Test question specification method and program

Abstract

To make it possible to grasp whether to be able to pass a test when which test questions can be solved.SOLUTION: A question identification method executed by a test question identification device 1 includes the steps of: classifying a plurality of test questions into a plurality of importance ranks by giving an importance rank to each test question on the basis of an importance rank of a technical term included in each test question; calculating an integrated value obtained by integrating appearance rates corresponding to respective importance ranks in order of higher importance ranks from an appearance rate corresponding to the highest importance rank; and outputting question identification information for identifying a plurality test questions corresponding to importance ranks from the highest importance rank to an importance rank corresponding to an appearance rate which is after a time point when the integrated value exceeds a reference value and is integrated just before the time point to an examinee terminal 2.SELECTED DRAWING: Figure 1

Description

[Technical field]

[0001] The present invention relates to a test question specification method and a program. [Background technology]

[0002] There are known techniques for evaluating past exam questions for qualification exams. For example, Patent Literature 1 discloses a technique for analyzing past exam questions and evaluating the degree to which correct answers to past exam questions are required to pass the exam. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] JP 2020-95686 A Summary of the Invention [Problem to be solved by the invention]

[0004] However, the technology in Patent Document 1 can only evaluate the importance of past exam questions, making it difficult for people studying for exams to know which of the large number of past exam questions they need to be able to solve in order to pass the exam.

[0005] The present invention has been made in consideration of these points, and has as its object to enable a person studying for an exam to know which exam questions he or she needs to be able to solve in order to pass the exam. [Means for solving the problem]

[0006] In a first aspect of the present invention, a test question identification method is provided, which includes the steps of: acquiring a plurality of test questions that were asked in a test within a predetermined period of time in the past, executed by a computer; assigning a term importance rank to a predetermined technical term contained in each of the plurality of test questions; classifying the plurality of test questions into a plurality of problem importance ranks by assigning a problem importance rank to each of the plurality of test questions based on the term importance rank assigned to the technical term; calculating an occurrence rate, which is a ratio of the number of the test questions for each of the classified problem importance ranks to the total number of the plurality of test questions, for each of the plurality of problem importance ranks; calculating an integrated value by accumulating the occurrence rates corresponding to each of the problem importance ranks in order of increasing problem importance rank from the occurrence rate corresponding to the highest problem importance rank; identifying the problem importance rank corresponding to the occurrence rate accumulated immediately before the point in time when the integrated value exceeds a reference value corresponding to the correct answer rate required for passing, and outputting information for identifying the plurality of test questions corresponding to the highest problem importance rank to the identified problem importance rank.

[0007] The test question identification method may further include a step of obtaining term information including a plurality of the technical terms, which is executed before the step of assigning the term importance rank, and in the step of assigning the term importance rank, the term importance rank may be assigned to the technical term included in the term information among a plurality of terms contained in the plurality of test questions.

[0008] The step of assigning the term importance rank may include a step of identifying one or more locations in the question sentence, correct answer options, or incorrect answer options in the plurality of test questions that contain the technical term; a step of assigning to the technical term a total point calculated by adding up reference points determined for each of the one or more identified locations; and a step of assigning to each of the plurality of technical terms a term importance rank that is higher the greater the total point.

[0009] The step of assigning the term importance rank to the technical term includes a step of calculating a number of unranked terms, which is the number of technical terms to which the term importance rank has not been assigned, by subtracting a total number of technical terms to which the term importance rank has been assigned from a total number of the plurality of technical terms; a step of calculating a distribution number for distributing the technical terms to one of the term importance ranks by dividing the number of unranked terms by a remaining number of ranks obtained by subtracting the number of the term importance ranks assigned to the technical terms from the total number of the term importance ranks; and a step of calculating a distribution number for distributing the technical terms to one of the term importance ranks by dividing the number of the technical terms to which the term importance rank has not been assigned by the smallest number of points. The method may include a step of calculating an accumulated term count value by accumulating the number of technical terms corresponding to each of the points in order from the above points; a step of identifying the point that is after the point at which the accumulated term count value exceeds the distribution number and corresponds to the number of technical terms accumulated immediately before that point; and a step of assigning the lowest term importance rank among the term importance ranks that have not been assigned to other technical terms to the technical term that corresponds from the minimum point to the identified point among the technical terms to which the term importance rank has not been assigned.

[0010] The classifying step may include a step of assigning to the plurality of test questions a question importance rank corresponding to the lowest term importance rank among the term importance ranks of each of the plurality of technical terms contained in each of the plurality of test questions.

