Magnetic field-based sample measurement system and method thereof

Abstract

The present invention relates to a magnetic field-based sample measurement system and a method thereof, wherein a predetermined optical signal or electrical signal is applied to a sample and a predetermined magnetic field is applied to detect the optical signal generated from the sample, or a predetermined microwave is additionally applied to the sample to detect the optical signal, thereby simultaneously providing data for precisely analyzing the electrical characteristics and luminescence characteristics of the sample.

Description

Technology Field

[0001] The present invention relates to a magnetic field-based sample measurement system and method, and more specifically, to a system and method for measuring a light signal generated from a sample by applying a light signal and a magnetic field to the sample. Background Technology

[0002] Magnetic field-based sample measurement technology is an important tool for precisely analyzing the electromagnetic properties of materials and devices, and is widely used to understand the behavior of electronic states within materials. In particular, to optimize the efficiency and lifespan of light-emitting devices such as organic light-emitting diodes (OLEDs), analysis of luminescence characteristics, including energy transition mechanisms between triplet and singlet states, is required. By elucidating the behavior of electrons and excitons within the device, this can contribute to the research and development of next-generation high-efficiency electronic and optical materials.

[0003] Conventional Electron Spin Resonance (ESR) analysis equipment has been utilized to analyze the electromagnetic properties of devices and materials based on the Zeeman effect, in which electron energy levels are separated by an external magnetic field. Additionally, analysis techniques such as Magneto-Electroluminescence (MEL), Magneto-Photoluminescence (MPL), Electroluminescence Detected Magnetic Resonance (ELDMR), and Photoluminescence Detected Magnetic Resonance (PLDMR) are used to observe the luminescence characteristics of devices in response to changes in the magnetic field. These technologies stimulate the device through electrical driving and photoexcitation methods, and detect minute response signals by applying microwaves of a specific frequency using a resonator.

[0004] However, existing ESR analysis and measurement techniques such as MEL and ELDMR are limited in their ability to simultaneously perform multiple analysis methods (MEL and ELDMR) in a single measurement. In particular, ELDMR measurements present a problem in clearly distinguishing signal signs, such as whether the change in light intensity is increasing or decreasing. These limitations require additional experimental steps and time for triplet state analysis and luminescence mechanism research, which can reduce the accuracy of data interpretation. Prior art literature

[0005] Korean Registered Patent Publication No. 10-1671041 (Registration Date: Oct. 25, 2016) The problem to be solved

[0006] The present invention has been devised to solve the problems described above, and the objective of the present invention is to provide a magnetic field-based sample measurement system capable of simultaneously providing data for precisely analyzing the electrical characteristics and luminescence characteristics of a sample by applying a predetermined driving signal and a magnetic field to a sample to detect a light signal generated from the sample, or by additionally applying a predetermined microwave to the sample to detect the light signal. means of solving the problem

[0007] A magnetic field-based sample measurement system according to the present invention may include a resonator on which a sample is mounted, a sample driving unit comprising at least one sample driving device that applies a predetermined driving signal to the sample, a magnetic field applying device that applies a predetermined magnetic field to the sample, and a processor that controls the sample driving unit and the magnetic field applying device and detects and stores an optical signal generated from the sample.

[0008] In addition, the driving signal may be an optical signal or an electrical signal.

[0009] In addition, the processor can control the magnetic field application device to vary the strength of the magnetic field and detect changes in the strength of the optical signal generated in the sample.

[0010] Additionally, the apparatus further includes a microwave application device for applying a predetermined microwave to the sample, and the processor can control the microwave application device to vary the intensity of the microwave.

[0011] Additionally, the system further includes a noise removal device for removing noise from the detected optical signal, and the noise removal device can calculate an average value for the change in intensity of the optical signal from which noise has been removed.

[0012] The magnetic field-based sample measurement method according to the present invention, in a sample measurement method of a magnetic field-based sample measurement system, may include a sample driving step in which a processor controls a sample driving unit to apply a predetermined driving signal to a sample, a magnetic field application step in which a magnetic field application device controls a magnetic field application device to apply a predetermined magnetic field to the sample, and a light signal detection step in which a light signal generated from the sample is detected and stored.

