Magnetic field measuring device for detecting or imaging magnetic particles

The magnetic field measuring device uses semiconductor defect centers and compensation coils to enhance magnetic particle detection sensitivity and resolution by isolating magnetization signals from transmitting coil interference, addressing existing challenges in magnetic particle detection and imaging.

JP7842241B2Active Publication Date: 2026-04-07ASELSAN ELEKTRONIK SANAYI & TICARET ANONIM SIRKETI
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Patent Information

Authority / Receiving Office
JP · JP
Patent Type
Patents
Current Assignee / Owner
Filing Date
2023-11-28
Publication Date
2026-04-07

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Abstract

The present invention relates to a magnetic field measuring device (1) for detecting or imaging magnetic nanoparticles. The magnetic field measuring device (1) includes at least one transmitting coil (2) configured to generate a first magnetic field (MF1) that substantially uniformly magnetizes magnetic particles in a sensing region (SR) of a measurement target including a plurality of magnetic particles and a zero magnetic field line (MFL) outside the sensing region (SR), at least one coil driving and control circuit (3) configured to drive the at least one transmitting coil (2), at least one semiconductor material (4) having at least one defect center (DC) capable of changing electron spins and energy states when excited by electromagnetic energy, at least one optical assembly (5) having at least one optical sensor (not shown) configured to photoexcite the defect center (DC) in the structure of the semiconductor material (4) and detect radiation generated by the defect center (DC) due to the photoexcitation, at least one microwave antenna (6) configured to excite the electron spin state of the defect center (DC) located within the semiconductor material (4), and at least one microwave driving and control circuit (7) configured to drive the microwave antenna.
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Citation Information

Patent Citations

  • Device for imaging methods based on magnetic particle imaging and related methods

    EP3378389A1

  • Magnetic particle imaging apparatus and coil arrangement method

    JP2009056232A

  • Magnetic field measuring method and magnetic field measuring device

    JP2016102777A

  • Detection device, detection method, and voltage / current detection device using the same

    JP2018136316A

  • Probe manufacturing apparatus and method

    JP2019211271A