Semiconductor equipment

Abstract

To provide a semiconductor device in which the breakdown voltage can be increased and the on resistance can also be reduced.SOLUTION: A semiconductor device 1 includes a first semiconductor region 2 of a first conductivity type, a second semiconductor region 21 of a second conductivity type provided on the first semiconductor region, a third semiconductor region 22 of the first conductivity type provided on the second semiconductor region, a first main electrode 11 penetrating the second semiconductor region from the third semiconductor region and provided on the second semiconductor region through a first insulating film 4 in a first groove 3 reaching the first semiconductor region, and a plurality of field electrodes 14 provided through a second insulating film 41 in a second groove 31 reaching the first semiconductor region deeper than the first groove. In a view from above, the first main electrode is disposed between the field electrodes, the field electrodes are disposed alternately, and the field electrodes that are adjacent to each other alternately are disposed so as to overlap partially in a view from a direction where the field electrodes are arranged.SELECTED DRAWING: Figure 1

Description

Technical Field

[0001] The present invention relates to a semiconductor device.

Background Art

[0002] There is known a semiconductor device in which, when viewed planar from above, field electrodes for increasing the channel portion by arranging gate electrode patterns to intersect for improving the on-resistance and improving the breakdown voltage of semiconductor elements so as to sandwich the gate electrode patterns are formed in dots. Further, there is known a method of facilitating pinch-off by providing a region having an impurity concentration lower than that of the body region at the intersection of gate electrode patterns sandwiched by field electrodes or devising the planar shape of the field electrodes when viewed from above.

Prior Art Documents

Patent Documents

[0003]

Patent Document 1

Patent Document 2

Summary of the Invention

Problems to be Solved by the Invention

[0004] However, when a region having an impurity concentration lower than that of the body region is formed at the intersection of gate electrode patterns as shown in Patent Document 1 above, the channel resistance increases and the on-resistance rises. Further, in the case of field electrodes having a complicated shape as shown in Patent Document 2 above, variations in characteristics due to manufacturing variations during the formation of the field electrodes become large.

[0005] In view of the above problems, an object of the present invention is to provide a semiconductor device capable of achieving a higher breakdown voltage and further reducing the on-resistance.

Means for Solving the Problems

[0006] According to one aspect of the present invention, the semiconductor device comprises a first semiconductor region of a first conductivity type, a second semiconductor region of a second conductivity type provided on the first semiconductor region, a third semiconductor region of a first conductivity type provided on the second semiconductor region, a first main electrode provided on the second semiconductor region via a first insulating film in a first groove that penetrates from the third semiconductor region through the second semiconductor region and reaches the first semiconductor region, and a plurality of field electrodes provided via a second insulating film in a second groove that reaches the first semiconductor region more deeply than the first groove. Viewed from above, the first main electrode is arranged between the field electrodes, the field electrodes are arranged alternately, and adjacent field electrodes arranged alternately are arranged such that a portion of them overlaps when viewed from the direction of the alignment of the field electrodes. Viewed from above, the second groove and the field electrode have a roughly cross-shaped structure including an intersection, and the first groove has corners facing the roughly cross-shaped structure. [Effects of the Invention]

[0007] According to the present invention, a semiconductor device can be provided that can withstand high voltage and has reduced on-resistance. [Brief explanation of the drawing]

[0008] [Figure 1] This is a schematic cross-sectional view showing the structure of a semiconductor device according to the first embodiment. [Figure 2] This is a plan view of a semiconductor device according to the first embodiment. [Figure 3] This is a schematic cross-sectional view showing a semiconductor device according to a modified example of the first embodiment. [Figure 4] This is a plan view of a semiconductor device according to the second embodiment. [Figure 5] This is a plan view of a semiconductor device according to the third embodiment. [Figure 6] This is a plan view showing the arrangement of gate electrodes on a substrate of semiconductor devices according to the first to third embodiments. [Modes for carrying out the invention]

[0009] Next, embodiments of the present invention will be described with reference to the drawings. In the following drawings, identical or similar parts are denoted by the same or similar reference numerals. However, it should be noted that the drawings are schematic, and the relationship between thickness and planar dimensions, the ratio of lengths of each part, etc., may differ from reality. Therefore, specific dimensions should be determined by referring to the following explanation. Furthermore, it should be noted that there are parts where the relationships and ratios of dimensions differ between drawings.

[0010] Furthermore, the embodiments shown below illustrate devices and methods for realizing the technical idea of ​​this invention, and the technical idea of ​​this invention is not limited to the shapes, structures, arrangements, etc., of the components described below. Various modifications can be made to the embodiments of this invention within the scope of the claims.

