Semiconductor Device
Patent Information
- Application Number
- JP2021548324
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- Priority Date
- 2019-09-27
- Filing Date
- 2020-05-14
- Publication Date
- 2024-12-16
- Estimated Expiration
- 2040-05-14
AI Technical Summary
Conventional semiconductor devices with redundant wiring pairs face issues of undetectable short circuits during the manufacturing process, leading to deterioration in soft error resistance due to short-circuiting, which cannot be identified at the inspection stage.
The semiconductor device incorporates a design with multiple wiring layers where redundant wiring pairs are separated by a distance greater than the interlayer distance, ensuring they belong to different layers and have an overlapping portion with a specific distance arrangement to minimize short-circuit occurrence.
This design effectively reduces the likelihood of short circuits between redundant wiring pairs, allowing for detectable faults during manufacturing and maintaining high soft error resistance.
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Abstract
Citation Information
Patent Citations
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