[0011] The test question identification method may further include a step of obtaining the reference value input by a user, the step being executed before the step of identifying the question importance rank.

[0012] In a second aspect of the present invention, a program is provided for causing a computer to execute the steps of: acquiring a plurality of test questions that were asked in a test within a specified period of time in the past; for each of the plurality of test questions, assigning a term importance rank to a specified technical term contained in the test question; classifying the plurality of test questions into a plurality of problem importance ranks by assigning a problem importance rank to each of the plurality of test questions based on the term importance rank of the assigned technical term; calculating an occurrence rate for each of the plurality of problem importance ranks, which is the ratio of the number of the test questions for each of the classified problem importance ranks to the total number of the plurality of test questions; calculating an integrated value by accumulating the occurrence rates corresponding to each of the problem importance ranks in order of increasing problem importance rank from the occurrence rate corresponding to the highest problem importance rank; identifying the problem importance rank corresponding to the occurrence rate accumulated immediately before and after the point at which the integrated value exceeds a reference value corresponding to the correct answer rate required for passing; and outputting information for identifying the plurality of test questions corresponding to the highest problem importance rank through the identified problem importance rank. Effect of the Invention

[0013] According to the present invention, an effect is achieved in that a person studying for an exam can grasp which exam questions he or she needs to be able to solve in order to pass the exam. [Brief description of the drawings]

[0014] [Figure 1] FIG. 1 is a diagram for explaining an overview of a test question specification system. [Diagram 2] FIG. 1 is a diagram for explaining a configuration of an exam question specifying device 1. [Diagram 3] 1 is an example of a technical term list. [Figure 4] This is an example of points determined according to the location of appearance. [Diagram 5] This is a classification table of technical terms. [Figure 6]This is a classification table of technical terms obtained by assigning a term importance ranking to all technical terms. [Figure 7] This is a classification table of test questions. [Figure 8] 13 is a flowchart showing an example of a process for assigning a term importance rank to a technical term. [Figure 9] 13 is a flowchart illustrating an example of a process for identifying test questions. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0015] [Overview of the Test Question Identification System S] Fig. 1 is a diagram for explaining the outline of the test question identification system S. The test question identification system S is a system for outputting, to an examinee U studying for an exam, question identification information for identifying exam questions that need to be solved in order to pass the exam from among a number of past exam questions. In the following explanation, the test questions asked in the exam are described as multiple-choice questions, but the format of the test questions is arbitrary.

[0016] The test question identification device 1 is a device that identifies test questions that need to be solved from multiple past test questions. First, the test question identification device 1 classifies multiple test questions that were asked in past tests into multiple importance ranks based on the term importance rank, which is the importance rank of the technical terminology included in each test question. In this specification, the importance rank of the test questions is called the problem importance rank. Next, the test question identification device 1 identifies test questions that the examinee U needs to solve from among the multiple test questions, based on the order of problem importance rank, starting from the test question with the highest problem importance rank. The test question identification device 1 identifies test questions that need to be solved so that the ratio of the number of identified test questions to the total number of multiple test questions exceeds a reference value corresponding to the correct answer rate required to pass the test.

[0017] Then, the exam question identification device 1 outputs problem identification information for identifying the exam questions that need to be solved to the examinee terminal 2. The exam question identification device 1 outputs, for example, the problem numbers of the identified exam questions as problem identification information to the examinee terminal 2 that sent the instruction to output the problem identification information. The examinee terminal 2 displays the problem numbers on a display unit. In the example of Figure 1, 2, 3, 5, and 7 are displayed on the display unit of the examinee terminal as problem numbers of the exam questions that need to be solved.

[0018] In this way, the exam question identification device 1 can notify the examinee U of which exam question out of a large number of past exam questions he or she needs to be able to solve in order to pass the exam. As a result, the examinee U can know which exam question he or she needs to be able to solve in order to pass the exam, thereby improving the efficiency of exam study.

[0019] [Configuration of test question identification device 1] 2 is a diagram for explaining the configuration of the exam question identification device 1. The exam question identification device 1 comprises a communication unit 11, a storage unit 12, and a control unit 13. The communication unit 11 is a communication module capable of transmitting and receiving various information. The communication unit 11 can transmit and receive various information to and from the examinee terminal 2 and the administrator terminal 3, for example, via the Internet. The administrator terminal 3 is a terminal used by a teacher at a cram school who uses the exam question identification device 1 to teach examinees U how to study for exams.

