Inspection method using CAN communication of the equipment mounted in a satellite system

Abstract

The present invention discloses a method for inspecting satellite system onboard equipment using CAN communication, wherein the method is configured to analyze and verify signals of different onboard equipment using a test bench system, and comprises: an identification code receiving step of receiving an identification code of said onboard equipment from said onboard equipment; a pin-mapping data acquisition step of acquiring pin-mapping data of said onboard equipment identified by said identification code; an inspection signal transmission and reception step of transmitting a plurality of inspection signals valid for said onboard equipment to said onboard equipment or receiving them from said onboard equipment based on said acquired pin-mapping data; and a signal inspection and verification step of analyzing said inspection signals to verify whether they are normal, wherein the identification code and inspection signals are transmitted via CAN communication. Accordingly, the present invention has the effect of easily connecting and testing various equipment in the same test environment without the need to manufacture customized cables for each piece of equipment when testing equipment using a test bench system.

Description

Technology Field

[0001] The present invention relates to a method for inspecting onboard equipment of a satellite system using CAN communication, and more specifically, to a method for inspecting onboard equipment of a satellite system using CAN communication in which, when testing equipment using a test bench system, the test bench system and the onboard equipment are connected via CAN communication, thereby allowing various equipment to be easily connected and tested in the same test environment without the need to manufacture customized cables for each piece of onboard equipment. Background Technology

[0003] Generally, when testing onboard equipment installed in a satellite system, the inspection is conducted by connecting the test bench system and the onboard equipment with a cable and verifying the results through the analysis of the input and output signals of various types of components to be inspected within the onboard equipment.

[0004] Here, the payload equipment may be various types of equipment mounted on a satellite system, and the satellite system may be a satellite body, a support system for the same, or a simulator for the same.

[0005] In this case, in the prior art, individual input / output cards are configured according to the signal type of the mounted equipment, and the test bench system must be connected to the input / output card corresponding to each signal type using a Pin-to-Pin method.

[0006] FIG. 1 is a block diagram illustrating the configuration of a test bench for inspecting equipment using the pin-to-pin method of the prior art.

[0007] Referring to FIG. 1, in a conventional pin-to-pin method, when the signals input and output to the device under test (21) equipped in the device under test (DUT) include various signal types (DI, DO, AI, AO, Encoder, etc.), a cable is required to connect each signal to an input / output card.

[0008] Accordingly, the conventional test bench system (10) is configured to include a test bench rack assembly (12) in which a test bench computer and peripheral devices are installed in a rack, and a test bench monitor (11) that displays test execution results, and is connected to the mounted equipment (DUT) using a cable with a different pin configuration for each mounted equipment (DUT).

[0009] Consequently, in conventional structures, signal types differ for each Device Under Test (DUT) and their respective pin maps vary, requiring the fabrication of separate cables for each device. This not only increases cable manufacturing costs but also complicates signal connection and inspection procedures, leading to problems where significant time and costs are incurred during testing and maintenance. Prior art literature

[0010] Registered Patent Publication No. 1449475 (Registered on Oct. 02, 2014) The problem to be solved

[0011] Accordingly, the present invention was devised to solve the problems of the prior art, and aims to provide a method for inspecting satellite system onboard equipment using CAN communication, which allows various equipment to be easily connected and tested in the same test environment without the need to manufacture customized cables for each onboard equipment by connecting the test bench system and the onboard equipment via CAN communication when testing equipment using a test bench system.

[0013] The technical problems that the present invention aims to solve are not limited to those mentioned above, and other unmentioned technical problems will be clearly understood by those skilled in the art to which the present invention belongs from the description below. means of solving the problem

[0015] To achieve the above objectives, the inspection method of a satellite system onboard equipment using CAN communication according to the present invention is an inspection method using a test bench system configured to analyze and verify signals of different onboard equipment, comprising: an identification code receiving step of receiving an identification code of the onboard equipment from the onboard equipment; a pin-mapping data acquisition step of acquiring pin-mapping data of the onboard equipment identified by the identification code; an inspection signal transmission and reception step of transmitting a plurality of inspection signals valid for the onboard equipment to the onboard equipment or receiving them from the onboard equipment based on the acquired pin-mapping data; and a signal inspection and verification step of analyzing the inspection signals to verify whether they are normal, wherein the identification code and inspection signals are transmitted via CAN communication.

[0016] The above-described mounted equipment includes one or more types of inspection target elements, and the inspection signal may include at least one digital input signal, a digital output signal, an analog input signal, an analog output signal, and an encoder signal that are input or output from the inspection target element according to the type of inspection target element.

