Clamp-type AC voltage probe

JP7632452B2Active Publication Date: 2025-02-19NIDEC-READ CORPORATION
View PDF 10 Cites 0 Cited by

Patent Information

Application Number
JP2022505889
Authority / Receiving Office
JP · JP
Patent Type
Patents
Current Assignee / Owner
Priority Date
2020-03-13
Filing Date
2021-02-22
Publication Date
2025-02-19
Estimated Expiration
2041-02-22

AI Technical Summary

Benefits of technology

【0007】 このような構成のクランプ式交流電圧プローブは、高電圧の交流電圧を測定することが容易である。

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure 0007632452000001
    Figure 0007632452000001
  • Figure 0007632452000002
    Figure 0007632452000002
  • Figure 0007632452000003
    Figure 0007632452000003
Patent Text Reader

Abstract

Provided is a clamp-type AC voltage probe enabling easy measurement of high AC voltage. A clamp-type AC voltage probe 1 comprises: a clamp part 2 for clamping a cable CBL to be measured; an electrode E which is arranged to face the cable CBL clamped by the clamp part 2; a parallel circuit 5 in which a capacitor C1 and a resistance R1 are connected in parallel, the parallel circuit 5 having one end P1 connected to the electrode E; a resistance R2 having one end connected to the other end P2 of the parallel circuit 5 and the other end connected to a circuit ground; a capacitor C2 having one end connected to the other end P2 of the parallel circuit 5 and the other end connected to the circuit ground; and an amplifier A1 having an input terminal to which one end P1 or the other end P2 of the parallel circuit 5 is connected, the amplifier A1 amplifying a signal inputted to the input terminal and outputting the same.
Need to check novelty before this filing date? Find Prior Art

Description

[Technical field]

[0001] The present invention relates to a clamp-type AC voltage probe that clamps a cable to be measured. [Background technology]

[0002] Conventionally, there has been known a voltage detection device that detects an AC voltage to be detected by generating a reference voltage so as to reduce the potential difference between the AC voltage to be detected and the reference voltage, i.e., by generating a reference voltage that is the same voltage as the AC voltage to be detected (see, for example, Patent Document 1). [Prior art documents] [Patent documents]

[0003] [Patent Document 1] JP 2010-25918 A Summary of the Invention [Problem to be solved by the invention]

[0004] However, according to the above-mentioned voltage detection device, since it is necessary to generate a reference voltage that is the same as the AC voltage to be detected, if the AC voltage to be detected is a high voltage such as several hundred to several thousand volts, it is necessary to provide a circuit for generating such a high voltage. The circuit for generating such a high voltage is expensive, and it is not easy to reproduce the AC waveform of the detected high voltage.

[0005] An object of the present invention is to provide a clamp-type AC voltage probe that can easily measure high AC voltages. [Means for solving the problem]

[0006] A clamp-type AC voltage probe according to one example of the present invention includes a clamp unit that clamps a cable to be measured, an electrode arranged to face the cable clamped by the clamp unit, a parallel circuit in which a first capacitor and a first resistor are connected in parallel and one end is connected to the electrode, a second resistor having one end connected to the other end of the parallel circuit and the other end connected to circuit ground, a second capacitor having one end connected to the other end of the parallel circuit and the other end connected to circuit ground, and an amplifier having the one end or the other end of the parallel circuit connected to an input terminal and amplifying and outputting a signal input to the input terminal. Effect of the Invention

[0007] A clamp-type AC voltage probe having such a configuration can easily measure high AC voltages. [Brief description of the drawings]

[0008] [Figure 1] 1 is a perspective view showing an example of the configuration of a clamp-type AC voltage probe according to an embodiment of the present invention. FIG. [Diagram 2] 2 is a front view showing the inside of a clamp arm and a front wall of a housing shown in FIG. 1. [Diagram 3] 2 is a circuit diagram showing an example of an electrical configuration of the clamp-type AC voltage probe shown in FIG. [Figure 4] 4 is a circuit diagram showing another example of the electrical configuration of the clamp-type AC voltage probe shown in FIG. 3. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0009] Hereinafter, an embodiment of the present invention will be described with reference to the drawings. In the drawings, the same reference numerals are used to denote the same configuration, and the description thereof will be omitted.