[0020] The storage unit 12 is a storage medium including a read only memory (ROM), a random access memory (RAM), a hard disk, etc. The storage unit 12 stores a program that the control unit 13 executes.

[0021] The memory unit 12 stores a plurality of past exam questions. The plurality of past exam questions can be stored by an administrator using the administrator terminal 3. For example, the administrator inputs a plurality of past exam questions into the administrator terminal 3, and causes the administrator terminal 3 to transmit the input plurality of past exam questions to the exam question identification device 1, thereby causing the memory unit 12 to store a plurality of past exam questions.

[0022] The storage unit 12 stores terminology information (hereinafter referred to as a "terminology list") including multiple technical terms used in multiple test questions. Fig. 3 is an example of the technical terminology list. The technical terminology list in Fig. 3 is an example of technical terms used in the national nursing examination.

[0023] The control unit 13 is a computational resource including a processor such as a CPU (Central Processing Unit). The control unit 13 executes a program stored in the storage unit 12 to realize functions as an information acquisition unit 131, a term classification unit 132, a question classification unit 133, an appearance rate calculation unit 134, a question identification unit 135, and an information output unit 136.

[0024] The information acquisition unit 131 acquires a predetermined period (hereinafter referred to as the "question acquisition period") for acquiring multiple exam questions from multiple exam questions asked in past exams. For example, the information acquisition unit 131 acquires the question acquisition period from the examinee terminal 2. Then, the information acquisition unit 131 acquires from the memory unit 12 multiple exam questions asked in exams held during the question acquisition period. As an example, if 10 years is input into the examinee terminal 2 as the question acquisition period, the information acquisition unit 131 acquires from the memory unit 12 multiple exam questions asked in exams over the past 10 years. The information acquisition unit 131 may also acquire the question acquisition period from the administrator terminal 3.

[0025] The information acquiring unit 131 acquires the technical term list from the storage unit 12. The information acquiring unit 131 may acquire the technical term list input by the administrator to the administrator terminal 3 from the administrator terminal 3. In this case, the information acquiring unit 131 stores the acquired technical term list in the storage unit 12.

[0026] The information acquisition unit 131 acquires a reference value corresponding to the correct answer rate required to pass from the administrator terminal 3. The reference value is a value for determining the number of test questions that need to be solved in order to pass the test. The process of determining the number of test questions using the reference value will be described later, but the larger the reference value, the more test questions that need to be solved, and the smaller the reference value, the fewer test questions that need to be solved. The reference value is, for example, a value obtained by adding a predetermined additional value to the correct answer rate required to pass. The correct answer rate required to pass is set for each test, for example, by the administrator. In this case, the administrator inputs the correct answer rate required to pass and the additional value into the administrator terminal 3, and the information acquisition unit 131 acquires the correct answer rate required to pass and the additional value from the administrator terminal 3.

[0027] The information acquiring unit 131 may acquire information for setting a reference value input by the examinee U to the examinee terminal 2, and determine a reference value based on the acquired information for setting a reference value. For example, the information acquiring unit 131 may acquire probability information indicating the pass probability desired by the examinee U from the examinee terminal 2 as information for setting a reference value, and set a reference value based on the acquired probability information. The probability information may be numerical information, or may be text information associated with the pass probability, such as "high pass probability", "medium pass probability", or "minimum pass level".

[0028] When the information acquiring unit 131 acquires the probability information, it acquires a reference value stored in the storage unit 12 in association with the acquired probability information. When an initial value of the reference value is determined in advance, the information acquiring unit 131 may determine the reference value by adding an additional value corresponding to the acquired probability information to the initial value. For example, when the information acquiring unit 131 acquires probability information indicating "medium probability of passing," it determines the reference value by adding an additional value that is smaller than an additional value corresponding to "high probability of passing" and larger than an additional value corresponding to "minimum passing line" to the initial value.

[0029] The term classification unit 132 assigns a plurality of term importance ranks to a plurality of technical terms in the technical term list. For example, the term classification unit 132 assigns a term importance rank to technical terms included in the technical term list stored in the storage unit 12, among a plurality of terms included in all of a plurality of test questions. An example of the process of assigning term importance ranks to technical terms, which is executed by the term classification unit 132, will be specifically described below.

[0030] First, the terminology classification unit 132 identifies technical terms included in the technical term list from among multiple terms included in all of the multiple test questions. Next, the terminology classification unit 132 identifies one or more locations in which the technical term is included in the question sentence, correct answer options, or incorrect answer options in the multiple test questions. Hereinafter, the location in which the technical term is included in the test question is referred to as the "appearance location."

