Analysis device

JP7602331B2Active Publication Date: 2024-12-18TAMRON CO LTD
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Patent Information

Application Number
JP2020123128
Authority / Receiving Office
JP · JP
Patent Type
Patents
Current Assignee / Owner
Filing Date
2020-07-17
Publication Date
2024-12-18
Estimated Expiration
2040-07-17

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Abstract

To provide an analyzer at low cost which can easily analyze a plurality of materials on the basis of Raman scattered light.SOLUTION: An analyzer (1) includes: a plurality of optical filters (14-1 to 14-5) for selectively transmitting light with a longer wavelength or a shorter wavelength than a specific wavelength of light scattered by a sample (S) by emission of excitation light, the optical filters having different specific wavelengths; a plurality of light detectors (15-1 to 15-5) for detecting the intensity of light which has passed through the optical filters (14-1 to 14-5); and a control unit (17) for specifying a material included in the sample (S) on the basis of a signal output from the plurality of light detectors (15-1 to 15-5).SELECTED DRAWING: Figure 1
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Citation Information

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