[0010] 1 generally comprises a clamp unit 2 that clamps a cable CBL to be measured, and a roughly box-shaped housing 3 connected to the clamp unit 2. The housing 3 is connected to a measuring device such as an oscilloscope or a data logger via a coaxial cable 4.

[0011] The clamp unit 2 includes a pair of clamp arms 21, 22. The base end of the clamp arm 21 is pivotally supported by a shaft 27 attached to the housing 3. The clamp arm 21 is capable of swinging about the shaft 27. Retaining grooves 211, 221 into which the cable CBL fits are formed on the opposing surfaces of the clamp arms 21, 22.

[0012] The clamp arm 21 is biased toward the clamp arm 22 by a torsion spring (not shown). The cable CBL is clamped between the clamp arm 21 and the clamp arm 22 by the biasing force of the torsion spring.

[0013] 2, clamp arm 22 is fixedly connected to housing 3. Note that clamp arm 22 may be swingable like clamp arm 21.

[0014] The clamp arms 21 and 22 and the housing 3 are made of an insulating material, for example, a resin material.

[0015] An accommodation space 28 is provided inside the clamp arm 22. The accommodation space 28 is in communication with the internal space of the housing 3. An electrode E having a generally plate-like shape is disposed in the accommodation space 28. The electrode E may be formed as a conductor pattern on a printed wiring board, for example, or may be a metal plate. The electrode E is disposed facing or in contact with an inner wall surface of the holding groove 221 of the clamp arm 22. As a result, the electrode E is disposed facing the cable CBL clamped by the clamp unit 2 via the wall of the holding groove 221 made of an insulating material.

[0016] The housing 3 contains a circuit board 31. A terminal T3 of the circuit board 31 and an electrode E are connected via a wire W.

[0017] A conductive conductive layer 32, shown by hatching, is formed on the storage space 28 of the clamp arm 22 and the inner wall surface of the housing 3, except for at least the portion located between the cable CBL clamped by the clamp portion 2 and the electrode E.

[0018] The conductive layer 32 may be, for example, a metal foil such as an aluminum foil, may be coated with a conductive paint, may be a plating layer, or may be a metal plate. In the example shown in Fig. 2, the conductive layer 32 is not formed on the wall of the holding groove 221 located between the cable CBL clamped by the clamp unit 2 and the electrode E, and on the periphery of the electrode E.

[0019] As a result, the outer wall surface of the clamp-type AC voltage probe 1 is made insulating, and the inner wall surface of the housing 3 and the inner wall surface of the clamp arm 22 are made conductive except for at least the portion located between the cable CBL clamped by the clamp portion 2 and the electrode E.

[0020] Since the outer wall surface of the clamp-type AC voltage probe 1 is made insulating, even if the conductor portion of the cable CBL is exposed, the risk of current flowing from the cable CBL to the electrode E or the circuit board 31 and damaging the clamp-type AC voltage probe 1 is reduced. Furthermore, the safety of the user who operates the clamp-type AC voltage probe 1 is improved.

[0021] Furthermore, by providing the conductive layer 32, electromagnetic noise from the external environment can be reduced.

[0022] The electrode E is not necessarily limited to the example in which it is disposed inside the clamp unit 2 and arranged to face the cable CBL via an insulating material. The electrode E may be arranged, for example, exposed to the holding groove 221 and arranged to face the cable CBL in a state of contact with it.