[0031] Next, the term classification unit 132 assigns a total point to the technical term, which is the sum of the reference points determined for each of the one or more occurrences identified. The points determined for each of the multiple occurrences are stored in advance in the storage unit 12. FIG. 4 is an example of points determined for the occurrences. Also, as shown in FIG. 4, points may be set according to the question category. As an example with reference to FIG. 4, the points determined for the technical term included in the [correct answer option] of the [mandatory] test question are 6 points. For example, when the technical term [care migration] is included in the [correct answer option] of the [mandatory] test question and the [question text] of the [general / situation setting] test question, the term classification unit 132 assigns a total of 8 points, which is the sum of 6 points and 2 points, to [care migration].

[0032] The term classification unit 132 may assign points to a technical term based on the number of times the technical term is included in each part of a plurality of test questions. Specifically, the term classification unit 132 assigns points to the technical term that are calculated by multiplying the reference point for a part by the number of times the technical term is included in the part in all of the plurality of test questions. For example, if the technical term [extrinsic] is included three times in the required correct answer options in a plurality of test questions from the past 10 years, the term classification unit 132 assigns 18 points (6 points x 3 times) to [extrinsic].

[0033] Then, the term classification unit 132 performs the above process for each of a plurality of portions (for example, a correct answer option, a question text, and an incorrect answer option), and calculates the final point of the technical term by adding up the points calculated for each of the plurality of portions. For example, if the technical term [extrinsic] appears three times in the required correct answer option, two times in the required question text, and two times in the required incorrect answer option in a plurality of test questions from the past 10 years, the term classification unit 132 assigns 30 points to the technical term [extrinsic] (see formula (1) below). 6 points x 3 times + 4 points x 2 times + 2 points x 2 times = 30 points Formula (1)

[0034] Figure 5 is a terminology point classification table. The terminology point classification table in Figure 5 is obtained as a result of assigning points to all terminology. In the example in Figure 5, the number of terminology assigned 0 points is 141. Similarly, the number of terminology assigned 1 point is 242, the number of terminology assigned 2 points is 292, and the number of terminology assigned 221 points is 1.

[0035] The term classification unit 132 assigns a higher term importance rank to a technical term as the points assigned to the technical term increase. The process of assigning term importance ranks to technical terms will be specifically described below, assuming that the total number of technical terms is 2092, and the term importance ranks are S, A, B, C, D, E, F, G, and H (9 ranks) in descending order.

[0036] First, the term classification unit 132 identifies the total number of technical terms to which a term importance rank has been assigned (hereinafter referred to as "ranked terms"). Next, the term classification unit 132 subtracts the total number of ranked terms from the total number of multiple technical terms (2092) to calculate the number of technical terms to which a term importance rank has not been assigned (hereinafter referred to as "unranked terms"). If no term importance rank has been assigned, the total number of ranked terms is 0 and the number of unranked terms is 2092.

[0037] Next, the term classification unit 132 identifies the number of term importance ranks (hereinafter referred to as "processed ranks") assigned to technical terms. Then, the term classification unit 132 calculates the number of remaining ranks by subtracting the number of processed ranks from the total number of term importance ranks (in the above specific example, there are nine ranks from S to H, so the total number of term importance ranks is nine). Then, the term classification unit 132 divides the number of unranked terms by the number of remaining ranks to calculate the distribution number for distributing technical terms to one term importance rank. If no term importance ranks have been assigned, the number of processed ranks is 0, the number of remaining ranks is 9, and the distribution number is 232 (rounded down to the nearest whole number) (see formula (2) below). 2092÷9=232.444... Equation (2)

[0038] Then, the term classification unit 132 calculates the accumulated term count value by accumulating the number of technical terms in ascending order of points, starting from the technical term corresponding to the smallest point among the points corresponding to unranked terms. For example, when no term importance rank is assigned, the term classification unit 132 calculates the accumulated term count value by accumulating the number of technical terms in ascending order of points, starting from the technical term corresponding to 0 point, which is the smallest point. As an example, the term classification unit 132 calculates the accumulated term count value (383) by accumulating the number of technical terms with 0 point (141) and the number of technical terms with 1 point (242).

