X-ray beam emitted from the first X-ray source 3. The shape used may vary depending on the intended application and the area or volume to be irradiated by the X-rays. For example, a collimator with a small circular aperture may be used to obtain a cone beam. Alternatively, the collimator may be configured to shape the beam into a rectangular beam, or optionally a square beam.

[0112] The X-ray system 1 further comprises a first X-ray detector 5 having a first detector surface 7 configured to detect X-rays. The first X-ray detector 5 can be any suitable detector capable of detecting X-rays. Preferably, the first X-ray detector 5 is a digital X-ray detector, such as an organic photodetector (OPD), an organic-inorganic hybrid semiconductor, or a low-gain avalanche diode (LGAD).

[0113] The first X-ray source 3 and the first X-ray detector 5 may remain stationary while the object is exposed to X-rays using the X-ray system 1. This is preferable to avoid the mechanical complexities and image artifacts that can occur in known systems due to the movement of the X-ray source and / or detector.

[0114] As shown in Figure 2, the first X-ray source 3 may be provided in the emitter layer 9, and the first detector surface 7 may be provided in the detector layer 11. The emitter layer 9 may include other elements of the X-ray system 1 to support the function of the first X-ray source 3, such as control electronic equipment, electrical wiring, or a heat sink. Similarly, the detector layer 11 may include elements to support the function of the first X-ray detector 5.

[0115] The detector layer 11 may be adjacent to or in contact with the emitter layer 9. This provides a clear spatial relationship between the first X-ray source 3 and the first X-ray detector 5. It also simplifies manufacturing challenges, for example, by allowing the detector layer 11 and the emitter layer 9 to be manufactured separately and then assembled. The emitter layer 9 and the detector layer 11 may be flat and / or parallel to each other.

[0116] The X-ray system 1 may further include a filtering element 13 as shown in Figure 2. The filtering element 13 is configured to absorb X-rays (or other electromagnetic radiation) emitted from the first X-ray source 3 that have energy below a predetermined threshold. This reduces noise in the detector caused by low-energy radiation that is insufficient to provide high-quality measurements or images. The filtering element 13 may also be configured to absorb X-rays (or other electromagnetic radiation) that have energy above a predetermined threshold. This makes it possible to limit the X-rays used for measurement to a known range. The filtering element 13 may be provided as part of the detector layer 11, or the detector layer 11 itself may be configured to provide a filtering effect. In the latter case, it is not necessary to provide a separate filtering element 13 within the structure of the detector layer 11. The material of the detector layer 11 itself, for example, the material of the first detector surface 7, absorbs some of the X-rays emitted from the first X-ray source 3. This makes it possible to obtain a filtering effect without requiring a separate filtering element 13.

[0117] The X-ray system 1 is configured such that at least a portion of the X-rays emitted from the first X-ray source 3 propagate in a first emission direction 15. The first emission direction 15 may be oriented away from the first detector surface 7. As shown in Figure 1, the first emission direction 15 may be perpendicular to the first detector surface 7, but this is not mandatory.

[0118] As shown in Figure 3, the X-ray system 1 may further include a shielding element 19 configured to absorb X-rays that pass through the first detector surface 7 in a direction away from the target volume 17. The shielding element 19 may be positioned behind both the first X-ray source 3 and the first X-ray detector 5 along the first emission direction. This prevents X-rays from passing completely through the X-ray system 1, thereby reducing the risk to the operator of the X-ray system 1 and the amount of radiation exposure.

[0119] When a collimator is used, it may already be sufficient to block X-rays that pass through the first detector surface 7 in a direction away from the target volume 17. By design, the collimator absorbs X-rays emitted from the first X-ray source 3, except for those emitted along the desired trajectory. Therefore, the collimator also absorbs X-rays that travel in the opposite direction toward the first X-ray source 3 and do not precisely match the desired trajectory. Even X-rays that pass through the collimator toward the first X-ray source 3 are likely to collide with and be absorbed by parts of the first X-ray source 3 itself, such as the anode. This achieves bidirectional shielding and suppresses external exposure to the operator. This may allow for a reduction in the size and weight of the separate shielding element 19, or even make the shielding element 19 completely unnecessary.

[0120] As shown in Figure 3, the first X-ray source 3 may be configured to irradiate the target volume 17 with X-rays in order to expose the object within the target volume 17 to X-rays. The first emission direction 15 may be directed toward the target volume 17. The X-rays irradiating the target volume 17 interact with the object within the target volume 17. For example, some of the X-rays are absorbed by the object. By detecting the X-rays emitted from the target volume 17 after the interaction with the object, information about the object's characteristics can be obtained.

[0121] X-rays emitted from the target volume 17 after interaction with the object may be detected by the first X-ray detector 5, depending on the application. For example, X-rays may be reflected and / or scattered from the object, or X-rays generated by interactions such as fluorescence between X-rays emitted from the first X-ray source 3 and the object may be detected by the first X-ray detector 5. Alternatively or additionally, X-rays may be detected by another detector other than the first X-ray detector 5.

[0122] However, it may be desirable to avoid detecting the X-rays emitted from the first X-ray source 3 with the first X-ray detector 5. Optionally, the X-ray system 1 is a non-backscattering system that does not rely on backscattered X-rays that may be reflected or scattered by objects within the target volume 17. In this case, the X-ray system 1 may ignore, exclude, or not measure backscattered X-rays. For example, the X-rays emitted from the first X-ray source 3 may be ignored, excluded, or not measured by the first X-ray detector 5. Instead, the X-ray system 1 may measure only the X-rays emitted from the first X-ray source 3 that have passed through objects within the target volume 17 and / or been scattered at an angle of less than 90 degrees, optionally less than 45 degrees. The X-rays emitted from the first X-ray source 3 may also be measured by an X-ray detector other than the first X-ray detector 5, for example, the second X-ray detector 25 described later.

[0123] The X-ray system 1 may be configured such that a line along the first emission direction 15 intersects the first detector surface 7. This line is a virtual line along the first emission direction 15 and can be extended to any length. This line should intersect the first detector surface 7 itself, i.e., the portion of the X-ray system 1 configured to detect X-rays, and not merely intersect a plane parallel to the first detector surface 7.

[0124] This configuration can be realized in two main ways. The first method is as shown in Figure 1, in which the first X-ray source 3 is positioned behind the first X-ray detector 5 along the first emission direction 15 so that at least a portion of the X-rays emitted from the first X-ray source 3 pass through the first detector surface 7. When the first X-ray source 3 irradiates the target volume 17, at least a portion of the X-rays emitted from the first X-ray source 3 passes through the first detector surface 7 before reaching the target volume 17.

[0125] If the X-ray system 1 includes a detector layer 11, the first X-ray source 3 may be configured to emit X-rays through the detector layer 11. The detector layer 11 may be configured to reduce the absorption of X-rays emitted from the first X-ray source 3. For example, the detector layer 11 may be configured such that the electronic equipment of the first X-ray detector 5 is positioned away from the region of the detector layer 11 through which the X-rays emitted from the first X-ray source 3 pass. The electronic equipment of the first X-ray detector 5 may include control electronic equipment for controlling the first X-ray detector 5 and / or measuring electronic equipment for detecting signals generated by X-rays passing through the first detector surface 7. The electronic equipment may be positioned so that the X-rays emitted from the first X-ray source 3 do not pass through the electronic equipment before reaching the target volume 17.

[0126] A second alternative configuration is shown in Figure 4. In this configuration, the first X-ray source 3 is positioned in front of the first X-ray detector 5 along the first emission direction 15 so that the X-rays emitted from the first X-ray source 3 do not pass through the first detector surface 7. This configuration is possible but generally undesirable because the first X-ray source may affect the X-rays reaching the first X-ray detector 5. In the configuration of Figure 1, some of the X-rays emitted from the first X-ray source 3 pass through the first detector surface 7, so the X-rays emitted from the first X-ray source 3 may be detected by the first detector 5 to acquire a measurement before they interact with the object. This is undesirable and can lead to erroneous measurements (spurious measurements). To avoid this, the X-ray system may be configured to ignore the signal from the first X-ray detector 5 due to X-rays emitted from the first X-ray source 3. Alternatively or additionally, the first X-ray detector 5 may be configured not to generate a signal in response to X-rays emitted from the first X-ray source 3 that pass through the first detector surface 7.

[0127] As mentioned above, this function can also be used to ignore backscattered X-rays. Therefore, the X-ray system 1 may be a transmission system, in which case the X-rays measured by the X-ray system 1 are X-rays that have not been backscattered, i.e., X-rays that have not been scattered beyond 90 degrees, and / or X-rays that have been scattered at angles less than 90 degrees, and have passed through the target volume 17 from the X-ray source to the X-ray detector.

[0128] The first X-ray detector 5 is positioned in front of the first X-ray source 3 with respect to the first emission direction 15. However, it is preferable that the first X-ray detector 5 and the first X-ray source 3 are not used together during operation; that is, the X-rays emitted from the first X-ray source are not intended to be detected by the first X-ray detector 5. Rather, the X-ray system 1 uses the first X-ray detector 5 to detect transmitted X-rays from another X-ray source, such as the second X-ray source 23 described later, and uses the first X-ray source 3 to emit X-rays toward another detector, such as the second X-ray detector 25 described later.

[0129] If it is desirable to detect backscattered X-rays, the X-rays emitted from the first X-ray source 3 may be ignored or not generate a signal for a predetermined time period. The predetermined time period may be the period during which the first X-ray source 3 is emitting X-rays and / or a predetermined time length after the first X-ray source 3 has stopped emitting X-rays. A signal from the first X-ray detector 5 resulting from X-rays emitted from the first X-ray source 3 is still treated as valid or allowed to be generated if it is due to X-rays emitted from the first X-ray source 3 that interacted with the object in the target volume before or before the signal was generated. This makes it possible to obtain measurements from X-rays emitted from the first X-ray source 3 that were reflected by the object in the target volume, or from X-rays generated by other interactions between the X-rays emitted from the first X-ray source 3 and the object, such as fluorescence.