[0013] In addition, the sample driving step can control the sample driving unit to apply an optical signal or an electrical signal to the sample.

[0014] In addition, the magnetic field application step controls the magnetic field application device to vary the strength of the magnetic field, and the optical signal detection step can detect changes in the strength of the optical signal generated in the sample.

[0015] In addition, after the magnetic field application step and before the optical signal detection step, the method further includes a microwave application step of controlling a microwave application device to apply a predetermined microwave to the sample, and the microwave application step may control the microwave application device to vary the intensity of the microwave.

[0016] In addition, after the optical signal detection step, the method further includes a noise removal step for removing noise from the optical signal detected in the optical signal detection step by controlling a noise removal device, and the noise removal step can calculate an average value for the change in intensity of the optical signal from which noise has been removed. Effects of the invention

[0017] According to the present invention, the electromagnetic properties of a sample can be precisely measured, which has the advantage of providing data essential for optimizing performance.

[0018] In addition, it has the advantage of being able to simultaneously provide data for analyzing the electrical and luminescence properties of a sample, and to analyze the performance of complex materials more efficiently.

[0019] In addition, the measurement process is minimized, enabling efficient measurement, reducing measurement time, and increasing data processing efficiency. Brief explanation of the drawing

[0020] FIG. 1 is an exemplary configuration diagram showing a magnetic field-based sample measurement system according to one embodiment of the present invention. FIG. 2 is a configuration example diagram showing a magnetic field-based sample measurement system according to another embodiment of the present invention. FIG. 3 is a configuration example diagram showing a magnetic field-based sample measurement system according to another embodiment of the present invention. FIG. 4 is a flowchart illustrating a magnetic field-based sample measurement method according to one embodiment of the present invention. FIG. 5 is a flowchart illustrating a magnetic field-based sample measurement method according to another embodiment of the present invention. FIG. 6 is a flowchart illustrating a magnetic field-based sample measurement method according to another embodiment of the present invention. Specific details for implementing the invention

[0021] Hereinafter, a magnetic field-based sample measurement system and method according to the present invention having the configuration as described above will be explained in detail with reference to the attached drawings. The drawings presented below are provided as examples to ensure that the concept of the present invention is sufficiently conveyed to those skilled in the art. Accordingly, the present invention is not limited to the drawings presented below and may be embodied in other forms. In addition, throughout the specification, the same reference numerals indicate the same components.

[0022] Unless otherwise defined, technical and scientific terms used herein have the meaning commonly understood by those skilled in the art to which this invention pertains, and descriptions of known functions and configurations that could unnecessarily obscure the essence of the invention are omitted in the following description and accompanying drawings.

[0023] Furthermore, a system refers to a set of components, including devices, mechanisms, and means, that are organized and interact regularly to perform necessary functions.

[0024] FIG. 1 is an exemplary configuration diagram showing a magnetic field-based sample measurement system according to an embodiment of the present invention. With reference to FIG. 1, the magnetic field-based sample measurement system according to an embodiment of the present invention will be examined in detail.

[0025] A magnetic field-based sample measurement system (1000) according to one embodiment of the present invention may include a resonator (100), a sample driving unit (200), a magnetic field application device (300), and a processor (400), as illustrated in FIG. 1. It is preferable that each component performs operation by being individually or integrated into at least one computational processing means, such as a computer.

[0026] Let's take a closer look at each component.

[0027] A sample (10) can be mounted on the above resonator (100).

[0028] Here, the resonator (100) serves to amplify microwaves applied to the interior.

[0029] Additionally, the resonator (100) may be one of a microwave resonator, a loop-gap resonator, an RF resonator, and a variable frequency resonator.

[0030] However, this is merely one example, and any resonator capable of amplifying microwaves applied internally is possible.

