Continuity testing jig and method for testing printed circuit boards

Abstract

To provide a continuity inspection jig to give accurate results over a long period of time.SOLUTION: A continuity inspection jig includes a first member having a plurality of first openings, a second member having a plurality of second openings and located on the first member, a third member having a plurality of third openings and stacked directly below the first member, a support member disposed between the first member and the second member to form a space between the first member and the second member, and a probe passing through one of the plurality of first openings, a space, one of the plurality of second openings, and one of the plurality of third openings. The space is sandwiched between the first member and the second member. The first member has a first surface on a second member side, a second surface on the opposite side to the first surface, and a first recess formed on the side of the first surface. The first recess is formed approximately in the center of the first member. The third member has a third surface faced to the second surface, a fourth surface opposite to the third surface, and a third recess formed on the side of the fourth surface. The third recess is formed approximately in the center of the third member, and the second and third surfaces are approximately flat.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] The technology disclosed in the present specification relates to a continuity testing jig and a method for inspecting a printed wiring board. [Background Art]

[0002] Patent Document 1 discloses a continuity testing jig including a testing probe, a connection body having a plurality of electrode sections, and a holding body for holding the testing probe. The testing probe has a tip end portion and a rear end portion. The tip end portion contacts a test point, and the rear end portion contacts the electrode section. The holding body has a base portion. The base portion has a through hole for guiding the rear end portion of the testing probe to the electrode section. [Prior Art Documents] [Patent Documents]

[0003] [Patent Document 1] Japanese Unexamined Patent Application Publication No. 2011-122909 [Summary of the Invention]

[0004] [Problem of Patent Document 1] In the continuity testing jig of Patent Document 1, the testing probe bends when the tip end portion of the testing probe contacts an object to be inspected. When the testing probe bends, it is considered that the testing probe hits the periphery of the through hole in the base portion. It is considered that when the testing probe hits the periphery, a large load is applied to the periphery of the through hole in the base portion. It is considered that the base portion is likely to crack. [Means for Solving the Problem]

[0005] The continuity test jig of the present invention comprises a first member having a plurality of first openings, a second member having a plurality of second openings and located on the first member, a third member having a plurality of third openings and stacked directly below the first member, a support member positioned between the first member and the second member to form a space between the first member and the second member, and a probe that passes through one of the plurality of first openings, the space, one of the plurality of second openings, and one of the plurality of third openings. The space is sandwiched between the first member and the second member, the first member has a first surface on the side of the second member, a second surface opposite to the first surface, and a first recess formed on the side of the first surface, the first recess being formed approximately in the center of the first member, the third member has a third surface facing the second surface, a fourth surface opposite to the third surface, and a third recess formed on the side of the fourth surface, the third recess being formed approximately in the center of the third member, and the second and third surfaces are substantially flat.

[0006] In the continuity test jig of the embodiment of the present invention, the second surface of the first member and the third surface of the third member face each other. That is, the second and third surfaces, which are formed to be almost flat, overlap. The first recess and the third recess do not face each other. When the probe is bent during inspection, it is thought that the probe is likely to hit the area around the first opening of the first member. However, in the continuity test jig of the embodiment of the present invention, since the second surface of the first member and the third surface of the third member overlap, it is thought that sufficient thickness is ensured in the area where the probe makes contact. Therefore, even if a bent probe makes contact during inspection, the first and third members are less likely to crack. According to the embodiment of the present invention, accurate inspection results can be provided over a long period of time. [Brief explanation of the drawing]

[0007] [Figure 1] A schematic cross-sectional view showing the inspection device of the embodiment. [Figure 2A] A schematic cross-sectional view showing the printed circuit board under inspection. [Figure 2B] A schematic plan view showing the electrodes of a printed circuit board. [Figure 3] A perspective view showing an example of a support member. [Modes for carrying out the invention]

