Machine vision detection method, detection device, and detection system
The use of a line laser-based detection method for post-welding inspection enhances accuracy and efficiency by calculating gaps and welding point widths in three-dimensional images, addressing the limitations of traditional machine vision systems.
JP7597946B2Active Publication Date: 2024-12-10CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
3 Cites -1 Cited by
Patent Information
- Application Number
- JP2023553313
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- Filing Date
- 2021-12-29
- Publication Date
- 2024-12-10
- Estimated Expiration
- 2041-12-29
Abstract
A machine vision detection method, detection device, and detection system. The detection method includes the steps of receiving a three-dimensional image from a line laser, converting the three-dimensional image into a two-dimensional grayscale image, obtaining a boundary of a first member and a boundary of a second member from the two-dimensional grayscale image, determining N perpendicular lines located between the boundary of the first member and the boundary of the second member, and calculating an average value of the lengths of the N perpendicular lines as a gap between the first member and the second member. The three-dimensional image includes at least a part of the boundary of the first member, the boundary of the second member, and at least one welding point located on the boundary of the first member and the second member, where N is a positive integer. The method can more accurately calculate the gap between the two members by performing multiple detections and calculating the average value, thereby improving the detection accuracy. It also supports continuous sampling of the detection member, and does not require pre-calibration of the camera.
Need to check novelty before this filing date? Find Prior Art
Citation Information
Patent Citations
Method for measuring gap surface difference by using multi-line structured light
CN110530278A
Optical testing method on the basis of intensity distribution
EP2495525A1
Image processing apparatus, image processing method, and program
JP2014035656A