[0031] The sample driving unit (200) may include at least one sample driving device (210) that applies a predetermined driving signal to the sample (10).

[0032] In detail, the sample driving unit (200) applies a predetermined driving signal to the sample (10) through the sample driving device (210) to drive the sample (10).

[0033] Here, the driving signal may be an optical signal or an electrical signal.

[0034] In other words, the sample driving unit (200) may include at least one sample driving device (210) for applying an optical signal or an electrical signal to the sample (10) depending on the type of the sample (10).

[0035] Additionally, the sample driving device (210) may be at least one of a CW laser, a pulse laser, and a UV LED capable of applying the optical signal, or at least one of an SMU, a function generator, a voltage / current source, a functional power supply, a pulse generator, a digital multimeter, and an oscilloscope capable of applying the electrical signal, but is not limited thereto, and any device capable of applying an optical signal or an electrical signal to the sample (10) is possible.

[0036] In addition, the driving signal may be not limited to optical signals or electrical signals, but may be various signals for driving the sample (10) depending on the type of sample (10).

[0037] The magnetic field application device (300) can apply a predetermined magnetic field to the sample (10).

[0038] In detail, the magnetic field application device (300) can apply a predetermined magnetic field capable of inducing the Zeeman Effect, a phenomenon in which energy levels are separated, to the sample (10).

[0039] Here, the magnetic field application device (300) may include an electromagnet (not shown) disposed on both sides of the sample (10) and an electromagnet driving unit (not shown) that drives the electromagnet (not shown), but is not limited thereto, and any device capable of applying a predetermined magnetic field to the sample (10) is possible.

[0040] The processor (400) controls the sample driving unit (200) and the magnetic field application device (300), and can detect and store the light signal generated from the sample (10).

[0041] In detail, the processor (400) can transmit a control signal for controlling the sample driving unit (200) and the magnetic field application device (300) to the sample driving unit (200) and the magnetic field application device (300), respectively, and can detect at least one optical signal generated from the sample (10) and store it in a memory (not shown).

[0042] Additionally, as described above, the processor (400) can control the sample driving unit (200) so that the at least one sample driving device (210) applies an optical signal or an electrical signal to the sample (10) depending on the type of the sample (10).

[0043] Additionally, the processor (400) can control the magnetic field application device (300) to vary the strength of the magnetic field and detect changes in the strength of the light signal generated in the sample (10).

[0044] In detail, the processor (400) can control the magnetic field application device (300) to vary the strength of the magnetic field within a predetermined first range.

[0045] For example, the processor (400) controls the magnetic field application device (300) so that the magnetic field application device (300) varies the strength of the magnetic field from 0 mT to 300 mT.

[0046] However, this is merely one example, and the above-mentioned first range can be set according to user input.

[0047] Accordingly, the processor (400) detects an optical signal that changes in real time according to the strength of the magnetic field that varies within the first range.

[0048] In this way, a magnetic field-based sample measurement system (1000) according to one embodiment of the present invention can detect a light signal generated in the sample (10) in real time according to a light signal or an electric signal applied to the sample (10) when a magnetic field is applied to the sample (10) for MPL (Magneto-Photoluminescence) analysis explaining the effect of a magnetic field on photoluminescence or MEL (Magneto-Electroluminescence) analysis explaining the effect of a magnetic field on electroluminescence.

[0049] FIG. 2 is a configuration example diagram showing a magnetic field-based sample measurement system according to another embodiment of the present invention. A magnetic field-based sample measurement system (1000) according to another embodiment of the present invention may further include a microwave application device (500) as shown in FIG. 2.

[0050] The microwave application device (500) can apply a predetermined microwave to the sample (10).

[0051] In detail, the microwave application device (500) can apply a predetermined microwave to the resonator (100) to induce magnetic resonance of electron spins.

[0052] Accordingly, the microwave is amplified by the resonator (100), and magnetic resonance of the electron spin of the sample (10) is induced by the magnetic field applied by the magnetic field application device (300) and the microwave.

