Measurement path generating device, measurement path generating method, and measurement system

Abstract

The measurement path generating device (10) includes a shape model storage unit (101) that stores a shape model of a measurement object, a measurement target curve generating unit (102) that generates a measurement target curve that is a curve on the measurement object surface of the shape model, a reference point calculation unit (104) that calculates a reference point that is a point on the measurement target curve and a normal direction of the measurement object surface at the reference point, and a measurement path generating unit (105) that generates a measurement path that is a moving path for measuring the measurement target curve based on the reference point, the normal direction, a measurable distance range that is a range of measurable distances between the measurement sensor and the measurement target curve, and a measurable angle range that is a range of measurable relative angles between the measurement direction of the measurement sensor and the normal direction of the measurement object surface. The measurement path generating device (10) is capable of generating a measurement path that allows highly accurate on-machine measurement of the measurement object while reducing the time required for measuring the measurement object and the labor of an operator required for measuring the measurement object.

Description

[Technical field]

[0001] The present disclosure relates to a measurement path generating device, a measurement path generating method, and a measurement system for measuring a measurement object on a machine tool using a measurement sensor. [Background technology]

[0002] Conventionally, on-machine measurement is performed to measure the dimensions or shape of a machined workpiece on a machine tool using a measurement sensor such as an optical distance sensor. In on-machine measurement, the measurement sensor is moved relatively to follow the shape of the machined workpiece, and the measurement value obtained from the measurement sensor and the position of the measurement sensor on the machine tool when the measurement value was measured are acquired synchronously. In this case, it is necessary to control the movement path of the measurement sensor for measuring the machined workpiece and the attitude of the measurement sensor on the movement path.

[0003] Patent Document 1 discloses a shape measurement method in which the distance between the surface of the assumed shape of the measurement object and the measurement sensor in the measurement direction is maintained within a predetermined range, while the measurement sensor is moved to roughly trace the surface of the assumed shape to measure the distance. It also discloses controlling the attitude of the measurement sensor so that it is perpendicular to the surface of the assumed shape. The shape measurement method described in Patent Document 1 aims to move the measurement sensor and measure it while maintaining the distance within a measurable distance range even for objects with large undulations.

[0004] Furthermore, Patent Document 2 discloses a method for determining the relative direction between a measurement object and a measurement device along a moving path in order to avoid collision between the measurement object and the measurement device during movement. [Prior art documents] [Patent documents]

[0005] [Patent Document 1] Japanese Patent Application Publication No. 3-21814 [Patent Document 2] Special Publication No. 2010-537184 Summary of the Invention [Problem to be solved by the invention]

[0006] An optical distance measuring sensor, which is a type of measurement sensor, irradiates an output light toward a measurement object and receives the reflected light reflected by the measurement object. The optical distance measuring sensor uses a part of the output light before irradiating the measurement object as a reference light, and measures the distance to the measurement object based on the interference light between the reference light and the reflected light. Here, in order for the optical distance measuring sensor to receive the reflected light, it is sufficient that the measurement direction, which is the direction in which the output light is irradiated from the optical distance measuring sensor, and the normal direction of the surface at the measurement position of the measurement object are within a predetermined angle.

[0007] However, in the techniques described in Patent Documents 1 and 2, the measurement path is not generated taking into consideration that the measurement direction of the measurement sensor and the normal direction of the surface of the measurement object are within a predetermined angle. In such a case, the technique described in Patent Document 1 has a problem in that the time required for measurement increases by performing unnecessary attitude control to make the measurement direction of the measurement sensor perpendicular to the surface of the measurement object.

[0008] Furthermore, with the technology described in Patent Document 2, even if the relative direction between the measurement object and the measurement sensor is determined so as to prevent collision between them, there is no guarantee that the measurement direction of the measurement sensor and the normal direction of the surface of the measurement object are within a predetermined angle, which can result in a measurement path that cannot be used properly, requiring time and effort to correct the measurement path.

[0009] The present disclosure has been made in consideration of the above, and aims to provide a measurement path generation device that is capable of generating a measurement path that enables on-machine measurement of a measurement object with high accuracy while reducing the time required to measure the measurement object on-machine and the effort required by an operator to measure the measurement object. [Means for solving the problem]

[0010] In order to solve the above-mentioned problems and achieve the object, a measurement path generating device according to the present disclosure is a measurement path generating device that generates a measurement path, which is a relative movement path between a measurement sensor and a measurement object, for measuring the measurement object by the measurement sensor on a machine tool. The measurement path generating device includes a shape model storage unit that stores a shape model of the measurement object, a measurement target curve generating unit that generates a measurement target curve that is a curve on the measurement object surface of the shape model, a reference point calculation unit that calculates a reference point that is a point on the measurement target curve and a normal direction of the measurement object curved surface at the reference point, and a measurement path generating unit that generates a measurement path that is a movement path for measuring the measurement target curve based on the reference point, the normal direction, a measurable distance range that is a range of measurable distances between the measurement sensor and the measurement target curve, and a measurable angle range that is a range of measurable relative angles between the measurement direction of the measurement sensor and the normal direction of the measurement object curved surface. The measurement path generation unit determines a measurable area for each reference point where the measurement sensor can measure the object based on the measurable distance range and measurable angle range, calculates the measurement position of the measurement sensor within the measurable area determined for each reference point, and generates a measurement path that minimizes the amount of movement from the previous position of the linear axis and the rotation axis to the next position in the continuous or intermittent movement of the linear axis and the rotation axis when the measurement sensor moves between the measurement positions of the measurement sensor, so that the change in the linear axis and the rotation axis along which the measurement sensor is attached to the machine tool and the measurement sensor moves is minimized. Effect of the Invention

[0011] The measurement path generating device disclosed herein has the advantage of being able to generate a measurement path that enables on-machine measurement of a measurement object with high accuracy while reducing the time required to measure the measurement object on-machine and the effort required by an operator to measure the measurement object. [Brief description of the drawings]

[0012] [Figure 1] FIG. 1 is a diagram showing a configuration example of a measurement system according to a first embodiment; [Diagram 2] FIG. 1 is a diagram showing a configuration of a measurement path generating device according to a first embodiment; [Diagram 3] FIG. 1 is a diagram showing a configuration of a path processing unit included in a measurement path generating device according to a first embodiment; [Figure 4] 1 is a flowchart illustrating an example of an operation procedure of the measurement path generating device according to the first embodiment. [Diagram 5] FIG. 1 is a perspective view illustrating an example of a shape model used in a measurement path generating device according to a first embodiment; [Figure 6] FIG. 4 is a side view of an example of a shape model used in the measurement path generating device according to the first embodiment; [Figure 7] FIG. 1 is a perspective view showing a state in which a measurement target surface of a shape model used in the measurement path generating device according to the first embodiment is specified; [Figure 8] FIG. 1 is a diagram showing how a plane is generated in a shape model used in the measurement path generating device according to the first embodiment; [Figure 9] FIG. 9 is a plan view of FIG. 8. [Figure 10] A top view of Figure 8. [Figure 11] FIG. 1 is a perspective view showing a state in which a measurement target curve is generated on a measurement target curved surface of a shape model used in the measurement path generating device according to the first embodiment; [Figure 12] FIG. 1 is a side view showing a state in which a measurement target curve is generated on a measurement target curved surface of a shape model used in the measurement path generating device according to the first embodiment; [Figure 13] FIG. 1 is a diagram showing how a reference point on a measurement target curve of a shape model used in the measurement path generating device according to the first embodiment and a normal direction of a measurement target curved surface at the reference point are calculated; [Figure 14] FIG. 1 is a diagram showing an example of a measurable area determined based on a measurable distance range and a measurable angle range in a shape model used in the measurement path generating device according to the first embodiment; [Figure 15] FIG. 1 is a first diagram showing a state in which a measurement position and a measurement direction of a measurement sensor for measuring a reference point used in the measurement path generating device according to the first embodiment are calculated; [Figure 16] FIG. 2 is a second diagram showing a state in which a measurement position and a measurement direction of a measurement sensor for measuring a reference point used in the measurement path generating device according to the first embodiment are calculated; [Figure 17] FIG. 3 is a third diagram showing a state in which a measurement position and a measurement direction of a measurement sensor for measuring a reference point used in the measurement path generating device according to the first embodiment are calculated; [Figure 18]FIG. 4 is a fourth diagram showing a state in which a measurement position and a measurement direction of a measurement sensor for measuring a reference point used in the measurement path generating device according to the first embodiment are calculated; [Figure 19] FIG. 5 is a fifth diagram showing a state in which a measurement position and a measurement direction of a measurement sensor for measuring a reference point used in the measurement path generating device according to the first embodiment are calculated; [Figure 20] FIG. 1 is a diagram showing a state in which a measurement path is generated in the measurement path generating device according to the first embodiment; [Figure 21] FIG. 1 is a diagram showing a state in which a measurement path is displayed on a display unit of the measurement path generating device according to the first embodiment; [Figure 22] FIG. 11 is a perspective view showing a state in which a measurement target curve is generated on a measurement target curved surface of a shape model used by the measurement path generating device in the second embodiment; [Diagram 23] FIG. 13 is a diagram showing how a reference point and a normal direction of a measurement target curved surface at the reference point are calculated on a measurement target curve of a shape model used by the measurement path generating device in the second embodiment; [Figure 24] FIG. 11 is a diagram showing an example of a measurable area determined based on a measurable distance range and a measurable angle range in a shape model used in the measurement path generating device in the second embodiment; [Diagram 25] FIG. 1 is a first diagram showing how a measurement path generating device calculates a measurement position and a measurement direction of a measurement sensor in a second embodiment; [Figure 26] FIG. 2 is a second diagram showing how the measurement path generating device calculates the measurement position and measurement direction of the measurement sensor in the second embodiment; [Figure 27] FIG. 11 is a diagram showing how a measurement path generating device generates a measurement path in the second embodiment. [Figure 28] FIG. 13 is a perspective view showing a state in which a measurement target curve is generated on a measurement target curved surface of a shape model used by the measurement path generating device in the third embodiment; [Figure 29] FIG. 13 is a diagram showing how a reference point and a normal direction of a measurement target curved surface at the reference point are calculated on a measurement target curve of a shape model used by the measurement path generating device in the third embodiment; [Diagram 30]FIG. 13 is a diagram showing an example of a measurable area determined based on a measurable distance range and a measurable angle range in a shape model used in the measurement path generating device in the third embodiment; [Diagram 31] FIG. 13 is a diagram showing a state in which a plane R1, which is a plane along which a measurement position can be moved within all measurable areas in a shape model used by the measurement path generating device in the third embodiment, is determined. [Diagram 32] FIG. 13 is a diagram showing how the measurement path generating device calculates the measurement position and measurement direction of the measurement sensor in the third embodiment. [Diagram 33] FIG. 13 is a diagram showing how a measurement path generating device generates a measurement path in the third embodiment. [Diagram 34] FIG. 1 is a diagram showing a configuration in which the functions of the control unit according to the first to third embodiments are realized by hardware. [Diagram 35] FIG. 1 is a diagram showing a configuration in which the functions of the control unit according to the first to third embodiments are realized by software. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0013] DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A measurement path generating device, a measurement path generating method, and a measurement system according to embodiments will be described below in detail with reference to the drawings.

