Method for simultaneously cutting multiple discs from a workpiece

JP7797541B2Active Publication Date: 2026-01-13SILTRONIC AG
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Patent Information

Application Number
JP2023573645
Authority / Receiving Office
JP · JP
Patent Type
Patents
Current Assignee / Owner
Priority Date
2021-05-31
Filing Date
2022-05-19
Publication Date
2026-01-13
Estimated Expiration
2042-05-19

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Abstract

A method for sawing a semiconductor wafer. The method includes sawing a semiconductor ingot into workpieces and using a wire grid with fixed abrasive wires to move the workpiece toward the wire grid to saw the workpiece into slices. When the workpiece first contacts the wire grid, the initial cutting speed is less than 2 mm / min, the coolant flow is less than 0.1 l / h, and the wire speed is greater than 20 m / s. The workpiece is then guided through the wire grid until a first cutting depth is reached, and then the coolant flow is increased to at least 2000 l / h. The cutting speed is reduced to less than 70% of the initial cutting speed between when the workpiece first contacts the wire grid and when the cutting depth is half the diameter of a cylinder, and then increased.
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Citation Information

Patent Citations

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    JP2009283897A

  • Method and apparatus for recovering used liquid coolant

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  • Apparatus and method for concurrently slicing numerous slices from workpiece

    JP2013163260A