Material identification device and method

Abstract

The aim is to be able to determine the colour and / or other properties besides the NIR spectrum of objects in the stream. The invention relates to an apparatus (100) for classification of an object (102), comprising a scanning element configured to redirect at least one illumination beam and to shift a plurality of inspection zones and illuminated areas in a first direction relative to the object, a processing circuit configured to perform a second zone collection function configured to collect second zone data related to optical radiation emitted by the object in the second inspection zone, a third zone collection function configured to collect third zone data related to optical radiation emitted by the object in the third inspection zone, and a classification function configured to classify the object based on the second zone data and the third zone data.

Description

Technical Field

[0001] The present invention relates to an apparatus for detecting an object, and more particularly to such an apparatus comprising a spectroscopic system for detecting and analyzing a light-responsive event from the object.

Background Art

[0002] Throughout a wide range of industries, the identification, detection, classification, and sorting of various objects are frequently required and desired.

[0003] In its simplest form, manual identification of an object by a person can be advantageously employed when a limited number of objects are to be identified, classified, and sorted. In that case, a person can identify and classify the relevant objects based on his / her knowledge. However, this type of manual identification is monotonous and prone to errors. Also, the level of experience of the operator will significantly affect the result of the work performed by that operator. Furthermore, the above types of manual identification have the drawback of slow identification speed.

[0004] Therefore, in industry, the identification, classification, and sorting of large quantities of objects are often performed by machines, and those large quantities of objects are supplied in the form of a continuous stream of objects. Such machines are generally faster than operators and can operate for longer periods of time, thus providing an enhancement of the overall throughput. This type of machine is used, for example, in agriculture for fruits and vegetables, and in recycling for identifying and sorting objects and materials to be recycled.

[0005] The above types of machines generally have some form of sensor arrangement used to identify objects of interest. For example, to determine the color of an object, a reading from a VIS spectrometer, i.e., a spectrometer that senses visible light, may be used. Similarly, to determine, for example, what material an object to be recycled is made of, a reading from an NIR spectrometer, i.e., a spectrometer that senses near-infrared electromagnetic radiation, may be used.

[0006] However, it is necessary to determine further characteristics of the object. [Overview of the Initiative]

[0007] In view of the foregoing, an object of the present invention is to provide an apparatus for classifying objects that enables the determination of the color and / or other properties of an object in a flow other than its NIR spectrum.

[0008] Another objective is to provide such an apparatus for classifying objects that allows for the determination of not only the color and / or NIR spectrum of objects in a flow, but also further characteristics of the objects.

[0009] Another objective is to provide such a device that enables enhanced sorting of objects.

[0010] To achieve at least one of the above objectives, and other objectives that may become apparent from the following description, the present invention provides an apparatus having the features defined in claim 1. Preferred modifications of the apparatus will become apparent from the dependent claims.

[0011] More specifically, according to the first embodiment, an apparatus is provided for classifying objects into at least one of a first class and a second class, the apparatus is Irradiation arrangement, Scanning element and Spectroscopic system and, Equipped with, The illumination configuration is adapted to emit at least one illumination beam having light emission, and the illumination beam is configured to induce a photoexcitation event in the photoresponsive portion of the object when the photoresponsive portion of the object is illuminated by the at least one illumination beam. The illumination arrangement further comprises a first optical arrangement adapted to direct and selectively focus at least one illumination beam toward the scanning element for at least a first period of time. The scanning element is configured to redirect at least one illumination beam toward the object passage zone along the illumination direction so that, when an object is transported on a conveyor belt or in free fall through the object passage zone at a speed of, for example, between 0.4 m / s and 20 m / s, the illuminated area is illuminated by at least one illumination beam for at least a first period of time. The first optical arrangement is further configured to optionally focus at least one illumination beam into or near the object passage zone. The spectroscopic system comprises a sensor arrangement having one or more sensors, the sensor arrangement being adapted to receive and analyze light radiation reflected, scattered, and / or emitted by an object in at least one of a plurality of inspection zones arranged sequentially in a first direction. Of the multiple inspection zones, the first inspection zone substantially coincides with the irradiated area during the first period. The second inspection zone among the multiple inspection zones is positioned after the first inspection zone with respect to the first direction. The third inspection zone among the multiple inspection zones is located after the second inspection zone with respect to the first direction. and, The scanning element is further adapted to shift multiple inspection zones and illumination directions in a first direction relative to the object, so that the second inspection zone substantially coincides with the first inspection zone before the shift during the second period following the first period. The scanning element is further adapted to shift multiple inspection zones and the irradiated area in a first direction relative to the object, so that the third inspection zone substantially coincides with the second inspection zone before the shift during the third period after the second period. The spectroscopic system further includes an optical element, which, via a scanning element, • Light radiation emitted by an object in the second inspection zone during the second period, which includes light radiation relating to phosphorescence events arising from photoexcitation events in the first inspection zone during the first period, • Light radiation emitted by an object in the third inspection zone during the third period, which includes light radiation relating to phosphorescence events arising from photoexcitation events in the first inspection zone during the first period, It is configured to receive, It is configured to redirect the received light radiation to at least one of one or more sensors, The sensor placement is further as follows: A second zone acquisition function configured to acquire second zone data based on at least one sensor signal from one or more sensors, wherein the at least one sensor signal relates to light emission emitted by an object in a second inspection zone, and the second zone acquisition function A third zone acquisition function configured to acquire third zone data based on at least one sensor signal from one or more sensors, wherein the at least one sensor signal relates to light emission emitted by an object in the third inspection zone, and the third zone acquisition function A classification function configured to classify objects based on second zone data and third zone data, An output function configured to output a classification signal that assigns an object to at least one of a first class and a second class based on the output of the classification function, It includes a processing circuit configured to perform the following:

[0012] According to a second aspect, a method is provided for classifying objects to be transported in large quantities into at least one of a first class and a second class, the method being: Emitting at least one illumination beam with light emission and directing it toward the object passage zone, Irradiating an area of ​​an object with at least one illumination beam for at least a first time and for at least a first period, wherein the object is transported on a conveyor belt at a speed between 0.4 m / s and 20 m / s in the object passage zone or is in free fall, thereby causing a photoexcitation event in the photoresponsive portion of the object. Directional direction of light emission toward one or more sensors in a sensor arrangement via a scanning element, wherein the light emission is scattered and / or emitted by an object in at least one of a plurality of inspection zones sequentially arranged in a first direction, the first inspection zone of the plurality of inspection zones substantially coincides with the area to be irradiated, and the second inspection zone of the plurality of inspection zones is positioned after the first inspection zone with respect to the first direction. The scanning element shifts multiple inspection zones and the area to be irradiated in a first direction relative to the object so that the second inspection zone in the second period following the first period substantially coincides with the first inspection zone in the first period. Subsequently, the sensor configuration receives light radiation emitted by an object in the second inspection zone during the second period, and the light radiation emitted by the object in the second inspection zone relates to a phosphorescence event resulting from a photoexcitation event. During the second period, collect first phosphorescence data related to the received light emitted by objects within the second inspection zone, The scanning element shifts multiple inspection zones and the area to be irradiated in a first direction relative to the object so that the third inspection zone of the third period after the second period substantially coincides with the second inspection zone of the second period. Thereafter, receiving, by sensor arrangement, light radiation emitted by an object within a third inspection zone during a third period, the light radiation emitted by the object within the third inspection zone being related to a phosphorescence event resulting from a photoexcitation event, and collecting second phosphorescence data related to the received light emitted by the object within the third inspection zone during the third period, and classifying the object by a processing circuit based on the second zone data and the third zone data, and outputting, by the processing circuit, a classification signal that assigns at least one of the first class and the second class to the object based on the result of the classification, and comprising.

[0013] The information given below is applicable to both of the aforementioned first and second aspects.

[0014] The first and second aspects provide for the combined detection of fluorescence and phosphorescence. Characteristics of the fluorescence and / or phosphorescence spectra can be determined, such as rise time, decay time, for example the response time of a colored pigment, one or more gradients of the respective spectra, or the time between them, and one or more of these characteristics can be used to determine the characteristics of the passing object.

[0015] According to one exemplary embodiment, the device comprises point illumination that is scanned across a first object passage zone. This allows for a lower cost when sweeping the illumination across the surface as compared to non-scanning solutions, and thus requires a lower total intensity as well as a smaller number of illumination sources. When the illumination emits light radiation within the UV wavelength range, a smaller number of illumination sources is also advantageous as it provides a safer system with less or no need for shielding.

[0016] According to one exemplary embodiment, the number of inspection zones is at least n, and each reflective surface of the scanning element shifts exactly or at least n times across the inspection zones before the illumination direction is redirected to a first illumination direction. n is a positive integer. After the illumination direction is redirected to the first illumination direction, preferably n shifts are repeated to collect additional data.

[0017] According to one exemplary embodiment, the scanning element is a polygon mirror configured to rotate in a first direction about a rotation axis, the polygon mirror comprising a set of reflective surfaces disposed successively around the rotation axis. The rotation of the polygon mirror is preferably continuous and preferably at a substantially constant speed. Also, each reflective surface of the set of reflective surfaces is preferably configured to receive light radiation from the first, second, and third inspection zones during at least one corresponding one of three consecutive periods. Additionally or alternatively, each reflective surface of the set of reflective surfaces is preferably configured to receive light radiation from the second to nth inspection zones during at least one corresponding one of at least n consecutive periods.

[0018] After being redirected by the scanning element, each of the at least one illumination beam can be a beam of parallel light rays or a beam of non-parallel light rays such as a diverging beam or a converging beam, and / or the cross-section of the illumination beam can be circular, oval, or strip-shaped, to name a few non-limiting examples.

[0019] One redirection of the illumination beam from a first position to an nth position by the scanning element is referred to as one scan by the scanning element. Thus, in the case of a polygon mirror having m reflective surfaces, one rotation of the polygon mirror preferably corresponds to m executions of the second and third collection functions, once for each reflective surface.

[0020] The classification function may be performed once for each scan of the scanning element, once for each rotation of the polygon mirror, or at predetermined constant or variable time intervals. The classification function may also be performed based on data from a first inspection zone, and / or data from any other sensor input, such as from a second to nth inspection zone and / or based on image processing of the flow of objects, for example, based on camera images or spectrometer images of the flow of objects.

[0021] The second zone data, the third zone data, and preferably further zone data (e.g., from the fourth zone data to the nth zone data), and optionally the first zone data, are preferably collected repeatedly because the scanning element repeatedly changes the illumination direction from a first position to the nth position. For example, data from the second inspection zone may be collected repeatedly as the scanning element repeatedly scans the object passage zone, and may be collected once, twice, or more times per scan.

[0022] According to one exemplary embodiment, an inspection zone preceding a first inspection zone in a first direction may be used as a reference area for ambient light calibration or as ambient light calibration. In this embodiment, the first inspection zone is located between the preceding inspection zone and the second inspection zone in a first direction.

[0023] According to one exemplary embodiment, specular reflection and fluorescence events of an illumination beam are measured by a first inspection zone only, and optionally, the light emission received from this inspection zone can be converted into a digital representation of the associated spectrum. However, further inspection zones, such as both the first and second inspection zones, may be used to measure specular reflection and / or fluorescence events and optionally convert them into a digital spectrum.

[0024] According to an exemplary embodiment, one or more phosphorus events are measured using first to nth or second to nth inspection zones, and optionally, the light emission received from these zones can be converted into a digital representation of the associated phosphorus event spectrum.

[0025] Additionally or alternatively, the intensity of specular reflection of the illumination beam after it has been received by the scanning element may be used to create a grayscale image representing the object it passes through.

[0026] In relation to the present invention, the term “object” should be understood as an object, such as an apple, a grain of rice, a rock, a mineral, and waste, such as plastic waste including used containers. An object may also include a piece of an object, such as a part or a flake of waste, such as used containers. An object may also include a mark or marker, for example, provided to the object during or after its manufacture, or provided to a part of the object if the object is divided into at least two pieces. A stream of object consists of individual pieces of object, which are inspected and preferably sorted.

[0027] The footprint of an object, i.e., the area occupied by each piece of the object when placed on a horizontal conveyor belt, may be within the range of 1 to 10 mm² and / or 10 to 100 mm² and / or 1 to 100 mm² and / or 10 to 1000 mm² and / or 1 to 100 cm² and / or 40 to 400 cm² and / or 10 to 1000 cm² and / or 1 to 100 dm². For example, the individual pieces of the object are either separated from each other or only partially overlap in a plane parallel to the direction of transport (or free fall).

