Device

JP7913938B2Active Publication Date: 2026-09-01ASAHI KASEI KOGYO KABUSHIKI KAISHA
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Patent Information

Application Number
JP2022151108
Authority / Receiving Office
JP · JP
Patent Type
Patents
Current Assignee / Owner
Filing Date
2022-09-22
Publication Date
2026-09-01
Estimated Expiration
2042-09-22

AI Technical Summary

Benefits of technology

【0010】 本発明によれば、延伸フィルムの耐傷つき性を非破壊的手法により評価するための装置を提供することができる。

✦ Generated by Eureka AI based on patent content.

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Abstract

To provide a device for evaluating a property of scratch resistance of a stretched film using a non-destructive method.SOLUTION: There is provided a device for evaluating a property of scratch resistance of a stretched film using a non-destructive method, comprising an estimation unit that estimates information (e) regarding the property of scratch resistance of the stretched film based on information (a) regarding a film before inflation stretching.SELECTED DRAWING: Figure 4
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Description

[Technical Field]

[0001] The present invention relates to an apparatus for evaluating the scratch resistance of a stretched film by a non-destructive method. [Background Art]

[0002] Wrap films formed of vinylidene chloride-based resins and the like are excellent in oxygen gas barrier properties, water vapor barrier properties (moisture resistance) and transparency, and can be heated in a microwave oven. Therefore, they are widely used for packaging fresh fish, raw meat, processed meat, fresh vegetables, prepared dishes and the like for the purposes of oxygen blocking, moisture proofing and the like.

[0003] Wrap films are usually produced by melt-extruding a resin, followed by stretching, then wound around a paper tube and stored in a decorative box (carton). For example, a wound body wound around a paper tube is automatically inserted into the decorative box from an end of the decorative box. In this process, rubbing between the paper on, for example, the bottom surface of the decorative box and the wound body may cause scratches on the wound body, and such scratches serve as starting points to cause cutting defects during use. Patent Document 1 discloses a method for improving such cutting defects from the aspect of the composition of the wrap film. [Prior Art Literature] [Patent Literature]

[0004] [Patent Document 1] Japanese Unexamined Patent Publication No. 2021-055086 [Summary of the Invention] [Problem to be Solved by the Invention]

[0005] However, it is difficult to completely prevent the occurrence of cutting defects, and once a stretched film is packed, products may be distributed without noticing such scratches. Therefore, it is desired to evaluate the scratch resistance of stretched films to produce stretched films that are not easily scratched.

[0006] One possible method for evaluating the scratch resistance of such stretched films is to rub the stretched film against a box beforehand to assess the occurrence of scratches. However, this destructive method of rubbing the stretched film against a box to assess scratch occurrence is undesirable because, even if the stretched film is not ultimately scratched, it damages the stretched film before shipment.

[0007] Furthermore, if the occurrence of scratches is evaluated in the stretched film state, products that are evaluated as prone to scratches must be discarded, resulting in a significant environmental burden. Therefore, it is preferable to be able to predict the occurrence of scratches based on upstream processes in the manufacturing line, such as the properties of the film before stretching.

[0008] This invention has been made in view of the above-mentioned problems, and aims to provide an apparatus for evaluating the scratch resistance of stretched films by a non-destructive method. [Means for solving the problem]

[0009] In other words, the present invention is as follows. [1] An apparatus for evaluating the scratch resistance of stretched films using non-destructive methods, The system includes an estimation unit that estimates information e regarding the scratch resistance of the stretched film based on information a regarding the film before inflation stretching. Device. [2] The information a includes information a1 regarding the orientation of the film before inflation stretching, The information a1 includes the orientation of MD, the orientation of TD, and / or the MD / TD orientation ratio. The apparatus described in [1]. [3] The aforementioned information a includes, as information a1, information relating to the Raman spectrum. The apparatus described in [1] or [2]. [4] The estimation unit estimates information e based on information a and information b regarding the stretched film. The apparatus described in any one of items [1] to [3]. [5] The information b includes information regarding the heat of fusion, tear strength, degree of crystallinity, crystallite size, and / or index of crystal orientation of the stretched film. The apparatus described in [4]. [6] The estimation unit estimates information e based on the information a and the information c regarding the manufacturing conditions of the film before inflation stretching. The apparatus described in any one of items [1] to [5]. [7] The information c includes information regarding the extrusion conditions, cooling conditions, and / or feed rate of the film before inflation stretching. The apparatus described in [6]. [8] The estimation unit estimates information e based on information a and information d regarding the manufacturing conditions of the stretched film. The apparatus described in any one of items [1] to [7]. [9] The information d includes information regarding the stretching conditions of the stretched film. The apparatus described in [8].

