Shallow inclined plate sedimentation device and particle collection method

The shallow inclined plate sedimentation device with biaxial inclination and a baffle plate addresses the inefficiencies of existing technologies in collecting large particles at high temperatures by reducing thermal stress impact and preventing direct flushing, resulting in improved particle collection efficiency in steelmaking processes.

JP7682961B2Active Publication Date: 2025-05-26シーイーアールアイ エンバイロメント プロテクション テクノロジー カンパニーリミテッド +1
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Patent Information

Application Number
JP2023141255
Authority / Receiving Office
JP · JP
Patent Type
Patents
Current Assignee / Owner
Priority Date
2022-11-16
Filing Date
2023-08-31
Publication Date
2025-05-26
Estimated Expiration
2043-08-31

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Abstract

To provide a shallow inclined plate settlement apparatus and a particle trapping method, each enabling to be applied efficiently and simply to intermittent conversion of the high-middle-low temperature and the high-middle-low flow rate and each enabling trapping of targe particles at a dry-type centimeter-millimeter level.SOLUTION: An apparatus includes a plurality of settling layers 21 each including a plurality of shallow settling units 211. Each shallow settling unit includes an inclined plate group which includes a bottom inclined plate and a plurality of upper inclined plates disposed in parallel at intervals. Fume settling channels are formed between the adjacent upper inclined plates, and between the bottom inclined plate and the upper inclined plate adjacent thereto. A side of the inclined plate group located at an entrance 101 of the fume settling channel is inclined downward to make the trapped particles flow downward. The bottom inclined plate and each upper inclined plate are arched bent plates that arch upward. A vault folded line at the top of the arched bent plate is arranged along a fume flow direction. A baffle plate is disposed on a side of the inclined plate group located at an exit of the fume settling channel.SELECTED DRAWING: Figure 1
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Citation Information

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