[0023] Near the tips of the clamp arms 21, 22, there are formed screw holes 23, 24 that penetrate the clamp arms 21, 22 when the clamp arms 21, 22 are in a closed state. A nut 26 is attached to the screw hole 24 of the clamp arm 22 on the side opposite the clamp arm 21. This allows the cable CBL to be firmly clamped by the clamp arms 21, 22 by inserting a screw 25 into the screw hole 24 from the screw hole 23 side and fastening the screw 25 and the nut 26.

[0024] As described below, the clamp-type AC voltage probe 1 detects the AC voltage of the cable CBL via the electrostatic capacitance Cx that is generated by arranging the conductor wire of the cable CBL and the electrode E facing each other. The electrostatic capacitance Cx is inversely proportional to the facing distance d between the conductor wire of the cable CBL and the electrode E. Therefore, the shorter the facing distance d, the larger the electrostatic capacitance Cx becomes, making it easier to detect the AC voltage. Furthermore, when the facing distance d changes, the voltage level obtained via the electrostatic capacitance Cx fluctuates.

[0025] On the other hand, the clamping force of the clamp arms 21, 22 may be insufficient for clamping the cable CBL only by the biasing force of the torsion spring (not shown), causing a gap between the cable CBL and the holding groove 221, increasing the facing distance d and decreasing the capacitance Cx. Also, the cable CBL may swing, causing the facing distance d to fluctuate, and the capacitance Cx to fluctuate.

[0026] However, the clamp-type AC voltage probe 1 can firmly clamp the cable CBL by fastening the clamp arms 21, 22 with the screw 25, thereby reducing the risk of a decrease in the capacitance Cx due to an increase in the opposing distance d and fluctuations in the capacitance Cx due to the shaking of the cable CBL.

[0027] The nut 26 may be provided on the side of the screw hole 23, and the screw 25 may be inserted through the screw hole 24. Alternatively, the nut 26 may not be provided, and a thread groove may be formed in the screw hole 23 or the screw hole 24.

[0028] 3 includes an electrode E, a parallel circuit 5, a resistor R2 (second resistor), a capacitor C2 (second capacitor), an amplifier A1, and terminals T1 and T2. The parallel circuit 5 is a parallel circuit of a capacitor C1 (first capacitor) and a resistor R1 (first resistor). The parallel circuit 5, the resistor R2, the capacitor C2, the amplifier A1, and the terminals T1 and T2 are formed on a circuit board 31.

[0029] In FIG. 3, the capacitance formed by the cable CBL and the electrode E facing each other is represented as capacitance Cx.

[0030] The electrode E is connected to one end P1 of the parallel circuit 5 via a wiring W and a terminal T3 shown in Fig. 2. The other end P2 of the parallel circuit 5 is connected to the circuit ground via a capacitor C2. The other end P2 of the parallel circuit 5 is connected to the circuit ground via a resistor R2. The circuit ground is connected to the conductive layer 32.

[0031] One end P1 of the parallel circuit 5 is connected to an input terminal of the amplifier A1. The output terminal of the amplifier A1 is connected to a terminal T1. The terminal T2 is connected to the circuit ground.

[0032] The terminal T1 is connected to the core of the coaxial cable 4, and the terminal T2 is connected to the shield of the coaxial cable 4. This causes the output signal of the amplifier A1 to be output to a measuring device such as an oscilloscope or a data logger via the coaxial cable 4. The output signal of the amplifier A1 is not limited to being output via a coaxial cable, and may be a twisted pair cable or a multi-core cable. The output signal line of the amplifier A1 and the power supply line for operating the amplifier A1, etc. may be included in a single cable. From the viewpoint of reducing the influence of noise, it is more preferable to provide a cable for supplying power for operating the amplifier A1, etc., in addition to the cable for the output signal of the amplifier A1.