[0130] As shown in Figure 5, the X-ray system 1 may comprise a plurality of first X-ray sources 3. In Figure 5, the X-ray system 1 comprises six first X-ray sources 3, but is not limited thereto. The X-ray system 1 may comprise 10 or more first X-ray sources 3, optionally 20 or more first X-ray sources 3, or optionally 30 or more first X-ray sources 3. If an emitter layer 9 is provided, the plurality of first X-ray sources 3 may be uniformly distributed throughout the emitter layer 9. The first X-ray sources 3 may be arranged linearly, for example, along a single axis. Alternatively, the first X-ray sources 3 may be arranged in a two-dimensional configuration, such as a grid or array extending along two orthogonal axes. Figure 6 shows an example in which the first X-ray sources 3 are arranged in a square grid. Figure 7 shows an example in which the first X-ray sources 3 are arranged in a triangular grid.

[0131] Each of the first X-ray sources 3 may have substantially identical performance. Alternatively, the first X-ray sources 3 may differ in performance and / or characteristics. For example, one or more of the first X-ray sources 3 may be configured to emit X-rays having a first wavelength, and one or more of the first X-ray sources may be configured to emit X-rays having a second wavelength. This may be achieved, for example, by using X-ray sources having targets containing different materials.

[0132] The first X-ray source 3 is selectively controllable. Optionally, each first X-ray source 3 can be individually and selectively controlled. For example, different subsets of the first X-ray source 3 can be made to emit X-rays at different times. This can be used to measure X-rays that have passed through different portions of a target volume. If the first X-ray source 3 is configured to emit X-rays with controllable energy, different subsets of the first X-ray source 3 can be made to emit X-rays of different energies.

[0133] The X-ray system 1 may be configured to selectively control the first X-ray source 3 so that its maximum power consumption remains below a predetermined power threshold while it is emitting X-rays. This allows the X-ray system 1 to operate even in environments with limited power requirements.

[0134] As further shown in Figure 5, the X-ray system 1 may include a plurality of first X-ray detectors 5. In Figure 5, the X-ray system 1 includes three first X-ray detectors 5, but is not limited to these. The X-ray system 1 may include five or more first X-ray detectors 5, optionally ten or more X-ray detectors 5, or optionally twenty or more first X-ray detectors 5. The first X-ray detectors 5 may be arranged linearly, for example, along a single axis. Alternatively, the first X-ray detectors 5 may be arranged in a two-dimensional arrangement, such as a grid or array extending along two orthogonal axes. The first detector surfaces 7 of the plurality of first X-ray detectors 5 may be arranged on the same plane. Figures 6 and 7 show a configuration in which the first X-ray detectors 5 are arranged in a square grid.

[0135] The maximum total extent of the first detector surface 7 of the first X-ray detector 5 within its plane may be 40 cm or less, arbitrarily 30 cm or less, or arbitrarily 25 cm or less. The minimum total extent of the first detector surface of the first X-ray detector within its plane may be 5 cm or more, arbitrarily 10 cm or more. These sizes are particularly advantageous for medical imaging applications, as will be further detailed below. However, generally, the dimensions of the first X-ray detector 5 are determined by the specific application in which it is intended, and may be larger or smaller than these exemplary values.

[0136] If the X-ray system 1 includes both a plurality of first X-ray sources 3 and a plurality of first X-ray detectors 5, the maximum overall dimensions of the first X-ray sources 3 may be equal to or less than the maximum overall dimensions of the first detector surface 7 of the first X-ray detectors 5 within the plane of the first X-ray detectors 5. This limits the irradiation range of the emitted X-rays and reduces X-ray exposure outside the intended detection area.

[0137] The X-ray system 1 described above is suitable for measuring X-rays emitted from the first X-ray source 3, reflected by an object within the target volume, and returned to the first X-ray detector 5. Other suitable measurements include fluorescence measurements, in which X-rays emitted from the first X-ray source 3 interact with the object to produce X-rays that are then detected by the first X-ray detector 5. However, for other types of measurements, including many medical imaging applications, it is desirable to be able to perform X-ray transmission measurements of the object.

[0138] Figure 8 shows an X-ray system 1 that provides this type of function. The X-ray system 1 further comprises a second X-ray source 23 configured to emit X-rays and a second X-ray detector 25 having a second detector surface 27 configured to detect X-rays.

[0139] The second X-ray source 23 and the second X-ray detector 25 may be substantially identical to the first X-ray source 3 and the first X-ray detector 5, or they may be of a different type from the first X-ray source 3 and the first X-ray detector 5. Any of the features described above for the first X-ray source 3 and the first X-ray detector can be appropriately applied to the second X-ray source 23 and the second X-ray detector 25, respectively. For example, the second X-ray source 23 may be equipped with any of the cathode types described above, and the second X-ray source 23 may be configured to emit X-rays with controllable energy.

[0140] The X-ray system 1 is configured such that X-rays emitted from the first X-ray source 3 are detected by the second X-ray detector 25, and X-rays emitted from the second X-ray source 23 are detected by the first X-ray detector 5.

[0141] As described above, the X-ray system 1 may be a non-backscattering system that does not rely on backscattered X-rays that may be reflected or scattered by an object in the target volume 17. In this case, X-rays emitted from the second X-ray source 23 may be ignored, excluded, or not measured by the second X-ray detector 25. Instead, the X-ray system 1 may measure only the X-rays emitted from the second X-ray source 23 that are detected by the first X-ray detector 5 after passing through an object in the target volume 17 and / or after being scattered at an angle of less than 90 degrees, and optionally less than 45 degrees.

[0142] The arrangement of two X-ray sources and two X-ray detectors allows for a highly flexible measurement configuration for a variety of objects. This enables the acquisition of images by transmission. Furthermore, it eliminates the need to move either the X-ray source or the X-ray detector while acquiring measurements, allowing for diverse measurements at various angles and orientations of the object.

[0143] The X-ray system in Figure 8 can be used to carry out a method as shown in Figure 20 for obtaining an X-ray measurement of a target. This method includes irradiating a target volume 17 containing the target by emitting X-rays from a first X-ray source 3 S1. As described above, at least a portion of the X-rays emitted from the first X-ray source 3 can propagate in a first emission direction 15 away from the first detector surface 7 of the first X-ray detector 5 such that a line along the first emission direction 15 intersects with the first detector surface 7. Alternatively or additionally, at least a portion of the X-rays emitted from the first X-ray source 3 may pass through the first detector surface 7 of the first X-ray detector 5 before reaching the target volume 17.

[0144] This method further includes S3 detecting X-rays from the first X-ray source 3 on the second detector surface 27 of the second X-ray detector 25.

[0145] This method may further include S5 emitting X-rays from the second X-ray source 23 to irradiate the target volume 17, and S7 detecting the X-rays from the second X-ray source 23 on the first detector surface 7.

[0146] Figure 20 shows the steps of the method in a specific order, but this order is not mandatory. The steps can be performed in any order and can even be performed simultaneously. The only constraints on the order of the steps are that step S3, which detects X-rays from the first X-ray source 3, must not precede step S1, which emits X-rays from the first X-ray source 3, and that step S7, which detects X-rays from the second X-ray source 23, must not precede step S5, which emits X-rays from the second X-ray source 23. In practice, it may be desirable to emit X-rays from the first X-ray source 3 and the second X-ray source 23 at different times so that the detection of X-rays from each source can be easily separated by a time difference. However, this is not always necessary, for example, if the wavelengths of the X-rays emitted by the first X-ray source 3 and the second X-ray source 23 are different.

[0147] At least a portion of the X-rays emitted from the second X-ray source 23 propagates in the second emission direction 35. The second emission direction 35 may be toward the first X-ray source 3. The second emission direction 35 may be oriented away from the second detector surface 27. The second emission direction 35 may be parallel to and opposite to the first emission direction 15.

[0148] Similar to the first emission direction 15, the second emission direction 35 may be in a direction such that the line along the second emission direction 35 intersects the second detector surface 27. As shown in Figure 8, at least a portion of the X-rays emitted from the second X-ray source 23 may pass through the second detector surface 27 before reaching the target volume 17. In this case, the second X-ray source 3 is positioned behind the first X-ray detector 5 along the second emission direction 35. Alternatively, the second X-ray source 23 and the second X-ray detector 25 can be configured similarly to the configuration of the first X-ray source 3 and the first X-ray detector 5 shown in Figure 4, in which case the second X-ray source 23 is positioned in front of the second X-ray detector 25 along the second emission direction 35.

[0149] The first detector surface 7 of the first X-ray detector 5 and the second detector surface 27 of the second X-ray detector 25 may be flat and parallel to each other. However, this is not mandatory, and the first detector surface 7 and the second detector surface 27 may be inclined to each other, as long as the condition is met that X-rays emitted from the first X-ray source 3 are detected by the second X-ray detector 25 and X-rays emitted from the second X-ray source 23 are detected by the first X-ray detector 5.

[0150] The distance between the first X-ray source 3 and the second X-ray source 23 may be 40 cm or less, optionally 30 cm or less, or optionally 22 cm or less. These dimensions are particularly suitable for brain scans and provide a compact and easily portable X-ray system 1. The distance between the first X-ray source 3 and the second X-ray source 23 may be 5 cm or more, optionally 10 cm or more, or optionally 15 cm or more. This ensures sufficient space for placing the object to be measured between the first X-ray source 3 and the second X-ray source 23.

[0151] As shown in Figure 9, the X-ray system 1 may comprise a plurality of first X-ray sources 3 and a plurality of second X-ray sources 23. In Figure 9, the X-ray system 1 comprises six second X-ray sources 23, but is not limited thereto. The X-ray system 1 may comprise 10 or more second X-ray sources 23, optionally 20 or more second X-ray sources 23, or optionally 30 or more second X-ray sources 23. The second X-ray sources 23 may be arranged in any suitable manner with respect to each other and to the second X-ray detector 25, for example, as described in relation to the first X-ray sources 3 above.

[0152] The X-ray system 1 may be configured such that the first X-ray detector 5 detects X-rays emitted from two or more second X-ray sources 23. This allows for different measurements of the target based on X-rays that reach the first X-ray detector 5 via different paths.

