Electronic component testing equipment

Abstract

To provide an electronic component test device.SOLUTION: An electronic component test device includes a main body 3, a mounting table, a test unit 8, and a control unit 9, the main body 3 having a work board with the mounting table installed thereon, the mounting table having a test plate 5 detachably mounted and rotatable, a feeding unit 7 provided at a peripheral edge of the mounting table, the test unit 8 installed on the work board, the control unit 9 controlling the test unit 8 or the feeding unit 7, the main body 3 having a detection device 6 capable of detecting presence of the test plate 5 on the mounting table, and the control unit 9 controlling operation of the test unit 8 or the feeding unit 7 on the basis of a detection result of the detection device 6.SELECTED DRAWING: Figure 3

Description

Technical Field

[0001] The present invention relates to a test apparatus, and particularly to an electronic component test apparatus for testing electronic components.

Background Art

[0002] Generally, after the manufacture of electronic components, it is necessary to confirm their physical characteristics through electrical characteristic tests. For example, the electronic component test apparatus disclosed in Patent Document 1 includes an apparatus main body, a mounting board attached to the apparatus main body, a test board installed on the mounting board and capable of being driven by the apparatus main body to rotate, and test units installed on the apparatus main body and located on both upper and lower opposite sides of the mounting board and the test board. A plurality of accommodation grooves for accommodating electronic components waiting for testing are formed on the test board.

[0003] The test unit includes a lower terminal box installed below the mounting board and an upper terminal box located above the test board.

[0004] A plurality of lower terminals of the lower terminal box can contact so as to be electrically connected to the downward electrodes of the electronic components, and the upper terminal box can be driven to move downward toward the test board. A plurality of upper terminals of the upper terminal box can contact so as to be electrically connected to the upward electrodes of the electronic components, thereby performing an electrical characteristic test on the electronic components.

[0005] Before performing an electrical characteristic test with such an electronic component test apparatus, it is necessary to calibrate the downward movement distance of the upper terminal box.

[0006] The calibration method is to move the upper terminal box downward from the reference position in a situation where the test board is not installed, and when the upper terminals contact so as to be electrically connected to the lower terminals, stop the downward movement of the upper terminal box to obtain the distance between the reference position and the lower terminals.

[0007] Furthermore, the downward movement of the upper terminal box continues until the upper terminal makes contact with the lower terminal and establishes an electrical connection.

[0008] Subsequently, when performing electrical characteristic tests on electronic components, the distance they move below the upper terminal box can be precisely controlled by lowering the height of the electronic components. [Prior art documents] [Patent Documents]

[0009] [Patent Document 1] Taiwan Patent No. I821945 [Overview of the project] [Problems that the invention aims to solve]

[0010] However, during the calibration and electrical characteristics testing process, the test board is repeatedly installed and removed. This means that calibration may be performed while the test board is installed. In this case, since the test board separates the upper terminal from the lower terminal, the upper terminal cannot make electrical contact with the lower terminal. As a result, the test board is pressed down by the continuous downward movement of the upper terminal box, causing damage to the test board, the upper terminal, and other components. In view of the above, an object of the present invention is to provide an electronic component testing apparatus that can mitigate at least one drawback of the prior art. [Means for solving the problem]

[0011] The present invention comprises a main body of the apparatus, a mounting plate, a test unit, and a control unit. The main body of the apparatus is equipped with a workbench, The aforementioned mounting plate is installed on the aforementioned workbench, A test plate that can be driven and rotated is detachably mounted on the aforementioned mounting plate, and a feeding unit is installed on the periphery of the mounting plate. The test unit is installed on the workbench, The control unit can control the test unit or the feeding unit. The present invention provides an electronic component testing apparatus characterized in that the apparatus body is provided with a detection device capable of detecting the presence of the test plate on the mounting plate, and the control unit can control the operation of the test unit or the feeding unit based on the detection result of the detection device. [Effects of the Invention]

