Test Apparatus

Abstract

The objective of the present invention is to provide a test device capable of automatically determining information regarding a socket board slot connected to a test board via a cable. To this end, the test device according to the present invention comprises: a socket board on which test target elements are mounted; at least two test boards for performing tests on the test target elements; and at least two cables connected to at least two socket board slots provided on the socket board to connect the at least two test boards to the socket board. At least two test target elements are connected to the socket board, and the socket board is provided with at least two socket board slot resistors corresponding to the at least two socket board slots.

Description

Technology Field

[0001] The present invention relates to a test device for testing the characteristics of semiconductor devices. Background Technology

[0002] Test devices are used to test the performance of semiconductor devices. Semiconductor devices tested by test devices are called test target devices.

[0003] The test device can generate various types of test patterns and transmit them to the device under test, analyze the patterns and various signals received from the device under test to analyze the performance of the device under test, and provide the analysis results.

[0004] The test device is equipped with at least two test boards, and the test boards can be connected via cables to a socket board on which the components to be tested are mounted.

[0005] In this case, the socket board can be connected to at least two test boards through at least two cables, and the socket board is provided with at least two socket board slots connected to at least two cables, and at least one test target component can be connected to each of the at least two socket board slots.

[0006] Therefore, the socket board slots and test boards connected via cables are not consistent, and consequently, the component under test and the test results may be confused.

[0007] For example, since the first socket board slot of the socket board may be connected to the first test board and the second socket board slot of the socket board may be connected to the second test board, there may be confusion as to which of the results of tests performed on the first test board and the second test board corresponds to the test target component connected to the first socket board slot.

[0008] Such confusion can reduce the reliability of test results. The problem to be solved

[0009] The objective of the present invention to solve the aforementioned problem is to provide a test device capable of automatically determining information regarding a socket board slot connected to a test board via a cable. means of solving the problem

[0010] A test device according to the present invention for achieving the above-mentioned purpose comprises: a socket board on which test target elements are mounted; at least two test boards for performing tests on the test target elements; and at least two cables connected to at least two socket board slots provided in the socket board to connect the at least two test boards to the socket board, wherein at least two test target elements are connected to the socket board, and the socket board is provided with at least two socket board slot resistors corresponding to the at least two socket board slots.

[0011] Each of the above at least two socket board slot resistors is connected to one of the above at least two socket board slots.

[0012] Each of the above at least two socket board slot resistors is electrically connected to a cable connected to the socket board slot.

[0013] The above at least two socket board slot resistors have different resistance values.

[0014] Each of the above at least two test boards is connected to one of the above at least two socket board slot resistors through one of the above at least two socket board slots.

[0015] Each of the above at least two test boards and at least two socket board slot resistors is electrically connected through a cable.

[0016] Each of the above at least two test boards comprises: a judgment unit that generates a test signal or a slot judgment signal; a test board connector connected to a cable; a test resistor connected between a first terminal of the test board connector and the judgment unit; a switch connected between the first terminal and a second terminal of the test board connector; and a sensing unit connected between the first terminal and the judgment unit.

[0017] The first terminal is connected to a socket provided on the socket board through a cable and one of the at least two socket board slots, and a test target component is connected to the socket.

[0018] The second terminal is connected to a socket board slot resistor through the cable and one of the at least two socket board slots.

[0019] The above switch is turned on during a slot determination period for determining the resistance of the socket board slot connected to the switch, and is turned off during a test period for a test target component connected through the first terminal. Effects of the invention

[0020] According to the present invention, information about a socket board slot connected to a test board via a cable can be automatically determined.

[0021] Therefore, the analysis result generated by the test board can be matched with the socket board slot connected to the test board, and accordingly, the analysis result can be accurately matched with the test target component mounted in the socket board slot.

[0022] Accordingly, the reliability of the test results for the device under test can be improved. Brief explanation of the drawing

[0023] FIG. 1 is an exemplary diagram showing the configurations of a test device according to the present invention. FIG. 2 is a perspective view of an embodiment of a test device according to the present invention. FIGS. 3 and FIGS. 4 are exemplary diagrams showing the connection relationship between test boards and socket boards applied to a test device according to the present invention. Specific details for implementing the invention

[0024] Throughout the specification, identical reference numbers denote substantially identical components. In the following description, detailed descriptions of components and functions known in the art may be omitted if they are not related to the core components of the invention. The meanings of the terms described in this specification should be understood as follows.

