Chemical analysis equipment

Abstract

To provide a chemical analyzer that facilitates estimation of a failure position in failure diagnosis.SOLUTION: A chemical analyzer comprises a plurality of reaction cells into which a specimen and a reagent are dispensed, and measures absorbance by a photometric system that irradiates a mixed solution of the specimen and reagent stored in the reaction cell with light and measures the light having passed through the mixed solution. The chemical analyzer comprises a diagnostic unit that performs failure diagnosis. The diagnostic unit accumulates time-series photometric system data measured using a sample specimen for failure diagnosis and a reagent for failure diagnosis, creates a population of the photometric data for failure diagnosis for each predetermined reaction cell, and compares the photometric data of the population of the photometric data created for each predetermined reaction cell with a preset threshold value to diagnose failure.SELECTED DRAWING: Figure 5

Description

[Technical field]

[0001] The present invention relates to a chemical analyzer, and more particularly to a chemical analyzer having a failure diagnosis function. [Background technology]

[0002] A chemical analyzer has an automatic sample and reagent supply mechanism that supplies samples and reagents to a reaction vessel, an automatic mixing mechanism that mixes the samples and reagents in the reaction vessel, a colorimetric measurement unit that measures the physical properties of the sample during or after the reaction, an automatic cleaning mechanism that aspirates and discharges the sample after measurement and cleans the reaction vessel, and a control unit that controls the operations of these units.The processing capacity of chemical analyzers ranges from several hundred tests per hour to over 9,000 tests per hour for large equipment.

[0003] In the colorimetric measurement section, white light from a light source is irradiated onto the solution to be measured in the reaction vessel, and the transmitted light is separated by a spectrometer. The light intensity of a specific wavelength of the separated light is measured, and the absorbance is calculated by comparing it with the light intensity of a solution of a reference concentration that has been measured in advance. The chemical components in the solution to be measured are analyzed based on the absorbance.

[0004] Chemical analyzers use halogen lamps as their light source. Halogen lamps are continuous spectrum light sources that cover the visible to near infrared ranges. They also have the excellent characteristic of having a long filament life due to the halogen cycle.

[0005] A rated life is set for light source lamps. The rated life is defined as the average life of many lamps. Therefore, not all lamps will reach the end of their life when they reach the rated life. For example, some lamps may become unable to light before reaching the rated life.

[0006] Therefore, a recommended replacement period is set for the lamp. The recommended replacement period is set shorter than the rated life. In other words, the recommended replacement period is set with a margin in mind relative to the rated life. If this margin is too large, the lamp will be replaced more frequently, resulting in higher running costs. Therefore, in order to reduce running costs, the recommended replacement period can be set with a small margin in mind relative to the rated life. However, in this case, it is known that even if a light amount that satisfies the specifications is ensured at the end of the life, the light amount may fluctuate within a short period of time. Fluctuations in the light amount lead to fluctuations in measurement accuracy. Therefore, there is a limit to setting the recommended lamp replacement period with a small margin.

[0007] In Patent Document 1, for the purpose of providing a chemical analysis device capable of extending the life of a light source lamp and ensuring measurement accuracy, a method is proposed for extending the life of the lamp by setting the light source driving power to a value lower than the rated value and setting the blank absorbance within a predetermined allowable value. Patent Document 1 also proposes monitoring the light source driving power supplied to the light source to diagnose the life and failure of the light source lamp, and monitoring the absorbance to diagnose failure of the light source lamp.

[0008] Patent Document 2 proposes an automatic analyzer for the purpose of enabling early detection of abnormalities in a measuring unit equipped with a photodetector, the automatic analyzer comprising: a specimen container holding section for holding a specimen container containing a specimen to be measured; a reagent container holding section for holding a reagent container containing a reagent; a reaction container holding section for holding a reaction container in which the specimen and reagent are stirred; a specimen dispensing section for aspirating the specimen from the specimen container and dispensing the specimen into the reaction container; a reagent dispensing section for aspirating the reagent from the reagent container and dispensing the reagent into the reaction container; a measuring section for measuring a reaction product obtained by reacting the specimen and reagent dispensed into the reaction container; a control section for causing the measuring section to perform self-diagnosis of the measuring section when the automatic analyzer is started, when measurement of a predetermined unit of specimen is started, and when measurement of a predetermined unit of specimen is completed, and determining whether the measuring section is normal or abnormal based on the measurement values ​​of the measuring section; and a display section for displaying the measurement values ​​obtained by the self-diagnosis of the measuring section in chronological order under the control of the control section. [Prior art documents] [Patent documents]

