Method and device for diagnosing the condition of an object to be inspected, and condition diagnosis system

JP7664729B2Active Publication Date: 2025-04-18FUJITA CO LTD +1
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Patent Information

Application Number
JP2021054061
Authority / Receiving Office
JP · JP
Patent Type
Patents
Current Assignee / Owner
Filing Date
2021-03-26
Publication Date
2025-04-18
Estimated Expiration
2041-03-26

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Abstract

To provide a state diagnosis method and device and a state diagnosis system with which it is possible to generate evaluation information regarding the horizontal surface state of an inspection object efficiently with good accuracy.SOLUTION: A state diagnosis device 100 for diagnosing the state of an inspection object 10 comprises: a wheel part 104 capable of moving the device body on the inspection object surface of the inspection object 10; an entire position detection part 200 provided to a frame, for detecting at least two external indices 21-24 so as to detect the entire position of a frame 101; a diagnosis unit 400 including a detection part for detecting the state of the inspection object 10 at the entire position of the frame 101; and a computer 500 including a data processing part that generates diagnosis information of the inspection object surface associating the entire position of the frame 101 with the detection signal by the detection unit.SELECTED DRAWING: Figure 1
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Citation Information

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