[0012] The electronic component testing apparatus of the present invention can detect whether or not a test board is placed on the mounting plate using a detection device, and the control unit determines how to control the operation of the test unit or the feeding unit based on the detection result of the detection device, thereby preventing the control unit from causing the test unit or feeding unit to perform an undesirable operation. [Brief explanation of the drawing]

[0013] [Figure 1] This is a perspective view showing the structure of an embodiment of the electronic component testing apparatus of the present invention. [Figure 2] This is a perspective view showing the structure of the above embodiment, with the feeding unit and multiple test units omitted. [Figure 3] The block diagram shows the functional structure of the above embodiment. [Figure 4] This is an exploded perspective view showing the mounting plate and test plate of the above embodiment. [Figure 5] This is a partial cross-sectional view showing that when the test unit of the above embodiment performs a calibration function, the upper terminal set moves downward and electrically connects to the lower terminal set. [Figure 6] This is a partial cross-sectional view showing that when the test unit of the above embodiment performs a test function, the upper terminal set moves downward and makes contact with the electronic components on the test board, thereby creating an electrical connection. [Figure 7]It is a partial cross-sectional view showing that when the test unit of the above embodiment executes the calibration function, the upper terminal set is adjusted and moved downward by one calibration distance and recorded. [Figure 8] It is a partial cross-sectional view showing that when the test unit of the above embodiment executes the test function, the upper terminal set is controlled to move downward by one moving distance.

Embodiments for Carrying Out the Invention

[0014] In order to more clearly explain the object, technical means, and advantages of the embodiments of the present invention, hereinafter, in combination with the accompanying drawings of the embodiments of the present invention, the technical means in the embodiments of the present invention will be clearly explained. It will be clear that the described embodiments are some embodiments of the present invention and not all embodiments. Usually, the components of the embodiments of the present invention depicted and shown in the accompanying drawings can be arranged and designed in various different arrangements. Therefore, hereinafter, the detailed description of the embodiments of the present invention provided in the accompanying drawings does not constitute any limitation to the protection scope of the present invention, but only shows the selected embodiments of the present invention.

[0015] Before explaining the present invention in more detail, it should be noted that if considered appropriate, the reference signs or the end portions of the reference signs are repeated between the figures to indicate corresponding or similar elements, and these can optionally have the same characteristics.

[0016] In the description of the present invention, terms indicating orientation and positional relationships such as "upper", "lower", "inner", "outer", "left", "right", "front", "rear", etc. are based on the orientation and positional relationships shown in the drawings or the orientation and positional relationships habitually placed when using the products of the present invention for the purpose of more simply and clearly explaining, and do not teach or suggest that the corresponding devices and devices have specific orientations, structures, operations, etc. in a specific orientation, and are not limitations to the present invention.

[0017] In the description of the present invention, terms such as "first" and "second" are used only for the purpose of distinction and do not teach or imply relative importance.

[0018] Hereinafter, the present invention will be described in detail. As shown in FIGS. 1 to 3, one embodiment of the electronic component test apparatus 200 of the present invention is for performing electrical characteristic tests on a plurality of electronic components 100 (shown in FIG. 6). The electronic components 100 include, for example, capacitors, inductors, etc., but are not limited thereto. As shown in FIG. 8, first electrodes 101 and second electrodes 102 are provided at both ends of each electronic component 100, respectively.

[0019] The electronic component test apparatus 200 is provided with a device main body 3, a mounting plate 4 installed on the device main body 3, a test board 5, a detection device 6, a feeding unit 7, a plurality of test units 8, and a control unit 9 connected to the detection device 6, the feeding unit 7, and each test unit 8 so that signals can be transmitted.

[0020] As shown in FIGS. 2 and 4, the device main body 3 has a workbench 30 installed obliquely upward, and the workbench 30 is formed with a groove 301 for fitting the detection device 6.