[10] It further includes a learning unit that creates a model based on training data, The training data includes information A about the film before inflation stretching and information E about the scratch resistance of the stretched film. The estimation unit estimates the information e based on the information a using the model. The apparatus described in any one of items [1] to [9].

[11] The aforementioned training data further includes information B regarding the stretched film. The apparatus described in

[10] .

[12] The estimation unit estimates information e based on information a obtained from a measuring device installed inline with the inflation stretcher. further comprising a display control unit that controls display of said information e of the film that has passed through said inline-installed measuring device, The device according to any one of [1] to

[11] .

[13] A method for evaluating scratch resistance of a stretched film by a non-destructive method, wherein an apparatus performs an acquisition step of acquiring information a relating to a film before inflation stretching; an estimation step of estimating information e relating to scratch resistance of the stretched film based on said information a; An apparatus.

[14] A method for evaluating scratch resistance of a stretched film by a non-destructive method, wherein causing an apparatus to execute an acquisition step of acquiring information a relating to a film before inflation stretching, and execute an estimation step of estimating information e relating to scratch resistance of the stretched film based on said information a. A program. Effects of the Invention

[0010] According to the present invention, an apparatus for evaluating scratch resistance of a stretched film by a non-destructive method can be provided. Brief Description of the Drawings

[0011] [Figure 1A] FIG. 1 is a schematic cross-sectional view of a system for producing a film according to the present embodiment. [Figure 1B] FIG. 2 is a schematic perspective view of a film container. [Figure 2A] FIG. 3 is a schematic diagram illustrating one aspect of the apparatus according to the present embodiment. [Figure 2B] FIG. 4 is a schematic diagram illustrating one aspect of the apparatus according to the present embodiment. [Figure 2C] FIG. 5 is a schematic diagram illustrating one aspect of the apparatus according to the present embodiment. [Figure 2D] FIG. 6 is a schematic diagram illustrating one aspect of the apparatus according to the present embodiment. [Figure 3]This block diagram shows an example of the functional configuration of the apparatus of this embodiment. [Figure 4] This is a schematic diagram illustrating the method for evaluating scratch resistance in this embodiment. [Figure 5] This is a schematic diagram showing an example of how the information a and e of this embodiment change over time. [Figure 6] This is a flowchart showing the process in this embodiment. [Modes for carrying out the invention]

[0012] The following describes in detail an embodiment of the present invention (hereinafter referred to as "this embodiment"), but the present invention is not limited thereto, and various modifications are possible without departing from its essence.

[0013] 1. Film manufacturing method First, the method for manufacturing the film will be described. In this embodiment, pellets are extruded into a film shape using an extruder, and the extruded film is stretched using a stretching device.

[0014] The resin contained in the pellets is not particularly limited, but examples include vinylidene chloride resins, polyethylene resins, polypropylene resins, and polyvinyl chloride resins. Furthermore, the pellets may contain known additives such as plasticizers and stabilizers as needed.

[0015] 1.1. Extrusion Process Figure 1A shows a schematic diagram of the film manufacturing method according to this embodiment. As shown in Figure 1A, the extruder 100 may include a drive unit 110, a cylinder 120, a screw 130, a feeder 140, a die 150, and a control unit 160. As an example, the extruder 100 melts and kneads the raw material in the cylinder 120 and extrudes it through the die 150.

[0016] The drive unit 110 rotates the screw 130 inside the cylinder 120, and the extrusion speed and pressure of the kneaded material inside the cylinder can be adjusted by the rotation speed. The cylinder 120 is a cylindrical member that houses the screw 130. As the screw 130 rotates, the kneaded material is pushed through the cylinder 120 from the feeder 140 to the die 150. Multiple screws, for example, two screws 130 may be arranged inside the cylinder 120.

[0017] The screw 130 rotates inside the cylinder 120, kneading the raw material supplied from the feeder 140 and pushing it into the die 150. At this time, the raw material inside the cylinder 120 may be melted by shear heat generated dynamically by the rotation of the screw 130.

[0018] The screw 130 may be configured to allow control of its rotational speed and other properties in response to signals from the control unit 160. This allows for adjustment of the extrusion speed and pressure inside the cylinder. Furthermore, if the components interact with each other during mixing, such as if the additives affect the molecular weight or other physical properties of the resin during mixing, the physical properties of the resulting mixture may be adjusted by controlling the extrusion speed and pressure inside the cylinder using the screw 130.

[0019] The feeder 140 supplies resin, which is the raw material for the compound, such as pellets, and additives to the cylinder 120. Upstream of the feeder 140, separate feeders may be provided for each type of raw material to be supplied, such as a feeder 140a that shares pellets and a feeder 140b that supplies additives. The raw material supplied from the feeder 140 may be pushed out in the direction from the base of the rotating screw 130 toward the opposite tip.

