Diagnostic Board And Test System Using The Same

Abstract

The object of the present invention is to provide a diagnostic board and a test system using the same, wherein the slot shape can be connected to test devices of different types. To this end, the diagnostic board according to the present invention comprises a first diagnostic connector, a second diagnostic connector, a switching unit connected to the second diagnostic connector, and a control unit connected to the first diagnostic connector through first communication lines, connected to or disconnected from the second diagnostic connector by the switching unit, and storing test information used for testing a test device.

Description

Technology Field

[0001] The present invention relates to a test system for testing the characteristics of a test target device. Background Technology

[0002] A test device is used to test the performance of memory devices or semiconductor components. A memory device or semiconductor component tested by a test device is called a test target component.

[0003] The test device can generate various types of test patterns and transmit them to the device under test, analyze the patterns and various signals received from the device under test to analyze the performance of the device under test, and provide the analysis results to the user.

[0004] In this case, since the types and shapes of the components under test are diverse, the types of test devices are also diverse.

[0005] In particular, since the shapes of the slot connectors provided on the components under test may differ, the shapes of the slots of the test devices may differ.

[0006] In this case, the reliability of the test target component tested by the test device can only be ensured if the reliability of the test device is ensured.

[0007] Therefore, a diagnostic board can be used to analyze the performance of the test device.

[0008] In this case, since the shapes of the slots of the test devices may differ, the shapes of the diagnostic connectors provided on the diagnostic boards may also differ.

[0009] Therefore, conventionally, in order to diagnose test devices with different slot shapes, various types of diagnostic boards having diagnostic connectors corresponding to the slots must be provided. Consequently, the cost of diagnosing test devices may increase. The problem to be solved

[0010] The objective of the present invention to solve the aforementioned problem is to provide a diagnostic board and a test system using the same, wherein the slot shape can be connected to test devices of different types. means of solving the problem

[0011] A diagnostic board according to the present invention for achieving the above-mentioned purpose comprises a first diagnostic connector, a second diagnostic connector, a switching unit connected to the second diagnostic connector, and a control unit connected to the first diagnostic connector through first communication lines, connected to or disconnected from the second diagnostic connector by the switching unit, and storing test information used for testing a test device.

[0012] When a connection control signal is received from the test device through the second diagnostic connector, the switching unit connects the second diagnostic connector to the control unit, and when a connection control signal is not received through the second diagnostic connector, the switching unit disconnects the second diagnostic connector from the control unit.

[0013] Second communication lines and a diagnostic control line are connected between the second diagnostic connector and the switching unit, and third communication lines corresponding to the second communication lines are connected between the switching unit and the control unit.

[0014] When a connection control signal is received from the test device through the second diagnostic connector and the diagnostic control line connected to the slot of the test device, the switching unit connects the second communication lines to the third communication lines, and when the connection control signal is not received, the switching unit disconnects the second communication lines from the third communication lines.

[0015] The diagnostic board according to the present invention further includes an output unit that outputs connection status information indicating that the second diagnostic connector is connected to the test device when a connection control signal is received from the test device through the second diagnostic connector.

[0016] The diagnostic board according to the present invention further includes a diagnostic auxiliary sensing line provided in the first diagnostic connector, and the diagnostic auxiliary sensing line is connected to a slot auxiliary sensing line provided in the first slot portion of the test device.

[0017] A test system according to the present invention for achieving the above-mentioned purpose includes a slot connected to a test target element or a diagnostic board, and a test board that supplies a test signal to the test target element, analyzes the characteristics of the test target element using a received test signal received from the test target element, supplies at least one of a test signal and a connection control signal to the diagnostic board, and determines whether the test signal is normal using the received test signal received from the diagnostic board.

[0018] The above slot includes a first slot section and a second slot section, and the test board includes a connection control signal generating section that generates the connection control signal.

[0019] A slot control line is provided between the above test board and the above second slot section to which the connection control signal is transmitted.

[0020] The test system according to the present invention further includes a slot auxiliary sensing line connected between the first slot portion and the connection control signal generating portion.

[0021] When the above connection control signal generating unit receives a sensing signal indicating that the first slot part and the first diagnostic connector of the diagnostic board are connected through the slot auxiliary sensing line, it outputs the connection control signal to the second slot part.

[0022] The slot auxiliary sensing line is connected to the diagnostic auxiliary sensing line provided in the diagnostic connector of the diagnostic board.

[0023] The above diagnostic board includes a first diagnostic connector, a second diagnostic connector, a switching unit connected to the second diagnostic connector, and a control unit connected to the first diagnostic connector through first communication lines, which is connected to or disconnected from the second diagnostic connector by the switching unit and stores test information used for testing a test device. Effects of the invention

[0024] According to the present invention, the performance of test devices with different slot shapes can be diagnosed using a single diagnostic board. Accordingly, the diagnostic cost of the test devices can be reduced.