[0017] The above-mentioned mounted equipment may include a CAN board configured to enable CAN communication with the test bench system, and the CAN board may include: a CAN communication unit that performs transmission and reception of the identification code and inspection signal with the test bench system via the CAN communication; a memory unit that stores an identification code for the mounted equipment; and a signal distribution unit that distributes the inspection signal transmitted and received via the CAN communication unit to a corresponding inspection target element among the plurality of inspection target elements.

[0018] The above pin-mapping data is stored in the memory unit, and the pin-mapping data acquisition step may be to read from the memory unit to acquire the pin-mapping data.

[0019] The above test bench system may include: a test bench computer that performs the identification code reception step, the pin-mapping data acquisition step, the inspection signal transmission and reception step, and the signal inspection and verification step; a test bench monitor that displays the execution result of the above test bench computer; and a CAN converter that converts the identification code and inspection signal to be transmitted via CAN communication between the test bench computer and the mounted equipment when the above identification code reception step and the inspection signal transmission and reception step are performed.

[0020] The above pin-mapping data is stored in memory provided in the test bench computer, and the pin-mapping data acquisition step may be to acquire the pin-mapping data by reading from memory provided in the test bench computer.

[0021] The above-mentioned one or more types of inspection target elements may include at least one DI switch corresponding to the digital input signal, a DO switch corresponding to the digital output signal, an AI switch corresponding to the analog input signal, an AO switch corresponding to the analog output signal, and an encoder switch corresponding to the encoder signal.

[0022] It may further include an inspection result report step that reports the results analyzed and verified in the above signal inspection and verification step. Effects of the invention

[0024] The inspection method for satellite system onboard equipment using CAN communication according to the present invention has the effect of easily connecting and testing various equipment in the same test environment without the need to manufacture customized cables for each piece of onboard equipment when testing equipment using a test bench system. Brief explanation of the drawing

[0026] FIG. 1 is a block diagram illustrating the configuration of a test bench for inspecting equipment using the pin-to-pin method of the prior art. FIG. 2 is a block diagram illustrating the configuration of a test bench for inspecting equipment using the CAN communication method of the present invention. Figure 3 is a diagram illustrating the internal configuration of a CAN board. FIG. 4 is a flowchart illustrating a method for inspecting onboard equipment according to the present invention. Specific details for implementing the invention

[0027] A preferred embodiment of the present invention will be described in detail below with reference to the accompanying drawings. The following detailed description is merely illustrative and illustrates a preferred embodiment of the present invention.

[0029] FIG. 2 is a block diagram illustrating the configuration of a test bench for inspecting equipment using the CAN communication method of the present invention.

[0030] Referring to FIG. 2, the test bench system (100) of the present invention may be configured to include a test bench computer (121) that performs a test bench computer inspection method of a mounted device according to a preset step, a test bench monitor (110) that displays the execution result of the test bench computer (121), and a CAN converter (122) that converts an identification code and a test signal to be transmitted via CAN communication between the test bench computer (121) and the mounted device (DUT, Device under test).

[0031] Additionally, the test bench system (100) of the present invention may further include a power supply unit (124) that receives power from an external power source and generates and supplies power required for the test bench system (100), and a power control panel (123) configured to control the power generated by the power supply unit (124).

[0032] At this time, the test bench computer (121), CAN converter (122), power control panel (123) and power supply unit (124) can be assembled in a rack separately from the test bench monitor (110) to form a test bench rack assembly (120).

[0033] The onboard equipment (DUT) may be various types of equipment mounted on a satellite system, wherein the satellite system may be a satellite body, its ground support system, or a simulator thereof. For example, the onboard equipment (DUT) may be power equipment, communication equipment, optical equipment, etc.

[0034] The onboard equipment (DUT) is configured to include one or more types of inspection target elements (210), and each type of inspection target element (210) may be configured to receive or output a corresponding signal.

[0035] Accordingly, the inspection signal for inspecting the inspection target element (210) is a signal input or output from each inspection target element (210), and may be a signal including at least one of a digital input signal, a digital output signal, an analog input signal, an analog output signal, and an encoder signal corresponding to each type of inspection target element (210).

[0036] At this time, the inspection target element (210) may be configured to include at least one type among a DI switch corresponding to a digital input signal, a DO switch corresponding to a digital output signal, an AI switch corresponding to an analog input signal, an AO switch corresponding to an analog output signal, and an encoder switch corresponding to an encoder signal.