[0153] The X-ray system 1 may be configured to selectively control the second X-ray source 23 to sequentially emit X-rays such that X-rays emitted from different second X-ray sources 23 are detected by the first X-ray detector 5 at different times. This allows for easy temporal separation of X-rays that have followed different paths to reach the first X-ray detector 5, and thus enables the encoding of different information about the object. Alternatively or additionally, the X-ray system 1 may be configured to control the second X-ray source 23 to emit X-rays of different wavelengths. If the second X-ray source 23 has a controllable energy, this may include controlling each second X-ray source 23 to emit X-rays of multiple different wavelengths. Alternatively, regardless of whether the second X-ray source 23 has a controllable energy, this may include controlling different second X-ray sources 23 to emit X-rays of different wavelengths. This can be used to separate X-rays from different second X-ray sources 23, or to perform spectral X-ray measurements by making measurements at multiple different wavelengths.

[0154] As shown in Figure 9, the X-ray system 1 may comprise a plurality of first X-ray detectors 5. Each first X-ray detector 5 may be configured to detect X-rays emitted from different subsets of the second X-ray sources 23. This is shown in Figure 9, where the leftmost first X-ray detector 5 detects X-rays from the two second X-ray sources 23 on the left, while the rightmost first X-ray detector 5 detects X-rays from the two second X-ray sources 23 on the right.

[0155] Similarly, the X-ray system 1 may be configured so that the second X-ray detector 25 detects X-rays emitted from two or more first X-ray sources 3. The X-ray system 1 may be configured to selectively control the first X-ray sources 3 to sequentially emit X-rays so that X-rays emitted from different first X-ray sources 3 are detected by the second X-ray detector 25 at different times. With respect to the first X-ray sources 3, as described above for the first X-ray sources 3, the system may be configured to control the first X-ray sources 3 to emit X-rays of different wavelengths.

[0156] As shown in Figure 9, the X-ray system 1 may include a plurality of second X-ray detectors 25. Each second X-ray detector 25 may be configured to detect X-rays emitted from a different subset of the first X-ray source 3.

[0157] The first X-ray source 3 and the second X-ray source 23 are configured to irradiate the target volume 17 with X-rays, as described above. This makes it possible to expose the object within the target volume to X-rays and perform measurements on the object. The target volume 17 is located between the first X-ray source 3 and the second X-ray source 23.

[0158] The X-ray system 1 is configured to acquire X-ray images sufficient to perform two-dimensional and / or three-dimensional tomographic reconstruction of an object within a target volume 17. Examples of objects include industrial parts for quality inspection or mammalian tissues such as the human brain. Acquiring sufficient X-ray images for tomographic reconstruction involves acquiring multiple images of the object, each image taken from a different angle. For example, five or more images can be acquired, optionally ten or more images, optionally twenty or more images, or optionally fifty or more images.

[0159] The target volume 17 ideally includes most or all of the space between the first X-ray source 3 and the second X-ray source 23, and / or the space between the first detector surface 7 and the second detector surface 27, depending on the system configuration. This maximizes the size of the measurable object relative to the size of the X-ray system 1, thereby improving compactness. The cross-sectional area of ​​the target volume 17 may occupy 50% or more, optionally 70% or more, or optionally 80% or more of the cross-sectional area of ​​the volume between the first X-ray source 3 and the second X-ray source 23, and / or the volume between the first detector surface 7 and the second detector surface 27. The smallest linear extent of the target volume is 5 cm or more, optionally 10 cm or more.

[0160] The largest linear extent of the target volume 17 may be 50% or more, optionally 70% or more, or optionally 80% or more of the distance between the first X-ray source 3 and the second X-ray source 23. The minimum linear extent of the target volume 17 may be 10% or more, optionally 20% or more, or optionally 40% or more of the distance between the first X-ray source 3 and the second X-ray source 23. If the X-ray system 1 includes multiple first X-ray sources 3 and multiple second X-ray sources 23, the largest linear extent of the target volume 17 may be 25% or more, optionally 50% or more, optionally 70% or more, or optionally 80% or more of the maximum distance between any first X-ray source 3 and any second X-ray source 23. The minimum linear extent of the target volume 17 may be 10% or more, optionally 20% or more, or optionally 40% or more of the maximum distance between any first X-ray source 3 and any second X-ray source 23.

[0161] These constraints can also be defined based on the distance between the first detector surface 7 and the second detector surface 27. The maximum linear dimension of the target volume 17 may be 50% or more, arbitrarily 70% or more, or arbitrarily 80% or more of the distance between the first detector surface 7 and the second detector surface 27. The minimum linear dimension of the target volume 17 may be 10% or more, arbitrarily 20% or more, or arbitrarily 40% or more of the distance between the first detector surface 7 and the second detector surface 27. If the X-ray system 1 includes a plurality of first detectors 5 and a plurality of second detectors 25, the maximum linear dimension of the target volume 17 may be 25% or more, arbitrarily 50% or more, arbitrarily 70% or more, or arbitrarily 80% or more of the maximum distance between any first detector surface 7 and any second detector surface 27. The minimum linear dimension of the target volume 17 may be 10% or more, arbitrarily 20% or more, or arbitrarily 40% or more of the maximum distance between any first detector surface 7 and any second detector surface 27.

[0162] The arrangement of the first X-ray source 3 and the second X-ray source 23 may be such that, when all first X-ray sources 3 and the second X-ray sources 23 are operating simultaneously, at least a portion of the target volume 17 is irradiated with X-rays emitted from two or more, optionally four or more, or optionally six or more different first X-ray sources 3 or second X-ray sources 23. Two or more different first X-ray sources 3 or second X-ray sources 23 may include one or more first X-ray sources 3 and one or more second X-ray sources 23. This allows for measurements at various angles. The arrangement of the first X-ray sources 3 and the second X-ray sources 23 may be such that, when all first X-ray sources 3 and the second X-ray sources 23 are operating simultaneously, at least a portion of the target volume 17 is irradiated with X-rays emitted from the same number of first X-ray sources 3 or second X-ray sources 23. At least a portion of the target volume 17 may occupy 50% or more, optionally 70% or more, or optionally 80% or more of the target volume.

[0163] The X-ray imaging system 1, equipped with a first X-ray source 3 and a second X-ray source 23, has advantages over conventional systems in that it can irradiate the target appropriately and uniformly with a compact configuration, and can avoid excessive radiation exposure. The latter advantage is particularly significant in medical imaging diagnostic applications.

[0164] Figure 10 shows a prior art X-ray system 101 comprising multiple X-ray sources 103 emitting cone beams with a typical 12-degree cone angle. The X-rays pass through the object 141 and form an image on the detector 105. As shown in the figure, the irradiation range on the left side of the object 141 is insufficient, and a considerable portion of the object 141 does not receive X-rays. This hinders proper imaging and reconstruction of this portion of the object 141.

[0165] Figure 11 shows a solution to this problem using a larger number of densely arranged X-ray sources 103. However, this results in a large variation in the amount of X-rays irradiated to object 141, with the right-hand portion of object 141 receiving significantly more X-ray irradiation than is necessary to achieve proper imaging.

[0166] As shown in Figure 12, this X-ray system 1 solves this problem by enabling irradiation of the target 41 from opposing directions. In Figure 12, the target 41 is uniformly irradiated with X-rays sufficient for imaging, and no part of the target 41 is irradiated with an unnecessarily high dose. In Figure 13, tomography reconstruction is made possible by increasing the number of first X-ray sources 3 and second X-ray sources 23 so that each part of the target is irradiated by two or more different X-ray sources. The arrangement of the first X-ray sources 3 and second X-ray sources 23 may be such that when all of the first X-ray sources 3 and second X-ray sources 23 are operating simultaneously, at least a portion of the target volume 17 is irradiated with X-rays of a substantially uniform flux density. At least a portion of the target volume 17 may occupy 50% or more, optionally 70% or more, or optionally 80% or more of the target volume.

[0167] The arrangement of the first X-ray source 3 and the second X-ray source 23 may be such that, when both the first X-ray source 3 and the second X-ray source 23 are operating simultaneously, the X-ray flux density in the target volume 17 is symmetrical along a line between the first detector surface 7 and the second detector surface 27. This line may be perpendicular to the first detector surface 7 and / or the second detector surface 27.

[0168] In the example shown in Figure 9, multiple first X-ray sources 3 and multiple first detectors 5 are paired with multiple second X-ray sources 23 and multiple second X-ray detectors 25, facing each other. Furthermore, it is also possible to provide an X-ray system 1 that includes even more pairs of facing first and second X-ray sources and X-ray detectors.

[0169] Figure 14 shows an example of this. The first detector surface 7 of the first X-ray detector 5 and the second detector surface 27 of the second X-ray detector 25 are arranged such that the cross-section passing through the first detector surface 7 and the second detector surface 27 forms a regular polygon with an even number of sides. The first X-ray source 3 and the second X-ray source 23 are positioned on the periphery of this regular polygon.

[0170] Each first X-ray detector 5 is configured to detect X-rays emitted from a second X-ray source 23 located on the opposite side of a regular polygon from the side on which the first X-ray detector 5 is located. Each second X-ray detector 25 is configured to detect X-rays emitted from a first X-ray source 3 located on the opposite side of a regular polygon from the side on which the second X-ray detector 25 is located.

[0171] This configuration makes it possible to obtain more detailed information in the measurement and imaging of the target without significantly increasing the overall size of the X-ray system 1. In this system, the outer periphery of the target volume 17 is defined by the first detector surface and the second detector surface.

[0172] In Figure 14, the regular polygon forms a square cross-section with four sides. However, it is possible to further increase the number of pairs of opposing first and second X-ray sources and X-ray detectors. The regular polygon may have four or more sides, and may have six or more sides, as shown in Figure 15. The regular polygon may have eight or more sides, as shown in Figure 16.

[0173] In the examples in Figures 14 to 16, the first X-ray source 3 and the first X-ray detector 5 are shown together on one half of the polygon, and the second X-ray source 23 and the second X-ray detector 25 are shown together on the other half. However, this is not mandatory, and the first and second X-ray sources and the X-ray detectors can be arranged in any suitable way, for example, alternatingly around each side of the polygon. The designations "first" and "second" are merely conceptual labels indicating pairs of X-ray sources and detectors associated by the above requirement that X-rays emitted from the first X-ray source 3 are detected by the second X-ray detector 25, and X-rays emitted from the second X-ray source 23 are detected by the first X-ray detector 5.