[0025] Furthermore, according to the present invention, the problem of a diagnostic board incompatible with the test device being connected to the test device does not occur. Therefore, the problem of the test device being damaged due to a diagnostic board incompatible with the test device being connected to the test device does not occur.

[0026] In addition, according to the present invention, a user can visually confirm that the diagnostic board is connected to the test device. Accordingly, diagnosis of the test device can be performed quickly. Brief explanation of the drawing

[0027] FIG. 1 is an exemplary diagram showing the configuration of a test system according to the present invention. FIG. 2 is an exemplary diagram showing the configuration of a test device applied to a test system according to the present invention. FIG. 3 is an exemplary diagram showing a test device and a diagnostic board applied to a test system according to the present invention. FIG. 4 is an exemplary diagram showing another test device and diagnostic board applied to a test system according to the present invention. Specific details for implementing the invention

[0028] Throughout the specification, identical reference numbers denote substantially identical components. In the following description, detailed descriptions of components and functions known in the art may be omitted if they are not related to the core components of the invention. The meanings of the terms described in this specification should be understood as follows.

[0029] The advantages and features of the present invention and the methods for achieving them will become clear by referring to the embodiments described below in detail together with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below but may be implemented in various different forms. These embodiments are provided merely to ensure that the disclosure of the present invention is complete and to fully inform those skilled in the art of the scope of the invention, and the present invention is defined only by the scope of the claims.

[0030] The shapes, sizes, ratios, angles, numbers, etc. disclosed in the drawings for explaining embodiments of the present invention are exemplary, and therefore the present invention is not limited to the depicted details. Throughout the specification, the same reference numerals refer to the same components. Furthermore, in describing the present invention, if it is determined that a detailed description of related known technology may unnecessarily obscure the essence of the present invention, such detailed description is omitted.

[0031] Where terms such as 'comprising,' 'having,' 'consisting of,' etc. are used in this specification, other parts may be added unless 'only' is used. Where a component is expressed in the singular, it includes cases where it is included in the plural unless specifically stated otherwise.

[0032] In interpreting the components, they are interpreted to include a margin of error even in the absence of a separate explicit statement.

[0033] In the case of describing a positional relationship, for example, when the positional relationship between two parts is described using expressions such as 'on,' 'upper,' 'lower,' or 'next to,' one or more other parts may be located between the two parts unless 'immediately' or 'directly' is used.

[0034] In the case of an explanation of a temporal relationship, for example, when a temporal sequence is explained using 'after', 'following', 'next', 'before', etc., it may include cases where the sequence is not continuous unless 'immediately' or 'directly' is used.

[0035] Although terms such as "first," "second," etc. are used to describe various components, these components are not limited by these terms. These terms are used merely to distinguish one component from another. Accordingly, the first component mentioned below may be the second component within the technical scope of the present invention.

[0036] "X-axis direction," "Y-axis direction," and "Z-axis direction" should not be interpreted solely as geometric relationships in which the relationship between them is perpendicular, but may mean having a broader directionality within the range in which the configuration of the present invention can function functionally.

[0037] The term “at least one” should be understood to include all combinations that can be presented from one or more related items. For example, the meaning of “at least one of the first item, the second item, and the third item” may mean not only the first item, the second item, or the third item individually, but also all combinations of items that can be presented from two or more of the first item, the second item, and the third item.

[0038] The features of each of the various embodiments of the present invention may be combined or combined with one another, either partially or wholly, and may technically enable various interlocking and operation. Each embodiment may be implemented independently of one another or may be implemented together in an associated relationship.

[0039] Hereinafter, embodiments of the present specification are described in detail with reference to the attached drawings.

[0040] FIG. 1 is an exemplary diagram showing the configuration of a test system according to the present invention, and FIG. 2 is an exemplary diagram showing the configuration of a test device applied to the test system according to the present invention.

[0041] As shown in FIG. 1, the test system according to the present invention may include a test device (100), a test target element (500), a diagnostic board (200), and a user terminal.

[0042] As illustrated in FIGS. 1 and 2, the test device (100) includes a test board (110) that generates a test signal to be transmitted to a test target element (500) and analyzes the characteristics of the test target element (500) using a received test signal received from the test target element (500), and a slot (120) that connects the test board (110) to the test target element (500). In this case, the slot (120) and the test board (110) may be connected by a Hi-Fix board (130).

[0043] Each of the test boards (110) may be connected to a slot (120) in a one-to-one manner, or two or more test boards (110) may be connected to a single slot (120). Additionally, a test board (110) may be connected to at least two slots (120).