[0014] Embodiment 1 1 is a diagram showing an example of the configuration of a measurement system according to embodiment 1. Measurement system 1 is a system that performs on-machine measurement for measuring a measurement object 30 on a machine tool 20, that is, for measuring the dimensions of the measurement object 30 or the shape of the measurement object 30 on the machine tool 20. Measurement system 1 according to embodiment 1 includes a measurement path generating device 10 and the machine tool 20.

[0015] The machine tool 20 includes a measurement sensor 21, a numerical control device 22, and a servo control unit 23. Furthermore, on the machine tool 20, a measurement object 30, such as an object to be machined, is placed.

[0016] The measurement sensor 21 is installed on at least one of the drive axes of the machine tool 20, and measures the distance to a specified object, in the example of Figure 1, the distance between the measurement object 30 and the measurement sensor 21.

[0017] Numerical control device 22 controls the operation of machine tool 20 to control the machining of a workpiece in machine tool 20. Numerical control device 22 outputs control signals for controlling the operation of machine tool 20, including position commands, speed commands, etc., to servo control unit 23 based on a set program. Similarly, when on-machine measurement is performed using measurement sensor 21 attached to a drive shaft of machine tool 20, numerical control device 22 outputs control signals for controlling the operation of machine tool 20, including position commands, speed commands, etc., to servo control unit 23 based on a set program.

[0018] Servo control unit 23 outputs a servo signal including information such as information on a current for operating a drive shaft of machine tool 20 and an actual position of the drive shaft to a drive shaft of machine tool 20 in response to the output from numerical control device 22, i.e., in response to a control signal output from numerical control device 22. Similarly, when on-machine measurement is performed using measurement sensor 21 attached to a drive shaft of machine tool 20, servo control unit 23 outputs a servo signal including information such as information on a current for operating a drive shaft to which measurement sensor 21 is attached in machine tool 20 and an actual position of the drive shaft to the drive shaft of machine tool 20 in response to the output from numerical control device 22, i.e., in response to a control signal output from numerical control device 22.

[0019] The measurement path generating device 10 generates a measurement path, which is a relative movement path between a measurement sensor 21 and a measurement object 30, for measuring the measurement object 30 by the measurement sensor 21 on a machine tool 20. The measurement path generating device 10 has a computer installed with a measurement path generating program that generates a measurement path.

[0020] Here, the change in the relative position between the measurement sensor and the measurement object is shown as a path, which is called the relative movement path. For example, the position of the measurement sensor 21 with respect to the measurement object 30, i.e., the relative position of the measurement sensor 21 with respect to the position of the measurement object 30, is shown as a coordinate position. Then, the series of changes in the coordinate positions when the measurement sensor 21 and the measurement object 30 move may be shown as a path, which may be called the relative movement path.

[0021] 2 is a diagram showing a configuration of the measurement path generating device according to the first embodiment. The measurement path generating device 10 according to the first embodiment includes an operation unit 11, a path processing unit 12, a storage unit 13, a communication unit 14, and a control unit 15. Information can be exchanged between the components of the measurement path generating device 10.

[0022] The operation unit 11 is an operation receiving unit that receives user operations, i.e., setting operations from a user. The operation unit 11 receives input of user operations and transmits information corresponding to the user operations to components within the measurement path generating device 10. The operation unit 11 is composed of input devices such as a keyboard and a mouse. Note that the measurement path generating device 10 may be configured without including the operation unit 11.

[0023] The path processing unit 12 performs processing to generate a measurement path, which is a moving path measured by the measurement sensor 21, when performing on-machine measurement to measure the dimensions of the measurement object 30 or the shape of the measurement object 30 on the machine tool 20 using the measurement sensor 21. Information on the measurement path generated by the path processing unit 12 is transmitted to the numerical control device 22.

[0024] The storage unit 13 stores various information used for controlling the measurement path generating device 10.

[0025] The communication unit 14 communicates with devices external to the measurement path generating device 10 .

[0026] The control unit 15 controls the operation of the entire measurement path generating device 10 .

[0027] 3 is a diagram showing the configuration of a path processing unit included in the measurement path generating device according to the first embodiment. The measurement path generating device 10 includes a shape model storage unit 101, a measurement target curve generation unit 102, a measurement target surface designation unit 103, a reference point calculation unit 104, a measurement path generation unit 105, a measurement environment information storage unit 106, a display unit 107, an interference determination unit 108, and a measurement program output unit 109. Information can be exchanged between the components of the path processing unit 12.

[0028] The shape model storage unit 101 stores a shape model representing the shape of the measurement object 30, which is input from outside the measurement path generating device 10. Examples of the measurement object 30 include a machined workpiece before machining, a machined workpiece after machining, a fixture for the machined workpiece, a cutting tool, and a structure of the machine tool 20. Methods for inputting the shape model to the shape model storage unit 101 include data conversion from computer aided design (CAD) data, graphic input by an operator operating an input device such as a keyboard, and the like.

[0029] The measurement target curve generating unit 102 generates a measurement target curve which is a curve on a measurement target surface of a shape model of the measurement object 30. The measurement target surface is a curve on the shape model of the measurement object 30 which is the target of on-machine measurement by the measurement sensor 21.

[0030] The measurement target surface designation unit 103 designates a measurement target surface that is to be measured, among a plurality of surfaces that the shape model of the measurement object 30 has.

[0031] The reference point calculation unit 104 calculates a reference point, which is a point on the measurement target curve, and a normal direction of the measurement target curved surface at the reference point.

[0032] The measurement path generation unit 105 generates a measurement path, which is a moving path for measuring the measurement target curve, based on a reference point, a normal direction at the reference point, a measurable distance range which is the range of measurable distances between the measurement sensor 21 and the measurement target curve, and a measurable angle range which is the range of measurable relative angles between the measurement direction of the measurement sensor 21 and the normal direction of the curved surface to be measured.

[0033] The measurement environment information storage unit 106 stores measurement environment information including various conditions related to the measurement environment when the measurement object 30 is measured by the measurement sensor 21. The measurement environment information includes at least one of the type of the measurement sensor, the measurement method of the measurement sensor, the wavelength of the output light of the measurement sensor, the focal length of the measurement sensor, the measurement cycle of the measurement sensor, the material of the measurement object, and the surface roughness of the measurement object.

[0034] The display unit 107 has a display screen and a display control unit that controls the display of information on the display screen, and displays various types of information within the measurement path generating device 10.

[0035] The interference determination unit 108 determines whether or not there is interference between the measurement sensor 21 and the shape model of the object to be measured 30 based on information on the shape model, information on the surface to be measured, information on the measurement target curve, information on the coordinate position of the reference point on the measurement target curve, information on the normal direction of the surface to be measured at the reference point, information on the specifications of the measurement sensor 21, information on the shape of the measurement sensor 21, and information on the measurement position and measurement direction of the measurement sensor 21 for measuring each reference point.

[0036] The measurement program output unit 109 generates a measurement program that describes commands to move the measurement sensor 21 and the measurement object 30 relative to each other along the measurement path generated by the measurement path generation unit 105, based on the configuration of the drive axes of the machine tool 20.

[0037] Next, a description will be given of the operation of the path processing unit 12 of the measurement path generating device 10 configured as above. Fig. 4 is a flowchart showing an example of the procedure of the operation of the measurement path generating device according to the first embodiment.

[0038] First, in step S110, a measurement target surface of a shape model is specified. Specifically, first, the measurement target curve generating unit 102 acquires a shape model stored in the shape model storage unit 101. The shape model of the measurement target object is stored in advance in the shape model storage unit 101 in a shape model storage step.

[0039] Fig. 5 is a perspective view showing an example of a shape model used in the measurement path generating device according to the first embodiment. Fig. 5 shows a shape model M1, which is a shape model expressing the shape of the measurement object 30, and curved surfaces S1 to S15 of the shape model M1 in a perspective view. In the shape model M1, two concave shapes along the Y direction are formed by curved surfaces. Fig. 6 is a side view of an example of a shape model used in the measurement path generating device according to the first embodiment. Fig. 6 shows a side view of the shape model M1 shown in Fig. 5 as viewed from the direction of the arrow A in Fig. 5.

[0040] 5 and 6 is the width direction of the shape model M1. The width direction of the shape model M1 corresponds to the X direction in FIG. 5 and 6. The up and down direction in FIG. 5 and 6 is the height direction of the shape model M1. The height direction of the shape model M1 corresponds to the Z direction in FIG. 5 and 6. In addition, the direction perpendicular to the width direction and the height direction of the shape model M1 is the height direction of the shape model M1. Depth The direction of the shape model M1 Depth The direction corresponds to the Y direction in FIG.