[0009] [Patent Document 1] JP 2008-058151 A [Patent Document 2] JP 2019-158738 A Summary of the Invention [Problem to be solved by the invention]

[0010] According to Patent Document 1, the life of the light source lamp can be extended and measurement accuracy can be ensured. However, Patent Document 1 does not disclose a method for diagnosing failures other than the light source lamp. In addition to the light source lamp, threshold judgments may be performed on the dispensing mechanism, stirring mechanism, cleaning mechanism, reaction cell, and other mechanisms to satisfy the analytical performance of the device, but the failure diagnosis for each mechanism is independent, making it difficult to identify the location of the failure and sometimes taking a long time to restore the system.

[0011] According to Patent Document 2, even if the measurement unit is judged to be normal at startup, if the measurement unit is judged to be abnormal at the start of measurement of a predetermined unit of sample or at the end of measurement of a predetermined unit of sample, it is possible to quickly grasp the abnormality and take the prescribed action, and it is possible to eliminate abnormalities in measurement values ​​that may occur due to continued use of a measurement unit judged to be abnormal. However, Patent Document 2 does not disclose a method for diagnosing abnormalities other than those of the measurement unit equipped with a photodetector.

[0012] An object of the present invention is to provide a chemical analysis device that makes it easy to estimate a fault location in fault diagnosis. [Means for solving the problem]

[0013] In order to achieve the above object, the chemical analysis apparatus of the present invention is configured as described in the claims. Note that in the claims, the citation of other claims in the dependent claims is made as a single citation to make the dependent claims easier to understand, but the present invention includes a form in which a dependent claim cites multiple claims (multiple dependent claims) and a form in which a dependent claim cites multiple multiple dependent claims. Specifically, the chemical analysis apparatus of the present invention is, for example, a chemical analysis apparatus that has a plurality of reaction cells into which specimens and reagents are dispensed, and performs absorbance measurements using a photometric system that irradiates light onto a mixture of specimens and reagents contained in the reaction cells and measures the light that passes through the mixture, and is equipped with a diagnostic unit that performs fault diagnosis.The diagnostic unit accumulates time-series photometric system data measured using a sample specimen for fault diagnosis and a reagent for fault diagnosis, creates a population of photometric data for fault diagnosis for each specified reaction cell, and compares the photometric data of the population of photometric data created for each specified reaction cell with a predetermined threshold value to perform fault diagnosis. In addition, the diagnostic unit acquires time series data of various mechanisms that constitute the chemical analysis device, such as a dispensing mechanism and a stirring mechanism, and if it determines that there is a fault by comparing the photometric data of the population of photometric data created for each specified reaction cell with a preset threshold value, it estimates the location of the fault by collating it with the time series data of the various mechanisms. Effect of the Invention

[0014] According to the present invention, it becomes easy to estimate a fault location in fault diagnosis. Problems, configurations and effects other than those described above will become apparent from the following description of the embodiments. [Brief description of the drawings]

[0015] [Figure 1] 1 is an explanatory diagram illustrating an example of the overall device configuration of a chemical analysis device to which the present invention is applied; [Diagram 2] FIG. 2 is a diagram for explaining the measurement results of the photometric system described in the first embodiment. [Diagram 3] FIG. 2 is an explanatory diagram showing a thermostatic chamber of the device configuration described in Example 1 as viewed from above. [Figure 4]FIG. 2 is a diagram for explaining the measurement results of the photometric system described in the first embodiment. [Diagram 5] 4 is a flowchart illustrating a flow of failure diagnosis according to the first embodiment. [Figure 6] 11 is a flowchart illustrating a flow of failure diagnosis according to a second embodiment. [Figure 7] FIG. 1 is a diagram illustrating the measurement results described in Example 2. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0016] Hereinafter, an embodiment of the present invention will be described with reference to the drawings. Note that the same reference numerals are used to designate substantially the same or similar components, and where explanations are redundant, the explanations may be omitted. EXAMPLES