[0011] (First embodiment) Figure 1 is a schematic cross-sectional view of a semiconductor device 1 according to the first embodiment of the present invention. Figure 2 is a plan view of Figure 1. Note that Figure 1 is a cross-sectional view taken along the line X1-X1 in Figure 2. In the following description, we will use the XYZ coordinate system, which is an example of a Cartesian coordinate system. That is, the plane parallel to the surface of the substrate constituting the semiconductor device 1 is defined as the XY plane, and the direction perpendicular to the XY plane is defined as the Z direction. The X and Y axes are two orthogonal directions within the XY plane.

[0012] As shown in Figure 1, the semiconductor device 1 according to the first embodiment includes a drift region 2 which is an example of a first semiconductor region of a first conductivity type, a body region 21 which is an example of a second semiconductor region of a second conductivity type different from the first conductivity type, and a source region 22 which is an example of a third semiconductor region of a first conductivity type.

[0013] The semiconductor device 1 further includes a gate electrode 11, which is an example of a first main electrode provided in the first groove 3, and a plurality of field electrodes 14 provided in the second groove 31. The semiconductor device 1 may further include a drain region 23, which is an example of a fourth semiconductor region of the first conductivity type, a source electrode 12, which is an example of a second main electrode, a drain electrode 13, which is an example of a third main electrode, a gate insulating film 4, which is an example of a first insulating film, a field insulating film 41, which is an example of a second insulating film, a gate wiring 5, which is an example of a first conductor, a source wiring 51, which is an example of a second conductor, a drain wiring 52, which is an example of a third conductor, and an interlayer insulating film 50.

[0014] The first conductivity type and the second conductivity type are opposite conductivity types. That is, if the first conductivity type is n-type, the second conductivity type is p-type, and if the first conductivity type is p-type, the second conductivity type is n-type. Hereinafter, the case where the first conductivity type is n-type and the second conductivity type is p-type will be described.

[0015] The semiconductor device 1 includes a semiconductor substrate having a drift region 2, a body region 21, a source region 22, and a drain region 23.

[0016] The first main surface 2a of the semiconductor substrate is the upper surface in contact with the source region 22. The second main surface 2b of the semiconductor substrate is the lower surface in contact with the drain region 23.

[0017] The drift region 2 is provided between the body region 21 and the drain region 23.

[0018] The body region 21 is provided on the drift region 2 on the first main surface 2a side.

[0019] The source region 22 is provided on the body region 21.

[0020] The first groove 3 penetrates the body region 21 from the source region 22 and reaches the drift region 2.

[0021] The gate insulating film 4 is formed in the first groove 3.

[0022] The gate electrode 11 is provided on the body region 21 via a gate insulating film 4 within the first groove 3.

[0023] The second groove 31 penetrates the body region 21 from the source region 22 and reaches the drift region 2. The depth of the second groove 31 (position of the bottom of the second groove 31) D2 is deeper than the depth of the first groove 3 (position of the bottom of the first groove 3) D1.

[0024] The field insulating film 41 is formed within the second groove 31. The field insulating film 41 on the side surface of the second groove 31 has approximately the same thickness at the same depth, so that the shape of the second groove 31 and the field electrode 14 are approximately the same. The field insulating film 41 may be thicker than, for example, the gate insulating film 4.

[0025] The field electrode 14 is provided in the second groove 31 via a field insulating film 41.

[0026] The drain region 23 is located on the drift region 2 on the second main surface 2b side.

[0027] The source electrode 12 is provided in electrical contact with the source region 22 and the body region 21. Specifically, as shown in Figure 1, the source electrode 12 may be provided, for example, by penetrating the source region 22.

[0028] The drain electrode 13 is provided on the drain region 23.

[0029] The gate wiring 5 is provided on the semiconductor substrate on the first main surface 2a side.

[0030] The source wiring 51 is provided on the semiconductor substrate on the first main surface 2a side.

[0031] The drain wiring 52 is provided on the semiconductor substrate on the second main surface 2b side.

[0032] The interlayer insulating film 50 is provided, for example, to cover the source region 22, the gate electrode 11, and the field electrode 14.

[0033] As shown in Figure 2, when viewed from above, the gate electrode 11 is positioned between the field electrodes 14.

[0034] The first groove 3, when viewed from above, splits into two branches in the Y direction just before it meets the second groove 31, forming a roughly T-shaped structure. Also, when viewed from above, one roughly T-shaped structure F1 and the other roughly T-shaped structure F2, which is facing the opposite direction to the first roughly T-shaped structure F1, are provided at both ends of the second groove 31 in the Y direction, and the roughly T-shaped structures F1 and F2 between adjacent second grooves 31 in the Y direction are alternately connected in the X direction.