[0025] The advantages and features of the present invention and the methods for achieving them will become clear by referring to the embodiments described below in detail together with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below but may be implemented in various different forms, and these embodiments are provided merely to ensure that the disclosure of the present invention is complete and to fully inform those skilled in the art of the scope of the invention.

[0026] The shapes, sizes, ratios, angles, numbers, etc. disclosed in the drawings for explaining embodiments of the present invention are exemplary, and therefore the present invention is not limited to the depicted details. Throughout the specification, the same reference numerals refer to the same components. Furthermore, in describing the present invention, if it is determined that a detailed description of related known technology may unnecessarily obscure the essence of the present invention, such detailed description is omitted.

[0027] Where terms such as 'comprising,' 'having,' 'consisting of,' etc. are used in this specification, other parts may be added unless 'only' is used. Where a component is expressed in the singular, it includes cases where it is included in the plural unless specifically stated otherwise.

[0028] In interpreting the components, they are interpreted to include a margin of error even in the absence of a separate explicit statement.

[0029] In the case of describing a positional relationship, for example, when the positional relationship between two parts is described using expressions such as 'on,' 'upper,' 'lower,' or 'next to,' one or more other parts may be located between the two parts unless 'immediately' or 'directly' is used.

[0030] In the case of an explanation of a temporal relationship, for example, when a temporal sequence is explained using 'after', 'following', 'next', 'before', etc., it may include cases where the sequence is not continuous unless 'immediately' or 'directly' is used.

[0031] Although terms such as "first," "second," etc. are used to describe various components, these components are not limited by these terms. These terms are used merely to distinguish one component from another. Accordingly, the first component mentioned below may be the second component within the technical scope of the present invention.

[0032] "X-axis direction," "Y-axis direction," and "Z-axis direction" should not be interpreted solely as geometric relationships in which the relationship between them is perpendicular, but may mean having a broader directionality within the range in which the configuration of the present invention can function functionally.

[0033] The term “at least one” should be understood to include all combinations that can be presented from one or more related items. For example, the meaning of “at least one of the first item, the second item, and the third item” may mean not only the first item, the second item, or the third item individually, but also all combinations of items that can be presented from two or more of the first item, the second item, and the third item.

[0034] The features of each of the various embodiments of the present invention may be combined or combined with one another, either partially or wholly, and may technically enable various interlocking and operation. Each embodiment may be implemented independently of one another or may be implemented together in an associated relationship.

[0035] Hereinafter, embodiments of the present specification are described in detail with reference to the attached drawings.

[0036] FIG. 1 is an exemplary diagram showing the configurations of a test device according to the present invention, and FIG. 2 is a perspective view of an embodiment of a test device according to the present invention.

[0037] The test device (10) according to the present invention can perform the function of testing the quality of a device under test (Device Under Test: DUT) (20).

[0038] The test subject device (DUT) (20) may include a solid state drive (SSD), a hard disk drive (HDD), a double data rate (DDR)4, a DDR5, and a system on chip (SoC).

[0039] As shown in FIGS. 1 and 2, the test device according to the present invention may include a socket board (200) to which a test target element (20) is connected, a Hi-Fix (400) on which the socket board (200) is mounted, a cable (300) connected to the socket board (200), a test board (100) connected to the cable (300), and a test board box (900) on which the test board (100) is mounted.

[0040] First, at least one socket board (200) can be mounted on the Hi-Pix (400).

[0041] For example, FIG. 2 shows a Hi-Fix (400) equipped with four socket boards (200).

[0042] Next, the socket board (200) can be mounted on the Hi-Fix (400), and the socket board (200) can be electrically connected to the test target element (20) through the socket (500) provided on the socket board (200).

[0043] The socket board (200) may be provided with at least one socket (500), and thus, at least one test target element (20) may be mounted on the socket board (200).

[0044] However, at least two or more test target elements (20) can be mounted in one socket (500).

[0045] The socket board (200) can be connected to at least two test boards (100).

[0046] To this end, the socket board (200) may be provided with at least two socket board slots (210).