[0017] First, with reference to FIG. 1, an example of the overall device configuration of a chemical analysis device to which the present invention is applied will be described. The chemical analyzer has a control unit 30, a mechanical unit 50, and a diagnostic unit 60. The control unit 30 has a control power supply 31, a CPU 32, a memory 33, a storage medium 34, an I / O 35, and an AD converter 36. The mechanical unit 50 has a light source power supply 41, a light source 42, a multi-wavelength photometer 43, a power meter 44, a sample dispensing mechanism 53, a reagent dispensing mechanism 54, a stirring mechanism 55, a cleaning mechanism 56, and a thermostatic bath 57. The diagnostic unit 60 has a control power supply 61, a CPU 62, a memory 63, a storage medium 64, and an AD converter 66. The control unit 30 drives each part of the mechanism unit 50 via the I / O 35. The sample dispensing mechanism 53 dispenses the sample in the specimen container (sample container) 51 into the reaction cell (reaction container) 52. The reagent dispensing mechanism 54 injects the reagent into the reaction container 52. The stirring mechanism 55 stirs the mixed liquid in the reaction cell (reaction container) 52 to cause the sample and reagent to react with each other. The cleaning mechanism 56 cleans the reaction cell (reaction container) 52. The thermostatic bath 57 maintains the reaction system at a constant temperature to stabilize the reaction. Light from the light source 42 is irradiated onto the mixed liquid contained in a reaction cell (reaction vessel) 52. The multi-wavelength photometer 43 detects light of a predetermined wavelength from the light that has passed through the mixed liquid. The AD converter 36 converts the analog signal from the multi-wavelength photometer 43 into a digital signal. The control unit 30 calculates the absorbance by comparing the light intensity detected by the multi-wavelength photometer 43 with the light intensity of a solution of a reference concentration measured in advance. The control unit 30 analyzes the sample based on the absorbance. The light source 42 and the multi-wavelength photometer 43 constitute a photometric system. The power meter 44 measures the light source driving power, that is, the light source driving current or the light source driving voltage. Methods for measuring the light source driving current include a method using a Hall element as the light source power supply 41 as a DC power supply, and a method using a current transformer as the light source power supply 41 as an AC power supply. The method using a Hall element has the advantage of being able to reduce power loss because it measures the current without contact. One method for measuring the light source driving voltage is to use a shunt resistor and measure the potential difference generated across the resistor. The light source power supply 41 supplies power to the light source 42. The light source power supply 41 controls the power supplied to the light source 42 based on a control signal from the control unit 30. The storage medium 34 stores various programs for operating the chemical analysis apparatus. The memory 33 stores the absorbance and the light source driving power in real time. The control power supply 31 is a power supply for the control unit 30. The CPU 32 reads out the programs stored in the storage medium 34 and controls the operation of the control unit 30.

[0018] In estimating the fault location of the chemical analysis apparatus of this embodiment, the measured values ​​of the dynamic characteristics of each mechanism of the mechanism section 50 are transmitted to the ADC 66 of the diagnosis section 60. The storage medium 64 stores thresholds and various programs for estimating the fault location of the chemical analysis apparatus. The memory 63 stores the dynamic characteristics of each mechanism of the mechanism section 50 and the measurement results of the photometry system in real time. The control power supply 61 is a power supply for the diagnosis section 60. The CPU 62 reads out the thresholds and programs stored in the storage medium 64 and controls the operation of the control section 30.

[0019] The chemical analyzer of this embodiment performs (1) an absorbance calculation process for calculating absorbance by comparing the light intensity detected by the multi-wavelength photometer 43 with the light intensity of a solution of a reference concentration measured in advance, (2) a lamp life extension mode operation process for operating the chemical analyzer in a lamp life extension mode, (3) a life determination process for determining that the light source lamp has reached the end of its life and issuing a warning to that effect, (4) a failure determination process for determining that the light source lamp or various mechanisms have failed and issuing a warning to that effect, and (5) a failure location estimation process when various mechanisms have failed, etc. Programs for performing these processes (1) to (4) are stored in the storage medium 34. A program for performing the process (5) is stored in the storage medium 64. The process (5) will be described in detail below.

[0020] In this embodiment, a detailed description will be given of a process for estimating a failure location when various mechanisms constituting the chemical analysis apparatus fail.

[0021] In order to diagnose the presence or absence of a malfunction, the measured values ​​of the photometry system are generally repeatedly accumulated without changing the conditions to create a population, and the degree of variation is then judged against a threshold value. In repeated measurements, measurements are taken in a series over time with one photometry system, so in most cases, a malfunction or abnormality is diagnosed as occurring at the time when there is a change as a result of the threshold judgment. After that, the malfunction is confirmed by tracing back to the timing when the malfunction occurred, and the location of the malfunction is estimated by empirically investigating the location of the malfunction and confirming the presence or absence of a malfunction. Although it is possible to predict the malfunction of each mechanism by setting a lifespan for each mechanism, it is necessary to refer to the output results for each mechanism, which takes time.