[0020] The feeders 140, 140a, and 140b may each be configured to control the supply amount of each raw material in response to signals from the control unit 160. This allows for adjustment of the proportion of each raw material contained in the kneaded product. Furthermore, if the raw material composition affects the physical properties of the kneaded product, the physical properties of the resulting kneaded product may be adjusted by controlling the proportion of each raw material using the feeders 140, 140a, and 140b.

[0021] The die 150 is the opening from which the kneaded material is extruded from the cylinder 120. Figure 1A shows a configuration in which a tubular film is extruded from a die 150 using a ring-shaped opening to form a sock 310. However, the opening of the die 150 is not limited to this and may be a T-die. The sock 310 is also called a pile.

[0022] The control unit 160 controls the operation of the extruder 100 according to predetermined operating conditions and can also record extrusion conditions measured by various instruments (not shown), such as thermometers and pressure gauges. The control unit 160 may be connected to the drive unit 110, feeder 140, and various instruments by a wired or wireless network N.

[0023] 1.2. Cooling process The sock liquid 320 is injected into the inside of the sock 310, and the outside of the sock 310 is brought into contact with the cold water in the cold water tank 330. As a result, the sock 310 is cooled from both the inside and the outside, and the film that makes up the sock 310 solidifies.

[0024] The distance from die 150 to chilled water bath 330 is called the hot distance. By adjusting this hot distance, the physical properties of the film, such as the crystal period when stretched, can be adjusted.

[0025] 1.3.Stretching process As shown in Figure 1A, the stretching device 200 may include a first roll 210, a second roll 220, a third roll 230, a fourth roll 250, a guide plate 240, a winding roll 260, and a control unit 160. As an example, the stretching device 200 stretches the extruded film to form a stretched film. The stretched film is then wound up to form a rolled-up sheet.

[0026] First, the first roll 210 folds the solidified sock 310 to form the parison 340. The parison 340 may be subjected to tension by the first roll 210 and the second roll 220. Subsequently, air may be injected into the inside of the parison 340 after it has passed through the second roll 220. This opens the parison 340 and forms an annular film. At this time, the sock liquid 320 applied to the inner surface of the sock 310 may act as an opening agent for the parison 340.

[0027] Next, the parison 340, which has been opened between the second roll 220 and the third roll 230, may be reheated to a temperature suitable for stretching. Heating may be carried out with hot water or the like. At this time, any hot water adhering to the outside of the parison 340 may be squeezed out by the third roll 230.

[0028] Furthermore, air may be injected further into the parison 340 after it has passed through the third roll 230 to form bubbles 350. This air pushes the bubbles 350 outward from the inside, stretching the film and yielding a stretched film.

[0029] The process from the first roll 210 to the fourth roll 250 is called the stretching process. The bubble 350 passes through the fourth roll 250 and is folded at the fourth roll 250 to become the double-ply film 360. The double-ply film 360 is wound up on the winding roll 260.

[0030] The stretching ratio of the film in the TD direction may be adjusted primarily by controlling the amount of air. The stretching ratio of the film in the MD direction may be adjusted by controlling the rotational speed of the third roll 230 and the fourth roll 250, or by controlling the distance between the rolls. In addition to adjusting the stretching ratios in the MD and TD directions, the stretching speeds in the MD and TD directions may also be adjusted within a predetermined range. Furthermore, the stretching ratio and stretching speed may be adjusted based on the temperature of the stretching conditions.

[0031] Furthermore, the film manufacturing method of this embodiment may include a relaxation step to relax the film immediately after stretching, a slitting step to slit the film and peel it apart to form a single film, or a trimming step to cut the film to an arbitrary size.

[0032] 1.4. Film container Figure 1B shows a schematic perspective view of the film housing. The film housing 1 comprises a wound film 11 and a storage box 31 for housing the wound film 11. The wound film 11 is made by winding (removing) a predetermined amount of stretched film 13 around the outer circumference 12a of a cylindrical core 12 made of paper or plastic. As shown in the figure, the wound film 11 is housed in the storage box 31 such that the axial direction of the wound film 11 coincides with the longitudinal direction of the storage box 31.

[0033] The storage box 31 is a packaging material used when packing, transporting, displaying, selling, and storing the rolled film 11, and is made of a folding box formed by folding at least one sheet of base paper along multiple fold lines to create an outer shape that is roughly cylindrical. As shown in the figure, the storage box 31 of this embodiment has a storage section 33 having an opening 33a on its upper surface and a lid section 38 that closes this opening 33a.

