Dynamic light scattering measurement device, dynamic light scattering measurement analysis method, and measurement program
JP7789311B2Active Publication Date: 2025-12-22WASEDA UNIV
Patent Information
- Application Number
- JP2022002138
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- Priority Date
- 2021-06-01
- Filing Date
- 2022-01-11
- Publication Date
- 2025-12-22
- Estimated Expiration
- 2042-01-11
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Abstract
To provide a dynamic light scattering measurement device for molecularly selectively measuring the particle diameter / particle diameter distribution of particles in a liquid sample by using a dynamic light scattering method, its measurement analysis method and its measurement program.SOLUTION: According to the present invention, a device for measuring a particle diameter / particle diameter distribution of particles in a liquid sample having particles (angular frequency: ωv of molecules constituting a particle) of particles by a dynamic light scattering method includes a light source part for issuing a first pulse laser beam (angular frequency: ω1) and a second pulse laser beam (angular frequency: ω2, ω1>ω2, ω1-ω2=ωv) synchronizing the first pulse laser beam to the liquid sample, and irradiating them to the liquid sample, wherein either of the first and second pulse laser beams is a monochromatic pulse laser beam, a separation device for extracting a CARS photon / CSRS photon, a photon detection device for detecting the photon to generate an electric pulse, and an information processing device for performing processing by using the electric pulse. The information processing device includes a time correlation function operation processing part for operating a time correlation function, and a particle diameter operation part for operating a particle diameter / particle diameter distribution of particles.SELECTED DRAWING: Figure 1
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Citation Information
Patent Citations
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