[0041] Next, a measurement target surface, which is a surface to be measured among the multiple surfaces of the shape model, is specified. The measurement target surface is specified from among the multiple surfaces of the shape model in accordance with instruction information input by an operator in a measurement target surface specifying unit 103. The measurement target surface specifying unit 103 transmits measurement target surface specification information, which is information on the surface specified as the measurement target surface, to the measurement target curve generating unit 102.

[0042] Fig. 7 is a perspective view showing a state in which measurement target surfaces of a shape model used in the measurement path generating device according to the embodiment 1 are specified. Fig. 7 shows a state in which surfaces S2 to S14, which are surfaces of an area surrounded by a thick line, are specified as measurement target surfaces of a shape model M1.

[0043] The method of specifying the measurement target surface is not limited to the above-mentioned method, and the measurement target surface may be automatically specified by previously adding an attribute for specifying the measurement target surface to the surface of the shape model stored in the shape model storage unit 101. In this way, when the measurement target curve generating unit 102 acquires the shape model stored in the shape model storage unit 101, The shape model has The measurement target surface is automatically specified in the curved surface. After step S110 is executed, the process proceeds to step S120.

[0044] In step S120, the measurement target curve generating unit 102 generates a measurement target curve on the measurement target surface of the shape model. The measurement target curve represents continuous positions on the measurement target surface measured by the measurement sensor 21. That is, in step S120, a measurement target curve generating step is performed to generate a measurement target curve, which is a curve on the measurement target surface of the shape model.

[0045] The measurement target curve generating unit 102 generates a plane, and generates an intersection line between the plane and the measurement target surface as a measurement target curve. Here, the plane may be specified by an operator by inputting information on the position of the plane and information on the direction of the plane to the path processing unit 12, or may be selected by the operator from information on a plurality of planes prepared in advance in the path processing unit 12. Information on the plurality of planes may be stored, for example, in the shape model storage unit 101, or may be stored in other components of the path processing unit 12, such as the measurement target curve generating unit 102. In addition, not only one plane but also a plurality of planes may be generated, and for example, one plane and a plurality of planes obtained by offsetting the plane at equal intervals in the normal direction of the plane may be generated. In other words, for example, one plane and a plurality of planes arranged at equal intervals in the normal direction of the plane in the depth direction of the shape model may be generated.

[0046] Fig. 8 is a diagram showing a state in which planes are generated in a shape model used in the measurement path generating device according to the first embodiment. Fig. 8 shows a state in which three planes, a first plane PL1, a second plane PL2, and a third plane PL3, are generated in a shape model M1. Fig. 9 is a diagram showing the planes shown in Fig. 8. Fig. 10 is a diagram showing a state in which Fig. 8 is viewed from above. Note that in Fig. 10, the two concave shapes along the Y direction are omitted.

[0047] Fig. 11 is a perspective view showing a state where a measurement target curve is generated on a measurement target surface of a shape model used in the measurement path generating device according to the first embodiment. Fig. 12 is a side view showing a state where a measurement target curve is generated on a measurement target surface of a shape model used in the measurement path generating device according to the first embodiment. Fig. 11 shows a state where a measurement target curve C11, a measurement target curve C12, and a measurement target curve C13 are generated on a shape model M1 as intersecting lines between a plane PL1 to a plane PL3 and a curved surface S2 to a curved surface S14 that are the measurement target surfaces specified in step S110. Fig. 12 shows a state where the shape model M1 shown in Fig. 11 is viewed from the direction of an arrow A in Fig. 11.

[0048] The measurement target curve is not limited to the above-mentioned generation method, and may be generated based on a shape element included in a shape model. For example, the measurement target curve may be generated by using an edge curve of a shape model, which is one of the shape elements included in the shape model, as the measurement target curve, or by performing an operation such as offsetting the edge curve or blending edge curves.

[0049] The measurement target curve generating unit 102 transmits the information on the shape model, the information on the measurement target curved surface, and the information on the measurement target curve to the reference point calculating unit 104. After executing step S120, the process proceeds to step S130.

[0050] In step S130, the reference point calculation unit 104 calculates the coordinate position of the reference point on the measurement target curve and the normal direction of the measurement target curved surface at the reference point. That is, in step S130, a reference point calculation step is performed to obtain the reference point, which is a point on the measurement target curve, and the normal direction of the measurement target curved surface at the reference point. Hereinafter, the normal direction of the measurement target curved surface at the reference point may be simply referred to as the normal direction.

[0051] Specifically, the reference point calculation unit 104 samples a point on the measurement target curve, and the sampled point is set as the reference point. As a method for sampling a point on the measurement target curve, for example, parameters corresponding to the start point and the end point of the measurement target curve are divided at equal intervals, and a position on the measurement target curve is calculated based on each parameter, and the position can be obtained as the reference point. In addition, in order to obtain a reference point corresponding to the curvature of the measurement target curve, a chordal error between a line segment connecting adjacent reference points and the measurement target curve may be determined in advance, and a reference point may be obtained on the measurement target curve so as to satisfy the predetermined chordal error.

[0052] In addition, since the measurement target curve exists on the measurement target curved surface, the calculated reference point also exists on the measurement target curved surface. Therefore, the reference point calculation unit 104 can calculate the normal direction at the position of the reference point on the measurement target curved surface. At this time, in order to obtain a reference point corresponding to the amount of change in the normal direction of the measurement target curve, the amount of change in the normal direction at an adjacent reference point may be obtained, and a reference point may be added on the measurement target curve so as to satisfy a predetermined allowable angle change.

[0053] 13 is a diagram showing how a reference point on a measurement target curve of a shape model used in the measurement path generating device according to the first embodiment and a normal direction of the measurement target curved surface at the reference point are calculated. In FIG. 13, a reference point Q25 is calculated from a reference point Q1 on a measurement target curve C11, and further a normal direction N25 is calculated from a normal direction N1 on the measurement target curved surface at each reference point. Normal Direction N25 is the normal direction of the measurement target curved surface from reference point Q1 to reference point Q25.

[0054] In Fig. 13, a circle indicates a reference point. The same applies to the subsequent figures. In Fig. 13, a unidirectional arrow indicates the normal direction of the measurement target surface at the reference point. In Fig. 13, for example, the normal direction of the measurement target surface at the position of reference point Q1 on the measurement target surface is normal direction N1. Also, the normal direction of the measurement target surface at the position of reference point Q2 on the measurement target surface is normal direction N2. The same applies to the correspondence between the other reference points and normal directions.

[0055] The reference point calculation unit 104 transmits the information on the shape model, the information on the measurement target surface, the information on the measurement target curve, the information on the coordinate position of the reference point on the measurement target curve, and the information on the normal direction of the measurement target surface at the reference point to the measurement path generation unit 105. After executing step S130, the process proceeds to step S140.

[0056] In step S140, the measurement path generating unit 105 generates a measurement path that satisfies the measurable conditions and is a movement path of the measurement sensor 21 that measures the measurement target curve. The measurement path generating unit 105 generates a measurement path so as to satisfy the measurable conditions. That is, in step S140, a measurement path generating step is performed to generate a measurement path that is a movement path that measures the measurement target curve based on the reference point, the normal direction, a measurable distance range that is the range of the measurable distance between the measurement sensor 21 and the measurement target curve, and a measurable angle range that is the range of the measurable relative angle between the measurement direction of the measurement sensor 21 and the normal direction of the measurement target curve.

[0057] First, a measurable distance range and a measurable angle range are set as measurement conditions in the measurement path generating unit 105. The measurement path generating unit 105 sets the measurable distance range and the measurable angle range according to measurement condition setting information that specifies the specific ranges of the measurable distance range and the measurable angle range. The measurement condition setting information is input to the measurement path generating unit 105 by the operator.

[0058] The measurable distance range is a predetermined range of measurable distance between the measurement sensor 21 and the measurement target curve. The measurable distance range is determined by the specifications of the measurement sensor 21.

[0059] The measurable angle range is a predetermined range of measurable relative angles between the measurement direction of the measurement sensor 21 and the normal direction of the curved surface to be measured. The relative angle between the measurement direction of the measurement sensor 21 and the normal direction of the curved surface to be measured is the angle between the measurement direction of the measurement sensor 21 and the normal direction of the curved surface to be measured on a virtual plane that includes the measurement direction of the measurement sensor 21 and the normal direction of the curved surface to be measured. angle The range is determined by the specifications of the measurement sensor 21 .

[0060] Then, the measurement path generating unit 105 determines a measurable area in which the measurement sensor 21 can measure the measurement object 30 based on the measurement possible conditions. Here, the measurement direction of the measurement sensor 21 refers to the attitude of the measurement sensor 21. For example, if the measurement sensor 21 is an optical distance measuring sensor, the direction of output light that the optical distance measuring sensor irradiates toward the measurement object 30 may be the measurement direction. Hereinafter, the measurement direction of the measurement sensor 21 may be simply referred to as the measurement direction.

[0061] Fig. 14 is a diagram showing an example of a measurable area determined based on a measurable distance range and a measurable angle range in a shape model used in the measurement path generating device according to the embodiment 1. Note that the unidirectional arrow in Fig. 14 indicates the normal direction of the measurement target curved surface at the reference point, similarly to Fig. 13.

[0062] In FIG. 14, the measurable distance range Rd1 and the measurable angle range Ra1 are set as predetermined values, and based on the measurable distance range Rd1 and the measurable angle range Ra1, the measurement sensor 21 is set to measure the reference points Q1 to Q25. Measurable area These are shown as measurable areas A1 to A25. When performing measurement by the measurement sensor 21, the measurement sensor 21 can be placed within each of the measurable areas A1 to A25.

[0063] 14, the measurable distance range Rd1 and the measurable angle range Ra1 are shown on the XZ plane, that is, the measurable distance range Rd1 and the measurable angle range Ra1 are shown two-dimensionally, but the measurable distance range Rd1 and the measurable angle range Ra1 can be set three-dimensionally. Therefore, it is sufficient that the measurable distance and the measurable angle are determined three-dimensionally.