[0033] The cable CBL is not particularly limited, but may be, for example, a power cable for driving the motor of an electric vehicle. In the case of a power cable for driving the motor of an electric vehicle, the AC voltage with a rectangular periodic waveform generated by PWM (Pulse Width Modulation) output from an inverter is the measurement target. In this case, the expected voltage is AC 200V to 1000V, and the measurement waveform is a pulse with a frequency equivalent to 1kHz to 1MHz.

[0034] The AC voltage of the cable CBL is applied to one end P1 of the parallel circuit 5 via the electrostatic capacitance Cx.

[0035] For example, in the case of a periodic square wave waveform generated by PWM, the rising and falling edges of the square wave contain high-frequency components, so in order to accurately measure the voltage waveform of cable CBL, it is necessary to detect both the low-frequency components corresponding to the period of the square wave and the high-frequency components corresponding to the rising and falling edges of the square wave.

[0036] Therefore, a series circuit of resistor R1 and capacitor C2 is formed in the clamp-type AC voltage probe 1. The series circuit of resistor R1 and capacitor C2 is a so-called integrating circuit, and functions as a low-pass filter that passes low-frequency components.

[0037] The input terminal of amplifier A1 is supplied with the sum of the terminal voltage of capacitor C2 and the terminal voltage of resistor R1. Therefore, the series circuit of resistor R1 and capacitor C2 allows low-frequency components corresponding to the period of the square wave to be input to amplifier A1.

[0038] Furthermore, a series circuit of the capacitor C1 and resistor R2 is formed in the clamp-type AC voltage probe 1. The series circuit of the capacitor C1 and resistor R2 is a so-called differential circuit, and functions as a high-pass filter that passes high-frequency components.

[0039] The input terminal of the amplifier A1 is supplied with the sum of the terminal voltage of the resistor R2 and the terminal voltage of the capacitor C1. According to the series circuit of 2, high frequency components corresponding to the rising and falling edges of the square wave can be input to the amplifier A1.

[0040] That is, the input terminal of the amplifier A1 receives a superimposed signal consisting of low-frequency components corresponding to the period of the square wave and high-frequency components corresponding to the rising and falling edges of the square wave. This allows the amplifier A1 to accurately amplify the AC voltage waveform detected from the cable CBL and output it to the measuring device.

[0041] In addition, the resistance value R of resistor R1 1 is set to be much larger than the impedance of the capacitor C1. 1 For example, if the expected frequency f is 1 kHz to 1 MHz and the capacitor C1 is 1 nF, the impedance |Z| of the capacitor C1 at 1 kHz can be 1 / (2π×10 3 ×10 -9 )=159kΩ, and the impedance |Z| of the capacitor C1 at 1MHz is 1 / (2π×10 6 ×10 -9 )=159Ω.

[0042] This results in a resistance value of R 1 is 1MΩ / 159kΩ=6.3 times larger than the impedance |Z| of capacitor C1 when the frequency f is 1kHz, and is 1MΩ / 159Ω=6300 times larger than the impedance |Z| of capacitor C1 when the frequency f is 1MHz. Therefore, most of the AC current detected from cable CBL flows through the series circuit of capacitance Cx and capacitors C1 and C2.

[0043] As a result, the current flowing through resistor R1 can be almost ignored, so the cable voltage Vin of cable CBL is divided by the series circuit of capacitance Cx and capacitors C1 and C2, and the input voltage Va input to amplifier A1 can be approximated by the following equation (1).

[0044] Va = Vin × (CxC 2+CxC 1 ) / (C 1 C 2 +CxC 2 +CxC 1 ) (1) However, the capacitance of the capacitor C1 is C 1 , the capacitance of the capacitor C2 is C 2 Let us assume that.

[0045] In this way, according to the clamp-type AC voltage probe 1, the cable voltage Vin is divided and the reduced input voltage Va is input to the amplifier A1, making it easy to measure a high AC voltage without providing a circuit for generating a high voltage as described in Patent Document 1.