[0028] In relation to the present invention, the terms “classify” or “sort” should be understood as assigning at least one class to an object based at least on the spectral response of the object. This class is used by a sorting system when orienting object pieces toward at least one of available destinations based on characteristics such as color, material, quality, marking, and / or combinations of these characteristics. The class may be a number representing a value of this characteristic, such as red, green, yellow; oil, plastic, glass, textile, wood; mature, decayed, deteriorated; food container, non-food container, etc. Alternatively, the sorting classes may be rejected, possibly rejected and requiring further inspection, possibly acceptable and requiring further inspection, and acceptable.

[0029] For example, the system is configured to classify pieces in a flow of material based on their individual phosphorus responses or characteristics of their phosphorus responses. In relation to the present invention, the term "characteristics of phosphorus response" refers to the properties of the emitted phosphorus spectrum, such as duration, rise time, decay time, and / or intensity, or a given wavelength range of the emitted phosphorus spectrum.

[0030] Fluorescence is the emission of light by a substance that has absorbed light or other electromagnetic radiation. It is a form of light emission. In most cases, the emitted light has a longer wavelength than the absorbed radiation and therefore has a lower photon energy. Perceptible examples of fluorescence occur when the absorbed radiation is in the ultraviolet region of the spectrum (invisible to the human eye), while the emitted light is in the visible region. Unlike phosphorescent materials, which continue to emit light for a period of time afterward, fluorescent materials stop glowing almost immediately when the radiation source is removed.

[0031] Phosphorescence is a type of photoluminescence related to fluorescence. When exposed to light (radiation) of shorter wavelengths, phosphorescent materials glow, absorbing the light and re-emitting it at longer wavelengths. Unlike fluorescence, phosphorescent materials do not immediately re-emit the radiation they absorb. Instead, they absorb some of the radiation energy and re-emit it over a much longer period of time after the radiation source has been removed.

[0032] There are two distinct mechanisms that can produce phosphorescence: triplet phosphorescence and persistent phosphorescence. Persistent phosphorescence occurs when high-energy photons are absorbed by atoms, and their electrons are trapped in defects in the lattice of crystalline or amorphous materials. Defects such as vacancies can trap electrons like pitfalls, accumulating their energy until it is released by random spikes of thermal (vibrational) energy. Such materials then emit light that gradually decreases in intensity over a period ranging from a few seconds to several hours after the initial excitation.

[0033] In triplet phosphorescence, the electron that absorbs the photon (energy) experiences an unusual intersystem crossover to a different (usually higher) spin multiplicity energy state, typically the triplet state. As a result, the excited electron can be trapped in the triplet state, and only a "forbidden" transition is available to return to the lower energy singlet state. Although such transitions are "forbidden," they still occur in quantum mechanics, but are dynamically unfavorable and therefore proceed on a significantly slower time scale. Most phosphorescent compounds are still relatively fast emitters, with triplet decay times on the order of milliseconds.

[0034] The objects to be classified are provided as a flow of objects, and the apparatus irradiates the objects to be classified with light emission within a UV wavelength range designed to elicit a phosphorus response from the irradiated objects, for example. Because the flow of objects is moving and there is a delay before phosphorescence occurs, it is difficult to determine the spectrum, particularly the rise time and decay time, with high accuracy.

[0035] The objects to be classified are provided as a flow of objects that partially or entirely contain objects having known phosphorus response characteristics. When the flow of objects contains only objects having known phosphorus response characteristics, each individual object piece has known phosphorus response characteristics, or one or more known phosphorus response characteristics above or below a given threshold. When the flow of objects partially contains objects having known phosphorus response characteristics, the flow may also contain objects that have no phosphorus response at all, or objects that have unknown phosphorus response characteristics to the irradiated light radiation. The portion of the flow that has a phosphorus response to the irradiated light radiation may be referred to as the photoresponse portion of the object.

[0036] This invention is based on the inventors' insights into how a system should be designed to elicit and detect the phosphorus response of an object in a flow, and optionally, a fluorescence response and / or color spectrum and / or NIR spectrum, when the object is moving in free fall or being transported by a conveyor.

[0037] According to one exemplary embodiment, the apparatus or method described above further includes receiving, in one or more sensors of the sensor arrangement, light radiation reflected, scattered, and / or emitted by an object in a first inspection zone during at least a first period, wherein the light radiation reflected and / or scattered by the object in the first inspection zone relates to at least one illumination beam, and the light radiation emitted by the object in the first inspection zone relates to a fluorescence event resulting from a photoexcitation event. Collecting first zone data relating to received light radiation reflected, scattered, and / or emitted by objects within a first inspection area during at least a first period, It is equipped with.

[0038] Optical information about an object can be collected by detecting and collecting radiation from the first detection zone once or repeatedly during one, two, or all of the first, second, and third time intervals, and optionally, one or all of the further time intervals.

[0039] According to one exemplary embodiment, data from a first inspection zone is collected during one or more scans by a scanning element, and this first zone data is a representation of at least a first spectrum, and classifying an object comprises determining the wavelength distribution of the first spectrum and optionally determining at least one characteristic relating to the shape of the first spectrum, such as the peak height, peak width, and / or peak area of ​​one or more peaks.

[0040] According to one exemplary embodiment, data from second and third inspection zones and optionally fourth to nth inspection zones are sequentially collected during one or more scans by a scanning element, preferably by second and third acquisition functions and optionally fourth to nth acquisition functions, wherein the second to third zone data or the second to nth zone data is a representation of at least one phosphorus event spectrum, and classifying an object comprises determining the wavelength distribution of one phosphorus event spectrum based on the collected data, and optionally determining at least one characteristic relating to the shape of the phosphorus event spectrum, such as the peak height, peak width, and / or peak area of ​​one or more peaks, based on the collected data.

[0041] According to one exemplary embodiment, second and third collection functions, and optionally fourth to nth collection functions, are configured to form phosphorus data based on at least second and third zone data, wherein the phosphorus data is at least a representation of a phosphorescent spectrum, and classifying an object comprises determining the wavelength distribution of the phosphorescent spectrum and optionally determining at least one characteristic relating to the shape of the second spectrum, such as the peak height, peak width, and / or peak area of ​​one or more peaks.

[0042] According to one exemplary embodiment, classifying an object involves determining the rise time and / or decay time of one or both of the phosphorescence and fluorescence events.

[0043] The type of object can be determined by analyzing properties related to either or both phosphorescence and fluorescence phenomena. These properties can be compared to one, two, or all of the following: thresholds, lookup tables, and criteria.

[0044] According to one exemplary embodiment, classifying objects is: At least one property related to the phosphorescence phenomenon of an object, At least one property relating to one of the following: color, transmittance, reflectance, and fluorescence of an object, It may be possible to classify objects based on this.

[0045] According to one exemplary embodiment, classifying an object further comprises comparing at least one property relating to the phosphorescence of the object, as well as one or more other properties relating to the corresponding one of the object's color, transmittance, reflectance, and fluorescence, with data stored in a local or centralized database.

[0046] According to one exemplary embodiment, classification is: Determining whether an object is provided with a linker by at least one of image processing and spectral processing, and / or For example, spectral processing to identify one or more materials that make up an object, and / or When determining the multiple materials that make up a single object, it is possible to determine whether the combination of these materials is acceptable or unacceptable. It is equipped with.

[0047] Link markers can be identified, for example, based on their shape, and their profiles can be identified by image processing. Additionally or alternatively, link markers can be identified, for example, based on the spectrum or spectral signature emitted in response to illumination by a light beam. The spectral signature can be identified by spectral processing.

[0048] According to one exemplary embodiment, at least one illumination beam that induces a photoexcitation event comprises light emission in the ultraviolet and / or visible wavelength range. The at least one illumination beam may comprise light emission in one or a combination thereof of the ultraviolet, visible, near-infrared, and infrared wavelength ranges.

[0049] According to one exemplary embodiment, receiving light radiation reflected, scattered, and / or emitted by an object in a first inspection zone comprises receiving light radiation in one or a combination thereof of the ultraviolet, visible, near-infrared, and infrared wavelength ranges.

[0050] According to one exemplary embodiment, the sensor arrangement comprises at least a first sensor configured to detect light emission in the ultraviolet and / or visible wavelength range, and a second sensor configured to detect light emission in the near-infrared and / or infrared light wavelength range.

[0051] According to one exemplary embodiment, the scanning element and optical element are further configured to simultaneously receive light radiation from at least the second and third inspection zones and redirect it toward the sensor arrangement during at least the second and third time intervals. The sensor arrangement preferably comprises at least one sensor array, each of which has a plurality of sensor pixels, and the at least one sensor array is arranged such that light radiation reflected, scattered, and / or emitted by an object in each inspection zone is received on each corresponding set of sensor pixels of the at least one sensor array, the pixels of each corresponding set of sensor pixels being different or partially overlapping.

[0052] The inventors have recognized that by using interleaved readings of sensors, when different sets of pixels are used to detect the phosphorescence response at different points in time from the same part of an object, and adjacent pixels are used to detect the phosphorescence response at the same point in time from adjacent parts of the object, a highly accurate phosphorescence spectrum can be determined, along with its rise time and decay time, even if the object is moving at high speed in free fall or being transported by a conveyor belt.

[0053] The sensor readings described above correspond to the collection of zone data by the second zone acquisition function and the nth zone acquisition function.

[0054] According to one exemplary embodiment, the optical element is further transmitted via a scanning element. • Light emission relating to at least one illumination beam that is reflected and / or scattered by an object in the first inspection zone during the first period, and / or • Light emission from objects related to fluorescence events resulting from photoexcitation events in the first inspection zone during the first period. It is configured to receive, The processing circuit further, A first zone acquisition function configured to acquire first zone data based on at least one sensor signal from one or more sensors, wherein the sensor signal relates to light radiation reflected, scattered, and / or emitted by an object in a first inspection zone. It is configured to perform the following actions: The classification function is further configured to classify objects based on the first zone data as well.

[0055] A stream of object may comprise object pieces that do not exhibit either a fluorescence event or a phosphorus event when irradiated with at least one illumination beam. Such object pieces are considered non-photoresponsive for the purposes of this invention. A stream of object may comprise object pieces that exhibit a fluorescence event and / or a phosphorus event when irradiated with at least one illumination beam, wherein the fluorescence event and / or phosphorus event is preferably strong enough to be detected and determined by at least one sensor. Such object pieces are considered photoresponsive for the purposes of this invention. The portion of an object that exhibits a detectable fluorescence event when irradiated with at least one illumination beam is referred to as the fluorescence portion. The portion of an object that exhibits a detectable phosphorus event when irradiated with at least one illumination beam is referred to as the phosphorus portion.

[0056] According to one exemplary embodiment, the fluorescent portion of the photoresponsive portion of an object emits light emission when irradiated with at least one illumination beam in a first zone, the light emission relating to a fluorescence event and comprising light emission in one or more wavelength bands, and each object piece of the fluorescent portion of the photoresponsive portion of an object emits radiation in at least one wavelength band of one or more wavelength bands when irradiated with at least one illumination beam. At least one illumination beam contains substantially no light emission within one or more wavelength bands. Optionally, at least one illumination beam consists of light emission from at least one low-wavelength range and at least one high-wavelength range, and each of one or more wavelength bands optionally consists of light emission from a wavelength range different from both its low-wavelength range and high-wavelength range.

[0057] As further described herein, the above embodiments facilitate the detection of radiation relating to fluorescence events by enabling the radiation to be detected without being buried in reflected or scattered radiation. This is possible because fluorescence events include one or more unique wavelengths that are not present in at least one illumination beam.

[0058] According to one exemplary embodiment, the sensor arrangement comprises a first sensor and a first diffraction element, and a second sensor and a second diffraction element, and the optical elements are • Directing light emission within the first wavelength range to only the first diffraction grating of the first and second diffraction gratings, and to only the first sensor of the first and second sensors, • Directing light emission within the second wavelength range to only the second diffraction grating out of the first and second diffraction gratings, and to only the second sensor out of the first and second sensors. It is configured in such a way, The first wavelength range and the second wavelength range are either the same, different, or partially overlapping.

[0059] When the first wavelength range and the second wavelength range are the same, the radiation is split, for example, by a beam splitter that directs half of the intensity of all wavelengths in one direction and the other half of the intensity of all wavelengths in another direction.

[0060] When the first wavelength range and the second wavelength range are different, the radiation is split, for example, by a beam splitter that directs substantially all of the intensity of the UV and VIS light in one direction and the NIR light in the other direction.

[0061] When the first wavelength range and the second wavelength range partially overlap, the radiation is split by a beam splitter, for example, which directs substantially all of the UV intensity and half of the VIS light intensity in one direction, while directing the remaining half of the VIS light intensity and all of the NIR light intensity in the other direction.