[0021] As shown in FIG. 4, the mounting plate 4 is installed on the workbench 30 and has a plurality of sector-shaped blocks 41 of different sizes that can be independently and removably combined with each other in an annular shape to form the mounting plate 4. And as shown in FIG. 4, the plurality of sector-shaped blocks 41 together define a transparent area 40 that can expose the workbench 30 inside them. The groove 301 is located in the transparent area 40.

[0022] As shown in Figure 4, the test plate 5 is formed in the shape of a circular sheet and is connected to a rotary drive mechanism 31 installed on the main body of the apparatus 3. It is removable and coaxially mounted above the mounting plate 4 so as to cover the perforated area 40, and can be rotated relative to the mounting plate 4 by the rotary drive mechanism 31.

[0023] The test plate 5 has multiple storage tanks 50 that penetrate vertically through it, and as shown in Figure 4, the storage tanks 50 are arranged in a ring shape with spacing between them radially.

[0024] As shown in Figure 8, each storage compartment 50 can accommodate one electronic component 100, and the electronic component 100 is housed in each storage compartment 50 such that the first electrode 101 faces downward and the second electrode 102 faces upward.

[0025] As shown in Figures 3 and 4, the detection device 6 is fitted into the recessed groove 301 and located within the perforated area 40. It is positioned below the test plate 5 when the test plate 5 is placed on the mounting plate 4, and is located in the area from the inner ring side of the test plate 5 housing groove 50 to the rotation center of the test plate 5, thereby enabling detection of the presence of the test plate 5.

[0026] The measurement device 6 includes a light-emitting unit 61 provided on the measurement device 6 that can emit light onto the bottom surface of the test plate 5, and a light-receiving unit 62 provided on the measurement device 6 that can receive reflected light from the bottom surface of the test plate 5. When the light-receiving unit 62 receives reflected light, a measurement signal is generated.

[0027] As shown in Figure 1, the feeding unit 7 is installed on the periphery of the mounting plate 4. The feeding unit 7 can be driven under the control of the control unit 9 to feed the electronic components 100 to be housed into the housing tanks 50 of the test board 5 one by one.

[0028] The method by which the loading unit 7 loads the electronic components 100 into the storage tank 50 of the test board 5 is based on existing technology and there are various methods, so a detailed explanation will be omitted.

[0029] As shown in Figures 1, 5, and 6, the test unit 8 is installed on the workbench 30 so as to be arranged along the periphery of the test plate 5, and can be controlled by the control unit 9 to perform electrical characteristic tests on the electronic components 100 installed in the storage compartments 50 of the test plate 5. Unless otherwise specified, the following explanation assumes that the test plate 5 is installed on the mounting plate 4.

[0030] Each test unit 8 is installed on the workbench 30 and includes a lower terminal set 81 fitted into the mounting plate 4 so as to be exposed from the upper surface of the mounting plate 4, an adjustment movement unit 82 installed on the workbench 30, and an upper terminal set 83 installed on the adjustment movement unit 82 and positioned above the test plate 5 so as to be spaced apart.

[0031] The lower terminal set 81 is located below the test plate 5 and is provided with a plurality of lower terminals 811 arranged along the radial direction of the test plate 5.

[0032] The upper terminal set 83 is provided with a plurality of upper terminals 831 corresponding to each of the plurality of lower terminals 811, and since the length or width of the upper terminals 831 is larger than the diameter of the housing tank 50, the upper terminals 831 cannot pass through the housing tank 50 and make contact to electrically connect to the lower terminals 811.

[0033] The adjustment and movement unit 82 is controlled by the control unit 9 and has its upper terminal 831 linked so that it can be moved up and down relative to the mounting plate 4 or test 5.

[0034] If the test plate 5 is not installed on the mounting plate 4, the upper terminal set 83, which is driven and moves downward as shown in Figure 5, makes contact such that the upper terminal 831 electrically connects to the lower terminal 811 of the lower terminal set 81.

[0035] When the test plate 5 is mounted on the mounting plate 4, and the test plate 5 is driven to rotate relative to the mounting plate 4, the radially arranged storage tanks 50 pass through the test position one set at a time, as shown in Figure 6.