[0047] For example, FIG. 2 shows a socket board (200) equipped with four socket board slots (210).

[0048] A cable (300) can be connected to each of the socket board slots (210).

[0049] The cable (300) can be connected to the test board (100).

[0050] Each of the socket board slots (210) can be electrically connected to the socket (500).

[0051] Accordingly, when the test board (100) and the socket board slot (210) are electrically connected through the cable (300), the socket (500) connected to the socket board slot (210) can be electrically connected to the test board (100). Accordingly, the test target element (20) mounted on the socket (500) can be electrically connected to the test board (100).

[0052] Next, the test board (100) can be connected to the socket board (200) via at least one cable (300). To this end, the test board (100) may be provided with a test board connector (110) that is connected to the cable (300).

[0053] At least one test board (100) can be mounted in a test board box (900) as shown in FIGS. 1 and 2.

[0054] The test board (100) transmits power and test signals to a test target element (20) inserted into a socket (500) of a socket board (200) connected via a cable (300), and can test various characteristics and normal operation of the test target element (20) using test reception signals received from the test target element (20) according to the test signals.

[0055] For example, the test board (100) can transmit various types of test patterns to the test target device (20), receive test reception signals generated from the test target device (20) by the test patterns, and generate an analysis result for the test target device using the received test reception signals.

[0056] Each of the test boards (100) may be connected to the socket board (200) in a one-to-one manner, or two or more test boards (100) may be connected to one socket board (200). Additionally, the socket board (200) may be connected to the test target device (20) in a one-to-one manner, or two or more test target devices (20) may be connected to one socket board (200).

[0057] The test board (100) can be connected to the administrator terminal (30) via a network.

[0058] The test board (100) is driven according to various control signals transmitted from the administrator terminal (30) to test the test target element (20) and can transmit test information and analysis results generated by the test to the administrator terminal (30).

[0059] The administrator can control various functions of the test board (100) through the administrator terminal (30) and monitor various test information generated from the test board (100) through the administrator terminal (400).

[0060] Finally, the cable (300) performs the function of connecting the test board (100) to the socket board (200). The test board (100) and the socket board (200) are connected via at least one cable (300). The socket board (200) can be connected to at least two test boards (100).

[0061] To this end, the socket board (200) may be provided with at least two socket board slots (310) connected to at least two cables (300).

[0062] One end of the cable (300) is connected to a socket board slot (210) provided in the socket board (200), and the other end of the cable (300) is connected to a test board connector (110) provided in the test board (100), so that the test board (100) can be connected to the socket board (200).

[0063] Accordingly, various test signals output from the test board (100) can be transmitted to the test target device (20) through the socket board (200), and various test reception signals generated from the test target device (20) can be transmitted to the test board (100) through the socket board (200) and the cable (300).

[0064] When the number of test signals transmitted from the test board (100) to the test target device (20) and the number of test reception signals transmitted from the test target device (20) to the test board (100) are large, at least two cables (300) can be connected to one test board (100).

[0065] The cable (300) may include a first connector (310) connected to a socket board slot (210), a second connector (320) connected to a test board connector (110), and a connecting cable (330) connecting the first connector (310) and the second connector (320).

[0066] FIGS. 3 and 4 are exemplary diagrams showing the connection relationships between test boards and socket boards applied to a test device according to the present invention. In the following description, content identical or similar to that described with reference to FIGS. 1 and 2 is omitted or briefly described.

[0067] As described above, the test device (10) according to the present invention may include a socket board (200) on which test target elements (20) are mounted, at least two test boards (100) that perform tests on the test target elements (20), and at least two cables (300) that connect the at least two test boards (100) to the socket board (200) by connecting them to at least two socket board slots (210) provided in the socket board (200).

[0068] In this case, at least two test target elements (20) can be connected to the socket board (200). To this end, the socket board (200) may be equipped with at least two sockets (500).

[0069] That is, at least one test target element (20) can be connected to each of at least two sockets (500).

[0070] The socket board (200) may be provided with at least two socket board slot resistors (220) corresponding to at least two socket board slots (210).

[0071] First, the socket board (200) is described as follows.

[0072] Each of at least two socket board slot resistors (220) can be connected to at least one of two socket board slots (210).

