Measuring device and image forming device

Abstract

To enable a measurement time for measuring the electric resistance of a recording medium to be shortened.SOLUTION: A measurement device comprises: a measurement unit having a first mode in which the electric resistance of a recording medium that is used in an image forming device is measured in a first range of predetermined electric resistance values and a second mode in which the electric resistance is measured in a second range of electric resistance values that are different from those of the first range, the second and first ranges being set so that, regarding the electric resistance of multiple brands of recording media, the number of brands belonging to the second range is larger than the number of brands belonging to the first range; and a control unit for exercising control upon the measurement unit to cause the second mode to be executed preferentially over the first mode.SELECTED DRAWING: Figure 5

Description

[Technical field]

[0001] The present invention relates to a measuring device and an image forming apparatus. [Background technology]

[0002] Patent Document 1 discloses a measurement terminal used for measuring the resistance of a thin film using a four-terminal method, characterized in that the positions of the four measurement terminals are fixed so that the measured voltage value divided by the current value is equal to the sheet resistance value of the thin film. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] JP 2011-137774 A Summary of the Invention [Problem to be solved by the invention]

[0004] The measuring device may have a first mode for measuring the electrical resistance of a recording medium used in an image forming device within a first range of predetermined electrical resistance values, and a second mode for measuring the electrical resistance within a second range of electrical resistance values ​​different from the first range, the second range and the first range being set such that, for the electrical resistance of multiple brands of recording media, the number of brands belonging to the second range is greater than the number of brands belonging to the first range.

[0005] In this measuring device, if the first mode is executed with priority over the second mode, it may take a long time to measure the electrical resistance of the recording medium.

[0006] The present invention aims to shorten the measurement time required to measure the electrical resistance of a recording medium, compared to a configuration in which control is performed on the measurement unit to give priority to the first mode over the second mode. [Means for solving the problem]

[0007] The first aspect is a measurement unit having a first mode for measuring the electrical resistance of a recording medium used in an image forming apparatus within a predetermined first range of electrical resistance values, and a second mode for measuring the electrical resistance within a second range of electrical resistance values ​​different from the first range, wherein the second range and the first range are set such that, for electrical resistance of multiple brands of recording media, the number of brands belonging to the second range is greater than the number of brands belonging to the first range, and a control unit that controls the measurement unit to execute the second mode in priority over the first mode.

[0008] In a second aspect, the control unit controls the measurement unit not to execute the first mode when the electrical resistance of the recording medium measured in the second mode is within the second range.

[0009] In a third aspect, when the electrical resistance of the recording medium measured in the second mode is within the second range, the control unit controls the measurement unit to execute a third mode in which the electrical resistance is measured within the second range and a larger number of samples are used to measure the electrical resistance or the measurement time is longer than in the second mode.

[0010] In a fourth aspect, the control unit controls the measurement unit to execute the first mode when the electrical resistance of the recording medium measured in the second mode is not within the second range.

[0011] In a fifth aspect, when the electrical resistance of the recording medium measured in the first mode is within the first range, the control unit controls the measurement unit to execute a fourth mode in which the electrical resistance is measured within the first range and a larger number of samples are used to measure the electrical resistance or the measurement time is longer than in the first mode.

[0012] In a sixth aspect, when the electrical resistance of the recording medium measured in the first mode is not within the first range, the control unit controls the measurement unit to execute a fifth mode in which the electrical resistance is measured within a third range of electrical resistance values ​​different from the first range and the second range.

[0013] In a seventh embodiment, the second range is set as a range in which the electrical resistances of more than half of the brands fall.

[0014] An eighth aspect includes an acquisition unit that acquires an execution instruction to execute the control, and when the acquisition unit acquires an execution instruction to execute the control, the control unit performs the control on the measurement unit, and when the acquisition unit does not acquire an execution instruction to execute the control, the control unit does not perform the control on the measurement unit.

[0015] In a ninth aspect, the acquisition unit acquires either an execution instruction to execute a first control as the control or an execution instruction to execute a second control, and when the acquisition unit acquires an execution instruction to execute the first control, the control unit performs the first control on the measurement unit, and when the acquisition unit acquires an execution instruction to execute the second control, the control unit performs the second control on the measurement unit to execute both the first mode and the second mode regardless of the measurement results measured by the measurement unit.

[0016] A tenth aspect includes a measuring device according to any one of the first to ninth aspects, an image forming unit that forms an image on a recording medium whose electrical resistance has been measured by the measuring device, and a control device that controls the image formation operation of the image forming unit based on the electrical resistance measured by the measuring device. Effect of the Invention

[0017] According to the first aspect, the measurement time required to measure the electrical resistance of the recording medium can be shortened, compared to a configuration in which the measurement unit is controlled to execute the first mode with priority over the second mode.

[0018] According to the configuration of the second aspect, the measurement time for measuring the electrical resistance of the recording medium can be shortened, compared to a configuration in which the first mode is always executed after the second mode is executed.

[0019] According to the configuration of the third aspect, when the electrical resistance of the recording medium measured in the second mode is within the second range, the electrical resistance of the recording medium can be measured with high accuracy compared to a configuration in which the processing is terminated without executing the third mode.

[0020] According to the configuration of the fourth aspect, it is possible to specify whether or not the electrical resistance of the recording medium is an electrical resistance value included in the first range.

[0021] According to the configuration of the fifth aspect, when the electrical resistance of the recording medium measured in the first mode is within the first range, the electrical resistance of the recording medium can be measured with high accuracy compared to a configuration in which the processing is terminated without executing the fourth mode.

[0022] According to the configuration of the sixth aspect, it is possible to specify whether or not the electrical resistance of the recording medium is an electrical resistance value included in the third range.

[0023] According to the seventh aspect, the measurement time required to measure the electrical resistance of the recording medium can be shortened, compared to a configuration in which the second range is set as a range in which half or less of the brands of electrical resistance belong.

[0024] According to the configuration of the eighth aspect, it is possible to select whether or not to execute control for giving priority to the second mode over the first mode.

[0025] According to the configuration of the ninth aspect, it is possible to select whether the first control or the second control is to be executed.