[0036] When the electronic component 100 is housed in the housing tank 50, the lower terminal 811 makes contact to electrically connect to the first electrode 101 of the electronic component 100 in the housing tank 50 at the test position, and the upper terminal 831, which is driven to move to the test board 5, makes contact to electrically connect to the second electrode 102 of the electronic component 100 at the test position.

[0037] At that time, the test unit 8 performs an electrical characteristic test of the planned function on the electronic component 100 that is electrically connected via the upper terminal 831 and the lower terminal 811.

[0038] As shown in Figures 3, 7, and 8, the control unit 9 is equipped with calibration and test functions, and it controls the operation of the test unit 8 to perform the calibration and test functions.

[0039] When the calibration function is activated, the control unit 9 determines that no measurement signal is generated in the measurement device 6 and that the test board 5 is not on the mounting plate 4 based on the measurement results from the measurement device 6, it drives the adjustment movement unit 82 to drive the upper terminal 831 and move it downward, and when the upper terminal set 83 makes contact to electrically connect with the lower terminal set 81, it stops the downward movement of the upper terminal set 83, and records the distance moved downward by the movement of the upper terminal set 83 to obtain the calibration distance d1.

[0040] In this case, unless the upper terminal set 83 makes contact to electrically connect with the lower terminal set 81, the control unit 9 will drive the adjustment movement unit 82 to continue moving the upper terminal set 83 downward in conjunction with the upper terminal set 83 until the upper terminal set 83 makes contact to electrically connect with the lower terminal set 81.

[0041] Furthermore, when the calibration function is activated, the control unit 9 generates a measurement signal in the measurement device 6. If the measurement result from the measurement device 6 determines that the test board 5 is on the mounting plate 4, it does not drive the moving unit 82 to move the upper terminal set 83 downwards in conjunction with it. This prevents damage to the components caused by the upper terminal set 83 continuing to move downwards.

[0042] When the test function is activated, the control unit 9 generates a measurement signal in the measurement device 6. If the measurement result from the measurement device 6 determines that the test board 5 is on the mounting plate 4, the control unit 9 controls the adjustment movement unit 82 to calculate the movement distance d3 required to electrically connect the upper terminal set 83 to the second electrode 102 of the electronic component 100, using the planned height d2 of the electronic component 100 (the standard length of the electronic component 100) and the calibration distance d1 obtained when the calibration function was executed.

[0043] The travel distance d3 is obtained by subtracting the planned height d2 from the calibration distance d1 (d1-d2=d3). When actually performing the electrical characteristic test, the adjustment movement unit 82 can move the upper terminal set 83 downwards by a distance slightly greater than the travel distance d3, thereby ensuring that the upper terminal 831 makes contact with the electronic component 100 to make a secure electrical connection.

[0044] Furthermore, when the control unit 9 activates the test function, if it determines from the measurement results of the measurement device 6 that the test board 5 is on the mounting plate 4, it controls the rotation drive mechanism 31 to drive and rotate the test board 5, and also controls the feeding unit 7 to feed the electronic components 100 into the storage tank 50 of the test board 5.

[0045] Simultaneously, each time the test board 5 rotates to move a set of electronic components 100 to the test position, the control unit 9 controls the adjustment movement unit 82 to move the upper terminal set 83 downward by at least a distance d3, so that each upper terminal 831 of the upper terminal set 83 makes contact with each electronic component 100 at the test position to make an electrical connection, thereby allowing the test unit 8 to perform an electrical characteristic test on the electronic components 100 at the test position.

[0046] After the electrical characteristics test is completed, the control unit 9 controls the adjustment movement unit 82 to move the upper terminal set 83 upward to its original position, and also controls the rotation drive mechanism 31 to drive the test plate 5 to move the next set of electronic components 100 to the test position for electrical characteristics testing of the electronic components 100.