[0062] According to one exemplary embodiment, the sensor arrangement comprises a first sensor and an optical element, • Direct light emission within a first wavelength range towards a first sensor for a certain period of time. • Direct light emission within a second wavelength range towards a second sensor for a certain period of time. It is configured in such a way, The first wavelength range and the second wavelength range are either different or only partially overlapping.

[0063] According to one exemplary embodiment, the illumination arrangement comprises at least two illumination arrangements whose optical axes are incident on the scanning element from different directions, and each of the at least two illumination arrangements is adapted to emit light radiation in different or partially overlapping wavelength ranges, which are emitted simultaneously or sequentially. The different directions are preferably non-parallel.

[0064] According to one exemplary embodiment, the irradiation arrangement comprises at least one irradiation arrangement adapted to emit light radiation in different or partially overlapping wavelength ranges at different time points.

[0065] By providing at least two illumination configurations, stronger illumination can be provided in the first detection zone. Furthermore, the illumination of the first detection zone can be easily adjusted by using different types of illumination sources or light sources with different characteristics as the first and second illumination configurations. Moreover, a more robust device can be achieved. The device does not need to be taken out of operation if one of the first or second illumination sources fails, and therefore can continue to operate while one of the illumination sources is being replaced.

[0066] The focusing configuration may include a first focusing element adapted to direct and focus a first set of illumination beams onto a scanning element, and a second focusing element adapted to direct and focus a second set of illumination beams onto a scanning element, which is advantageous in that the first and second sets of illumination beams can be individually directed and focused onto the scanning element. The focusing element may be any optical element capable of focusing and directing the first and / or second sets of illumination beams. The focusing element may be a combination of multiple optical elements acting together. The focusing element may direct the first and / or second sets of illumination beams along the direction of illumination into which the illumination beams of the first and / or second sets are incident. The first focusing element may be a lens or a mirror. The first focusing element may be a combination of a lens and a mirror. The second focusing element may be a lens or a mirror. The second focusing element may be a combination of a lens and a mirror.

[0067] The illumination source arrangement may include a single illumination source or light source adapted to emit a first set of illumination beams and a second set of illumination beams, which is advantageous in that the illumination source arrangement can be more energy-efficient. Furthermore, the light source arrangement can be more compact, as space only needs to be allocated to a single illumination source.

[0068] According to one exemplary embodiment, each of one or more sensors comprises a sensor array having a plurality of sensor pixels, the plurality of sensor pixels arranged such that light radiation reflected, scattered and / or emitted by an object in a second inspection zone is received on a second set of sensor pixels of the sensor array, and light radiation emitted by an object in a third inspection zone is simultaneously received on a third set of sensor pixels of the sensor array, wherein the pixels of the first and second sets of sensor pixels are different or only partially the same.

[0069] Optionally, multiple sensor pixels are arranged such that light radiation emitted by an object in a first inspection zone is received on a first set of sensor pixels in the sensor array, where the pixels of the first set of pixels are either different from or partially overlap with the first and second sets of sensor pixels.

[0070] According to one exemplary embodiment, the apparatus comprises a further sensor arrangement adapted to receive and analyze light radiation reflected and / or scattered by objects within the irradiated area, and the processing circuit is optionally configured to perform an additional acquisition function configured to collect additional data based on additional sensor signals from the further sensor arrangement, the additional sensor signals relating to light radiation reflected and / or scattered by objects within the irradiated area.

[0071] The scanning arrangement is preferably calibrated using a white reference or white light. The apparatus optionally includes a reference arrangement comprising a white reference element, which is adapted to receive light radiation from the illumination arrangement and to direct the received light radiation toward the detector system via the white reference element. The white reference element is a reference that reflects or transmits a substantially uniform spectrum within one or more predetermined wavelength intervals of interest. For example, if all wavelengths in the visible spectrum are of interest, the white reference element will reflect or transmit light that would be perceived as white when illuminated by a light source that emits a uniform spectrum across the entire visible wavelength range. However, if only wavelengths in the NIR spectrum are of interest, or if wavelengths in the NIR spectrum are additionally of interest, the white reference element will reflect or transmit light radiation with substantially uniform intensity when illuminated by a light source that emits a uniform spectrum across the NIR wavelength range of interest.

[0072] In addition to or instead of a spectrometer, a camera-based sensor system, i.e., a sensor system without a diffracting element for splitting light emission into different wavelength bands, may be used. The camera-based sensor system may comprise a CCD or CMOS camera having one or more sensor matrices or sensor arrays for detecting all radiation, or for separately detecting, for example, red, green, and blue. The sensor arrays or sensor matrices of the camera-based sensor system may be used to detect the intensity of radiation reflected, scattered, and / or emitted from the first to nth inspection zones as described above. The acquisition of the camera system may be synchronized with the polygon mirror used for light projection.

[0073] Additionally or alternatively, a camera-based sensor system may be used as part of a laser triangulation system. According to one exemplary embodiment, the apparatus comprises a laser triangulation system. The laser triangulation system includes a laser arrangement adapted to emit a laser beam toward a second detection zone, through which an object is provided. The laser arrangement typically includes one or more laser sources and optionally optical elements for forming the emitted laser light into a laser beam.

[0074] In the context of this application, the term "laser beam" can refer to any type of laser light having a visible or invisible elongated extension, and it should be noted that when it strikes a surface, the light forms a line or linear profile.

[0075] The laser triangulation system includes a camera-based sensor arrangement configured to receive and analyze light reflected and / or scattered by an object within a first object passage zone or a second object passage zone.

[0076] The first and second detection zones may overlap, which is advantageous in that it may be easier to correlate an object in the first detection zone with a corresponding object in the second detection zone. In other words, it may be easier to determine when a particular object piece that has passed through the first detection zone will pass through the second detection zone. This configuration is advantageous when an object moves randomly through the first and / or second detection zones, as is generally the case when an object is free-falling or sliding through the first and / or second detection zones.

[0077] The first detection zone and the second detection zone may partially overlap. The first detection zone and the second detection zone may almost completely overlap. Therefore, the first detection zone and the second detection zone may be located in substantially the same physical location.

[0078] According to one embodiment, the light received by the spectroscopic system completely or partially intersects with the light and / or laser beam received by the camera-based sensor arrangement. The special provision of the spectroscopic system in relation to the camera-based sensor arrangement and / or laser arrangement enables a compact system that requires significantly less space.

[0079] For example, the light radiation received by the spectral system from the first object passage zone completely or partially intersects or crosses the light received by the camera-based sensor arrangement, i.e., light originating from a laser beam and reflected and / or scattered by an object in the first or second detection zone.

[0080] For example, an object transported through a first object passage zone is also transported through a second object passage zone. This allows a particular object provided to the first object passage zone to be correlated to be the same object when it is later or concurrently provided through the second object passage zone. In other words, the same object is typically analyzed sequentially or concurrently by both a spectroscopic system and a laser triangulation system. Thus, a compact device with enhanced detection capabilities is provided.

[0081] In one example, the apparatus further includes one, two, or more optical filters arranged in the optical path from one or more illumination sources through a first detection zone to at least one sensor of a spectrometer system. One, two, or more optical filters prevent light originating from a first set of light beams and a second set of light beams from reaching the camera-based sensor arrangement. This arrangement of one, two, or more optical filters can form a barrier to prevent unwanted light, which would otherwise risk interfering with the camera-based sensor system or the spectrometer system, from reaching those systems. Providing one, two, or more is particularly relevant and therefore advantageous when the first detection zone and the second detection zone overlap. In one example, at least one of the optical filters prevents the passage of light originating from a first set of light beams, a second set of light beams, and ambient light, while allowing the passage of light originating from laser light.

[0082] The apparatus may further include a processing unit connected to the spectroscopic system and the camera-based sensor arrangement, the processing unit configured to determine a first set of characteristics of an object in a first detection zone based on the output signal of the spectroscopic system, and the processing unit configured to determine a second set of characteristics of an object in a second detection zone based on the output signal of the camera-based sensor arrangement. Providing a processing unit connected to the spectroscopic system and the camera-based sensor arrangement allows the processing unit to determine one or more characteristics of each object in the first and second detection zones. Thus, the processing unit can receive signals from the spectroscopic system and the camera-based sensor arrangement, respectively. The received signals are obtained based on the analysis of light received by the spectroscopic system and the camera-based sensor arrangement, respectively.

[0083] In the context of this application, the term "processing unit" can refer to any unit, system, or device capable of receiving one or more signals or data from another entity and processing the received signals or data. Processing may include, for example, calculating one or more properties based on the received signals or data, transferring the received signals or data, and modifying the received signals or data. A processing unit may be a single unit or distributed across multiple devices, such as multiple PCs, each having processing capabilities. A processing unit may be implemented in hardware or software.

[0084] It should be noted that, within the context of this application, the term "characteristic set" can be any set of data containing any type of data. A characteristic set can contain any number of characteristics, including zero. Therefore, a characteristic set can be an empty set, which may, for example, indicate the non-existence of an object.

[0085] The first set of characteristics may indicate at least one of the following: the spectral response of an object, the material type of an object, the color of an object, the fluorescence of an object, the phosphorescence of an object, the maturity of an object, the dry material content of an object, the water content of an object, the fat content of an object, the oil content of an object, the calorific value of an object, the presence of bones or fish bones in an object, the presence of pests, the mineral type of an object, the ore type of an object, the defect level of an object, the detection of hazardous biological materials in an object, the presence or absence of an object, the detection of multilayer materials in an object, the detection of fluorescence and / or phosphorescence markers in an object, the color markers of an object, the quality grade of an object, the physical structure of the surface of an object, and the molecular structure of an object.

[0086] One example of a potentially harmful biological material that may be detected is mycotoxins.

[0087] The above characteristics of the first set of characteristics can be determined by specific combinations that may be useful for detecting objects within the first detection zone. Examples of applications where such combinations are useful, to name a few non-limiting examples, include sorting pet food, detecting fish bones in fillets, sorting paper using visible and NIR spectroscopy, removing foreign materials and shells from pistachios, and polymer recycling.

[0088] The second set of characteristics may indicate at least one of the following: the height of the object, the height profile of the object, a 3D map of the object, the intensity profiles of reflected and / or scattered light, the volume center of the object, the estimated center of mass of the object, the estimated weight of the object, the estimated material of the object, the presence or absence of the object, detection of isotropic and anisotropic light scattering of the object, the structure and quality of the wood, the surface roughness and texture of the object, and an indication of the presence of fluid in the object.

[0089] Examples of related fluids include oil and water used in food products.

[0090] The above characteristics of the second set of characteristics can be determined by specific combinations that may be useful for detecting objects within the second detection zone. Examples of applications where such combinations are useful, to name a few non-limiting examples, include glass sorting and quartz sorting.

[0091] The processing unit may further be configured to receive an input indicating the field of view of the camera-based sensor arrangement relative to the second detection zone, and to compensate for the field of view of the camera-based sensor arrangement when determining the second set of characteristics, which is advantageous in that more accurate subsequent sorting or discharge of objects can be achieved. In practice, when determining the position of an object in the second detection zone, the height of the object in the second detection zone may be compensated for. This allows subsequent sorting or discharge operations to act on or affect the object at a certain location, preventing improper sorting or discharge. For example, the sorter or discharger may collide with the object at its estimated center of mass, thereby reducing the risk of the object slipping or rolling, for example. The discharger may be configured to include a valve image processing step for reducing or minimizing compressed air consumption and energy consumption while maintaining optimal sorting yield and sorting loss.

[0092] The processing unit may be configured to receive input indicating the geometry of the laser placement and camera-based sensor placement for the second detection zone.

[0093] The processing unit may be configured to compensate for the geometry of the laser and camera-based sensor placements relative to the second detection zone when determining the second set of characteristics.

[0094] The apparatus may further include a discharge configuration connected to a processing unit, the discharge configuration being adapted to discharge and sort an object into a plurality of fragments in response to receiving a signal from the processing unit based on a determined first set of characteristics and / or a determined second set of characteristics, the discharge configuration being adapted to discharge and sort an object by at least one of compressed air jets, pressurized water jets, mechanical fingers, compressed air jet bars, pressurized water jet bars, mechanical finger bars, robotic arms, and mechanical diverters.

[0095] By providing an discharge configuration connected to the processing unit, the apparatus can discharge and sort an object into multiple fragments based on a determined first set of characteristics and / or a determined second set of characteristics. Thus, the object can be sorted based on analysis performed by a spectroscopic system and / or a laser triangulation system.

[0096] Multiple fragments may be based on any of the determined characteristics. Fragments may be based, for example, on material or color. Some fragments may correspond to objects that should be discarded or scrapped.