[0174] Figure 16 also shows that by using the selective operation of the first X-ray source 3 and the second X-ray source 23, only a portion of the object 41 within the target volume 17, 43 in total, can be imaged.

[0175] The selective operation of the first X-ray source 3 and the second X-ray source 23 can also be used for radiotherapy applications. The radiotherapy system may include an X-ray system 1 and a processor. The processor may be configured to use the X-ray system 1 to acquire measurements of the subject (i.e., the patient), to locate the location of a target structure within the subject based on those measurements, and to control the X-ray system 1 to deliver a therapeutic dose of X-rays to the target structure, such as a cancerous tumor.

[0176] The processor may be configured to control the first X-ray source 3 and / or the second X-ray source 23 to emit X-rays at a first intensity while acquiring measurements. The processor may also be configured to control the first X-ray source 3 and / or the second X-ray source 23 to emit X-rays at a second intensity while irradiating a therapeutic dose. The first intensity is different from the second intensity, and is preferably lower than the second intensity. As described above, different intensities can be achieved by changing the intensity of the X-rays emitted from each individual first X-ray source 3 and / or second X-ray source 23. Alternatively or additionally, different intensities can be achieved by changing the number of first X-ray sources 3 and second X-ray sources 23 that emit X-rays.

[0177] A current problem in radiation therapy is that the target area of ​​the patient may shift during treatment due to factors such as changes in the patient's position or breathing. The advantage of this X-ray system 1 is that it can perform measurements such as imaging and therapeutic X-ray irradiation simultaneously or alternately. This makes it possible to track the target structure to which the therapeutic radiation dose is irradiated in near real time, and to adjust the position to which the therapeutic radiation dose is irradiated accordingly. This can improve the effectiveness of the treatment and reduce radiation exposure to surrounding healthy areas.

[0178] Figure 17 shows an example of applying the X-ray system from Figure 15 to patient imaging, enabling imaging along the patient's longitudinal direction by moving the patient through the opening of the X-ray system 1.

[0179] Figure 18 shows an example of the application of X-ray system 1 to fluorescence measurement. X-rays emitted from one of the first X-ray emitters 3 are shown. The X-rays emitted from the first X-ray emitter 3 interact with the object 41, and the resulting X-rays are emitted from the object 41 in various directions. X-rays emitted from the first X-ray source 3 and transmitted through the object 41 are detected by the opposing second detector 25. However, X-rays generated from the object 41 due to other interactions such as reflection or fluorescence are also detected by the first X-ray detector 3. This configuration makes it possible to simultaneously perform various types of measurements on an object 41, such as a living mammal. For example, CT imaging can be performed using transmitted X-rays, and simultaneously, quantitative analysis and spatial localization of metals and metalloids in the tissue can be performed using X-ray fluorescence analysis.

[0180] As shown in Figure 19, the X-ray system 1 may include a support 45 configured to support a first X-ray source 3. The support 45 may further be configured to support a first X-ray detector 5. The support may further be configured to support a second X-ray source 23 and / or a second X-ray detector 25, if present. The support 45 allows the system to be positioned around a target 41 for measurement.

[0181] As shown in Figure 20, the support 45 is configured to be fixedly engaged with a frame 47 for holding the X-ray irradiated object 41. In Figure 20, the frame 47 is a stereotactic head frame, but this is not mandatory, and other types of frames may be used depending on the X-ray irradiated object 41. When the frame is a stereotactic head frame, the distance between the first X-ray source 3 and the second X-ray detector 25 may be 40 cm or less. This allows the system to perform head measurements while keeping the system compact. Figure 21 shows a top view of the X-ray system with the support 45 engaged with the frame 47.

[0182] The support 45 is configured to engage with the frame 47 such that the first X-ray source 3 and the first X-ray detector 5 assume a predetermined positional relationship with respect to the frame when the support 45 is engaged with the frame 47. As described above, the X-ray system 1 may comprise a plurality of first X-ray sources 3 and first X-ray detectors 5, and / or one or more second X-ray sources 23 and second X-ray detectors 25. These may also be supported by the support 45 and assumed a predetermined positional relationship with respect to the frame 47 when the support 45 engages with the frame 47.

[0183] This allows for the definition of a three-dimensional coordinate system based on frame 47, in which the positions of the first X-ray source 3 and the first X-ray detector 5 are known. This makes it possible to directly identify the position of features of an object 41 measured or imaged using the X-ray system 1 in the three-dimensional coordinate system based on frame 47. In other words, a direct correspondence can be derived between the position in the image captured using the X-ray system 1 and the position relative to frame 47. The engagement of the X-ray system 1 with the frame causes the three-dimensional coordinates in the image captured by the X-ray system to be co-registered with the three-dimensional coordinate system defined based on frame 47.

[0184] Defining a three-dimensional coordinate system can also be beneficial in applications such as industrial inspection. In industrial inspection, the expected dimensions of the manufactured object are often known with great precision, for example, when the object is manufactured using computer-aided design (CAD) and computer numerical control (CNC). This makes it possible to sequentially and kinematically position multiple objects relative to the X-ray system 1 using the frame 47 and support 45. This allows for prediction of the signals obtained from each X-ray detector, and enables rapid identification of discrepancies (e.g., due to manufacturing inaccuracies or material defects) without requiring complex image reconstruction, thus facilitating rapid inspection.

[0185] As shown in Figures 20 and 21, the support 45 may include one or more engaging features 49 configured to engage with corresponding mounting features 51 in the frame 47. The engaging features 49 may be kinematic engaging features that mechanically engage with the mounting features 51. In Figure 20, the engaging features 49 are composed of spherical features extending from the support 45. The mounting features 51 are corresponding recesses in the frame 47 with cam locks for securing the engaging features. The mounting features 51 thereby provide a reference point for defining a three-dimensional coordinate system relative to the frame 47, enabling the measurement of the position of any point within a target from an X-ray image acquired using the X-ray system 1. This three-dimensional coordinate system may be a Cartesian coordinate system, as is commonly used in stereotactic head frames.

[0186] The X-ray system 1 can be used to carry out a method for preparing a device that interacts with an object, or a method for locating a structure within an object, as shown in Figure 21. The device may be a tool, such as a spray coater or a part of industrial machinery such as a robotic arm. The object may be an object that is processed in some way using the device. This method includes engaging the support 45 with the frame 47 S11.

[0187] The method further includes acquiring measurements of the object using the X-ray system 1 S13. This measurement is shown in Figure 20 and can be performed using the method described above. For example, X-ray measurements can be used for quality control of parts on an assembly line. The X-ray system 1 can be used to acquire appropriate X-ray measurements, which can be used to determine the parameters for processing the object. For example, it is possible to measure the thickness of a coated film or to detect the presence of cracks in a part. Acquiring measurements S13 may include taking multiple images sufficient to perform two-dimensional and / or three-dimensional tomographic reconstruction of the object. During the acquisition of measurements S13, it is preferable that the first X-ray source 3 and the first X-ray detector 5 are stationary relative to the frame 47.

[0188] Furthermore, this method includes determining the settings of the apparatus based on the measurement S15, or determining the position of the structure within the object 41 based on the measurement S15.

[0189] Determining the position S15 may include using predetermined positions of the first X-ray source 3 and the first X-ray detector 4. The position of the structure may be defined by relative coordinates with respect to the frame 47. The subject may be an animal, such as the head of a human, and the structure may be an anatomical structure, such as a brain region. The frame 47 may be a stereotactic head frame. Determining the position S15 does not necessarily include using one or more reference markers in the image.

[0190] The settings may be determined based on parameters determined from measurements. These settings may include the thickness of the coating that still needs to be applied to the object, or the destination to which the object will be moved using a robotic arm, for example, to discard defective parts.

[0191] Many other examples are conceivable. In particular, the device may be a surgical instrument configured to engage with a stereotactic head frame, and the target may be the head of a patient to which the stereotactic frame is attached. Based on this perspective, a system can be provided for preparing a surgical instrument configured to engage with a stereotactic head frame. The system comprises an X-ray system 1, which comprises a support 45 and a processor configured to determine the settings of the surgical instrument based on measurements made using the X-ray system 1. The processor may be integrated with the X-ray system, for example, so as to be supported by the support 45. Alternatively, the processor may be provided separately from the X-ray system and connected for data exchange by any suitable connection means, such as wired or wireless connection.

[0192] This system can be used to perform a method for preparing surgical instruments configured to engage with a stereotactic head frame. This is an example of the method shown in Figure 21. The method includes engaging the support 45 of the X-ray system 1 with the stereotactic head frame S11 while the stereotactic head frame is mounted on the patient's head. The method further includes acquiring measurements of at least a portion of the patient's head using the X-ray system 1 S13. Preferably, while acquiring measurements S13, the first X-ray source 3 and the first X-ray detector 5 are stationary relative to the stereotactic head frame. Acquiring measurements S13 may include taking a number of images sufficient to perform two-dimensional and / or three-dimensional tomographic reconstruction of the patient's head.

[0193] Finally, the method includes adjusting the settings of the surgical instruments based on measurements. The settings of the surgical instruments may include the position of at least a portion of the surgical instruments relative to the patient's head when the surgical instruments are engaged with the stereotactic head frame. The setting adjustment may include determining the trajectory from outside the head to the target structure inside the head based on tomographic reconstruction of the head. The setting adjustment may also include determining the position of the target structure inside the head using predetermined positions of the first X-ray source 3 and the first X-ray detector 5, and optionally predetermined positions of the second X-ray source 23 and the second X-ray detector 25.

[0194] As described above, the X-ray system 1 can directly map its X-ray image to the coordinate system of the stereotactic head frame because the support 45 of the X-ray system 1 is configured to engage with the stereotactic head frame, and when the X-ray system 1 engages with the frame, the first X-ray source 3 and the first X-ray detector 5 assume a predetermined positional relationship with respect to the stereotactic head frame. This makes it possible to identify the position of the target on the image using the coordinate system of the X-ray image (which is also the coordinate system of the stereotactic head frame) and to directly plan the trajectory to the target. The determined coordinates and settings can be directly transferred to the surgical instrument that engages with the stereotactic head frame.