[0034] Examples of the base paper used to make up the storage box 31 include cardboard, coated cardboard, single-sided corrugated cardboard, and corrugated cardboard, but the invention is not limited to these, and any paper known in the industry can be appropriately selected and used. The base paper may also be made of these materials that have been embossed, printed, laminated with polyethylene, etc. During packaging, transportation, display, sale, and storage, the stretched film 13 may rub against the inside of the storage box 31, potentially causing scratches.

[0035] In this embodiment, the scratch resistance of the stretched film can be evaluated by a non-destructive method based on information a about the film before inflation stretching.

[0036] 3. Equipment The apparatus of this embodiment is for evaluating the scratch resistance of a stretched film using a non-destructive method, and includes an estimation unit that estimates information e regarding the scratch resistance of the stretched film based on information a regarding the film before inflation stretching. The apparatus of this embodiment may also include a display control unit, a learning unit, and the like, as needed.

[0037] This allows for the evaluation of the scratch resistance of stretched films using non-destructive methods. Therefore, it is possible to prevent products from being distributed without the damage being noticed.

[0038] Figures 2A to 2D show the configuration of the apparatus 400 of this embodiment. For example, as shown in Figure 2A, the apparatus 400 of this embodiment may be a terminal 400a independent of the film manufacturing system 500, which is composed of an extruder 100 and a stretching device 200. The terminal 400a may be a terminal used by a user. Here, "terminal" may refer to a desktop computer, laptop computer, tablet, smartphone, handheld computer device, wearable device, etc.

[0039] As shown in Figure 2B, the apparatus 400 in this embodiment may be a server independent of the manufacturing system 500. Users can operate terminal 400a to send various information to the server 400 and receive various information from the server 400.

[0040] As shown in Figure 2C, the apparatus 400 in this embodiment may be a server 400 connected to the manufacturing system 500 via a network N. The manufacturing system 500 may be configured to function as a replacement for terminal 400a in Figure 2B. In this case, the user can operate the manufacturing system 500 instead of terminal 400a to send various information to the server 400 and receive various information from the server 400.

[0041] As shown in Figure 2D, the apparatus 400 of this embodiment may be an apparatus incorporated into the manufacturing system 500. In this case, the apparatus 400 of this embodiment may be integrated with the control unit 160.

[0042] In this embodiment, for example, the device 400 may be connected to other devices via a wired or wireless network N in order to acquire or estimate arbitrary information. Alternatively, the device 400 may acquire at least some of the information shown in Figure 3 from other devices such as servers connected via the network N, or the device may be configured to have at least some of the processing of the functional unit shown in Figure 3 performed by other devices such as servers connected via the network N.

[0043] First, let's describe the embodiment shown in Figure 2A.

[0044] 3.1. Hardware Configuration Referring to Figure 3, the hardware configuration of device 400 will be described. For example, a processor 410, a communication interface 420, and an input / output interface. 430, memory 440, storage 450, and for interconnecting these components Includes one or more communication buses 460.

[0045] Processor 410 processes the code contained in the program stored in storage 450. Alternatively, it executes a process, function, or method implemented by an instruction. Processor 410 , not limited to, but as an example, one or more central processing units (CPUs), MPUs (Microprocessors) (Graphics Processing Unit), GPU (Graphics Processing Unit), Microprocessor (microprocessor) r), processor core, multiprocessor, AS IC (Application-Specific Integrated Circuit), FPGA (Field Programmable Ga Includes te Array, etc., and integrated circuits (IC (Integrated Circuit) chips, LSI (Large Scale) Each actual Each of the processes, functions, or methods disclosed in the implementation form may be implemented.

[0046] The communication interface 420 transmits and receives various types of data with other devices over a network. This communication may be performed via wired or wireless connection, and any communication protocol may be used as long as communication between the devices is possible. For example, the communication interface 420 may be implemented as hardware such as a network adapter, various types of communication software, or a combination thereof.

[0047] A network may include, but is not limited to, an ad hoc network, intranet, extranet, virtual private network (VPN), local area network (LAN), wireless LAN (WLAN), wide area network (WAN), wireless WAN (WWAN), metropolitan area network (MAN), part of the internet, part of the public switched telephone network (PSTN), mobile phone network, ISDNs (Integrated Service Digital Networks), wireless LANs, LTE (Long Term Evolution), CDMA (Code Division Multiple Access), Bluetooth (registered trademark), satellite communications, etc., and may be a combination of these. A network may include one or more networks.