[0097] Discharge and sorting may be performed by compressed air jets, pressurized water jets, mechanical fingers, compressed air jet bars, pressurized water jet bars, mechanical finger bars, robotic arms, or mechanical diverters.

[0098] Alternatively, for disposal and sorting purposes, objects may be analyzed online, for example, by a cloud service. The analyzed objects can then be classified, for example, in terms of purity, defect level, average color, etc.

[0099] The apparatus may further include a conveyor for transporting objects through a first detection zone and a second detection zone, or a chute optionally including a vibrating feeder for sliding or free-falling objects through the first detection zone and / or the second detection zone.

[0100] By providing a conveyor, objects can be transported in a controlled manner through a first detection zone and a second detection zone. Objects transported through the first detection zone and analyzed in the first detection zone are then transported through the second detection zone and analyzed in the second detection zone. Through the controlled transport of objects through the first and second detection zones, objects can be tracked. Thus, objects in the first detection zone can be correlated or identified as being the same as objects in the second detection zone.

[0101] By providing a chute optionally including a vibrating feeder, objects can be slid or free-falled through a first detection zone and / or a second detection zone. Objects may be slid through the first and second detection zones. Objects may be free-falled through the first and second detection zones. Objects may be slid through the first detection zone and free-falled through the second detection zone. Providing a chute optionally including a vibrating feeder is advantageous for small quantities of objects, such as different types of grains.

[0102] Further scope of the applicability of the present invention will become apparent from the detailed description given below. However, it should be understood that the detailed description and specific examples are given only as illustrations, although they illustrate preferred modifications of the concept of the present invention. This is because, for those skilled in the art, various changes and modifications within the scope of the concept of the present invention will become apparent from this detailed description.

[0103] Therefore, it should be understood that the concept of the present invention is not limited to specific components of the described device, as such devices can change. It should also be understood that the terms used herein are intended solely to describe specific variations and are not intended to limit them. It should be noted that, when used herein and in the appended claims, the articles “a,” “an,” “the,” and “said” are intended to mean that there is one or more of those elements unless the context otherwise explicitly specifies. Thus, for example, a reference to “a unit” or “the unit” may include several devices, etc. Also, the terms and similar expressions “equip,” “include,” and “contain” do not exclude other elements. Furthermore, items or arrangements described as part of a whole can also be used independently. [Brief explanation of the drawing]

[0104] [Figure 1]A schematic diagram of the apparatus 100 for classifying object 102 according to this disclosure is shown. [Figure 2] Figure 1 shows schematic diagrams of some of the internal components of the housing 110. [Figure 3] Figure 1 shows schematic diagrams of some of the internal components of the housing 110. [Figure 4] A schematic diagram of some of the components within the spectroscopic system 120 of the instrument is shown. [Figure 5a] This is a view from above of an object on a conveyor belt (not shown). [Figure 5b] This is a view from above of an object on a conveyor belt (not shown). [Figure 5c] This is a view from above of an object on a conveyor belt (not shown). [Figure 6] This diagram illustrates intensity data from materials that emit both fluorescence and phosphorescence. [Figure 7a] This shows the radiation intensity data detected when the illuminated object is white paper. [Figure 7b] This shows the radiation intensity data detected when the illuminated object is white paper. [Figure 8a] This shows the radiation intensity data detected when the illuminated object is a yellow glowing bottle. [Figure 8b] This shows the radiation intensity data detected when the illuminated object is a yellow glowing bottle. [Figure 9a] This shows the intensity data of the radiation detected when the illuminated object is a blue marker. [Figure 9b] This shows the intensity data of the radiation detected when the illuminated object is a blue marker. [Figure 10a] This shows the intensity data of the radiation detected when the illuminated object is a red marker. [Figure 10b] This shows the intensity data of the radiation detected when the illuminated object is a red marker. [Figure 11]The intensity data of the radiation detected for four different materials is shown. [Figure 12] The average intensity data from several experiments on white paper is shown. [Figure 13] This shows average intensity data across several experiments with a yellow glowing bottle. [Figure 14] The average intensity data across several experiments using the blue marker is shown. [Figure 15] The average intensity data across several experiments using red markers is shown. [Figure 16] This shows the maximum intensity recorded across all wavelengths as a function of time for white paper. [Figure 17] For the red marker, this shows the maximum intensity recorded across all wavelengths as a function of time. [Figure 18] This is a process diagram of the method according to the present invention. [Modes for carrying out the invention]

[0105] The concept of the present invention will be fully described below with reference to the accompanying drawings. The drawings show currently preferred modifications of the concept of the present invention. However, the concept of the present invention may be implemented in many different forms and should not be construed as being limited to the modifications described herein. Rather, these modifications are provided for thoroughness and completeness and fully convey the scope of the concept of the present invention to those skilled in the art.

[0106] Figure 1 schematically shows a device 100 for compiling information about an object and / or classifying the object into at least a first and a second class. The object 102 is provided through a first object passage zone 104.

[0107] In the apparatus 100 illustrated in Figure 1, the object 102 is transported through a first object passage zone 104 by a conveyor 108. However, the object 102 may also be provided through the first object passage zone 104 by any suitable means, for example, by sliding or free fall. For this purpose, the apparatus 100 may be provided with a chute. Thus, the conveyor in Figure 1 is optional. More specifically, this involves the object being illuminated in the illuminated area 118 by at least one illumination beam for at least a first period of time when the object is being transported through the object passage zone by the conveyor 108 at a speed of 0.4 m / s to 20 m / s, or sliding through the object passage zone by the chute, or free-falling through the object passage zone.

[0108] The apparatus 100 illustrated in Figure 1 further includes an optional housing 110 positioned to the side, preferably above, the first object passage zone 104. In other words, the housing 110 is positioned above the conveyor 108. Referring now to Figure 2, which schematically discloses an excerpt of components preferably located within the optional housing 110.

[0109] Inside the housing 110 is an illumination configuration 114, also referred to as illumination configuration 114, which is adapted to emit at least one illumination beam having light emission within a first wavelength range toward a scanning element 136, the scanning element being configured to redirect at least one illumination beam 116 toward a first object passage zone 104. If an object is within the first object passage zone, a portion of the surface of this object will be illuminated by at least one illumination beam. In the context of this invention, this portion of the surface illuminated by at least one illumination beam is referred to as the illuminated area 118.

[0110] According to one exemplary embodiment, at least some object pieces in a stream of objects are expected to fluoresce (i.e., emit light emission relating to a fluorescent event when illuminated by at least one illumination beam in a first zone), and this is of interest for detection. To facilitate the detection of light emission relating to a fluorescent event having emission in one or more predetermined wavelength bands, it is preferable that at least one illumination beam has no emission at all, or at least no significant emission, in that one or more predetermined wavelength bands. The wavelength range of light emission relating to one or more fluorescent events may be broader than one or more predetermined wavelength bands, but one or more predetermined wavelength bands allow for the detection of at least a sufficient portion of the light emission relating to one or more fluorescent events to obtain information of interest, such as determining that a fluorescent event has occurred. If at least one illumination beam substantially contains no light emission in one or more wavelength bands, then in at least some applications, the inability to distinguish the fluorescent emission from reflected or scattered radiation is a risk.

[0111] Inside the housing 110 is a spectroscopic system 120 adapted to receive and analyze light radiation 122 reflected, scattered, and / or emitted by an object 102 in the first detection area 104.

[0112] The apparatus 100 shown in Figure 1 further includes a discharge configuration 112 located downstream of the first object passage zone 104. The discharge configuration 112 is adapted to discharge and sort the object 102 to at least two different destinations. However, the discharge configuration 112 in Figure 1 is optional.

[0113] The apparatus 100 illustrated in Figure 1 further includes a control cabinet 111 positioned above the conveyor 108. The control cabinet 111 contains equipment used to control the apparatus 100. The equipment typically includes a processing unit 113 or control unit for controlling the conveyor 108, the discharge arrangement 112, and the equipment within the housing 110. The processing unit 113 is typically used to determine one or more characteristics of an object 102 based on measurements performed by the equipment within the housing 110.

[0114] Next, referring specifically to Figure 2, the components inside the housing 110 of Figure 1 are conceptually illustrated. Figure 2 also shows a portion of the conveyor 108, including the first object passage zone 104.

[0115] In Figure 2, one of the small arrows in the illuminated area 118 indicates the scanning direction. As seen in Figure 2, the illumination beam intersects the object passage zone at a non-orthogonal angle. That is, in this example, the illumination beam is non-orthogonal to the conveyor belt in at least one geometric plane. According to an alternative embodiment, the illumination beam intersects the object passage zone orthogonally. That is, in this example, the illumination beam is orthogonal to the conveyor belt in at least two geometric planes.

[0116] Object 102 is provided by conveyor 108 through a first object passage zone. Object 102 is typically transported continuously through the first object passage zone 104.

[0117] Furthermore, in conjunction with the illustrated illumination arrangement 114, a first optical arrangement 134 is provided. The first optical arrangement 134 is adapted to direct at least one illumination beam 116 toward a scanning element 136 and optionally converge it. The operating element 136 is adapted to change the direction of at least one illumination beam 116 toward the first object passage zone 104 and, if present, the illuminated area 118 of the object being passed, along the illumination direction. As shown in Figure 2, the first optical arrangement 134 is configured to focus at least one illumination beam within or near the first object passage zone 104. The scanning element 136 illustrated in Figure 2 is in the form of a rotating polygon mirror. Therefore, by rotating the polygon mirror, a change in direction of at least one illumination beam 116 and a shift in the illumination direction occur in the first object passage zone 104. Therefore, at least one illumination beam 116 is repeatedly redirected across the first object passage zone 104 for each rotation of the polygon mirror, and the number of repetitions is equal to the number of reflective surfaces of the polygon mirror, namely 10 in the case of the polygon mirror shown in Figure 2.

[0118] Other types of scanning elements may be advantageously used. For example, a scanning element having only one reflective surface hinged around a pivot axis may be used.

[0119] As described above, the spectroscopic system 120 is adapted to receive and analyze light radiation 122 reflected, scattered, and / or emitted by an object 102 in the first object passage zone 104. The radiation 122 reflected, scattered, and / or emitted by the object 102 in the first object passage zone 104 collides with the scanning element 136, i.e., the polygon mirror, before entering the spectroscopic system 120, from which the light radiation 122 is received by the optical element 121 of the spectroscopic system 120. Optionally, the optical path from the polygon mirror 136 to the spectroscopic system 120 may include a further optical element, such as a fixed folding mirror, which redirects the radiation reflected by the polygon mirror toward an optional housing 121 of the spectrometer system. The fixed folding mirror may be located near where at least one illumination beam 116 exits the first optical arrangement 134.

[0120] The spectroscopic system 120 may be manufactured by Tomra and may be able to accommodate the required number of repetitions. Each spectrometer in the spectrometer system may be configured to analyze light emission with a wavelength interval of 400 to 1000 nm, or light emission with a wavelength interval of 500 to 1000 nm or 1000 to 1900 nm. Additionally or alternatively, spectrometers in the spectrometer system may be configured to analyze light emission with wavelengths greater than 900 nm. For example, a spectrometer may be configured to analyze light emission with a wavelength interval of 1900 to 2500 nm, or a spectrometer may be configured to analyze light emission with a wavelength interval of 2700 to 5300 nm. Alternatively, a spectrometer may be configured to analyze light emission with a wavelength interval of 900 to 1700 nm. Additionally or alternatively, a spectrometer in the spectrometer system may be configured to analyze light emission with a wavelength interval of 700 to 1400 nm. A spectrometer may analyze visible light. A spectrometer may analyze NIR light. A spectrometer may analyze IR light. Depending on the expected characteristics of object 102, different types of spectrometers may be used.

[0121] The spectrometer system may comprise one, two, or more sensors, for example, a first sensor 131 and a second sensor 132. Preferably, each of the one, two, or more sensors is an array or matrix sensor comprising multiple pixels. Each sensor is also preferably associated with corresponding diffracting elements 128, 129, such as a grating. These sensor-diffracting element pairs are positioned at different locations and are arranged to receive corresponding portions of the light emission 122, with the different portions of the light emission 122 directed toward the first diffracting element 128 and the second diffracting element 129, respectively. The light emission 122 may be split into two distinct portions by, for example, a beam splitting element 123.

[0122] Apparatus 100 may use two or more spectrometers. For example, the spectroscopic system 120 may include a first sensor 131 adapted to analyze light in a first wavelength interval and a second sensor 120 adapted to analyze light in a second wavelength interval. As an example, the first spectrometer 120 may analyze light in a wavelength interval of 450 to 800 nm, and the second spectrometer 120 may analyze light emission in a wavelength interval of 1500 to 1900 nm. For example, one spectrometer for visible light may be used in combination with one NIR spectrometer.