[0073] Accordingly, each of at least two socket board slot resistors (220) can be electrically connected to a cable (300) connected to a socket board slot (210). The cable (300) can be connected to a test board (100). Accordingly, each of the socket board slot resistors (220) can be connected to a test board (100).

[0074] In this case, the socket board slot resistor (220) may be provided inside the socket board slot (210) or may be provided on the socket board (200).

[0075] To elaborate, as illustrated in FIG. 3, when the socket board (200) is provided with four socket board slots (210), one socket board slot resistor (220) may be provided in each of the four socket board slots (210). Thus, the socket board (200) may be provided with four socket board slot resistors (220).

[0076] In this case, a socket (500) can be connected to each of the four socket board slots (210), and at least one test target element (20) can be mounted in the socket (500).

[0077] At least two socket board slot resistors (220) have different resistance values.

[0078] The present invention is characterized in that a test board (100) recognizes at least one of the number, coordinates, location, and identifier of a socket board slot (210) to which it is connected (hereinafter simply referred to as a number), and to this end, the socket board slot resistors (220) may have resistance values ​​of different sizes.

[0079] That is, a socket board slot resistor (220) having a specific resistance value can be connected to each of the socket board slots (210).

[0080] Accordingly, when the resistance value of the socket board slot resistor (220) is determined, the socket board slot (210) connected to the socket board slot resistor (220) whose resistance value was determined can be determined, and thus the test board (100) can check where on the socket board (200) the socket board slot (210) connected to it is provided.

[0081] Accordingly, the test board (100) can check the location of the test target element (20) currently being tested.

[0082] That is, since the test target element (20) is mounted in a socket (500) connected to a socket board slot (210), the location of the test target element (20) can also be confirmed when the socket board slot (210) is identified.

[0083] To this end, each of the test boards (100) can store the resistance values ​​of the socket board slot resistors (220) and the numbers of the socket board slots (210) connected to the socket board slot resistors (220).

[0084] Therefore, when the resistance value of the socket board slot resistor (220) is confirmed, the test board (100) can confirm the number of the socket board slot (210) to which it is connected and can accurately confirm the location of the test target component (10) that it is testing.

[0085] To elaborate, each of at least two test boards (100) can be connected to at least one of two socket board slot resistors (220) through at least one of two socket board slots (210).

[0086] At least one of each of at least two test boards (100) and at least two socket board slot resistors (220) can be electrically connected through a cable (300).

[0087] In this case, the test board (100) can measure the resistance value of the socket board slot resistor (220) connected to it, and accordingly, can determine the location of the socket board slot (210) connected to it.

[0088] A socket (500) is connected to the socket board slot (210), and a test target component (20) is connected to the socket (500).

[0089] Therefore, the test board (100) can check the location of the test target element (20) that it is testing.

[0090] Second, the test board (100) is described as follows.

[0091] Each of at least two test boards (100) may include, as illustrated in FIG. 3, a judgment unit (120) that generates a test signal or a slot judgment signal, a test board connector (110) connected to a cable (300), a test resistor (130) connected between a first terminal of the test board connector (110) and the judgment unit (120), a switch (140) connected between the first terminal and the second terminal of the test board connector (110), and a sensing unit (150) connected between the first terminal and the judgment unit (120).

[0092] First, the judgment unit (120) can generate and output a test signal during the test period and can generate and output a slot judgment signal during the slot judgment period.

[0093] The test period refers to the period during which a test is conducted on the test target device (20).

[0094] The slot determination period refers to the period during which the test board (100) determines the resistance (220) of the socket board slot to which it is connected.

[0095] The test signal can be transmitted to the test target element (20) through, for example, a test resistor (130), a test board connector (110), a cable (300), a socket board slot (210), and a socket (500).

[0096] The slot determination signal can be transmitted to the socket board slot resistor (220) through, for example, the sensing unit (150), the switch (140), the test board connector (110), the cable (300), and the socket board slot (210).

[0097] Next, the test board connector (110) may include a first terminal connected to a test resistor (130) and a second terminal connected to a switch (140).

[0098] The first terminal of the test board connector (110) can be connected to the first terminal of the socket board slot (210) via a cable (300), and the first terminal of the socket board slot (210) can be connected to the socket (500).