[0026] According to the configuration of the tenth aspect, a high-quality image can be formed on the recording medium, compared to a configuration in which the image forming operation of the image forming unit is performed regardless of the electrical resistance of the recording medium. [Brief description of the drawings]

[0027] [Figure 1]1 is a block diagram showing a configuration of an image forming apparatus according to an embodiment of the present invention; [Diagram 2] 1 is a schematic diagram showing a configuration of a measurement device according to an embodiment of the present invention. [Diagram 3] 4 is a graph for explaining a measurement range of the measurement device according to the present embodiment. [Figure 4] 2 is a block diagram showing an example of a hardware configuration of a control circuit according to the present embodiment. FIG. [Diagram 5] 2 is a block diagram showing an example of a functional configuration of a processor of the control circuit according to the embodiment. FIG. [Figure 6] 5 is a flowchart showing a flow of a control process according to the present embodiment. [Figure 7] 10 is a flowchart showing a flow of a time priority process according to the embodiment. [Figure 8] 10 is a flowchart showing a flow of precision priority processing according to the present embodiment. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0028] Hereinafter, an example of an embodiment of the present invention will be described with reference to the drawings.

[0029] (Image forming apparatus 10) A configuration of an image forming apparatus 10 according to this embodiment will be described below. Fig. 1 is a block diagram showing the configuration of an image forming apparatus 10 according to this embodiment.

[0030] The image forming apparatus 10 shown in Fig. 1 is an apparatus for forming an image. Specifically, as shown in Fig. 1, the image forming apparatus 10 includes an image forming apparatus main body 11, a medium storage section 12, an image forming section 14, a conveying mechanism 15, a control device 16, and a measuring device 20. The image forming apparatus 10 is capable of transmitting and receiving data to and from a user terminal 19. Each section of the image forming apparatus 10 will be described below.

[0031] (Image forming device body 11) 1 is a portion in which the components of the image forming device 10 are provided. Specifically, the image forming device body 11 is configured, for example, as a box-shaped housing. In this embodiment, the medium storage unit 12, the image forming unit 14, and the transport mechanism 15 are provided inside the image forming device body 11.

[0032] (Medium storage section 12) 1 is a portion of the image forming apparatus 10 that stores paper P. The paper P stored in the medium storage portion 12 is supplied to the image forming portion 14. The paper P is an example of a "recording medium."

[0033] (Image forming unit 14) 1 has a function of forming an image on paper P supplied from the medium container 12. Examples of the image forming unit 14 include an inkjet type image forming unit that forms an image on paper P using ink, and an electrophotographic type image forming unit that forms an image on paper P using toner.

[0034] In an inkjet type image forming unit, for example, ink droplets are ejected from an ejection unit onto a sheet of paper P to form an image on the sheet of paper P. In the inkjet type image forming unit, ink droplets may be ejected from an ejection unit onto a transfer body, and the ink droplets may be transferred from the transfer body to the sheet of paper P to form an image on the sheet of paper P.

[0035] In an electrophotographic image forming unit, for example, the steps of charging, exposing, developing, transferring, and fixing are performed to form an image on paper P. In the electrophotographic image forming unit, an image may be formed on a transfer body by performing the steps of charging, exposing, developing, and transferring, and then transferring the image from the transfer body to paper P, and then fixing the image to paper P, thereby forming an image on paper P.

[0036] Note that examples of the image forming section are not limited to the inkjet type image forming section and the electrophotographic type image forming section described above, and various other image forming sections can be used.

[0037] (Transport mechanism 15) 1 is a mechanism for transporting paper P. As an example, the transport mechanism 15 transports paper P by transport members (not shown) such as a transport roll and a transport belt. The transport mechanism 15 transports paper P from the medium container 12 to the image forming unit 14 through a predetermined transport path.

[0038] (Overview of user terminal 19, control device 16, and measurement device 20) The user terminal 19 shown in Fig. 1 is configured with a terminal such as a smartphone, a tablet, or a personal computer. The user terminal 19 is capable of communicating with the measuring device 20 and the control device 16 wirelessly or by wire. As shown in Fig. 1, the measuring device 20 and the control device 16 are provided outside the image forming device main body 11, for example. Each of the user terminal 19 and the control device 16 is configured with a control unit (control board) having a recording unit configured with a storage or the like in which a program is recorded, and a processor that operates according to the program.

[0039] In this embodiment, a user of the image forming apparatus 10 places, for example, a sheet of paper P on which an image is to be formed on the measuring device 20 and issues a measurement instruction from the user terminal 19. Upon receiving the measurement instruction from the user terminal 19, the measuring device 20 measures the physical properties of the sheet of paper P and transmits measurement value information indicating the measured values ​​of the physical properties to the user terminal 19.

[0040] A user of the image forming apparatus 10, for example, stores the paper P that has been measured by the measuring device 20 in the medium storage unit 12, and issues a measurement instruction and an image formation instruction from the user terminal 19. The image formation instruction may also serve as a measurement instruction.

[0041] When the control device 16 receives an acquisition instruction from the user terminal 19, it acquires measurement value information from the user terminal 19. When the control device 16 receives an image formation instruction from the user terminal 19, it causes the image forming unit 14 and the transport mechanism 15 to perform an image formation operation, and controls the operations of the image forming unit 14 and the transport mechanism 15 based on the measurement value information. Specifically, the control device 16 controls the transport speed of the paper P in the transport mechanism 15, as well as the transfer voltage and fixing temperature in the image forming unit 14, based on the measurement value information.

[0042] In the above example, control device 16 is provided outside image forming apparatus main body 11, but it may be provided inside image forming apparatus main body 11. In addition, control device 16 acquires measurement value information of measuring device 20 via user terminal 19, but it may be configured to acquire measurement value information directly from measuring device 20.

[0043] Furthermore, although the measuring device 20 is provided outside the image forming apparatus body 11, it may be provided inside the image forming apparatus body 11. Specifically, the measuring device 20 may be configured as a device that measures physical properties in the medium storage unit 12 or in the transport path of the paper P.

