Radiation thermometer, temperature measurement method and temperature measurement program

JP7785539B2Active Publication Date: 2025-12-15HORIBA LTD
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Patent Information

Application Number
JP2021553573
Authority / Receiving Office
JP · JP
Patent Type
Patents
Current Assignee / Owner
Priority Date
2020-04-10
Filing Date
2020-10-23
Publication Date
2025-12-15
Estimated Expiration
2040-10-23
Patent Text Reader

Abstract

The present invention is equipped with two infrared ray detection units 1, 1' which each have a prescribed measurement field of view and detect the quantity of infrared rays which are incident from said measurement field of view, and also equipped with a temperature calculation unit 2 for calculating the temperature of the measurement target region Xa on the basis of the infrared ray quantity detected by each of the infrared ray detection units 1, 1'. Therein, the measurement target region Xa enters the measurement field of view of each of the infrared ray detection units 1, 1', and the size of each measurement field of view with the measurement target region Xa as a reference is set so as to differ from one another.
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