[0195] Compared to existing methods that require acquiring multiple image sets using various imaging modalities (e.g., MRI, X-ray, etc.) and then performing complex registration techniques to align the images acquired with various modalities using reference markers within the images, this method significantly simplifies the surgical process. In this method, determining the position does not necessarily involve using one or more reference markers within the images.

[0196] Alternatively, the system described herein can be used as part of a radiotherapy method as described in relation to Figure 16. This method includes obtaining measurements of a subject using the X-ray system 1, locating a target structure within the subject based on these measurements, and controlling the X-ray system 1 to irradiate the target structure with a therapeutic dose of X-rays.

[0197] The first X-ray source 3 and / or the second X-ray source 23 are controlled to emit X-rays at a first intensity while measurements are being acquired, and the first X-ray source 3 and / or the second X-ray source 23 are controlled to emit X-rays at a second intensity while a therapeutic dose is being delivered. The first intensity is preferably lower than the second intensity. The method may include tracking the position of the target structure over time and adjusting the location of the therapeutic dose delivery based on the position of the target structure. Tracking the position over time may include acquiring multiple measurements of the subject using the X-ray system 1 and identifying the position of the target structure based on the corresponding measurements at each point in time. The method may include acquiring measurements of the subject and delivering the therapeutic dose simultaneously or alternately.

[0198] As described above, different intensities can be obtained by changing the intensity of the X-rays emitted from each of the first X-ray sources 3 and / or the second X-ray source 23. Alternatively or additionally, different intensities can be obtained by changing the number of first X-ray sources 3 and second X-ray sources 23 that emit X-rays.

[0199] The present invention is also characterized by the following numbered clauses, which are not the claims of this application that follow below under the heading "Claim". 1. An X-ray system comprising a first X-ray source configured to emit X-rays and a first X-ray detector having a first detector surface configured to detect X-rays, wherein at least a portion of the X-rays emitted from the first X-ray source propagates in a first emission direction, the first emission direction is oriented away from the first detector surface, and the system is configured such that lines along the first emission direction intersect the first detector surface. 2. An X-ray system in which the first emission direction is perpendicular to the first detector surface, as described in paragraph 1. 3. An X-ray system according to paragraph 1 or 2, wherein the first X-ray source is configured to irradiate a target volume with X-rays in order to expose an object within the target volume to X-rays. 4. An X-ray system in which the first emission direction is directed toward the target volume, as described in Section 3. 5. An X-ray system as described in paragraph 3 or 4, wherein the X-rays emitted from the first X-ray source pass through the first detector surface before reaching the target volume.

[0200] 6. An X-ray system comprising a first X-ray source configured to emit X-rays and a first X-ray detector having a first detector surface configured to detect X-rays, wherein the first X-ray source is configured to irradiate a target volume with X-rays in order to expose an object within the target volume to X-rays, and the X-rays emitted from the first X-ray source pass through the first detector surface before reaching the target volume. 7. An X-ray system described in any one of the preceding paragraphs, wherein a) the signal from the first X-ray detector due to X-rays emitted from the first X-ray source is ignored, and / or b) the first X-ray detector does not generate a signal in response to X-rays emitted from the first X-ray source and passing through the first detector surface. 8. An X-ray system according to any one of the preceding paragraphs, wherein the system comprises a plurality of first X-ray sources. 9. An X-ray system in which the first X-ray source is selectively controllable, and each first X-ray source is optionally individually and selectively controllable. 10. An X-ray system described in paragraph 9, wherein the system is configured to selectively control the first X-ray sources such that the maximum power consumption of the multiple first X-ray sources falls below a predetermined power threshold during X-ray emission by the first X-ray source.

[0201] 11. An X-ray system according to any one of the preceding paragraphs, wherein the first X-ray source is provided in the emitter layer and the first detector surface is provided in the detector layer. 12. In the X-ray system described in paragraph 11, the detector layer is adjacent to or in contact with the emitter layer. 13. An X-ray system according to paragraph 11 or 12, wherein the system comprises a plurality of first X-ray sources uniformly distributed throughout the emitter layer. 14. An X-ray system according to any one of paragraphs 11 to 13, wherein the first X-ray source is configured to emit X-rays through a detector layer. 15. An X-ray system according to any one of paragraphs 11 to 14, wherein the emitter layer and the detector layer are flat and / or parallel.

[0202] 16. An X-ray system according to any one of the preceding paragraphs, wherein the system further comprises a filtering element configured to absorb X-rays emitted from a first X-ray source having an energy below a predetermined threshold. 17. An X-ray system according to any one of the preceding paragraphs, wherein the first X-ray source is configured to irradiate a target volume with X-rays in order to expose an object within the target volume to X-rays, and the system further comprises a shielding element configured to absorb X-rays that have passed through the first detector surface in a direction away from the target volume. 18. An X-ray system according to any one of the preceding paragraphs, wherein the system comprises a plurality of first X-ray detectors. 19. An X-ray system in which the first detector surfaces of a plurality of first X-ray detectors are arranged on the same plane, in the X-ray system described in paragraph 18. 20. An X-ray system as described in paragraph 18 or 19, wherein a) the maximum overall dimension of the first detector surfaces of the multiple first X-ray detectors in the plane of the multiple first X-ray detectors is 40 cm or less, arbitrarily 30 cm or less, arbitrarily 25 cm or less, and / or b) the minimum overall dimension of the first detector surfaces of the multiple first X-ray detectors in the plane of the multiple first X-ray detectors is 5 cm or more, arbitrarily 10 cm or more. 21. An X-ray system according to any one of paragraphs 18 to 20, wherein the system comprises a plurality of first X-ray sources, the maximum overall dimensions of the plurality of first X-ray sources being less than or equal to the maximum overall dimensions of the first detector surfaces of the plurality of first X-ray detectors in the plane of the plurality of first X-ray detectors.

[0203] 22. An X-ray system according to any one of the preceding paragraphs, wherein the system further comprises a second X-ray source configured to emit X-rays and a second X-ray detector having a second detector surface configured to detect X-rays, wherein the system is configured such that X-rays emitted from the first X-ray source are detected by the second X-ray detector, and X-rays emitted from the second X-ray source are detected by the first X-ray detector. 23. An X-ray system in which at least a portion of the X-rays emitted from the second X-ray source propagates toward the first X-ray source in the second emission direction. 24. An X-ray system comprising a first X-ray source configured to emit X-rays, a second X-ray source configured to emit X-rays, a first X-ray detector having a first detector surface configured to detect X-rays, and a second X-ray detector having a second detector surface configured to detect X-rays, wherein X-rays emitted from the first X-ray source are detected by the second X-ray detector, X-rays emitted from the second X-ray source are detected by the first X-ray detector, and at least a portion of the X-rays emitted from the second X-ray source propagates toward the first X-ray source in a second emission direction. 25. An X-ray system as described in paragraph 23 or 24, wherein at least a portion of the X-rays emitted from a first X-ray source propagates in a first emission direction, and a second emission direction is parallel to and opposite to the first emission direction.

[0204] 26. An X-ray system comprising a first X-ray source configured to emit X-rays, a second X-ray source configured to emit X-rays, a first X-ray detector having a first detector surface configured to detect X-rays, and a second X-ray detector having a second detector surface configured to detect X-rays, wherein X-rays emitted from the first X-ray source are detected by the second X-ray detector, X-rays emitted from the second X-ray source are detected by the first X-ray detector, at least a portion of the X-rays emitted from the first X-ray source propagates in a first emission direction, and at least a portion of the X-rays emitted from the second X-ray source propagates in a second emission direction that is parallel to and opposite to the first emission direction. 27. An X-ray system according to any one of paragraphs 22 to 26, wherein the system comprises a plurality of first X-ray sources and a plurality of second X-ray sources. 28. An X-ray system as described in paragraph 27, wherein the system is configured such that a first X-ray detector detects X-rays emitted from two or more second X-ray sources. 29. An X-ray system as described in paragraph 28, wherein the system is configured to selectively control the second X-ray source to sequentially emit X-rays such that X-rays emitted from different second X-ray sources are detected by the first X-ray detector at different times. 30. An X-ray system according to any one of paragraphs 27 to 29, wherein the system comprises a plurality of first X-ray detectors, each first X-ray detector configured to detect X-rays emitted from a different subset of a second X-ray source.

[0205] 31. An X-ray system according to any one of paragraphs 27 to 30, wherein the system is configured such that a second X-ray detector detects X-rays emitted from two or more first X-ray sources. 32. An X-ray system as described in paragraph 31, wherein the system is configured to selectively control the first X-ray source to sequentially emit X-rays such that X-rays emitted from different first X-ray sources are detected by the second X-ray detector at different times. 33. An X-ray system according to any one of paragraphs 27 to 32, the system comprising a plurality of second X-ray detectors, each second X-ray detector configured to detect X-rays emitted from a different subset of a first X-ray source. 34. An X-ray system according to any one of paragraphs 22 to 33, wherein the first X-ray source and / or the second X-ray source are configured to irradiate a target volume between the first X-ray source and the second X-ray source with X-rays in order to expose an object within the target volume to X-rays. 35. An X-ray system as described in paragraph 34, wherein the system is configured to acquire X-ray images sufficient to perform two-dimensional and / or three-dimensional tomographic reconstruction of an object within a target volume, and optionally the object includes mammalian tissue.