[0044] The test board (110) can communicate with the test target element (500) connected to the slot (120) to test whether the test target element (500) is operating normally.

[0045] First, the test target device (500) can be any one of various types of memory devices such as, for example, a Solid State Drive (SSD) (hereinafter simply referred to as SSD), DDR (Double Data Rate) 4 and DDR5, or any one of integrated circuits that perform various functions.

[0046] Next, the test board (110) can transmit various types of test signals to a test target device (200) connected to a slot (120), and can test various characteristics of the test target device (500) using the received test signals received from the test target device through the slot (120).

[0047] To this end, the test board (110) may include a test signal generating unit and an input / output control signal generating unit that generate test signals to be transmitted to the test target device (500), and may include a test board control unit that analyzes the characteristics of the test target device (500) using a received test signal received from the test target device (500).

[0048] The test board control unit can generate various test commands to generate various types of test signals and can store various information for this purpose. Based on the test commands generated by the test board control unit, various types of test signals can be generated by the test signal generation unit, and various types of control signals can be generated by the input / output control signal generation unit.

[0049] The test board (110) can be connected to the slot (120) through the Hi-Fix board (130).

[0050] The test device (100) can be connected to a monitoring terminal (400) via a network. The user can control various functions of the test device (100) through the monitoring terminal (400) and monitor various test information collected from the test device (100) through the monitoring terminal (400).

[0051] Next, the test device (100) is provided with at least one chamber (190), and the chamber (190) may be provided with at least one slot (120).

[0052] For example, the test device (100) illustrated in FIG. 2 may be equipped with two chambers (190), and each of the two chambers (190) may be equipped with eight slots (120). The eight slots (120) may be connected to the test board (110) through a Hi-Fix board (130).

[0053] Here, the chamber (190) forms a sealed space equipped with slots (120). That is, the test target elements (500) are connected to the slots (120) inside the chamber (190).

[0054] One test target element (500) can be connected to one slot (120). However, the number of test target elements (500) connected to one slot (120) can be varied.

[0055] Hereinafter, for convenience of explanation, a test device (100) including a slot (120) to which one test target element (500) or one diagnostic board (200) is connected is described as an example of the present invention.

[0056] Next, the test target element (500) can be connected to the slot (120).

[0057] Finally, before analyzing the characteristics of the test target element (500), a process for diagnosing the quality of the test device (100) may be performed, and in this case, a diagnostic board (200) may be used.

[0058] In the diagnostic process for the test device (100), it can be determined whether high-speed test signals and input / output control signals transmitted from the test device (100) to the diagnostic board (200) are normally generated in the test device and transmitted to the diagnostic board (200), and also whether the test device (100) and the diagnostic board (200) are operating organically with each other.

[0059] Through this diagnostic process, it can be determined whether the test device (100) is operating normally.

[0060] After determining through the diagnostic process that the test device (100) is operating normally, if the test target element (500) is tested using the test device (100), the reliability of the test result for the test target element (500) can be further improved.

[0061] The structure and function of the diagnostic board (200) are described in detail below with reference to FIGS. 3 and FIGS. 4.

[0062] FIG. 3 is an exemplary diagram showing a test device and a diagnostic board applied to a test system according to the present invention, and FIG. 4 is an exemplary diagram showing another test device and a diagnostic board applied to a test system according to the present invention.

[0063] First, with reference to FIGS. 3 and FIGS. 4, the diagnostic board (200) is described in detail.

[0064] First, as illustrated in FIGS. 3 and 4, the diagnostic board (200) may include a first diagnostic connector (220a), a second diagnostic connector (220b), a switching unit (230) connected to the second diagnostic connector (220b), and a control unit (210) connected to the first diagnostic connector (220a) through first communication lines (241a), connected to or disconnected from the second diagnostic connector (220b) by the switching unit (230), and storing test information used for testing the test device (100). The diagnostic connector (220) may include the first diagnostic connector (220a) and the second diagnostic connector (220b). The test information may include information regarding received test signals corresponding to test signals transmitted from the test device (100), and various information for generating received test signals.

[0065] The first diagnostic connector (220a) can be electrically and physically connected to the first slot portion (120a) provided in the slot (120) of the test device (100). The first diagnostic connector (220a) can be connected to the control unit (210).

[0066] The second diagnostic connector (220b) can be electrically and physically connected to the second slot portion (120b) provided in the slot (120) of the test device (100).

[0067] However, the slot (120) may include only the first slot portion (120a). In this case, the second diagnostic connector (220b) may not be electrically and physically connected to a separate configuration.

[0068] For example, each of the slots (120) provided in the test device (100) may include a first slot portion (120a) and a second slot portion (120b), as shown in FIG. 3.