[0044] (Specific configuration of the measuring device 20) FIG. 2 is a schematic diagram showing the configuration of a measuring device 20 according to this embodiment. Note that the arrow UP shown in the figure indicates the upper side (vertically upward) of the device, and the arrow DO indicates the lower side (vertically downward) of the device. Also, the arrow LH shown in the figure indicates the left side of the device, and the arrow RH indicates the right side of the device. Also, the arrow FR shown in the figure indicates the front side of the device, and the arrow RR indicates the rear side of the device. These directions are determined for the convenience of explanation, and the device configuration is not limited to these directions. Note that in each direction of the device, the word "device" may be omitted. That is, for example, "above the device" may be simply indicated as "above."

[0045] In addition, in the following description, the "up-down direction" may mean "both above and below" or "either above or below". The "left-right direction" may mean "both right and left" or "either right or left". The "left-right direction" may also be referred to as the lateral direction or horizontal direction. The "front-rear direction" may mean "both forward and backward" or "either forward or backward". The front-rear direction may also be referred to as the lateral direction or horizontal direction. In addition, the up-down direction, left-right direction, and front-rear direction are directions that intersect with each other (specifically, directions that are perpendicular to each other).

[0046] In addition, the symbol "x" inside a "circle" in the figure means an arrow pointing from the front to the back of the page. In addition, the symbol "·" inside a "circle" in the figure means an arrow pointing from the back to the front of the page.

[0047] The measuring device 20 is a device that measures the physical properties of the paper P used in the image forming apparatus 10. Specifically, the measuring device 20 measures the basis weight, electrical resistance, and the presence or absence of a coating layer of the paper P. Note that "measurement" means measuring the value (i.e., the degree) of a physical property, but the value of the physical property is a concept that includes 0 (zero). In other words, "measurement" includes measuring whether the value of the physical property is 0 (zero) or not, that is, measuring whether or not the physical property is present.

[0048] 2, the measuring device 20 specifically includes a first housing 21, a second housing 22, a basis weight measuring unit 30, a resistance measuring unit 50, and a coating layer measuring unit 70. Each part of the measuring device 20 will be described below.

[0049] (First housing 21) The first housing 21 is a portion in which some of the components of the measuring device 20 are provided. This first housing 21 constitutes the lower portion of the measuring device 20. The first housing 21 has an opposing surface 21A that faces the lower surface of the paper sheet P. The opposing surface 21A is also a support surface that supports the paper sheet P from below. A portion of the basis weight measuring unit 30 and a portion of the resistance measuring unit 50 are arranged inside the first housing 21.

[0050] (Second housing 22) The second housing 22 is a portion in which the other parts of each component of the measuring device 20 are provided. This second housing 22 constitutes the upper portion of the measuring device 20. The second housing 22 has an opposing surface 22A that faces the upper surface of the paper P. Other parts of the basis weight measuring unit 30, the coating layer measuring unit 70, and other parts of the resistance measuring unit 50 are arranged inside the second housing 22. In the measuring device 20, a paper sheet P as an example of a measurement target is arranged between the first housing 21 and the second housing 22.

[0051] In addition, the second housing 22 is configured to be movable relative to the first housing 21, for example, in a direction approaching and moving away from the first housing 21 (specifically, in the up and down direction), and after the paper P is placed between the first housing 21 and the second housing 22, it moves relative to the first housing 21 in a direction approaching the first housing 21 and is positioned at the position shown in Figure 2.

[0052] (Basic weight measurement section 30) The basis weight measuring unit 30 shown in FIG. 2 vibrates the paper P with ultrasonic waves to measure the basis weight [g / m 2 The basis weight measuring unit 30 specifically includes a drive circuit 31, a transmitting unit 32, a receiving unit 35, and a processing unit 36, as shown in FIG.

[0053] The transmitter 32 has a function of transmitting ultrasonic waves to the paper P. The transmitter 32 is disposed in the second housing 22. That is, the transmitter 32 is disposed at a position facing one surface (specifically, the upper surface) of the paper P. Note that below the transmitter 32 in the second housing 22, an opening 24 is formed to allow the ultrasonic waves from the transmitter 32 to pass through to the paper P.

[0054] The driving circuit 31 is a circuit that drives the transmitting unit 32. When the driving circuit 31 drives the transmitting unit 32, the transmitting unit 32 applies ultrasonic waves to the upper surface side of the paper P, vibrating the paper P. The vibrated paper P vibrates the air below the paper P. In other words, the ultrasonic waves from the transmitting unit 32 pass through the paper P.

[0055] The receiving unit 35 has a function of receiving ultrasonic waves that have passed through the paper sheet P. The receiving unit 35 is disposed in the first housing 21. That is, the receiving unit 35 is disposed at a position facing the other surface (specifically, the lower surface) of the paper sheet P. The receiving unit 35 generates a reception signal by receiving the ultrasonic waves that have passed through the paper sheet P. An opening 23 is formed above the receiving unit 35 in the first housing 21, allowing the ultrasonic waves from the paper sheet P side to pass through to the receiving unit 35.

[0056] In this way, in the basis weight measurement unit 30, the transmitter 32 and the receiver 35 constitute a detection unit (specifically, a detection sensor) that detects information indicating the basis weight of the paper P (specifically, ultrasonic waves transmitted through the paper P). A drive circuit 31 constitutes a circuit that drives the detection unit.

[0057] The processing unit 36 ​​obtains a measurement value by performing processing such as amplification on the received signal obtained from the receiving unit 35. Furthermore, the processing unit 36 ​​outputs measurement value information indicating the obtained measurement value to the user terminal 19. As one example, the processing unit 36 ​​is configured with an electric circuit including an amplifier circuit and the like.

[0058] The measurement value obtained by the processing unit 36 ​​is a value that has a correlation with the basis weight of the paper P. Therefore, the measurement in the basis weight measuring unit 30 includes not only the measurement of the basis weight of the paper P itself, but also the measurement of a measurement value that has a correlation with the basis weight of the paper P.