[0064] At this time, the measurement path generating unit 105 may set the measurable distance range and measurable angle range, which are the measurement enabling conditions, based on measurement environment information, which is information on the measurement environment stored in the measurement environment information storage unit 106. The measurement environment information may be stored in advance in the measurement environment information storage unit 106, or may be input by an operator to the measurement environment information storage unit 106. The measurement path generating unit 105 may use at least one of the type of the measurement sensor 21, the measurement method of the measurement sensor 21, the wavelength of the output light of the measurement sensor 21, the focal length of the measurement sensor 21, the measurement cycle of the measurement sensor 21, the material of the measurement object 30, and the surface roughness of the measurement object 30, as the measurement environment information.

[0065] The measurement environment information includes various conditions related to the measurement environment when the measurement sensor 21 measures the measurement object 30. The measurement environment information can include, for example, information that the type of the measurement sensor 21 is an optical distance measuring sensor, and information that the measurement method of the measurement sensor 21 is, for example, a frequency scanning interferometry method as disclosed in JP 2017-191815 A. An optical distance measuring device using a frequency scanning interferometry method, which is one of the methods for measuring the distance to a measurement object using light, irradiates a frequency swept light whose frequency changes over time toward the measurement object, and receives the frequency swept light reflected by the measurement object as reflected light. The optical distance measuring device uses a part of the frequency swept light before irradiating the measurement object as a reference light, and measures the distance to the measurement object based on the interference light between the reference light and the reflected light.

[0066] The measurement environment information may also include, for example, information on the shape of the measurement sensor 21, the wavelength of the output light of the measurement sensor 21, and the focal length of the measurement sensor 21, which are specifications of the measurement sensor 21. It may also include information on the material of the measurement object 30, which are specifications of the measurement object 30, and information on the surface roughness of the measurement object 30. A design target value for the surface roughness of the measurement object 30 may be determined in advance for each curved surface of the shape model.

[0067] Here, the measurement path generating unit 105 can predict in advance the intensity of the reflected light of the output light irradiated toward the measurement object 30 and reflected by the measurement object 30 in accordance with the above-mentioned specifications of the measurement sensor 21 or the specifications of the measurement object 30, and can obtain an allowable relative angle for obtaining sufficient reflected light in the measurement sensor 21. This allows the measurement path generating unit 105 to set an appropriate measurable distance range and measurable angle range based on the measurement environment information. Note that the measurable distance range and measurable angle range may be variable values ​​expressed by mathematical expressions rather than fixed values. For example, the measurable distance range may be changed in accordance with the relative angle between the measurement direction and the normal direction of the curved surface.

[0068] Next, the measurement path generating unit 105 calculates the measurement position and measurement direction of the measurement sensor 21 for measuring each reference point. Simply, the measurement path generating unit 105 may determine the measurement position and measurement direction for the measurable area determined for each reference point so that the measurement direction is in the center of the measurable distance range and opposite to the normal direction of the reference point. Here, the normal direction of the reference point and the measurement direction being opposite to each other means that the normal direction of the reference point and the measurement direction are located on the same line and face each other.

[0069] As described above, since the measurable distance range Rd1 and the measurable angle range Ra1 can be set three-dimensionally, the measurement position and measurement direction of the measurement sensor 21 may also be determined within a three-dimensional range.

[0070] At this time, the interference determination unit 108 determines whether or not there is interference between the measurement sensor 21 and the shape model of the measurement object 30. The interference determination unit 108 acquires from the measurement path generation unit 105 information on the shape model, information on the measurement object surface, information on the measurement target curve, information on the coordinate position of the reference point on the measurement target curve, information on the normal direction of the measurement object surface at the reference point, information on the specifications of the measurement sensor 21, information on the shape of the measurement sensor 21, and information on the measurement position and measurement direction of the measurement sensor 21 for measuring each reference point, and determines whether or not there is interference between the measurement sensor 21 and the shape model of the measurement object 30 based on this information. The interference determination unit 108 determines whether or not there is interference between the measurement sensor 21 and the shape model of the measurement object 30 for each reference point. of The determination result is transmitted to the measurement path generating unit 105 .

[0071] Then, if it is determined that the measurement sensor 21 will interfere with the shape model of the measurement object 30, the measurement path generation unit 105 modifies the measurement position and measurement direction of the measurement sensor 21 so as to avoid interference between the measurement sensor 21 and the shape model of the measurement object 30.

[0072] Here, when one measurement position and measurement direction are corrected, the measurement path generating unit 105 corrects the measurement positions and measurement directions around the corrected measurement position and measurement direction in order to suppress the occurrence of abrupt movement of the measurement sensor 21. In other words, when the measurement position and measurement direction of the measurement sensor 21 for one reference point are corrected, the measurement path generating unit 105 corrects the measurement positions and measurement directions of the measurement sensor 21 for reference points around the reference point.

[0073] For example, the measurement path generating unit 105 can correct the measurement position and measurement direction of the measurement sensor 21 so that the movement direction of each drive axis of the machine tool 20 is not reversed, or correct the measurement position and measurement direction of the measurement sensor 21 so that the ratio of the movement amount of the linear axis and the movement amount of the rotational axis of the machine tool 20 does not exceed a predetermined value.

[0074] An example of a method for calculating the measurement position and measurement direction of the measurement sensor 21 for measuring the reference points Q1 to Q3 will be described with reference to Fig. 15 to Fig. 17. In Fig. 15 to Fig. 17, black circles indicate the measurement positions of the measurement sensor 21. In Fig. 15 to Fig. 17, one-way arrows indicate the measurement direction of the measurement sensor 21.

[0075] FIG. 15 is a first diagram showing a state in which the measurement position and measurement direction of the measurement sensor for measuring the reference point used in the measurement path generating device according to the first embodiment are calculated. FIG. 15 shows a state in which the measurement path generating unit 105 calculates the measurement position of the measurement sensor 21 from the measurement position P1 to the measurement position P3, and calculates the measurement direction of the measurement sensor 21 from the measurement direction V1 to the measurement direction V3, for the reference point Q1 to the reference point Q3, so that the measurement direction is the center of the measurable distance range and faces the normal direction of the reference point. Here, in FIG. 15, when the measurement position P3 and the measurement direction V3 of the measurement sensor 21 for measuring the reference point Q3 are set, interference occurs between the curved surface of the shape model M1 and the measurement sensor 21. That is, in FIG. 15, when the measurement position P3 and the measurement direction V3 of the measurement sensor 21 for measuring the reference point Q3 are set, interference occurs between the measurement target curve C11, which is the measurement target curve on the measurement target curved surface of the shape model M1, and the measurement sensor 21.

[0076] Fig. 16 is a second diagram showing a state in which the measurement position and measurement direction of the measurement sensor for measuring the reference point used in the measurement path generating device according to the embodiment 1 are calculated. Fig. 16 shows a state in which the measurement position P3 is corrected to the measurement position P3' and the measurement direction V3 is corrected to the measurement direction V3' in order to avoid interference between the measurement sensor 21 and the curved surface of the shape model when the measurement position P3 and measurement direction V3 of the measurement sensor 21 for measuring the reference point Q3 are set.

[0077] In addition, in order to prevent the measurement sensor 21 from suddenly moving due to the correction of the measurement position and measurement direction of the measurement sensor 21, the measurement position P2 and measurement direction V2 of the measurement sensor 21 for measuring the reference point Q2 are corrected. That is, Fig. 16 shows a state in which the measurement position P2 for the reference point Q2 is corrected to the measurement position P2', and the measurement direction V2 is corrected to the measurement direction V2'.

[0078] Fig. 17 is a third diagram showing how to calculate the measurement positions and measurement directions of the measurement sensor for measuring the reference points used in the measurement path generating device according to the embodiment 1. Fig. 17 shows how the measurement positions of the measurement sensor 21 for measuring from the reference point Q1 to the reference point Q12 are calculated as P1 to P12, respectively, and the measurement directions of the measurement sensor 21 for measuring from the reference point Q1 to the reference point Q12 are calculated as V1 to V12, respectively.

[0079] On the other hand, when it is determined that the measurement sensor 21 interferes with the shape model of the measurement object 30, the interference may not be avoided even if the measurement position and measurement direction of the measurement sensor 21 are corrected within the measurable area relative to the reference point in the measurement path generating unit 105. In such a case, the measurement path generating unit 105 does not calculate the measurement position and measurement direction of the measurement sensor 21 for measuring the reference point, and stores the reference point as a non-measurable reference point.

[0080] An example of a method for calculating the measurement position and measurement direction of measurement sensor 21 for measuring reference points Q13 to Q25 will be described with reference to Figures 18 and 19. In Figures 18 and 19, black circles indicate the measurement positions of measurement sensor 21. In Figures 18 and 19, one-way arrows indicate the measurement direction of measurement sensor 21.

[0081] Fig. 18 is a fourth diagram showing how to calculate the measurement position and measurement direction of the measurement sensor for measuring the reference point used in the measurement path generating device according to the first embodiment. Fig. 18 shows how the measurement path generating unit 105 calculates the measurement position of the measurement sensor 21 from measurement position P13 to measurement position P15, respectively, for the reference point Q13 to reference point Q15, so that the measurement direction is in the center of the measurable distance range and faces the normal direction of the reference point, and calculates the measurement direction of the measurement sensor 21 from measurement direction V13 to measurement direction V15, respectively.

[0082] In FIG. 18, when the measurement position P15 and the measurement direction V15 of the measurement sensor 21 for measuring the reference point Q15 are set, interference occurs between the curved surface of the shape model M1 and the measurement sensor 21. 15 When the measurement position P15 and measurement direction V15 of the measurement sensor 21 for measuring are set, interference occurs between the measurement sensor 21 and the measurement target curve C11, which is the measurement target curve on the measurement target surface of the shape model M1.