[0048] The input / output interface 430 includes an input device for inputting various operations to the device 400, and an output device for outputting processing results processed by the device 400. For example, the input / output interface 430 includes information input devices such as a keyboard, mouse, and touch panel, and information output devices such as a display. The device 400 may accept predetermined inputs or perform predetermined outputs by connecting an external input / output interface 430.

[0049] For example, device 400 may be connected via a wired or wireless network N to other devices that record data such as information a to d. This allows device 400 to always use the latest data and models based on that data, for example, by having the other devices keep the data such as information a to d up to date. In addition, it reduces the waste of multiple devices 400 individually accumulating and calculating this information such as information a to e. Here, the other devices may be servers that provide data on request.

[0050] Memory 440 temporarily stores programs loaded from storage 450, It provides a workspace for the processor 410. The memory 440 is used by the processor 410. Various data generated while the program is running are also temporarily stored here. Memory 4 40 is, for example, DRAM, SRAM, DDR RAM or other random access solid-state memory. This can be high-speed random access memory such as a storage device, and these can be combined That's good too.

[0051] The storage 450 stores programs, various functional units, and various data. The storage 450 may be, for example, one or more magnetic disk storage devices, optical disk storage devices, flash memory devices, or other non-volatile memory such as non-volatile solid-state storage devices, or a combination of these. Another example of the storage 450 is one or more storage devices installed remotely from the processor 410.

[0052] In one embodiment of the present invention, the storage 450 stores a program, a functional unit, and a data structure, or a subset thereof. The device 400 is configured to function as an estimation unit 454, as shown in Figure 3, by having the processor 410 execute instructions contained in the program stored in the storage 450.

[0053] The operating system 451 includes, for example, procedures for handling various basic system services and for executing tasks using hardware.

[0054] The network communication unit 452 is used, for example, to connect the device 400 to another computer via the communication interface 420 and one or more communication networks such as the Internet, other wide area networks, local area networks, and metropolitan area networks.

[0055] 3.1.1. Acquisition part The acquisition unit 453 acquires information a about the film before inflation stretching. The acquisition unit 453 may also acquire information b about the stretched film, information c about the manufacturing conditions of the film before inflation stretching, and information d about the manufacturing conditions of the stretched film, as needed.

[0056] Information a regarding the film before inflation stretching may be obtained from a measuring device 280 installed inline with the stretching device 200, or the information may be obtained from another measuring device by sampling the film before inflation stretching.

[0057] The acquisition unit 453 may acquire these pieces of information a to d from other devices, for example, via a network N. Alternatively, the acquisition unit 453 may acquire pieces of information a to d from a manufacturing system 500 via a network. Furthermore, the acquisition unit 453 may acquire these pieces of information a to d through user input via an input / output interface.

[0058] Furthermore, the acquisition unit 453 may store the acquired information a to e in the estimation data 455. The estimation unit 454, which will be described later, may use the information a to e stored in the estimation data 455 for estimation processing.

[0059] Furthermore, the acquisition unit 453 may store information e regarding the scratch resistance of the stretched film, which is estimated by the estimation unit 454 (described later), in the estimation data 455.

[0060] 3.1.2. Estimation part As a result of diligent research by the present inventors, it has been found that the scratch resistance of a stretched film is affected by the condition of the film before stretching. In view of this, the estimation unit 454 of this disclosure estimates information e regarding the scratch resistance of the stretched film based on information a regarding the film before inflation stretching, which is obtained by the acquisition unit 453.

[0061] Information a regarding the film before inflation stretching is not particularly limited, but includes, for example, information a1 regarding the orientation of the film before inflation stretching. Information a1 may include the orientation of the MD, the orientation of the TD, and / or the MD / TD orientation ratio. In this disclosure, TD means the width direction, and MD means the length direction or machine direction.

[0062] Furthermore, the film before stretching is in an amorphous state, and its state may change over time. Therefore, when analyzing the structure of the amorphous portion of the film before stretching, for example, the orientation of the film after being left to stand for 30 minutes after extrusion may be measured and used as information a above.

[0063] Furthermore, information a may include information a1, which includes information about the Raman spectrum, and the orientation of MD and TD may include information about the Raman spectrum. More specifically, the orientation can be evaluated by comparing the MD spectrum and the TD spectrum of the film before stretching. For example, one may focus on a predetermined CC stretching peak and use its peak intensity ratio (vertical / horizontal) as a parameter indicating the degree of orientation. The peak intensity ratio (vertical / horizontal) may also be used as the MD / TD orientation ratio.