[0008] [Embodiment] Figure 1 is a cross-sectional view showing an inspection device 2 and a printed circuit board 120 to be inspected according to an embodiment. The inspection device 2 performs electrical testing of a printed circuit board 120 having wiring. The inspection device 2 has a continuity test jig 4. The continuity test jig 4 is formed by a first member 10, a second member 20, a third member 30, a fourth member, a support member 50, and a plurality of probes 60. It is preferable that there are multiple third members 30. It is preferable that there are multiple fourth members 40. A space SP is formed between the first member 10 and the second member 20. The space SP is sandwiched between the first member 10 and the second member 20. The third member 30 is provided below the first member 10. The fourth member 40 is provided above the second member 20. The first member 10 and the third member 30 are arranged on the substrate 80 side (device side). The second member 20 and the fourth member 40 are arranged on the printed circuit board 120 side (inspection target side). The probe 60 penetrates the fourth member 40, the second member 20, the space SP, the first member 10, and the third member 30. The inspection device 2 further has a substrate 80 having a terminal 82 below the first member 10 and lead wires 84 extending from the terminal 82. The lead wires 84 are electrically connected to a tester (not shown).

[0009] An example of the printed circuit board 120 to be inspected is shown in Figure 2A. Figure 2A shows a cross-section of the printed circuit board 120. The printed circuit board 120 includes multiple resin insulating layers 121 and multiple conductor layers 122. The resin insulating layers 121 and conductor layers 122 are stacked alternately. Adjacent conductor layers 122 are connected by via conductors 123. The printed circuit board 120 has a surface F and a back surface S opposite to the surface F. The surface F has multiple electrodes 127. Figure 2B is a plan view of the electrodes 127. Figure 2B shows two adjacent electrodes 127. The pitch P between adjacent electrodes 127 is shown in Figures 2A and 2B. The pitch P is the distance between the centers of adjacent electrodes 127.

[0010] As shown in Figure 1, the first member 10 has a first surface 12 (top surface in the figure) on the side of the second member 20 and a second surface 14 (bottom surface in the figure) on the opposite side of the first surface 12. The first surface 12 faces the space SP. The second surface 14 faces the third member 30. The first member 10 has a first recess 16. The first recess 16 is formed approximately in the center of the first member 10. The first recess 16 is formed on the side of the first surface 12. The first recess 16 is connected to the space SP. The second surface 14 is formed almost flat.

[0011] The first member 10 has a first central portion 17 and a first outer portion 15 located outside the first central portion 17. The first central portion 17 and the first outer portion 15 are connected. The thickness of the first central portion 17 is thinner than the thickness of the first outer portion 15. The first central portion 17 forms the bottom of the first recess 16. The first outer portion 15 surrounds the first central portion 17. Multiple first openings 18 are formed in the first central portion 17. A probe 60 passes through each first opening 18. For example, the first member 10 is made of resin. The bending strength of the first member 10 is less than 300 MPa.

[0012] Multiple third members 30 are stacked beneath the first member 10. There are four third members 30. In the modified example, there is one or more third members 30. Each third member 30 has a third surface 32 (top surface in the figure) on the side of the second member 20 and a fourth surface 34 (bottom surface in the figure) on the opposite side of the third surface 32. The third surface 32 of the uppermost third member 30 faces the first member 10. The uppermost third member 30 is positioned directly below the first member 10. The fourth surface 34 of the bottommost third member 30 faces the substrate 80. Each third member 30 has a third recess 36. Each third recess 36 is formed approximately in the center of the third member 30. The third recess 36 of the uppermost third member 30 is formed on the side of the fourth surface 34. The third surface 32 of the uppermost third member 30 is formed almost flat. The third recess 36 of the other third members (third members other than the uppermost third member) 30 is formed on the third surface 32 side. The fourth surface 34 of the other third member (lower third member) 30 is formed to be substantially flat. In the modified example, the third recess 36 of the lower third member 30 may be formed on the fourth surface 34 side.