[0035] The second grooves 31 are arranged alternately when viewed from above. The field electrodes 14 are also arranged alternately when viewed from above. Specifically, as shown in Figure 2, the field electrodes 14 are arranged alternately, for example, in the X and Y directions.

[0036] The field electrodes 14 are arranged such that, when viewed from above, adjacent field electrodes 14 are staggered and partially overlap each other when viewed in the direction of the alignment of the field electrodes 14 (in this case, the Y direction). Specifically, the extension of the first end (the widest part in the X direction) E1 of the field electrode 14 in the Y direction is arranged such that, for example, a portion E2 overlaps (collides) with an adjacent field electrode. That is, in the Y direction, the field electrodes 14 are arranged to partially overlap with adjacent field electrodes 14 via the gate electrode 11.

[0037] The field electrode 14 has a roughly rectangular structure when viewed from above.

[0038] As shown in Figure 1, the gate electrode 11 is electrically connected to the gate wiring 5.

[0039] The source electrode 12 is electrically connected to the source region 22 and the body region 21. The source electrode 12 is also electrically connected to the source wiring 51.

[0040] The drain electrode 13 is electrically connected to the drain region 23. The drain electrode 13 is also electrically connected to the drain wiring 52.

[0041] Although not shown in the diagram, the field electrode 14 may be electrically connected to the source wiring 51. In other words, the source region 22 and the field electrode may be electrically short-circuited.

[0042] As explained above, in the semiconductor device shown in Figures 1 and 2, a trench MOS cell having a first groove between the field electrodes is provided when viewed from above, the field electrodes 14 are arranged alternately, and adjacent field electrodes 14 are arranged so that a portion of them overlap when viewed from the direction of the alignment of the field electrodes 14. This allows the depletion layer in the semiconductor region between the field electrodes 14 to be wider, thereby improving the breakdown voltage.

[0043] Furthermore, in the semiconductor device shown in Figures 1 and 2, a trench MOS cell is provided with a first groove between the field electrodes 14 when viewed from above. The field electrodes are arranged alternately, and the first groove 3 intersects with the second groove 31 in the Y direction, forming approximately T-shaped structural portions F1 and F2. The bases of the approximately T-shaped structural portions F1 and F2 of the first groove 3 face each other. When viewed from above, in order to make the distance between the first groove 3 and the second groove 31 as equal as possible, the side surface of the first groove 3 has a layout that is approximately similar to the side surface of the second groove 31. In addition, adjacent field electrodes 14 connected via the gate electrode 11 are arranged so that a portion of them overlap when viewed from the direction of the alignment of the field electrodes 14. As a result, the depletion layer in the region between the field electrodes is wider, and the breakdown voltage can be further improved.

[0044] Furthermore, in the semiconductor device shown in Figures 1 and 2, by arranging the field electrodes as described above, it is not necessary to improve the breakdown voltage by increasing the impurity concentration at the intersection of the first grooves, thus enabling higher breakdown voltage and reducing on-resistance.

[0045] (Modified version of the first embodiment) As shown in Figure 3, the semiconductor device 1 according to a modification of the first embodiment further includes a resistor 60 in addition to the semiconductor device 1 according to the first embodiment. That is, in the modification of the first embodiment, the field electrode 14 is electrically connected to the source wiring 51 via the resistor 60. The other configurations are the same as those of the first embodiment shown in Figure 1.

[0046] The field electrode 14 is electrically connected to the source wiring 51 via the resistor 60. In other words, the source region 22 and the field electrode 14 are connected via the resistor 60.

[0047] According to the semiconductor device shown in Figure 3, the inclusion of a resistor enables soft recovery, thereby suppressing surge voltage.

[0048] (Second embodiment) Figure 4 is a plan view of the semiconductor device 1 according to the second embodiment.

[0049] As shown in Figure 4, the field electrode 14A of the semiconductor device 1 according to the second embodiment has a substantially cross-shaped structure when viewed from above, unlike the field electrode 14 of the semiconductor device 1 according to the first embodiment which has a rectangular structure. Also, the field insulating film 41 on the side surface of the second groove 31A has substantially the same thickness at the same depth, so that the shape of the second groove 31A is also substantially cross-shaped when viewed from above. In addition, the layout of the first groove 3A and the gate electrode 11A when viewed from above is different. The other configurations are the same as in the first embodiment shown in Figure 1. Note that in the second groove 31A and the field insulating film 41 in Figure 3, the length extending in the X direction from the intersection G3 of the cross portion and the length extending in the Y direction may be the same, but either the length extending in the X direction or the length extending in the Y direction may be formed to be longer than the other length.