[0069] Additionally, each of the slots (120) provided in the test device (100) may include only the first slot portion (120a).

[0070] Additionally, some of the slots (120) provided in the test device (100) may include a first slot portion (120a) and a second slot portion (120b) as shown in FIG. 3, and other portions may include only the first slot portion (120a).

[0071] Additionally, even if the first slot portion (120a) and the second slot portion (120b) are provided in the slot (120), the second slot portion (120b) may not be electrically connected to the second diagnostic connector (220b).

[0072] For example, as in the test device (100) illustrated in FIG. 4, when the slot (120) includes a first slot portion (120a) and a second slot portion (120b), the second slot portion (120b) may not be equipped with a communication line for transmitting various signals. In this case, the second slot portion (120b) may be physically connected to the second diagnostic connector (220b), but is not electrically connected.

[0073] The switching unit (230) may be provided between the second diagnostic connector (220b) and the control unit (210).

[0074] When a connection control signal (CCS) is received from the test device (100) through the second diagnostic connector (220b), the switching unit (230) can connect the second diagnostic connector (220b) to the control unit (210) as shown in FIG. 3.

[0075] However, if the connection control signal (CCS) is not received through the second diagnostic connector (220b), the switching unit (230) can disconnect the second diagnostic connector (220b) from the control unit, as shown in FIG. 4.

[0076] That is, the switching unit (230) may connect the second diagnostic connector (220b) to the control unit (210) according to the connection control signal (CCS), and may also disconnect the second diagnostic connector (220b) from the control unit (210).

[0077] The control unit (210) can be connected to the first diagnostic connector (220a) through the first communication lines (241a), can be connected to or disconnected from the second diagnostic connector (220b) by the switching unit (230), and can store test information used for testing the test device (100).

[0078] For example, as described above, the diagnostic board (200) is connected to the test device (100) to diagnose the quality of the test device (100), and thus, the control unit (210) of the diagnostic board (200) may store test information used for testing the test device (100).

[0079] To elaborate, when the control unit (210) receives test signals from the test device (100) only through the first diagnostic connector (220a) and the first communication line (241a), it can generate received test signals corresponding to the test signals and transmit them to the test device (100).

[0080] In this case, the test device (100) can analyze the test signals and the received test signals to diagnose whether the test device (100) is operating normally.

[0081] Additionally, the control unit (210) can generate reception test signals using test signals received from the test device (100) through the first diagnostic connector (220a) and the first communication line (241a), and test signals received from the test device (100) through the second diagnostic connector (220a), the second communication line (241b), the switching unit (230), and the third communication line (241d), and can transmit the generated reception test signals to the test device (100).

[0082] In this case, the test device (100) can analyze the test signals and the received test signals to diagnose whether the test device (100) is operating normally.

[0083] In this case, various signals, as well as test signals and reception test signals, can be transmitted through the first communication line (241a), the second communication line (241b) and the third communication line (241d), and power can also be transmitted.

[0084] In addition, depending on the function and configuration of the test device (100) to be diagnosed, the control unit (210) can perform various functions.

[0085] Next, second communication lines (241b) and a diagnostic control line (241c) may be connected between the second diagnostic connector (220b) and the switching unit (230), and third communication lines (241d) corresponding to the second communication lines (241b) may be connected between the switching unit (230) and the control unit (210). Additionally, the control unit (210) may be connected to the first diagnostic connector (220a) through the first communication lines (241a).

[0086] Here, the first communication line (241a), the second communication line (241b), and the third communication line (241d) may be lines through which a test signal or a reception test signal used during testing of the test device (100) is transmitted.

[0087] For example, when a high-speed test signal or a high-speed reception test signal is transmitted through the first communication line (241a), the second communication line (241b), and the third communication line (241d). The first communication line (241a), the second communication line (241b), and the third communication line (241d) can transmit the test signal or reception test signal using PCIe (Peripheral Component Interconnect Express).

[0088] In this case, each of the first communication line (241a), the second communication line (241b), and the third communication line (241d) may include at least two lines.

[0089] In addition, at least one power line supplying various power sources may be further connected between the first diagnostic connector (220a) and the control unit (210).

[0090] Additionally, at least one power line supplying various power sources may be further connected between the second diagnostic connector (220b) and the switching unit (230), and at least one power line supplying various power sources may also be further connected between the switching unit (230) and the control unit (210).

[0091] In this case, the second communication line (241b) and the third communication line (241d) can be connected by the switching unit (230).

[0092] The diagnostic control line (241c) can be connected between the second diagnostic connector (220b) and the switching unit (230).

[0093] In this case, as illustrated in FIG. 3, when a connection control signal (CCS) is received from the test device (100) through the diagnostic control line (241c), the switching unit (230) can connect the second communication line (241b) to the third communication line (241d).