[0083] At this time, even if an attempt is made to correct the measurement position and measurement direction of the measurement sensor 21 for measuring the reference point Q15 to avoid interference between the measurement sensor 21 and the curved surface of the shape model M1, the measurement position and measurement direction of the measurement sensor 21 that can avoid interference cannot be found within the measurable area A15 of the reference point Q15 shown in Fig. 18. The measurement path generating unit 105 does not calculate the measurement position and measurement direction of the measurement sensor 21 for measuring the reference point, and stores the reference point Q15 as a non-measurable reference point. Similarly, since a measurement position and measurement direction that can avoid interference between the measurement sensor 21 and the curved surface of the shape model M1 cannot be found for the reference point Q16 to the reference point Q23, the measurement path generating unit 105 does not calculate the measurement position and measurement direction of the measurement sensor 21 for measuring the reference point, and stores the reference point Q16 to the reference point Q23 as a non-measurable reference point.

[0084] Fig. 19 is a fifth diagram showing how to calculate the measurement positions and measurement directions of the measurement sensor for measuring the reference points used in the measurement path generating device according to the first embodiment. Fig. 19 shows how the measurement path generating unit 105 calculates the measurement positions of the measurement sensor 21 as measurement position P13, measurement position P14, measurement position P24, and measurement position P25, respectively, for reference points Q13, Q14, Q24, and Q25, which are reference points that can be measured by the measurement sensor 21, so that the measurement directions are in the center of the measurable distance range and opposite to the normal direction of the reference points, and calculates the measurement directions of the measurement sensor 21 as measurement direction V13, measurement direction V14, measurement direction V24, and measurement direction V25, respectively.

[0085] Then, the measurement path generating unit 105 generates a measurement path that sequentially connects the calculated measurement positions and sets the measurement direction calculated at each measurement position as the measurement direction of the measurement sensor 21 at each measurement position. At this time, the measurement path generating unit 105 distinguishes between the reference points stored as non-measurable reference points. That is, the measurement path generating unit 105 generates a connection path that sequentially connects the measurement position P13, the measurement position P14, the measurement position P24, and the measurement position P25, and does not connect the reference point Q15 stored as the non-measurable reference point to the reference point Q23, leaving them out of the connection path. Note that the measurement path generating unit 105 may generate a path that does not directly connect between the reference points stored as the non-measurable reference points, and approaches the next reference point after retreating in a direction that does not cause interference between the measurement sensor 21 and the measurement target 30.

[0086] Fig. 20 is a diagram showing how a measurement path is generated in the measurement path generating device according to the first embodiment. Fig. 20 shows how a measurement path TP1 is generated by connecting the calculated measurement position P1 to measurement position P14, measurement position P24, and measurement position P25 in that order, with the measurement directions at each measurement position being measurement direction V1 to measurement direction V14, measurement direction V24, and measurement direction V25, respectively. Here, because reference point Q15 to reference point Q23, which are stored as non-measurable reference points, exist between measurement position P14 and measurement position P24, the path connecting measurement position P14 and measurement position P24 is distinguished.

[0087] In step S140 described above, the measurement path generating unit 105 generates information on a measurement path including a plurality of measurement positions, lines connecting the measurement positions, and measurement directions at each measurement position. When a reference point stored as a non-measurable reference point exists, the measurement path generating unit 105 generates information on a non-measurable area, which is an area of ​​the measurement target curve where the non-measurable reference point exists, and information on a detour measurement path that detours the non-measurable area, as part of the measurement path information. In other words, the measurement path generating unit 105 determines an non-measurable area on the measurement target curve where a measurement path cannot be generated, and generates a measurement path including a detour measurement path that avoids the non-measurable area.

[0088] The measurement path generated as described above may be configured to include a plurality of measurement positions, avoid unmeasurable areas at all measurement positions, and satisfy the requirements that the error between the measurement target curve and a line segment connecting positions on the measurement target curve measured at successive measurement positions satisfies a predetermined allowable error.

[0089] The measurement path generating unit 105 transmits the information on the shape model, the information on the measurement target surface, the information on the measurement target curve, the information on the coordinate position of the reference point on the measurement target curve, the information on the normal direction of the measurement target surface at the reference point, and the measurement path information to the display unit 107. After executing step S140, the process proceeds to step S150.

[0090] In step S150, the measurement path is displayed on the display unit 107, and the measurement program is output. Specifically, the shape model stored in the shape model storage unit 101 and from which the measurement path has been generated, the measurement target curve generated in the measurement target curve generation unit 102, and the measurement path generated in the measurement path generation unit 105 for measuring the measurement target curve are displayed on the screen of the display unit 107. At this time, a plurality of measurement target curves and a plurality of measurement paths may be displayed. In this case, the measurement target curve and the measurement path are displayed in association with each other so that the measurement paths corresponding to the respective measurement target curves can be distinguished.

[0091] Here, displaying the measurement target curve and the measurement path in association with each other may mean, for example, displaying a measurement path associated with the measurement target curve and a measurement path not associated with the measurement target curve in a manner that allows a worker to distinguish them when looking at the display screen of the display unit 107. Examples of methods for displaying the measurement target curve and the measurement path in association with each other include displaying the associated measurement target curve and the measurement path in the same color, displaying the associated measurement target curve and the measurement path in the same line width, and displaying the associated measurement target curve and the measurement path in the same line type such as a dashed line or a dotted line.

[0092] The measurement route is displayed by displaying a plurality of measurement positions, lines connecting the measurement positions, and the measurement direction at each measurement position. Furthermore, when a reference point stored as a non-measurable reference point exists, a non-measurable area, which is an area of ​​the measurement target curve where the non-measurable reference point exists, and a detour measurement route that detours around the non-measurable area are displayed separately from the measurement route.

[0093] Here, examples of methods for displaying the unmeasurable area to be distinguished from the measurement target curve include a method for displaying the unmeasurable area in a different color than areas of the measurement target curve that are not unmeasurable, a method for displaying the unmeasurable area with a different line width than areas of the measurement target curve that are not unmeasurable, and a method for displaying the unmeasurable area with a different line type than areas of the measurement target curve that are not unmeasurable.

[0094] In addition, examples of methods for displaying a detour measurement route distinct from a measurement route include displaying the detour measurement route in a different color than the other measurement routes, displaying the detour measurement route in a different line width than the other measurement routes, and displaying the detour measurement route in a different line type than the other measurement routes.

[0095] Fig. 21 is a diagram showing a state in which a measurement path is displayed on a display unit of the measurement path generating device according to the first embodiment. Specifically, Fig. 21 shows a shape model M1, a measurement target curve C11, and a measurement path TP1 for measuring the measurement target curve C11, which are displayed on the display unit 107 of the measurement path generating device 10. Fig. 21 shows a state in which, as the measurement path TP1, measurement position P1 to measurement position P14, measurement position P24, measurement position P25, lines connecting each of the measurement positions, and measurement directions V1 to V14, V24, V25 at each of the measurement positions are displayed.

[0096] 21 also shows how the path connecting measurement position P14 and measurement position P24, which is the measurement path between reference point Q15 stored as the non-measurable reference point and reference point Q23, is displayed with a dashed line. Furthermore, FIG 21 also shows how the area on the measurement target curve C11 where reference points Q15 to Q23 stored as the non-measurable reference points exist is displayed with a dashed line.

[0097] Next, the measurement program output unit 109 generates and outputs a measurement program based on the measurement path generated by the measurement path generation unit 105. At this time, the measurement program output unit 109 stores the configuration of the drive axes of the machine tool 20 in advance, and generates and outputs a measurement program in which commands for relatively moving the measurement sensor 21 and the measurement target 30 along the measurement path based on the configuration.

[0098] The measurement program output unit 109 generates a measurement program describing commands for relatively moving the measurement sensor 21 and the measurement target 30 along the measurement path generated by the measurement path generation unit 105 based on the configuration of the drive axes of the machine tool 20. Furthermore, when the measurement path generation unit 105 determines a non-measurable area on the measurement target curve where a measurement path cannot be generated, the measurement program output unit 109 generates a measurement program describing commands corresponding to the measurement path in the non-measurable area separately from other commands.

[0099] The measurement program is written in a file of a predetermined format using character strings such as G-codes or macro statements. Here, the G-code is, for example, a command code for performing positioning, linear interpolation, circular interpolation, plane designation, etc. by numerical control. At this time, when the measurement path generating unit 105 determines a non-measurable area where a measurement path cannot be generated on the measurement target curve, the command corresponding to the measurement path included in the non-measurable area may be written separately from the area where the measurement path was generated. As a method of writing separately, for example, a section of the measurement path included in the non-measurable area may be written by describing a special G-code or M-code, etc., to distinguish it.

[0100] Furthermore, the measurement program output unit 109 may acquire the measurement environment information from the measurement environment information storage unit 106, calculate conditions such as the feed speed for moving the measurement sensor 21 based on the measurement environment information, and write the calculated conditions in the measurement program. For example, based on the measurement cycle of the measurement sensor, which is the measurement environment information, the relative moving speed between the measurement sensor and the measurement target object 30 may be determined according to the curvature of the measurement target curve so that the interval at which measurements are performed on the measurement target curve for each measurement cycle is constant. Here, measuring on the measurement target curve can be rephrased as, for example, measuring along the measurement target curve, or measuring as if tracing a reference point located on the measurement target curve. Also, the interval at which measurements are performed on the measurement target curve for each measurement cycle is constant means that the interval between positions on the measurement target curve measured for each measurement cycle is constant.

[0101] By executing step S150, a series of measurement path processes in the measurement path generating device 10 is completed.

[0102] The measurement path generating device 10 according to the above-described first embodiment has the effect of being able to perform measurement in a measurement direction other than perpendicular to the measurement target curved surface of the measurement object 30, and to generate a measurement path that can reduce the time required to measure the measurement object 30. In addition, the measurement path generating device has the effect of being able to generate a measurement path that avoids interference between the measurement target curved surface of the measurement object 30 and the measurement sensor 21 and appropriately measures the measurement object 30, and therefore can generate a measurement path that can reduce the effort required for an operator to correct the measurement path.

[0103] The measurement target curve generating unit 102 generates a plane and can easily specify a measurement target curve by using the intersection line between the measurement target surface of the measurement model and the plane, thereby reducing the effort required to generate the measurement target curve.