[0064] Furthermore, information a may include information about raw materials. Information about raw materials is not particularly limited, but could include, for example, information about the resins that make up the film or other components of the film that are not resins. Na Some examples include:

[0065] The acquisition unit 453 may acquire information a from a measuring device 280 installed inline with the inflation stretcher. The estimation unit 454 may also estimate scratch resistance information e based on the information a acquired from the measuring device 280 installed inline with the inflation stretcher. This makes it possible to acquire scratch resistance information e for the film being manufactured. Therefore, if the film being manufactured has poor scratch resistance, manufacturing can be stopped immediately, preventing the production of any more defective products.

[0066] Scratch resistance information e is information regarding whether or not the stretched film is easily scratched. For example, scratch resistance information e may be estimated information of the expected results if an evaluation method for evaluating scratch resistance were performed.

[0067] For example, Figure 4 shows a schematic diagram of the scratch resistance evaluation method. For example, 15 rolls of film prepared in the examples and comparative examples are manufactured by winding 50 m of film, each 22 cm wide, onto a paper tube. In this case, the distance between one end of the paper tube and the end of the film is 5 mm. Next, assuming the slitting, rewinding, and boxing processes immediately after film formation, one end of the roll immediately after film formation is fixed to a metal jig as shown in Figure 4. The other end is positioned so that its edge contacts the paper used for the cosmetic box attached to the conveyor belt. In this case, the roll is tilted at an angle of 3.7° with respect to the paper of the cosmetic box. With the film end of the roll in contact in this manner, the conveyor is moved 30 cm at a speed of 0.27 m / min so that the film end and the paper of the cosmetic box rub against each other.

[0068] The process of rubbing the end of the film against the paper of the packaging box is repeated four times, changing the position of the film end each time. Specifically, when viewed from the side of the paper tube, the film ends at positions 90° apart are rubbed against the paper of the packaging box. Then, an evaluation is conducted to check for the occurrence of tears or scratches at the four locations. The same operation is performed on all 15 rolls, resulting in a total of 60 rubbing locations (15 rolls x 4 locations). The 60 rubbing locations are then examined, and the percentage of tears or scratches larger than 1 mm in size among the 60 locations may be evaluated.

[0069] The method described above is an example of evaluating scratch resistance using a destructive method. In this disclosure, instead of actually performing such a destructive evaluation, the estimated result of scratch resistance assuming that such an evaluation was performed may be output as the above information e.

[0070] Furthermore, not limited to the method described above, the acquisition unit 453 may output the estimated scratch resistance result as the scratch resistance information e, assuming that the evaluation was performed by other destructive or non-destructive methods.

[0071] When the acquisition unit 453 acquires information b regarding the stretched film, the estimation unit 454 may estimate scratch resistance information e based on information a and information b. Information b is not particularly limited, but may include, for example, information regarding the heat of fusion, tear strength, degree of crystallinity, crystallite size, and / or index of crystal orientation of the stretched film. This allows information about the film after stretching, such as crystalline structure or amorphous structure, to be taken into consideration when estimating scratch resistance information e.

[0072] If the acquisition unit 453 acquires information c regarding the manufacturing conditions of the film before inflation stretching, the estimation unit 454 may estimate scratch resistance information e based on information a and information c. Information c is not particularly limited, but for example, it may include information regarding the extrusion conditions and cooling conditions of the film before inflation stretching. 、 Information regarding feed rate , information regarding the extrusion conditions of the film before stretching, and / or information regarding post-extrusion conditions before stretching, such as sock liquid and cooling conditions. These are some examples.

[0073] If the acquisition unit 453 acquires information d regarding the manufacturing conditions of the stretched film, the estimation unit 454 may estimate scratch resistance information e based on information a and information d. d Examples of such information include, but are not limited to, information regarding the stretching conditions of the stretched film. Examples of stretching conditions for a stretched film include, but are not limited to, stretching temperature, TD stretching ratio, MD stretching ratio, etc.

[0074] 3.1.3. Display Control Unit The apparatus 400 of this embodiment may further include a display control unit 456. The display control unit 456 may control the display of scratch resistance information e on the display device. For example, the display control unit 456 may control the display of scratch resistance information e by representing scratch susceptibility or resistance as a numerical value, or by using colors or predetermined classifications.

[0075] The display control unit 456 may also control the display of scratch resistance information e of the film that has passed through an inline measuring device. The inline measuring device can estimate the scratch resistance information e of the film before stretching or the film about to be stretched in real time.

[0076] Figure 5 shows a schematic diagram illustrating an example of the time-dependent changes in information a and e in this embodiment. In Figure 5, the horizontal axis represents the time axis, and the vertical axis represents the values ​​of information a and e. As shown in Figure 5, the display control unit 456 displays and controls the scratch resistance information e of the film that has passed through the inline measuring device in real time, thereby enabling the rapid cessation of production of products evaluated as having poor scratch resistance. Furthermore, the user can quickly proceed to the task of identifying the factors causing the poor scratch resistance.