[0059] In addition, the basis weight measuring unit 30 may calculate the basis weight of the paper P based on the measurement value obtained by the processing unit 36. Specifically, the basis weight measuring unit 30 calculates the basis weight from correlation data indicating the correlation between the measurement value and the basis weight, for example.

[0060] (Coating layer measuring unit 70) The coating layer measuring unit 70 shown in Fig. 2 has the function of measuring the presence or absence of a coating layer on paper P. A coating layer is a layer formed by applying a coating agent to the surface of paper. In other words, the coating layer measuring unit 70 measures whether or not the paper P is coated paper (i.e., coated paper). Specifically, as shown in Fig. 2, the coating layer measuring unit 70 has a drive circuit 71, a light irradiating unit 72, a light receiving unit 75, and a processing unit 76.

[0061] The light irradiating section 72 has a function of irradiating light onto the paper P. The light irradiating section 72 is disposed in the second housing 22. That is, the light irradiating section 72 is disposed at a position facing one surface (specifically, the upper surface) of the paper P with a gap therebetween. Note that below the light irradiating section 72 in the second housing 22, an opening 28 is formed to pass the light from the light irradiating section 72 onto the paper P.

[0062] The driving circuit 71 is a circuit that drives the light emitting section 72. When the driving circuit 71 drives the light emitting section 72, the light emitting section 72 irradiates the paper P with light, and the light is reflected by the paper P.

[0063] The light receiving unit 75 has a function of receiving light reflected by the paper P. The light receiving unit 75 is disposed in the second housing 22. That is, the light receiving unit 75 is disposed in a position facing one surface (specifically, the upper surface) of the paper P with a gap therebetween. The light receiving unit 75 receives the light reflected by the paper P and generates a light receiving signal. Note that an opening 29 is formed below the light receiving unit 75 in the second housing 22, which allows light from the paper P side to pass through to the light receiving unit 75.

[0064] Thus, in the coating layer measuring unit 70, the light irradiating unit 72 and the light receiving unit 75 constitute a detection unit (specifically, a detection sensor) that detects information indicating the presence or absence of a coating layer on the paper P (specifically, light reflected by the paper P). A drive circuit 71 constitutes a circuit that drives the detection unit.

[0065] The processing unit 76 obtains a measurement value by performing processing such as amplification on the light receiving signal obtained from the light receiving unit 75. Furthermore, the processing unit 76 outputs measurement value information indicating the obtained measurement value to the user terminal 19. As one example, the processing unit 76 is configured by an electric circuit including an amplifier circuit and the like.

[0066] The measured values ​​obtained by processing unit 76 are values ​​that correlate with the presence or absence of a coating layer on paper P. Therefore, the measurements in coating layer measuring unit 70 include not only measuring the presence or absence of a coating layer on paper P itself, but also measuring a measurement value that correlates with the presence or absence of a coating layer on paper P.

[0067] The coating layer measuring unit 70 may measure the presence or absence of a coating layer on the paper P based on the measurement value obtained by the processing unit 76. Specifically, the presence or absence of a coating layer is measured, for example, by whether or not the measurement value exceeds a predetermined threshold value.

[0068] (Resistance measuring unit 50) The resistance measuring unit 50 shown in Fig. 2 has a function of measuring the surface resistance value [Ω] of the paper P. The resistance measuring unit 50 is an example of a "measuring unit." The surface resistance is an example of an "electrical resistance." Specifically, as shown in Fig. 2, the resistance measuring unit 50 has an electric circuit 51, a pair of terminals 52, a power source 53, a pair of opposing members 54, a detection circuit 55, and a processing unit 56.

[0069] The pair of terminals 52 are disposed, for example, on the first housing 21. The pair of terminals 52 are spaced apart from each other in the left-right direction and contact the lower surface of the paper P through an opening 25 formed in the first housing 21. Each of the pair of terminals 52 is electrically connected to a power source 53 through an electric circuit 51.

[0070] Each of the pair of opposing members 54 faces each of the pair of terminals 52 with the paper P disposed between each of the pair of terminals 52. Each of the pair of opposing members 54 contacts the upper surface of the paper P through the opening 26 formed in the second housing 22. That is, the paper P is sandwiched between each of the pair of opposing members 54 and each of the pair of terminals 52. Each of the pair of opposing members 54 and each of the pair of terminals 52 are formed of a roll, for example.

[0071] The power source 53 applies a predetermined voltage ([V]) to the pair of terminals 52 through the electric circuit 51. As a result, a current corresponding to the surface resistance of the paper P flows between the pair of terminals 52. The detection circuit 55 is electrically connected to the pair of terminals 52. The detection circuit 55 detects the current flowing between the pair of terminals 52 to generate a detection signal.

[0072] In this way, in the resistance measuring unit 50, the pair of terminals 52 and the detection circuit 55 constitute a detection unit (specifically, a detection sensor) that detects information indicating the surface resistance of the paper P (specifically, the current flowing through the paper P). The electric circuit 51 constitutes a circuit that drives the detection unit.

[0073] The processing unit 56 performs processing such as amplification on the detection signal obtained from the detection circuit 55 to obtain a measurement value (specifically, a current value [A]). Furthermore, the processing unit 56 outputs measurement value information indicating the obtained measurement value to the user terminal 19. As an example, the processing unit 56 is configured by an electric circuit including an amplifier circuit and the like.

[0074] The measured value obtained by the processing unit 56 is a value that has a correlation with the surface resistance value of the paper P. Therefore, the measurement in the resistance measuring unit 50 includes not only measuring the surface resistance value of the paper P itself, but also measuring a measured value that has a correlation with the surface resistance value of the paper P. Note that the resistance measuring unit 50 may calculate the surface resistance value of the paper P based on the measured value obtained by the processing unit 56.

[0075] In the above embodiment, the resistance measuring unit 50 is configured to apply a predetermined voltage to the pair of terminals 52 and detect the current flowing between the pair of terminals 52 to obtain the surface resistance value, but is not limited to this. For example, the resistance measuring unit 50 may be configured to obtain the surface resistance value by passing a current of a predetermined current value through the pair of terminals 52 and detecting the voltage between the pair of terminals 52.