[0094] That is, the connection control signal (CCS) output through the second slot portion (120b) of the test device (100) can be transmitted to the switching portion (230) through the diagnostic control line (241c) provided in the second diagnostic connector (220b), and when the connection control signal (CCS) is received, the switching portion (230) can connect the second communication line (241b) to the third communication line (241d).

[0095] However, if the diagnostic connector (220) is connected to a slot (120) that does not have a second slot portion (120b), or to a slot (120) that includes a second slot portion (120b) as shown in FIG. 4 but has no communication line in the second slot portion (120b), a connection control signal cannot be transmitted from the test device (100) to the switching portion (230).

[0096] In this case, the switching unit (230) can separate the second communication line (241b) and the third communication line (241d) as shown in FIG. 4.

[0097] To elaborate, when a connection control signal (CCS) is received from the test device (100) through the second diagnostic connector (220b) and the diagnostic control line (241c) connected to the slot (120) of the test device (100), the switching unit (230) can connect the second communication line (241b) to the third communication line (241d) as shown in FIG. 3.

[0098] However, if the connection control signal (CCS) is not received, the switching unit (230) can separate the second communication line (241b) from the third communication line (241d), as shown in FIG. 4.

[0099] Next, the diagnostic board (200) may further include an output unit (250) that outputs connection status information indicating that the second diagnostic connector (220b) is connected to the test device (100) when a connection control signal (CCS) is received from the test device (100) through the second diagnostic connector (220b), as illustrated in FIGS. 3 and 4.

[0100] For example, to diagnose a test device (100), the diagnostic connector (220) of the diagnostic board (200) is connected to a slot (120) including a first slot portion (120a) and a second slot portion (120b) as shown in FIG. 3. When a connection control signal (CCS) is received from the test device (100) through the second diagnostic connector (220b) and the diagnostic control line (241c), the output portion (250) can output light through a lamp, output a connection completion message through a display, or output a connection completion voice through a speaker.

[0101] Accordingly, the user can visually confirm that the diagnostic board (200) is connected to the test device (100). Afterward, the user can start diagnosing the test device.

[0102] Additionally, the diagnostic board (200) may further include an auxiliary output unit (250) connected to the first diagnostic connector (220a).

[0103] For example, when a diagnostic connector (220) is connected to a slot (120) that does not have a second slot portion (120b), or to a slot (120) that includes a second slot portion (120b) as shown in FIG. 4 but has no communication line in the second slot portion (120b), the auxiliary output portion (250) is driven by at least one signal transmitted to the first diagnostic connector (220a) through the first slot portion (120a) to output light through a lamp, output a connection completion message through a display, or output a connection completion voice through a speaker.

[0104] Accordingly, the user can visually confirm that the diagnostic board (200) is connected to the test device (100) and can start diagnosing the test device.

[0105] Finally, the diagnostic board (200) may further include a diagnostic auxiliary sensing line (241e) provided in the first diagnostic connector (220a) as shown in FIGS. 3 and 4.

[0106] The diagnostic auxiliary sensing line (241e) can be connected to the slot auxiliary sensing line (141e) provided in the first slot portion (120a) of the test device (100).

[0107] The diagnostic auxiliary sensing line (241e) may be formed of two diagnostic auxiliary lines. In this case, the two diagnostic auxiliary lines may be separated at the end of the first diagnostic connector (220a), and the two diagnostic auxiliary lines may be separated inside the first diagnostic connector (200a).

[0108] In this case, the slot auxiliary sensing line (141e) may include two separate slot auxiliary lines.

[0109] When the first slot portion (120a) is connected to the first diagnostic connector (220a), the two slot auxiliary lines can be connected to the two diagnostic auxiliary lines.

[0110] Accordingly, a sensing signal transmitted from the test board (110) to the first diagnostic connector (220a) through one of the two slot auxiliary lines can be transmitted back to the test board (110) through the first diagnostic connector (220a) and another slot auxiliary line.

[0111] However, the diagnostic auxiliary sensing line (241e) and the slot auxiliary sensing line (141e) can each be formed as a single line.

[0112] In this case, when the diagnostic auxiliary sensing line (241e) and the slot auxiliary sensing line (141e) are connected, the size or shape of the sensing signal output from the test board (100) and received by the test board (100) may differ from the size or shape of the sensing signal output from the test board (100) and received by the test board (100) when the diagnostic auxiliary sensing line (241e) and the slot auxiliary sensing line (141e) are not connected.

[0113] Accordingly, the test board (100) can analyze the size or shape of the received sensing signal to determine whether the first diagnostic connector (220a) and the first slot portion (120a) are connected.