[0206] 36. An X-ray system as described in paragraph 34 or 35, wherein the X-rays emitted from the second X-ray source pass through the second detector surface of the second X-ray detector before reaching the target volume. 37. An X-ray system as described in any one of paragraphs 34 to 36, wherein a) the maximum linear dimension of the target volume is 50%, optionally 70%, or optionally 80% of the distance between the first X-ray source and the second X-ray source, and / or b) the minimum linear dimension of the target volume is 10%, optionally 20%, or optionally 40% of the distance between the first X-ray source and the second X-ray source. 38. An X-ray system as described in any one of paragraphs 34 to 37, wherein the minimum linear dimension of the target volume is 5 cm or more, and optionally 10 cm or more. 39. An X-ray system according to any one of paragraphs 34 to 38, comprising a plurality of first X-ray sources and a plurality of second X-ray sources, satisfying either or both of the following a) and b). a) The maximum linear dimension of the target volume is 25% or more, arbitrarily 50% or more, arbitrarily 70% or more, and arbitrarily 80% or more of the maximum distance between any first X-ray source and any second X-ray source. b) The minimum linear dimension of the target volume is 10% or more, optionally 20% or more, and optionally 40% or more of the maximum distance between any first X-ray source and any second X-ray source. 40. An X-ray system according to any one of paragraphs 34 to 39, wherein the arrangement of the first X-ray source and the second X-ray source is such that when all the first X-ray sources and the second X-ray source are operating simultaneously, at least a portion of the target volume is irradiated with X-rays emitted from two or more different first X-ray sources or second X-ray sources, and the two or more different first X-ray sources or second X-ray sources are any one or more first X-ray sources and one or more second X-ray sources.

[0207] 41. An X-ray system according to any one of paragraphs 22 to 40, wherein the system comprises a first X-ray detector having a first detector surface configured to detect X-rays, and a second X-ray detector having a second detector surface configured to detect X-rays, wherein the first detector surface of the first X-ray detector and the second detector surface of the second X-ray detector are flat and parallel to each other. 42. An X-ray system as described in any one of paragraphs 22 to 41, wherein a) the distance between the first X-ray source and the second X-ray source is 40 cm or less, arbitrarily 30 cm or less, and arbitrarily 22 cm or less, and b) the distance between the first X-ray source and the second X-ray source is 5 cm or more, arbitrarily 10 cm or more, and arbitrarily 15 cm or more. 43. An X-ray system according to any one of paragraphs 22 to 42, wherein the system comprises a plurality of first X-ray sources and a plurality of second X-ray sources, the system comprises a plurality of first X-ray detectors and a plurality of second X-ray detectors, wherein the first detector surface of the first X-ray detector and the second detector surface of the second X-ray detector are arranged such that the cross section passing through the first detector surface and the second detector surface forms a regular polygon having an even number of sides, the first X-ray sources and the second X-ray sources are arranged on the periphery of the regular polygon, each first X-ray detector is configured to detect X-rays emitted from a second X-ray source located on the opposite side of the regular polygon from the side on which the first X-ray detector is located, and each second X-ray detector is configured to detect X-rays emitted from a first X-ray source located on the opposite side of the regular polygon from the side on which the second X-ray detector is located. 44. An X-ray system according to paragraph 43, wherein a regular polygon has four or more sides, optionally six or more sides, and optionally eight or more sides. 45. An X-ray system according to any one of the preceding paragraphs, wherein the system comprises a support configured to support a first X-ray source and a first X-ray detector, the support configured to be fixedly engaged with a frame for holding an X-ray irradiated object, and optionally the frame is a stereotactic head frame.

[0208] 46. ​​An X-ray system comprising a first X-ray source configured to emit X-rays, a second X-ray detector having a second detector surface configured to detect X-rays emitted from the first X-ray source, and a support configured to support the first X-ray source and the second X-ray detector, wherein the support is configured to be fixedly engaged with a frame for performing brain measurements, the frame being a stereotactic head frame, and the distance between the first X-ray source and the second X-ray detector is 40 cm or less. 47. An X-ray system according to paragraph 45 or 46, wherein the support is configured to engage with the frame such that when the support is engaged with the frame, the first X-ray source and the first X-ray detector are in a predetermined positional relationship with respect to the frame. 48. An X-ray system according to any one of paragraphs 45 to 47, wherein the support comprises one or more engaging features configured to engage with corresponding mounting features of a frame. 49. A system for preparing a surgical instrument configured to engage with a stereotactic head frame, comprising an X-ray system as described in any one of paragraphs 45 to 48, and a processor configured to determine the settings of the surgical instrument based on measurements made using the X-ray system. 50. A radiotherapy system comprising an X-ray system as described in any one of paragraphs 22 to 26 or any one of the preceding paragraphs dependent thereon, and a processor that uses the X-ray system to acquire measurements of a subject, to locate a target structure within the subject based on the measurements, and to control the X-ray system to irradiate the target structure with a therapeutic X-ray dose, wherein the processor is configured to control a first X-ray source and / or a second X-ray source to emit X-rays at a first intensity while acquiring measurements, and the processor is configured to control the first X-ray source and / or the second X-ray source to emit X-rays at a second intensity while irradiating a therapeutic dose, the first intensity being lower than the second intensity.

[0209] 51. An X-ray system described in any one of the preceding paragraphs, wherein the system is portable and can be carried by a person at will. 52. An X-ray system described in any one of the preceding paragraphs, wherein the first X-ray source and the first X-ray detector are stationary while the system is used to irradiate a target with X-rays. 53. An X-ray system in which the first X-ray source is configured to emit X-rays with controllable energy, in any one of the X-ray systems described in the preceding paragraph. 54. An X-ray system in which the first X-ray source is configured to emit cone-beam-shaped X-rays, in any one of the X-ray systems described in the preceding paragraph. 55. An X-ray system according to any one of the preceding paragraphs, wherein the system comprises a collimator configured to shape an X-ray beam emitted from a first X-ray source, and optionally the collimator is configured to shape the beam into a rectangular beam, or optionally into a square beam.

[0210] 56. An X-ray system according to any one of the preceding paragraphs, wherein the first X-ray source is a cold cathode field emission electron source which is, for example, a carbon nanotube layer, a graphene multilayer structure, bulk graphene, or a spint emitter. 57. An X-ray system according to any one of the preceding paragraphs, wherein the first X-ray source includes a transmission X-ray target and optionally contains tungsten, tantalum, or molybdenum. 58. An X-ray system in which the first X-ray detector is a digital X-ray detector, in any one of the preceding paragraphs, wherein the first X-ray detector is, for example, an organic photodetector (OPD), an organic-inorganic hybrid semiconductor, or a low-gain avalanche diode (LGAD). 59. An X-ray system described in any one of the preceding paragraphs, wherein the X-ray system is an X-ray imaging system.

[0211] 60. A method for obtaining X-ray measurements of a target, comprising: emitting X-rays from a first X-ray source to irradiate a target volume containing the target; at least a portion of the X-rays emitted from the first X-ray source propagates in a first emission direction, the first emission direction is oriented away from the first detector surface of a first X-ray detector, and a line along the first emission direction intersects with the first detector surface; and detecting the X-rays from the first X-ray source at the second detector surface of a second X-ray detector. 61. The method of paragraph 60, wherein at least a portion of the X-rays emitted from the first X-ray source passes through the first detector surface of the first X-ray detector before reaching the target volume. 62. A method for obtaining X-ray measurements of a target, comprising: emitting X-rays from a first X-ray source to irradiate a target volume containing the target; at least a portion of the X-rays emitted from the first X-ray source passing through a first detector surface of a first X-ray detector before reaching the target volume; and detecting the X-rays from the first X-ray source on a second detector surface of a second X-ray detector. 63. A method according to paragraph 62, wherein at least a portion of the X-rays emitted from the first X-ray source propagates in a first emission direction, the first emission direction is oriented away from the first detector surface, and a line along the first emission direction intersects the first detector surface. 64. A method according to any one of paragraphs 60 to 63, further comprising emitting X-rays from a second X-ray source to irradiate a target volume, and detecting X-rays from the second X-ray source on a first detector surface. 65. The method according to paragraph 64, wherein at least a portion of the X-rays emitted from the second X-ray source propagates in a second emission direction, the second emission direction is away from the second detector surface, and the line along the second emission direction intersects the second detector surface.

[0212] 66. A method according to paragraph 64 or 65, wherein at least a portion of the X-rays emitted from the second X-ray source passes through the second detector surface before reaching the target volume. 67. A method for obtaining X-ray measurements of a target, comprising: emitting X-rays from a first X-ray source to irradiate a target volume containing the target; emitting X-rays from a second X-ray source to irradiate the target volume containing the target; at least a portion of the X-rays emitted from the second X-ray source propagating toward the first X-ray source; detecting the X-rays from the first X-ray source on the second detector surface of the second X-ray detector; and detecting the X-rays from the second X-ray source on the first detector surface of the first X-ray detector. 68. A method for obtaining X-ray measurements of a target, comprising: emitting X-rays from a first X-ray source in a first emission direction to irradiate a target volume containing the target; emitting X-rays from a second X-ray source in a second emission direction to irradiate the target volume; detecting X-rays from the first X-ray source on the second detector surface of the second X-ray detector; detecting X-rays from the second X-ray source on the first detector surface of the first X-ray detector, wherein the second emission direction is parallel to and opposite to the first emission direction. 69. A method for preparing a device that interacts with an object, comprising obtaining measurements of the object using an X-ray system described in any one of paragraphs 1 to 59, and determining the settings of the device based on the measurements.

[0213] 70. A method for preparing a surgical instrument configured to engage with a stereotactic head frame, comprising engaging a support of an X-ray system with the stereotactic head frame while the stereotactic head frame is fitted to the patient's head, obtaining measurements of at least a portion of the patient's head using the X-ray system, and adjusting the settings of the surgical instrument based on the measurements. 71. The method according to paragraph 70, wherein the X-ray system comprises a first X-ray source configured to emit X-rays and a first X-ray detector having a first detector surface configured to detect X-rays, wherein a support for the X-ray system is configured to support the first X-ray source and the first X-ray detector, and the support for the X-ray system is configured to engage with a stereotactic head frame such that the first X-ray source and the first X-ray detector are in a predetermined positional relationship with respect to the stereotactic head frame when the X-ray system is engaged with the frame. 72. The method described in paragraph 71, wherein the first X-ray source and the first X-ray detector are stationary relative to the stereotactic head frame while the measurement is being acquired. 73. A method according to any one of paragraphs 70 to 72, wherein the setting of the surgical instrument includes positioning of at least a portion of the surgical instrument relative to the patient's head when the surgical instrument is engaged with the stereotactic head frame. 74. A method according to any one of paragraphs 70 to 73, wherein obtaining a measurement involves acquiring a number of images sufficient to perform two-dimensional and / or three-dimensional tomographic reconstruction of the patient's head. 75. A method of the procedure described in paragraph 74, wherein the adjustment of the setting includes determining a trajectory from outside the head to a target structure inside the head based on a tomographic reconstruction of the head.

