Feature map generation device, feature map generation method, and program

JP7865130B2Active Publication Date: 2026-05-26TOPPAN HOLDINGS INC

Patent Information

Authority / Receiving Office
JP · JP
Patent Type
Patents
Current Assignee / Owner
TOPPAN HOLDINGS INC
Filing Date
2022-07-12
Publication Date
2026-05-26

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Abstract

To provide a feature map generation apparatus which generates a feature map which can be restored in a three-dimensional manner with high accuracy.SOLUTION: A feature map generation apparatus 1 includes: a kernel deformation method determination unit 100 which determines a first deformation method corresponding to a first target view image so that specific coordinates in a kernel may be converted into coordinates of a corresponding point in the first target view image, using three-dimensional coordinates, a normal direction, and a first camera parameter corresponding to the first target view image, on the first target view image included in a multi-view image; a kernel deformation unit 101 which generates a first deformed kernel for the first target view image by deforming a criterial reference kernel using the first deformation method; and a convolution operation unit 102 which extracts feature quantities in the first target view image by performing convolution operation on the first target view image using the first deformed kernel, to generate a first feature map corresponding to the first target view image using the extracted feature quantities.SELECTED DRAWING: Figure 1
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