[0037] According to FIG. 2, the test bench system (100) is connected to different onboard equipment (DUT) via a CAN communication cable so that CAN communication can be performed.

[0038] To this end, each mounted equipment (DUT) may be equipped with a CAN board (220) configured to enable CAN communication with the test bench system (100).

[0040] Figure 3 is a diagram illustrating the internal configuration of a CAN board.

[0041] Referring to FIG. 3, the CAN board (220) may be configured to include a CAN communication unit (221) that performs transmission and reception of identification codes and inspection signals with a test bench system (100) via CAN communication, a memory unit (222) in which identification codes for the mounted equipment (DUT) are stored, and a signal distribution unit (223) that distributes inspection signals transmitted and received via the CAN communication unit (221) to corresponding inspection target elements (210) among a plurality of inspection target elements (210).

[0042] The CAN communication unit (221) is connected to the CAN converter (122) of the test bench system (100) via a CAN communication cable and is configured to transmit and receive identification codes and inspection signals of each mounted equipment (DUT) via CAN communication.

[0043] The memory unit (222) is configured to store an identification code for a mounted device (DUT) and, upon request from the test bench system (100), to read out the stored identification code and transmit it to the test bench system (100) through the CAN communication unit (221) and the CAN communication cable.

[0044] Accordingly, the memory unit (222) may be configured to include non-volatile memory, such as ROM or flash memory.

[0045] Additionally, the memory unit (222) further stores pin-mapping data, which is mapping information of a component (210) to be inspected corresponding to an inspection signal, and is configured so that the stored pin-mapping data is read out upon request from the test bench system (100) and transmitted to the test bench system (100) through the CAN communication unit (221) and the CAN communication cable. Through this, the test bench computer (121) can acquire pin-mapping data of the mounted equipment (DUT).

[0046] Alternatively, pin-mapping data may be stored in memory provided in the test bench system (100), specifically in the test bench computer (121), according to the identification code of the mounted equipment (DUT). In this case, the test bench computer (121) may also read pin-mapping data corresponding to the received identification code from memory to obtain pin-mapping data for the mounted equipment (DUT).

[0047] The signal distribution unit is a component that distributes inspection signals transmitted and received by the CAN communication unit (221) to a corresponding inspection target element (210) among a plurality of inspection target elements (210), and may be configured to include a multiplexer (MUX) or a demultiplexer (DeMUX), and may distribute inspection signals transmitted and received based on pin-mapping data to a corresponding inspection target element (210).

[0049] FIG. 4 is a flowchart illustrating a method for inspecting onboard equipment according to the present invention.

[0050] Referring to FIG. 4, a method for inspecting satellite system equipment using CAN communication according to the present invention may be configured to include an identification code receiving step of receiving an identification code of the equipment (DUT) from the equipment (DUT), a pin-mapping data acquisition step of acquiring pin-mapping data of the equipment (DUT) identified by the identification code, an inspection signal transmission and reception step of transmitting a plurality of inspection signals valid for the equipment (DUT) to the equipment (DUT) or receiving them from the equipment (DUT) based on the acquired pin-mapping data, and a signal inspection and verification step of analyzing the inspection signals to verify whether they are normal.

[0051] Here, the identification code and inspection signal are characterized by being transmitted between the test bench system (100) and the onboard equipment (DUT) via CAN communication.

[0052] The identification code reception step is a step in which the test bench computer (121) receives an identification code of the mounted equipment (DUT) from the mounted equipment (DUT), and through this step, the test bench computer (121) can identify what kind of equipment the mounted equipment (DUT) is from the identification code received.

[0053] The pin-mapping data acquisition step is a step of acquiring pin-mapping data of a mounted device (DUT) identified by an identification code received by a test bench computer (121). As described above, when pin-mapping data is stored in the memory section (222) of the CAN board (220), the pin-mapping data acquisition step may be to acquire pin-mapping data by reading the memory section (222) in response to a request from the test bench system (100).

[0054] Alternatively, in the case where pin-mapping data is stored in memory provided in the test bench system (100), specifically in the test bench computer (121), according to the identification code of the mounted equipment (DUT), the pin-mapping data acquisition step may be to acquire pin-mapping data by reading the memory provided in the test bench computer (121).

[0055] The inspection signal transmission and reception step is a step of transmitting an inspection signal that effectively corresponds to each inspection target element (210) provided in the onboard equipment (DUT) to the onboard equipment (DUT) or receiving it from the onboard equipment (DUT), and this step may include matching and distributing the inspection signal and the corresponding inspection target element (210) based on the pin-mapping data obtained above.