[0013] Each third member 30 has a third central portion 37 and a third outer portion 35 located outside the third central portion 37. The third central portion 37 and the third outer portion 35 are connected. The thickness of the third central portion 37 is thinner than the thickness of the third outer portion 35. The third central portion 37 forms the bottom of the third recess 36. The third outer portion 35 surrounds the third central portion 37. Multiple third openings 38 are formed in the third central portion 37. A probe 60 passes through each third opening 38. For example, the third member 30 is made of resin. The bending strength of the third member 30 is less than 300 MPa.

[0014] The second surface 14 of the first member 10 and the third surface 32 of the uppermost third member 30 face each other. That is, the second surface 14, which is formed to be almost flat, and the third surface 32 of the uppermost third member 30 overlap. The first recess 16 and the third recess 36 of the uppermost third member 30 do not face each other.

[0015] The second member 20 has a fifth surface 22 (bottom surface in the figure) on the side of the first member 10 and a sixth surface 24 (top surface in the figure) on the opposite side of the fifth surface 22. The fifth surface 22 faces the space SP. The sixth surface 24 faces the fourth member 40. The second member 20 has a second recess 26. The second recess 26 is formed approximately in the center of the second member 20. The second recess 26 is formed on the side of the fifth surface 22. The second recess 26 is connected to the space SP. The sixth surface 24 is formed almost flat.

[0016] The second member 20 has a second central portion 27 and a second outer portion 25 located outside the second central portion 27. The second central portion 27 and the second outer portion 25 are connected. The thickness of the second central portion 27 is thinner than the thickness of the second outer portion 25. The second central portion 27 forms the bottom of the second recess 26. The second outer portion 25 surrounds the second central portion 27. Multiple second openings 28 are formed in the second central portion 27. A probe 60 passes through each second opening 28. For example, the second member 20 is made of resin. The bending strength of the second member 20 is less than 300 MPa.

[0017] Multiple fourth members 40 are stacked on top of the second member 20. There are two fourth members 40. In the modified example, there is one or more fourth members 40. Each fourth member 40 has a seventh surface 42 (bottom surface in the figure) on the side of the second member 20 and an eighth surface 44 (top surface in the figure) on the opposite side of the seventh surface 42. The seventh surface 42 of the bottommost fourth member 40 faces the sixth surface 24 of the second member 20. The bottommost fourth member 40 is positioned directly above the second member 20. The eighth surface 44 of the topmost fourth member 40 faces the printed circuit board 120. Each fourth member 40 has a fourth recess 46. Each fourth recess 46 is formed approximately in the center of the fourth member 40. The fourth recess 46 of the bottommost fourth member 40 is formed on the side of the eighth surface 44. The seventh surface 42 of the bottommost fourth member 40 is formed almost flat. The fourth recess 46 of the other fourth members (fourth members other than the bottom fourth member) 40 is formed on the seventh surface 42 side. The eighth surface 44 of the other fourth member (upper third member) 40 is formed to be substantially flat. In the modified example, the fourth recess 46 of the upper fourth member 40 may be formed on the eighth surface 44 side.

[0018] Each fourth member 40 has a fourth central portion 47 and a fourth outer portion 45 located outside the fourth central portion 47. The fourth central portion 47 and the fourth outer portion 45 are connected. The thickness of the fourth central portion 47 is thinner than the thickness of the fourth outer portion 45. The fourth central portion 47 forms the bottom of the fourth recess 46. The fourth outer portion 45 surrounds the fourth central portion 47. Multiple fourth openings 48 are formed in the fourth central portion 47. A probe 60 passes through each fourth opening 48. For example, the fourth member 40 is made of resin. The bending strength of the fourth member 40 is less than 300 MPa.

[0019] The sixth surface 24 of the second member 20 and the seventh surface 42 of the bottommost fourth member 40 face each other. That is, the nearly flat sixth surface 24 and the seventh surface 42 of the bottommost fourth member 40 overlap. The second recess 26 and the fourth recess 46 of the bottommost fourth member 40 do not face each other.