[0047] Conversely, when the control unit 9 activates the test function, if no measurement signal is generated at the measurement device 6, and the measurement result from the measurement device 6 determines that the test board 5 is not on the mounting plate 4, the control unit 9 will not drive the feeding unit 7. For example, it will not drive the feeding unit 7 to feed the electronic components 100 onto the test board 5, nor will it control the adjustment movement unit 82 to move the upper terminal set 83 downwards in conjunction with it.

[0048] According to the above configuration, the inspection device 6 can detect whether or not the test board 5 is installed on the mounting plate 4, and the control unit 9 determines how to control the operation of the test unit 8 or the feeding unit 7 based on the inspection result of the inspection device 6. Therefore, when the test board 5 is installed on the mounting plate 4, the calibration function is not executed to prevent damage to the components of the present invention, or when the test board 5 is not installed on the mounting plate 4, the test function is not executed, that is, the feeding unit 7 is not driven to feed the electronic components 100 onto the test board 5, thereby preventing the electronic components 100 from scattering.

[0049] Therefore, the electronic component testing apparatus 200 of the present invention is a novel invention and can reliably achieve the objectives of the present invention.

[0050] The above embodiments are illustrative in illustrating the principles and effects of the present invention and do not limit it. A person skilled in the art can make some modifications and alterations to the above embodiments, provided that they do not deviate from the spirit and scope of the invention. Therefore, all modifications and alterations made by a person skilled in the art, provided that they do not deviate from the spirit of the invention, should also be considered to fall within the scope of protection of the present invention.

[0051] The electronic component testing apparatus of the present invention is suitable for testing electronic components. The following are some embodiments (configurations) of the present invention. [Aspect 1] The device consists of a main unit, a mounting plate, a test unit, and a control unit. The main body of the apparatus is equipped with a workbench, The aforementioned mounting plate is installed on the aforementioned workbench, A test plate that can be driven and rotated is detachably mounted on the aforementioned mounting plate, and a feeding unit is installed on the periphery of the mounting plate. The test unit is installed on the workbench, The control unit can control the test unit or the feeding unit. The electronic component testing apparatus is characterized in that the apparatus body is provided with a detection device capable of detecting the presence of the test plate on the mounting plate, and the control unit can control the operation of the test unit or the feeding unit based on the detection result of the detection device. [Aspect 2] The electronic component testing apparatus according to embodiment 1, characterized in that the inspection device is installed on the workbench so as to be located below the test board. [Aspect 3] The aforementioned mounting plate has a plurality of fan-shaped blocks of different sizes that can be independently and detachably combined with each other to constitute the mounting plate. The aforementioned multiple fan-shaped blocks define a perforated area that allows the workbench to be exposed. The test plate is installed so as to cover the perforated area. The electronic component testing apparatus according to embodiment 1, characterized in that the inspection device is located within the watermark area. [Aspect 4] The electronic component testing apparatus according to embodiment 1, characterized in that the inspection device comprises a light-emitting unit provided on the inspection device and capable of emitting light onto the test plate, and a light-receiving unit provided on the inspection device and capable of receiving reflected light from the test plate. [Aspect 5] The electronic component testing apparatus according to embodiment 4, characterized in that the light-emitting unit emits light toward the bottom surface of the test plate, and the light-receiving unit receives reflected light from the bottom surface of the test plate. [Aspect 6] The test unit has an upper terminal set and a lower terminal set, The electronic component testing apparatus according to embodiment 1, characterized in that the control unit drives the upper terminal set to contact the lower terminal set when the measurement result from the measurement device indicates that the test board is not present. [Aspect 7] The test unit has an upper terminal set and a lower terminal set, The electronic component testing apparatus according to embodiment 1, characterized in that the control unit does not drive the upper terminal set to contact the lower terminal set when the measurement result from the measurement device indicates that the test board is present. [Aspect 8] The electronic component testing apparatus according to embodiment 1, characterized in that the control unit drives the feeding unit to feed an electronic component onto the test board when the measurement result from the measurement device indicates that the test board is present. [Aspect 9] The electronic component testing apparatus according to embodiment 1, characterized in that the control unit does not drive the feeding unit to feed electronic components onto the test board when the measurement result from the measurement device indicates that the test board is not present. [Aspect 10] The aforementioned test plate has multiple storage compartments formed therein. The aforementioned storage tanks are arranged in a manner that creates multiple annular structures with gaps between them along the radial direction. The electronic component testing apparatus according to embodiment 1, characterized in that the inspection device is located in the area between the inner ring of the housing chamber of the test plate and the rotation center of the test plate. [Explanation of symbols]