[0056] The signal inspection and verification step is a step of verifying whether the inspection signal is normal by analyzing the inspection signal, and verification can be performed by analyzing whether the inspection signal is a signal corresponding to the normal operation of the inspection target element (210) based on the pin-mapping data.

[0057] Furthermore, the inspection method of the onboard equipment according to the present invention may further include an inspection result reporting step that reports the results analyzed and verified in the signal inspection and verification step described above.

[0058] At this time, during the inspection result report stage, the inspection result may be displayed on the test bench monitor (110), and may be saved or displayed as a separate file or document.

[0060] Through the above-described configuration, the method for inspecting satellite system equipment using CAN communication according to the present invention has the effect of easily connecting and testing various equipment in the same test environment without the need to manufacture customized cables for each piece of equipment (DUT) when testing equipment using a test bench system (100).

[0061] Although the present invention has been described and illustrated above based on preferred embodiments to exemplify the principles of the invention, the invention is not limited to the configuration and operation as described and illustrated. The embodiments described above should be understood as illustrative in all respects and not restrictive. The scope of the invention is defined by the claims set forth below, and all modifications or variations derived from the meaning and scope of the claims and equivalents thereof should be interpreted as being included within the scope of the invention. Explanation of the symbols

[0063] 10, 100: Testbench system 11, 110: Testbench monitor 12, 120: Test bench rack assembly 121: Testbench computer 122: CAN converter 123: Power control panel 124: Power supply unit 21, 210: Components under inspection 220: CAN board 221: CAN communication unit 222: Memory unit 223: Signal distribution unit DUT: Onboard equipment

Claims

Claim 1 A method for inspecting onboard equipment using a test bench system configured to analyze and verify signals of different onboard equipment, wherein the test bench system comprises: an identification code reception step in which the test bench system receives an identification code of the onboard equipment from the onboard equipment; a pin-mapping data acquisition step in which pin-mapping data of the onboard equipment identified by the received identification code is acquired; an inspection signal transmission and reception step in which a plurality of inspection signals valid for the onboard equipment are transmitted to or received from the onboard equipment based on the acquired pin-mapping data; and a signal inspection and verification step in which the inspection signals are analyzed to verify whether they are normal, wherein the identification code and inspection signals are transmitted via CAN communication. Claim 2 A method for inspecting satellite system onboard equipment according to claim 1, wherein the onboard equipment comprises one or more types of inspection target elements, and the inspection signal comprises at least one digital input signal, a digital output signal, an analog input signal, an analog output signal, and an encoder signal input or output from the inspection target element according to the type of inspection target element. Claim 3 In paragraph 2, the method for inspecting satellite system onboard equipment is characterized in that the onboard equipment comprises a CAN board configured to enable CAN communication with the test bench system, and the CAN board comprises: a CAN communication unit that performs transmission and reception of the identification code and inspection signal with the test bench system via the CAN communication; a memory unit that stores an identification code for the onboard equipment; and a signal distribution unit that distributes the inspection signal transmitted and received via the CAN communication unit to a corresponding inspection target element among the plurality of inspection target elements. Claim 4 In paragraph 3, the pin-mapping data is stored in the memory unit, and the pin-mapping data acquisition step is characterized by reading from the memory unit to acquire the pin-mapping data. Claim 5 A method for inspecting satellite system onboard equipment according to claim 1, wherein the test bench system comprises: a test bench computer that performs the identification code reception step, the pin-mapping data acquisition step, the inspection signal transmission and reception step, and the signal inspection and verification step; a test bench monitor that displays the execution result of the test bench computer; and a CAN converter that converts the identification code and inspection signal to be transmitted via CAN communication between the test bench computer and the onboard equipment during the execution of the identification code reception step and the inspection signal transmission and reception step. Claim 6 In claim 5, the pin-mapping data is stored in a memory provided in the test bench computer, and the pin-mapping data acquisition step is characterized by reading the memory provided in the test bench computer to acquire the pin-mapping data. Claim 7 A method for inspecting equipment on a satellite system according to claim 2, wherein one or more types of inspection target elements include at least one DI switch corresponding to the digital input signal, a DO switch corresponding to the digital output signal, an AI switch corresponding to the analog input signal, an AO switch corresponding to the analog output signal, and an encoder switch corresponding to the encoder signal. Claim 8 A method for inspecting equipment on a satellite system according to claim 1, further comprising an inspection result reporting step for reporting the results analyzed and verified in the signal inspection and verification step.

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