[0020] The support member 50 is arranged between the first member 10 and the second member 20. As shown in FIG. 1 and FIG. 3, the support member 50 substantially encloses the space SP. As shown in FIG. 3, the support member 50 has an upper surface 52 facing the second member 20, a lower surface 54 facing the first member 10, and an opening 56 forming the space SP. The support member 50 is formed of a single member. In a modified example, the support member 50 may be formed of a combination of a plurality of members.

[0021] As shown in FIG. 1, the probe 60 has one end 62 and the other end 64 opposite to the one end 62. The one end 62 protrudes from the fourth member 40. The other end 64 protrudes from the third member 30. The probe 60 is formed of a conductive wire and an insulating film covering a side surface of the conductive wire. The probe 60 has flexibility. One probe 60 passes through one third opening 38, one first opening 18, the space SP, one second opening 28, and one fourth opening 48. During inspection, the one end 62 of the probe 60 is electrically connected to an electrode 127 of a printed wiring board 120. As shown in FIG. 2A, when the printed wiring board 120 has a bump 126 on the electrode 127, the one end 62 comes into contact with the bump 126. During inspection, the other end 64 of the probe 60 is connected to a terminal 82.

[0022] The second opening 28 is not located directly above the first opening 18. The third opening 38 is not located directly below the first opening 18. The fourth opening 48 is not located directly above the second opening 28. The first opening 18, the second opening 28, the third opening 38, and the fourth opening 48 are arranged such that the probes 60 are arranged obliquely. Each of the probes 60 is inclined in the same manner. During inspection, the one end 62 abuts against the electrode 127 or the bump 126 of the printed wiring board 120, and the other end 64 abuts against the terminal 82. At this time, since each of the probes 60 is inclined in the same manner, each of the probes 60 bends in the same direction. All the probes 60 curve in the same direction within the space SP.

[0023] If the probe 60 bends during inspection, the probe 60 presses the wall surface (first wall surface) of the first member 10 exposed by the first opening 18 of the first member 10. Alternatively, the probe 60 presses the corner between the first wall surface and the first surface 12. Alternatively, the probe 60 presses the corner between the first wall surface and the second surface 14. Almost all probes 60 apply stress to the first member 10 in the same manner. Therefore, the first member 10 is likely to receive large stress. However, in the embodiment, the second surface 14 of the first member 10 and the third surface 32 of the third member 30 face each other. That is, the substantially flat formed second surface 14 and third surface 32 overlap each other. The first central portion 17 is reinforced by the third central portion 37. Therefore, even if the first central portion 17 having a small thickness receives stress during inspection, the first central portion 17 is unlikely to break. The first member 10 is unlikely to break. Similarly, the third central portion 37 is reinforced by the first central portion 17. The third central portion 37 and the third member 30 are unlikely to break.

[0024] During inspection, the probe 60 presses the first central portion 17. Alternatively, both the first central portion 17 and the third central portion 37 are pressed. Alternatively, the third central portion 37 is pressed via the first central portion 17. It is considered that the stress received from the probe 60 acts on both the first central portion 17 and the third central portion 37. Therefore, even if the thickness of the first central portion 17 is small, the thickness of the third central portion 37 is added to the thickness of the first central portion 17, so the first central portion 17 is unlikely to break. The first member 10 is unlikely to break. Even if the thickness of the third central portion 37 is small, the thickness of the first central portion 17 is added to the thickness of the third central portion 37, so the third central portion 37 is unlikely to break. The third member 30 is unlikely to break. The continuity inspection jig 4 of the embodiment can provide accurate inspection results over a long period of time.

[0025] During inspection, the second central portion 27 is pressed by the probe 60, similar to the first member 10. The fourth central portion 47 of the bottommost fourth member 40 is pressed by the probe 60. However, the sixth surface 24 of the second member 20 and the seventh surface 42 of the bottommost fourth member 40 are opposite each other. That is, the nearly flat sixth surface 24 and the seventh surface 42 of the bottommost fourth member 40 overlap. The second central portion 27 contributes to preventing cracking of the fourth central portion 47 of the bottommost fourth member 40. The fourth central portion 47 of the bottommost fourth member 40 contributes to preventing cracking of the second central portion 27. The second member 20 and the fourth member 40 are resistant to cracking.