[0214] 76. The method of paragraph 75, wherein the adjustment of the settings includes determining the position of a target structure within the head using predetermined positions of the first X-ray source and the first X-ray detector. 77. A method of determining location in paragraph 76, wherein the location does not involve the use of one or more reference markers in the image. 78. A method for determining the location of a structure within an object, comprising engaging a support of an X-ray system with a frame mounted on the object, wherein the X-ray system comprises a first X-ray source configured to emit X-rays and a first X-ray detector having a first detector surface configured to detect X-rays, the support being configured to support the first X-ray source and the first X-ray detector, obtaining measurements of the object using the X-ray system, determining the location of a structure within the object based on the measurements, wherein the X-ray system is configured to engage with the frame such that the first X-ray source and the first X-ray detector are in a predetermined positional relationship with respect to the frame when the X-ray system is engaged with the frame, and the location of the structure is defined by relative coordinates with respect to the frame. 79. The method described in paragraph 78, wherein the first X-ray source and the first X-ray detector are stationary relative to the frame while the measurement is being performed. 80. A method according to paragraph 78 or 79, wherein the subject is an animal and the structure is an anatomical structure.

[0215] 81. A method according to any one of paragraphs 78 to 80, wherein the subject is a human head and the frame is a stereotactic head frame. 82. A method according to any one of paragraphs 78 to 81, wherein obtaining a measurement involves acquiring a number of images sufficient to perform two-dimensional and / or three-dimensional tomographic reconstruction of the object. 83. A method according to any one of paragraphs 78 to 82, wherein the position determination includes using predetermined positions of the first X-ray source and the first X-ray detector. 84. A method according to any one of paragraphs 78 to 83, wherein the determination of location does not involve the use of one or more reference markers in the image. 85. A radiotherapy method comprising: obtaining measurements of a subject using an X-ray system described in any one of paragraphs 22 to 26 or any one of the preceding paragraphs subordinate thereto; locating a target structure within the subject based on the measurements; controlling the X-ray system to irradiate the target structure with a therapeutic X-ray dose; a first X-ray source and / or a second X-ray source being controlled to emit X-rays at a first intensity while obtaining measurements; and a first X-ray source and / or a second X-ray source being controlled to emit X-rays at a second intensity while irradiating a therapeutic dose, wherein the first intensity is lower than the second intensity.

Claims

1. A first X-ray source configured to emit X-rays, A second X-ray source configured to emit X-rays, A first X-ray detector having a first detector surface configured to detect X-rays, A second X-ray detector having a second detector surface configured to detect X-rays, The X-rays emitted from the first X-ray source are detected by the second X-ray detector. The X-rays emitted from the second X-ray source are detected by the first X-ray detector. The first X-ray source and the second X-ray source are configured to irradiate a target volume located between the first X-ray source and the second X-ray source with X-rays, and to expose an object within the target volume to X-rays. The X-rays emitted from the first X-ray source pass through the first detector surface of the first X-ray detector before reaching the target volume. An X-ray system in which X-rays emitted from the second X-ray source pass through the second detector surface of the second X-ray detector before reaching the target volume.

2. An X-ray system according to claim 1, wherein at least a portion of the X-rays emitted from the first X-ray source propagates in a first emission direction, the first emission direction is oriented away from the first detector surface, and the line along the first emission direction intersects the first detector surface.

3. An X-ray system according to claim 2, wherein the first emission direction is perpendicular to the first detector surface.

4. An X-ray system according to claim 1 or 2, wherein the first emission direction is toward the target volume.

5. An X-ray system according to any one of claims 1 to 4, wherein a) a signal from the first X-ray detector due to X-rays emitted from the first X-ray source is ignored, and / or b) the first X-ray detector generates a signal in response to X-rays emitted from the first X-ray source and passing through the surface of the first detector.

6. An X-ray system according to any one of claims 1 to 5, wherein the system comprises a plurality of the first X-ray sources.

7. An X-ray system according to claim 6, wherein the first X-ray source is selectively controllable, and each of the first X-ray sources is optionally individually and selectively controllable.

8. An X-ray system according to claim 7, wherein the system is configured to selectively control the plurality of first X-ray sources such that the maximum power consumption of the first X-ray sources falls below a predetermined power threshold during X-ray emission by the first X-ray source.

9. An X-ray system according to any one of claims 1 to 8, wherein the first X-ray source is provided in the emitter layer and the first detector surface is provided in the detector layer.

10. An X-ray system according to claim 9, wherein the detector layer is adjacent to or in contact with the emitter layer.

11. An X-ray system according to claim 9 or 10, wherein the system comprises a plurality of first X-ray sources uniformly distributed across the entire emitter layer.

12. An X-ray system according to any one of claims 9 to 11, wherein the first X-ray source is configured to emit X-rays through the detector layer.

13. An X-ray system according to any one of claims 9 to 12, wherein the emitter layer and the detector layer are flat and / or parallel.

14. An X-ray system according to any one of claims 1 to 13, wherein the system further comprises a filtering element configured to absorb X-rays emitted from the first X-ray source having an energy below a predetermined threshold.

15. An X-ray system according to any one of claims 1 to 14, wherein the system further comprises a shielding element configured to absorb X-rays that have passed through the first detector surface in a direction away from the target volume.

16. An X-ray system according to any one of claims 1 to 15, wherein the system comprises a plurality of the first X-ray detectors.

17. An X-ray system according to claim 16, wherein the first detector surfaces of the plurality of first X-ray detectors are arranged on the same plane.

18. In the X-ray system according to claim 16 or 17, a) The maximum total extent of the first detector surfaces of the plurality of first X-ray detectors within the plane of the plurality of first X-ray detectors is 40 cm or less, arbitrarily 30 cm or less, arbitrarily 25 cm or less, and / or b) An X-ray system in which the minimum total extent of the first detector surfaces of the plurality of first X-ray detectors within the plane of the plurality of first X-ray detectors is 5 cm or more, and optionally 10 cm or more.

19. An X-ray system according to any one of claims 16 to 18, wherein the system comprises a plurality of first X-ray sources, the maximum overall dimension of the plurality of first X-ray sources being less than or equal to the maximum overall dimension of the first detector surface of the plurality of first X-ray detectors in the plane of the plurality of first X-ray detectors.

20. An X-ray system according to any one of claims 1 to 19, wherein at least a portion of the X-rays emitted from the second X-ray source propagates toward the first X-ray source in the second emission direction.

21. In the X-ray system according to claim 20, At least a portion of the X-rays emitted from the first X-ray source propagates in the first emission direction. An X-ray system in which the second emission direction is parallel to and opposite to the first emission direction.

22. An X-ray system according to any one of claims 1 to 21, wherein the system comprises a plurality of the first X-ray sources and a plurality of the second X-ray sources.

23. An X-ray system according to claim 22, wherein the system is configured such that the first X-ray detector detects X-rays emitted from two or more second X-ray sources.

24. An X-ray system according to claim 23, wherein the system is configured to selectively control the second X-ray source to sequentially emit X-rays such that X-rays emitted from different second X-ray sources are detected by the first X-ray detector at different times.

25. In the X-ray system according to any one of claims 22 to 24, The system comprises a plurality of the first X-ray detectors, Each of the first X-ray detectors is configured to detect X-rays emitted from different subsets of the second X-ray source in an X-ray system.

26. An X-ray system according to any one of claims 22 to 25, wherein the system is configured such that the second X-ray detector detects X-rays emitted from two or more first X-ray sources.

27. An X-ray system according to claim 26, wherein the system is configured to selectively control the first X-ray source to sequentially emit X-rays such that X-rays emitted from different first X-ray sources are detected by the second X-ray detector at different times.

28. In the X-ray system according to any one of claims 22 to 27, The system comprises a plurality of the aforementioned second X-ray detectors, Each of the second X-ray detectors is configured to detect X-rays emitted from different subsets of the first X-ray source in an X-ray system.

29. An X-ray system according to any one of claims 1 to 28, wherein the system is configured to acquire X-ray images sufficient to perform two-dimensional and / or three-dimensional tomographic reconstruction of the object within the target volume, and the object optionally includes mammalian tissue.

30. An X-ray system according to any one of claims 1 to 29 that satisfies one or more of the following a) to c). a) The largest linear extent of the target volume is 50% or more, optionally 70% or more, or optionally 80% or more of the distance between the first X-ray source and the second X-ray source. b) The smallest linear extent of the target volume is 10% or more, optionally 20% or more, or optionally 40% or more of the distance between the first X-ray source and the second X-ray source. c) The minimum linear dimension of the target volume is 5 cm or more, and optionally 10 cm or more.

31. An X-ray system according to any one of claims 1 to 30, comprising a plurality of the first X-ray sources and a plurality of the second X-ray sources, satisfying either or both of the following a) and b). a) The maximum linear dimension of the target volume is 25% or more, optionally 50% or more, optionally 70% or more, or optionally 80% or more of the maximum distance between any first X-ray source and any second X-ray source. b) The minimum linear dimension of the target volume is 10% or more, optionally 20% or more, or optionally 40% or more of the maximum distance between any first X-ray source and any second X-ray source.

32. In the X-ray system according to any one of claims 1 to 31, the arrangement of the first X-ray source and the second X-ray source is such that when all of the first X-ray sources and the second X-ray sources are operating simultaneously, at least a portion of the target volume is irradiated with X-rays emitted from two or more different first X-ray sources or second X-ray sources. Optionally, two or more different first X-ray sources or second X-ray sources are an X-ray system comprising one or more first X-ray sources and one or more second X-ray sources.

33. An X-ray system according to any one of claims 1 to 32, wherein the first detector surface of the first X-ray detector and the second detector surface of the second X-ray detector are flat and parallel to each other.