[0039] Next, the term classifying unit 132 determines whether the term count integrated value exceeds the distribution number. In the above example, the term classifying unit 132 determines that the term count integrated value (383) exceeds the distribution number (232). Next, the term classifying unit 132 identifies a point that corresponds to the number of technical terms that is integrated after the time when it is determined that the term count integrated value has exceeded the distribution number and that is immediately prior to the time when it is determined that the term count integrated value has exceeded the distribution number. As a specific example, the term classifying unit 132 identifies one point that is integrated immediately prior to the time when it is determined that the term count integrated value (383) has exceeded the distribution number (232).

[0040] Then, the term classification unit 132 assigns the lowest term importance rank among the term importance ranks not assigned to technical terms to technical terms corresponding to one or more points from the minimum point corresponding to an unranked term to the specified point. For example, the term classification unit 132 classifies technical terms with 0 points and 1 point accumulated when it is determined that the term number accumulated value (383) has exceeded the distribution number (232) into the same term importance rank. As an example, the term classification unit 132 assigns an H rank to technical terms corresponding to 0 points to 1 point.

[0041] The term classification unit 132 repeats the above classification process until there are no more unranked terms. For example, the process after the term classification unit 132 assigns an H rank is as follows.

[0042] The term classification unit 132 subtracts the total number of ranked terms (383) from the total number of multiple technical terms (2092) to determine the number of unranked terms (1709). Next, the term classification unit 132 divides the number of unranked terms (1709) by the remaining rank number (8) to determine the distribution number (213). Next, when the number of technical terms with 2 points is 292, the term classification unit 132 determines that the points corresponding to the number of technical terms most recently accumulated at the time when the accumulated value (292) exceeded the distribution number (213) are 2 points. Then, the term classification unit 132 assigns the technical term corresponding to 2 points with G rank, which is the lowest term importance rank among the term importance ranks (S to G ranks) not assigned to technical terms.

[0043] This process is then repeated, and unranked terms are assigned term importance ranks in the following order: F, E, D, C, B, A, S.

[0044] FIG. 6 is a classification table of technical terms obtained as a result of assigning a term importance rank to all technical terms. In the example of FIG. 6, the S rank is assigned to technical terms corresponding to 25 points to 221 points. In the example of FIG. 6, the number of S rank technical terms is 122, and the ratio of the number of S rank technical terms to the total number of technical terms is 6%. The ratios of the number of technical terms belonging to each rank from S rank to H rank are 6%, 6%, 8%, 8%, 8%, 13%, 18%, 14%, and 18%, respectively. By classifying the term importance rank of technical terms by the above procedure, the term classification unit 132 can make the number of technical terms with high term importance ranks smaller than the number of technical terms with low term importance ranks.

[0045] The question classification unit 133 classifies the multiple test questions into multiple question importance ranks by assigning a question importance rank to each of the multiple test questions. As an example, specifically, the question classification unit 133 classifies the multiple test questions by assigning the lowest term importance rank among the term importance ranks of multiple technical terms included in the test questions as the question importance rank of the test question. More specifically, the question classification unit 133 assigns the lowest term importance rank among the technical terms included in the question text and correct answer options of the test question as the question importance rank of the test question.

[0046] An example of how to assign a question importance rank to the next test question will be described. Q: Which mental health and welfare center is appointed by the prefectural governor to provide counseling to people with mental disorders and their families? Correct answer: Mental health and welfare counselor Incorrect answer: Gatekeeper."

[0047] Assume that the term [Mental Health and Welfare Center] in the question text is a terminology of rank D, the correct answer option [Gatekeeper] is a terminology of rank G, and the incorrect answer option [Mental Health and Welfare Counselor] is a terminology of rank A. In this case, the question classification unit 133 assigns rank D, which is the lowest term importance rank out of ranks D and A, as the question importance rank of the test question.

[0048] Technical terms with high term importance ranks are included in more test questions than technical terms with low term importance ranks. Therefore, if the highest term importance rank of technical terms included in a test question is assigned as the problem importance rank of the test question, there will be too many test questions with high problem importance ranks. On the other hand, if the lowest term importance rank of technical terms included in a test question is assigned as the problem importance rank of the test question, only test questions that contain only technical terms with high term importance ranks will be assigned a high problem importance rank. In other words, the question classification unit 133 can assign a higher problem importance rank to test questions that can be answered correctly by studying only technical terms with high term importance ranks than test questions that require studying technical terms with low term importance ranks.