[0022] In this embodiment, in addition to the population of photometric data measured in a time series as described above, a sample specimen and a reagent for fault diagnosis are dispensed into multiple reaction cells to record photometric data, and a population of photometric data is created for each reaction cell position to diagnose a fault. For example, a glycerin aqueous solution is used as the sample specimen for fault diagnosis. The concentration of the glycerin aqueous solution is changed to simulate the viscosity of the analysis target of the chemical analysis device. Instead of the glycerin aqueous solution, physiological saline may be used. For example, a dye solution such as amido black is used as the reagent for fault diagnosis. A specimen container (not shown) is provided as a specimen container (specimen container) for containing the sample specimen for fault diagnosis.

[0023] FIG. 2 shows a diagram for explaining the measurement results of the photometry system of this embodiment. When the photometry data measured in a time series is plotted with the horizontal axis as time and the vertical axis as absorbance, it becomes data 201 to 203, and the average value shown by the dashed line is compared with a preset threshold value as an index to diagnose a fault. Data 201 to 203 show the measurement results of different reaction cells, and the data are recorded so that the position of the reaction cell can be known. That is, a population for fault diagnosis is created based on the measurement time information and the reaction cell position information. The horizontal time axis is, for example, on the order of several seconds.

[0024] The photometric data measured in a time series to generate a population may be measured by emptying the reaction cell, or may be filled by dispensing a sample specimen and a reagent for fault diagnosis as described above. In the former case, the cost can be reduced by not using a sample specimen and a reagent for fault diagnosis. In the latter case, the population created by measuring in a time series and the population organized by each reaction cell can be created with common photometric data, so that the time required to measure the data for fault diagnosis can be shortened. In addition, if photometry can be performed without substantially changing the conditions, it is also possible to perform fault diagnosis using the photometric data of the analysis target of the chemical analysis device instead of the sample specimen and the reagent for fault diagnosis. The important thing is to create a population of photometric data for each reaction cell and perform fault diagnosis.

[0025] In addition, as shown in FIG. 3, for example, three reaction cells (A, B, C) are selected for use in failure diagnosis, and sample specimens and reagents for failure diagnosis are dispensed into the selected reaction cells to record photometric data. As a result, as shown in FIG. 4, the results shown in data 401, data 402, and data 403 are plotted by collecting data measured at the positions of reaction cells A, B, and C on a predetermined time axis. The average value is, for example, a moving average of the most recent three measurement data. If the failure depends on the location of the reaction cell, as shown in data 401, it becomes easier to notice changes in the average value of the measured values, and the accuracy of failure or abnormality diagnosis increases. In this embodiment, the diameter of the circle in the plot corresponds to the threshold value. Just before time t5, the difference from the previous average value exceeds the threshold value.

[0026] The number of reaction cell selection locations is not limited to three. The more the number of selected locations, the higher the accuracy of estimating the fault location. In other words, the positions and number of reaction cells used for fault diagnosis are set according to the total number of reaction cells. In this case, it is desirable to arrange the selection locations evenly around the thermostatic chamber 57.

[0027] Furthermore, because the population has spatial information (position information of the reaction cells), it is possible to estimate the location of the failure. For example, in the measurement results of Figure 4, it can be estimated that the failure occurred in a location related to reaction cell A. If similar results that indicate a failure also occur simultaneously in reaction cells B and C, it can be inferred that the failure occurred in a mechanism common to reaction cells A to C. In this way, the location of the failure can be estimated by combining spatial independence and temporal continuity, which shortens the time required to analyze the cause of the failure and take recovery measures.

[0028] It is also possible to determine a new threshold value for fault diagnosis based on accumulated photometric data. In other words, to avoid judging (presuming) a fault when there is no fault, the threshold value is set looser if there are multiple cases where faults are judged (presumed) based on accumulated photometric data and a previous threshold value is used to judge (presumed) a fault when it turns out that there is no fault in reality. In the case of Figure 4, the diameter of the circle in the plot is set large.

[0029] Fault diagnosis is performed by the diagnosis unit 60 in Fig. 1. Photometric data and operation data of various mechanisms are sent from the mechanism unit 50 to an AD converter 66 of the diagnosis unit 60 and temporarily stored in memory 63. A storage medium 64 stores a program for organizing the photometric data into a time series (series over time) and for each reaction cell as a population, as well as thresholds for fault determination for each population, and the like, and the data is processed by the CPU 62 to determine faults.