[0104] The measurement path generation unit 105 determines unmeasurable areas on the measurement target curve where a measurement path cannot be generated, and generates a detour measurement path that avoids the unmeasurable areas, thereby generating a measurement path that can measure only the measurable areas of the measurement object 30, thereby reducing the effort required by the operator to modify the measurement path.

[0105] On the display unit 107, the measurement target curve and the measurement route for measuring on the measurement target curve are displayed in association with each other, thereby making it possible to present to the operator the correspondence between the measurement target curve and the measurement route in an easily understandable manner, thereby reducing the effort required for the operator to check the measurement route.

[0106] In the case where there is an unmeasurable area on the measurement target curve where a measurement path cannot be generated, the display unit 107 displays the unmeasurable area separately from the measurement path, thereby reducing the effort required by the operator to check whether or not the measurement can be performed appropriately using the measurement path.

[0107] The measurement program output unit 109 outputs a measurement program that describes commands to move the measurement sensor 21 and the object to be measured 30 relatively along the measurement path based on the configuration of the drive shaft of the machine tool 20, thereby reducing the effort required for the operator to modify the measurement program to correspond to the configuration of the drive shaft of the machine tool 20.

[0108] When the measurement path generating unit 105 determines a non-measurable area where a measurement path cannot be generated on the measurement target curve, the measurement program output unit 109 outputs a measurement program in which commands corresponding to the measurement path in the non-measurable area are described separately from others. This provides the effect that the machine tool 20 can perform on-machine measurement using the measurement program, thereby making it possible to perform measurement only in areas where the measurement target 30 can be appropriately measured. In the machine tool 20, Operator of This has the effect of reducing the time and effort required to modify the measurement program for areas where measurement cannot be performed.

[0109] The measurement path generating unit 105 uses, as the measurement environment information, information that the type of the measurement sensor 21 is an optical distance measuring sensor, Measurement sensor 21 This has the effect of easily generating a measurement path that enables appropriate measurement of the object to be measured 30 when a non-contact optical distance measuring sensor is used, thereby reducing the effort required for creating a measurement program.

[0110] The measurement path generation unit 105 uses information that the measurement sensor 21 is an optical distance measuring sensor that uses a measurement method to measure the distance to the measurement object 30 by a frequency scanning interference method as measurement environment information, thereby generating a measurement path that allows the measurement object 30 to be appropriately measured when on-machine measurement is performed by the measurement sensor 21, thereby reducing the effort required for creating a measurement program.

[0111] The measurement path generation unit 105 determines the measurable distance range and measurable angle range based on the measurement environment information, thereby determining the measurable distance range and measurable angle range in accordance with the measurement environment, and generating a measurement path that can appropriately measure the measurement object 30 in accordance with the conditions of the measurement sensor or the measurement object 30, thereby reducing the effort required to modify the measurement path.

[0112] The measurement path generation unit 105 uses at least one of the following as measurement environment information: the type of measurement sensor 21, the measurement method of the measurement sensor 21, the wavelength of the output light of the measurement sensor 21, the focal length of the measurement sensor 21, the measurement period of the measurement sensor 21, the material of the measurement object 30, and the surface roughness of the measurement object 30. This has the effect of generating a measurement path that can measure the measurement object 30 with high accuracy in accordance with this measurement environment information, thereby reducing the effort required to modify the measurement path.

[0113] The measurement path generating unit 105 can determine the relative moving speed between the measurement sensor 21 and the measurement target object 30 according to the measurement period of the measurement sensor 21 in the measurement environment information so that the interval between the positions on the measurement target curve measured at each measurement period is constant, and can include the information on the moving speed in the measurement path. This provides an effect that the measurement path generating unit 105 can measure the measurement target curve at appropriate intervals and generate a measurement path that can obtain highly accurate measurement results with less dense and coarse measurement intervals. Then, the measurement program output unit 109 can generate a measurement program in which the moving speed is described based on the measurement path including the information on the moving speed.

[0114] The measurement system 1 according to the above-described embodiment 1 determines the measurable distance range and measurable angle range based on environmental information relating to the machine tool 20, the measurement sensor 21 and the object to be measured 30, thereby making it possible to perform measurement along a measurement path that is optimal for the measurement environment, thereby achieving the effect of obtaining appropriate measurement results without any hassle.

[0115] Therefore, according to the measurement path generating device 10 and measurement system 1 of embodiment 1, it is possible to generate a measurement path that enables on-machine measurement of the measurement object 30 with high accuracy while reducing the time and effort required to measure the measurement object 30.

[0116] Embodiment 2 In the second embodiment, other functions of the measurement path generating device 10 according to the first embodiment will be described. In the second embodiment, the measurement path generating device 10 also basically operates according to the flowchart shown in FIG. 4 described above. Below, differences in the operation of the measurement path generating device 10 from the first embodiment will be described. Other operations of the measurement path generating device 10 are similar to those in the first embodiment, so descriptions thereof will be omitted.

[0117] In the second embodiment, in step S130, the reference point calculation unit 104 calculates the coordinate position of the reference point on the measurement target curve and the normal direction of the measurement target curved surface at the reference point. At this time, when the tangent is discontinuous on the measurement target curve, such as at a corner, the reference point calculation unit 104 calculates two reference points at that position and the normal direction at each of the reference points.

[0118] Fig. 22 is a perspective view showing a state in which a measurement target curve is generated on a measurement target surface of a shape model used by the measurement path generating device in embodiment 2. Fig. 22 shows a state in which a measurement target curve C21 is generated on a curved surface S21 generated on the shape model M2 and on a curved surface S22 generated on the shape model M2. Here, the tangent of the measurement target curve C21 is discontinuous at the boundary between the curved surface S21 and the curved surface S22.

[0119] Fig. 23 is a diagram showing how a reference point and a normal direction of the measurement target surface at the reference point are calculated on a measurement target curve of a shape model used by the measurement path generating device in embodiment 2. Fig. 23 shows how a reference point Q34 is calculated from a reference point Q31 on the measurement target curve C21, and further how a normal direction 34 is calculated from a normal direction N31 on the measurement target curve C21 at each reference point. Here, two reference points, reference point Q32 and reference point Q33, are calculated at a position where the tangent to the measurement target curve C21 is discontinuous, and the normal direction N32 calculated from the measurement target curve S21 is shown at the reference point Q32, and the normal direction N33 calculated from the measurement target curve S22 is shown at the reference point Q33.

[0120] When the shape model M2 is cut by a plane passing through the measurement target curve C21, the tangent to the measurement target curve C21 becomes discontinuous at the corner where the line segment from reference point Q31 to reference point Q32 intersects with the line segment from reference point line Q33 to reference point Q34. That is, the differential coefficient of the line segment from reference point Q31 to reference point Q32 differs from the differential coefficient of the line segment from reference point line Q33 to reference point Q34 at the corners Q32 and Q33, which are the intersections of the two line segments.

[0121] In the second embodiment, in step S140, when the measurable condition is satisfied and the normal directions of adjacent reference points change beyond a predetermined angle range, the measurement path generating unit 105 generates a measurement path that is divided into multiple measurement directions for measurement. Here, a measurement path that is divided into multiple measurement directions for measurement is a measurement path that is measured by dividing a portion of the measurement path that includes two reference points into multiple sections and setting a different measurement direction for each divided section.

[0122] The normal directions of adjacent reference points changing beyond a predetermined angle range can be said to mean that the angle between the normal directions of two adjacent reference points changes beyond a predetermined angle range. The angle between the normal directions of two adjacent reference points is the angle between the normal directions of the two reference points in a plane that includes the normal directions of the two adjacent reference points.

[0123] The predetermined angle range is set so as to suppress an increase in measurement error caused by, for example, a sudden acceleration or deceleration of the rotation axis of the machine tool 20 accompanying a sudden change in the measurement direction of the measurement sensor 21, or a large fluctuation in the intensity of reflected light accompanying a sudden change in the normal direction of a curved surface during measurement by the optical distance measuring sensor. In other words, the predetermined angle range may be specifically determined based on the specifications of the measurement sensor 21 or the machine tool 20.

[0124] First, the measurement path generating unit 105 determines a measurable area in the same manner as in embodiment 1. Next, the measurement path generating unit 105 calculates the measurement position and measurement direction of the measurement sensor for measuring each reference point in the same manner as in embodiment 1. Simply, the measurement path generating unit 105 may determine the measurement position and measurement direction for the measurable area determined for each reference point in the same manner as in embodiment 1, so that the measurement position and measurement direction are in the center of the measurable distance range and opposite to the normal direction of the reference point.

[0125] Here, the measurement path generating unit 105 checks the amount of change in the normal direction of the measurement target curved surface at adjacent reference points at a position where the tangent is discontinuous on the measurement target curve. At this time, if the amount of change in the normal direction of the measurement target curved surface at adjacent reference points changes beyond a predetermined angle range, the measurement path generating unit 105 calculates a measurement direction that can pass through two measurable areas without changing the measurement direction of the measurement sensor 21 based on two measurable areas corresponding to the two reference points. Specifically, a common part of the measurable angle ranges for the two measurable areas is obtained, and the measurement direction is set to within the angle range of the common part. The measurement direction calculated here is set to the measurement direction for measuring the reference point.

[0126] Then, the measurement path generating unit 105 sequentially connects the calculated measurement positions to generate a measurement path in which the measurement direction calculated at each measurement position is the measurement direction of the measurement sensor 21 .

[0127] A specific example in which the measurement path generating device calculates the measurement position and measurement direction of the measurement sensor in the second embodiment will be described below.

[0128] 24 is a diagram showing an example of a measurable area determined based on a measurable distance range and a measurable angle range in a shape model used by the measurement path generating device in embodiment 2. In Fig. 24, the measurable distance range Rd2 and the measurable angle range Ra2 are set as predetermined values, and based on the measurable distance range Rd2 and the measurable angle range Ra2, the measurable area is determined as a measurable area for measuring the reference points Q31 to Q34 by the measurement sensor 21. Measurable area The measurable areas are shown as A31 to A34.