[0076] (Measurement mode of resistance measuring unit 50) The resistance measuring unit 50 has a plurality of measurement modes. Specifically, the resistance measuring unit 50 has a first, second, third, fourth, and fifth measurement modes. Each of the first, second, third, fourth, and fifth measurement modes is a mode for measuring within a predetermined range of surface resistance values.

[0077] The first and fourth measurement modes are modes for measuring the surface resistance value in a measurement range exceeding 11.5 [log Ω] and not exceeding 14.5 [log Ω] (hereinafter referred to as the high resistance measurement range (see FIG. 3)). In the first and fourth measurement modes, the voltage applied to the paper P and the amplification factor in the amplification process are set in accordance with the high resistance measurement range.

[0078] Furthermore, the fourth measurement mode is a mode for measuring the surface resistance value with higher accuracy than the first measurement mode. Specifically, in the fourth measurement mode, the number of samples used for measuring the surface resistance value is made larger or the measurement time is made longer than in the first measurement mode. More specifically, the processing unit 56, for example, increases the number of detection signals obtained from the detection circuit 55 (i.e., the number of samples) and performs processing such as averaging the detection signals to obtain a measurement value.

[0079] Hereinafter, the first measurement mode will be referred to as the "high resistance measurement mode," and the fourth measurement mode will be referred to as the "high resistance measurement mode (high precision)." Note that the high resistance measurement mode is an example of the "first mode," and the high resistance measurement mode (high precision) is an example of the "fourth mode." The high resistance measurement range is an example of the "first range."

[0080] The second and third measurement modes are modes for measuring in a measurement range exceeding 9 [log Ω] and not exceeding 11.5 [log Ω] (hereinafter referred to as the medium resistance measurement range (see FIG. 3)). In the second and third measurement modes, the voltage applied to the paper P and the amplification factor in the amplification process are set corresponding to the medium resistance measurement range. Specifically, in the second and third measurement modes, at least one of the voltage and the amplification factor in the high resistance measurement mode is set lower. That is, in the high resistance measurement mode, at least one of the voltage applied to the paper P and the amplification factor is set higher than in the second and third measurement modes. This is because in the high resistance measurement range, current flows less easily than in the medium resistance measurement range, and the current detected by the detection circuit 55 is very small.

[0081] Furthermore, the third measurement mode is a mode for measuring the surface resistance value with higher accuracy than the second measurement mode. Specifically, in the third measurement mode, the number of samples used for measuring the surface resistance value is made larger or the measurement time is made longer than in the second measurement mode. More specifically, the processing unit 56, for example, increases the number of detection signals obtained from the detection circuit 55 (i.e., the number of samples) and performs processing such as averaging the detection signals to obtain a measurement value.

[0082] Hereinafter, the second measurement mode will be referred to as the "medium resistance measurement mode," and the third measurement mode will be referred to as the "medium resistance measurement mode (high accuracy)." The medium resistance measurement mode is an example of the "second mode," and the medium resistance measurement mode (high accuracy) is an example of the "third mode." The medium resistance measurement range is an example of the "second range."

[0083] The fifth measurement mode is a mode for measuring the surface resistance value in a measurement range exceeding 4 [log Ω] and not exceeding 9 [log Ω] (hereinafter referred to as the low resistance measurement range (see FIG. 3)). In the fifth measurement mode, the voltage applied to the paper P and the amplification factor in the amplification process are set corresponding to the low resistance measurement range. Specifically, in the fifth measurement mode, at least one of the voltage and the amplification factor in the medium resistance measurement mode is set lower. That is, in the medium resistance measurement mode, at least one of the voltage applied to the paper P and the amplification factor is set higher than in the fifth measurement mode. This is because current flows less easily in the medium resistance measurement range than in the low resistance measurement range, and the current detected by the detection circuit 55 is very small.

[0084] Hereinafter, the fifth measurement mode will be referred to as the “low resistance measurement mode.” The low resistance measurement mode is an example of the “fifth mode.” The low resistance measurement range is an example of the “third range.”

[0085] Here, as shown in Figure 3, the medium resistance measurement range and the high resistance measurement range are set so that, for the electrical resistance of multiple brands of paper P, the number of brands belonging to the medium resistance measurement range is greater than the number of brands belonging to the high resistance measurement range.

[0086] The high resistance measurement range and the low resistance measurement range are set so that the number of brands belonging to the high resistance measurement range is greater than the number of brands belonging to the low resistance measurement range for the electrical resistance of multiple brands of paper P. Therefore, the number of brands belonging to each measurement range is set so that it increases in the order of the low resistance measurement range, the high resistance measurement range, and the medium resistance measurement range.

[0087] 3 plots the surface resistance values ​​of all brands (e.g., 2506 brands) of paper P used in the image forming apparatus 10. As shown in FIG. 3, the medium resistance measurement range is set as a range in which the surface resistance values ​​of more than half of all brands belong. Specifically, the medium resistance measurement range is set as a range in which the surface resistance values ​​of more than 90% of all brands belong.

[0088] (Control circuit 80) The control circuit 80 has a control function for controlling the operation of the resistance measuring unit 50. Specifically, the control circuit 80 has a processor 81, a memory 82, and a storage 83, as shown in FIG.

[0089] The processor refers to a processor in a broad sense, and examples of the processor 81 include general-purpose processors (e.g., a CPU (Central Processing Unit) and dedicated processors (e.g., a GPU: Graphics Processing Unit, ASIC: Application Specific Integrated Circuit, FPGA: Field Programmable Gate Array, programmable logic device, etc.).

[0090] The storage 83 stores various programs including a control program 83A (see FIG. 5) and various data. Specifically, the storage 83 is realized by a recording device such as a hard disk drive (HDD), a solid state drive (SSD), or a flash memory.

[0091] The memory 82 is a working area for the processor 81 to execute various programs, and temporarily records various programs or various data when the processor 81 executes processing. The processor 81 reads various programs including a control program 83A from the storage 83 into the memory 82, and executes the programs using the memory 82 as a working area.