[0030] Next, a flow for performing a failure location estimation process and the like when the various mechanisms described in the first embodiment fail will be described. FIG. 5 is a flowchart for performing a failure location estimation process when any of the mechanisms described in the first embodiment fails. In S201, the fault diagnosis is started. In S202, a sample specimen and a reagent for fault diagnosis are dispensed into a reaction cell. In the S203, the sample is mixed with a stirring mechanism. Specimen and stir the reagents. In S204, the absorbance is measured by the photometry system.

[0031] In S205, a failure is judged for the data that forms a population in a time series. If it is judged in S205 that the data is outside the threshold, it is judged that a failure has occurred in one of the chemical analyzers.

[0032] In S206, if the data forming the population in time series in S205 is within the threshold, threshold determination is performed on the data forming the population at each reaction cell position.

[0033] In S207, if it is determined that the threshold is within the threshold in S206, the reaction cell is washed and the process proceeds to normal termination. If it is determined that the threshold is not within the threshold in S206, the fault location is estimated, the reaction cell is washed, abnormality Proceed to the end. If it is determined in S205 that the value is outside the threshold, the reaction cell is washed, abnormality Proceed to Finish.

[0034] As a result, it is possible to estimate the parts that need to be restored during fault diagnosis, shortening the time it takes to restore from a fault. Furthermore, it is possible to increase the probability of detecting an abnormality in the early stages, reducing the possibility of misdiagnosis, and ultimately improving analysis performance.

[0035] If the result in S205 is outside the threshold, it can be determined that a failure has occurred in one of the chemical analyzers, but since it is difficult to estimate the location of the failure, it is possible to proceed to S206 so that the location of the failure can be estimated. Generally, it is more likely that a change will appear in the measurement data in each reaction cell than in the data that forms a population over time (measurement data of the entire chemical analyzer). Considering this, S205 may be omitted. EXAMPLES

[0036] Next, a flow for performing a failure location estimation process etc. when various mechanisms described in the second embodiment fail will be described. The device configuration is the same as in the embodiment 1. The fault diagnosis program stored in the storage medium of the diagnosing unit 60 is different.

[0037] FIG. 6 is a flowchart for performing a failure location estimation process when various mechanisms described in the second embodiment fail. S601 to S607, S617, and S618 are similar to S201 to S207, and S217 and S218 in the first embodiment.

[0038] In S602, a control signal during dispensing is transmitted to the diagnosis unit 60 to acquire data. The acquired data includes, for example, a pressure value in the dispensing path, a current value during pressure control of the syringe pump, and the like.

[0039] In S603, for example, when stirring using ultrasound, the output of ultrasound during stirring is transmitted to the diagnostic unit 60 to acquire data in chronological order. The acquired data includes the sound pressure value of the output ultrasound, the current value when the ultrasonic element is driven, and the like.

[0040] In S616, the data acquired from the various mechanisms constituting the chemical analysis device (in FIG. 6, the sample dispensing mechanism, the reagent dispensing mechanism, and the mixing mechanism) is compared with the results of a fault determination based on the data that forms a population at the reaction cell position, and the fault location that indicates a threshold anomaly is estimated.

[0041] 7 shows data 701 in which a population is formed in a time series, data 702 in which a population is formed in a reaction cell (reaction cell A in FIG. 7), and acquired data 703 of the current value during stirring in reaction cell A. When there is only one stirring mechanism, the current value during stirring of the stirring mechanism may be used regardless of the reaction cell. In addition, a time lag occurs due to differences between the absorbance measurement position and the stirring position, but data 702 and data 703 are associated with each other by taking into consideration the time difference from the stirring mechanism to the absorbance measurement position.

[0042] The data 701 forming a population in a time series shows data in which the average value changes at time t71. However, by comparing the data 702 of the reaction cell with the acquired data 703 of the current value during stirring, an increase in absorbance and a decrease in the current value are detected at time t70. The abnormality is detected earlier than when judged from the data 701 forming a population in a time series, and it is possible to estimate the location of the fault and that the abnormality has occurred in the stirring mechanism. If an abnormality occurs in the sample dispensing mechanism or the reagent dispensing mechanism, the abnormality and its location can be estimated in the same way. Although not described in this embodiment, the cleaning mechanism can also be diagnosed by applying this embodiment. In addition, the method described in Patent Document 1 may be applied to diagnose abnormalities in the light source lamp.