[0129] In FIG. 24, the measurable distance range Rd2 and the measurable angle range Ra2 are shown two-dimensionally, but the measurable distance range Rd2 and the measurable angle range Ra2 can be set three-dimensionally.

[0130] Here, it is assumed that the amount of change in the normal direction between normal directions V32 and V33, which are the normal directions to the measurement target curved surface at each reference point, exceeds a predetermined angle range at two reference points Q32 and Q33 calculated at a position where the tangent to the measurement target curve C21 is discontinuous. In other words, the normal directions between two adjacent reference points, reference point Q32 and reference point Q33, change beyond a predetermined angle range.

[0131] Fig. 25 is a first diagram showing how the measurement path generating device calculates the measurement position and measurement direction of the measurement sensor in embodiment 2. Fig. 25 shows how the measurement path generating unit 105 calculates the measurement position of the measurement sensor 21 from measurement position P31 to measurement position P34, and calculates the measurement direction of the measurement sensor 21 from measurement direction V31 to measurement direction V34, respectively, for reference point Q31 to reference point Q34, so that the measurement direction is in the center of the measurable distance range and faces the normal direction of the reference points.

[0132] Fig. 26 is a second diagram showing how the measurement path generating device calculates the measurement position and measurement direction of the measurement sensor in embodiment 2. Fig. 26 shows how the measurement path generating unit 105 calculates the measurement position and measurement direction of the measurement sensor 21 for measuring a reference point where the amount of change in the normal direction of the curved surface to be measured exceeds a predetermined angle range.

[0133] The measurement path generating unit 105 obtains a common angle range of the measurable angle ranges of the measurable areas A32 and A33 corresponding to the reference points Q32 and Q33, which are reference points at which the amount of change in the normal direction of the measurement target curved surface exceeds a predetermined angle range. Then, the measurement path generating unit 105 calculates a new measurement direction within the common angle range. FIG. 26 shows a state in which the measurement direction corresponding to the measurement position P32 is corrected to the measurement direction V32', and the measurement direction corresponding to the measurement position P33 is corrected to the measurement direction V33'. In FIGS. 25 and 26, the common angle range of the measurable angle ranges of the measurable areas A32 and A33 is indicated by a thick line.

[0134] Fig. 27 is a diagram showing how the measurement path generating device generates a measurement path in embodiment 2. Fig. 27 shows how measurement path TP2 is generated by sequentially connecting calculated measurement position P31 to measurement position P34, and setting the measurement directions at each measurement position to measurement direction V31, measurement direction V32', measurement direction V33', and measurement direction V34, respectively.

[0135] The above is an example of the operation of the measurement path generating device 10 in the second embodiment.

[0136] In the second embodiment, when the normal direction changes beyond a predetermined angle range, the measurement path generating unit 105 of the measurement path generating device 10 generates a measurement path that is divided into a plurality of measurement directions for measurement. As a result, by performing on-machine measurement of the measurement object 30 on the machine tool 20 using the measurement path, when a corner of the measurement object 30 is to be measured, it is possible to avoid a measurement path that focuses on measuring the corner, and an effect is achieved that the time required for measuring the measurement object 30 can be shortened.

[0137] Furthermore, this measurement path has the effect of enabling corners to be measured with high accuracy by avoiding measurement paths that focus on measuring the corners. That is, when measuring a corner that is the boundary between two measurement target surfaces, the measurement path generation unit 105 does not generate a measurement path that focuses on measuring the corners. As a result, by using the measurement path generated by the measurement path generation unit 105, the measurement target surface does not change frequently during measurement, making it easy to check the measurement results of the corners after measurement.

[0138] Furthermore, this measurement route makes it possible to avoid the concentration and output of a large amount of measurement results when measuring corners, thereby reducing the effort required for the worker to check the measurement results after measurement.

[0139] Embodiment 3 In the third embodiment, other functions of the measurement path generating device 10 according to the first embodiment will be described. In the third embodiment, the measurement path generating device 10 basically operates according to the flowchart shown in FIG. 4 described above. Below, differences in the operation of the measurement path generating device 10 from the first embodiment will be described. Other operations of the measurement path generating device 10 are similar to those in the first embodiment, so descriptions thereof will be omitted.

[0140] 28 is a perspective view showing a state in which a measurement target curve is generated on a measurement target curved surface of a shape model used by the measurement path generating device in the embodiment 3. In FIG. 28, a measurement target curve C31 is generated on a measurement target curved surface generated on a shape model M3. A surface where The figure shows how it was generated on S31.

[0141] Fig. 29 is a diagram showing how a reference point and a normal direction of the measurement target surface at the reference point are calculated on a measurement target curve of a shape model used by a measurement path generating device in embodiment 3. Fig. 29 shows how a reference point Q51 is calculated from a reference point Q41 on a measurement target curve C31, and further how a normal direction 51 is calculated from a normal direction N41 on the measurement target curved surface at each reference point.

[0142] In the third embodiment, in step S140, measurement path generating unit 105 generates a measurement path that satisfies the measurable conditions and minimizes the amount of movement of each drive axis of machine tool 20. The minimum amount of movement of each drive axis of machine tool 20 means that, when measurement sensor 21 attached to a drive axis of machine tool 20 is moved along the measurement path to measure object 30, the amount of movement from the previous position of the drive axis to the next position in continuous or intermittent movement of the drive axis is minimized.

[0143] First, the measurement path generating unit 105 determines a measurable area in the same manner as in embodiment 1. Next, the measurement path generating unit 105 calculates the measurement position and measurement direction of the measurement sensor 21 for measuring each reference point in the same manner as in embodiment 1. Simply, for the measurable area determined for each reference point, the measurement position may be determined so that the measurement direction is in the center of the measurable distance range and opposite to the normal direction of the reference point.

[0144] Here, in order to minimize the amount of movement of each drive axis of machine tool 20, it is sufficient to determine a combination of measurement positions and measurement directions that minimizes the change in the linear and rotational axes of machine tool 20 within a measurable area for each reference point. Specifically, this can be achieved by moving the measurement position of measurement sensor 21 along a certain plane and determining a combination that minimizes the change in the measurement direction of measurement sensor 21 at this time. That is, in the third embodiment, in step S140, measurement path generating unit 105 generates a measurement path in machine tool 20 that minimizes the change in the linear and rotational axes along which measurement sensor 21 is attached and moves measurement sensor 21.

[0145] For example, in order to minimize the change in the measurement direction of the measurement sensor 21, a common part of the measurable angle range is sequentially obtained, and the measurement direction is repeatedly adopted as long as the common measurement direction can be obtained. The measurement direction of the measurement sensor 21 is Alternatively, the measurement position and measurement direction of the measurement sensor 21 may be changed little by little to list and store all possible measurement positions and measurement directions in each measurable area, and the combinations of the measurement positions and measurement directions of the measurement sensor 21 for all measurable areas may be evaluated to determine a combination of the measurement positions and measurement directions that minimizes the change in the linear axis and rotation axis of the machine tool 20.

[0146] Then, the measurement path generating unit 105 sequentially connects the calculated measurement positions to generate a measurement path in which the measurement direction calculated at each measurement position is the measurement direction of the measurement sensor 21 .

[0147] A specific example in which the measurement path generating device calculates the measurement position and measurement direction of the measurement sensor in the third embodiment will be described below.

[0148] 30 is a diagram showing an example of a measurable area determined based on a measurable distance range and a measurable angle range in a shape model used in a measurement path generating device in embodiment 3. In Fig. 30, a measurable distance range Rd3 and a measurable angle range Ra3 are set as predetermined values, and based on the measurable distance range Rd3 and the measurable angle range Ra3, a measurable area is determined as a measurable area for measuring the reference points Q41 to Q51 by the measurement sensor 21. Measurable area The measurable area is shown as A41 to A51.

[0149] FIG. 31 is a diagram showing a state in which a plane R1, which is a plane along which the measurement position can be moved within all measurable areas in a shape model used by the measurement path generating device in the third embodiment, has been determined.

[0150] Fig. 32 is a diagram showing how the measurement path generating device calculates the measurement position and measurement direction of the measurement sensor in embodiment 3. Fig. 32 shows how the measurement path generating unit 105 generates the measurement positions of the measurement sensor 21 as measurement positions P41 to P51 for reference points Q41 to Q51, respectively, so that they are on the determined plane R1, and changes the measurement direction of the measurement sensor 21 from measurement direction V41 to measurement direction V51, respectively, so that the amount of change in the measurement direction of the measurement sensor 21 is minimized.

[0151] Here, a method for determining measurement direction V51 from measurement direction V41 is to determine common measurement directions that can be taken between measurable area A41 to measurable area A43, measurable area A44 to measurable area A47, and measurable area A48 to measurable area A51 among the measurable areas A41 to A51 corresponding to each reference point Q41 to reference point Q51, and then determine the combination that results in the least amount of change among the possible measurement directions.

[0152] Fig. 33 is a diagram showing how the measurement path generating device generates a measurement path in embodiment 3. Fig. 33 shows how measurement path TP3 is generated by sequentially connecting calculated measurement position P41 to measurement position P51, with the measurement directions at each measurement position being measurement direction V41 to measurement direction V51, respectively.

[0153] The above is an example of the operation of the measurement path generating device 10 in the third embodiment.

[0154] In the third embodiment, the measurement path generating unit 105 of the measurement path generating device 10 generates a measurement path that minimizes the amount of movement of each drive axis of the machine tool 20. That is, the measurement path generating unit 105 can reduce the time required for measurement by selecting, from among a plurality of possible measurement paths, the one that minimizes the amount of movement of each drive axis of the machine tool 20. This provides the effect of reducing the time required for measurement of the measurement object 30 by performing on-machine measurement of the measurement object 30 on the machine tool 20 using the measurement path.