[0049] The question classification unit 133 assigns question importance ranks to all of the multiple test questions administered in the test during the period (e.g., the past 10 years) set as the question acquisition period. The question classification unit 133 identifies the number of test questions classified into each question importance rank. FIG. 7 is a classification table of test questions. In the classification table shown in FIG. 7, ranks, the number of questions, occurrence rates, and an accumulated occurrence rate value are associated with each other. The occurrence rate is the ratio of the number of test questions for each classified problem importance rank to the total number of multiple test questions. The accumulated occurrence rate value is a value obtained by accumulating the occurrence rates corresponding to each problem importance rank in order of increasing problem importance rank, starting from the occurrence rate corresponding to the S rank, which is the highest problem importance rank. In the example of FIG. 7, the number of test questions classified into the S rank is 18. As shown in FIG. 7, the question classification unit 133 identifies the number of classified test questions for each problem importance rank.

[0050] The occurrence rate calculation unit 134 calculates the occurrence rate of the test questions classified into each question importance rank. The occurrence rate calculation unit 134 calculates the occurrence rate for each of the multiple question importance ranks. In the example of FIG. 7, the occurrence rate of S rank is 9%, and the occurrence rate of A rank is 8%.

[0051] The occurrence rate calculation unit 134 calculates an integrated occurrence rate value by integrating the occurrence rates corresponding to each problem importance rank in order of increasing problem importance rank, starting from the occurrence rate corresponding to the S rank, which is the highest problem importance rank. For example, the occurrence rate calculation unit 134 calculates the integrated occurrence rate value from the S rank to the A rank to be 17% (see FIG. 7).

[0052] The problem identification unit 135 identifies a problem importance rank that corresponds to the occurrence rate accumulated immediately before the point in time when the occurrence rate accumulated value exceeded the reference value. The problem importance rank is the lowest problem importance rank of the test questions that the examinee U should study for, and is referred to as the "lower limit study rank" in the following explanation. For example, when the reference value set by the examinee U is 60%, the problem identification unit 135 identifies E rank, which is a problem importance rank that corresponds to the occurrence rate accumulated value [62%], as the lower limit study rank (see FIG. 7).

[0053] The question identifying unit 135 identifies the lower limit study rank using a reference value set by the information acquiring unit 131. For example, the question identifying unit 135 identifies the lower limit study rank using a reference value corresponding to the probability information acquired from the examinee terminal 2. As a specific example, when the reference value set by the information acquiring unit 131 is 90%, the question identifying unit 135 identifies G rank, which is a question importance rank corresponding to the appearance rate integrated value [90%], as the lower limit study rank.

[0054] When the question identification unit 135 identifies the lower limit study rank, it generates question identification information for identifying exam questions that need to be solved in order to pass the exam. The question identification information is information for identifying multiple exam questions that correspond from the highest question importance rank to the lower limit study rank. The question identification information is, for example, the question number of the exam question. The question identification information may include the date the exam was conducted and the question category. The question identification information may also be the identified exam question itself. For example, the question identification unit 135 generates question identification information indicating the question numbers of multiple exam questions that correspond to ranks S to E.

[0055] The information output unit 136 outputs the question identification information generated by the question identification unit 135 to the examinee terminal 2. For example, the information output unit 136 outputs question identification information indicating the question numbers of a plurality of exam questions corresponding to ranks S to E to the examinee terminal 2. The examinee terminal 2 then displays the question numbers indicated in the question identification information output from the exam question identification device 1 on the display unit of the examinee terminal 2. This allows the examinee U, who checks the displayed question numbers, to know which exam questions he or she needs to solve in order to pass the exam.

[0056] [Process of assigning importance rank to technical terms] 8 is a flowchart showing an example of a process for assigning a term importance rank to technical terms. The process in FIG. 8 is performed before a process for identifying test questions that need to be solved to pass an exam is performed.

[0057] First, the term classification unit 132 calculates the number of unranked terms by subtracting the total number of ranked terms from the total number of multiple technical terms (step S1). Next, the term classification unit 132 calculates the distribution number by dividing the calculated number of unranked terms by the remaining number of ranks obtained by subtracting the number of processed ranks from the total number of term importance ranks (step S2).

[0058] The term classifying unit 132 calculates an integrated term number value by accumulating the numbers of technical terms in ascending order of points, starting from the technical term corresponding to the smallest point among the points corresponding to unranked terms (step S3).

[0059] The term classification unit 132 determines whether the term count integrated value is greater than the distribution number (step S4). If the term count integrated value is equal to or less than the distribution number (No in step S4), the term classification unit 132 returns to step S3 and calculates the term count integrated value again. When returning from step S4 to execute step S3, the term classification unit 132 adds the number of technical terms corresponding to the second largest point among the points corresponding to the already accumulated number of technical terms to the calculated integrated value.