34. In the X-ray system according to any one of claims 1 to 33, a) The distance between the first X-ray source and the second X-ray source is 40 cm or less, arbitrarily 30 cm or less, arbitrarily 22 cm or less, and / or b) An X-ray system in which the distance between the first X-ray source and the second X-ray source is 5 cm or more, optionally 10 cm or more, and optionally 15 cm or more.

35. In the X-ray system according to any one of claims 1 to 34, The system comprises a plurality of the first X-ray sources and a plurality of the second X-ray sources, The system comprises a plurality of first X-ray detectors and a plurality of second X-ray detectors, The first detector surface of the first X-ray detector and the second detector surface of the second X-ray detector are arranged such that the cross-section passing through the first and second detector surfaces forms a regular polygon having an even number of sides. The first X-ray source and the second X-ray source are arranged on the periphery of the regular polygon. Each of the first X-ray detectors is configured to detect X-rays emitted from the second X-ray source located on the side of the regular polygon opposite to the side on which the first X-ray detector is located. Each of the second X-ray detectors is configured to detect X-rays emitted from the first X-ray source located on the opposite side of the regular polygon from the side on which the second X-ray detector is located.

36. An X-ray system according to claim 35, wherein the regular polygon has four or more sides, optionally six or more sides, and optionally eight or more sides.

37. In the X-ray system according to any one of claims 1 to 36, The system comprises a support configured to support the first X-ray source and the first X-ray detector, The support is configured to be fixably engaged with a frame for holding an X-ray irradiated object, and optionally the frame is a stereotactic head frame in the X-ray system.

38. A first X-ray source configured to emit X-rays and A second X-ray detector having a second detector surface configured to detect X-rays emitted from the first X-ray source, The system comprises a support configured to support the first X-ray source and the second X-ray detector, The support is configured to engage securely with a frame for performing brain measurements, The aforementioned frame is a positioning head frame, An X-ray system in which the distance between the first X-ray source and the second X-ray detector is 40 cm or less.

39. An X-ray system according to claim 37 or 38, wherein the support is configured to engage with the frame such that when the support is engaged with the frame, the first X-ray source and the first X-ray detector are in a predetermined positional relationship with respect to the frame.

40. An X-ray system according to any one of claims 37 to 39, wherein the support comprises one or more engagement features configured to engage with corresponding mounting features of the frame.

41. A system for preparing surgical instruments configured to engage with a stereotactic head frame, The X-ray system according to any one of claims 37 to 40, A system comprising a processor configured to determine the settings of the surgical instrument based on measurements performed using the aforementioned X-ray system.

42. A radiation therapy system, The X-ray system according to any one of claims 1 to 40, Using the aforementioned X-ray system, measurements of the subject are obtained. Based on the above measurements, the location of the target structure within the subject is identified. The system comprises a processor configured to control the X-ray system to irradiate the target structure with a therapeutic dose of X-rays, The processor is configured to control the first X-ray source and / or the second X-ray source to emit X-rays at a first intensity while the measurement is being acquired. The processor is configured to control the first X-ray source and / or the second X-ray source to emit X-rays at a second intensity while irradiating a therapeutic dose. A radiation therapy system in which the first intensity is lower than the second intensity.

43. An X-ray system according to any one of claims 1 to 40, wherein the system is portable and can be carried by a person at will.

44. An X-ray system according to any one of claims 1 to 43, wherein the first X-ray source and the first X-ray detector are stationary while the system is used to irradiate a target with X-rays.

45. An X-ray system according to any one of claims 1 to 44 that satisfies either or both of the following a) and b). a) The first X-ray source is configured to emit X-rays with controllable energy. b) The first X-ray source is configured to emit cone-beam-shaped X-rays.

46. An X-ray system according to any one of claims 1 to 45, wherein the system comprises a collimator configured to shape the X-ray beam emitted from the first X-ray source, An X-ray system in which the collimator is optionally configured to shape the beam into a rectangular beam, and more optionally into a square beam.

47. An X-ray system according to any one of claims 1 to 46, wherein the first X-ray source is a cold cathode field emission electron source which is, for example, a carbon nanotube layer, a graphene multilayer structure, bulk graphene, or a spint emitter.

48. An X-ray system according to any one of claims 1 to 47, wherein the first X-ray source includes a transmission X-ray target and optionally includes tungsten, tantalum, or molybdenum.

49. An X-ray system according to any one of claims 1 to 48, wherein the first X-ray detector is a digital X-ray detector which is, for example, an organic photodetector (OPD), an organic-inorganic hybrid semiconductor, or a low-gain avalanche diode (LGAD).

50. An X-ray system according to any one of claims 1 to 49, wherein the X-ray system is an X-ray imaging system.

51. A method for preparing a device that interacts with an object, Using the X-ray system described in any one of claims 1 to 50, the measurement of the object is obtained, A method for determining the settings of the apparatus based on the aforementioned measurements.

52. A method for performing X-ray measurements of an object using an X-ray system, X-rays are emitted from the first X-ray source of the X-ray system to irradiate the target volume including the object, and at least a portion of the X-rays emitted from the first X-ray source passes through the first detector surface of the first X-ray detector of the X-ray system before reaching the target volume. On the second detector surface of the second X-ray detector of the aforementioned X-ray system, X-rays from the first X-ray source are detected. X-rays are emitted from the second X-ray source of the X-ray system to irradiate the target volume, and at least a portion of the X-rays emitted from the second X-ray source passes through the second detector surface before reaching the target volume. X-rays from the second X-ray source are detected on the first detector surface. The method wherein the target volume is located between the first X-ray source and the second X-ray source.

53. The method according to claim 52, wherein at least a portion of the X-rays emitted from the first X-ray source propagates in a first emission direction, the first emission direction is away from the first detector surface, and the line along the first emission direction intersects the first detector surface.

54. The method according to claim 52 or 53, wherein at least a portion of the X-rays emitted from the second X-ray source propagates in a second emission direction, the second emission direction is oriented away from the second detector surface, and the line along the second emission direction intersects the second detector surface.

55. A method according to any one of claims 52 to 54, wherein at least a portion of the X-rays emitted from the second X-ray source propagates toward the first X-ray source.

56. In the method according to any one of claims 52 to 55, The X-rays emitted from the first X-ray source are emitted in the first emission direction. The X-rays emitted from the second X-ray source are emitted in the second emission direction. The method wherein the second discharge direction is parallel to and opposite to the first discharge direction.

57. A method for preparing a surgical instrument configured to engage with a stereotactic head frame, While the stereotactic head frame is attached to the patient's head, the support for the X-ray system is engaged with the stereotactic head frame. Using the aforementioned X-ray system, measurements are obtained for at least a portion of the patient's head. A method for adjusting the settings of the surgical instrument based on the aforementioned measurement.

58. In the method according to claim 57, The X-ray system comprises a first X-ray source configured to emit X-rays and a first X-ray detector having a first detector surface configured to detect X-rays. The support of the X-ray system is configured to support the first X-ray source and the first X-ray detector. A method wherein the support of the X-ray system is configured to engage with the positioning head frame such that the first X-ray source and the first X-ray detector assume a predetermined positional relationship with respect to the positioning head frame when the X-ray system engages with the frame.

59. The method according to claim 58, wherein the first X-ray source and the first X-ray detector are stationary relative to the positioning head frame while the measurement is being performed.

60. A method according to any one of claims 57 to 59, wherein the setting of the surgical instrument includes the position of at least a portion of the surgical instrument relative to the patient's head when the surgical instrument is engaged with the stereotactic head frame.

61. A method according to any one of claims 57 to 60, wherein obtaining a measurement includes taking a number of images sufficient to perform two-dimensional and / or three-dimensional tomographic reconstruction of the patient's head.

62. A method according to claim 61, wherein the adjustment of the settings includes determining a trajectory from outside the head to a target structure inside the head based on a tomographic reconstruction of the head.

63. The method according to claim 62, wherein the adjustment of the settings includes determining the position of the target structure in the head using a predetermined positional relationship between the first X-ray source and the first X-ray detector.

64. The method according to claim 63, wherein the determination of the position does not involve the use of one or more reference markers in the plurality of images.

65. A method for identifying the location of a structure within a target, The support body of the X-ray system is engaged with a frame mounted on the aforementioned object, and the X-ray system comprises a first X-ray source configured to emit X-rays and a first X-ray detector having a first detector surface configured to detect X-rays, and the support body is configured to support the first X-ray source and the first X-ray detector. Using the aforementioned X-ray system, measurements of the target are obtained. Based on the above measurement, the position of the structure within the target is determined. The X-ray system is configured to engage with the frame such that when the X-ray system is engaged with the frame, the first X-ray source and the first X-ray detector assume a predetermined positional relationship with respect to the frame. The position of the structure is defined by its relative coordinates to the frame.

66. The method according to claim 65, wherein the first X-ray source and the first X-ray detector are stationary relative to the frame while the measurement is being performed.

67. The method according to claim 65 or 66, wherein the subject is an animal and the structure is an anatomical structure.

68. A method according to any one of claims 65 to 67, wherein the object is a human head and the frame is a stereotactic head frame.

69. A method according to any one of claims 65 to 68, wherein obtaining a measurement includes taking a number of images sufficient to perform two-dimensional and / or three-dimensional tomographic reconstruction of the object.

70. A method according to any one of claims 65 to 69, wherein the determination of the position includes using the predetermined positional relationship of the first X-ray source and the first X-ray detector.

71. A method according to any one of claims 65 to 70, wherein the determination of the position does not involve the use of one or more reference markers in the plurality of images.

72. A method according to any one of claims 52 to 71, wherein the X-ray system is the X-ray system according to any one of claims 1 to 50.

73. A method of radiation therapy, Using the X-ray system described in any one of claims 1 to 50, a measurement of the subject is obtained, Based on the above measurements, the location of the target structure within the subject is identified. The X-ray system is controlled to irradiate the target structure with a therapeutic dose of X-rays. The first X-ray source and / or the second X-ray source are controlled to emit X-rays at a first intensity while the measurement is being acquired. The first X-ray source and / or the second X-ray source are controlled to emit X-rays at a second intensity while irradiating the therapeutic dose. A radiation therapy method in which the first intensity is lower than the second intensity.

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