[0053] Accordingly, the processor (400) detects a light signal generated in the sample (10) due to the magnetic resonance of the induced electron spin.

[0054] Additionally, the processor (400) can control the microwave application device (500) to vary the intensity of the microwave.

[0055] In detail, the processor (400) can control the microwave application device (500) to vary the intensity of the microwave within a predetermined second range.

[0056] For example, the processor (400) controls the microwave application device (500) so that the microwave application device (500) varies the intensity of the microwave within 6 GHz to 9 GHz.

[0057] However, this is merely one example, and the second range mentioned above can be set in various ways depending on user input.

[0058] Accordingly, the processor (400) detects an optical signal that changes in real time according to the strength of the magnetic field that varies within the first range and the strength of the microwave that varies within the second range.

[0059] As such, the magnetic field-based sample measurement system (1000) according to another embodiment of the present invention has the advantage of being able to detect optical signals generated from the sample (10) in real time according to an optical signal or an electrical signal applied for driving the sample (10) in a situation where a magnetic field and microwaves are applied to the sample (10) to detect data for the analysis of Electroluminescence Detected Magnetic Resonance (ELDMR) which detects and analyzes an electroluminescence signal emitted from the sample (10) by an electron spin resonance phenomenon, or Photoluminescence Detected Magnetic Resonance (PLDMR) which detects and analyzes a photoluminescence signal emitted from the sample (10) by an electron spin resonance phenomenon, and to simultaneously perform MPL and PLDMR data detection, or MEL and ELDMR detection.

[0060] FIG. 3 is a configuration example diagram showing a magnetic field-based sample measurement system according to another embodiment of the present invention. The magnetic field-based sample measurement system (1000) according to another embodiment of the present invention may further include a noise removal device (600) as shown in FIG. 3.

[0061] The noise removal device (600) can remove noise from the optical signal detected by the processor (400).

[0062] At this time, the noise removal device (600) may be at least one of a lock-in amplifier, an optical filter, an electrical filter, and a digital signal processing device, but is not limited thereto, and any device capable of removing noise from the optical signal generated in the sample (10) is possible.

[0063] In addition, the noise removal device (600) can calculate an average value for the change in intensity of the light signal from which noise has been removed.

[0064] This allows for securing highly reliable optical signals and offers the advantage of improving the accuracy of future analysis.

[0065] FIG. 4 is a flowchart illustrating a magnetic field-based sample measurement method according to an embodiment of the present invention. With reference to FIG. 4, the magnetic field-based sample measurement method according to an embodiment of the present invention will be examined in detail.

[0066] A magnetic field-based sample measurement method according to one embodiment of the present invention may include a sample driving step (S100), a magnetic field application step (S200), and an optical signal detection step (S400), as illustrated in FIG. 4. Each step is performed by a processor included in a magnetic field-based sample measurement system (1000).

[0067] Let's take a closer look at each step,

[0068] The sample driving step (S100) above can control the sample driving unit (200) to apply a predetermined driving signal to the sample (10) mounted on the resonator (100).

[0069] In detail, the sample driving step (S100) can control at least one sample driving device (210) included in the sample driving unit (200) to apply a predetermined driving signal to the sample (10) mounted on the resonator (100).

[0070] Here, the driving signal may be an optical signal or an electrical signal.

[0071] In other words, the sample driving step (S100) controls at least one sample driving device (210) included in the sample driving unit (200) to apply an optical signal or an electrical signal to the sample (10) according to the type of sample (10).

[0072] The above magnetic field application step (S200) can apply a predetermined magnetic field to the sample (10) by controlling the magnetic field application device (300).

[0073] In detail, the magnetic field application step (S200) may apply a predetermined magnetic field capable of inducing the Zeeman Effect, which is a phenomenon in which energy levels are separated in the sample (10).

[0074] Additionally, the magnetic field application step (S200) can control the magnetic field application device (300) to vary the strength of the magnetic field.

[0075] In detail, the magnetic field application step (S200) can control the magnetic field application device (300) to vary the strength of the magnetic field within a predetermined first range.

