Voltage measurement system

JP7692749B2Active Publication Date: 2025-06-16HIOKI DENKI KK
10 Cites -1 Cited by

Patent Information

Application Number
JP2021111397
Authority / Receiving Office
JP · JP
Patent Type
Patents
Current Assignee / Owner
Filing Date
2021-07-05
Publication Date
2025-06-16
Estimated Expiration
2041-07-05

AI Technical Summary

Technical Problem

Existing voltage measurement systems struggle with accurate and safe measurement of high voltages exceeding the maximum rated input voltage, particularly in systems with solar panels exceeding 1000V DC, due to attenuation rate issues and risks of electric shock.

Method used

A voltage measurement system featuring a measurement probe with first and second resistor elements connected in series between positive and negative probes, and a third resistor element connected between them, allowing for safe and accurate measurement by attenuating the voltage without requiring a ground connection.

Benefits of technology

The system enables safe and highly accurate voltage measurement for high voltages exceeding the maximum rated input voltage, reducing measurement errors and eliminating the risk of electric shock, while also allowing for rapid and legible measurement results.

✦ Generated by Eureka AI based on patent content.
Patent Text Reader

Abstract

To provide a voltage measurement system capable of performing safe and precise measurement.SOLUTION: A voltage measurement system 1 includes: a measurement probe 3 that comprises a positive side probe and a negative side probe; and a voltage measuring device 5 for measuring voltage of a measurement object. The measurement probe 3 has a first resistive element R1 and a second resistive element R2 that are connected in series between the positive side probe and the negative side probe and have equal characteristics. A third resistive element (r) having characteristics differing from those of the first resistive element R1 and the second resistive element R2 is connected between the first resistive element R1 and the second resistive element R2. A connection point 11 between the third resistive element (r) and the positive side probe is connected to an internal impedance r' via a positive electrode terminal 15 of the voltage measuring device 5, and a connection point 13 between the third resistive element and the negative side probe is connected to the internal impedance r' via a negative electrode terminal 17 of the voltage measuring device 5.SELECTED DRAWING: Figure 1
Need to check novelty before this filing date? Find Prior Art

Citation Information

Patent Citations

  • Partial pressure pro - tube

    JP1985082270U

  • JP1988141464U

  • JP1992094574U

  • High voltage probe

    JP1996086808A

  • Portable high voltage measuring apparatus

    JP1997251035A