[0046] For example, the capacitance Cx is 0.1 to 10 pF, and the capacitance C 1 0.1 to 10 nF, capacitance C 2 can be set to 1 to 100 nF. Cx=0.1 pF, C 1 =0.1nF, C 2 When Cx = 1nF, according to formula (1), Va = Vin × 0.001. Also, Cx = 10pF, C 1 =10nF, C 2 = 100nF, according to equation (1), Va = Vin × 0.001.

[0047] That is, the input voltage Va, which is 1 / 1000 of the cable voltage Vin, can be input to the amplifier A1. In this case, even if the cable voltage Vin is 1 kV, the input voltage Va input to the amplifier A1 is 1 V, so it is easy to measure the high cable voltage Vin.

[0048] The amplifier A1 is a so-called amplifier circuit that amplifies and outputs an input signal. The amplifier A1 is preferably an element with a high input impedance, and an amplifier configured using FETs such as a junction FET (Field Effect Transistor) or a MOSFET (Metal-Oxide-Semiconductor FET) can be suitably used.

[0049] As described above, the AC current detected by the electrode E from the cable CBL flows through the series circuit of the capacitance Cx and the capacitors C1 and C2, and the cable voltage Vin is divided to input the input voltage Va to the amplifier A1. However, if the input impedance of the amplifier A1 is small, the detected AC current flows into the amplifier A1, and the current flowing through the series circuit of the capacitance Cx and the capacitors C1 and C2 decreases, causing the input voltage Va to decrease. This may result in a decrease in the detection accuracy of the cable voltage Vin.

[0050] However, by setting the input impedance of the amplifier A1 to a high impedance, the current flowing into the input terminal of the amplifier A1 can be reduced, thereby reducing the risk of a decrease in the detection accuracy of the cable voltage Vin.

[0051] The output signal of the amplifier A1 is output to the measuring device via the terminal T1 and the coaxial cable 4. This makes it possible to observe the AC voltage waveform of the cable CBL by the measuring device.

[0052] As shown in Fig. 4, the input terminal of the amplifier A1 may be connected to the other end P2 instead of the one end P1. However, depending on the frequency and waveform of the signal to be detected, it may be necessary to adjust the filter characteristics of the low-pass filter consisting of the resistor R1 and the capacitor C2 and the high-pass filter consisting of the capacitor C1 and the resistor R2. If the circuit constant of the capacitors C1 and C2 is changed due to such adjustment of the filter characteristics, and the voltage division ratio in the series circuit of the capacitance Cx and the capacitors C1 and C2 changes, the detection level input to the amplifier A1 will change if the input terminal of the amplifier A1 is connected to the other end P2.

[0053] On the other hand, when the input terminal of the amplifier A1 is connected to one end P1, by adjusting the capacitance of the capacitors C1 and C2 within a range in which the series impedance of the capacitors C1 and C2 does not change, it is possible to adjust the filter characteristics while suppressing changes in the detection level input to the amplifier A1. Therefore, although the input terminal of the amplifier A1 may be connected to the other end P2, it is more preferable to connect it to one end P1.

[0054] That is, a clamp-type AC voltage probe according to one embodiment of the present invention includes a clamp unit that clamps a cable to be measured, an electrode arranged to face the cable clamped by the clamp unit, a parallel circuit in which a first capacitor and a first resistor are connected in parallel and one end is connected to the electrode, a second resistor having one end connected to the other end of the parallel circuit and the other end connected to circuit ground, a second capacitor having one end connected to the other end of the parallel circuit and the other end connected to circuit ground, and an amplifier having the one end or the other end of the parallel circuit connected to an input terminal and amplifying and outputting a signal input to the input terminal.