[0043] The fault diagnosis described in the first and second embodiments may acquire data for fault diagnosis several times a day, and perform data acquisition and diagnosis. The more times the fault diagnosis is performed, the more the time resolution of anomaly detection improves.

[0044] According to the above-described embodiment of the present invention, it is possible to estimate the fault location (the part that needs to be restored) during fault diagnosis, and it is possible to shorten the time required for restoration from a fault. Furthermore, it is possible to increase the probability of detecting an abnormality at an early stage, reduce the possibility of misdiagnosis, and ultimately improve the analysis performance.

[0045] The present invention is not limited to the above-described embodiment, but includes various modified examples. For example, the above-described embodiment has been described in detail to easily explain the present invention, and is not necessarily limited to those including all of the configurations described. It is also possible to replace a part of the configuration of one embodiment with the configuration of another embodiment, and it is also possible to add the configuration of another embodiment to the configuration of one embodiment. It is also possible to add, delete, or replace a part of the configuration of each embodiment with another configuration. [Explanation of symbols]

[0046] 30...control unit, 31...control power supply, 32...CPU, 33...memory, 34...storage medium, 35...I / O, 36...AD converter, 41...light source power supply, 42...light source, 43...multi-wavelength photometer, 44...power meter, 50...mechanism, 51...specimen container (sample container), 52...reaction cell (reaction container), 53...sample dispensing mechanism, 54...reagent dispensing mechanism, 55...mixing mechanism, 56...cleaning mechanism, 57...thermostatic bath, 60...diagnosis unit, 61...control power supply, 62...CPU, 63...memory, 64...storage medium, 66...AD converter.

Claims

1. A chemical analyzer comprising a plurality of reaction cells into which a specimen and a reagent are dispensed, the chemical analyzer performing absorbance measurement using a photometric system that irradiates a mixture of the specimen and the reagent contained in the reaction cells with light and measures the light that passes through the mixture, A chemical analysis apparatus comprising a diagnostic unit for performing fault diagnosis, the diagnostic unit creating a population of photometric data for fault diagnosis for each predetermined reaction cell, and comparing photometric data of the population of photometric data created for each predetermined reaction cell with a preset threshold value to perform fault diagnosis, The diagnostic unit accumulates time-series photometric data measured using a sample specimen for fault diagnosis and a reagent for fault diagnosis, and creates a population of photometric data for fault diagnosis for each of the specified reaction cells based on the accumulated photometric data.

2. 2. The chemical analysis apparatus according to claim 1, The chemical analysis apparatus according to claim 1, wherein the photometric data to be compared with the threshold value is a difference between a measured value and an average value of the photometric data.

3. 2. The chemical analysis apparatus according to claim 1, A chemical analysis apparatus, wherein the photometric data compared with the threshold value is a coefficient of variation obtained by dividing the standard deviation of the measured values ​​of the photometric data by the average value.

4. 2. The chemical analysis apparatus according to claim 1, The diagnostic unit acquires time series data of a mechanism constituting the chemical analysis apparatus, and when it determines that there is a fault by comparing the photometric data of a population of photometric data created for each of the specified reaction cells with the preset threshold value, it estimates the location of the fault by collating the data with the time series data of the mechanism.

5. 5. The chemical analysis apparatus according to claim 4, The chemical analysis apparatus is characterized in that the mechanism constituting the chemical analysis apparatus is a sample dispensing mechanism or a reagent dispensing mechanism, and the time series data of the mechanism constituting the chemical analysis apparatus is a pressure value in a dispensing path constituting the sample dispensing mechanism or the reagent dispensing mechanism, or a current value during pressure control of a syringe pump.

6. 5. The chemical analysis apparatus according to claim 4, The chemical analysis apparatus is characterized in that the mechanism constituting the chemical analysis apparatus is a stirring mechanism that stirs the sample and the reagent, and the time series data of the mechanism constituting the chemical analysis apparatus is the sound pressure value of the output ultrasound of an ultrasonic element constituting the stirring mechanism or the current value when the ultrasonic element is driven.

7. 2. The chemical analysis apparatus according to claim 1, The diagnostic unit stores the photometric data and determines a new threshold value based on the stored data.

8. 2. The chemical analysis apparatus according to claim 1, The chemical analysis apparatus further comprises setting the positions and number of reaction cells used in fault diagnosis in accordance with the total number of the reaction cells.

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