[0060] If the term count integrated value is greater than the distribution number (Yes in step S4), the term classification unit 132 assigns the lowest term importance rank among the term importance ranks not assigned to the technical term (step S5). For example, if no term importance rank has been assigned, the term classification unit 132 assigns rank H.

[0061] The term classification unit 132 determines whether there are any unranked terms (step S6). If there are any unranked terms (No in step S6), the term classification unit 132 repeats the process from step S1 to step S6 until there are no unranked terms. If there are no unranked terms (Yes in step S6), the term classification unit 132 ends the process of classifying technical terms.

[0062] [Process to identify test questions to be presented to examinee U] Fig. 9 is a flowchart showing an example of a process for identifying test questions to be presented to the examinee U. The flowchart in Fig. 9 is executed when the information acquisition unit 131 acquires, for example, an instruction to output question identification information from the examinee terminal 2.

[0063] The occurrence rate calculation unit 134 calculates the occurrence rate of the exam questions (step S11). For example, the occurrence rate calculation unit 134 calculates the occurrence rate by dividing the number of exam questions in each question importance rank by the total number of exam questions.

[0064] The occurrence rate calculation unit 134 calculates the occurrence rate integrated value (step S12). Specifically, the occurrence rate calculation unit 134 calculates the occurrence rate integrated value by integrating the occurrence rates corresponding to each problem importance rank in descending order of problem importance rank, starting from the occurrence rate corresponding to the highest problem importance rank. As an example, the occurrence rate calculation unit 134 calculates the occurrence rate integrated value from rank S to rank A to be 17% (see FIG. 7).

[0065] The occurrence rate calculation unit 134 judges whether the occurrence rate integrated value is greater than the reference value (step S13). If the occurrence rate integrated value is equal to or less than the reference value (No in step S13), the occurrence rate calculation unit 134 returns to step S12 and calculates the occurrence rate integrated value again. When returning from step S13 to execute step S12, the occurrence rate calculation unit 134 adds the occurrence rate corresponding to the problem importance rank next to the highest problem importance rank among the problem importance ranks corresponding to the occurrence rates already calculated, to the calculated occurrence rate integrated value.

[0066] If the occurrence rate calculation unit 134 finds that the occurrence rate cumulative value is greater than the reference value (Yes in step S13), it identifies the lowest study rank (step S14). For example, if the reference value set by the examinee U is 60%, the question identification unit 135 identifies E rank, which is a question importance rank corresponding to an occurrence rate cumulative value of 62%, as the lowest study rank (see FIG. 7).

[0067] The question identifying unit 135 generates question identifying information for identifying a plurality of test questions corresponding to question importance ranks from the highest question importance rank to the lowest study rank. For example, the question identifying unit 135 generates question identifying information indicating question numbers for identifying test questions from rank S to rank E. Then, the information output unit 136 outputs the generated question identifying information to the examinee terminal 2 (step S15).

[0068] [Effects of Test Question Identification Device 1] As described above, the test question identification device 1 classifies a plurality of test questions into a plurality of problem importance ranks by assigning a problem importance rank to each test question based on the term importance rank of the technical term contained in each test question. Next, the test question identification device 1 calculates an integrated value by integrating the occurrence rates corresponding to each problem importance rank in ascending order of problem importance rank, starting from the occurrence rate corresponding to the highest problem importance rank. Then, the test question identification device 1 outputs to the examinee terminal 2 problem identification information for identifying a plurality of test questions corresponding to the problem importance rank from the highest problem importance rank to the problem importance rank corresponding to the occurrence rate that is after the time when the integrated value exceeds the reference value and is most recently integrated at that time.

[0069] In this way, the examinee terminal 2 can display, for example, the question numbers of the exam questions that should be studied in order to pass the exam on the display unit of the examinee terminal 2. As a result, the examinee U who checks the displayed question numbers can know which exam questions he or she needs to be able to solve in order to pass the exam, which reduces the need to study more questions than necessary and improves the efficiency of studying for the exam.