[0092] In the control circuit 80, the processor 81 executes the control program 83A to realize various functions. The following describes the functional configuration realized by the cooperation of the processor 81 as a hardware resource and the control program 83A as a software resource. Figure 5 is a block diagram showing the functional configuration of the processor 81.

[0093] As shown in FIG. 5, in the control circuit 80, a processor 81 executes a control program 83A to function as an acquisition unit 81A and a control unit 81B.

[0094] The acquisition unit 81A acquires, as a measurement instruction, from the user terminal 19, either an execution instruction to execute time priority control or an execution instruction to execute accuracy priority control. In this embodiment, it is assumed that only an execution instruction to execute either time priority control or accuracy priority control is possible as a measurement instruction. The time priority control is an example of "first control", and the accuracy priority control is an example of "second control".

[0095] When the acquiring unit 81A acquires an execution instruction to execute time priority control, the control unit 81B performs time priority control on the resistance measuring unit 50. When the acquiring unit 81A acquires an execution instruction to execute accuracy priority control, the control unit 81B performs accuracy priority control on the resistance measuring unit 50. In other words, when the acquiring unit 81A does not acquire an execution instruction to execute time priority control, the control unit 81B does not perform time priority control on the resistance measuring unit 50.

[0096] The time priority control is a control that prioritizes execution of the medium resistance measurement mode over the low resistance measurement mode and the high resistance measurement mode. Specifically, in the time priority control, the control unit 81B performs control not to execute the low resistance measurement mode and the high resistance measurement mode when the surface resistance value of the paper P measured in the medium resistance measurement mode is included in the medium resistance measurement range. In other words, when the surface resistance value of the paper P measured in the medium resistance measurement mode is included in the medium resistance measurement range, the control unit 81B ends the process without executing the low resistance measurement mode and the high resistance measurement mode.

[0097] Furthermore, in the time-priority control, the control section 81B performs control to execute the medium resistance measurement mode (high accuracy) when the surface resistance value of the paper P measured in the medium resistance measurement mode is included in the medium resistance measurement range.

[0098] Furthermore, in the time-priority control, the control section 81B performs control to execute the high resistance measurement mode when the surface resistance value of the paper P measured in the medium resistance measurement mode is not included in the medium resistance measurement range.

[0099] Furthermore, in the time-priority control, the control section 81B performs control to execute the high resistance measurement mode (high accuracy) when the surface resistance value of the paper P measured in the high resistance measurement mode is included in the high resistance measurement range.

[0100] Furthermore, in the time-priority control, the control section 81B performs control to execute the low resistance measurement mode when the surface resistance value of the paper P measured in the high resistance measurement mode is not included in the high resistance measurement range.

[0101] On the other hand, in the accuracy priority control, the control unit 81B performs control to execute all of the high resistance measurement mode, the medium resistance measurement mode, and the low resistance measurement mode, regardless of the measurement result measured in the low resistance measurement mode. Specifically, in the accuracy priority control, the control unit 81B performs control to execute all of these modes in the order of, for example, the low resistance measurement mode, the medium resistance measurement mode, and the high resistance measurement mode.

[0102] In this embodiment, the control circuit 80 is an example of a “control unit.” It is also possible to grasp the processor 81 or the control unit 81B as an example of a “control unit.”

[0103] (Action according to this embodiment) Next, an example of the operation of this embodiment will be described.

[0104] This process is performed by the processor 81 reading and executing the control program 83A from the storage 83. This process is started when the processor 81 receives a measurement instruction from the user terminal 19, for example.

[0105] 6, first, the processor 81 determines whether or not an execution instruction to execute time priority control has been acquired as a measurement instruction from the user terminal 19 (step S101). When the processor 81 determines that an execution instruction to execute time priority control has been acquired as a measurement instruction (step S101: YES), the processor 81 causes the resistance measuring unit 50 to execute time priority control for prioritizing execution of the medium resistance measurement mode over the high resistance measurement mode (step S102).

[0106] On the other hand, if the processor 81 determines that an execution instruction to execute time-priority control has not been received as the measurement instruction (step S101: NO), the processor 81 causes the resistance measurement unit 50 to execute accuracy-priority control (step S103).

[0107] In this embodiment, since only an instruction to execute either time priority control or precision priority control can be given as a measurement instruction, the case where "an instruction to execute time priority control has not been obtained as a measurement instruction" is equivalent to "an instruction to execute precision priority control has been obtained as a measurement instruction."

[0108] In the time priority control (step S102), as shown in FIG. 7, the processor 81 first causes the resistance measuring unit 50 to execute the medium resistance measurement mode (step S201). Next, the processor 81 determines whether the surface resistance value of the paper P measured in the medium resistance measurement mode is within the medium resistance measurement range (step S202). If the processor 81 determines that the surface resistance value is within the medium resistance measurement range (step S202: YES), the processor 81 causes the resistance measuring unit 50 to execute the medium resistance measurement mode (high accuracy) (step S203) and ends this process. In other words, if the processor 81 determines that the surface resistance value is within the medium resistance measurement range (step S202: YES), the processor 81 ends this process without causing the resistance measuring unit 50 to execute the high resistance measurement mode and the low resistance measurement mode.

[0109] When the processor 81 determines that the surface resistance value is not included in the medium resistance measurement range (step S202: NO), it causes the resistance measurement unit 50 to execute the high resistance measurement mode (step S204). Next, the processor 81 determines whether the surface resistance value of the paper P measured in the high resistance measurement mode is included in the high resistance measurement range (step S205). When the processor 81 determines that the surface resistance value is included in the high resistance measurement range (step S205: YES), it causes the resistance measurement unit 50 to execute the high resistance measurement mode (high accuracy) (step S206) and ends this process. In other words, when the processor 81 determines that the surface resistance value is included in the high resistance measurement range (step S205: YES), it ends this process without causing the resistance measurement unit 50 to execute the low resistance measurement mode.

[0110] When the processor 81 determines that the surface resistance value is not included in the high resistance measurement range (step S205: NO), it causes the resistance measurement unit 50 to execute the low resistance measurement mode (step S207) and ends this process.