[0114] When the test board (110) receives a sensing signal from the first diagnostic connector (220a) or determines that the first diagnostic connector (220a) and the first slot section (120a) are connected as a result of analyzing the sensing signal, it can transmit a connection control signal (CCS) to the second diagnostic connector (220b) through the second slot section (120b).

[0115] Second, with reference to FIGS. 3 and FIGS. 4, the test device (200) is described in detail.

[0116] First, as described above, the test device (100) may include a test board (110), a slot (120), and a Hi-Fix board (130).

[0117] The test device (100) may be provided with at least one slot (120).

[0118] The slot (120) can be connected to the test target element (500) or the diagnostic board (100).

[0119] The slot (120) may include a first slot portion (120a). The first slot portion (120a) may be provided with a first slot communication line (141a) connected to a test board (110).

[0120] The first slot communication line (141a) can be electrically connected to the first communication line (241a) through the first slot portion (120a) and the first diagnostic connector (220a).

[0121] The slot (120) may not include a second slot portion (120b), or it may include one.

[0122] Additionally, the slot portion (120b) included in the slot (120) may be provided with a second slot communication line (141b) and a slot control line (141c) as shown in FIG. 3, and may not be provided with a second slot communication line (141b) and a slot control line (141c) as shown in FIG. 4.

[0123] The second slot communication line (141b) can be electrically connected to the second communication line (241b) through the second slot portion (120b) and the second diagnostic connector (220b).

[0124] The slot control line (141c) can be electrically connected to the diagnostic control line (241c) through the second slot section (120b) and the second diagnostic connector (220b).

[0125] Next, when the test target element (500) is connected to the slot (120), the test board (110) can supply a test signal to the test target element (500) and can analyze the characteristics of the test target element (500) using the received test signal received from the test target element (500).

[0126] Additionally, when the diagnostic board (200) is connected to the slot (120), the test board (110) can supply at least one of a test signal and a connection control signal (CCS) to the diagnostic board (200), and can determine whether the test signal or the test device is normal using the received test signal received from the diagnostic board (200).

[0127] That is, the test board (110) may perform the function of testing the test target element (500), and may also diagnose various functions of the test device (100) and various components constituting the test device (100) using a received test signal received from the diagnostic board (200).

[0128] Next, the slot (120) may include a first slot portion (120a) and a second slot portion (120b), as illustrated in FIGS. 3 and 4.

[0129] However, as described above, the slot (120) may include only the first slot portion (120a).

[0130] Additionally, as illustrated in FIG. 4, the second slot portion (120b) included in the slot (120) may not be equipped with the second slot communication line (141bc) and the slot control line (141c).

[0131] The test board (110) may include a connection control signal generating unit (111) that generates a connection control signal (CCS).

[0132] For example, the test board (110) may include a connection control signal generating unit (111) and a test unit (112).

[0133] The test unit (112) may include at least one of the test signal generation unit, input / output control signal generation unit and test board control unit described above.

[0134] For example, the test signal generation unit can generate test signals to be transmitted to the test target device (500) or the diagnostic board (200).

[0135] The input / output control signal generation unit can generate various control signals to be transmitted to the test target device (500) or the diagnostic board (200).

[0136] The test board control unit can analyze the characteristics of the test target element (500) using a received test signal received from the test target element (500), or diagnose the performance of the test device using a received test signal received from the diagnostic board (200).

[0137] Next, a slot control line (141c) through which a connection control signal (CCS) is transmitted may be provided between the test board (110) and the second slot section (120b).

[0138] In particular, the slot control line (141c) can be connected between the connection control signal generation unit (111) and the second slot unit (120b).

[0139] Next, the test device (100) may include a slot auxiliary sensing line (141e) connected between the first slot portion (120a) and the connection control signal generating portion (111), as shown in FIGS. 3 and 4.

[0140] The sensing signal (SS) generated in the connection control signal generation unit (111) can be transmitted to the first diagnostic connector (220a) through the slot auxiliary sensing line (141e) and the first slot unit (120a), and can be received again by the connection control signal generation unit (111) through the first diagnostic connector (220a), the first slot unit (120a), and the slot auxiliary sensing line (141e).

[0141] To this end, as described above, the slot auxiliary sensing line (141e) may include two separated slot auxiliary lines, and the diagnostic auxiliary sensing line (241e) may include two diagnostic auxiliary lines. In this case, the two diagnostic auxiliary lines may be separated at the end of the first diagnostic connector (220a), and the two diagnostic auxiliary lines may be separated inside the first diagnostic connector (200a).

[0142] Accordingly, a sensing signal transmitted from the connection control signal generation unit (111) to the first diagnostic connector (220a) through one of the two slot auxiliary lines can be transmitted back to the connection control signal generation unit (111) through the two diagnostic auxiliary lines and another slot auxiliary line provided in the first diagnostic connector (220a).