[0055] According to this configuration, the core wire of the cable and the electrode are disposed opposite to each other, and the electrode is electrostatically coupled to the core wire of the cable. As a result, the AC voltage of the cable is applied to one end of the parallel circuit through the electrostatic capacitance generated between the core wire of the cable and the electrode. In addition, the first resistor and the second capacitor are connected in series to form a low-pass filter, and the first capacitor and the second resistor are connected in series to form a high-pass filter. As a result, the fundamental frequency of the AC voltage to be measured is obtained by the low-pass filter, and the high-frequency components contained in the waveform of the rising and falling edges of the AC voltage are obtained by the high-pass filter, so that it is easy to accurately detect the waveform of the measurement target. Furthermore, since the cable and the electrode are electrostatically coupled, the DC current from the cable is blocked, and the current obtained from the electrode is AC. As a result, the voltage input to the amplifier is dominated by the electrostatic capacitance between the cable electrodes, the first capacitor, and the second capacitor. Then, even if the voltage of the cable is high, the divided and reduced voltage is input to the amplifier. Therefore, even if the object to be measured is a high voltage, it can be detected without providing a circuit for generating a high voltage as described in Patent Document 1, so by using this clamp-type AC voltage probe, it is easy to measure high AC voltages.

[0056] It is also preferable that the input terminal of the amplifier is connected to the one end of the parallel circuit.

[0057] According to this configuration, the voltage division ratio of the voltage input to the amplifier is determined by the series impedance of the first capacitor and the second capacitor. On the other hand, when the input terminal of the amplifier is connected to the other end of the parallel circuit, the voltage division ratio of the voltage input to the amplifier is determined by the impedance of the second capacitor. Therefore, when the capacitance of the second capacitor is changed to adjust the characteristics of the low-pass filter, the signal level input to the amplifier also changes. On the other hand, according to this configuration, since the voltage division ratio of the voltage input to the amplifier is determined by the series impedance of the first capacitor and the second capacitor, by changing the capacitance of the second capacitor within a range that does not change the series impedance of the first and second capacitors, it becomes easy to adjust the capacitance of the second capacitor while suppressing the change in the signal level input to the amplifier.

[0058] In addition, it is preferable that the resistance value of the first resistor is greater than the impedance of the first capacitor.

[0059] According to this configuration, in the parallel circuit of the first capacitor and the first resistor, a larger current flows through the first capacitor than through the first resistor, thereby improving the accuracy of voltage division by the capacitance between the cable electrodes, the first capacitor, and the second capacitor.

[0060] Moreover, it is preferable that the input terminal of the amplifier is of high impedance.

[0061] According to this configuration, the current flowing from the electrode to the input terminal of the amplifier is reduced, improving the accuracy of voltage division by the capacitance between the cable electrodes, the first capacitor, and the second capacitor.

[0062] Moreover, it is preferable that the amplifier is configured using a FET.

[0063] Since the input impedance of a FET is high, it is suitable for the above-mentioned amplifier.

[0064] It is also preferable that the clamp portion is made of an insulating material, and the electrode is disposed inside the clamp portion and positioned so as to face the cable via the insulating material.

[0065] According to this configuration, even if the core wire of the cable comes into contact with the clamp portion, the voltage of the cable is not directly applied to the electrode, thereby improving the safety of the clamp-type AC voltage probe.

[0066] It is also preferable that the device further includes a housing connected to the clamp portion and housing the parallel circuit, the second resistor, the second capacitor, and the amplifier, the housing having an insulating outer wall surface and a conductive inner wall surface, and the circuit ground is connected to the conductive inner wall surface.

[0067] According to this configuration, the outer wall surface of the housing that the user touches is made insulating to improve safety, while the conductive inner wall surface reduces electromagnetic noise from the external environment.

[0068] It is also preferable that the clamp portion has a storage space that accommodates the electrode, the outer wall surface of the clamp portion is insulating, and the inner wall surface of the storage space is conductive except for at least a portion located between the electrode and the cable, and the circuit ground is connected to the conductive inner wall surface of the storage space.

[0069] According to this configuration, the outer wall surface of the clamp part that the user touches is made insulating to improve safety, while the conductive portion of the inner wall surface reduces electromagnetic noise from the external environment.