[0111] In the accuracy-priority control (step S103), as shown in Fig. 8, the processor 81 first causes the resistance measuring unit 50 to execute the low resistance measurement mode (step S301). Next, the processor 81 causes the resistance measuring unit 50 to execute the medium resistance measurement mode (step S302). Next, the processor 81 causes the resistance measuring unit 50 to execute the high resistance measurement mode (step S303), and ends this process.

[0112] In this way, in the accuracy-priority control, the resistance measuring unit 50 executes all of the low resistance measurement mode, the medium resistance measurement mode, and the high resistance measurement mode without making any judgment on the results of the surface resistance value of the paper P measured in each measurement mode. In other words, in the accuracy-priority control, the processor 81 executes all of these modes in the order of the low resistance measurement mode, the medium resistance measurement mode, and the high resistance measurement mode, regardless of the measurement results measured in each measurement mode.

[0113] As described above, in this embodiment, for example, the user of the image forming apparatus 10 can select whether to execute time priority control depending on whether he or she prioritizes time or accuracy when measuring the surface resistance value of the paper P. That is, the user of the image forming apparatus 10 can select to execute time priority control when he or she prioritizes time in measuring the surface resistance value of the paper P, and can select to execute accuracy priority control when he or she prioritizes accuracy.

[0114] In addition, when the processor 81 receives an instruction to execute time priority control as a measurement instruction from the user terminal 19 (step S101: YES), it causes the resistance measuring unit 50 to execute time priority control that prioritizes execution of the medium resistance measurement mode over the high resistance measurement mode (step S102).

[0115] This gives priority to measurements in the medium resistance measurement range, which has a greater number of brands than the high resistance measurement range, making it possible to obtain measurement results more quickly than in a configuration (hereinafter referred to as configuration A) in which the high resistance measurement mode is given priority over the medium resistance measurement mode. As a result, the measurement time required to measure the surface resistance value of paper P is shorter than in configuration A.

[0116] In this embodiment, as shown in Figure 3, the medium resistance measurement range is set as a range that includes the surface resistance values ​​of more than half of all brands, so the measurement time for measuring the surface resistance value of paper P is shorter than in a configuration in which the medium resistance measurement range is set as a range that includes the surface resistance values ​​of less than half of all brands.

[0117] In the time-priority control, when the surface resistance value of the paper P measured in the medium resistance measurement mode is within the medium resistance measurement range (step S202: YES), the processor 81 causes the resistance measurement unit 50 to execute the medium resistance measurement mode (high accuracy) (step S203).

[0118] Therefore, when the surface resistance value is within the medium resistance measurement range (step S202: YES), the processor 81 can measure the surface resistance value of the paper P with high accuracy compared to a configuration in which the processor 81 terminates processing without executing the medium resistance measurement mode (high accuracy).

[0119] In this way, when the surface resistance value is included in the medium resistance measurement range (step S202: YES), the processor 81 terminates this processing without causing the resistance measurement unit 50 to execute the high resistance measurement mode and the low resistance measurement mode.

[0120] Therefore, the measurement time for measuring the surface resistance value of the paper P is shorter than in a configuration in which the high resistance measurement mode and the low resistance measurement mode are always executed after the medium resistance measurement mode is executed.

[0121] In the time-priority control, when the surface resistance value is not included in the medium resistance measurement range (step S202: NO), the processor 81 causes the resistance measurement unit 50 to execute the high resistance measurement mode (step S204). This makes it possible to identify whether the surface resistance value of the paper P is included in the high resistance measurement range.

[0122] In addition, in time priority control, when the surface resistance value of the paper P measured in the high resistance measurement mode is within the high resistance measurement range (step S205: YES), the processor 81 causes the resistance measuring unit 50 to execute the high resistance measurement mode (high precision) (step S206).

[0123] Therefore, when the surface resistance value is within the high resistance measurement range (step S205: YES), the processor 81 can measure the surface resistance value of the paper P with high accuracy compared to a configuration in which the processor 81 terminates processing without executing the high resistance measurement mode (high accuracy).

[0124] In the time-priority control, when the surface resistance value of the paper P measured in the high resistance measurement mode is not within the high resistance measurement range (step S205: NO), the processor 81 causes the resistance measurement unit 50 to execute the low resistance measurement mode (step S207). This makes it possible to identify whether the surface resistance value of the paper P is within the low resistance measurement range.

[0125] In addition, in this embodiment, when the control device 16 receives an image formation instruction from the user terminal 19, it causes the image forming unit 14 and the transport mechanism 15 to perform the image forming operation, and controls the operations of the image forming unit 14 and the transport mechanism 15 based on the measurement value information. Therefore, a high-quality image is formed on the paper P, compared to a configuration in which the image forming operation is performed regardless of the physical properties of the paper P.

[0126] (Modification) In the present embodiment, either the time priority control or the accuracy priority control can be selectively executed, but this is not limiting. For example, the present invention may be configured such that only the time priority control can be executed.

[0127] In this embodiment, as shown in Fig. 3, the medium resistance measurement range is set as a range in which the surface resistance values ​​of more than half of all brands belong, but is not limited to this. For example, the medium resistance measurement range may be set as a range in which the surface resistance values ​​of less than half of all brands belong. Even in this case, for example, the surface resistance values ​​of multiple brands of paper P are set so that the number of brands belonging to the medium resistance measurement range is greater than the number of brands belonging to each of the high resistance measurement range and the low resistance measurement range.

[0128] In the time-priority control, when the surface resistance value of the paper P measured in the medium resistance measurement mode is within the medium resistance measurement range (step S202: YES), the processor 81 causes the resistance measurement unit 50 to execute the medium resistance measurement mode (high accuracy) (step S203), but this is not limited to the above. For example, when the surface resistance value of the paper P measured in the medium resistance measurement mode is within the medium resistance measurement range (step S202: YES), the processor 81 may not execute the medium resistance measurement mode (high accuracy) and may use the measurement value measured in the medium resistance measurement mode in step S202 as the measurement result. In this case, the medium resistance measurement mode (high accuracy) may be executed in step S202.