[0077] Furthermore, the display control unit 456 may control the display of whether the scratch resistance information e is within the range of threshold F1, within the range of threshold F2, etc. For example, if it is within the range of threshold F1, it may indicate that the scratch resistance is good; if it is between thresholds F1 and F2, it may indicate that the risk of impaired scratch resistance is increasing; and if it is within the range of threshold F2, it may indicate that the risk of impaired scratch resistance is high.

[0078] 3.1.4. Learning Department The apparatus 400 of this embodiment may further include a learning unit 457. The learning unit 457 may collect training data 458 and create a model based on the training data. Using the model thus obtained, the estimation unit 454 may perform each estimation process.

[0079] The training data 458 may include information A about the film before inflation stretching and information E about the scratch resistance of the stretched film. The training data 458 may further include information B about the stretched film, information C about the manufacturing conditions of the film before inflation stretching, or information D about the manufacturing conditions of the stretched film.

[0080] Here, the information E regarding the scratch resistance of the stretched film may be the result of a scratch resistance evaluation method as shown in Figure 4, as described above, or it may be the result of another scratch resistance evaluation method.

[0081] In this disclosure, the information used or estimated by the estimation unit 454 is represented by lowercase letters (information a to e), and the information used by the learning unit 457 is represented by uppercase letters (information A to E). The information represented by uppercase letters may include the same information as the information represented by lowercase letters. For example, information A may include each of the pieces of information exemplified by information a.

[0082] There are no particular restrictions on the method of creating the model, and conventionally known methods can be used. For example, various other models can be adopted, such as logistic regression models, multilayer perceptrons, neural networks such as CNNs (Convolutional Neural Networks) and RNNs (Recurrent Neural Networks), support vector machines using arbitrary kernel functions such as Gaussian kernels, random forests modeled as regression trees, multiple regression analysis, models using hidden Markov models, statistical models, and probabilistic models. It is also possible to adopt a model that combines various models to make a comprehensive judgment.

[0083] Furthermore, the learning unit 457 may periodically collect training data 458 and update the model through retraining.

[0084] 3.2. Operation Processing Next, the operation of the device 400 will be described. Figure 6 is a flowchart showing an example of the processing performed by the device 400.

[0085] 3.2.1. Model Creation In step A01, the learning unit 457 of the device 400 creates a model that estimates fracture-resistant scratch information e based on the training data 458.

[0086] 3.2.2. Acquisition process In step A02, the acquisition unit 453 of terminal 400 acquires information a about the film before inflation stretching. At this time, the acquisition unit 453 of terminal 400 may also acquire information b about the stretched film, information c about the manufacturing conditions of the film before inflation stretching, and information d about the manufacturing conditions of the stretched film.

[0087] 3.2.3. Estimation process In step A03, the estimation unit 454 of terminal 400 estimates scratch resistance information e from the information acquired by the acquisition unit 453. At this time, the estimation unit 454 of terminal 400 may input information a to the above model and output scratch resistance information e.

[0088] Then, in step A04, the display control unit 456 of the terminal 400 may control the display of the estimated information e.

[0089] 3.3 Other embodiments Next, the embodiments shown in Figures 2B to 2D will be described. Figure 2B shows an embodiment in which the device 400 of this embodiment is a server. The user can input information a, etc., to the device 400, which is the server, via terminal 400a, and can obtain scratch resistance information e from the device 400, which is the server, via terminal 400a. In Figure 2B, the device 400 of this embodiment is also referred to as the server 400.

[0090] By using server 400, various types of information can be aggregated on server 400. This makes it possible to build a more accurate estimation model. In addition, by using server 400, even computationally intensive processes can be executed stably on the terminals. Furthermore, since terminal 400a only needs to be able to send and receive various types of information with server 400, existing terminals can be used without developing a new terminal 400a.

[0091] In this embodiment, the server 400 may also use other devices connected via a wired or wireless network N as part of the storage of various information, or as part of the functional unit that performs various processes.

[0092] Figure 2C shows an embodiment in which the device 400 of this embodiment is a server connected to the manufacturing system 500 via a network N. In Figure 2C, the user can input information a to the server 400 via the manufacturing system 500 and obtain scratch resistance information e from the server 400 via the manufacturing system 500. Figure 2C can also be described as an embodiment in which the terminal 400a of Figure 2B is incorporated into the manufacturing system 500 and functions as a single client terminal.

[0093] Figure 2D shows how the device 400 of this embodiment is incorporated into the manufacturing system 500. In Figure 2D, the user can input information a to the device 400 incorporated into the manufacturing system 500 and obtain scratch resistance information e from the device 400 incorporated into the manufacturing system 500. Figure 2D can also be described as how the terminal 400a of Figure 2A is incorporated into the manufacturing system 500.