[0155] Next, the hardware configuration of each of the control units 80 according to the first to third embodiments will be described. The control units 80 according to the first to third embodiments correspond to the path processing unit 12 and the control unit 15 in the measurement path generating device 10, respectively. The functions of each of the control units 80 according to the first to third embodiments are realized by a processing circuit. The processing circuit may be dedicated hardware, or may be a processing device that executes a program stored in a storage device.

[0156] When the processing circuit is a dedicated hardware, the processing circuit corresponds to a single circuit, a composite circuit, a programmed processor, a parallel programmed processor, an application specific integrated circuit, a field programmable gate array, or a combination of these. Figure 34 is a diagram showing a configuration in which the functions of the control unit according to the first to third embodiments are realized by hardware. A logic circuit 81a that realizes the function of the control unit 80 is incorporated in the processing circuit 81.

[0157] When the processing circuit 81 is a processing device, the functions of the control unit 80 are realized by software, firmware, or a combination of software and firmware.

[0158] FIG. 35 is a diagram showing a configuration in which the functions of the control unit according to the first to third embodiments are realized by software. The processing circuit 81 has a processor 811 that executes a program 81b, a random access memory 812 that the processor 811 uses as a work area, and a storage device 813 that stores the program 81b. The processor 811 deploys the program 81b stored in the storage device 813 on the random access memory 812 and executes it, thereby realizing the function of the control unit 80. The software or firmware is written in a program language and stored in the storage device 813. The processor 811 can be exemplified by a central processing unit, but is not limited to this. The storage device 813 can be a semiconductor memory such as a random access memory (RAM), a read only memory (ROM), a flash memory, an erasable programmable read only memory (EPROM), or an electrically erasable programmable read only memory (EEPROM (registered trademark)). The semiconductor memory may be a non-volatile memory or a volatile memory. Further, in addition to a semiconductor memory, a magnetic disk, a flexible disk, an optical disk, a compact disk, a mini disk, or a DVD (Digital Versatile Disc) can be applied to the storage device 813. The processor 811 may output data such as a calculation result to the storage device 813 for storage, or may store the data in an auxiliary storage device (not shown) via the random access memory 812. By integrating the processor 811, the random access memory 812, and the storage device 813 on one chip, the functions of the control unit 80 can be realized by a microcomputer.

[0159] The processing circuit 81 realizes the functions of the control unit 80 by reading and executing the program 81b stored in the storage device 813. It can also be said that the program 81b causes a computer to execute procedures and methods for realizing the functions of the control unit 80.

[0160] In a processing circuit 81 for implementing each of the path processing unit 12 and the control unit 15 in the measurement path generating device 10, a program 81b includes a measurement path generating program for generating a measurement path.

[0161] In addition, the processing circuit 81 may be configured so that some of the functions of the control unit 80 are realized by dedicated hardware, and some of the functions of the control unit 80 are realized by software or firmware.

[0162] Thus, the processing circuitry 81 can realize each of the above-described functions by hardware, software, firmware, or a combination of these.

[0163] The configurations shown in the above embodiments are merely examples, and may be combined with other known technologies, or the embodiments may be combined with each other. Also, parts of the configurations may be omitted or modified without departing from the spirit of the invention. [Explanation of symbols]

[0164] 1 Measurement system, 10 Measurement path generating device, 11 Operation unit, 12 Path processing unit, 13 Memory unit, 14 Communication unit, 15 Control unit, 20 Machine tool, 21 Measurement sensor, 22 Numerical control device, 23 Servo control unit, 30 Measurement object, 101 Shape model memory unit, 102 Measurement target curve generating unit, 103 Measurement target curved surface designation unit, 104 Reference point calculation unit, 105 Measurement path generating unit, 106 Measurement environment information memory unit, 107 Display unit, 108 Interference determination unit, 109 Measurement program output unit, A1 to A25, A31 to A34, A41 to A51 Measurable area, C11, C12, C13, C21, C31 Measurement target curve, M1, M2, M3 Shape model, N1 to N25, N31 to N34, N41 to N51 Normal direction, P1~P25,P31~P,P41~P51,P2',P3' Measurement position, PL1,PL2,PL3 Plane, Q1~Q25,Q31~Q34,Q41~Q51 Reference point, R1 Plane, Ra1,Ra2,Ra3 Measurable angle range, Rd1,Rd2,Rd3 Measurable distance range, S1~S15,S21,S22,S31 Curved surface, TP1,TP2,TP3 Measurement path, V1~V25,V31~V34,V41~V51,V2',V3' Measurement direction.

Claims

1. 1. A measurement path generating device that generates a measurement path, which is a relative movement path between a measurement sensor and a measurement object, for measuring the measurement object by the measurement sensor on a machine tool, comprising: a shape model storage unit that stores a shape model of the measurement object; a measurement target curve generating unit that generates a measurement target curve that is a curve on a measurement target curved surface of the shape model; a reference point calculation unit that calculates a reference point that is a point on the measurement target curve and a normal direction of the measurement target curved surface at the reference point; a measurement path generating unit that generates the measurement path, which is the movement path along which the measurement target curve is measured, based on the reference point, the normal direction, a measurable distance range that is the range of measurable distances between the measurement sensor and the measurement target curve, and a measurable angle range that is the range of measurable relative angles between the measurement direction of the measurement sensor and the normal direction of the measurement target curve; A measurement path generating device comprising:

2. the measurement path generation unit determines a measurable area for each reference point, which is an area in which the measurement sensor can measure the measurement object based on the measurable distance range and the measurable angle range, and determines the measurement path such that the relative position of the measurement sensor with respect to the reference point is positioned in the measurable area; The measurement path generating device according to claim 1 .

3. the measurement target curve generating unit generates a plane, and generates an intersection line between the plane and the measurement target curved surface as the measurement target curve; 3. The measurement path generating device according to claim 1 or 2,

4. the measurement route generating unit determines a non-measurable area on the measurement target curve where the measurement route cannot be generated, and generates a measurement route including a detour measurement route that detours around the non-measurable area; The measurement path generating device according to claim 1 .

5. when the normal directions of the two adjacent reference points change beyond a predetermined angle range, the measurement path generation unit divides a portion of the measurement path that includes the two reference points into a plurality of sections, and generates the measurement path by setting a different measurement direction for each divided section; The measurement path generating device according to claim 1 .

6. the measurement path generation unit generates a measurement path in which changes in a linear axis and a rotation axis along which the measurement sensor is attached to the machine tool and along which the measurement sensor is moved are minimized; The measurement path generating device according to claim 1 .

7. A display unit is provided, displaying, on the display unit, the measurement target curve and a measurement path along which measurements are taken on the measurement target curve in association with each other; The measurement path generating device according to claim 1 .

8. A display unit is provided, when the measurement path generating unit determines a non-measurable area on the measurement target curve in which the measurement path cannot be generated, the non-measurable area is displayed on the display unit in distinction from an area in which the measurement path is generated; The measurement path generating device according to claim 1 .

9. a measurement program output unit that outputs a measurement program describing commands for relatively moving the measurement sensor and the measurement object based on the configuration of a drive axis to which the measurement sensor is attached in the machine tool and that moves the measurement sensor and the measurement path; The measurement path generating device according to claim 1 .

10. when a measurement unmeasurable area in which the measurement path cannot be generated on the measurement target curve is determined by the measurement path generating unit, the measurement program output unit outputs a measurement program in which a command corresponding to the measurement path included in the measurement unmeasurable area is described in a manner distinguished from an area in which the measurement path is generated; The measurement path generating device according to claim 9 .

11. the measurement sensor is an optical distance measuring sensor; The measurement path generating device according to claim 1 .

12. the optical distance measuring sensor measures the distance to the measurement object by a frequency scanning interferometry method; The measurement path generating device according to claim 11 .

13. a measurement environment information storage unit configured to store measurement environment information, which is information regarding a measurement environment when the measurement sensor measures the measurement object; the measurement path generating unit determines the measurable distance range and the measurable angle range based on the measurement environment information; The measurement path generating device according to claim 1 .

14. the measurement environment information includes at least one of a type of the measurement sensor, a measurement method of the measurement sensor, a wavelength of output light of the measurement sensor, a focal length of the measurement sensor, a measurement cycle of the measurement sensor, a material of the measurement object, and a surface roughness of the measurement object; The measurement path generating device according to claim 13 .

15. the measurement path generation unit determines a relative moving speed between the measurement sensor and the measurement object in accordance with a measurement cycle of the measurement sensor in the measurement environment information so that an interval between positions on the measurement target curve measured for each measurement cycle is constant; The measurement path generating device according to claim 14 .

16. 1. A measurement path generating method for generating a measurement path, which is a relative movement path between a measurement sensor and a measurement object, for measuring the measurement object by the measurement sensor on a machine tool, comprising: a shape model storing step of storing a shape model of the measurement object; a measurement target curve generating step of generating a measurement target curve which is a curve on a measurement target curved surface of the shape model; a reference point calculation step of calculating a reference point which is a point on the measurement target curve and a normal direction of the measurement target curved surface at the reference point; a measurement path generating step of generating the measurement path, which is the movement path for measuring the measurement target curve, based on the reference point, the normal direction, a measurable distance range which is the range of measurable distances between the measurement sensor and the measurement target curve, and a measurable angle range which is the range of measurable relative angles between the measurement direction of the measurement sensor and the normal direction of the measurement target curve; A measurement path generating method comprising:

17. Machine tools and A measurement sensor that measures a measurement object disposed on the machine tool; a shape model storage unit that stores a shape model of the measurement object; a measurement target curve generating unit that generates a measurement target curve that is a curve on a measurement target curved surface of the shape model; a reference point calculation unit that calculates a reference point that is a point on the measurement target curve and a normal direction of the measurement target curved surface at the reference point; a measurement path generating unit that generates a measurement path, which is a movement path for measuring the measurement target curve and is a relative movement path between the measurement sensor and the measurement object, based on the reference point, the normal direction, a measurable distance range which is a range of measurable distances between the measurement sensor and the measurement target curve, and a measurable angle range which is a range of measurable relative angles between the measurement direction of the measurement sensor and the normal direction of the measurement object curved surface; A measurement system comprising:

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