[0050] The field electrodes 14A are arranged alternately when viewed from above. Specifically, as shown in Figure 4, the field electrodes 14A are arranged alternately, for example, in the X and Y directions.

[0051] The field electrodes 14A are arranged such that, when viewed from above, adjacent field electrodes 14A overlap in part when viewed in the direction of the alignment of the field electrodes 14A (in this case, the Y direction). Specifically, a point E3 of a field electrode 14A (in this case, the right side of the cross portion of the field electrode 14A) is arranged so that, for example, it partially overlaps with the fourth end E4 of an adjacent field electrode 14A (in this case, the left side of the cross portion of the field electrode 14A, which is the widest part in the X direction) when viewed in the Y direction. That is, in the Y direction, the field electrodes 14A are arranged to partially overlap with adjacent field electrodes 14A via the gate electrode 11A. Furthermore, the widest part G2 of the cross portion of the field electrode 14A in the Y direction and the approximately T-shaped structure G1 of the first groove 3A are arranged to face each other. Furthermore, the intersection G3 of the cross portion of the field electrode 14A and the corner G4 of the first groove 3A that extends in the X direction and extends in the Y direction of the first groove 3A face each other. Also, in order to make the distance between the first groove 3A and the second groove 31A as equal as possible when viewed from above, the side surface of the first groove 3A is formed to be substantially similar to the side surface of the second groove 31A. Note that in Figure 4, adjacent field electrodes 14A are arranged so that they partially overlap when viewed from the Y direction, but adjacent field electrodes 14A may also be arranged so that they partially overlap when viewed from the X direction as well as the Y direction.

[0052] As explained above, in the semiconductor device shown in Figure 4, a trench MOS cell having a first groove 3A between the field electrodes 14A is provided when viewed from above, the field electrodes 14A are arranged alternately, and adjacent field electrodes 14A are arranged so that a portion of them overlap when viewed from the direction of the alignment of the field electrodes 14A. This allows the depletion layer to be wider in the region between the field electrodes 14A, thereby improving the breakdown voltage.

[0053] (Third embodiment) As shown in Figure 5, the second groove 31B and field electrode 14B of the semiconductor device 1 according to the third embodiment have a structure in which, when viewed from above, they have a portion of curvature R at the intersection of the cross portion with respect to the second groove 31A and field electrode 14A of the semiconductor device 1 according to the second embodiment. The other configurations are the same as those of the second embodiment shown in Figure 4.

[0054] The field electrodes 14B are arranged alternately when viewed from above. Specifically, as shown in Figure 5, the field electrodes 14B are arranged alternately, for example, in the X and Y directions.

[0055] The field electrodes 14B are arranged such that, when viewed from above, adjacent field electrodes 14B partially overlap each other when viewed in the direction of the alignment of the field electrodes 14B (in this case, the Y direction). Specifically, a point E5 of a field electrode 14B is arranged such that, for example, it partially overlaps with the sixth end (the point that is widest in the X direction) E6 of an adjacent field electrode 14B when viewed in the Y direction. That is, in the Y direction, the field electrodes 14B are arranged to partially overlap with adjacent field electrodes 14B via the gate electrode 11B. Note that in Figure 5, adjacent field electrodes 14B are arranged to partially overlap when viewed in the Y direction, but adjacent field electrodes 14B may also be arranged to partially overlap when viewed in the X direction as well as the Y direction.

[0056] The field electrode 14B has a structure in which a portion R of curvature is present at the intersection of the cross-shaped portion. The corner G4 of the portion of the first groove 3B extending in the X direction and the portion of the first groove 3B extending in the Y direction face each other at the curvature R of the field electrode 14B. In other words, the distance between the first groove 3B and the field electrode 14B can be narrowed.

[0057] As explained above, in the semiconductor device shown in Figure 5, a trench MOS cell having a first groove 3B between the field electrodes 14B is provided when viewed from above, and the second groove 31B and the field electrodes 14B are arranged alternately. This eliminates any areas where the distance between the first groove 3B and the field electrodes 14B widens in the T-shaped structure where the first grooves 3B intersect, thereby improving the breakdown voltage.

[0058] Furthermore, in the semiconductor device shown in Figure 5, the structure has curvature at the intersection of the cross portion of the second groove 31B and the field electrode 14B, which allows the distance between the first groove 3B and the field electrode 14B to be narrowed, thereby improving the withstand voltage.