[0123] Similarly, two, three, or more spectrometers 120 may be included in the spectroscopic system 120. Thus, two or three spectrometers may be used. For example, one spectrometer for visible light may be used in combination with two NIR spectrometers.

[0124] The spectroscopic system 120 may also be a scanning spectroscopic system 120. An example of a suitable scanning spectrometer is manufactured by Tomra.

[0125] Various properties of the object 102 within the first object passage zone 104 can be determined based on measurements performed by the spectroscopic system 120.

[0126] As described above, the apparatus 100 illustrated in Figures 1, 2, and 3 includes a processing unit 113. In the illustrated apparatus 100, the processing unit 113 is located within a control cabinet 111. The processing unit 113 is connected to a spectroscopic system 120, and the connection between the processing unit 113 and the spectroscopic system 120 is schematically shown by a dashed line in Figure 2. The processing unit 113 can be connected to the spectroscopic system 120 and the camera-based sensor arrangement 128 by any suitable connection, including wired and wireless connections. Any connection capable of transmitting data in any digital or analog format may be advantageously used.

[0127] Figures 5a to 5c are views from above of an object on a conveyor belt (not shown). When an object is in free fall, similar figures can be observed by viewing the flow from a direction perpendicular or transverse to the direction of transport of the object, for example, from a direction shifted by up to + / -60°, up to + / -45°, or up to + / -30° from the perpendicular direction.

[0128] Figure 5a shows the positions of multiple inspection zones in the first, second, and third periods, respectively, with scanning elements positioned in the first, second, and third positions, and at least one illumination beam directed toward the first object passage zone in the first, second, and third illumination directions, respectively. In the first period, the scanning elements are positioned in the first position, and at least one illumination beam is directed along the first illumination direction, illuminating an object within the first illuminated area 118a, indicated by a circle in Figure 5a. The object passage zone comprises multiple inspection zones numbered 1 to 8, which are sequentially arranged in the first direction 140. More specifically, the second inspection zone 2 of the multiple inspection zones is positioned after the first inspection zone with respect to the first direction, and the third inspection zone 3 of the multiple inspection zones is positioned after the second inspection zone with respect to the first direction. In this first period, the multiple inspection zones 1 to 8 are positioned in the first position relative to the object. The first optical arrangement 134, scanning element, and optical element 125 are preferably arranged such that the irradiated area substantially coincides with the first inspection zone 1 during the first period.

[0129] In the second period, the scanning element is positioned in a second position relative to the object, and at least one illumination beam is directed along a second illumination direction to illuminate the object within a second illumination area 118b, indicated by a circle in Figure 5b. In this second period, the multiple inspection zones 1-8 are positioned in a second position relative to the object. More specifically, when rotating to the second position, the scanning element shifts the multiple inspection zones 1-8 and the illumination direction relative to the object to a first direction, thereby so that the second inspection zone 2 substantially coincides with the first inspection zone before the shift during the second period following the first period. As described above, the spectroscopic system 120 includes a sensor arrangement comprising one or more sensors 131,132, which is adapted to receive and analyze light radiation 122 reflected, scattered, and / or emitted by an object in at least one of the multiple inspection zones. More specifically, the sensor arrangement is adapted to receive at least light radiation 122 emitted by an object in the second inspection zone during the second period, the light radiation relating to a phosphorescence event resulting from a photoexcitation event in the first zone during the first period.

[0130] In the third period, the scanning element is positioned in a third position relative to the object, and at least one illumination beam is directed along the third illumination direction to illuminate an area 118c outside the object, indicated by a circle in Figure 5c. In this third period, the multiple inspection zones 1-8 are positioned in the third position relative to the object. More specifically, when rotating to the third position, the scanning element shifts the multiple inspection zones 1-8 and the illumination direction relative to the object to the first direction, thereby so that the third inspection zone 3 substantially coincides with the second inspection zone before the shift during the third period following the second period. The sensor arrangement of the spectroscopic system is adapted to receive at least the light emission 122 emitted by the object in the third inspection zone during the third period, the light emission relating to phosphorescence events resulting from photoexcitation events in the first inspection zone during the first period.

[0131] During the second and third periods, and optionally during the first period as well, the optical element is further configured to redirect the received radiation 122 to at least one of one or more sensors.

[0132] Note that the apparatus 100 is illustrated here such that the first direction 140 crosses the conveyor belt 108. In other words, the scanning direction is perpendicular to the conveyor belt and therefore perpendicular to the movement of the object 102 being transported on the conveyor belt 108. In alternative embodiments, the angular difference between the transport direction 141 and the first direction 140 may be any value, for example, between 0° and less than 360°. Alternatively, the angular difference may deviate from 90° by up to + / -70°, up to + / -50°, or up to + / -30°, or the angular difference may deviate from -90° by up to + / -70°, up to + / -50°, or up to + / -30°. In Figures 5a to 5c, the angular difference is 90°.

[0133] According to one exemplary embodiment, the number of inspection zones is at least n, and each reflective surface of the scanning element preferably shifts the inspection zone n times before the illumination direction is changed to a first illumination direction, where n is a positive integer. After the illumination direction is preferably changed to a first illumination direction, the n shifts are preferably repeated.

[0134] As described above, the light radiation received by the spectrometer system is directed to one or more sensors. The sensor arrangement further includes processing circuitry configured to collect sensor data based on the sensor signals from the sensor arrangement. The processing circuitry may be located anywhere, for example, within the spectrometer housing 121 and / or within the processing unit 113. For example, it may be located partly within the spectrometer housing and partly within the processing unit. Additionally or alternatively, the processing circuitry may be located entirely or partially in a cloud-based solution.

[0135] More specifically, the processing circuit is configured to perform a second zone acquisition function, which is configured to acquire second zone data based on at least one sensor signal from one or more sensors, the at least one sensor signal relating to light emission emitted by an object in the second inspection zone.

[0136] For example, during and / or after the second period, the first sensor outputs at least one signal corresponding to the light radiation received by the sensor from the second inspection zone during the second period, and optionally, more sensors, such as the second sensor, do the same. This at least one signal from one or more sensors may be referred to as at least one second zone sensor signal.

[0137] Furthermore, during and / or after the third period, the first sensor outputs at least one signal corresponding to the light radiation received by the sensor from the third inspection zone during the third period, and optionally, more sensors, such as the second sensor, do the same. This at least one signal from one or more sensors may be referred to as at least one third zone sensor signal.

[0138] Generally, during and / or after the nth time period, for example, the first sensor outputs at least one signal corresponding to the light radiation received by that sensor from the nth inspection zone during the nth time period, and optionally, more sensors, such as the second sensor, do the same. This at least one signal from one or more sensors may be referred to as the at least one nth zone sensor signal.

[0139] The processing circuit is configured to perform a second zone acquisition function, which is configured to acquire second zone data based on at least one second zone sensor signal or on at least one sensor signal from one or more sensors, wherein the at least one sensor signal relates to light emission emitted by an object in a second inspection zone. This second zone data may be a representation of all or part of the information present in the at least one second zone sensor signal. For example, the at least one second zone sensor signal is a continuous analog signal from a plurality of pixels representing a plurality of wavelength bands, while the second zone data is a sampled value of the analog signal from all or part of the wavelength bands.

[0140] Furthermore, the processing circuit is configured to perform a third zone acquisition function, which is configured to acquire third zone data based on at least one third zone sensor signal or at least one sensor signal from one or more sensors, wherein the at least one sensor signal relates to light emission emitted by an object in the third inspection zone.

[0141] Generally, a processing circuit may be configured to perform an nth zone acquisition function, which is configured to acquire nth zone data based on at least one nth zone sensor signal or on at least one sensor signal from one or more sensors, wherein the at least one sensor signal relates to light emission emitted by an object in the nth inspection zone. This nth zone data may be a representation of all or part of the information present in at least one nth zone sensor signal. For example, at least one nth zone sensor signal may be multiple continuous analog signals from a plurality of pixels, each associated with a corresponding wavelength band, while the nth zone data is a sampled value of the analog signal from all or part of the pixels. Additionally or alternatively, at least one nth zone sensor signal may comprise a continuous analog signal from a single pixel, while the nth zone data is a sampled value of part, all, or discontinuous portion of the analog signal. However, it is optional that at least one nth zone sensor signal comprises one or more analog signals. At least one nth zone sensor signal may comprise any kind of data and / or signal, whether progressed or raw.

[0142] The processing circuit is configured to perform a classification function and classify objects based on at least the second to the nth zone data, where n is 3. In other words, the processing circuit is configured to perform a classification function and classify objects based on at least the second and third zone data.

[0143] The processing circuit may be configured, for example, to classify objects based on zone data from the first to the nth zone, or zone data from the second to the nth zone, where n is the number of shifts performed by the scanning element in the first direction before the illumination direction is changed to the first illumination direction.

[0144] Generally, the processing circuit may be configured to classify objects based on a predetermined selection of two, three, four, or more zone data from the first to the nth zone, where n is the number of shifts performed by the scanning element in the first direction before the illumination direction is changed to the first illumination direction.

[0145] The processing circuit is configured to perform an output function which outputs a classification signal that assigns an object to at least one of a first class and a second class based on the output of the classification function.

[0146] Figure 6 shows intensity data from materials emitting both fluorescence and phosphorescence, where the first set of sensor pixels detects fluorescence and the second set of sensor pixels detects phosphorescence, and the second set of sensor pixels is different from the first set of sensor pixels, and the first and second sets of sensor pixels belong to the same or different sensors in the spectroscopic system. Figure 6 shows data sequentially from eight acquisition functions (from the first to the eighth acquisition function), where the nth acquisition function has intensity data (y-axis) from the nth period. The first period, marked 1 on the x-axis, shows increasing and decreasing light emission from fluorescence events, detected by the first set of pixels and collected by the first zone acquisition function. The period from the second to the eighth period, marked 8 on the x-axis, shows increasing and decreasing light emission from phosphorus events, detected by the second set of pixels and collected by the second to eighth zone acquisition functions. As seen in Figure 6, the decay of phosphorus events is significantly slower compared to fluorescence events.

[0147] Different characteristics of fluorescence and / or phosphorus events can be used to classify objects. Such characteristics may include presence / absence, intensity above a given threshold, rise time, decay time, and one, two, three, or more of the strongest wavelength bands. These characteristics may be determined for one or both of the fluorescence and / or phosphorus events and can be compared to preset values ​​and / or lookup tables. Additionally or alternatively, one characteristic of one of the events may be compared to one characteristic of the other event. For example, the maximum intensity of a fluorescence event may be compared to the decay time of a phosphorus event. Additionally or alternatively, one characteristic of one of the events may be compared to another characteristic of the same event. For example, the maximum intensity of a phosphorus event may be compared to the decay time of a phosphorus event.

[0148] Figures 7 to 11 show intensity data for fluorescence and / or phosphorus events originating from different types of objects. The graphs clearly demonstrate that intensity data can be used to distinguish different types of materials from one another, based on, for example, peak intensity, rise and decay times, and peak width, and / or the occurrence of one or both fluorescence and / or phosphorus events. In all measurements, the objects were irradiated with an OSRAM LZ4-V4UV0R-0000 365 nm UV LED emitter, and the emitted radiation was recorded.

[0149] Figures 7a, 8a, 9a, and 10a show intensity data as a function of wavelength, with the illuminated objects being white paper, a yellow glowing bottle, a blue marker, and a red marker, respectively. Each line represents a single triggered experiment. Figures 7b, 8b, 9b, and 10b show the corresponding illumination timelines, with the indicated vertical stripes corresponding to different timings of the intensity data in Figures 7a, 8a, 9a, and 10a.

[0150] For example, in Figure 7a, where the illuminated object is white paper, intensity lines are shown for five different experiments at different times, labeled A to E on the timeline in Figure 7b. Times A and E are taken before and after illumination, i.e., under ambient light conditions. Times B, C, and D are the beginning, middle, and end of illumination. As can be seen, there is a spread in the recorded intensity during illumination of the object. However, there is a clear cutoff; that is, no afterglow is recorded after the illumination ends, meaning that in this case, there is only fluorescence and no phosphorescence. The intensity lines also have a characteristic shape.

[0151] Figures 8a,b and 9a,b show similar examples where a yellow bottle and a blue marker are illuminated, respectively. Similar to Figures 7a,b, the times labeled A and E in Figures 8a,b and 9a,b are before and after illumination, respectively. The times labeled B, C, and D are the beginning, middle, and end of illumination. The recorded intensities differ for each object (different peak heights / shapes), but in all cases, only fluorescence is detected. There is afterglow here, i.e., no phosphorescence.

