Optoelectronic structural elements, semiconductor structures and methods relating thereto
By employing controlled dopant application and diffusion processes with patterned masks, the method addresses efficiency degradation in quantum well intermixing, enhancing both low- and high-current performance and extending the lifespan of optoelectronic components.
Patent Information
- Application Number
- JP2024204199
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- Priority Date
- 2020-01-29
- Filing Date
- 2024-11-22
- Publication Date
- 2025-12-22
- Estimated Expiration
- 2040-03-26
AI Technical Summary
Optoelectronic components with quantum well intermixing experience significant degradation and efficiency loss at low current intensities due to impurity diffusion, particularly in high load current densities, limiting their performance and lifespan.
A method involving controlled dopant application and diffusion processes, including a patterned mask to protect active layers, followed by precise temperature and precursor use, forms barriers to impurity penetration and quantum well intermixing, optimizing the process window for improved aging resistance and efficiency.
The method enhances low- and high-current efficiency by reducing non-radiative recombination and extending the lifespan of optoelectronic components through controlled quantum well intermixing and barrier formation, maintaining performance over time.
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Abstract
Citation Information
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