[0070] It is also preferable that the clamp portion clamps the cable using a pair of clamp arms, the base end of at least one of the pair of clamp arms is supported by a shaft, the at least one clamp arm is capable of swinging around the shaft, and a screw hole capable of receiving a screw for fastening the pair of clamp arms is formed near the tip of the pair of clamp arms.

[0071] According to this configuration, the pair of clamp arms can be fastened by the screw, so that the cable can be firmly clamped by the pair of clamp arms. Therefore, a gap is unlikely to occur between the cable and the clamp arms, and the electrostatic capacitance between the cable electrodes is stabilized. As a result, it becomes easier to detect the cable voltage by the clamp-type AC voltage probe. [Explanation of symbols]

[0072] 1 Clamp-type AC voltage probe 2 Clamp Amplifier section 3 Housing 4 Coaxial cable 5 Parallel circuits 21, 22 Clamp arms 23, 24 Screw hole 25 Screw 26 Nut 27 Shaft 28 Storage space 31 Circuit board 32 Conductive layers 211, 221 Retaining groove A1 Amplifier C1 Capacitor (first capacitor) C2 Capacitor (second capacitor) CBL Cable E Electrode P1 One end P2 Other end R1 Resistor (first resistor) R2 Resistor (second resistor) T1, T2, T3 Terminal Va Input voltage Vin Cable voltage W Wiring

Claims

1. a clamping portion for clamping the cable to be measured; an electrode disposed to face the cable clamped by the clamp portion; a parallel circuit in which a first capacitor and a first resistor are connected in parallel, one end of the parallel circuit being connected to the electrode; a second resistor having one end connected to the other end of the parallel circuit and the other end connected to a circuit ground; a second capacitor having one end connected to the other end of the parallel circuit and the other end connected to a circuit ground; the one end of the parallel circuit is connected to an input terminal, and an amplifier is provided which amplifies and outputs a signal input to the input terminal.

2. The clamp-type AC voltage probe according to claim 1 , wherein a resistance value of the first resistor is greater than an impedance of the first capacitor.

3. 3. The clamp-type AC voltage probe according to claim 1, wherein the input terminal of the amplifier has a high impedance.

4. 4. The clamp-type AC voltage probe according to claim 3, wherein the amplifier is configured using a FET.

5. The clamp portion is made of an insulating material, The clamp-type AC voltage probe according to any one of claims 1 to 4, wherein the electrode is disposed inside the clamp portion and is arranged so as to face the cable via the insulating material.

6. a housing connected to the clamp unit and housing the parallel circuit, the second resistor, the second capacitor, and the amplifier; The clamp-type AC voltage probe according to any one of claims 1 to 5, wherein the housing has an insulating outer wall surface and a conductive inner wall surface, and the circuit ground is connected to the conductive inner wall surface.

7. The clamp portion has an accommodation space for accommodating the electrode, 7. The clamp-type AC voltage probe according to claim 6, wherein an outer wall surface of the clamp portion is insulating, and an inner wall surface of the accommodating space is conductive except for at least a portion located between the electrode and the cable, and the circuit ground is connected to the conductive inner wall surface of the accommodating space.

8. The clamp unit clamps the cable with a pair of clamp arms, At least one of the pair of clamp arms has a base end supported by a shaft body, The at least one clamp arm is pivotable about the shaft body, 8. The clamp-type AC voltage probe according to claim 1, wherein a screw hole capable of receiving a screw for fastening the pair of clamp arms is formed near a tip of the pair of clamp arms.

Citation Information

Patent Citations

  • Attenuator compensator

    JP1984086322A

  • Frequency-characteristic calibrating apparatus

    JP1992276561A

  • Voltage measurement circuit and its calibration method

    JP2002090394A

  • Frequency characteristics adjustment circuit for attenuator

    JP2002271159A

  • Measuring device

    JP2010025653A