[0059] (Other embodiments) As described above, the present invention has been described by embodiments, but the descriptions and drawings that constitute part of this disclosure should not be understood as limiting the invention. Various alternative embodiments, examples, and operational techniques will become apparent to those skilled in the art from this disclosure.

[0060] Thus, the present invention naturally includes various embodiments not described herein. Therefore, the technical scope of the present invention is defined solely by the inventive features relating to the claims that are reasonable based on the above description.

[0061] For example, as shown in Figure 6, the first grooves 3, 3A, and 3B may extend in the 0-degree or 90-degree direction relative to the orientation flat plane of the semiconductor substrate when viewed from above. Specifically, the orientation flat plane of the semiconductor substrate may be, for example, the (100) plane.

[0062] By extending the first grooves 3, 3A, and 3B in the 0-degree or 90-degree direction relative to the orientation flat surface, the increase in on-resistance of channel mobility due to surface orientation can be suppressed. Furthermore, by extending the first grooves 3, 3A, and 3B in the 0-degree or 90-degree direction relative to the orientation flat surface, differences in etching rate and differences in the thickness of the gate insulating film 4 due to the surface orientation of the semiconductor substrate can be made uniform. In other words, extending the first grooves 3 in the 0-degree or 90-degree direction relative to the orientation flat surface can suppress the surface orientation dependence of channel mobility and the gate insulating film 4. Furthermore, by extending the second grooves 31, 31A, and 31B in the 0-degree or 90-degree direction relative to the orientation flat surface, the thickness of the field insulating film 41 can be made more uniform. [Explanation of symbols]

[0063] 1… Semiconductor equipment 2…First semiconductor region, drift region 3…The first groove 4…First insulating film, gate insulating film 5…First conductor, gate wiring 11...First main electrode, gate electrode 12...Second main electrode, source electrode 13…Third main electrode, drain electrode 14…Field electrodes 21…Second semiconductor area, body area 22…Third semiconductor area, source area 23…Fourth semiconductor region, drain region 31…The second trench 41...Second insulating film, field insulating film 50…Interlayer insulating film 51…Second conductor, source wiring 52...Third conductor, drain wiring 60... Resistance 2a...first principal surface 2b…Second main surface

Claims

1. A first semiconductor region of the first conductivity type, A second semiconductor region of a second conductivity type provided on the first semiconductor region, A third semiconductor region of the first conductivity type is provided on the second semiconductor region, A first main electrode is provided on the second semiconductor region via a first insulating film in a first groove that penetrates the third semiconductor region through the second semiconductor region and reaches the first semiconductor region, A plurality of field electrodes are provided in a second groove that extends deeper than the first groove to the first semiconductor region, via a second insulating film, Equipped with, Viewed from above, the first main electrode is positioned between the field electrodes, the field electrodes are arranged alternately, and adjacent field electrodes arranged alternately are positioned such that a portion of them overlaps when viewed from the direction of the alignment of the field electrodes. Viewed from above, The second groove and the field electrode have a substantially cross-shaped structure including an intersection, The first groove has corners that face the substantially cross-shaped structure. Semiconductor equipment.

2. Viewed from above, The first groove has a substantially T-shaped structure, The base of the aforementioned roughly T-shaped structure faces the field electrodes which are adjacent to each other in an alternating pattern. The semiconductor device according to claim 1.

3. A first semiconductor region of the first conductivity type, A second semiconductor region of a second conductivity type provided on the first semiconductor region, A third semiconductor region of the first conductivity type is provided on the second semiconductor region, A first main electrode is provided on the second semiconductor region via a first insulating film in a first groove that penetrates the third semiconductor region through the second semiconductor region and reaches the first semiconductor region, A plurality of field electrodes are provided in a second groove that extends deeper than the first groove to the first semiconductor region, via a second insulating film, Equipped with, Viewed from above, the first main electrode is positioned between the field electrodes, the field electrodes are arranged alternately, and adjacent field electrodes arranged alternately are positioned such that a portion of them overlaps when viewed from the direction of the alignment of the field electrodes. Viewed from above, The second groove and the field electrode have a substantially cross-shaped structure including an intersection, and the intersection of the substantially cross-shaped structure has a curvature. Semiconductor equipment.

4. The third semiconductor region and the field electrode are electrically short-circuited. The semiconductor device according to claim 1.

5. The third semiconductor region and the field electrode are connected via a resistor. The semiconductor device according to claim 1.

6. Viewed from above, The first groove extends in the 0-degree direction or the 90-degree direction with respect to the orientation flat surface of the substrate. The corner where the portion extending in the 0-degree direction and the portion extending in the 90-degree direction connect faces the intersection of the substantially cross-shaped structure of the second groove. The semiconductor device according to claim 1.

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