[0143] However, as described above, the diagnostic auxiliary sensing line (241e) and the slot auxiliary sensing line (141e) can each be formed as a single line.

[0144] In this case, the connection control signal generation unit (111) can analyze the size or shape of the sensing signal to determine whether the first diagnostic connector (220a) and the first slot unit (120a) are connected.

[0145] Finally, when the connection control signal generating unit (111) receives a sensing signal (SS) indicating that the first slot unit (120a) and the first diagnostic connector (220a) of the diagnostic board (200) are connected through the slot auxiliary sensing line (141e), it can output a connection control signal (CCS) to the second slot unit (220b).

[0146] As described above, the slot auxiliary sensing line (141e) can be connected to the diagnostic auxiliary sensing line (241e) provided in the diagnostic connector (220) of the diagnostic board (200).

[0147] The diagnostic auxiliary sensing line (241e) may be provided, in particular, in the first diagnostic connector (220a).

[0148] Hereinafter, a method for operating a test system according to the present invention described above is described. In the following description, content identical or similar to that described with reference to FIGS. 1 to 4 is omitted or briefly described.

[0149] First, when a diagnostic process is performed on the test device (100), the user can connect the diagnostic connector (220) of the diagnostic board (200) to the slot (120) of the test device (100).

[0150] Next, as illustrated in FIGS. 3 and 4, when a diagnostic connector (220) is connected to a slot (120) including a first slot portion (120a) and a second slot portion (120b), the first diagnostic connector (220a) can be connected to the first slot portion (120a), and the second diagnostic connector (220b) can be connected to the second slot portion (120b).

[0151] Additionally, if a diagnostic connector (220) is connected to a slot (120) that includes only the first slot portion (120a), only the first diagnostic connector (220a) can be connected to the first slot portion (120a).

[0152] Accordingly, according to the present invention, a diagnostic board (200) can be connected to a slot (120) that includes only the first slot portion (120a), and a diagnostic board (200) can also be connected to a slot (120) that includes both the first slot portion (120a) and the second slot portion (120b).

[0153] That is, according to the present invention, in order to test different types of test target elements (500), a single diagnostic board (200) can be commonly connected to test devices (100) that include slots (120) having different shapes. Accordingly, diagnosis of two different types of test devices can be performed using a single diagnostic board (200).

[0154] However, if the slot (120) applied to the test device (100) further includes a third slot portion in addition to the first slot portion (120a) and the second slot portion (120a), the diagnostic board (200) may further be provided with a third diagnostic connector corresponding to the third slot portion. Additionally, if the slot (120) applied to the test device (100) further includes a fourth slot portion, the diagnostic board (200) may further be provided with a fourth diagnostic connector corresponding to the fourth slot portion.

[0155] In this case, the same configurations as those connected to the second diagnostic connector (220b) can be connected to each of the third diagnostic connector and the fourth diagnostic connector.

[0156] For example, components corresponding to the second communication line (241b), the diagnostic control line (241c), the switching unit (230), the third communication line (241d), and the output unit (250) may be connected to each of the third diagnostic connector and the fourth diagnostic connector.

[0157] Accordingly, according to the present invention, diagnosis of test devices (100) having various types of slots can be performed through a single diagnostic board (200).

[0158] Next, as illustrated in FIG. 3, when a diagnostic connector (220) is connected to a slot (120) including a first slot portion (120a) and a second slot portion (120b), the connection control signal generating unit (111) can transmit a connection control signal (CCS) to a switching unit (230) through a slot control line (141c), a second slot portion (120b), a second diagnostic connector (220b), and a diagnostic control line (241c).

[0159] In this case, the connection control signal generating unit (111) can transmit the connection control signal (CCS) to the switching unit (230) when a control signal for transmitting the connection control signal (CCS) is received from the test unit (112), or can transmit the connection control signal (CCS) to the switching unit (230) when a sensing signal corresponding to the sensing signal transmitted to the first diagnostic connector (220a) is received.

[0160] Next, when a connection control signal (CCS) is received by the switching unit (230), the switching unit (230) can connect the second communication line (241b) to the third communication line (241d).

[0161] Next, when a connection control signal (CCS) is received through the diagnostic control line (241c), the output unit (250) can output light through a lamp, output a connection completion message through a display, or output a connection completion voice through a speaker.

[0162] Accordingly, the user can visually confirm that the diagnostic board (200) is connected to the test device (100).

[0163] Finally, the user who confirms that the diagnostic board (200) is connected to the test device (100) can select the diagnostic start menu through the monitoring terminal (400), and accordingly, the test unit (112) can start a diagnosis of the test device (100).