[0099] The second terminal of the test board connector (110) can be connected to the second terminal of the socket board slot (210) via a cable (300), and the second terminal of the socket board slot (210) can be connected to the socket board slot resistor (220).

[0100] Next, the test resistor (130) can perform the function of transmitting a test signal during the test period and the function of generating a reference voltage during the slot determination period. The test resistor (130) can be composed of at least one resistor.

[0101] For example, during the slot judgment period, a slot judgment signal (e.g., test voltage) output from the judgment unit (120) can be applied to the test resistor unit (130) through the sensing unit (150) and can be transmitted to the socket board slot resistor (220) through the switch (140).

[0102] In this case, a constant voltage can be applied to the test resistor (130), and thus, the sensing unit (150) can accurately sense the voltage value of the socket board slot resistor (220).

[0103] That is, the test resistor (130) can perform the function of generating a reference voltage during the slot judgment period.

[0104] Next, the switch (140) can be connected between the first terminal and the second terminal of the test board connector (110).

[0105] The switch (140) can be turned open during the test period and turned on during the slot judgment period.

[0106] Next, the sensing unit (150) can be connected between the first terminal of the test board connector (110) and the judgment unit (120).

[0107] As described above, the sensing unit (150) can perform the function of sensing the resistance value of the socket board slot resistor (220) during the slot determination period.

[0108] Using the value sensed by the sensing unit (150), the judgment unit (120) can determine the resistance value of the socket board slot resistor (220) to which the test board (100) is connected, and thereby can check the number of the socket board slot (210) to which it is connected.

[0109] Next, the first terminal of the test board connector (110) can be connected to a socket (500) provided in the socket board (200) through a cable (300) and at least one of the two socket board slots (210).

[0110] A test target element (20) can be connected to the socket (500).

[0111] Accordingly, a test of the test target device (20) can be conducted during the test period.

[0112] The second terminal of the test board connector (110) can be connected to a socket board slot resistor (220) through a cable (300) and at least one of two socket board slots (210).

[0113] Accordingly, during the slot determination period, the test board (100) can check the socket board slot resistance (220) to which it is connected.

[0114] Next, the switch (140) is turned on during a slot determination period in which the socket board slot resistance (220) connected to the switch (140) is determined, and can be turned off during a test period in which a test target component connected through the first terminal is tested.

[0115] The switch (140) can be turned on or turned off according to the control of the judgment unit (120).

[0116] Finally, the test boards (100) can be controlled entirely by the control unit (600).

[0117] Third, below, a driving method of the test device (10) according to the present invention is described in detail with reference to FIGS. 1 to 4.

[0118] First, a slot determination period is conducted before the test of the test elements (10) is performed.

[0119] During the slot determination period, the administrator connects the test boards (100) and the socket board slots (210) with cables (300). In this case, the test target components (20) may or may not be mounted in the socket (500).

[0120] Next, during the slot judgment period, the judgment unit (120) turns on the switch (140).

[0121] Accordingly, as illustrated in FIG. 3, the judgment unit (120) and the sensing unit (150) can be connected to the socket board slot resistor (220) through the switch (140).

[0122] Next, the judgment unit (120) can output a slot judgment signal, and the slot judgment signal can be transmitted to the socket board slot resistor (220) through the sensing unit (150), the switch (140), the second terminal of the test board connector (110), and the second terminal of the socket board slot (210).

[0123] Next, for example, if the slot judgment signal is a voltage, the voltage output from the judgment unit (120) can be branched to the test resistor unit (130) and the socket board slot resistor (220), and the judgment unit (120) knows the resistance value of the test resistor unit (130).

[0124] The voltage sensed through the sensing unit (150) can correspond to the socket board slot resistor (220).

[0125] Accordingly, the judgment unit (120) can determine the resistance value of the socket board slot resistor (220) connected to the sensing unit (150) by analyzing the signal sensed through the sensing unit (150).

[0126] Next, the judgment unit (120) can compare the previously stored information with the sensed resistance value to determine the location or number of the socket board slot (210) to which the socket board slot resistor (220) connected to the test board (100) is connected.

[0127] Accordingly, the judgment unit (120) can determine the number or location of the socket board slot (210) to which the test board (100) is connected, among at least two socket board slots (210) provided in the socket board (200).

[0128] Next, when the slot judgment period as described above ends, the judgment unit (120) turns off the switch (140).

