System examination support device and system examination support program
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Filing Date
- 2023-07-12
- Publication Date
- 2026-04-09
AI Technical Summary
It is challenging to predict how a system layout, particularly one involving industrial robots, will be perceived by observers in the actual field, making it difficult to confirm visibility and usability until the system is constructed.
A system study support device and program that allow users to input system and observer information, generate observer models, and calculate and display the system's layout from various observer perspectives, enabling simulation of how the system will be viewed by different observers.
Facilitates easier confirmation of system visibility and usability during layout consideration, ensuring that observers can see critical components without obstacles and that all areas are visually recognizable, improving the efficiency of teaching robots and displaying systems in exhibitions.