[0152] In Figures 10a and 10b, the illuminated object is a red marker. The times labeled A through E correspond to the same illumination-related times as the corresponding markings in Figures 7 through 9. As in the previous example, the intensity is low at time A, before illumination. The intensity increases at times B and C, i.e., at the beginning and middle of illumination, and reaches its maximum value at time D, which is the end of illumination. At time E, after illumination, a clear intensity peak is still recorded. There is afterglow, i.e., a phosphorescence event is recorded. At time F, which occurs approximately 1.25 ms after the end of illumination, the afterglow is still detectable.

[0153] The intensity data from experiments on different objects in Figures 7 through 10 are simultaneously presented in Figure 11. The groups of peaks labeled M1, M2, M3, and M4 correspond to the white paper, yellow bottle, blue marker, and red marker in Figures 7 through 10, respectively. Figure 11 clearly demonstrates that the materials can be classified based on the height and shape of the obtained intensity peaks.

[0154] Figures 12 to 15 are plots of the average intensity measured during different experiments where the illuminated object was white paper, a yellow glowing bottle, a blue marker, and a red marker, respectively. Thus, each line in Figure 12 represents the average intensity measured at the times labeled A to E in Figures 7a and 7b. Similarly, Figures 13 to 15 represent the average intensity at the times labeled A to E in Figures 8a,b to 10a,b, respectively.

[0155] In Figures 12 to 15, lines labeled "205" (such as "Paper 205" and "Yellow 205") correspond to time A, lines labeled "220" correspond to time B, lines labeled "230" correspond to time C, lines labeled "240" correspond to time D, and lines labeled "250" correspond to time E. In Figures 12 to 14, the average intensity is substantially null at times A and E, before illumination begins and after illumination ends, but characteristic peaks exist at times B, C, and D. In Figure 15, for the red marker, a characteristic peak still exists at time E, after illumination has ended. This indicates the presence of phosphorescence.

[0156] The absence or presence of phosphorescence is clearly shown in Figures 16 and 17, which, respectively, show the maximum intensity recorded across all wavelengths as a function of time for white paper and a red marker. For the white paper in Figure 16, the maximum intensity drops to 0 as soon as the illumination ends. In contrast, for the red marker in Figure 17, there is afterglow; that is, the maximum intensity decreases much more slowly, which indicates the presence of phosphorescence.

[0157] Optionally, the device may be configured such that light radiation 122 from multiple inspection zones, for example, from at least two, at least three, at least four, at least eight, or at least 20 inspections, is simultaneously received by an optical element during a predetermined time interval, the optical element redirects the simultaneously received light radiation to a sensor, where the light radiation simultaneously received from the multiple inspection zones (referred to as simultaneous light radiation) is analyzed by the sensor configuration, and the analyzed simultaneous light radiation comprises a portion of the radiation from each of the multiple inspection zones. In one example, the scanning element and the optical element are configured to simultaneously receive light radiation from at least the second and third inspection zones, and from, for example, the first inspection zone, during at least the second and third time intervals, and simultaneously redirect it towards the sensor configuration.

[0158] For example, if there are four shifts and at least one illumination beam is directed toward the first object passage zone in a fifth illumination direction, the sensor may simultaneously receive light radiation from the first, second, third, fourth, and fifth inspection zones. If the light radiation received from the first inspection zone indicates the color and / or fluorescence of the object in the currently illuminated portion, the light radiation simultaneously received from the second inspection zone indicates phosphorescence of the object in a portion illuminated one period earlier, the light radiation simultaneously received from the third inspection zone indicates phosphorescence of the object in a portion illuminated two periods earlier, the light radiation simultaneously received from the fourth inspection zone indicates phosphorescence of the object in a portion illuminated three periods earlier, and the light radiation simultaneously received from the fifth inspection zone indicates phosphorescence of the object in a portion illuminated four periods earlier. By grouping and selecting data belonging to the same portion of the object over time, information about the light radiation reflected, scattered, or emitted from that portion of the object can be gathered. Similarly, by aggregating and sorting data belonging to multiple different object pieces over time, information about the light radiation reflected, scattered, or emitted from those different pieces can be gathered. Although this example describes the simultaneous use of five inspection zones, the same can be achieved by using any number of inspection zones.

[0159] Simultaneous measurements from multiple inspection zones can improve measurement accuracy, but this is optional. Information about light radiation reflected, scattered, or emitted from a single object or multiple different object pieces may be collected by using only one inspection zone at each time interval.

[0160] According to one exemplary embodiment, the processing circuit of the illustrated apparatus 100 is configured to classify an object based on a first set of characteristics relating to an object 102 in a first detection zone 104. The first set of characteristics may be any set of data, including any type of data. The first set of characteristics may include any number of characteristics. The first set of characteristics is determined based on an output signal S1 from at least one sensor of the spectroscopic system 120. The signal S1 may include any type of data, whether progressed or raw. Thus, the processing circuit is configured to receive and analyze data based on the output signal S1 of the spectroscopic system 120, and to determine the first set of characteristics based on the signal S1.

[0161] The first set of characteristics may indicate at least one of the following: the spectral response of object 102, the material type of the object, the color of the object, the fluorescence of the object, the maturity of the object, the dry material content of the object, the water content of the object, the fat content of the object, the oil content of the object, the calorific value of the object, the presence of bones or fish bones in the object, the presence of pests in the object, the mineral type of the object, the ore type of the object, the defect level of the object, the detection of hazardous biological materials in the object, the presence or absence of the object, the detection of multilayer materials in the object, the detection of fluorescent markers in the object, the quality grade of the object, the physical structure of the surface of the object, and the molecular structure of the object.

[0162] Furthermore, the processing circuit may include processing capabilities that can be used to process the actual raw data from one or more spectrometers of the spectroscopic system 120. This means that the spectroscopic system 120 may be able to determine one or more characteristics that should be included in the first characteristic set. In other words, the processing unit 113 may be configured to simply include already processed data from the spectroscopic system 120 into the first characteristic set.

[0163] For different applications of device 100, typically different characteristics are included in the first set of characteristics. In other words, the first set of characteristics typically exhibits different characteristics for different applications of device 100.

[0164] In applications where waste is recycled, the first set of properties typically includes polymer materials, sleeve materials, and cap materials.

[0165] In applications where fruits or vegetables are sorted, the first set of characteristics typically indicates foreign matter such as polymers, stones, and shells.

[0166] In applications where wood is sorted, the first set of characteristics typically indicates the type of wood and the presence of different materials.

[0167] The device may optionally further include a camera-based sensor arrangement 128, such as a laser triangulation system 124, for determining one or more further parameters of an object, or for measuring an object within the first object passage zone 104 or the second object passage zone 106, the second object passage zone being located entirely or partially upstream or downstream of the first object passage zone.

[0168] For example, a camera-based detector system may be used to determine the height or width of an object passing through in order to facilitate its removal.

[0169] The discharge configuration 112 of the illustrated apparatus 100 is connected to the processing unit 113. The discharge configuration 112 is adapted to discharge objects 102 and, in turn, sort them into first and second classes or multiple classes or fragments. For example, objects 102 may be sorted into one scrap fragment and one usable fragment. In the case of fruits and vegetables, objects 102, i.e., fruits and vegetables, may be sorted into multiple classes based on color, i.e., ripeness level, blemishes, or the presence of foreign materials.

[0170] The discharge and sorting carried out by the discharge configuration 112 may be initiated in response to receiving a signal from the processing unit 113. The signal from the processing unit 113 is typically based on a determined first set of characteristics and / or a determined second set of characteristics. Thus, objects can be sorted based on analysis carried out by the spectroscopic system 120 and / or a camera-based system.

[0171] The signal received in this manner may be a simple on / off signal, or it may be a complex signal that includes, for example, the specific coordinates of the object 102 as it approaches the discharge device 112. In the latter case, the discharge device 112 may thus collide with or grasp a specific object 102 that meets certain criteria, and may do so at a specific location, as a result of the object 102 being discharged and subsequently sorted.

[0172] To carry out the actual discharge and sorting, the discharge configuration 112 may include compressed air jets, pressurized water jets, mechanical fingers, compressed air jet bars, pressurized water jet bars, mechanical finger bars, robotic arms, and mechanical diverters. Thus, the entities and principles used to carry out the discharge and sorting are known in the art themselves.

[0173] As shown in Figure 18, when one VIS spectrometer and one NIR spectrometer are used, and at least one illumination beam comprises one focused UV illumination beam and one focused NIR illumination beam, the following processing of the collected zone data may be performed: The NIR spectrometer detects radiation only from the illuminated inspection zone 1, and the VIS spectrometer detects radiation from inspection zones 1 to n.

[0174] According to one exemplary embodiment, the following procedure may be used to associate each inspection zone data with the same part of the object. Calculate NIR pixels in Zone 1 P_a=pix(z_1) For each zone (i:2..8) Calculate the NIR pixels in zone i: P_b = pix(z_i) Add the VIS spectrum of zone i to all pixels between P_a and P_b. For each NIR pixel (j:P_a..P_b+1) Add VIS pixel j and zone i. P_a=P_b However, z is the cc distance [mm] between the two inspection zones.

[0175] In detection zones 2-8, phosphorescent spectra may occur. Within these zones, the zone with the highest phosphorescence intensity is searched for (maxP(D2,..,D8)). The phosphorescence spectrum of the zone with the highest intensity is considered the phosphorescence spectrum of the measurement. To improve the SNR of the phosphorescence signal, adjacent zones may be used (v_p). In extreme cases, the data is integrated using the TDI (Time Delay Integral) method.

[0176] Additionally or alternatively, two data series may be provided, one from a VIS spectrometer and one from an NIR spectrometer. The following processing may be performed, for example, when processing the data and classifying objects. Each data series is preprocessed, for example, by performing dark subtraction (subtracting a dark criterion), white calibration, and / or temperature calibration. One or both of the data series may also be compensated for ambient light by ambient light subtraction. Subsequently, one or more steps of spectral processing may be performed on one or both of the data series. Spectral processing may involve rise and fall analysis to determine information relating to the rise and fall of different spectra, and / or time-delay integration to integrate the spectra, and / or cross-comparison of several spectra to determine the best spectrum. After one or more optional steps of spectral processing, the model continues with a classification model step, preferably providing one or more NIR datasets representing one or more NIR spectra and one or more VIS datasets representing one or more VIS spectra. One or more NIR datasets may be processed to perform material classification, i.e., to determine what one or more materials a substance is composed of. One or more VIS datasets may be processed to perform fluorescence / phosphorescence classification, where the VIS data is matched against one or more criteria to determine or classify materials / markers based, for example, on features in the fluorescence-phosphorescence spectrum of an object. Optionally, one or more VIS data may be processed to determine or classify the color of an object. The results of the classification model step are then provided to the resulting integration, where the classification results are processed to provide the resulting classification. After the resulting integration, the output may optionally be provided, along with the initial or processed data from the NIR and / or VIS spectrometers, for further object processing such as image processing, washing, or discharge.

[0177] Therefore, it should be understood that the concept of the present invention is not limited to specific components of the described device, as such devices can change. It should also be understood that the terms used herein are intended solely to describe specific variations and are not intended to limit them. It should be noted that, when used herein and in the appended claims, the articles “a,” “an,” “the,” and “said” are intended to mean that there is one or more of those elements unless the context otherwise explicitly specifies. Thus, for example, a reference to “a unit” or “the unit” may include several devices, etc. Also, the terms and similar expressions “equip,” “include,” and “contain” do not exclude other elements. Furthermore, items described as part of a whole can also be used independently.