[0129] In addition, in the time priority control, when the surface resistance value of the paper P measured in the high resistance measurement mode is within the high resistance measurement range (step S205: YES), the processor 81 causes the resistance measurement unit 50 to execute the high resistance measurement mode (high accuracy) (step S206), but this is not limited to this. For example, when the surface resistance value of the paper P measured in the high resistance measurement mode is within the high resistance measurement range (step S205: YES), the processor 81 may not execute the high resistance measurement mode (high accuracy) and may use the measurement value measured in the high resistance measurement mode in step S205 as the measurement result. In this case, the high resistance measurement mode (high accuracy) may be executed in step S205.

[0130] Also, the processor 81 may cause the resistance measuring unit 50 to execute the low resistance measurement mode in step S204, and determine whether or not the surface resistance value of the paper P measured in the low resistance measurement mode is within the low resistance measurement range in step S205. In this case, if the processor 81 determines that the surface resistance value is within the low resistance measurement range (step S205: YES), the processor 81 causes the resistance measuring unit 50 to execute the low resistance measurement mode (high accuracy) (step S206), and ends this process. On the other hand, if the processor 81 determines that the surface resistance value is not within the low resistance measurement range (step S205: NO), the processor 81 causes the resistance measuring unit 50 to execute the high resistance measurement mode (step S207), and ends this process. The low resistance measurement mode (high accuracy) is a mode in which the surface resistance value is measured with higher accuracy than the low resistance measurement mode. Specifically, in the low resistance measurement mode (high accuracy), the number of samples used to measure the surface resistance value is made larger or the measurement time is made longer than in the low resistance measurement mode. More specifically, the processing unit 56, for example, increases the number of detection signals acquired from the detection circuit 55 (that is, the number of samples), and performs processing such as averaging the detection signals to obtain a measurement value.

[0131] In addition, in the present embodiment, paper P is used as an example of a recording medium, but this is not limited to this. An example of a recording medium may be a sheet-like recording medium such as a metal or resin film other than paper P.

[0132] In the present embodiment, the measuring device 20 includes the basis weight measuring unit 30 and the coating layer measuring unit 70, but is not limited thereto. For example, the measuring device 20 may be configured not to include at least one of the basis weight measuring unit 30 and the coating layer measuring unit 70, and may include at least the resistance measuring unit 50.

[0133] In this embodiment, the resistance measuring unit 50 that measures the surface resistance value of the paper P is used as an example of a measuring unit, but is not limited to this. An example of a measuring unit may be, for example, a measuring unit that measures the volume resistance or other physical properties of a recording medium. In other words, an example of electrical resistance may be, for example, the volume resistance or other physical properties of a recording medium.

[0134] The present invention is not limited to the above-described embodiment, and various modifications, changes, and improvements are possible without departing from the spirit and scope of the present invention. For example, the configurations included in the above-described modified examples may be appropriately combined to form a configuration. [Explanation of symbols]

[0135] 10 Image forming device 14 Image forming section 16 Control device 20 Measuring Equipment 50 Resistance measuring section (example of measuring section) 80 Control circuit (an example of a control unit) 81A Acquisition Department 81B Control section P Paper (an example of a recording medium)

Claims

1. a measuring unit having a first mode for measuring the electrical resistance of a recording medium used in an image forming apparatus within a first range of predetermined electrical resistance values, and a second mode for measuring the electrical resistance within a second range of electrical resistance values ​​different from the first range, the second range and the first range being set such that, for electrical resistances of a plurality of brands of recording media, the number of brands belonging to the second range is greater than the number of brands belonging to the first range; a control unit that controls the measurement unit to execute the second mode in priority over the first mode; A measuring device comprising:

2. The control unit is When the electrical resistance of the recording medium measured in the second mode is within the second range, the measurement unit is controlled not to execute the first mode.

2. The measuring device of claim 1.

3. The control unit is When the electrical resistance of the recording medium measured in the second mode is within the second range, the measurement unit is controlled to execute a third mode in which the electrical resistance is measured in the second range and a larger number of samples are used for measuring the electrical resistance than in the second mode, or a measurement time is longer.

3. The measuring device according to claim 2.

4. The control unit is When the electrical resistance of the recording medium measured in the second mode is not within the second range, the measurement unit is controlled to execute the first mode.

4. The measuring device according to claim 2 or 3.

5. The control unit is When the electrical resistance of the recording medium measured in the first mode is within the first range, the measurement unit is controlled to execute a fourth mode in which the electrical resistance is measured in the first range and a larger number of samples are used for measuring the electrical resistance than in the first mode, or a measurement time is longer.

5. The measuring device according to claim 4.

6. The control unit is When the electrical resistance of the recording medium measured in the first mode is not within the first range, and controlling the measurement unit to execute a fifth mode in which the electrical resistance is measured in a third range of electrical resistance values ​​different from the first range and the second range.

6. The measuring device according to claim 4 or 5.

7. The second range is set as a range in which the electrical resistance of more than half of the brands falls. The measuring device according to any one of claims 1 to 6.

8. An acquisition unit that acquires an execution instruction for executing the control, The control unit is When the acquisition unit acquires an execution instruction to execute the control, the acquisition unit performs the control on the measurement unit; When the acquisition unit does not acquire an execution instruction for executing the control, the control unit does not perform the control on the measurement unit. The measuring device according to any one of claims 1 to 7.

9. The acquisition unit is Obtaining either an execution instruction for executing a first control as the control or an execution instruction for executing a second control; The control unit is When the acquisition unit acquires an execution instruction to execute the first control, the acquisition unit performs the first control on the measurement unit; When the acquisition unit acquires an execution instruction to execute the second control, the second control is performed on the measurement unit to execute both the first mode and the second mode, regardless of the measurement result measured by the measurement unit.

9. The measuring device according to claim 8.

10. A measuring device according to any one of claims 1 to 9, an image forming unit that forms an image on the recording medium whose electrical resistance has been measured by the measuring device; a control device that controls an image forming operation of the image forming unit based on the electrical resistance measured by the measuring device; An image forming apparatus comprising:

Images