[0076] For example, the magnetic field application step (S200) controls the magnetic field application device (300) so that the magnetic field application device (300) varies the strength of the magnetic field from 0 mT to 300 mT.

[0077] However, this is merely one example, and the above-mentioned first range can be set according to user input.

[0078] The light signal detection step (S400) above can detect and store a light signal generated from the sample (10).

[0079] At this time, the light signal detection step (S400) can detect at least one light signal generated from the sample (10) and store it in the memory (not shown).

[0080] In addition, the light signal detection step (S400) can detect a change in the intensity of the light signal generated in the sample (10).

[0081] In detail, the optical signal detection step (S400) can detect an optical signal that changes in real time according to the strength of the magnetic field that varies within the first range.

[0082] In this way, a magnetic field-based sample measurement method according to one embodiment of the present invention can detect a light signal generated in the sample (10) in real time according to a light signal or an electric signal applied to the sample (10) when a magnetic field is applied to the sample (10) for MPL (Magneto-Photoluminescence) analysis explaining the effect of a magnetic field on photoluminescence or MEL (Magneto-Electroluminescence) analysis explaining the effect of a magnetic field on electroluminescence.

[0083] FIG. 5 is a flowchart illustrating a magnetic field-based sample measurement method according to another embodiment of the present invention. The magnetic field-based sample measurement method according to another embodiment of the present invention may further include a microwave application step (S300) after the magnetic field application step (S200) and before the optical signal detection step (S400), as shown in FIG. 5.

[0084] The microwave application step (S300) can apply a predetermined microwave to the sample (10) by controlling the microwave application device (500).

[0085] In detail, the microwave application step (S300) can control the microwave application device (500) to apply a predetermined microwave to the resonator (100) to induce magnetic resonance of the electron spin.

[0086] Accordingly, the microwave is amplified by the resonator (100), and magnetic resonance of the electron spin of the sample (10) is induced by the magnetic field applied by the magnetic field application device (300) and the microwave.

[0087] In addition, the microwave application step (S300) can control the microwave application device (500) to vary the intensity of the microwave.

[0088] In detail, the microwave application step (S300) can control the microwave application device (500) to vary the intensity of the microwave within a predetermined second range.

[0089] For example, the microwave application step (S300) controls the microwave application device (500) so that the microwave application device (500) varies the intensity of the microwave within 6 GHz to 9 GHz.

[0090] However, this is merely one example, and the second range mentioned above can be set according to user input.

[0091] In addition, the optical signal detection step (S400) can detect an optical signal that changes in real time according to the strength of the magnetic field that varies within the first range and the strength of the microwave that varies within the second range.

[0092] In other words, the light signal detection step (S400) detects a light signal generated in the sample (10) due to the magnetic resonance of the induced electron spin.

[0093] As such, the magnetic field-based sample measurement method according to another embodiment of the present invention has the advantage of being able to detect optical signals generated from the sample (10) in real time according to an optical signal or an electrical signal applied for driving the sample (10) in a situation where a magnetic field and microwaves are applied to the sample (10) to detect data for the analysis of Electroluminescence Detected Magnetic Resonance (ELDMR) which detects and analyzes an electroluminescence signal emitted from the sample (10) by an electron spin resonance phenomenon, or Photoluminescence Detected Magnetic Resonance (PLDMR) which detects and analyzes a photoluminescence signal emitted from the sample (10) by an electron spin resonance phenomenon, and to simultaneously perform MPL and PLDMR data detection, or MEL and ELDMR detection.

[0094] FIG. 6 is a flowchart illustrating a magnetic field-based sample measurement method according to another embodiment of the present invention. The magnetic field-based sample measurement method according to another embodiment of the present invention may further include a noise removal step (S500) after the optical signal detection step (S400), as shown in FIG. 6.

[0095] The noise removal step (S500) can remove noise from the optical signal detected in the optical signal detection step (S400) by controlling the noise removal device (600).