[0052] 100 Electronic Components 101 First electrode 102 Second electrode 200 Electronic component testing equipment 3. Main unit of the device 30 workbenches 301 Concave tank 31 Rotary drive mechanism 4 Mounting plate 40 Watermark Area 41 blocks 5 Test board 50 storage tanks 6. Measurement Devices 61 Lighting Unit 62 Light receiving part 7. Feed Unit 8 test units 81 Lower terminal set 811 Bottom terminal 82 Adjustment and Transfer Unit 83 Upper terminal set 831 Upper terminal 9 Control Unit d1 Calibration distance d3 distance traveled d2 Planned height

Claims

1. The device consists of a main unit, a mounting plate, a test unit, and a control unit. The main body of the apparatus is equipped with a workbench, The aforementioned mounting plate is installed on the aforementioned workbench, A test plate that can be driven and rotated is detachably mounted on the aforementioned mounting plate, and a feeding unit is installed on the periphery of the mounting plate. The test unit is installed on the workbench, The control unit can control the test unit or the feeding unit. The apparatus body is equipped with a detection device capable of detecting the presence of the test plate on the mounting plate, and the control unit can control the operation of the test unit or the feeding unit based on the detection result of the detection device. The aforementioned mounting plate defines a perforated area that allows the workbench to be exposed, The test plate is installed so as to cover the perforated area. The aforementioned inspection device is located within the watermark area, An electronic component testing apparatus characterized by the following features.

2. The electronic component testing apparatus according to claim 1, characterized in that the inspection device is installed on the workbench so as to be located below the test board.

3. The aforementioned mounting plate has a plurality of fan-shaped blocks of different sizes that can be independently and detachably combined with each other to constitute the mounting plate. The electronic component testing apparatus according to claim 1, characterized in that the plurality of fan-shaped blocks define the perforated area.

4. The electronic component testing apparatus according to claim 1, characterized in that the inspection device comprises a light-emitting unit provided on the inspection device and capable of emitting light onto the test plate, and a light-receiving unit provided on the inspection device and capable of receiving reflected light from the test plate.

5. The electronic component testing apparatus according to claim 4, characterized in that the light-emitting unit emits light onto the bottom surface of the test plate, and the light-receiving unit receives reflected light from the bottom surface of the test plate.

6. The test unit has an upper terminal set and a lower terminal set, The electronic component testing apparatus according to claim 1, characterized in that the control unit drives the upper terminal set to contact the lower terminal set when the measurement result from the measurement device indicates that the test board is not present.

7. The test unit has an upper terminal set and a lower terminal set, The electronic component testing apparatus according to claim 1, characterized in that the control unit does not drive the upper terminal set to contact the lower terminal set when the measurement result from the measurement device indicates that the test board is present.

8. The electronic component testing apparatus according to claim 1, characterized in that the control unit drives the feeding unit to feed electronic components onto the test board when the measurement result from the measurement device indicates that the test board is present.

9. The electronic component testing apparatus according to claim 1, characterized in that the control unit does not drive the feeding unit to feed electronic components onto the test board when the measurement result by the measurement device indicates that the test board is not present.

10. The aforementioned test plate has multiple storage compartments formed therein. The aforementioned storage tanks are arranged in a manner that creates multiple annular structures with gaps between them along the radial direction. The electronic component testing apparatus according to claim 1, characterized in that the inspection device is located in the area between the inner ring of the housing chamber of the test plate and the rotation center of the test plate.

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