[0070] Although the present invention has been described above using the embodiments, the technical scope of the present invention is not limited to the scope described in the above embodiments, and various modifications and changes are possible within the scope of the gist of the present invention. For example, all or part of the device can be configured by distributing or integrating functionally or physically in any unit. In addition, new embodiments resulting from any combination of multiple embodiments are also included in the embodiments of the present invention. The effect of the new embodiment resulting from the combination combines the effect of the original embodiment. [Explanation of symbols]

[0071] S Exam Question Identification System 1. Test question identification device 11 Communications Department 12 Storage section 13 Control section 131 Information Acquisition Department 132 Terminology classification section 133 Problem classification section 134 Appearance rate calculation section 135 Problem Identification Department 136 Information Output Section 2. Exam-taker's terminal 3. Administrator terminal U Candidate

Claims

1. The computer executes Obtaining a plurality of test questions that were asked in a test within a predetermined period of time in the past; a step of assigning a term importance rank to a predetermined technical term contained in each of the plurality of test questions; classifying the test questions into a plurality of question importance ranks by assigning a question importance rank to each of the test questions based on the term importance ranks assigned to the technical terms; calculating an appearance rate, which is a ratio of the number of the test questions for each of the classified question importance ranks to the total number of the test questions, for each of the plurality of question importance ranks; a step of accumulating the occurrence rates corresponding to the respective problem importance ranks in descending order of the problem importance rank, starting from the occurrence rate corresponding to the highest problem importance rank, to calculate an accumulated value; a step of identifying the question importance rank corresponding to the appearance rate accumulated immediately before the time point when the accumulated value exceeds a reference value corresponding to a correct answer rate necessary for passing the test; outputting information for identifying the plurality of test questions corresponding to the highest question importance rank through the identified question importance rank; A method for identifying test questions.

2. The method further includes a step of acquiring term information including a plurality of the technical terms, the step being executed before the step of assigning the term importance rank; In the step of assigning the term importance rank, the term importance rank is assigned to the technical term included in the term information among a plurality of terms included in the plurality of test questions.

2. The method of claim 1.

3. The step of assigning a term importance rank includes: Identifying one or more portions of a question, a correct answer option, or an incorrect answer option in the plurality of test questions that include the technical term; a step of adding up reference points determined for each of the one or more identified portions to give the technical term a total point; a step of assigning a term importance rank to each of the plurality of technical terms such that the greater the total point, the higher the rank of the term importance; having 3. The method of claim 1 or 2.

4. The step of assigning the term importance rank to the technical term comprises: A step of calculating a number of unranked terms, which is the number of technical terms to which the term importance rank has not been assigned, by subtracting a total number of technical terms to which the term importance rank has been assigned from a total number of the plurality of technical terms; a step of dividing the number of unranked terms by a remaining number of ranks obtained by subtracting the number of the term importance ranks assigned to the technical terms from the total number of the term importance ranks to calculate a distribution number for distributing the technical terms to one of the term importance ranks; a step of accumulating the number of technical terms corresponding to each of the points of the technical terms to which the term importance rank has not been assigned, in order from the smallest point, to calculate a term number accumulation value; Identifying the point that corresponds to the number of technical terms that is accumulated immediately before the time point when the accumulated value of the number of terms exceeds the distribution number and is subsequent to the time point when the accumulated value of the number of technical terms exceeds the distribution number; a step of assigning the lowest term importance rank among the term importance ranks not assigned to other technical terms to the technical terms corresponding to the minimum point to the specified point among the technical terms to which the term importance rank has not been assigned; 4. The method of claim 3, further comprising:

5. The step of classifying includes a step of assigning to the plurality of test questions the question importance rank corresponding to the lowest term importance rank among the term importance ranks of the plurality of technical terms included in each of the plurality of test questions. A method for identifying test questions according to any one of claims 1 to 4.

6. The method further includes a step of acquiring the reference value input by a user, the step being performed before the step of identifying the problem importance rank. A method for identifying test questions according to any one of claims 1 to 5.

7. On the computer, Obtaining a plurality of test questions that were asked in a test within a predetermined period of time in the past; a step of assigning a term importance rank to a predetermined technical term contained in each of the plurality of test questions; classifying the test questions into a plurality of question importance ranks by assigning a question importance rank to each of the test questions based on the term importance rank of the assigned technical term; calculating an appearance rate, which is a ratio of the number of the test questions for each of the classified question importance ranks to the total number of the test questions, for each of the plurality of question importance ranks; a step of accumulating the occurrence rates corresponding to the respective problem importance ranks in descending order of the problem importance rank, starting from the occurrence rate corresponding to the highest problem importance rank, to calculate an accumulated value; a step of identifying the question importance rank corresponding to the appearance rate accumulated immediately before the time point when the accumulated value exceeds a reference value corresponding to a correct answer rate necessary for passing the test; outputting information for identifying the plurality of test questions corresponding to the highest question importance rank through the identified question importance rank; A program for executing.

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