[0096] In addition, the noise removal step (S500) can calculate an average value for the change in intensity of the optical signal from which noise has been removed.

[0097] In addition, the noise removal device (600) can calculate an average value for the change in intensity of the light signal from which noise has been removed.

[0098] This allows for securing highly reliable optical signals and offers the advantage of improving the accuracy of future analysis.

[0099] In summary, the magnetic field-based sample measurement system and method according to various embodiments of the present invention have the advantage of simultaneously providing data for precisely analyzing the electrical characteristics and luminescence characteristics of a sample (10) by applying a predetermined optical signal or electrical signal to a sample (10) and a predetermined magnetic field to detect the optical signal generated from the sample (10), or by additionally applying a predetermined microwave to the sample (10) to detect the optical signal.

[0100] Although preferred embodiments of the present invention have been described above, the embodiments disclosed in the present invention are intended only to illustrate, not to limit, the technical scope of the present invention. Accordingly, the technical scope of the present invention includes not only each disclosed embodiment but also combinations of the disclosed embodiments, and furthermore, the scope of the technical scope of the present invention is not limited by such embodiments. In addition, a person skilled in the art to which the present invention pertains can make numerous changes and modifications to the present invention without departing from the spirit and scope of the appended claims, and all such appropriate changes and modifications should be deemed to fall within the scope of the present invention as equivalents. Explanation of the symbols

[0101] 10: Sample 100 : Resonator 200 : Sample drive unit 210: Sample drive unit 300 : Magnetic field application device 400 : Processor 500 : Microwave application device 600 : Noise removal device 1000: Magnetic field-based sample measurement system

Claims

Claim 1 A magnetic field-based sample measurement system comprising: a resonator mounted on a sample; a sample driving unit including at least one sample driving device that applies a predetermined driving signal to the sample; a magnetic field application device that applies a predetermined magnetic field to the sample; and a processor that controls the sample driving unit and the magnetic field application device and detects and stores an optical signal generated from the sample. Claim 2 In claim 1, the driving signal is an optical signal or an electrical signal, in a magnetic field-based sample measurement system. Claim 3 A magnetic field-based sample measurement system according to claim 1, wherein the processor controls the magnetic field application device to vary the strength of the magnetic field and detects a change in the strength of the optical signal generated in the sample. Claim 4 A magnetic field-based sample measurement system according to claim 1, further comprising a microwave application device for applying a predetermined microwave to the sample; wherein the processor controls the microwave application device to vary the intensity of the microwave. Claim 5 A magnetic field-based sample measurement system according to claim 1, further comprising a noise removal device for removing noise from the detected optical signal, wherein the noise removal device calculates an average value for the change in intensity of the optical signal from which noise has been removed. Claim 6 A magnetic field-based sample measurement method comprising: a sample driving step in which a processor controls a sample driving unit to apply a predetermined driving signal to a sample; a magnetic field application step in which a magnetic field application device controls a magnetic field application device to apply a predetermined magnetic field to the sample; and a light signal detection step in which a light signal generated from the sample is detected and stored. Claim 7 In claim 6, the sample driving step is a magnetic field-based sample measurement method that controls the sample driving unit to apply an optical signal or an electrical signal to the sample. Claim 8 A magnetic field-based sample measurement method according to claim 6, wherein the magnetic field application step controls the magnetic field application device to vary the strength of the magnetic field, and the optical signal detection step detects a change in the strength of the optical signal generated in the sample. Claim 9 A magnetic field-based sample measurement method according to claim 6, further comprising a microwave application step of controlling a microwave application device to apply a predetermined microwave to the sample after the magnetic field application step and before the optical signal detection step, wherein the microwave application step controls the microwave application device to vary the intensity of the microwave. Claim 10 In claim 6, the magnetic field-based sample measurement method further comprises a noise removal step after the optical signal detection step, wherein a noise removal device is controlled to remove noise from the optical signal detected in the optical signal detection step; wherein the noise removal step calculates an average value for the change in intensity of the optical signal from which noise has been removed.

Images