[0164] In this case, the test unit (112) can automatically start diagnosing the test device (100) after a preset period has elapsed following the transmission of the connection control signal (CCS) to the switching unit (230).

[0165] Additionally, the test unit (112) can automatically start diagnosing the test device (100) after a pre-set period has elapsed following the reception of a sensing signal (SS) through the slot auxiliary sensing line (141e) or the connection control signal generation unit (111).

[0166] Additionally, when a diagnostic connector (220) is connected to a slot (120) that does not include a second slot portion (120b) or a slot (120) that includes a second slot portion (120b) that is not equipped with a second slot communication line (141bc) and a slot control line (141c), the test portion (112) can start a diagnosis of the test device (100) through various methods as described above.

[0167] Accordingly, according to the present invention, diagnosis of various test devices (100) including slots (120) having various structures can be performed using a single diagnostic board (200).

[0168] Accordingly, according to the present invention, the diagnostic process for the test devices (100) can be carried out more simply and quickly, and the maintenance and manufacturing costs of the diagnostic board (200) can be reduced.

[0169] The embodiments described above should be understood as illustrative in all respects and not limiting. The scope of the invention is defined by the claims set forth below rather than by the detailed description above, and all modifications or variations derived from the meaning and scope of the claims and equivalent concepts thereof should be interpreted as being included within the scope of the invention. Explanation of the symbols

[0170] 100: Test device 500: Component under test 200: Diagnostic board

Claims

Claim 1 A diagnostic board comprising: a first diagnostic connector; a second diagnostic connector; a switching unit connected to the second diagnostic connector; and a control unit connected to the first diagnostic connector through first communication lines, connected to or disconnected from the second diagnostic connector by the switching unit, and storing test information used for testing a test device, wherein second communication lines and a diagnostic control line are connected between the second diagnostic connector and the switching unit, and third communication lines corresponding to the second communication lines are connected between the switching unit and the control unit, and when a connection control signal is received from the test device through the second diagnostic connector and the diagnostic control line, the switching unit connects the second communication lines to the third communication lines, and when a connection control signal is not received from the test device, the switching unit disconnects the second communication lines from the third communication lines. Claim 2 A diagnostic board according to claim 1, wherein when a connection control signal is received from a test device through the second diagnostic connector, the switching unit connects the second diagnostic connector to the control unit, and when a connection control signal is not received through the second diagnostic connector, the switching unit disconnects the second diagnostic connector from the control unit. Claim 3 delete Claim 4 delete Claim 5 A diagnostic board according to claim 1, further comprising an output unit that outputs connection status information indicating that the second diagnostic connector is connected to the test device when a connection control signal is received from the test device through the second diagnostic connector. Claim 6 A diagnostic board according to claim 1, further comprising a diagnostic auxiliary sensing line provided in the first diagnostic connector, wherein the diagnostic auxiliary sensing line is connected to a slot auxiliary sensing line provided in the first slot portion of the test device. Claim 7 A slot connected to a test target device or a diagnostic board; and a test board that supplies a test signal to the test target device and analyzes the characteristics of the test target device using a received test signal received from the test target device, or supplies at least one of a test signal and a connection control signal to the diagnostic board and determines whether the test signal is normal using a received test signal received from the diagnostic board, wherein the diagnostic board comprises: a first diagnostic connector; a second diagnostic connector; and a switching unit connected to the second diagnostic connector. A test system comprising a control unit that is connected to the first diagnostic connector through first communication lines, is connected to or disconnected from the second diagnostic connector by the switching unit, and stores test information used for testing a test device, wherein second communication lines and a diagnostic control line are connected between the second diagnostic connector and the switching unit, and third communication lines corresponding to the second communication lines are connected between the switching unit and the control unit, and when a connection control signal is received from the test device through the second diagnostic connector and the diagnostic control line, the switching unit connects the second communication lines to the third communication lines, and when a connection control signal is not received from the test device, the switching unit disconnects the second communication lines from the third communication lines. Claim 8 In claim 7, the slot comprises a first slot portion and a second slot portion, and the test board comprises a test system including a connection control signal generating portion that generates the connection control signal. Claim 9 In claim 8, a test system is provided with a slot control line between the test board and the second slot portion through which the connection control signal is transmitted. Claim 10 A test system according to claim 8, further comprising a slot auxiliary sensing line connected between the first slot portion and the connection control signal generating portion. Claim 11 In claim 10, the connection control signal generating unit outputs the connection control signal to the second slot unit when a sensing signal indicating that the first slot unit and the first diagnostic connector of the diagnostic board are connected is received through the slot auxiliary sensing line. Claim 12 In claim 10, the slot auxiliary sensing line is a test system connected to a diagnostic auxiliary sensing line provided in the diagnostic connector of the diagnostic board. Claim 13 delete

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