[0178] A categorized list of embodiments Item 1. Apparatus (100) for classifying an object (102) into at least one of a first class and a second class, Irradiation arrangement (114), Scanning element (136), It is equipped with a spectroscopic system (120), The illumination configuration is adapted to emit at least one illumination beam (116) having light emission, and the illumination beam is configured to induce a photoexcitation event in the photoresponsive portion of the object when the photoresponsive portion of the object is illuminated by the at least one illumination beam. The illumination arrangement further comprises a first optical arrangement (134) adapted to direct and optionally focus at least one illumination beam toward the scanning element for at least a first period of time. The scanning element is configured to redirect at least one illumination beam toward the object passage zone (104) along the illumination direction, thereby illuminating the illuminated area (118) by at least one illumination beam for at least a first period of time when the object is transported on the conveyor belt (108) or free-falling through the object passage zone at a speed of, for example, between 0.4 m / s and 20 m / s. The spectroscopic system (120) comprises a sensor arrangement having one or more sensors (131, 132), the sensor arrangement being adapted to receive and analyze light radiation reflected, scattered, and / or emitted by an object in at least one of a plurality of inspection zones (1 to 8) sequentially arranged in a first direction (140). The first of the multiple examination zones (1) substantially coincides with the irradiated area during the first period, The second inspection zone (2) of the multiple inspection zones is positioned after the first inspection zone (1) with respect to the first direction (140). The third inspection zone (3) among the multiple inspection zones is located after the second inspection zone (2) with respect to the first direction (140). and, The scanning element is further adapted to shift multiple inspection zones and illumination directions in a first direction relative to the object, so that the second inspection zone substantially coincides with the first inspection zone before the shift during the second period following the first period. The scanning element is further adapted to shift multiple inspection zones and the irradiated area in a first direction relative to the object, so that the third inspection zone substantially coincides with the second inspection zone before the shift during the third period after the second period. The spectroscopic system further includes an optical element, which, via a scanning element, • Light radiation emitted by an object in the second inspection zone during the second period, which includes light radiation relating to phosphorescence events arising from photoexcitation events in the first inspection zone during the first period, • Light radiation emitted by an object in the third inspection zone during the third period, which includes light radiation relating to phosphorescence events arising from photoexcitation events in the first inspection zone during the first period, It is configured to receive, It is configured to redirect the received light radiation to at least one of one or more sensors, The sensor placement is further as follows: A second zone acquisition function configured to acquire second zone data based on at least one sensor signal from one or more sensors, wherein the at least one sensor signal relates to light emission emitted by an object in a second inspection zone, and A third zone acquisition function configured to acquire third zone data based on at least one sensor signal from one or more sensors, wherein the at least one sensor signal relates to light emission emitted by an object in the third inspection zone, and the third zone acquisition function A classification function configured to classify objects based on second zone data and third zone data, An output function configured to output a classification signal that assigns an object to at least one of a first class and a second class based on the output of the classification function, A device comprising a processing circuit configured to perform a certain action. Item 2. The scanning element (136) and optical element are further configured to receive light radiation from at least the second inspection zone (2) and the third inspection zone (3) simultaneously during at least the second and third time intervals, and to redirect it toward the sensor placement. The sensor arrangement comprises at least one sensor array, each of which has a plurality of sensor pixels, and the at least one sensor array is arranged such that light radiation reflected, scattered, and / or emitted by an object (102) in each inspection zone is received on each corresponding set of sensor pixels of the at least one sensor array, and the pixels of each corresponding set of sensor pixels are different or only partially overlapping, as described in item 1 of the apparatus (100). Item 3. The optical element is further transmitted via the scanning element (136), • Light emission relating to at least one illumination beam that is reflected and / or scattered by an object (102) in the first inspection zone (1) during the first period, and / or • Light emission from objects related to fluorescence events resulting from photoexcitation events in the first inspection zone during the first period. It is configured to receive The processing circuit further, A first zone acquisition function configured to acquire first zone data based on at least one sensor signal from one or more sensors, wherein the sensor signal relates to light radiation reflected, scattered, and / or emitted by an object in a first inspection zone. It is configured to perform the following actions: The classification function is further configured to classify objects based on the first zone data as well. The apparatus (100) described in any one of items 1 or 2. Item 4. The fluorescent portion of the photoresponsive portion of object (102) emits light emission when irradiated with at least one illumination beam in the first zone (1), the light emission relating to a fluorescence event and comprising light emission in one or more wavelength bands, and each object piece of the fluorescent portion of the photoresponsive portion of the object emits radiation in at least one wavelength band out of one or more wavelength bands when irradiated with at least one illumination beam. At least one illumination beam contains substantially no light emission within one or more wavelength bands. Optionally, at least one illumination beam consists of light emission from at least one low-wavelength range and at least one high-wavelength range, and each of one or more wavelength bands consists of light emission from a wavelength range different from both the low-wavelength range and the high-wavelength range. The apparatus (100) described in any one of items 1 to 3. Item 5. The scanning element (136) is a polygon mirror configured to rotate in a first direction about a rotation axis, and the polygon mirror comprises a set of reflective surfaces arranged successively around the rotation axis. Each reflective surface in the set of reflective surfaces is configured to receive light radiation from a first inspection zone (1), a second inspection zone (2), and a third inspection zone (3) during at least one corresponding period of three consecutive periods. The apparatus (100) described in any one of items 1 to 4. Item 6. The sensor arrangement comprises a first sensor (131) and a first diffraction element, and a second sensor (132) and a second diffraction element, and the optical elements are • Directing light emission within the first wavelength range to only the first diffraction grating of the first and second diffraction gratings, and to only the first sensor of the first and second sensors, • Directing light emission within the second wavelength range to only the second diffraction grating out of the first and second diffraction gratings, and to only the second sensor out of the first and second sensors. It is configured in such a way, The first wavelength range and the second wavelength range are either the same, different, or partially overlapping. The apparatus (100) described in any one of items 1 to 5. Item 7. The sensor arrangement includes a first sensor (131), and the optical element is, • Direct light emission within a first wavelength range towards a first sensor for a first period of time. • Directing light emission within a second wavelength range towards a second sensor during a second period distinct from the first period. It is configured in such a way, The first wavelength range and the second wavelength range are different or only partially overlapping. The apparatus (100) described in any one of the preceding items 1 to 5. Item 8. The apparatus (100) according to any one of items 1 to 7, wherein the irradiation arrangement (114) comprises at least two irradiation arrangements whose optical axes are incident on the scanning element (136) from different directions, and each of the at least two irradiation arrangements is adapted to emit light radiation in different or partially overlapping wavelength ranges, and the light radiation in different or partially overlapping wavelength ranges is emitted simultaneously or sequentially. Item 9. An irradiation configuration (114) is an apparatus (100) according to any one of items 1 to 8, comprising at least one irradiation configuration adapted to emit light radiation in different or partially overlapping wavelength ranges at different time points. Item 10. The apparatus (100) described in any one of items 1 to 9, wherein one of the one or more sensors comprises a sensor array, the sensor array having a plurality of sensor pixels, the plurality of sensor pixels arranged such that light radiation reflected, scattered and / or emitted by an object (102) in a second inspection zone (2) is received on a second set of sensor pixels of the sensor array, and light radiation emitted by an object in a third inspection zone (3) is simultaneously received on a third set of sensor pixels of the sensor array, and the pixels of the first and second sets of sensor pixels are different or only partially the same. Item 11. The apparatus (100) according to Item 10, when the multiple sensor pixels are further arranged such that light radiation emitted by an object (102) in a first inspection zone (1) is received on a first set of sensor pixels of the sensor array, wherein the pixels of the first set of pixels are different from or only partially overlap with the first and second sets of sensor pixels, at least according to Item 2. Item 12. The apparatus comprises a further sensor arrangement adapted to receive and analyze light radiation reflected and / or scattered by objects within the irradiated area, and the processing circuit optionally further, A fourth acquisition function configured to acquire fourth data based on a fourth sensor signal from a further sensor arrangement, wherein the fourth sensor signal relates to light radiation reflected and / or scattered by an object in the illuminated area. A device described in any one of items 1 through 11, configured to perform the following: Item 13. A method for classifying objects (102) to be transported in large quantities into at least one of a first class and a second class, Emitting at least one illumination beam with light emission and directing it toward the object passage zone (104), Irradiating the irradiated area (118) of an object (102) with at least one illumination beam for at least a first time and for at least a first period, wherein the object (102) is transported on a conveyor belt (108) at a speed between 0.4 m / s and 20 m / s in the object passage zone or is free-falling, thereby causing a photoexcitation event in the photoresponsive portion of the object (102). Directioning light radiation toward one or more sensors in a sensor arrangement via a scanning element (136), wherein the light radiation is scattered and / or emitted by an object in at least one of a plurality of inspection zones (1-8) sequentially arranged in a first direction (140), the first inspection zone (1) of the plurality of inspection zones (1-8) substantially coincides with the area to be irradiated (118), and the second inspection zone (2) of the plurality of inspection zones (1-8) is positioned after the first inspection zone with respect to the first direction (140), The scanning element shifts multiple inspection zones and the area to be irradiated in a first direction (140) relative to the object (102) such that the second inspection zone in the second period after the first period substantially coincides with the first inspection zone in the first period. Subsequently, the sensor configuration receives light radiation emitted by an object (102) in the second inspection zone during the second period, wherein the light radiation emitted by the object (102) in the second inspection zone relates to a phosphorescence event resulting from a photoexcitation event. During the second period, collect first phosphorescence data related to the received light emitted by an object (102) in the second inspection zone, The scanning element shifts the multiple inspection zones and the irradiated area in a first direction (140) relative to the object (102) so that the third inspection zone of the third period after the second period substantially coincides with the second inspection zone of the second period. Subsequently, the sensor configuration receives light radiation emitted by an object (102) in the third inspection zone during the third period, wherein the light radiation emitted by the object (102) in the third inspection zone relates to a phosphorescence event resulting from a photoexcitation event. To collect second phosphorescence data related to the received light emitted by an object (102) in the third inspection zone during the third period, The processing circuit classifies the object (102) based on the second zone data and the third zone data, The processing circuit outputs a classification signal that assigns an object to at least one of the first and second classes based on the results of the classification. A method for providing this. Item 14. Receiving light radiation reflected, scattered, and / or emitted by an object (102) in a first inspection zone in one or more sensors of a sensor arrangement during at least a first period, wherein the light radiation reflected and / or scattered by an object in the first inspection zone relates to at least one illumination beam, and the light radiation emitted by an object in the first inspection zone relates to a fluorescence event resulting from a photoexcitation event. Collecting first zone data relating to received light radiation reflected, scattered, and / or emitted by objects within a first inspection area during at least a first period, The method described in item 13, further comprising the above. Item 15. The method according to Item 14, wherein the first zone data is a representation of at least a first spectrum, and classifying an object comprises determining the wavelength distribution of the first spectrum and optionally determining at least one characteristic relating to the shape of the first spectrum, such as the peak height, peak width, and / or peak area of ​​one or more peaks. Item 16. The method according to any one of items 13 to 15, further comprising forming phosphorus data based on at least second and third zone data, wherein the phosphorus data is a representation of at least the second spectrum, such as a phosphorescence spectrum, and classifying an object comprises determining the wavelength distribution of the second spectrum and optionally determining at least one property relating to the shape of the second spectrum, such as the peak height, peak width, and / or peak area of ​​one or more peaks. Item 17. The method according to any one of items 13 to 16, comprising classifying an object, wherein the rise time and / or decay time of a phosphorescent event is determined. Item 18. Classifying objects further involves, At least one property related to the phosphorescence phenomenon of an object, At least one property relating to one of the following: color, transmittance, reflectance, and fluorescence of an object, It includes classifying objects based on The method described in any one of items 13 to 17. Item 19. The method according to Item 18, wherein the step of classifying an object further comprises comparing at least one property relating to the phosphorescence of the object, as well as one or more other properties relating to the corresponding one of the color, transmittance, reflectance, and fluorescence of the object, with data stored in a local or centralized database. Item 20. Classification is further, Determining whether an object is provided with a linker by at least one of image processing and spectral processing, and / or For example, spectral processing to identify one or more materials that make up an object, and / or When determining the multiple materials that make up a single object, it is possible to determine whether the combination of these materials is acceptable or unacceptable. The method according to any one of items 13 to 20, comprising: Item 21. The method according to any one of items 13 to 20, wherein at least one illumination beam that causes a photoexcitation event comprises light emission in the ultraviolet and / or visible wavelength range. Item 22. Emitting and directing at least one illumination beam comprises emitting and directing at least one illumination beam having light emission in one or a combination thereof of the ultraviolet, visible, near-infrared, and infrared wavelength ranges, and / or, Receiving light radiation reflected, scattered, and / or emitted by an object within the first inspection zone comprises receiving light radiation within one or a combination thereof of the ultraviolet, visible, near-infrared, and infrared wavelength ranges. The method described in any one of items 13 to 21. Item 23. Sensor placement is, A first sensor configured to detect light emission in the ultraviolet and / or visible wavelength range, A second sensor configured to detect light emission in the near-infrared and / or infrared light wavelength range, The method according to any one of items 13 to 22, comprising:

Claims

1. An apparatus (100) for classifying an object (102) into at least one of a first class and a second class, Irradiation arrangement (114), Scanning element (136), Spectroscopic system (120), The system comprises a conveyor (108) for transporting the object (102), or a chute optionally including a vibrating feeder for the sliding or free fall of the object (102), The irradiation arrangement is adapted to emit at least one illumination beam (116) having light emission, and the illumination beam is configured to cause a photoexcitation event in the photoresponsive portion of the object (102) when the photoresponsive portion of the object is irradiated by the at least one illumination beam. The illumination arrangement further comprises a first optical arrangement (134) adapted to direct and optionally focus the at least one illumination beam toward the scanning element for at least a first period of time. The scanning element is configured to redirect the at least one illumination beam toward the object passage zone (104) along the illumination direction, so that when the object is transported by the conveyor (108) at a speed between 0.4 m / s and 20 m / s through the object passage zone, or when it is sliding or free-falling by the chute, the illuminated area (118) is illuminated by the at least one illumination beam for at least a first period of time. The spectroscopic system (120) comprises a sensor arrangement having one or more sensors (131, 132), the sensor arrangement being adapted to receive and analyze light radiation reflected, scattered, and / or emitted by the object in at least one of a plurality of inspection zones (1 to 8) sequentially arranged in a first direction (140). The first inspection zone (1) among the plurality of inspection zones substantially coincides with the irradiated area during the first period, The second inspection zone (2) among the plurality of inspection zones is positioned after the first inspection zone (1) with respect to the first direction (140). The third inspection zone (3) among the plurality of inspection zones is positioned after the second inspection zone (2) with respect to the first direction (140), and, The scanning element is further adapted to shift the plurality of inspection zones and the illumination direction in the first direction relative to the object, so that the second inspection zone substantially coincides with the first inspection zone before the shift during the second period following the first period. The scanning element is further adapted to shift the plurality of inspection zones and the irradiated area in the first direction relative to the object, so that the third inspection zone substantially coincides with the second inspection zone before the shift during the third period after the second period. The spectroscopic system further comprises an optical element, the optical element via the scanning element, During the second period, light radiation emitted by the object in the second inspection zone, including light radiation relating to phosphorescence events arising from the photoexcitation events in the first inspection zone during the first period, During the third period, light radiation emitted by the object in the third inspection zone, including light radiation relating to phosphorescence events arising from photoexcitation events in the first inspection zone during the first period, It is configured to receive, The received light radiation is configured to be redirected to at least one of the one or more sensors, The aforementioned sensor arrangement further includes: A second zone acquisition function configured to acquire second zone data based on at least one sensor signal from one or more sensors, wherein the at least one sensor signal relates to the light emission emitted by the object in the second inspection zone, A third zone acquisition function configured to acquire third zone data based on at least one sensor signal from one or more sensors, wherein the at least one sensor signal relates to the light emission emitted by the object in the third inspection zone, A classification function configured to classify the objects based on the second zone data and the third zone data, An output function configured to output a classification signal that assigns the object to at least one of the first and second classes based on the output of the classification function, A device comprising a processing circuit configured to perform a certain action.

2. The scanning element (136) and the optical element are further configured to simultaneously receive light radiation from at least the second inspection zone (2) and the third inspection zone (3) during at least the second and third time intervals, and to redirect it toward the sensor arrangement. The apparatus (100) according to claim 1, wherein the sensor arrangement comprises at least one sensor array, each of the at least one sensor array having a plurality of sensor pixels, the at least one sensor array is arranged such that light radiation reflected, scattered and / or emitted by the object (102) in each inspection zone is received on each corresponding set of sensor pixels of the at least one sensor array, and the pixels of each corresponding set of sensor pixels are different or only partially overlapping.

3. The optical element is further transmitted via the scanning element (136), During the first period, light emission relating to the at least one illumination beam that is reflected and / or scattered by the object (102) in the first inspection zone (1), and / or During the first period, the light emission emitted by the object relating to the fluorescence event resulting from the photoexcitation event in the first inspection zone. It is configured to receive The processing circuit further, A first zone acquisition function configured to acquire first zone data based on at least one sensor signal from one or more sensors, wherein the sensor signal relates to the light radiation reflected, scattered, and / or emitted by the object in the first inspection zone. It is configured to perform the following actions: The classification function is further configured to classify the objects based on the first zone data as well. The apparatus (100) according to claim 1.

4. The fluorescent portion of the photoresponsive portion of the object (102) emits light emission when irradiated with the at least one illumination beam in the first zone (1), the light emission relating to a fluorescence event and comprising light emission in one or more wavelength bands, and each object piece of the fluorescent portion of the photoresponsive portion of the object emits radiation in at least one wavelength band of the one or more wavelength bands when irradiated with the at least one illumination beam. The at least one illumination beam substantially includes light emission within one or more wavelength bands. first, Optionally, the at least one illumination beam consists of light emission from at least one low wavelength range and at least one high wavelength range, and each of the one or more wavelength bands optionally consists of light emission from a wavelength range different from both the low wavelength range and the high wavelength range. The apparatus (100) according to claim 1.

5. The scanning element (136) is a polygon mirror configured to rotate in a first direction about a rotation axis, and the polygon mirror comprises a set of reflective surfaces arranged successively around the rotation axis. Each reflective surface in the set of reflective surfaces is configured to receive light radiation from the first inspection zone (1), the second inspection zone (2), and the third inspection zone (3) during at least one corresponding period of three consecutive periods. The apparatus (100) according to claim 1.

6. The sensor arrangement comprises a first sensor (131) and a first diffraction element, and a second sensor (132) and a second diffraction element, and the optical elements are The light emission within the first wavelength range is directed only to the first diffraction grating among the first and second diffraction gratings, and only to the first sensor among the first and second sensors. The light emission within the second wavelength range is directed only to the second diffraction grating among the first and second diffraction gratings, and only to the second sensor among the first and second sensors. It is configured in such a way, The first wavelength range and the second wavelength range are the same, different, or partially overlapping. The apparatus (100) according to claim 1.

7. The aforementioned sensor arrangement includes a first sensor (131), and the optical element is Light emission within a first wavelength range is directed towards the first sensor for a first period of time. The light emission within the second wavelength range is directed towards the second sensor during a second period distinct from the first period. It is configured in such a way, The apparatus (100) according to claim 1, wherein the first wavelength range and the second wavelength range are different or overlap only partially.

8. The apparatus (100) according to claim 1, wherein the irradiation arrangement (114) comprises at least two irradiation arrangements, the optical axes thereof incident on the scanning element (136) from different directions, each of the at least two irradiation arrangements is adapted to emit light radiation in different or partially overlapping wavelength ranges, and the light radiation in different or partially overlapping wavelength ranges is emitted simultaneously or sequentially.

9. The apparatus (100) according to claim 1, wherein the irradiation configuration (114) comprises at least one irradiation configuration adapted to emit light radiation in different or partially overlapping wavelength ranges at different time points.

10. One of the one or more sensors comprises a sensor array, the sensor array having a plurality of sensor pixels, the plurality of sensor pixels such that light radiation reflected, scattered and / or emitted by the object (102) in the second inspection zone (2) is received on a second set of sensor pixels of the sensor array, and light radiation emitted by the object in the third inspection zone (3) is simultaneously received on the sensor pixels of the sensor array. The apparatus (100) according to claim 1, wherein the pixels of the second and third sets of sensor pixels are arranged to be received on a third set of cells, and the pixels of the second and third sets of sensor pixels are different or only partially the same.

11. The apparatus (100) according to claim 10, wherein the plurality of sensor pixels are further arranged such that light radiation emitted by the object (102) in the first inspection zone (1) is received on a first set of sensor pixels of the sensor array, and the pixels of the first set of pixels are different from or partially overlap with the second and third sets of sensor pixels.

12. The apparatus comprises a further sensor arrangement adapted to receive and analyze light radiation reflected and / or scattered by the object within the irradiated area, and the processing circuit optionally further, A fourth acquisition function configured to acquire fourth data based on a fourth sensor signal from the further sensor arrangement, wherein the fourth sensor signal relates to the light emission reflected and / or scattered by the object in the irradiated area. The apparatus according to any one of claims 1 to 11, configured to perform the following:

13. A method for classifying objects (102) to be transported in large quantities into at least one of a first class and a second class, Emitting at least one illumination beam that emits light and directing it toward the object passage zone (104), Irradiating the irradiated area (118) of the object (102) with the at least one illumination beam for at least a first time and for at least a first period, wherein the object (102) is transported by the conveyor (108) at a speed between 0.4 m / s and 20 m / s in the object passage zone or is free-falling, thereby causing a photoexcitation event in the photoresponsive portion of the object (102), and irradiating the irradiated area. Directioning light radiation toward one or more sensors in a sensor arrangement via a scanning element (136), wherein the light radiation is scattered and / or emitted by the object in at least one of a plurality of inspection zones (1 to 8) sequentially arranged in a first direction (140), the first inspection zone (1) of the plurality of inspection zones (1 to 8) substantially coincides with the irradiated area (118), and the second inspection zone (2) of the plurality of inspection zones (1 to 8) is located after the first inspection zone with respect to the first direction (140), The scanning element shifts the plurality of inspection zones and the irradiated area in the first direction (140) relative to the object (102) such that the second inspection zone in the second period after the first period substantially coincides with the first inspection zone in the first period. Subsequently, the sensor arrangement receives light radiation emitted by the object (102) in the second inspection zone during the second period, wherein the light radiation emitted by the object (102) in the second inspection zone is related to the phosphorescence event arising from the photoexcitation event. Collecting first phosphorescence data related to the received light emitted by the object (102) in the second inspection zone during the second period, The scanning element shifts the plurality of inspection zones and the irradiated area in the first direction (140) relative to the object (102) such that the third inspection zone in the third period after the second period substantially coincides with the second inspection zone in the second period. Subsequently, the sensor arrangement allows the object in the third inspection zone during the third period to be detected. Receiving light radiation emitted by (102), wherein the light radiation emitted by the object (102) in the third inspection zone is related to the phosphorescence event arising from the photoexcitation event, Collecting second phosphorescence data related to the received light emitted by the object (102) in the third inspection zone during the third period, The processing circuit classifies the object (102) based on the second zone data and the third zone data, The processing circuit outputs a classification signal that assigns the object to at least one of the first and second classes based on the result of the classification, A method for providing this.

14. Receiving light radiation reflected, scattered, and / or emitted by the object (102) in the first inspection zone in one or more sensors of the sensor arrangement during at least the first period, wherein the light radiation reflected and / or scattered by the object in the first inspection zone relates to the at least one illumination beam, and the light radiation emitted by the object in the first inspection zone relates to a fluorescence event resulting from the photoexcitation event, Collecting first zone data relating to the received light radiation reflected, scattered, and / or emitted by the object in the first inspection area during at least the first period, The method according to claim 13, further comprising the above.

15. The method according to claim 14, wherein the first zone data is a representation of at least a first spectrum, and classifying the object comprises determining the wavelength distribution of the first spectrum and optionally determining at least one characteristic relating to the shape of the first spectrum, such as the peak height, peak width, and / or peak area of ​​one or more peaks.

16. The method according to claim 13, further comprising forming phosphorus data based on at least the second zone data and the third zone data, wherein the phosphorus data is a representation of at least the second spectrum, such as a phosphorescence spectrum, and classifying the object comprises determining the wavelength distribution of the second spectrum and optionally determining at least one characteristic relating to the shape of the second spectrum, such as the peak height, peak width, and / or peak area of ​​one or more peaks.

17. The method according to claim 13, wherein classifying the object comprises determining the rise time and / or decay time of the phosphorescence event.

18. Classifying the aforementioned objects further involves, At least one characteristic of the object related to the phosphorescence event, At least one characteristic relating to each of the color, transmittance, reflectance, and fluorescence of the object, The method comprises classifying the objects based on the following: The method according to claim 13.

19. The method according to claim 18, wherein the step of classifying the object further comprises comparing the at least one property relating to the phosphorescence of the object, and one or more other properties relating to the corresponding one of the color, transmittance, reflectance, and fluorescence of the object, with data stored in a local database or a centralized database.

20. The aforementioned classification further means Determining whether the object is provided with a linker by at least one of image processing and spectral processing, and / or By spectral processing, one or more materials constituting the object are identified, and / or When determining the multiple materials that constitute a single object piece, it is determined whether the aforementioned combination of these materials is acceptable or unacceptable. The method according to claim 13, comprising:

21. The method according to claim 13, wherein the at least one illumination beam that causes the photoexcitation event comprises light emission in the ultraviolet and / or visible wavelength range.

22. Emitting and directing the at least one illumination beam comprises emitting and directing at least one illumination beam having light emission in one or a combination thereof of the ultraviolet, visible, near-infrared, and infrared wavelength ranges, and / or, Receiving light radiation reflected, scattered, and / or emitted by the object within the first inspection zone comprises receiving light radiation within one or a combination thereof of the ultraviolet, visible, near-infrared, and infrared wavelength ranges. The method according to claim 13.

23. The aforementioned sensor arrangement is, A first sensor configured to detect light radiation within the ultraviolet and / or visible wavelength range, A second sensor configured to detect light emission within the near-infrared and / or infrared light wavelength range, The method according to any one of claims 13 to 22, comprising:

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