Machine vision detection method, detection device, and detection system

The use of a line laser-based detection method for post-welding inspection enhances accuracy and efficiency by calculating gaps and welding point widths in three-dimensional images, addressing the limitations of traditional machine vision systems.

JP7597946B2Active Publication Date: 2024-12-10CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
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Patent Information

Application Number
JP2023553313
Authority / Receiving Office
JP · JP
Patent Type
Patents
Current Assignee / Owner
Filing Date
2021-12-29
Publication Date
2024-12-10
Estimated Expiration
2041-12-29
Patent Text Reader

Abstract

A machine vision detection method, detection device, and detection system. The detection method includes the steps of receiving a three-dimensional image from a line laser, converting the three-dimensional image into a two-dimensional grayscale image, obtaining a boundary of a first member and a boundary of a second member from the two-dimensional grayscale image, determining N perpendicular lines located between the boundary of the first member and the boundary of the second member, and calculating an average value of the lengths of the N perpendicular lines as a gap between the first member and the second member. The three-dimensional image includes at least a part of the boundary of the first member, the boundary of the second member, and at least one welding point located on the boundary of the first member and the second member, where N is a positive integer. The method can more accurately calculate the gap between the two members by performing multiple detections and calculating the average value, thereby improving the detection accuracy. It also supports continuous sampling of the detection member, and does not require pre-calibration of the camera.
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Citation Information

Patent Citations

  • Method for measuring gap surface difference by using multi-line structured light

    CN110530278A

  • Optical testing method on the basis of intensity distribution

    EP2495525A1

  • Image processing apparatus, image processing method, and program

    JP2014035656A