Sample holder and charged particle beam apparatus

The sample holder's bent pipe design prevents coolant leakage during rotation, ensuring efficient and prolonged sample preservation in cryo-electron microscopy.

JP7865820B2Active Publication Date: 2026-05-26JEOL LTD
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Patent Information

Authority / Receiving Office
JP · JP
Patent Type
Patents
Current Assignee / Owner
JEOL LTD
Filing Date
2022-07-27
Publication Date
2026-05-26

AI Technical Summary

Technical Problem

Rotating a sample holder containing coolant can cause coolant to leak from the tank, posing a challenge in cryo-electron microscopy.

Method used

The sample holder design includes a pipe for coolant that is bent with a first opening facing horizontally and a second opening facing vertically upward, preventing leakage during rotation.

Benefits of technology

Prevents coolant leakage during sample holder rotation, allowing for increased coolant volume and prolonged sample preservation in a frozen state.

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Patent Text Reader

Abstract

To provide a sample holder that can prevent coolant from leaking from a tank.SOLUTION: A sample holder 100 that holds a sample S in a charged particle beam device that irradiates the sample S with a charged particle beam includes a sample holding unit 110 that holds the sample S, and a tank 140 containing a cooling liquid for cooling the sample holding unit 110, and the tank 140 has a tube 150 for pouring coolant into the tank 140, and the tube 150 is bent.SELECTED DRAWING: Figure 2
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