[0129] Next, the manager can mount the test target components (20) in the sockets (500) of the socket board (200).

[0130] Finally, the judgment unit (120) can transmit various types of test signals to the test target device (20) through the test board connector (110), socket board slot (210) and socket (500), and accordingly, can perform a test on the test target device (20).

[0131] In this case, the judgment unit (120) can determine the location or number of the socket board slot (210) connected to the test board (100) through the slot judgment period, and thus can determine the number or location of the socket (500) connected to the socket board slot (210).

[0132] Accordingly, the judgment unit (120) can match information such as a socket (500) on which the test target element is installed with the analysis result of the test target element, and the matched information can be transmitted to the administrator terminal (30).

[0133] That is, the judgment unit (120) can provide information to the manager that matches the analysis result with information about the test target element (20).

[0134] Accordingly, the manager can extract the test target element corresponding to the analysis result among the tested test target elements (20) and take follow-up measures regarding the test target element (20).

[0135] For example, the manager can easily identify the test target component that has been determined to be an error in the analysis result by using information about the verification socket board slot (210) through the slot judgment period, and accordingly, can discard or repair the test target component.

[0136] That is, according to the present invention, the location or number of the test target element (20) that has been tested can be confirmed by the test board (100), and thus, the possibility that the test target element (10) and the analysis result do not match can be eliminated.

[0137] Therefore, the reliability of the analysis results of the test device (10) can be improved.

[0138] The embodiments described above should be understood as illustrative in all respects and not limiting. The scope of the invention is defined by the claims set forth below rather than by the detailed description above, and all modifications or variations derived from the meaning and scope of the claims and equivalent concepts thereof should be interpreted as being included within the scope of the invention. Explanation of the symbols

[0139] 10: Test device 20: Component under test 100: Test board 200: Socket board

Claims

Claim 1 A test device comprising: a socket board on which test target elements are mounted; at least two test boards for performing tests on the test target elements; and at least two cables connected to at least two socket board slots provided in the socket board to connect the at least two test boards to the socket board, wherein at least two test target elements are connected to the socket board, and the socket board is provided with at least two socket board slot resistors corresponding to the at least two socket board slots, and each of the at least two socket board slot resistors is electrically connected to a cable connected to the socket board slot. Claim 2 A test device according to claim 1, wherein each of the at least two socket board slot resistors is connected to one of the at least two socket board slots. Claim 3 delete Claim 4 In claim 1, the test device wherein the at least two socket board slot resistors have resistance values ​​of different sizes. Claim 5 A test device comprising: a socket board on which test target elements are mounted; at least two test boards for performing tests on the test target elements; and at least two cables connected to at least two socket board slots provided in the socket board to connect the at least two test boards to the socket board, wherein at least two test target elements are connected to the socket board, and the socket board is provided with at least two socket board slot resistors corresponding to the at least two socket board slots, and each of the at least two test boards is connected to one of the at least two socket board slot resistors through one of the at least two socket board slots. Claim 6 In claim 5, a test device in which each of the at least two test boards and at least two socket board slot resistors are electrically connected through a cable. Claim 7 A test device comprising: a socket board on which test target elements are mounted; at least two test boards for performing tests on the test target elements; and at least two cables connected to at least two socket board slots provided in the socket board to connect the at least two test boards to the socket board, wherein at least two test target elements are connected to the socket board, and the socket board is provided with at least two socket board slot resistors corresponding to the at least two socket board slots, and each of the at least two test boards comprises: a judgment unit for generating a test signal or a slot judgment signal; a test board connector connected to the cable; a test resistor unit connected between a first terminal of the test board connector and the judgment unit; a switch connected between the first terminal and a second terminal of the test board connector; and a sensing unit connected between the first terminal and the judgment unit. Claim 8 In claim 7, the first terminal is connected to a socket provided on the socket board through a cable and one of the at least two socket board slots, and the test device to which the test target is connected is connected to the socket. Claim 9 In claim 7, the second terminal is a test device connected to a socket board slot resistor through the cable and any one of the at least two socket board slots. Claim 10 In claim 7, the switch is turned on during a slot determination period for determining the resistance of a socket board slot connected to the switch, and is turned off during a test period for a test target component connected through the first terminal.

Images