[0026] [Example of modification of the embodiment 1] The continuity test jig 4 in Modified Example 1 does not have a support member 50 that almost completely surrounds the space SP. Instead, a support column is placed between the first member 10 and the second member 20. By placing the support column between the first member 10 and the second member 20, the space SP is formed between the first member 10 and the second member 20. The support column is an example of a support member.

[0027] [Example of modification of the embodiment 2] In the continuity test jig 4 of modification example 2, the fourth member 40 is omitted. Only the second member 20 is placed on top of the space SP. [Explanation of Symbols]

[0028] 2: Inspection equipment 4: Continuity test jig 10: First component 12: 1st page 14:Second side 15: First outer part 16: First recess 17: 1st central part 18: First opening 20: Second component 22:Side 5 24:Side 6 25: Second outer part 26: Second recess 27:Second central part 28: Second opening 30: Third member 32:Side 3 34:Side 4 35: Third outer part 36: Third recess 37: 3rd central part 38: Third opening 50: Support member 60: Probe 120: Printed circuit board SP: Space

Claims

1. A first member having multiple first openings, A second member having multiple second openings and located on the first member, A third member having multiple third openings and stacked directly below the first member, A support member is positioned between the first member and the second member to form a space between the first member and the second member, A continuity test jig comprising a probe passing through one of the plurality of first openings, the space, one of the plurality of second openings, and one of the plurality of third openings, The space is sandwiched between the first member and the second member, the first member has a first surface on the side of the second member, a second surface opposite to the first surface, and a first recess formed on the side of the first surface, the first recess being formed approximately in the center of the first member, the third member has a third surface facing the second surface, a fourth surface opposite to the third surface, and a third recess formed on the side of the fourth surface, the third recess being formed approximately in the center of the third member, and the second surface and the third surface are substantially flat.

2. A continuity test jig according to claim 1, wherein the second member has a fifth surface on the side of the first member, a sixth surface on the opposite side of the fifth surface, and a second recess formed on the side of the fifth surface, the second recess being formed approximately in the center of the second member.

3. A continuity test jig according to claim 1, wherein the first member has a first central portion and a first outer portion located outside the first central portion, the first central portion and the first outer portion are connected, the thickness of the first central portion is thinner than the thickness of the first outer portion, the first central portion forms the bottom of the first recess, and the plurality of first openings are formed in the first central portion.

4. A continuity test jig according to claim 3, wherein the first outer portion surrounds the first central portion.

5. A continuity test jig according to claim 2, wherein the second member has a second central portion and a second outer portion located outside the second central portion, the second central portion and the second outer portion are connected, the thickness of the second central portion is thinner than the thickness of the second outer portion, the second central portion forms the bottom of the second recess, and the plurality of second openings are formed in the second central portion.

6. The continuity test jig according to claim 5, wherein the second outer portion surrounds the second central portion.

7. A continuity test jig according to claim 1, wherein the third member has a third central portion and a third outer portion located outside the third central portion, the third central portion and the third outer portion are connected, the thickness of the third central portion is thinner than the thickness of the third outer portion, the third central portion forms the bottom of the third recess, and the plurality of third openings are formed in the third central portion.

8. The continuity test jig according to claim 7, wherein the third outer portion surrounds the third central portion.

9. A continuity test jig according to claim 1, wherein the first recess is connected to the space.

10. The continuity test jig according to claim 2, wherein the second recess is connected to the space.

11. A continuity test jig according to claim 1, wherein the first member is made of resin.

12. The continuity test jig according to claim 1, wherein the bending strength of the first member is less than 300 MPa.

13. A continuity test jig according to claim 1, wherein the support member substantially encloses the space.

14. A method for inspecting a printed circuit board, comprising inspecting the printed circuit board using the continuity test jig of claim 1.

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