[0094] 4. Method The method of this embodiment is a method for evaluating the scratch resistance of a stretched film by a non-destructive method, wherein the apparatus performs an acquisition step of acquiring information a about the film before inflation stretching, and an estimation step of estimating information e about the scratch resistance of the stretched film based on information a.

[0095] The specific details of the method in this embodiment are described in the operation processing above, so a detailed explanation is omitted here.

[0096] 5. Program The program of this embodiment is a method for evaluating the scratch resistance of a stretched film by a non-destructive method, and causes the apparatus to perform an acquisition step of acquiring information a about the film before inflation stretching, and an estimation step of estimating information e about the scratch resistance of the stretched film based on information a.

[0097] The program may be recorded on a readable recording medium. The specific details of the processing performed by the program in this embodiment are described in the operation processing section above, so a detailed explanation is omitted here. [Industrial applicability]

[0098] The apparatus of the present invention has industrial applicability as a device for evaluating the scratch resistance of stretched films by non-destructive methods. [Explanation of Symbols]

[0099] 1...Film container, 11...Wound film, 12...Cylindrical core, 13...Stretched film, 31...Storage box, 33a...Opening, 33...Storage section, 38...Lid, 100...Extruder, 110...Drive unit, 120...Cylinder, 130...Screw, 140, 140a, 140b, 140c...Feeder, 150...Die, 160...Control unit, 200...Stretching device, 210...First roll, 220...Second roll, 230...Third roll, 240...Guide plate, 250...Fourth roll, 260...Roll, 280...In-line measuring device, 310...Sock 320...Sock liquid, 330...Chilled water bath, 340...Parison, 350...Bubble, 360...Double ply film, 400...Device, 400a...Terminal, 410...Processor, 420...Communication interface, 430...Input / output interface, 440...Memory, 450...Storage, 451...Operating system, 452...Network communication unit, 453...Acquisition unit, 454...Estimation unit, 455...Estimation data, 456...Display control unit, 457...Learning unit, 458...Learning data, 460...Communication bus, 500...Manufacturing system.

Claims

1. An apparatus for evaluating the scratch resistance of stretched films using non-destructive methods, The system includes an estimation unit that estimates information e regarding the scratch resistance of the stretched film based on information a regarding the film before inflation stretching. Device.

2. The information a includes information a1 regarding the orientation of the film before inflation stretching, The information a1 includes the orientation of MD, the orientation of TD, and / or the MD / TD orientation ratio. The apparatus according to claim 1.

3. The information a includes information a1 regarding the orientation of the film before inflation stretching, The aforementioned information a1 includes information regarding the Raman spectrum, The apparatus according to claim 1.

4. The estimation unit estimates information e based on information a and information b regarding the stretched film. The apparatus according to claim 1.

5. The information b includes information relating to the heat of fusion, tear strength, degree of crystallinity, crystallite size, and / or index of crystal orientation of the stretched film. The apparatus according to claim 4.

6. The estimation unit estimates the information e based on the information a and the information c regarding the manufacturing conditions of the film before inflation stretching. The apparatus according to claim 1.

7. The information c includes information regarding the extrusion conditions, cooling conditions, and / or feed rate of the film before inflation stretching. The apparatus according to claim 6.

8. The estimation unit estimates information e based on information a and information d regarding the manufacturing conditions of the stretched film. The apparatus according to claim 1.

9. The information d includes information regarding the stretching conditions of the stretched film. The apparatus according to claim 8.

10. It further includes a learning unit that creates a model based on training data, The training data includes information A about the film before inflation stretching and information E about the scratch resistance of the stretched film. The estimation unit estimates the information e based on the information a using the model. The apparatus according to claim 1.

11. The aforementioned training data further includes information B regarding the stretched film. The apparatus according to claim 10.

12. The estimation unit estimates the information e based on the information a obtained from a measuring device installed inline with the inflation stretcher. The system further includes a display control unit that controls the display of the information e of the film that has passed through the inline-installed measuring device. The apparatus according to claim 1.

13. A method for evaluating the scratch resistance of stretched films using non-destructive techniques, The device, An acquisition step to obtain information a about the film before inflation stretching, Based on the information a, an estimation step is performed to estimate information e regarding the scratch resistance of the stretched film. method.

14. A program for evaluating the scratch resistance of stretched films using non-destructive methods, In the device, An acquisition step to obtain information a about the film before inflation stretching, Based on the information a, an estimation process is performed to estimate information e regarding the scratch resistance of the stretched film. program.

Citation Information

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